A multi-channel pd testing method and system

Abstract

The present application relates to a kind of multi-channel PD test method and system.The method part mainly includes: setting several optical test interface sites and several to be tested PD one-to-one correspondence, and setting several switch ports and several optical test interface sites one-to-one correspondence;Each switch port is sequentially connected, to test each to be tested PD, and based on whether to be tested PD passes test to mark the optical test interface site of normal test and the optical test interface site of abnormal test;The to be tested PD that passes test is multiplexed to the optical test interface site of abnormal test, and participates in the next round of test, to determine whether the optical test interface site of abnormal test before exists problem by the result of the next round of test.The present application can solve the problem of test site test failure and easily discard abnormal test site.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of optical communication technology, in particular to a multi-channel PD testing method and system. BACKGROUND

[0002] In the process of optical communication, the optical power in the optical link needs to be monitored. With the development of the communication industry, the rise of 5G network construction promotes the expansion and upgrading of optical transmission systems, and the monitoring of optical power requires a large number of power, high precision and a wide range. Among them, the calibration and testing of PD (Photo-Diode, photodiode) is a common testing method.

[0003] In the previous PD (Photo-Diode, photodiode) testing scheme, only single-channel testing can be performed, which does not meet the current development trend, and when multi-channel testing is used, testing failures often occur. For example, in the case of a number of test sites corresponding to a number of PDs, some PDs do not pass the test. At this time, the PDs that do not pass the test are usually treated as test failures, but in fact, the PD testing failure may be caused by the abnormality of the test site, resulting in testing failure. In addition, when the test site is abnormal, the test site is often abandoned, but in fact, the abnormality of the test site can be solved by adjusting the input of the optical power corresponding to it. In this case, abandoning the test site is a waste of behavior, which reduces the number of one-time tests and the testing efficiency of the system under the condition of full working state coverage.

[0004] In view of the above situation, how to overcome the defects of the prior art and solve the problems of test site testing failure and abandonment of abnormal test sites is a difficult problem to be solved in this technical field. SUMMARY

[0005] In view of the above defects or improvement needs of the prior art, the present application provides a multi-channel PD testing method and system. After one round of testing, the tested PDs that pass the test are multiplexed to the optical test interface site that does not test normally, so as to determine whether the PD has a problem or the optical test interface site has a problem after the next round of testing, reduce the probability of test site testing failure, and further determine whether the optical test interface site with a problem can be compensated for stability by adjusting the optical power. If so, the optical test interface site is not abandoned. The present application can solve the problems of test site testing failure and easy abandonment of abnormal test sites.

[0006] The embodiments of the present application adopt the following technical solutions:

[0007] In a first aspect, the present application provides a multi-channel PD testing method, comprising:

[0008] a plurality of optical test interface positions are set in one-to-one correspondence with the plurality of PDs to be tested, and a plurality of switch openings are set in one-to-one correspondence with the plurality of optical test interface positions;

[0009] each switch opening is sequentially turned on to test each PD to be tested, and the optical test interface positions in which the PDs to be tested pass the test and the optical test interface positions in which the PDs to be tested fail the test are marked based on whether the PDs to be tested pass the test;

[0010] the PDs to be tested that pass the test are multiplexed to the optical test interface positions in which the PDs to be tested fail the test, and participate in the next round of test, so as to determine whether the optical test interface positions in which the PDs to be tested fail the test have problems based on the results of the next round of test.

[0011] Further, the marking of the optical test interface positions in which the PDs to be tested pass the test and the optical test interface positions in which the PDs to be tested fail the test based on whether the PDs to be tested pass the test specifically includes:

[0012] if the PD to be tested passes the test, the optical test interface position corresponding to the PD to be tested that passes the test is marked as the optical test interface position in which the PD to be tested passes the test;

[0013] if the PD to be tested fails the test, the optical test interface position corresponding to the PD to be tested that fails the test is marked as the optical test interface position in which the PD to be tested fails the test.

[0014] Further, the multiplexing of the PDs to be tested that pass the test to the optical test interface positions in which the PDs to be tested fail the test, and the participation of the PDs to be tested that pass the test in the next round of test, so as to determine whether the optical test interface positions in which the PDs to be tested fail the test have problems based on the results of the next round of test specifically includes:

[0015] if the PD to be tested that passes the test is multiplexed to the optical test interface position in which the PD to be tested fails the test, and passes the test in the next round of test, the optical test interface position in which the PD to be tested fails the test is re-marked as the optical test interface position in which the PD to be tested passes the test;

[0016] if the PD to be tested that passes the test is multiplexed to the optical test interface position in which the PD to be tested fails the test, and fails the test in the next round of test, the optical test interface position in which the PD to be tested fails the test is marked as the optical test interface position in which the PD to be tested has problems.

[0017] Further, it further includes:

[0018] for the optical test interface position in which the PD to be tested has problems, whether the stability of the optical test interface position in which the PD to be tested has problems can be compensated for is determined by adjusting the optical power.

[0019] Further, the compensation for the stability of the optical test interface position in which the PD to be tested has problems by adjusting the optical power specifically includes:

[0020] acquiring the optical power output by the tested PD passing the test and marking as normal optical power;

[0021] adjusting the input optical power of the problematic optical test interface position to try to make the tested PD corresponding to the problematic optical test interface position pass the test and output normal optical power;

[0022] If the attempt is successful, it is determined that the stability of the corresponding optical test interface position can be compensated by adjusting the optical power, and if the attempt is unsuccessful, it is determined that the stability of the corresponding optical test interface position cannot be compensated by adjusting the optical power.

[0023] Further, if the attempt is successful, the input optical power of the problematic optical test interface position is set to the input optical power at the time of the successful attempt, so that the input optical power at the time of the successful attempt is applied to the problematic optical test interface position in subsequent test rounds.

[0024] In a second aspect, the present application provides a multi-channel PD test system for implementing the multi-channel PD test method as described in the first aspect, the system comprising switch ports, optical test interface positions, tested PDs, optical input modules, and a test control module, wherein:

[0025] The tested PDs are provided in a plurality, the optical test interface positions are provided in a plurality corresponding one-to-one to the tested PDs, and the switch ports are provided in a plurality corresponding one-to-one to the optical test interface positions;

[0026] The optical input modules are connected to the switch ports to input optical power of a certain power to perform testing of the tested PDs when each switch port is closed;

[0027] The test control module is used to test each tested PD and mark the optical test interface positions passing the test and the optical test interface positions not passing the test based on whether the tested PD passes the test; the test control module is also used to multiplex the tested PD passing the test to the optical test interface position not passing the test and participate in the next round of testing to determine whether the previous optical test interface position not passing the test is problematic based on the result of the next round of testing.

[0028] Further, the optical power monitoring module is used to acquire the optical power output by the PD under test, and mark the optical power output by the PD under test passing the test as normal optical power; the test control module is further used to adjust the input optical power of the problematic optical test interface position, so as to attempt to make the PD under test corresponding to the problematic optical test interface position pass the test and output normal optical power; if the attempt is successful, the test control module further sets the input optical power of the problematic optical test interface position as the input optical power at the time of the successful attempt, so that the input optical power at the time of the successful attempt is applied to the problematic optical test interface position in the subsequent test round.

[0029] Further, the optical power monitoring module and the test control module are integrated in the same software control module.

[0030] Further, the optical input module comprises a wide light source, a laser and an optical power adjustment module, wherein:

[0031] The wide light source and the laser are used to generate optical signals;

[0032] The optical power adjustment module is used to adjust the optical power of the optical signals generated by the wide light source and the laser, so as to input the optical signals with corresponding optical power to the corresponding optical test interface position when the corresponding switch port is closed, thereby testing the corresponding PD under test.

[0033] Compared with the prior art, the beneficial effects of the present application are that after one round of test, the PD under test passing the test is multiplexed to the optical test interface position not passing the test, so as to determine whether the PD under test or the optical test interface position is problematic after the next round of test, thereby reducing the test failure probability of the test position; in addition, the problematic optical test interface position is further determined to determine whether it can be compensated for stability by adjusting the optical power, and if so, the optical test interface position is not discarded, and the present application can solve the problems of test failure of the test position and easy discarding of the abnormal test position. BRIEF DESCRIPTION OF DRAWINGS

[0034] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the drawings needed to be used in the embodiments of the present application. Obviously, the drawings described below are only some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained from these drawings without creative labor.

[0035] Figure 1 A multi-channel PD test method flow chart is provided for Embodiment 1 of the present application;

[0036] Figure 2This is a schematic diagram of the extended process of step 200 in Embodiment 1 of the present invention;

[0037] Figure 3 This is a schematic diagram of the extended process of step 300 in Embodiment 1 of the present invention;

[0038] Figure 4 This is a schematic diagram of the extended process of step 400 in Embodiment 1 of the present invention;

[0039] Figure 5 This is a connection diagram of a multi-channel PD testing system provided in Embodiment 2 of the present invention;

[0040] Figure 6 This is a schematic diagram of a multi-channel PD testing device provided in Embodiment 3 of the present invention. Detailed Implementation

[0041] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.

[0042] Furthermore, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other. The present invention will now be described in detail with reference to the accompanying drawings and embodiments.

[0043] Example 1:

[0044] like Figure 1 As shown, Embodiment 1 of the present invention provides a multi-channel PD testing method, which includes the following steps:

[0045] Step 100: Assign a number of optical test interface bits to a number of devices under test (PDs), and assign a number of switch ports to a number of optical test interface bits. This step establishes a one-to-one correspondence between the PDs under test, the optical test interface bits, and the switch ports. This allows the corresponding optical test interface bit to be activated by closing each switch port, thus enabling testing of the corresponding PD under test. It should be noted that in this embodiment, the "number of" PDs under test, optical test interface bits, and switch ports is generally at least 36, but can also be 64, 72, or more, depending on the requirements and available resources.

[0046] Step 200: Turn on each switch port in turn to test each PD under test, and mark the optical test interface bit that passes the test and the optical test interface bit that fails the test based on whether the PD under test passes the test. This step describes a round of testing of the PD under test. For example, if there are 36 PDs under test in each round, then each switch port corresponding to the PD under test is turned on in turn, for example, the switch port corresponding to the first PD under test is turned on first, and the other switch ports are turned off, so as to test the first PD under test. Then, the switch port corresponding to the second PD under test is turned on, and the other switch ports are turned off, so as to test the second PD under test. In this way, the 36 PDs under test are tested one by one. After the test is completed, the optical test interface bit that passes the test and the optical test interface bit that fails the test are marked based on whether the PD under test passes the test, so as to facilitate the next step of judging the optical test interface bit that fails the test.

[0047] Step 300: Multiplex the PD under test that passes the test to the optical test interface bit that fails the test, and participate in the next round of test, so as to determine whether the optical test interface bit that fails the test has a problem or not through the result of the next round of test. After the test of the PD under test in the previous round is completed, it is found that there is a PD under test that fails the test. According to the conventional method, the PD under test that fails the test is determined to have a problem. However, in this process, there may be a false judgment. For example, the PD under test actually has no problem, and the optical test interface bit corresponding to the PD under test has a problem. Therefore, this step is to analyze the false judgment, and multiplex the PD under test that passes the test to the optical test interface bit that fails the test through the next round of test, so as to determine whether the PD under test that fails the test actually has a problem or the optical test interface bit has a problem.

[0048] Through the above three steps, it can be determined whether the PD under test that fails the test has a problem or the optical test interface bit corresponding to the PD under test has a problem. Thus, the false judgment of the PD under test is avoided, and the probability of test failure of the optical test interface bit is reduced.

[0049] Based on the above steps 100-300, the embodiment further provides a step 400 for further judging the optical test interface bit that has a problem, so as to determine whether the optical test interface bit should be abandoned. The step 400 of the embodiment is specifically as follows.

[0050] Step 400: For the optical test interface bit with problem, determine whether the stability can be compensated by adjusting the optical power. In this step, if the test stability can be compensated by adjusting the optical power, it means that the optical test interface bit can still be used, but the input optical power needs to be adjusted, and if the test stability cannot be compensated by adjusting the optical power, it means that the optical test interface bit cannot be used for testing, and it can only be abandoned.

[0051] Through step 400, the embodiment can further determine whether the optical test interface bit with problem can be compensated by adjusting the optical power, and if so, the optical test interface bit is not abandoned, thereby maintaining full working state coverage of the entire system test, and solving the problem of easily abandoning abnormal test bits in the prior art.

[0052] For each of the above steps, a more detailed description is given below.

[0053] Specifically, in the preferred embodiment, the step 200 of "marking the optical test interface bits with normal test and the optical test interface bits with abnormal test based on whether the to-be-tested PD passes the test" can be expanded as the step shown in Figure 2 .

[0054] Step 201: If the to-be-tested PD passes the test, mark the optical test interface bit corresponding to the to-be-tested PD that passes the test as the optical test interface bit with normal test. In this step, the to-be-tested PD passes the test, which means that the function of the to-be-tested PD is normal, and the optical test interface bit corresponding thereto is also normal, so these optical test interface bits are marked as the optical test interface bit with normal test.

[0055] Step 202: If the to-be-tested PD does not pass the test, mark the optical test interface bit corresponding to the to-be-tested PD that does not pass the test as the optical test interface bit with abnormal test. In this step, the to-be-tested PD does not pass the test, and the corresponding optical test interface bit is marked as the optical test interface bit with abnormal test, but it should be noted that the "abnormal test" marked for the optical test interface bit in this step does not completely determine that the optical test interface bit has a problem, but it needs to be determined whether it really has a problem through further judgment (i.e., step 300).

[0056] Specifically, in the preferred embodiment, the step 300 of "multiplexing the to-be-tested PD that passes the test to the optical test interface bit with abnormal test, and participating in the next round of test to determine whether the optical test interface bit with abnormal test has a problem through the result of the next round of test" can be expanded as the step shown in Figure 3 .

[0057] Step 301: If the to-be-tested PD that has passed the test is multiplexed to the optical test interface bit that has not passed the test, and in the next round of test, the to-be-tested PD still passes the test, then the optical test interface bit that has not passed the test is re-marked as the optical test interface bit that has passed the test. In this case, the PD that has passed the test in the last round of test is used in the optical test interface bit that has not passed the test, and the PD still passes the test, which indicates that the optical test interface bit has not failed, and the PD that has not passed the test is indeed problematic. Therefore, in this case, the optical test interface bit that has not passed the test is re-marked as the optical test interface bit that has passed the test, to indicate that it can be normally used.

[0058] Step 302: If the to-be-tested PD that has passed the test is multiplexed to the optical test interface bit that has not passed the test, and in the next round of test, the to-be-tested PD fails the test, then the optical test interface bit that has not passed the test is marked as the optical test interface bit that has a problem. In this case, the PD that has passed the test in the last round of test is used in the optical test interface bit that has not passed the test, and the PD still fails the test, which indicates that the optical test interface bit has failed, and the PD that has not passed the test is not necessarily problematic. Therefore, in this case, the optical test interface bit that has not passed the test is further marked as the optical test interface bit that has a problem, to indicate that it cannot be normally used. However, it should be noted that even if it has been marked as "having a problem", it does not mean that it cannot be used at all, but it needs to be further determined (i.e., step 400) whether it is abandoned or reused.

[0059] Specifically, in the preferred embodiment, the step 400 "for the optical test interface bit that has a problem, whether the stability of the optical test interface bit can be compensated by adjusting the optical power" can be specifically extended as the steps shown in the following table: Figure 4

[0060] Step 401: Obtain the optical power output by the to-be-tested PD that has passed the test and mark it as normal optical power. In this step, the optical power output by the PD that has passed the test needs to be obtained first, for example, the optical power output by most of the PDs that have passed the test is A (or close to A, which can allow a certain range of errors. As for the specific optical power and the specific error, it is determined according to the needs, and here cannot be given a certain number). Then A is marked as normal optical power.

[0061] ​Step 402: adjust the input optical power of the problematic optical test interface site to try to make the to-be-tested PD corresponding to the problematic optical test interface site pass the test and output normal optical power. This step is an adjustment of the input optical power of the test. In general, if it is excluded that the PD test failure is caused by the PD itself, but caused by the optical test interface site, for example, the optical test interface site marked as "problematic" in the second round of testing, there are two possible problems, the first is that the test fails because the input optical power is not enough, and the other is that the test fails due to reasons other than optical power (for example, the optical test interface site has indeed been damaged). Therefore, this step adjusts the input optical power to determine which problem the optical test interface site marked as "problematic" has.

[0062] Step 403: if the attempt is successful, it is determined that the stability of the corresponding optical test interface site can be compensated by adjusting the optical power, and if the attempt is unsuccessful, it is determined that the stability of the corresponding optical test interface site cannot be compensated by adjusting the optical power. This step is a judgment step. Based on step 402, if the detection of the PD can pass the test by adjusting the optical power (here, the PD is the PD that passes the test in the first round, or the reused PD that passes the test in the second round), for example, after adjusting the optical power to three times the original optical power, the tested PD passes the test (that is, the optical power output by the tested PD is A, which also has a certain error), it indicates that the "problematic" optical test interface site belongs to the first problem mentioned above, so we do not need to abandon the use of this optical test interface site, but set the input optical power of the problematic optical test interface site to the input optical power when the attempt is successful, so that in subsequent test rounds, the input optical power when the attempt is successful is applied to the problematic optical test interface site. In this way, power adjustment of the optical test interface site can be completed at the software control level, and full working state coverage of the entire test system can be achieved. Of course, if the PD test still fails after adjusting the optical power, it indicates that the "problematic" optical test interface site belongs to the second problem mentioned above. At this stage, the optical test interface site can be abandoned.

[0063] In summary, the embodiment of the present application reuses the to-be-tested PD that passes the test to the optical test interface site that does not pass the test in the next round of testing to determine whether the PD or the optical test interface site has a problem, thereby reducing the probability of test site test failure. In addition, the problematic optical test interface site is further determined to determine whether it can be compensated for stability by adjusting the optical power. If it can, the optical test interface site is not abandoned. The present application can solve the problems of test site test failure and easy abandonment of abnormal test sites, and can achieve full working state coverage of the entire test system as much as possible.

[0064] Embodiment 2:

[0065] Based on the multi-channel PD test method provided in Embodiment 1, Embodiment 2 provides a multi-channel PD test system for implementing the multi-channel PD test method provided in Embodiment 1. As shown in Figure 5 the system provided in this embodiment includes switch ports, optical test interface positions, PDs to be tested, optical input modules, and a test control module.

[0066] The PDs to be tested are provided in a plurality of numbers, the optical test interface positions are provided in a plurality of numbers corresponding one-to-one to the PDs to be tested, and the switch ports are provided in a plurality of numbers corresponding one-to-one to the optical test interface positions. Referring to Figure 5 In this embodiment, the switch ports and the optical test interface positions are each provided in 36 numbers, and the PDs to be tested in each round are also provided in 36 numbers. It should be noted that the number can be expanded as needed, and is not limited herein. The optical input modules are connected to the switch ports to input light of a certain power when each switch port is closed to test the PDs to be tested. The test control module is used to test each PD to be tested, and to mark the optical test interface positions that test normally and the optical test interface positions that test abnormally based on whether the PD to be tested passes the test. The test control module is also used to multiplex the PD to be tested that passes the test to the optical test interface position that tests abnormally, and to participate in the next round of testing to determine whether there is a problem with the optical test interface position that tests abnormally based on the result of the next round of testing.

[0067] In this preferred embodiment, a light power monitoring module is further included, which is used to acquire the light power output by the PD to be tested, and to mark the light power output by the PD to be tested that passes the test as normal light power. The test control module is also used to adjust the input light power of the optical test interface position that has a problem, in an attempt to make the PD to be tested corresponding to the optical test interface position that has a problem pass the test and output normal light power. If the attempt is successful, the test control module further sets the input light power of the optical test interface position that has a problem to the input light power at the time of the successful attempt, so that the input light power at the time of the successful attempt is applied to the optical test interface position that has a problem in subsequent test rounds.

[0068] Referring to Figure 5 In this embodiment, the light power monitoring module and the test control module are integrated in the same software control module, which can be set on a computer and controlled by the computer.

[0069] Referring to Figure 5In the embodiment, the optical input module comprises a broadband light source, a laser and an optical power adjustment module, and the optical power adjustment module is preferably a variable optical attenuator (VOA). The broadband light source and the laser are used to generate optical signals, and the optical power adjustment module is used to adjust the optical power of the optical signals generated by the broadband light source and the laser, so that the optical signal with corresponding optical power is input to the corresponding optical test interface bit when the corresponding switch port is closed, thereby testing the corresponding to-be-tested PD.

[0070] Based on the above system module, the system is further described below through an example of specific work.

[0071] First, the first batch of 36 to-be-tested PDs (PD1, PD2, …, PD36 in the figure) are arranged at corresponding positions and connected in one-to-one correspondence with the 36 optical test interface bits (CH-1Rx, CH-2Rx, …, CH-36Rx in the figure), at this time, the 36 switch ports (switch port 1, switch port 2, …, switch port 36 in the figure) corresponding to the 36 optical test interface bits are all in the open state.

[0072] The test control module in the software control module is used to test the first batch of 36 to-be-tested PDs, first, switch port 1 is closed, thereby connecting with optical test interface bit CH-1Rx, and PD1 is tested; then switch port 1 is opened, switch port 2 is closed, thereby connecting with optical test interface bit CH-2Rx, and PD2 is tested; and the same is true for the other to-be-tested PDs, until the first batch of 36 to-be-tested PDs are all tested. In the testing process, the optical power monitoring module in the software control module also monitors the optical power information fed back by the to-be-tested PDs in real time, and after the testing is completed, the optical power output by the PDs that pass the test is collected and marked as normal optical power.

[0073] After the testing is completed, some of the 36 to-be-tested PDs pass the test, and some do not, for example, the first 35 to-be-tested PDs all pass the test, and the 36th to-be-tested PD (PD36) does not pass the test, then the test control module marks the optical test interface bits (CH-1Rx-CH-35Rx) corresponding to the first 35 to-be-tested PDs as normal optical test interface bits, and marks the optical test interface bit CH-36Rx corresponding to PD36 as an abnormal optical test interface bit.

[0074] Then, the second round of testing is started, a PD (such as PD1) that passes the test in the first round is multiplexed to connect with optical test interface bit CH-36Rx, and the other optical test interface bits that are marked as normal optical test interface bits are respectively connected with a new to-be-tested PD.

[0075] After the second round of test preparation is completed, the second round of test is started. The test control module still tests the PDs one by one in the manner of the first round of test. After the test is completed, the test control module obtains the test result of each PD. For the 35 newly added PDs to be tested in the second round, the test result can be directly trusted. For the optical test interface bit CH-36Rx and the PD1, further judgment is needed. If the PD1 passes the test in this round, it is indicated that the optical test interface bit CH-36Rx is normal. The test control module re-labels it as a normal optical test interface bit. In this case, the PD36 in the last round of test is indeed problematic. If the PD1 does not pass the test in this round, it is indicated that the optical test interface bit CH-36Rx is problematic. The test control module labels the optical test interface bit CH-36Rx as a problematic optical test interface bit. The PD36 in the last round of test is not necessarily problematic and needs to be re-added as a PD to be tested in the next round of test.

[0076] Taking the problematic optical test interface bit CH-36Rx as an example, the system of the embodiment also needs to make a deeper judgment on the optical test interface bit CH-36Rx. Specifically, the third round of test is started. The other 35 optical test interface bits still connect the new test PDs to perform the test. The optical test interface bit CH-36Rx continues to connect the PD1 (which can also be the PD that passes the test in the first round or the second round of test). When the optical test interface bit CH-36Rx and the PD1 are tested in turn, the test control module controls the optical power adjustment module to adjust the optical power to try to make the PD1 pass the test.

[0077] If the PD1 still does not pass the test after the optical power adjustment is tried, it is indicated that the problem of the optical test interface bit CH-36Rx cannot be solved by adjusting the optical power and the optical test interface bit CH-36Rx cannot be used any more. The optical test interface bit CH-36Rx is discarded and a new PD is no longer connected to the optical test interface bit CH-36Rx to perform the test.

[0078] If the PD1 passes the test after a certain optical power adjustment is performed, the test control module determines that the optical test interface bit CH-36Rx can still be used. Therefore, the input optical power B of the optical test interface bit CH-36Rx in the pass test condition is recorded. In the subsequent round of test, when the optical test interface bit CH-36Rx is reached, the optical power of level B is input to the optical test interface bit CH-36Rx to perform the test of the PD.

[0079] In summary, the embodiment of the present application multiplexes the PDs that pass the test to the optical test interface bit that does not pass the test after one round of test, so as to determine whether the PD or the optical test interface bit has a problem after the next round of test, thereby reducing the probability of test bit test failure. In addition, the optical test interface bit that has a problem is further determined to determine whether it can be compensated for stability by adjusting the optical power, and if so, the optical test interface bit is not discarded. The present application can solve the problems of test bit test failure and easy discarding of abnormal test bits, and can achieve full working state coverage of the entire test system as much as possible.

[0080] Embodiment 3

[0081] Based on the multi-channel PD test method and system provided in the above embodiments 1 and 2, the present application further provides a multi-channel PD test device for implementing the functions of the above method and system, as shown in Figure 6 Fig. 1 is a device architecture schematic diagram of the embodiment of the present application. The multi-channel PD test device of the present embodiment comprises one or more processors 21 and a memory 22. In the embodiment, the processor 21 is taken as an example. Figure 6

[0082] The processor 21 and the memory 22 can be connected through a bus or other means. Figure 6 In the embodiment, the connection through the bus is taken as an example.

[0083] The memory 22 is a non-volatile computer readable storage medium, which can be used to store non-volatile software programs, non-volatile computer executable programs and modules, such as the multi-channel PD test method and system modules in the above embodiments 1 and 2. The processor 21 executes the various functions of the multi-channel PD test device and data processing by running the non-volatile software programs, instructions and modules stored in the memory 22, that is, implements the functions of the multi-channel PD test method and modules in the above embodiments 1 and 2.

[0084] The memory 22 can include a high-speed random access memory, and can also include a non-volatile memory, such as at least one magnetic disk storage device, a flash memory device, or other non-volatile solid-state storage device. In some embodiments, the memory 22 can optionally include a memory remotely arranged with respect to the processor 21, and these remote memories can be connected to the processor 21 through a network. Examples of the above network include but are not limited to the Internet, an intranet, a local area network, a mobile communication network, and a combination thereof.

[0085] The program instructions / modules are stored in the memory 22, and when executed by the one or more processors 21, the functions of the multi-channel PD test method and modules in the above embodiments 1 and 2 are executed, for example, the various steps shown in Figures 1-4 Fig. 2 are executed.​

[0086] Those skilled in the art can understand that all or part of the steps in the various methods of the embodiments can be completed by instructing the relevant hardware with a program, and the program can be stored in a computer readable storage medium, which can include: a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, etc.

[0087] The above only describes the preferred embodiments of the present application and is not intended to limit the present application. Any modification, equivalent replacement and improvement made within the spirit and principle of the present application shall be included in the protection scope of the present application. The contents not described in detail in the specification belong to the prior art known to those skilled in the art.

Claims

1. A multi-channel PD testing method, characterized in that, The method comprises the following steps: a plurality of optical test interface positions are arranged in one-to-one correspondence with a plurality of PDs to be tested, and a plurality of switch openings are arranged in one-to-one correspondence with the plurality of optical test interface positions; each switch opening is sequentially turned on to test each PD to be tested, and the optical test interface positions of which the PD to be tested passes the test and the optical test interface positions of which the PD to be tested fails the test are marked based on whether the PD to be tested passes the test; the PD to be tested that passes the test is multiplexed to the optical test interface position of which the PD to be tested fails the test and participates in the next round of test, and whether the optical test interface position of which the PD to be tested fails the test has a problem is determined based on the result of the next round of test; the method further comprises the following steps: acquiring optical power output by the PD to be tested that passes the test and marking the optical power as normal optical power; adjusting input optical power of the optical test interface position of which a problem exists to attempt to make the PD to be tested corresponding to the optical test interface position pass the test and output normal optical power; if the attempt is successful, it is determined that the stability of the corresponding optical test interface position can be compensated by adjusting optical power; and if the attempt is unsuccessful, it is determined that the stability of the corresponding optical test interface position cannot be compensated by adjusting optical power.

2. The multi-channel PD testing method of claim 1, wherein, The marking of the optical test interface positions of which the PD to be tested passes the test and the optical test interface positions of which the PD to be tested fails the test based on whether the PD to be tested passes the test specifically comprises the following steps: if the PD to be tested passes the test, the optical test interface position corresponding to the PD to be tested that passes the test is marked as the optical test interface position of which the PD to be tested passes the test; if the PD to be tested fails the test, the optical test interface position corresponding to the PD to be tested that fails the test is marked as the optical test interface position of which the PD to be tested fails the test.

3. The multi-channel PD testing method of claim 1, wherein, The multiplexing of the PD to be tested that passes the test to the optical test interface position of which the PD to be tested fails the test and the participation of the PD to be tested that passes the test in the next round of test to determine whether the optical test interface position of which the PD to be tested fails the test has a problem based on the result of the next round of test specifically comprises the following steps: if the PD to be tested that passes the test is multiplexed to the optical test interface position of which the PD to be tested fails the test and passes the test in the next round of test, the optical test interface position of which the PD to be tested fails the test is re-marked as the optical test interface position of which the PD to be tested passes the test; if the PD to be tested that passes the test is multiplexed to the optical test interface position of which the PD to be tested fails the test and fails the test in the next round of test, the optical test interface position of which the PD to be tested fails the test is marked as the optical test interface position of which a problem exists.

4. The multi-channel PD testing method of claim 1, wherein, If the attempt is successful, the input optical power of the optical test interface position of which a problem exists is also set as the input optical power at the time of the successful attempt, so that the input optical power at the time of the successful attempt is applied to the optical test interface position of which a problem exists in subsequent test rounds.

5. A multi-channel PD testing system, characterized by, The device comprises a switch opening, an optical test interface position, a PD to be tested, an optical input module, and a test control module, wherein: the PD to be tested is provided in a plurality of numbers, the optical test interface position is provided in a plurality of numbers in one-to-one correspondence with the PD to be tested, and the switch opening is provided in a plurality of numbers in one-to-one correspondence with the optical test interface position; the optical input module is connected with the switch opening to input light of a certain power to test the PD to be tested when each switch opening is closed; The test control module is configured to test each PD under test, and mark the optical test interface position where the PD under test passes the test as normal and the optical test interface position where the PD under test fails the test as abnormal; the test control module is further configured to multiplex the PD under test that passes the test to the optical test interface position that fails the test, and participate in the next round of test to determine whether the optical test interface position that fails the test has a problem according to the result of the next round of test; The multi-channel PD test system further comprises an optical power monitoring module configured to acquire the optical power output by the PD under test, and mark the optical power output by the PD under test that passes the test as normal optical power; the test control module is further configured to adjust the input optical power of the optical test interface position that has a problem, so as to attempt to make the PD under test corresponding to the optical test interface position that has a problem pass the test and output normal optical power; if the attempt is successful, the test control module further sets the input optical power of the optical test interface position that has a problem to the input optical power at the time of the successful attempt, so that the input optical power at the time of the successful attempt is applied to the optical test interface position that has a problem in subsequent test rounds.

6. The multi-channel PD testing system of claim 5, wherein, The optical power monitoring module and the test control module are integrated in the same software control module.

7. The multi-channel PD testing system of any of claims 5-6, wherein, The optical input module comprises a wide light source, a laser, and an optical power adjustment module, wherein: The wide light source and the laser are configured to generate optical signals; The optical power adjustment module is configured to adjust the optical power of the optical signals generated by the wide light source and the laser, so that when the corresponding switch port is closed, the optical signal with the corresponding optical power is input to the corresponding optical test interface position, thereby testing the corresponding PD under test.

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