A power-on timing test method, device, electronic equipment and storage medium

Abstract

The present disclosure provides a power-on sequence testing method, device, electronic device and storage medium, comprising obtaining multiple waveforms output by an oscilloscope, including: test waveforms of two test points and a differential waveform between the two test points; determining a characteristic curve of a power-on sequence of the waveforms reflected on a first-order derivative of the differential waveform, and obtaining a local differential waveform; determining the correlation between the local differential waveform and the test waveforms of the two test points respectively; and determining the power-on sequence of the two test points according to the result of the correlation.

Description

Technical Field

[0001] The present disclosure relates to the field of computer technology, and in particular to a power-on sequence testing method, device, electronic device and storage medium. Background Art

[0002] The power-on timing test of electronic signals usually involves testing the test points with the probe of an oscilloscope, capturing waveform data, and obtaining the signal power-on sequence of the two test points by comparing the waveform data of the two test points.

[0003] The existing oscilloscope probe point test is implemented manually, such as using two single-ended probes to test two test points respectively to obtain the power-on sequence of the two test point signals. If a robotic arm is used instead of manual point test, at least two robotic arms are required. If the front end of the robotic arm is to be able to perform 360° point test like a human hand, a fixture needs to be installed at the front end of the robotic arm. The fixture needs to be equipped with a motor for driving, a positioning camera and other equipment, resulting in a large size of the fixture and a large space occupation. Each test point is equipped with a robotic arm and a probe, and it is easy for two adjacent robotic arms to interfere with each other during use. Summary of the invention

[0004] The present disclosure provides a power-on timing test method, device, electronic device and storage medium to at least solve the above technical problems existing in the prior art.

[0005] The present disclosure provides a power-on timing test method, comprising:

[0006] Acquire multiple waveforms output by the oscilloscope, including: test waveforms of two test points and a differential waveform between the two test points;

[0007] Determine a characteristic curve of the power-on sequence of the reaction waveform on the first-order derivative of the differential waveform to obtain a local differential waveform;

[0008] Determine the correlation between the local differential waveform and the test waveforms of the two test points respectively;

[0009] The power-on timing of the two test points is determined according to the correlation result.

[0010] In one possible implementation manner, the step of acquiring multiple waveforms output by an oscilloscope includes:

[0011] In response to the waveform triggering mode output by the oscilloscope, the mechanical arm is controlled to connect the positive electrode of the probe to the first test point of the two test points and the negative electrode to the ground wire, so that the oscilloscope collects the test waveform of the first test point;

[0012] In response to the waveform triggering mode output by the oscilloscope, the mechanical arm is controlled to connect the positive electrode of the probe to the ground wire and the negative electrode to the second test point of the two test points, so that the oscilloscope collects the test waveform of the second test point;

[0013] In response to the waveform triggering mode output by the oscilloscope, controlling the mechanical arm to connect the positive and negative electrodes of the probe to the first test point and the second test point respectively, so that the oscilloscope collects the differential waveform between the first test point and the second test point;

[0014] The test waveform of the first test point, the test waveform of the second test point and the differential waveform output by the oscilloscope are acquired.

[0015] In one possible implementation manner, determining the power-on timing of the two test points according to the correlation result includes:

[0016] If the result of the correlation between the test waveform of the first test point or the test waveform of the second test point and the local differential waveform is greater than a set threshold, it is determined that the first test point and the second test point are not powered on at the same time;

[0017] If the correlation results of the test waveform of the first test point and the test waveform of the second test point with the local differential waveform are both less than a set threshold, it is determined that the first test point and the second test point are powered on at the same time.

[0018] In one possible implementation manner, after determining that the first test point and the second test point are not powered on at the same time, the method further includes:

[0019] Determine a power-on timing difference between a first test point and a second test point;

[0020] Obtaining a derivative result of a local differential waveform with respect to the power-on timing difference;

[0021] If the derivative result is greater than 0, it is determined that the first test point is powered on first and the second test point is powered on later;

[0022] If the derivative result is less than 0, it is determined that the second test point is powered on first and the first test point is powered on later.

[0023] In one possible implementation manner, determining the power-on timing difference between the first test point and the second test point includes:

[0024] Use the following formula to determine;

[0025] t=(H / S)*K(d(AB))

[0026] t is the power-on timing difference, H is the oscilloscope sampling depth, S is the oscilloscope sampling rate, d(AB) is the local differential waveform, and K(d(AB)) is the number of discrete sampling points in the local differential waveform.

[0027] In one possible implementation manner, before calculating the characteristic curve of the power-on sequence of the reaction waveform on the first-order derivative of the differential waveform, the method further includes:

[0028] The test waveforms and the differential waveforms of the two test points are filtered separately.

[0029] Another aspect of the present disclosure provides a power-on sequence testing device, comprising:

[0030] An acquisition module, used for acquiring multiple waveforms output by the oscilloscope, including: test waveforms of two test points and a differential waveform between the two test points;

[0031] A calculation module, used to determine a characteristic curve of a power-on sequence of a reaction waveform on a first-order derivative of the differential waveform, and obtain a local differential waveform;

[0032] The calculation module is further used to determine the correlation between the local differential waveform and the waveforms of the two test points respectively;

[0033] The analysis module is used to determine the power-on timing of the two test points according to the correlation result.

[0034] In yet another aspect, the present disclosure provides an electronic device, comprising: a memory and a processor, wherein the memory stores a computer program executable by the processor, and the processor implements the above-mentioned power-on sequence test method when executing the computer program.

[0035] In another aspect, the present disclosure provides a storage medium, characterized in that a computer program is stored on the storage medium, and when the computer program is read and executed, the above-mentioned power-on sequence test method is implemented.

[0036] Based on the above scheme, the present disclosure provides a method for testing a power-on timing, by acquiring waveforms of two test points and a differential waveform between the two test points, and analyzing the differential waveform, a local differential waveform is obtained according to the differential waveform, and the power-on timing between the first test point and the second test point can be determined by calculating the correlation between the two test points and the local differential waveform respectively. Using this method, only one probe can be used to acquire the above-mentioned multiple waveforms respectively, and the power-on timing of the two test points can be analyzed without following the timing and order of acquiring the waveforms. The probe occupies little space when acquiring the waveform, and the test is convenient and there is no interference with the use of space. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Figure 1 FIG. 1 is a flow chart of a power-on timing test method provided by an embodiment of the present disclosure;

[0038] Figure 2Shown is a schematic diagram of a test waveform of a first test point provided by an embodiment of the present disclosure;

[0039] Figure 3 Shown is a schematic diagram of a test waveform of a second test point provided by an embodiment of the present disclosure;

[0040] Figure 4 FIG. 1 is a schematic diagram of a differential waveform in a rising edge trigger mode provided by an embodiment of the present disclosure;

[0041] Figure 5 Shown is a schematic diagram of the structure of a main control mechanism of a power-on sequence testing device provided in an embodiment of the present disclosure. DETAILED DESCRIPTION

[0042] In order to make the purpose, features, and advantages of the present disclosure more obvious and easy to understand, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the drawings in the embodiments of the present disclosure. Obviously, the described embodiments are only part of the embodiments of the present disclosure, not all of the embodiments. Based on the embodiments in the present disclosure, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present disclosure.

[0043] In order to save space, a robotic arm is used to control the probe to obtain the power-on timing of adjacent test points. Set up the main control mechanism, robotic arm and probe. The robotic arm is used to fix the probe. One robotic arm can only fix one probe at a time. The robotic arm is controlled by the main control mechanism signal to perform the following test method.

[0044] like Figure 1 As shown, an embodiment of the present disclosure provides a power-on timing test method, comprising:

[0045] Step 101 : acquiring a plurality of waveforms output by an oscilloscope, including: test waveforms of two test points and a differential waveform between the two test points.

[0046] In a power-on sequence test, an oscilloscope is usually used to obtain a waveform, and the waveform is displayed on the oscilloscope screen.

[0047] In one example, obtaining test waveforms of two test points includes first testing the first test point with a probe to obtain the test waveform output by the oscilloscope of the first test point, and then testing the second test point with the probe to obtain the test waveform output by the oscilloscope of the second test point.

[0048] In one example, one end of the probe is connected to the first test point and the other end is connected to the second test point to simultaneously test the first test point and the second test point. The difference between the two test waveforms of the first test point and the second test point, i.e., the differential waveform, can be obtained, and the differential waveform output by the oscilloscope can be obtained.

[0049] It should be noted that one probe can be used to obtain the test waveform of the first test point, the test waveform of the second test point, or the differential waveform of the two, in no particular order. The differential waveform is obtained by connecting the probe to two test points at the same time. The signal difference between the positive and negative ends of the probe is constructed by the test waveforms of the two test points. Therefore, the differential waveform contains the characteristics of the power-on timing of the two test points. For example, if the first test point is powered on at the 3rd second and the second test point is powered on at the 4th second, the differential waveform must begin to show a characteristic curve at the 3rd second. The characteristic curve at the 3rd second is the difference between the test waveform of the first test point at that point and the test waveform of the second test point at that point, and its content includes the characteristics of the power-on of the first test point.

[0050] In one example, in order to have a better display effect of the above waveform on the screen of the oscilloscope, the oscilloscope screen is set with appropriate x-axis (horizontal axis) scales and y-axis (vertical axis) scales so that the waveform can be fully presented on the screen of the oscilloscope whether it is going up or down, wherein the position where the voltage on the y-axis is 0 mV is set in the middle of the y-axis that can be presented on the oscilloscope screen, so that the waveform is positive when it is going up and negative when it is going down.

[0051] It should be emphasized that the starting point of each waveform is the same. For example, the starting point is when power is supplied to the mainboard, or the starting point is after a delay of a specific length of time based on power supply to the mainboard, as long as the starting point of each waveform is the same. For example, when obtaining the test waveform of the first test point, connect the probe to the first test point, and start obtaining the test waveform when power is supplied to the mainboard; when obtaining the test waveform of the second test point, connect the probe to the second test point, and also start obtaining the test waveform when power is supplied to the mainboard. For another example, when obtaining the test waveform of the first test point, connect the probe to the first test point, supply power to the mainboard, and start obtaining the test waveform after n seconds; when obtaining the test waveform of the second test point, connect the probe to the second test point, supply power to the mainboard, and start obtaining the test waveform after m seconds, then the values ​​of m and n should be the same.

[0052] Step 102, determining a characteristic curve of a power-on sequence of a reaction waveform on a first-order derivative of the differential waveform, and obtaining a local differential waveform.

[0053] In one example, determining a characteristic curve of the power-on sequence of the reaction waveform on the first-order derivative of the differential waveform is to calculate the first monotonic interval of the first-order derivative of the differential waveform.

[0054] Since the differential waveform is the difference between the test waveform of the first test point and the test waveform of the second test point, before the first test point and the second test point are powered on, both test waveforms are horizontal waveforms without fluctuations, so the differential waveform before any test point is powered on is also a horizontal waveform without fluctuations. After the two test points are powered on in sequence, the value of the differential waveform on the vertical axis corresponds to the difference between the test waveforms of the two test points at each moment, so calculating the first-order derivative of the differential waveform can reflect the increasing rising interval or the decreasing falling interval of the difference, and the waveform fluctuates only when powered on, and therefore the first monotonic interval reflects the characteristics of the waveform generated by any test point that is powered on first.

[0055] For example, the test waveform of the first test point presents a curve of power-on characteristics from 3 seconds to 4 seconds, and the test waveform of the second test point presents a curve of power-on characteristics from 3.5 seconds to 5 seconds. The curve presented by the difference between the differential waveforms of the two from 3 seconds to 3.5 seconds is the same as the curve of the power-on characteristics presented by the test waveform of the first test point from 3 seconds to 3.5 seconds and shows an increasing trend. The curve of the differential waveform from 3.5 seconds to 4 seconds may increase or decrease, but the first monotonic interval of the differential waveform must reflect the power-on characteristics from 3 seconds to 3.5 seconds. Therefore, by calculating the first monotonic interval of the first-order derivative of the differential waveform as the local differential waveform, the power-on timing characteristics of the first test point and the second test point can be reflected.

[0056] Step 103: Determine the correlation between the local differential waveform and the test waveforms of the two test points.

[0057] In one example, the differential waveform is determined by the difference between the test waveform of the first test point and the test waveform of the second test point. Therefore, the correlation with the test waveform of the first test point and the test waveform of the second test point can be determined by analyzing the local differential waveform that reflects the power-on characteristics. The correlation is used to describe the relationship between the local differential waveform and the test waveform of the first test point or the test waveform of the second test point, respectively, and combined with subsequent calculations, the power-on timing of the first test point and the second test point is determined.

[0058] Step 104: Determine the power-on timing of the two test points according to the correlation result.

[0059] The result of the correlation is usually presented in a numerical form. According to experience, a threshold value can be set to measure whether the result of the correlation is strong or weak. A value greater than the threshold value indicates a strong correlation, and a value less than the threshold value indicates a weak correlation. Combined with step 103, it can be known that by judging the strength of the correlation between the local differential waveform and the first test point, and judging the strength of the correlation between the local differential waveform and the second test point, the power-on timing of the two test points can be determined.

[0060] The present invention obtains waveforms of two test points and a differential waveform between the two test points, and analyzes the differential waveform, obtains a local differential waveform according to the differential waveform, and determines the power-on timing between the first test point and the second test point by calculating the correlation between the two test points and the local differential waveform respectively. This method can be used to obtain the above-mentioned multiple waveforms respectively with only one probe rod, and the power-on timing of the two test points can be analyzed without following the timing and order of obtaining the waveforms. The probe occupies little space when obtaining the waveform, and the test is convenient and there is no interference with the use of space.

[0061] In one example, in step 101, the step of obtaining multiple waveforms output by an oscilloscope includes:

[0062] like Figure 2 As shown, in response to the waveform triggering mode output by the oscilloscope, the robot arm is controlled to connect the positive pole of the probe to the first test point of the two test points and the negative pole to the ground wire, so that the oscilloscope collects the test waveform of the first test point.

[0063] like Figure 3 As shown, in response to the waveform triggering mode output by the oscilloscope, the robot arm is controlled to connect the positive pole of the probe to the ground wire and the negative pole to the second test point of the two test points, so that the oscilloscope collects the test waveform of the second test point.

[0064] like Figure 4 As shown, in response to the waveform triggering mode output by the oscilloscope, the robotic arm is controlled to connect the positive and negative poles of the probe to the first test point and the second test point respectively, so that the oscilloscope collects the differential waveform between the first test point and the second test point.

[0065] The test waveform of the first test point, the test waveform of the second test point and the differential waveform output by the oscilloscope are acquired.

[0066] In one example, the waveform triggering mode output by the oscilloscope includes rising edge triggering and falling edge triggering. The rising edge triggering includes setting the trigger position at an upward position close to 0 so that the upward waveform is triggered as soon as possible, and the falling edge triggering includes setting the trigger position at a downward position close to 0 so that the downward waveform is triggered as soon as possible.

[0067] In one example, the waveform triggering mode in response to the output of the oscilloscope includes setting the waveform triggering mode of the oscilloscope in advance, connecting the probe to the test point and powering on, and displaying the test waveform after the test point is powered on according to the set waveform triggering mode. For example, if the waveform triggering mode is set to rising edge triggering, the test waveform displayed on the screen of the oscilloscope after the test point is powered on is an upward waveform, and if the waveform triggering mode is set to falling edge triggering, the test waveform displayed on the screen of the oscilloscope after the test point is powered on is a downward waveform.

[0068] In one example, when the probe is only connected to the first test point, the waveform trigger mode of the oscilloscope can be set to rising edge trigger, so that the test waveform of the first test point is in an upward state. When the probe is only connected to the second test point, the waveform trigger mode of the oscilloscope can be set to falling edge trigger, so that the test waveform of the second test point is in a downward state. The waveform trigger modes when acquiring the test waveforms at the above two test points can also be interchanged, as long as the test waveforms of the two test points can be clearly distinguished.

[0069] In one example, if the differential waveform between the two test points is not obtained, it is determined that the first test point and the second test point are powered on at the same time, and the test waveform of the first test point is the same or similar to the test waveform of the second test point. For example, the first test point is powered on at the 3rd second, and the second test point is also powered on at the 3rd second. If the difference between the two at the 3rd second is to be 0, that is, the differential waveform at the 3rd second is horizontal, then the value of the vertical axis corresponding to the test waveform of the first test point at the 3rd second is the same as the value of the vertical axis corresponding to the test waveform of the second test point at the 3rd second. Similarly, if there is no difference regardless of how many seconds, the test waveform of the first test point is the same or similar as a whole.

[0070] In one example, in step 104, determining the power-on timing of the two test points according to the correlation result includes:

[0071] If the correlation result of the test waveform of the first test point or the test waveform of the second test point with the local differential waveform is greater than a set threshold, it is determined that the first test point and the second test point are not powered on at the same time.

[0072] If the correlation results of the test waveform of the first test point and the test waveform of the second test point with the local differential waveform are both less than a set threshold, it is determined that the first test point and the second test point are powered on at the same time.

[0073] In one example, the threshold is set to 0.5, that is, the correlation result is greater than 0.5, indicating that the correlation is strong, and the closer it is to 1, the stronger the correlation is. The correlation result is less than 0.5, indicating that the correlation is weak, and the closer it is to 0, the weaker the correlation is.

[0074] In one example, if the result of the correlation between the test waveform of the first test point or the test waveform of the second test point and the local differential waveform is greater than 0.5, it means that the correlation between the test waveform of the first test point and the test waveform of the second test point and the local differential waveform is strong, and the local differential waveform represents the characteristic curve of the difference between the test waveform of the first test point and the test waveform of the second test point, and the local differential waveform is a characteristic curve of the waveform power-on sequence, which reflects the power-on situation according to step 102. Therefore, if the result of the correlation between the test waveform of the first test point or the test waveform of the second test point and the local differential waveform is greater than 0.5, it can be determined that the first test point and the second test point are not powered on at the same time.

[0075] In one example, if the result of the correlation between the test waveform of the first test point and the test waveform of the second test point and the local differential waveform is less than 0.5, it means that the correlation between the test waveform of the first test point and the test waveform of the second test point and the local differential waveform is weak, and it can be considered that there is no local correlation, and the local differential waveform represents the characteristic curve of the difference between the test waveform of the first test point and the test waveform of the second test point, and the local differential waveform is the characteristic curve of the waveform power-on sequence, which reflects the power-on situation according to step 102. Therefore, if the result of the correlation between the test waveform of the first test point and the test waveform of the second test point and the local differential waveform is less than 0.5, it is determined that the first test point and the second test point are powered on at the same time.

[0076] In one example, after determining that the first test point and the second test point are not powered on at the same time, the method further includes:

[0077] Determine a power-on timing difference between a first test point and a second test point;

[0078] Obtaining a derivative result of a local differential waveform with respect to the power-on timing difference;

[0079] If the derivative result is greater than 0, it is determined that the first test point is powered on first and the second test point is powered on later;

[0080] If the derivative result is less than 0, it is determined that the second test point is powered on first and the first test point is powered on later.

[0081] In one example, if it is determined that the first test point and the second test point are not powered on at the same time, it is necessary to further determine the power-on timing of the first test point and the second test point. First, the power-on timing difference between the two is calculated, and the local differential waveform is derived using the power-on timing difference, and the determination is made based on the derivative result.

[0082] If the derivative result d(AB) / dt is greater than 0, it means that the difference between the test waveform of the first test point and the test waveform of the second test point increases in a local range, and the local range is within the first monotonic interval. According to step 102, the local range reflects the power-on characteristic curve, so it is determined that the first test point is powered on before the second test point.

[0083] If the derivative result d(AB) / dt is less than 0, it means that the difference between the test waveform of the first test point and the test waveform of the second test point decreases in a local range, and the local range is within the first monotonic interval. According to step 102, the local range reflects the power-on characteristic curve, so it is determined that the second test point is powered on before the first test point.

[0084] By determining the power-on timing difference and the derivation result, the power-on timing of the first test point and the second test point can be quickly determined.

[0085] In one example, determining a power-on timing difference between a first test point and a second test point includes:

[0086] Determine using the following formula: t = (H / S)*K(d(AB));

[0087] The t is the power-on timing difference, H is the oscilloscope sampling depth, S is the oscilloscope sampling rate, d(AB) is the local differential waveform, and K(d(AB)) is the number of discrete sampling points in the local differential waveform.

[0088] Among them, the oscilloscope sampling depth and the oscilloscope sampling rate can be directly obtained through the parameters of the oscilloscope. K(d(AB)) is the number of discrete sampling points in the local differential waveform, which can also be regarded as the data volume.

[0089] In one example, in step 102, before determining the characteristic curve of the first-order derivative of the differential waveform reflecting the waveform power-on sequence, the method further includes:

[0090] The test waveforms and the differential waveforms of the two test points are filtered separately.

[0091] In order to remove the noise signal, it is also necessary to filter the test waveform of the first test point, the test waveform of the second test point and the differential waveform respectively, such as by using mean filtering to reduce the impact of sharp and interfering signals on subsequent judgments.

[0092] In an example, taking rising edge trigger as a first test point in response to a waveform trigger mode of an oscilloscope output, and taking falling edge trigger as a second test point in response to a waveform trigger mode of an oscilloscope output as an example, the present disclosure further provides a specific embodiment, including:

[0093] In response to the rising edge trigger of the oscilloscope output, the robot arm is controlled to connect the positive electrode of the probe to the first test point of the two test points and the negative electrode to the ground wire, so that the oscilloscope collects the test waveform of the first test point.

[0094] In response to the falling edge trigger of the oscilloscope output, the robot arm is controlled to connect the positive electrode of the probe to the ground wire and the negative electrode to the second test point of the two test points, so that the oscilloscope collects the test waveform of the second test point.

[0095] In response to the rising edge trigger of the oscilloscope output, the mechanical arm is controlled to connect the positive and negative electrodes of the probe to the first test point and the second test point respectively, so that the oscilloscope collects the differential waveform between the first test point and the second test point.

[0096] If the differential waveform is not collected, it is determined that the differential waveform may be in a downward state, so the oscilloscope is triggered in response to the falling edge of the oscilloscope output so that the oscilloscope collects the differential waveform between the first test point and the second test point.

[0097] If the differential waveform between the two test points is not obtained, it is determined that the first test point and the second test point are powered on at the same time, and the test waveform of the first test point is the same as or similar to the test waveform of the second test point.

[0098] Determine the first monotonic interval of the first derivative of the difference waveform to obtain the local difference waveform.

[0099] The correlation between the local differential waveform and the test waveforms of the two test points is determined, and the power-on status of the first test point and the second test point is determined according to the result of the correlation.

[0100] If the result of the correlation between the test waveform of the first test point or the test waveform of the second test point and the local differential waveform is greater than 0.5, it can be determined that the first test point and the second test point are not powered on at the same time. Then the power-on timing difference between the first test point and the second test point is calculated, and the local differential waveform is derived using the power-on timing difference to obtain the derivative result of the derivative. It should be understood that if the first test point and the second test point are not powered on at the same time, the result of the correlation between the test waveform of the first test point or the test waveform of the second test point and the local differential waveform should actually be close to 1.

[0101] If the derivative result is greater than 0, it is determined that within the range corresponding to the first monotonic interval, the difference between the first test point and the second test point is a positive value, and it is determined that the first test point is powered on before the second test point;

[0102] If the derivative result is less than 0, it is determined that within the range corresponding to the first monotonic interval, the difference between the first test point and the second test point is a negative value, and it is determined that the second test point is powered on before the first test point.

[0103] If the correlation results of the test waveform of the first test point and the test waveform of the second test point with the local differential waveform are both less than 0.5, since the local differential waveform can represent the power-on condition, it can be determined that the first test point and the second test point are powered on at the same time. It should be understood that if the first test point and the second test point are powered on at the same time, the correlation results of the test waveform of the first test point or the test waveform of the second test point with the local differential waveform should actually be close to 0.

[0104] An embodiment of the present disclosure further provides a power-on timing test system, which includes a main control mechanism, a mechanical arm and a differential probe, wherein the mechanical arm is used to fix the differential probe, and one mechanical arm fixes one differential probe at a time, wherein the mechanical arm is controlled by a signal from the main control mechanism.

[0105] An embodiment of the present disclosure further provides a power-on sequence test device, which is applied to a main control mechanism, such as Figure 5 As shown, the device comprises:

[0106] The acquisition module 10 is used to acquire multiple waveforms output by the oscilloscope, including: test waveforms of two test points and a differential waveform between the two test points;

[0107] The acquisition module 10 is also used to control the robotic arm to connect the positive pole of the probe to the first test point of the two test points and the negative pole to the ground wire in response to the waveform triggering mode output by the oscilloscope, so that the oscilloscope can collect the test waveform of the first test point.

[0108] In response to the waveform triggering mode output by the oscilloscope, the robot arm is controlled to connect the positive pole of the probe to the ground wire and the negative pole to the second test point of the two test points, so that the oscilloscope collects the test waveform of the second test point.

[0109] In response to the waveform triggering mode output by the oscilloscope, the robot arm is controlled to connect the positive and negative poles of the probe to the first test point and the second test point respectively, so that the oscilloscope collects the differential waveform between the first test point and the second test point.

[0110] The test waveform of the first test point, the test waveform of the second test point and the differential waveform output by the oscilloscope are acquired.

[0111] A calculation module 20, used to determine a characteristic curve of a power-on sequence of a reaction waveform on a first-order derivative of the differential waveform, and obtain a local differential waveform;

[0112] The calculation module 20 is further used to determine the correlation between the local differential waveform and the waveforms of the two test points respectively;

[0113] The calculation module 20 is further used to determine the power-on timing difference between the first test point and the second test point;

[0114] A derivative result of the local differential waveform with respect to the power-on timing difference is obtained.

[0115] The calculation module 20 is also used to determine using the following formula: t = (H / S) * K (d (AB));

[0116] The t is the power-on timing difference, H is the oscilloscope sampling depth, S is the oscilloscope sampling rate, d(AB) is the local differential waveform, and K(d(AB)) is the number of discrete sampling points in the local differential waveform.

[0117] The calculation module 20 is also used to filter the test waveforms and the differential waveforms of the two test points respectively.

[0118] The analysis module 30 is used to determine the power-on timing of the two test points according to the correlation result.

[0119] The analysis module 30 is further configured to determine that the first test point and the second test point are not powered on at the same time if the correlation result of the test waveform of the first test point or the test waveform of the second test point with the local differential waveform is greater than a set threshold.

[0120] If the correlation results of the test waveform of the first test point and the test waveform of the second test point with the local differential waveform are both less than a set threshold, it is determined that the first test point and the second test point are powered on at the same time.

[0121] The analysis module 30 is further used to determine that the first test point is powered on first and the second test point is powered on later if the derivative result is greater than 0;

[0122] If the derivative result is less than 0, it is determined that the second test point is powered on first and the first test point is powered on later.

[0123] The present invention also provides a computer-readable storage medium, wherein the storage medium stores a computer program, and the computer program is used to execute the power-on sequence testing method of the present invention.

[0124] Another aspect of the present invention provides an electronic device, comprising:

[0125] processor;

[0126] a memory for storing instructions executable by the processor;

[0127] The processor is used to read the executable instructions from the memory and execute the instructions to implement the power-on sequence testing method of the present invention.

[0128] In addition to the above-mentioned methods and apparatus, an embodiment of the present application may also be a computer program product, which includes computer program instructions, which, when executed by a processor, enable the processor to execute the steps of the method according to various embodiments of the present application described in the above-mentioned “Exemplary Method” section of this specification.

[0129] The computer program product may be written in any combination of one or more programming languages ​​to write program codes for performing the operations of the embodiments of the present application, including object-oriented programming languages, such as Java, C++, etc., and conventional procedural programming languages, such as "C" language or similar programming languages. The program code may be executed entirely on the user computing device, partially on the user device, as an independent software package, partially on the user computing device and partially on a remote computing device, or entirely on a remote computing device or server.

[0130] In addition, an embodiment of the present application may also be a computer-readable storage medium on which computer program instructions are stored. When the computer program instructions are executed by a processor, the processor executes the steps of the method according to various embodiments of the present application described in the above "Exemplary Method" section of this specification.

[0131] The computer readable storage medium can adopt any combination of one or more readable media. The readable medium can be a readable signal medium or a readable storage medium. The readable storage medium can include, for example, but is not limited to, a system, device or device of electricity, magnetism, light, electromagnetic, infrared, or semiconductor, or any combination of the above. More specific examples (non-exhaustive list) of readable storage media include: an electrical connection with one or more wires, a portable disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above.

[0132] The basic principles of the present application are described above in conjunction with specific embodiments. However, it should be noted that the advantages, strengths, effects, etc. mentioned in the present application are only examples and not limitations, and it cannot be considered that these advantages, strengths, effects, etc. are required by each embodiment of the present application. In addition, the specific details disclosed above are only for the purpose of illustration and ease of understanding, not for limitation, and the above details do not limit the present application to being implemented by adopting the above specific details.

[0133] The block diagrams of the devices, apparatuses, equipment, and systems involved in this application are only illustrative examples and are not intended to require or imply that they must be connected, arranged, and configured in the manner shown in the block diagram. As will be appreciated by those skilled in the art, these devices, apparatuses, equipment, and systems can be connected, arranged, and configured in any manner. Words such as "including", "comprising", "having", etc. are open words, referring to "including but not limited to", and can be used interchangeably with them. The words "or" and "and" used here refer to the words "and / or" and can be used interchangeably with them, unless the context clearly indicates otherwise. The words "such as" used here refer to the phrase "such as but not limited to", and can be used interchangeably with them.

[0134] It should also be noted that in the apparatus, device and method of the present application, each component or each step can be decomposed and / or recombined. Such decomposition and / or recombination should be regarded as equivalent solutions of the present application.

[0135] The above description of the disclosed aspects is provided to enable any person skilled in the art to make or use the present application. Various modifications to these aspects will be readily apparent to those skilled in the art, and the general principles defined herein may be applied to other aspects without departing from the scope of the present application. Therefore, the present application is not intended to be limited to the aspects shown herein, but rather to the widest scope consistent with the principles and novel features disclosed herein.

[0136] The above description has been given for the purpose of illustration and description. In addition, this description is not intended to limit the embodiments of the present application to the forms disclosed herein. Although multiple example aspects and embodiments have been discussed above, those skilled in the art will recognize certain variations, modifications, changes, additions and sub-combinations thereof.

Claims

1. A method for testing a power-on sequence, characterized in that: include: Acquire multiple waveforms output by the oscilloscope, including: test waveforms of two test points and a differential waveform between the two test points, the two test points including a first test point and a second test point; Determine a characteristic curve of the power-on sequence of the reaction waveform on the first-order derivative of the differential waveform to obtain a local differential waveform; Determine the correlation between the local differential waveform and the test waveforms of the two test points respectively; Determine the power-on timing of the two test points according to the correlation result; The step of determining the power-on timing of the two test points according to the correlation result includes: If the result of the correlation between the test waveform of the first test point or the test waveform of the second test point and the local differential waveform is greater than a set threshold, determining that the first test point and the second test point are not powered on at the same time; If the correlation results of the test waveform of the first test point and the test waveform of the second test point with the local differential waveform are both less than a set threshold, determining that the first test point and the second test point are powered on at the same time; After determining that the first test point and the second test point are not powered on at the same time, the method further includes: Determine a power-on timing difference between the first test point and the second test point; Obtaining a derivative result of the local differential waveform with respect to the power-on timing difference; If the derivative result is greater than 0, it is determined that the first test point is powered on first and the second test point is powered on later; If the derivative result is less than 0, it is determined that the second test point is powered on first and the first test point is powered on later.

2. The power-on sequence testing method according to claim 1, characterized in that: The step of obtaining multiple waveforms output by the oscilloscope includes: In response to the waveform triggering mode output by the oscilloscope, the mechanical arm is controlled to connect the positive electrode of the probe to the first test point of the two test points and the negative electrode to the ground wire, so that the oscilloscope collects the test waveform of the first test point; In response to the waveform triggering mode output by the oscilloscope, the mechanical arm is controlled to connect the positive electrode of the probe to the ground wire and the negative electrode to the second test point of the two test points, so that the oscilloscope collects the test waveform of the second test point; In response to the waveform triggering mode output by the oscilloscope, controlling the mechanical arm to connect the positive and negative electrodes of the probe to the first test point and the second test point respectively, so that the oscilloscope collects the differential waveform between the first test point and the second test point; The test waveform of the first test point, the test waveform of the second test point and the differential waveform output by the oscilloscope are acquired.

3. The power-on sequence testing method according to claim 1, characterized in that: The step of determining a power-on timing difference between a first test point and a second test point includes: Determine using the following formula: t = (H / S)*K(d(AB)); The t is the power-on timing difference, H is the oscilloscope sampling depth, S is the oscilloscope sampling rate, d(AB) is the local differential waveform, and K(d(AB)) is the number of discrete sampling points in the local differential waveform.

4. The power-on sequence testing method according to claim 1, characterized in that: Before determining the characteristic curve of the power-on sequence of the reaction waveform on the first-order derivative of the differential waveform, the method further includes: The test waveforms and the differential waveforms of the two test points are filtered separately.

5. A power-on sequence test device, characterized in that: include: An acquisition module, used for acquiring multiple waveforms output by the oscilloscope, including: test waveforms of two test points and a differential waveform between the two test points, the two test points including a first test point and a second test point; A calculation module, used to determine a characteristic curve of a power-on sequence of a reaction waveform on a first-order derivative of the differential waveform, and obtain a local differential waveform; The calculation module is further used to determine the correlation between the local differential waveform and the waveforms of the two test points respectively; An analysis module, used to determine the power-on timing of the two test points according to the correlation result; The analysis module is further configured to determine that the first test point and the second test point are not powered on at the same time if the result of the correlation between the test waveform of the first test point or the test waveform of the second test point and the local differential waveform is greater than a set threshold; If the correlation results of the test waveform of the first test point and the test waveform of the second test point with the local differential waveform are both less than a set threshold, determining that the first test point and the second test point are powered on at the same time; The calculation module is further used to determine a power-on timing difference between the first test point and the second test point; Obtaining a derivative result of the local differential waveform with respect to the power-on timing difference; The analysis module is further configured to determine that the first test point is powered on first and the second test point is powered on later if the derivative result is greater than 0; If the derivative result is less than 0, it is determined that the second test point is powered on first and the first test point is powered on later.

6. The power-on sequence testing device according to claim 5, characterized in that: The acquisition module is also used for: In response to the waveform triggering mode output by the oscilloscope, the mechanical arm is controlled to connect the positive electrode of the probe to the first test point of the two test points and the negative electrode to the ground wire, so that the oscilloscope collects the test waveform of the first test point; In response to the waveform triggering mode output by the oscilloscope, the mechanical arm is controlled to connect the positive electrode of the probe to the ground wire and the negative electrode to the second test point of the two test points, so that the oscilloscope collects the test waveform of the second test point; In response to the waveform triggering mode output by the oscilloscope, controlling the mechanical arm to connect the positive and negative electrodes of the probe to the first test point and the second test point respectively, so that the oscilloscope collects the differential waveform between the first test point and the second test point; The test waveform of the first test point, the test waveform of the second test point and the differential waveform output by the oscilloscope are acquired.

7. An electronic device, characterized in that: include: A memory and a processor, wherein the memory stores a computer program executable by the processor, and the processor implements the power-on timing test method described in any one of claims 1 to 4 when executing the computer program.

8. A storage medium, characterized in that: The storage medium stores a computer program, and when the computer program is read and executed, the power-on sequence testing method described in any one of claims 1 to 4 is implemented.

Images