IGBT Half-Bridge Module Drive Pulse Alignment Test Circuit and Test Method

Abstract

The present invention provides an IGBT half-bridge module drive pulse alignment test circuit and a test method. The test circuit includes: a primary power module, a secondary power module, and a host computer; the primary module control board is connected to an adjustable drive board; the adjustable drive board is connected to the IGBT half-bridge module to drive the IGBT half-bridge module; a first mode selection circuit with a fixed resistance value is connected in series between the drive core MOD pin of the adjustable drive board and the drive circuit GND; the secondary module control board is connected to an adjustable drive board; the adjustable drive board is connected to the IGBT half-bridge module to drive the IGBT half-bridge module; a second mode selection circuit with an adjustable resistance value is connected in series between the drive core MOD pin of the adjustable drive board and the drive circuit GND; the maximum resistance value of the second mode selection resistor is greater than the resistance value of the first mode selection resistor, and the minimum resistance value is less than the resistance value of the first mode selection resistor; the host computer is respectively connected to the primary module control board and the secondary module control board to form a control loop.

Description

Technical Field

[0001] The present invention relates to the technical field of CLLC resonant DC / DC converters, and particularly to a driving pulse alignment test circuit and a test method for an IGBT half-bridge module. Background Art

[0002] This section aims to provide background or context for the embodiments of the present invention described in the claims. The description herein is not admitted to be prior art merely because it is included in this section.

[0003] With the continuous development of power electronics technology, DC / DC (direct current) converters are increasingly widely used in the fields of rail transit, photovoltaic power transmission, DC networking, AC-DC interconnection, etc. At the same time, DC power grids and DC power supply technologies can more reliably and efficiently accommodate distributed renewable power generation systems such as wind and light, energy storage units, electric vehicles, and other DC electrical loads, and reduce the conversion link, have high energy utilization, and good power flow control. They have developed rapidly worldwide. Therefore, DC / DC converter-related devices have a very wide range of applications and market prospects, and are also an important part of building future multi-voltage-level and multi-terminal DC power grids. The bidirectional CLLC (capacitor-inductor-inductor-capacitor) resonant converter has natural soft-switching characteristics and is an important topology in DC / DC converters. It has the characteristics of a wide soft-switching frequency range, a large voltage regulation range, and a high power density, and has great advantages in applications in high-voltage, high-frequency, and high-power occasions. The IGBT (Insulated Gate Bipolar Transistor) half-bridge module, as a composite semiconductor power device, has high reliability, low usage cost, simple design of the peripheral drive circuit, and at the same time, the standard modular package also has the characteristics of convenient installation and maintenance and stable heat dissipation. Therefore, it has a very wide range of applications in power electronic devices such as DC / DC converters.

[0004] In terms of driving the IGBT half-bridge module, a driving core with a complete dual channel is often adopted, and an external circuit is constructed around the driving core. Generally speaking, this type of driving core has two working modes: direct mode and half-bridge mode. The half-bridge mode has a physical hardware dead zone, and its dead time is determined by the series resistor Rm. Further, a parallel capacitor Cm is used to reduce the dead-time jitter generated by the driving signal InA. The direct mode does not have a hardware dead zone, and a control circuit needs to generate sufficient dead time to avoid a DC bus short circuit caused by the simultaneous conduction or overlapping conduction time of the two switching tubes in the half-bridge.

[0005] Due to reasons such as circuit stray capacitance, device parameter differences, and the error of the driving signal InA itself, the dead time controlled by Rm is usually not accurate enough, and the dead-time jitter cannot be completely eliminated by the parallel capacitor Cm.

[0006] To maximize the advantages of resonant DC / DC topologies such as CLLC and achieve zero-voltage switching (ZVS) operation over the full load range, in addition to optimizing the design of switching frequency, gain characteristics, resonant cavity LC parameters, etc., the dead time should not be designed too large. Therefore, at a relatively small dead time, the time error caused by the above-mentioned time misalignment and jitter accounts for a relatively large proportion in the dead time, which makes it difficult to achieve ZVS in the DC / DC converter under heavy load conditions and greatly affects the efficiency of the converter.

[0007] Therefore, how to provide a new solution that can solve the above technical problems is a technical problem that needs to be urgently solved in this field. Summary of the Invention

[0008] An embodiment of the present invention provides an IGBT half-bridge module drive pulse alignment test circuit, which can improve the working efficiency of DC / DC converters such as the CLLC resonant DAB topology. The test circuit includes: a primary power module, a secondary power module, and a host computer.

[0009] The primary power module includes: an IGBT half-bridge module, an adjustable drive board, and a primary module control board; the primary module control board is connected to the adjustable drive board; the adjustable drive board is connected to the IGBT half-bridge module for driving the IGBT half-bridge module; a first mode selection circuit is connected in series between the drive core MOD pin of the adjustable drive board and the drive circuit GND; the resistance value of the first mode selection resistor of the first mode selection circuit is a fixed value; the resistance value of the first mode selection resistor is determined by a preset dead time.

[0010] The secondary power module includes: an IGBT half-bridge module, an adjustable drive board, and a secondary module control board; the secondary module control board is connected to the adjustable drive board; the adjustable drive board is connected to the IGBT half-bridge module for driving the IGBT half-bridge module; a second mode selection circuit is connected in series between the drive core MOD pin of the adjustable drive board and the drive circuit GND, and the resistance value of the second mode selection resistor of the second mode selection circuit is adjustable; the maximum resistance value of the second mode selection resistor is greater than the resistance value of the first mode selection resistor, and the minimum resistance value of the second mode selection resistor is less than the resistance value of the first mode selection resistor.

[0011] The host computer is respectively connected to the primary side module control board and the secondary side module control board to form a control loop for sending control pulses to the primary side power module and the secondary side power module; the non-adjustable drive board and the adjustable drive board are connected to an oscilloscope, and the oscilloscope is used to display the VGE waveforms of the corresponding upper tubes of the non-adjustable drive board and the adjustable drive board; by adjusting the resistance value of the second mode selection resistor, the rising edge waveforms of the VGE waveforms of the non-adjustable drive board and the adjustable drive board are overlapped, and the VGE waveform of the non-adjustable drive board is located at the central position of the jitter afterglow of the VGE waveform of the adjustable drive board.

[0012] The embodiment of the present invention also provides a test method for the above IGBT half-bridge module drive pulse alignment test circuit, including:

[0013] Connect the non-adjustable drive board with the primary side module control board, and connect the non-adjustable drive board to the IGBT half-bridge module to drive the IGBT half-bridge module; a first mode selection circuit is connected in series between the MOD pin of the drive core of the non-adjustable drive board and the drive circuit GND; the resistance value of the first mode selection resistor of the first mode selection circuit is a fixed value; the resistance value of the first mode selection resistor is determined by a preset dead time;

[0014] Connect the adjustable drive board with the secondary side module control board, and connect the adjustable drive board to the IGBT half-bridge module to drive the IGBT half-bridge module; a second mode selection circuit is connected in series between the MOD pin of the drive core of the adjustable drive board and the drive circuit GND, and the resistance value of the second mode selection resistor of the second mode selection circuit is adjustable; the maximum resistance value of the second mode selection resistor is greater than the resistance value of the first mode selection resistor, and the minimum resistance value of the second mode selection resistor is less than the resistance value of the first mode selection resistor;

[0015] Connect the host computer to the primary side module control board and the secondary side module control board respectively to form a control loop, send control pulses to the primary side power module and the secondary side power module, connect the non-adjustable drive board and the adjustable drive board to the oscilloscope to display the VGE waveforms of the corresponding upper tubes of the non-adjustable drive board and the adjustable drive board, and adjust the resistance value of the second mode selection resistor so that the rising edge waveforms of the VGE waveforms of the non-adjustable drive board and the adjustable drive board are overlapped, and the VGE waveform of the non-adjustable drive board is located at the central position of the jitter afterglow of the VGE waveform of the adjustable drive board.

[0016] An IGBT half-bridge module drive pulse alignment test circuit and test method provided by an embodiment of the present invention include: a primary power module, a secondary power module, and a host computer; the primary power module includes: an IGBT half-bridge module, an adjustable drive board, and a primary module control board; the primary module control board is connected to the adjustable drive board; the adjustable drive board is connected to the IGBT half-bridge module for driving the IGBT half-bridge module; a first mode selection circuit is connected in series between the drive core MOD pin of the adjustable drive board and the drive circuit GND; the resistance value of the first mode selection resistor of the first mode selection circuit is a fixed value; the resistance value of the first mode selection resistor is determined by a preset dead time; the secondary power module includes: an IGBT half-bridge module, an adjustable drive board, and a secondary module control board; the secondary module control board is connected to the adjustable drive board; the adjustable drive board is connected to the IGBT half-bridge module for driving the IGBT half-bridge module; a second mode selection circuit is connected in series between the drive core MOD pin of the adjustable drive board and the drive circuit GND, and the resistance value of the second mode selection resistor of the second mode selection circuit is adjustable; the maximum resistance value of the second mode selection resistor is greater than the resistance value of the first mode selection resistor, and the minimum resistance value of the second mode selection resistor is less than the resistance value of the first mode selection resistor; the host computer is respectively connected to the primary module control board and the secondary module control board to form a control loop for sending control pulses to the primary power module and the secondary power module; the adjustable drive board and the adjustable drive board are connected to an oscilloscope, and the oscilloscope is used to display the VGE waveforms of the corresponding upper tubes of the adjustable drive board and the adjustable drive board; by adjusting the resistance value of the second mode selection resistor, the rising edge waveforms of the VGE waveforms of the adjustable drive board and the adjustable drive board are overlapped, and the VGE waveform of the adjustable drive board is located at the center of the jitter afterglow of the VGE waveform of the adjustable drive board. The present invention can improve the working efficiency of DC / DC converters such as CLLC resonant DAB topologies; a second mode selection circuit is designed on the adjustable drive board, and by adjusting the resistance value of the second mode selection resistor of the second mode selection circuit, the resistance value between the drive core MOD pin and GND can be accurately adjusted, that is, the IGBT dead time can be accurately adjusted, and the errors caused by the circuit and signals can be eliminated. Through the IGBT half-bridge module drive pulse alignment test circuit of the present application, the IGBT half-bridges on both sides of the same name terminal of DC / DC converters such as CLLC resonant DAB topologies can be driven pulse-aligned, and by the way of jitter centering, the error caused by dead time jitter can be further reduced, helping the DC / DC converter to achieve ZVS operation in the full load range and improving the working efficiency of the DC / DC converter. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the accompanying drawings required for the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other accompanying drawings can be obtained based on these drawings. In the accompanying drawings:

[0018] Figure 1 Schematic diagram of a driving pulse alignment test circuit for an IGBT half-bridge module according to an embodiment of the present invention.

[0019] Figure 2 CLLC resonant DAB topology applicable to the embodiment of the present invention.

[0020] Figure 3 Pulse time error waveform diagram of the IGBT half-bridge module according to an embodiment of the present invention.

[0021] Figure 4 Schematic diagram of the first mode selection circuit of the non-adjustable drive board of a driving pulse alignment test circuit for an IGBT half-bridge module according to an embodiment of the present invention.

[0022] Figure 5 Schematic diagram of the second mode selection circuit of the adjustable drive board of a driving pulse alignment test circuit for an IGBT half-bridge module according to an embodiment of the present invention.

[0023] Figure 6 Rising edge pulse alignment waveform diagram of the IGBT half-bridge module of a driving pulse alignment test circuit for an IGBT half-bridge module according to an embodiment of the present invention.

[0024] Figure 7 Falling edge pulse alignment waveform diagram of the IGBT half-bridge module of a driving pulse alignment test circuit for an IGBT half-bridge module according to an embodiment of the present invention.

[0025] Figure 8 Schematic diagram of a test method for a driving pulse alignment test circuit for an IGBT half-bridge module according to an embodiment of the present invention. Detailed implementation manners

[0026] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer and more understandable, the following will further elaborate on the embodiments of the present invention in conjunction with the accompanying drawings. Herein, the illustrative embodiments of the present invention and their descriptions are used to explain the present invention, but not to limit the present invention.

[0027] Figure 1 Schematic diagram of a driving pulse alignment test circuit for an IGBT half-bridge module according to an embodiment of the present invention, as Figure 1As shown in the figure, an IGBT half-bridge module drive pulse alignment test circuit is provided in an embodiment of the present invention, which can improve the working efficiency of DC / DC converters such as CLLC resonant DAB topologies. The test circuit includes: a primary power module, a secondary power module, and a host computer;

[0028] The primary power module includes: an IGBT half-bridge module, a non-adjustable drive board, and a primary module control board; the primary module control board is connected to the non-adjustable drive board; the non-adjustable drive board is connected to the IGBT half-bridge module for driving the IGBT half-bridge module; a first mode selection circuit is connected in series between the MOD pin of the drive core of the non-adjustable drive board and the drive circuit GND; the resistance value of the first mode selection resistor of the first mode selection circuit is a fixed value; the resistance value of the first mode selection resistor is determined by a preset dead time;

[0029] The secondary power module includes: an IGBT half-bridge module, an adjustable drive board, and a secondary module control board; the secondary module control board is connected to the adjustable drive board; the adjustable drive board is connected to the IGBT half-bridge module for driving the IGBT half-bridge module; a second mode selection circuit is connected in series between the MOD pin of the drive core of the adjustable drive board and the drive circuit GND, and the resistance value of the second mode selection resistor of the second mode selection circuit is adjustable; the maximum resistance value of the second mode selection resistor is greater than the resistance value of the first mode selection resistor, and the minimum resistance value of the second mode selection resistor is less than the resistance value of the first mode selection resistor;

[0030] The host computer is respectively connected to the primary module control board and the secondary module control board to form a control loop for sending control pulses to the primary power module and the secondary power module; the non-adjustable drive board and the adjustable drive board are connected to an oscilloscope, and the oscilloscope is used to display the VGE waveforms of the upper tubes corresponding to the non-adjustable drive board and the adjustable drive board; by adjusting the resistance value of the second mode selection resistor, the rising edge waveforms of the VGE waveform of the non-adjustable drive board and the VGE waveform of the adjustable drive board are overlapped, and the VGE waveform of the non-adjustable drive board is located at the center of the jitter afterglow of the VGE waveform of the adjustable drive board.

[0031] An IGBT half-bridge module drive pulse alignment test circuit provided by an embodiment of the present invention includes: a primary power module, a secondary power module, and a host computer; the primary power module includes: an IGBT half-bridge module, a non-adjustable drive board, and a primary module control board; the primary module control board is connected to the non-adjustable drive board; the non-adjustable drive board is connected to the IGBT half-bridge module and is used to drive the IGBT half-bridge module; a first mode selection circuit is connected in series between the drive core MOD pin of the non-adjustable drive board and the drive circuit GND; the resistance value of the first mode selection resistor of the first mode selection circuit is a fixed value; the resistance value of the first mode selection resistor is determined by a preset dead time; the secondary power module includes: an IGBT half-bridge module, an adjustable drive board, and a secondary module control board; the secondary module control board is connected to the adjustable drive board; the adjustable drive board is connected to the IGBT half-bridge module and is used to drive the IGBT half-bridge module; a second mode selection circuit is connected in series between the drive core MOD pin of the adjustable drive board and the drive circuit GND, and the resistance value of the second mode selection resistor of the second mode selection circuit is adjustable; the maximum resistance value of the second mode selection resistor is greater than the resistance value of the first mode selection resistor, and the minimum resistance value of the second mode selection resistor is less than the resistance value of the first mode selection resistor; the host computer is respectively connected to the primary module control board and the secondary module control board to form a control loop, and is used to send control pulses to the primary power module and the secondary power module; the non-adjustable drive board and the adjustable drive board are connected to an oscilloscope, and the oscilloscope is used to display the VGE waveforms of the upper tubes corresponding to the non-adjustable drive board and the adjustable drive board; by adjusting the resistance value of the second mode selection resistor, the rising edge waveforms of the VGE waveform of the non-adjustable drive board and the VGE waveform of the adjustable drive board are overlapped, and the VGE waveform of the non-adjustable drive board is located at the central position of the jitter afterglow of the VGE waveform of the adjustable drive board. The present invention can improve the working efficiency of DC / DC converters such as CLLC resonant DAB topologies; a second mode selection circuit is designed on the adjustable drive board, and by adjusting the resistance value of the second mode selection resistor of the second mode selection circuit, the resistance value between the drive core MOD pin and GND can be accurately adjusted, that is, the IGBT dead time can be accurately adjusted to eliminate the errors brought by the circuit and signals. Through the IGBT half-bridge module drive pulse alignment test circuit of the present application, the drive pulses of the IGBT half-bridges on both sides of the same name ends of DC / DC converters such as CLLC resonant DAB topologies can be aligned, and by the way of centering the jitter, the errors brought by the dead time jitter are further reduced, helping the DC / DC converter to achieve ZVS operation in the full load range and improving the working efficiency of the DC / DC converter.

[0032] Figure 2This is the CLLC resonant DAB topology applicable to the embodiments of the present invention, providing a typical topology for the application of IGBT half-bridge modules in a CLLC resonant DC / DC converter. As Figure 2 shown, the DC / DC converter consists of a primary power module, a secondary power module, a resonant circuit, an isolation transformer, etc. The primary power module includes 1#, 2#, and 5# IGBT half-bridge modules, and the secondary power module includes 3# and 4# IGBT half-bridge modules. The 1#, 2#, 3#, 4# IGBT half-bridge modules, the resonant circuit, the isolation transformer, etc. constitute the CLLC resonant DAB topology, and the 5# module is usually used as a blocking half-bridge with Buck-Boost function.

[0033] In terms of driving the IGBT half-bridge module, a driving core of, for example, the model 2SC0108T of Concept company can be used, and a peripheral circuit can be built around this driving core. The working modes of the above driving core include the direct mode and the half-bridge mode. By directly connecting the MOD pin of the driving core to GND or connecting it to GND after series-connected with an appropriate resistance value resistor, two circuits are used to select between the "direct" and "half-bridge" working modes. When the half-bridge mode is selected, there is a hardware dead zone, and the dead time of this hardware dead zone is determined by the series-connected resistor Rm. At the same time, when designing the circuit, a capacitor Cm is often connected in parallel with Rm to reduce the dead time jitter generated by the driving signal InA.

[0034] There is an inaccurate problem in determining the dead time by using the series-connected resistor Rm in the above solution, and further, the dead time jitter cannot be completely eliminated by connecting the capacitor Cm in parallel. Figure 3 This is the pulse time error waveform diagram of the IGBT half-bridge module for the embodiments of the present invention. Figure 3 The driving pulse VGE waveforms of the IGBT half-bridges on both sides of the same name ends of the CLLC resonant DAB topology are observed using an oscilloscope. Channel 1 is the driving pulse of the upper tube of the 1# IGBT half-bridge module of the primary power module, and Channel 2 is the driving pulse of the upper tube of the 3# IGBT half-bridge module of the secondary power module. The waveform display mode is the afterglow display mode, where the waveform of Channel 1 is fixed on the screen using the trigger mode. Therefore, the pulse jitter time displayed by the afterglow of the waveform of Channel 2 is the sum of the waveforms of Channel 1 and Channel 2. From Figure 3 it can be obtained that the rising edge times of the two pulses differ by about 300 nS, and at the same time, the sum of the time jitters between the two pulses is about 200 nS.

[0035] Through Figure 3 the waveform diagram shown, it can be seen that at a relatively small dead time, due to the above-mentioned time misalignment and jitter, the time error accounts for a relatively large proportion in the dead time, which will cause it difficult to achieve ZVS under heavy load conditions of the DC / DC converter and will greatly affect the efficiency of the converter.

[0036] To solve the above problems, an embodiment of the present invention provides an IGBT half-bridge module drive pulse alignment test circuit, which can improve the working efficiency of DC / DC converters such as CLLC resonant DAB topologies.

[0037] When specifically implementing an IGBT half-bridge module drive pulse alignment test circuit provided by an embodiment of the present invention, in one embodiment, it includes: a primary power module, a secondary power module, and a host computer;

[0038] The primary power module includes: an IGBT half-bridge module, a non-adjustable drive board, and a primary module control board; the primary module control board is connected to the non-adjustable drive board; the non-adjustable drive board is connected to the IGBT half-bridge module for driving the IGBT half-bridge module; a first mode selection circuit is connected in series between the drive core MOD pin of the non-adjustable drive board and the drive circuit GND; the resistance value of the first mode selection resistor of the first mode selection circuit is a fixed value; the resistance value of the first mode selection resistor is determined by a preset dead time; the IGBT half-bridge module included in the primary power module may be a first IGBT half-bridge module group; the above-mentioned first IGBT half-bridge module group includes: a first IGBT half-bridge module and a second IGBT half-bridge module.

[0039] The secondary power module includes: an IGBT half-bridge module, an adjustable drive board, and a secondary module control board; the secondary module control board is connected to the adjustable drive board; the adjustable drive board is connected to the IGBT half-bridge module for driving the IGBT half-bridge module; a second mode selection circuit is connected in series between the drive core MOD pin of the adjustable drive board and the drive circuit GND, and the resistance value of the second mode selection resistor of the second mode selection circuit is adjustable; the maximum resistance value of the second mode selection resistor is greater than the resistance value of the first mode selection resistor, and the minimum resistance value of the second mode selection resistor is less than the resistance value of the first mode selection resistor; the IGBT half-bridge module included in the secondary power module may be a second IGBT half-bridge module group; the above-mentioned second IGBT half-bridge module group includes: a third IGBT half-bridge module and a fourth IGBT half-bridge module.

[0040] The host computer is respectively connected to the primary module control board and the secondary module control board to form a control loop for sending control pulses to the primary power module and the secondary power module; the non-adjustable drive board and the adjustable drive board are connected to an oscilloscope, and the oscilloscope is used to display the VGE waveforms of the corresponding upper tubes of the non-adjustable drive board and the adjustable drive board; by adjusting the resistance value of the second mode selection resistor, the rising edge waveforms of the VGE waveform of the non-adjustable drive board and the VGE waveform of the adjustable drive board are overlapped, and the VGE waveform of the non-adjustable drive board is located at the center of the jitter afterglow of the VGE waveform of the adjustable drive board.

[0041] Figure 4Schematic diagram of the first mode selection circuit of the non-adjustable drive board for the IGBT half-bridge module drive pulse alignment test circuit according to an embodiment of the present invention, as shown in Figure 4 shown. When specifically implementing an IGBT half-bridge module drive pulse alignment test circuit provided by an embodiment of the present invention, in one embodiment, the first mode selection circuit includes: a first mode selection resistor and a first jitter suppression capacitor;

[0042] After the first mode selection resistor is connected in parallel with the first jitter suppression capacitor, it is connected in series between the MOD pin of the drive core of the non-adjustable drive board and the drive circuit GND.

[0043] In an embodiment, the first mode selection circuit of the non-adjustable drive board may include: a first mode selection resistor R1 and a first jitter suppression capacitor Cm;

[0044] The first mode selection resistor R1 and the first jitter suppression capacitor Cm are connected in parallel to form a first mode selection circuit, and then the first mode selection circuit is connected in series between the MOD pin of the drive core of the non-adjustable drive board and the drive circuit GND. The first jitter suppression capacitor Cm is a capacitor with a suitable capacitance value selected according to actual requirements, and the first jitter suppression capacitor Cm matches the first mode selection resistor R1.

[0045] The resistance value of the first mode selection resistor R1 is determined by a preset dead time; specifically, the resistance value of the first mode selection resistor R1 is equal to the resistance value calculated according to the dead time requirement. In an example, the resistance value of the mode selection resistor R required is calculated through the dead time calculated by hardware design. m According to the resistance value of R m , a first mode selection resistor R1 with a resistance value equal to that of Rm is selected. That is to say, the resistance value of R m is usually calculated through the dead time Td designed by the switching device in the DC / DC converter. For example, for the drive core of the Concept company model 2SC0108T, the resistance value of R m is obtained through the following calculation formula:

[0046] R m (kΩ) = 33 × T d (μS) + 56.4, (0.5 μS < T d < 3.8 μS)

[0047] Wherein, R m is the resistance value of the calculated mode selection resistor, in kΩ; T d is the dead time, in μS; usually the dead time T d is set between 0.5 μS and 3.8 μS.

[0048] Calculate R based on the above formula m The resistance value of m , and select a resistor R1 as the first mode selection resistor. The resistance value of R1 is equal to that of R m That is, R m = R1. The resistance value of the first mode selection resistor R1 of the above first mode selection circuit is a fixed value.

[0049] The expression for calculating the resistance value of the mode selection resistor mentioned above is for illustration. Those skilled in the art can understand that during implementation, the above formula can also be deformed in a certain form and other parameters or data can be added, or other specific formulas can be provided. These variations should all fall within the protection scope of the present invention.

[0050] Figure 5 FIG. is the schematic diagram of the second mode selection circuit of the adjustable drive board of an IGBT half-bridge module drive pulse alignment test circuit according to an embodiment of the present invention. As Figure 5 shown, when specifically implementing an IGBT half-bridge module drive pulse alignment test circuit provided by an embodiment of the present invention, in one embodiment, the second mode selection circuit includes: a second mode selection resistor, a second jitter suppression capacitor; the second mode selection resistor includes: a second mode selection fixed-value resistor, a potentiometer; the second mode selection fixed-value resistor and the potentiometer are connected in series; the resistance value of the potentiometer is adjustable;

[0051] After the second mode selection resistor is connected in parallel with the second jitter suppression capacitor, it is connected in series between the drive core MOD pin of the adjustable drive board and the drive circuit GND.

[0052] In an embodiment, the second mode selection circuit of the adjustable drive board may include: a second mode selection resistor, a second jitter suppression capacitor Cm; the above second mode selection resistor includes: a second mode selection fixed-value resistor R2, a potentiometer Radj; the second mode selection fixed-value resistor R2 and the potentiometer Radj are connected in series; the resistance value of the potentiometer Radj is adjustable; in one case, the potentiometer Radj has a maximum resistance value Radj-max and a minimum resistance value Radj-min. The second jitter suppression capacitor Cm is a capacitor with a suitable capacitance value selected according to actual requirements, and the second jitter suppression capacitor Cm is matched with the first mode selection resistor R1. During specific implementation, the foregoing first jitter suppression capacitor Cm and the second jitter suppression capacitor Cm may be capacitors with the same capacitance value. Therefore, a common capacitor label Cm is used in the embodiments of the present invention; further, the foregoing first jitter suppression capacitor Cm and the second jitter suppression capacitor Cm may also use capacitors with different capacitance values. When the capacitance values are different, different capacitor labels can be used for distinction, such as the first jitter suppression capacitor Cm1 and the second jitter suppression capacitor Cm2, which will not be elaborated here.

[0053] After the second mode selection resistor (R2 + Radj) is connected in parallel with the second jitter suppression capacitor Cm, it is connected in series between the MOD pin of the drive core of the adjustable drive board and the drive circuit GND. Since the resistance value of the potentiometer Radj is adjustable, the resistance value of the second mode selection resistor (R2 + Radj) composed of the series connection of the second mode selection fixed resistor R2 and the potentiometer Radj is also adjustable.

[0054] Based on the above embodiments, when designing the adjustable drive board, after the resistor R2 and the potentiometer Radj are connected in series, they are connected in series between the MOD pin of the drive core and the drive circuit GND, and the jitter suppression capacitor Cm with an appropriate capacitance value is connected in parallel as needed.

[0055] When specifically implementing an IGBT half-bridge module drive pulse alignment test circuit provided by an embodiment of the present invention, in one embodiment, the sum of the maximum resistance value of the potentiometer and the resistance value of the second mode selection fixed resistor is greater than the resistance value of the first mode selection resistor;

[0056] The sum of the minimum resistance value of the potentiometer and the resistance value of the second mode selection fixed resistor is less than the resistance value of the first mode selection resistor.

[0057] In the embodiment, the sum (Radj-max + R2) of the maximum resistance value Radj-max of the potentiometer Radj and the resistance value R2 of the second mode selection fixed resistor is greater than the resistance value of the first mode selection resistor R1.

[0058] The sum (Radj-min + R2) of the minimum resistance value Radj-min of the potentiometer Radj and the resistance value R2 of the second mode selection fixed resistor is less than the resistance value of the first mode selection resistor R1.

[0059] Based on the above embodiments, when designing the adjustable drive board, according to the calculated R m resistance value, a resistor R2 and a potentiometer Radj are selected. The sum of the resistance value of the resistor R2 and the maximum resistance value of the potentiometer Radj should be greater than the resistance value of Rm; further, since R m = R1, the sum of the resistance value of the resistor R2 and the maximum resistance value of the potentiometer Radj should be greater than the resistance value of R1.

[0060] When specifically implementing an IGBT half-bridge module drive pulse alignment test circuit provided by an embodiment of the present invention, in one embodiment, the resistance value of the second mode selection fixed resistor is 0.8 times the resistance value of the first mode selection resistor.

[0061] When specifically implementing a driving pulse alignment test circuit for an IGBT half-bridge module provided by an embodiment of the present invention, in one embodiment, the maximum resistance value of the potentiometer is 0.4 times the resistance value of the second mode selection fixed resistor.

[0062] In the embodiment, in order to ensure the adjustment accuracy, it is advisable to design the resistance value of R2 to be about 0.8 times that of R1, and the maximum resistance value of Radj to be about 0.4 times the resistance value of R2. For example, if the resistance value of R1 is 150 kΩ, then design R2 to be 120 kΩ, and design Radj to be adjustable from 0 Ω to 50 kΩ.

[0063] When specifically implementing a driving pulse alignment test circuit for an IGBT half-bridge module provided by an embodiment of the present invention, in one embodiment, the control loop is further configured to implement power-on, driving control pulse output, and pulse unlocking and locking functions for the adjustable driving board and the non-adjustable driving board.

[0064] When specifically implementing a driving pulse alignment test circuit for an IGBT half-bridge module provided by an embodiment of the present invention, in one embodiment, the control loop is further configured to keep the control pulses sent to the primary power module and the secondary power module consistent.

[0065] In the embodiment, the control loop composed of the upper computer connecting the primary module control board and the secondary module control board and the relevant circuits necessary to implement the control and protection functions can be used to send control pulses to the primary power module and the secondary power module. In addition, the control loop is further configured to implement power-on, driving control pulse output, and pulse unlocking and locking functions for the adjustable driving board and the non-adjustable driving board, and is further configured to keep the control pulses sent to the primary power module and the secondary power module consistent.

[0066] When specifically implementing a driving pulse alignment test circuit for an IGBT half-bridge module provided by an embodiment of the present invention, in one embodiment, the IGBT half-bridge module of the primary power module includes: a first IGBT half-bridge module and a second IGBT half-bridge module;

[0067] The non-adjustable driving board of the primary power module includes: a first non-adjustable driving board and a second non-adjustable driving board;

[0068] The primary module control board is respectively connected to the first non-adjustable driving board and the second non-adjustable driving board;

[0069] The first non-adjustable driving board is connected to the first IGBT half-bridge module for driving the first IGBT half-bridge module;

[0070] The second non-adjustable driving board is connected to the second IGBT half-bridge module for driving the second IGBT half-bridge module.

[0071] In an embodiment of the present invention, the IGBT half-bridge module of the primary side power module includes: a first IGBT half-bridge module and a second IGBT half-bridge module; the structures and functions of the first IGBT half-bridge module and the second IGBT half-bridge module are the same; the non-adjustable drive board of the primary side power module includes: a first non-adjustable drive board and a second non-adjustable drive board; the structures and functions of the first non-adjustable drive board and the second non-adjustable drive board are the same.

[0072] Furthermore, the primary side power module may include: a first IGBT half-bridge module, a second IGBT half-bridge module, a first non-adjustable drive board, a second non-adjustable drive board, a primary side module control board, and circuits necessary to implement the CLLC resonant DAB topology or other topology functions.

[0073] In one example, the first IGBT half-bridge module is numbered as IGBT half-bridge module 1#, the second IGBT half-bridge module is numbered as IGBT half-bridge module 2#, the first non-adjustable drive board is numbered as drive board 1#, and the second non-adjustable drive board is numbered as drive board 2#; in the primary side power module, the primary side module control board is respectively connected to drive board 1# and drive board 2#, drive board 1# is connected to IGBT half-bridge module 1# for driving IGBT half-bridge module 1#; drive board 2# is connected to IGBT half-bridge module 2# for driving IGBT half-bridge module 2#.

[0074] When specifically implementing a driving pulse alignment test circuit for an IGBT half-bridge module provided by an embodiment of the present invention, in one embodiment, the first non-adjustable drive board is connected to the G and E terminals of the upper transistor of the first IGBT half-bridge module, and the G and E terminals of the lower transistor of the first IGBT half-bridge module are connected to the first non-adjustable drive board.

[0075] When specifically implementing a driving pulse alignment test circuit for an IGBT half-bridge module provided by an embodiment of the present invention, in one embodiment, the second non-adjustable drive board is connected to the G and E terminals of the upper transistor of the second IGBT half-bridge module, and the G and E terminals of the lower transistor of the second IGBT half-bridge module are connected to the second non-adjustable drive board.

[0076] As Figure 1 shown, in the IGBT half-bridge module, G1 and E1 represent the G and E terminals of the upper transistor of the module, and G2 and E2 represent the G and E terminals of the lower transistor of the module; based on the aforementioned numbering of the non-adjustable drive board and the IGBT half-bridge module, in the embodiment,

[0077] Drive board 1# is connected to the G and E terminals of the upper transistor of IGBT half-bridge module 1#, and the G and E terminals of the lower transistor of IGBT half-bridge module 1# are connected to drive board 1#; drive board 2# is connected to the G and E terminals of the upper transistor of IGBT half-bridge module 2#, and the G and E terminals of the lower transistor of IGBT half-bridge module 2# are connected to drive board 2#.

[0078] When specifically implementing an IGBT half - bridge module drive pulse alignment test circuit provided by an embodiment of the present invention, in one embodiment, the IGBT half - bridge module of the secondary - side power module includes: a third IGBT half - bridge module and a fourth IGBT half - bridge module;

[0079] The adjustable drive board of the secondary - side power module includes: a third adjustable drive board and a fourth adjustable drive board;

[0080] The third adjustable drive board is connected to the third IGBT half - bridge module and is used to drive the third IGBT half - bridge module;

[0081] The fourth adjustable drive board is connected to the fourth IGBT half - bridge module and is used to drive the fourth IGBT half - bridge module.

[0082] In an embodiment of the present invention, the IGBT half - bridge module of the secondary - side power module includes: a third IGBT half - bridge module and a fourth IGBT half - bridge module; the structures and functions of the third IGBT half - bridge module and the fourth IGBT half - bridge module are the same. The adjustable drive board of the secondary - side power module includes: a third adjustable drive board and a fourth adjustable drive board; the structures and functions of the third adjustable drive board and the fourth adjustable drive board are the same.

[0083] Furthermore, the secondary - side power module may include: a third IGBT half - bridge module, a fourth IGBT half - bridge module, a third adjustable drive board, a fourth adjustable drive board, a secondary - side module control board, and circuits necessary to implement the CLLC resonant DAB topology or other topology functions.

[0084] In one instance, the third IGBT half - bridge module is numbered as IGBT half - bridge module 3#, and the fourth IGBT half - bridge module is numbered as IGBT half - bridge module 4#; the third adjustable drive board is numbered as drive board 3#, and the fourth adjustable drive board is numbered as drive board 4#; in the secondary - side power module, the secondary - side module control board is respectively connected to drive board 3# and drive board 4#, drive board 3# is connected to IGBT half - bridge module 3# and is used to drive IGBT half - bridge module 3#; drive board 4# is connected to IGBT half - bridge module 4# and is used to drive IGBT half - bridge module 4#.

[0085] When specifically implementing an IGBT half - bridge module drive pulse alignment test circuit provided by an embodiment of the present invention, in one embodiment, the third adjustable drive board is connected to the G - terminal and E - terminal of the upper transistor of the third IGBT half - bridge module, and the G - terminal and E - terminal of the lower transistor of the third IGBT half - bridge module are connected to the third adjustable drive board.

[0086] When specifically implementing a driving pulse alignment test circuit for an IGBT half-bridge module provided by an embodiment of the present invention, in one embodiment, the fourth adjustable driving board is connected to the G and E electrodes of the upper transistor of the fourth IGBT half-bridge module, and the G and E electrodes of the lower transistor of the fourth IGBT half-bridge module are connected to the fourth adjustable driving board.

[0087] As Figure 1 shown, in the IGBT half-bridge module, G1 and E1 represent the G and E electrodes of the upper transistor of the module, and G2 and E2 represent the G and E electrodes of the lower transistor of the module; based on the foregoing numbering of the adjustable driving board and the IGBT half-bridge module, in the embodiment,

[0088] The driving board 3# is connected to the G and E electrodes of the upper transistor of the IGBT half-bridge module 3#, and the G and E electrodes of the lower transistor of the IGBT half-bridge module 3# are connected to the driving board 3#; the driving board 4# is connected to the G and E electrodes of the upper transistor of the IGBT half-bridge module 4#, and the G and E electrodes of the lower transistor of the IGBT half-bridge module 4# are connected to the driving board 4#.

[0089] Based on the above embodiments, when designing a driving pulse alignment test circuit for an IGBT half-bridge module, the primary power module includes driving boards 1# and 2#, IGBT half-bridge modules 1# and 2#, a primary module control board, and circuits necessary to implement the CLLC resonant DAB topology or other topology functions. The secondary power module includes driving boards 3# and 4#, IGBT half-bridge modules 3# and 4#, a secondary module control board, and circuits necessary to implement the CLLC resonant DAB topology or other topology functions. The driving boards 1# and 2# are the above-mentioned non-adjustable driving boards, and the driving boards 3# and 4# are the above-mentioned adjustable driving boards. In the IGBT half-bridge module, G1 and E1 represent the G and E electrodes of the upper transistor of the module, and G2 and E2 represent the G and E electrodes of the lower transistor of the module. Further, the driving board 1# drives the 1# IGBT half-bridge module, the driving board 2# drives the 2# IGBT half-bridge module, the driving board 3# drives the 3# IGBT half-bridge module, and the driving board 4# drives the 4# IGBT half-bridge module.

[0090] In the embodiment, the host computer is respectively connected to the primary module control board and the secondary module control board to form a control loop for sending control pulses to the primary power module and the secondary power module; the non-adjustable driving board and the adjustable driving board are connected to an oscilloscope, and the oscilloscope is used to display the VGE waveforms of the upper transistors corresponding to the non-adjustable driving board and the adjustable driving board; by adjusting the resistance value of the second mode selection resistor, the rising edge waveforms of the VGE waveforms of the non-adjustable driving board and the adjustable driving board are overlapped, and the VGE waveform of the non-adjustable driving board is located at the center of the jitter afterglow of the VGE waveform of the adjustable driving board.

[0091] In the embodiment, the control loop includes a primary module control board, a secondary module control board, a host computer, and related circuits necessary to implement the control and protection functions. The relevant control loop should normally implement functions such as power-on of the corresponding drive board, drive pulse output, pulse unlocking and locking, etc., and should ensure the consistency of the issued control pulses.

[0092] In order to align the drive pulses of the IGBT half-bridges on both sides of the same name terminals of DC / DC converters such as the CLLC resonant DAB topology and achieve jitter centering, it is necessary to connect the non-adjustable drive board and the adjustable drive board to an oscilloscope, which is used to display the VGE waveforms of the upper tubes corresponding to the non-adjustable drive board and the adjustable drive board; by adjusting the resistance value of the second mode selection resistor, the rising edge waveforms of the VGE waveform of the non-adjustable drive board and the VGE waveform of the adjustable drive board are overlapped, and the VGE waveform of the non-adjustable drive board is located at the center of the jitter afterglow of the VGE waveform of the adjustable drive board.

[0093] When testing the drive pulse alignment test circuit of the IGBT half-bridge module, each drive board works normally. Rotate the knob of the potentiometer Radj on the drive board 3# to adjust the resistance value of Radj so that the rising edge waveforms of the VGE of the drive board 1# and the VGE of the drive board 3# overlap, and the VGE waveform of the drive board 1# is located at the center of the jitter afterglow of the VGE waveform of the drive board 3#.

[0094] In one example, power on the drive board, unlock the pulse, connect the drive board 1# and the drive board 3# to an oscilloscope. The oscilloscope uses a digital oscilloscope, and the digital oscilloscope afterglow mode is used to observe the VGE waveforms of the upper tubes corresponding to the drive board 1# and 3#. The trigger channel of the oscilloscope selects the channel where the signal of the drive board 3# is located.

[0095] Further, rotate the knob of the potentiometer Radj on the drive board 3# to adjust the resistance value of Radj, and observe the rising edge waveforms of the VGE of the drive board 1# and the VGE of the drive board 3# displayed in the oscilloscope. It can be found that as the resistance value of Radj changes, the rising edge spacing between the VGE of the 1# and the VGE of the 3# will change;

[0096] Further, continue to rotate the Radj knob so that the rising edge waveforms of the VGE of the 1# and the VGE of the 3# overlap, and the VGE waveform of the 1# is located at the center of the jitter afterglow of the VGE waveform of the 3#, as Figure 6 shown;

[0097] Further, observe the falling edge waveforms of the VGE of the 1# and the VGE of the 3#, and make a comparison with reference to Figure 7 to check whether there is an error in the falling time of the two waveforms;

[0098] Further, refer to the above steps to observe the VGE waveforms of the lower transistors corresponding to the driving boards 1# and 3#, that is, whether the jitter of the rising edge waveform of the lower transistor VGE is centered and whether the falling edge waveforms are aligned;

[0099] Further, after completing the tests on the driving board 1# and the driving board 3#, refer to the steps in the above examples to complete the tests on the driving board 2# and the driving board 4#.

[0100] In the embodiment of the present invention, through the potentiometer Radj, the resistance value between the MOD pin of the driving core and GND can be precisely adjusted, that is, the IGBT dead time can be precisely adjusted to eliminate the errors brought by the circuit and signals. Through the module pulse alignment test circuit, the IGBT half-bridges on both sides of the same name terminals of DC / DC converters such as the CLLC resonant DAB topology can be driven for pulse alignment, and by the way of centering the jitter, the errors brought by the dead time jitter can be further reduced, helping the DC / DC converter to achieve ZVS operation in the full load range and improving the working efficiency of the DC / DC converter.

[0101] Next, in combination with a specific scenario, a test circuit for driving pulse alignment of an IGBT half-bridge module provided by the embodiment of the present invention will be briefly described:

[0102] A test circuit for driving pulse alignment of an IGBT half-bridge module provided by an embodiment of the invention includes: a primary side power module, a secondary side power module, and a host computer; an unadjustable driving board, an adjustable driving board, and a module pulse alignment test circuit are designed. A potentiometer Radj is designed on the adjustable driving board. Through the potentiometer Radj, the resistance value between the MOD pin of the driving core and GND can be precisely adjusted, that is, the IGBT dead time can be precisely adjusted to eliminate the errors brought by the circuit and signals. Through the module pulse alignment test circuit, the IGBT half-bridges on both sides of the same name terminals of DC / DC converters such as the CLLC resonant DAB topology can be driven for pulse alignment, and by the way of centering the jitter, the errors brought by the dead time jitter can be further reduced, helping the DC / DC converter to achieve ZVS operation in the full load range and improving the working efficiency of the DC / DC converter.

[0103] The mode selection resistor R1 of the non-adjustable driver board is equal to the resistance value of the mode selection resistor Rm calculated according to the dead time requirement; the mode selection resistor of the adjustable driver board is composed of the resistor R2 and the potentiometer Radj connected in series. The sum of the resistance value of the resistor R2 and the maximum resistance value of the potentiometer Radj is greater than the resistance value of Rm; the primary power module includes driver boards 1# and 2#, IGBT half-bridge modules 1# and 2#, the primary module control board, and the circuits necessary to implement the CLLC resonant DAB topology or other topology functions; the secondary power module includes driver boards 3# and 4#, IGBT half-bridge modules 3# and 4#, the secondary module control board, and the circuits necessary to implement the CLLC resonant DAB topology or other topology functions; driver boards 1# and 2# are the above-mentioned non-adjustable driver boards, and driver boards 3# and 4# are the above-mentioned adjustable driver boards; driver board 1# drives IGBT half-bridge module 1#, driver board 2# drives IGBT half-bridge module 2#, driver board 3# drives IGBT half-bridge module 3#, and driver board 4# drives IGBT half-bridge module 4#; the control loop includes the primary module control board, the secondary module control board, the upper computer, and the relevant circuits necessary to implement the control and protection functions. The relevant control loop should normally implement functions such as power-on, drive pulse output, and pulse unlocking and locking of the corresponding driver board, and should ensure the consistency of the issued control pulses.

[0104] When the IGBT half-bridge module drive pulse alignment test circuit is completely connected and each driver board is working properly, rotate the knob of the potentiometer Radj in driver board 3# to adjust the resistance value of Radj so that the rising edge waveforms of VGE of driver board 1# and VGE of driver board 3# overlap, and the VGE waveform of driver board 1# is located at the center of the jitter afterglow of the VGE waveform of driver board 3#.

[0105] The embodiment of the present invention also provides a test method for an IGBT half-bridge module drive pulse alignment test circuit, as described in the following embodiments. Since the principle of solving problems by this test method is similar to that of an IGBT half-bridge module drive pulse alignment test circuit, the implementation of this test method can refer to the implementation of an IGBT half-bridge module drive pulse alignment test circuit, and the repeated parts will not be described again.

[0106] Figure 8 It is a schematic diagram of a test method for an IGBT half-bridge module drive pulse alignment test circuit according to an embodiment of the present invention. As Figure 8 shown, the embodiment of the present invention also provides a test method for an IGBT half-bridge module drive pulse alignment test circuit.

[0107] When specifically implementing the test method for an IGBT half-bridge module drive pulse alignment test circuit provided by the embodiment of the present invention, in one embodiment, the test method includes:

[0108] Step 801: Connect the non-adjustable drive board using the primary side module control board. The non-adjustable drive board is connected to the IGBT half-bridge module to drive the IGBT half-bridge module. A first mode selection circuit is connected in series between the drive core MOD pin of the non-adjustable drive board and the drive circuit GND. The resistance value of the first mode selection resistor of the first mode selection circuit is a fixed value. The resistance value of the first mode selection resistor is determined by a preset dead time.

[0109] Step 802: Connect the adjustable drive board using the secondary side module control board. The adjustable drive board is connected to the IGBT half-bridge module to drive the IGBT half-bridge module. A second mode selection circuit is connected in series between the drive core MOD pin of the adjustable drive board and the drive circuit GND. The resistance value of the second mode selection resistor of the second mode selection circuit is adjustable. The maximum resistance value of the second mode selection resistor is greater than the resistance value of the first mode selection resistor, and the minimum resistance value of the second mode selection resistor is less than the resistance value of the first mode selection resistor.

[0110] Step 803: Use the host computer to connect to the primary side module control board and the secondary side module control board respectively to form a control loop, send control pulses to the primary side power module and the secondary side power module, connect the non-adjustable drive board and the adjustable drive board to the oscilloscope to display the VGE waveforms of the corresponding upper tubes of the non-adjustable drive board and the adjustable drive board, and adjust the resistance value of the second mode selection resistor so that the rising edge waveforms of the VGE waveforms of the non-adjustable drive board and the adjustable drive board overlap, and the VGE waveform of the non-adjustable drive board is located at the central position of the jitter afterglow of the VGE waveform of the adjustable drive board.

[0111] In summary, an IGBT half-bridge module drive pulse alignment test circuit and a test method provided by an embodiment of the present invention include: a primary power module, a secondary power module, and a host computer; the primary power module includes: an IGBT half-bridge module, an adjustable drive board, and a primary module control board; the primary module control board is connected to the adjustable drive board; the adjustable drive board is connected to the IGBT half-bridge module and is used to drive the IGBT half-bridge module; a first mode selection circuit is connected in series between the drive core MOD pin of the adjustable drive board and the drive circuit GND; the resistance value of the first mode selection resistor of the first mode selection circuit is a fixed value; the resistance value of the first mode selection resistor is determined by a preset dead time; the secondary power module includes: an IGBT half-bridge module, an adjustable drive board, and a secondary module control board; the secondary module control board is connected to the adjustable drive board; the adjustable drive board is connected to the IGBT half-bridge module and is used to drive the IGBT half-bridge module; a second mode selection circuit is connected in series between the drive core MOD pin of the adjustable drive board and the drive circuit GND, and the resistance value of the second mode selection resistor of the second mode selection circuit is adjustable; the maximum resistance value of the second mode selection resistor is greater than the resistance value of the first mode selection resistor, and the minimum resistance value of the second mode selection resistor is less than the resistance value of the first mode selection resistor; the host computer is respectively connected to the primary module control board and the secondary module control board to form a control loop, and is used to send control pulses to the primary power module and the secondary power module; the adjustable drive board and the adjustable drive board are connected to an oscilloscope, and the oscilloscope is used to display the VGE waveforms of the corresponding upper tubes of the adjustable drive board and the adjustable drive board; by adjusting the resistance value of the second mode selection resistor, the rising edge waveforms of the VGE waveform of the adjustable drive board and the VGE waveform of the adjustable drive board are overlapped, and the VGE waveform of the adjustable drive board is located at the center of the jitter afterglow of the VGE waveform of the adjustable drive board. The present invention can improve the working efficiency of DC / DC converters such as the CLLC resonant DAB topology; a second mode selection circuit is designed on the adjustable drive board, and by adjusting the resistance value of the second mode selection resistor of the second mode selection circuit, the resistance value between the drive core MOD pin and GND can be accurately adjusted, that is, the IGBT dead time can be accurately adjusted, and the errors caused by the circuit and signals can be eliminated. Through the IGBT half-bridge module drive pulse alignment test circuit of the present application, the IGBT half-bridges on both sides of the same name terminal of DC / DC converters such as the CLLC resonant DAB topology can be driven to align pulses, and by means of jitter centering, the error caused by dead time jitter can be further reduced, helping the DC / DC converter to achieve ZVS operation in the full load range and improving the working efficiency of the DC / DC converter.

[0112] Those skilled in the art should understand that the embodiments of the present invention can be provided as a method, a system, or a computer program product. Therefore, the present invention can take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present invention can take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk memory, CD-ROM, optical memory, etc.) that contain computer-usable program code.

[0113] The present invention is described with reference to the flowcharts and / or block diagrams of methods, apparatuses (systems), and computer program products according to embodiments of the present invention. It should be understood that each flow and / or block in the flowchart and / or block diagram, as well as the combination of flows and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to the processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing devices to generate a machine, such that the instructions executed by the processor of the computer or other programmable data processing devices produce means for implementing the functions specified in Figure 1 one or more of the flows Figure 1 or blocks or the combination of blocks.

[0114] These computer program instructions can also be stored in a computer-readable memory that can direct a computer or other programmable data processing devices to work in a specific manner, such that the instructions stored in the computer-readable memory produce a manufactured article including instruction means that implement the functions specified in Figure 1 one or more of the flows Figure 1 or blocks or the combination of blocks.

[0115] These computer program instructions can also be loaded onto a computer or other programmable data processing devices, such that a series of operation steps are executed on the computer or other programmable devices to generate a computer-implemented process, and thus the instructions executed on the computer or other programmable devices provide steps for implementing the functions specified in Figure 1 one or more of the flows Figure 1 or blocks or the combination of blocks.

[0116] The specific embodiments described above further elaborate on the purpose, technical solutions, and beneficial effects of the present invention. It should be understood that the above are only specific embodiments of the present invention and are not used to limit the protection scope of the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. An IGBT half-bridge module drive pulse alignment test circuit, characterized in that Including: Primary side power module, secondary side power module, host computer; The primary side power module includes: an IGBT half-bridge module, a non-adjustable drive board, and a primary side module control board; the primary side module control board is connected to the non-adjustable drive board; the non-adjustable drive board is connected to the IGBT half-bridge module for driving the IGBT half-bridge module; a first mode selection circuit is connected in series between the drive core MOD pin of the non-adjustable drive board and the drive circuit GND; the resistance value of the first mode selection resistor of the first mode selection circuit is a fixed value; the resistance value of the first mode selection resistor is determined by a preset dead time; The secondary side power module includes: an IGBT half-bridge module, an adjustable drive board, and a secondary side module control board; the secondary side module control board is connected to the adjustable drive board; the adjustable drive board is connected to the IGBT half-bridge module for driving the IGBT half-bridge module; a second mode selection circuit is connected in series between the drive core MOD pin of the adjustable drive board and the drive circuit GND, and the resistance value of the second mode selection resistor of the second mode selection circuit is adjustable; the maximum resistance value of the second mode selection resistor is greater than the resistance value of the first mode selection resistor, and the minimum resistance value of the second mode selection resistor is less than the resistance value of the first mode selection resistor; The host computer is respectively connected to the primary side module control board and the secondary side module control board to form a control loop for sending control pulses to the primary side power module and the secondary side power module; the non-adjustable drive board and the adjustable drive board are connected to an oscilloscope, and the oscilloscope is used to display the VGE waveforms of the upper tubes corresponding to the non-adjustable drive board and the adjustable drive board; by adjusting the resistance value of the second mode selection resistor, the rising edge waveforms of the VGE waveforms of the non-adjustable drive board and the adjustable drive board are overlapped, and the VGE waveform of the non-adjustable drive board is located at the central position of the jitter afterglow of the VGE waveform of the adjustable drive board.

2. The test circuit according to claim 1, wherein The first mode selection circuit includes: a first mode selection resistor, a first jitter suppression capacitor; After the first mode selection resistor and the first jitter suppression capacitor are connected in parallel, they are connected in series between the drive core MOD pin of the non-adjustable drive board and the drive circuit GND.

3. The test circuit according to claim 1, characterized in that The second mode selection circuit includes: a second mode selection resistor, a second jitter suppression capacitor; the second mode selection resistor includes: a second mode selection fixed resistor, a potentiometer; the second mode selection fixed resistor and the potentiometer are connected in series; the resistance value of the potentiometer is adjustable; After the second mode selection resistor and the second jitter suppression capacitor are connected in parallel, they are connected in series between the drive core MOD pin of the adjustable drive board and the drive circuit GND.

4. The test circuit according to claim 3, wherein The sum of the maximum resistance value of the potentiometer and the resistance value of the second mode selection fixed resistor is greater than the resistance value of the first mode selection resistor; The sum of the minimum resistance value of the potentiometer and the resistance value of the second mode selection fixed resistor is less than the resistance value of the first mode selection resistor.

5. The test circuit according to claim 3, wherein The resistance value of the second mode selection fixed resistor is 0.8 times the resistance value of the first mode selection resistor.

6. The test circuit according to claim 3, characterized in that, The maximum resistance value of the potentiometer is 0.4 times the resistance value of the second mode selection fixed resistor.

7. The test circuit according to claim 1, wherein The control loop is also used to implement the power-on, driving control pulse output, and pulse unlocking and locking functions for the adjustable driving board and the non-adjustable driving board.

8. The test circuit according to claim 1, characterized in that The control loop is also used to maintain the consistency of the control pulses sent to the primary power module and the secondary power module.

9. The test circuit according to claim 1, characterized in that The IGBT half-bridge module of the primary power module includes: a first IGBT half-bridge module and a second IGBT half-bridge module; The non-adjustable driving board of the primary power module includes: a first non-adjustable driving board and a second non-adjustable driving board; The primary module control board is respectively connected to the first non-adjustable driving board and the second non-adjustable driving board; The first non-adjustable driving board is connected to the first IGBT half-bridge module and is used to drive the first IGBT half-bridge module; The second non-adjustable driving board is connected to the second IGBT half-bridge module and is used to drive the second IGBT half-bridge module.

10. The test circuit according to claim 9, wherein The first non-adjustable driving board is connected to the G and E terminals of the upper transistor of the first IGBT half-bridge module, and the G and E terminals of the lower transistor of the first IGBT half-bridge module are connected to the first non-adjustable driving board.

11. The test circuit according to claim 9, wherein The second non-adjustable driving board is connected to the G and E terminals of the upper transistor of the second IGBT half-bridge module, and the G and E terminals of the lower transistor of the second IGBT half-bridge module are connected to the second non-adjustable driving board.

12. The test circuit according to claim 1, wherein The IGBT half-bridge module of the secondary power module includes: a third IGBT half-bridge module and a fourth IGBT half-bridge module; The adjustable driving board of the secondary power module includes: a third adjustable driving board and a fourth adjustable driving board; The third adjustable driving board is connected to the third IGBT half-bridge module and is used to drive the third IGBT half-bridge module; The fourth adjustable driving board is connected to the fourth IGBT half-bridge module and is used to drive the fourth IGBT half-bridge module.

13. The test circuit according to claim 12, characterized in that, The third adjustable driving board is connected to the G and E terminals of the upper transistor of the third IGBT half-bridge module, and the G and E terminals of the lower transistor of the third IGBT half-bridge module are connected to the third adjustable driving board.

14. The test circuit according to claim 12, wherein The fourth adjustable driving board is connected to the G and E terminals of the upper transistor of the fourth IGBT half-bridge module, and the G and E terminals of the lower transistor of the fourth IGBT half-bridge module are connected to the fourth adjustable driving board.

15. A test method for the IGBT half-bridge module drive pulse alignment test circuit according to any one of claims 1-14, characterized in that, It includes: Using the primary module control board to connect to the non-adjustable driving board, and the non-adjustable driving board to connect to the IGBT half-bridge module to drive the IGBT half-bridge module; A first mode selection circuit is connected in series between the driving core MOD pin of the non-adjustable driving board and the driving circuit GND; the resistance value of the first mode selection resistor of the first mode selection circuit is a fixed value; the resistance value of the first mode selection resistor is determined by a preset dead time; Using the secondary module control board to connect to the adjustable driving board, and the adjustable driving board to connect to the IGBT half-bridge module to drive the IGBT half-bridge module; A second mode selection circuit is connected in series between the driving core MOD pin of the adjustable driving board and the driving circuit GND, and the resistance value of the second mode selection resistor of the second mode selection circuit is adjustable; the maximum resistance value of the second mode selection resistor is greater than the resistance value of the first mode selection resistor, and the minimum resistance value of the second mode selection resistor is less than the resistance value of the first mode selection resistor; Use the host computer to connect to the primary side module control board and the secondary side module control board respectively to form a control loop, and send control pulses to the primary side power module and the secondary side power module. Connect the non-adjustable drive board and the adjustable drive board to an oscilloscope to display the VGE waveforms of the upper tubes corresponding to the non-adjustable drive board and the adjustable drive board. Adjust the resistance value of the second mode selection resistor so that the rising edge waveforms of the VGE waveform of the non-adjustable drive board overlap with those of the adjustable drive board, and the VGE waveform of the non-adjustable drive board is located at the center of the jitter afterglow of the VGE waveform of the adjustable drive board.

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