A test device and test method for net insertion loss of board-side RF connector

Abstract

The present invention relates to the field of connectors and discloses a device for testing the net insertion loss of a board-mounted radio frequency connector. The device comprises a test board, a first reference trace disposed on the test board, and a test trace, wherein the length of the first reference trace is twice that of the test trace. In the present invention, the length of the first reference trace is twice that of the test trace, that is, a reference trace length twice that of the test trace length is used. This effectively reduces losses introduced by varying quality levels of external SMA (or SMK) interfaces, improves test accuracy, and brings the connector net insertion loss closer to the actual value.

Description

Technical Field

[0001] The present invention relates to the field of connectors, and in particular to a device and method for testing the net insertion loss of a board-end radio frequency connector. Background Art

[0002] In RF test loop (link) systems, the standard connection interface SMA (or SMK), or the line trace of the test PCB, the structure of the connecting cable, and the different materials lead to discontinuous and uneven impedance characteristics, which directly affect the reflection characteristics of the two-port network system.

[0003] Since the change of impedance is due to the change of connector material and size, cable material and size, and conductor material and size, these changes will inevitably affect the overall transmission characteristics (insertion loss).

[0004] The test device is integrated with the board-side RF connector and related electromechanical modules. It serves as the interface between the application-side wiring harness and the adapter wiring harness and needs to be directly soldered to the PCB board.

[0005] Existing board-side connector testing involves connecting a test PCB to a dedicated SMA (or SMK) test connector and a network analyzer. PCB design typically uses a coplanar waveguide transmission model. Beyond design, verification, and impedance matching, these processes fail to account for instrument errors and errors introduced by the external SMA (or SMK) interface, leading to distorted insertion loss values. Summary of the Invention

[0006] The purpose of the present invention is to provide a test device and test method for the net insertion loss of a board-end RF connector, so as to solve the problem that the existing test device does not need to consider the instrument error and the error introduced by the external SMA (or SMK) interface, which easily leads to the distortion of the actual value of the insertion loss.

[0007] To achieve the above-mentioned purpose of the invention, the technical solution adopted by the present invention is: a test device for the net insertion loss of a board-end RF connector, including a test board and a first reference circuit and a test circuit arranged on the test board, wherein the length of the first reference circuit is twice the length of the test circuit.

[0008] Preferably, the first reference circuit includes a pair of first connectors and a first connecting wire, the first connectors are mounted on the test board, and both ends of the first connecting wire are respectively connected to corresponding first connectors;

[0009] The test circuit includes a second connector, a second connecting wire and a connector. The second connector is installed on the test board. One end of the second connecting wire is connected to the second connector, and the other end of the second connecting wire is connected to one end of the connector. The length of the first connecting wire is twice the length of the second connecting wire.

[0010] Preferably, a second reference circuit is further included, the second reference circuit includes a pair of third connectors and a third connecting line connected between the third connectors, the third connectors are all installed on the test board, and the third connecting line is the same length as the second connecting line.

[0011] Preferably, a third reference line is further included, the length of the third reference line is two hundred times the length of the second connecting line, and the third reference line is connected to the other end of the connector.

[0012] A method for testing the net insertion loss of a board-side radio frequency connector includes the following test steps:

[0013] Get the reference insertion loss I L参考 ;

[0014] Get the test insertion loss I L测试 ;

[0015] Calculate the net insertion loss of the connector I L连接器 ;I L连接器 =I L测试 -n*I L参考 , where n is a real number.

[0016] Preferably, the reference insertion loss includes a first reference route insertion loss I L参考1 , the length of the first reference line is twice the length of the test line, then the net insertion loss of the connector is: I L连接器 =I L测试 -1 / 2I L参考1 .

[0017] Preferably, the reference insertion loss includes a second reference route insertion loss I L参考2 , the length of the second reference line is the same as the length of the test line, then the net insertion loss of the connector is: I L连接器 =I L测试 -I L参考2 .

[0018] Preferably, the reference insertion loss includes a first reference line insertion loss I L参考1 , the insertion loss of the third reference line insertion loss I L参考3 , the length of the first reference line and the length of the third reference line are both twice the length of the test line, then the net insertion loss of the connector is: I L连接器=I L测试 -1 / 2I L参考2 -1 / 2I L参考3 .

[0019] The beneficial effects of the present invention are concentrated in:

[0020] In the present invention, the length of the first reference line is twice the length of the test line, that is, using a reference line (trace) that is twice the length of the test line (trace), which can effectively reduce the loss introduced by the different quality levels of the external SMA (or SMK) interface, improve the test accuracy, and the net insertion loss of the connector is closer to the actual value. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 This is the overall structural diagram of the testing device of the present invention;

[0022] Figure 2 is a schematic structural diagram of a test board according to a first embodiment of the present invention;

[0023] Figure 3 is a schematic structural diagram of a test board according to a second embodiment of the present invention;

[0024] Figure 4 is a schematic structural diagram of a test board according to a third embodiment of the present invention;

[0025] In the accompanying drawings: 0, test board; 1, first connector; 2, first connecting line; 3, second connector; 4, second connecting line; 5, connector; 6, third connector; 7, third connecting line; 8, third reference line. DETAILED DESCRIPTION

[0026] In order to enable those skilled in the art to better understand the technical solution of the present invention, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments.

[0027] Example 1

[0028] like Figure 1 、 2 As shown, a test device for the net insertion loss of a board-end RF connector 5 is used in a test system. The test system consists of a test device and a network analyzer, including a test board 0 and a first reference line and a test line set on the test board 0. The length of the first reference line is twice the length of the test line, wherein the test board 0 is a PCB board, and the first reference line and the test line are both connected to the input port of the network analyzer.

[0029] The first reference circuit includes a pair of first connectors 1 and a first connecting line 2. To save layout space, the first connecting line 2 is U-shaped. The first connector 1 is mounted on the test board 0. The two ends of the first connecting line 2 are respectively connected to the corresponding first connectors 1. The first connector 1 is then connected to the input port of the network analyzer via a data cable.

[0030] The test circuit includes a second connector 3, a second connecting line 4 and a connector 5. The second connector 3 is installed on the test board 0, one end of the second connecting line 4 is connected to the second connector 3, and the other end of the second connecting line 4 is connected to one end of the connector 5. The length of the first connecting line 2 is twice the length of the second connecting line 4, and the other end of the connector 5 is connected to the input port of the network analyzer through a cable.

[0031] In this embodiment, a method for testing the net insertion loss of the board-side RF connector 5 is also provided, including the following testing steps:

[0032] The network analyzer obtains the reference insertion loss I L参考 ;

[0033] The network analyzer obtains the test insertion loss I L测试 ;

[0034] Calculate the net insertion loss I of connector 5 L连接器 :I L连接器 =I L测试 -n*I L参考 , where n is a real number.

[0035] At this time, the reference insertion loss includes the first reference route insertion loss I L参考1 , and the length of the first reference line is twice the length of the test line, then the net insertion loss of connector 5 is:

[0036] I L连接器 = IL测试 -1 / 2I L参考1 .

[0037] That is to say, the net insertion loss of connector 5 is equivalent to the design minus the loss of the equal-length (1x rate) trace, but minus the loss of the 1x rate SMA. The mechanism of insertion loss is equivalent to the voltage drop (loss) of low-frequency and low-speed connector 5. From the analysis of the entire circuit, it is more reasonable to subtract the loss of the 1x rate SMA and 1x rate trace. It can effectively reduce the loss introduced by the different quality levels of the external SMA (or SMK) interface, improve the test accuracy, and be closer to the actual value.

[0038] Example 2

[0039] like Figure 1 、3 As shown, a test device for the net insertion loss of a board-end RF connector 5 is used in a test system. The test system consists of a test device and a network analyzer, including a test board 0 and a first reference line and a test line set on the test board 0. The length of the first reference line is twice the length of the test line, wherein the test board 0 is a PCB board, and the first reference line and the test line are both connected to the input port of the network analyzer.

[0040] The first reference circuit includes a pair of first connectors 1 and a first connecting line 2. To save layout space, the first connecting line 2 is U-shaped. The first connector 1 is mounted on the test board 0. The two ends of the first connecting line 2 are respectively connected to the corresponding first connectors 1. The first connector 1 is then connected to the input port of the network analyzer via a data cable.

[0041] The test circuit includes a second connector 3, a second connecting line 4 and a connector 5. The second connector 3 is installed on the test board 0, one end of the second connecting line 4 is connected to the second connector 3, and the other end of the second connecting line 4 is connected to one end of the connector 5. The length of the first connecting line 2 is twice the length of the second connecting line 4, and the other end of the connector 5 is connected to the input port of the network analyzer through a cable.

[0042] At the same time, a second reference circuit is also set on the test board 0, and the second reference circuit includes a pair of third connectors 6 and a third connecting line 7 connected between the third connectors 6. The third connectors 6 are all installed on the test board 0, and the third connecting line 7 is the same length as the second connecting line 4.

[0043] A method for testing the net insertion loss of the board-side RF connector 5 is also provided, including the following test steps:

[0044] The network analyzer obtains the reference insertion loss I L参考 ;

[0045] The network analyzer obtains the test insertion loss I L测试 ;

[0046] Calculate the net insertion loss of connector 5 I L连接器 ;I L连接器 =I L测试 -n*I L参考 , where n is a real number.

[0047] In this embodiment, the test board 0 integrates the following two test modes, which can be used for comparative testing.

[0048] First: the reference insertion loss includes the second reference route insertion loss I L参考2, the length of the second reference line is the same as the length of the test line, then the net insertion loss of connector 5 is:

[0049] I L连接器 =I L测试 -I L参考2 .

[0050] Second: the reference insertion loss includes the first reference route insertion loss I L参考1 , and the length of the first reference line is twice the length of the test line, then the net insertion loss of connector 5 is:

[0051] I L连接器 =I L测试 -1 / 2I L参考1 .

[0052] In this embodiment, it is equivalent to adopting a method in which an equal-length (1x magnification) reference trace and a 2x length reference trace coexist. The two methods can be used alternately and corresponding responses can be made according to the actual test accessories and sample conditions. As far as possible, after eliminating the test equipment error - after the network analyzer is calibrated, 1) connector 5, 2) the reference trace of the relevant PCB, and 3) the external RF cable connected to the test loop must be compensated and eliminated to avoid the introduction of external errors that lead to distortion of the actual value; this facilitates comparison, analysis, and evaluation of test results, making the test results more authentic, objective, and reliable.

[0053] Example 3

[0054] like Figure 1 、 4 As shown, a test device for the net insertion loss of a board-end RF connector 5 is used in a test system. The test system consists of a test device and a network analyzer, including a test board 0 and a first reference line and a test line set on the test board 0. The length of the first reference line is twice the length of the test line, wherein the test board 0 is a PCB board, and the first reference line and the test line are both connected to the input port of the network analyzer.

[0055] The first reference circuit includes a pair of first connectors 1 and a first connecting line 2. To save layout space, the first connecting line 2 is U-shaped. The first connector 1 is mounted on the test board 0. The two ends of the first connecting line 2 are respectively connected to the corresponding first connectors 1. The first connector 1 is then connected to the input port of the network analyzer via a data cable.

[0056] The test circuit includes a second connector 3, a second connecting line 4 and a connector 5. The second connector 3 is installed on the test board 0, one end of the second connecting line 4 is connected to the second connector 3, and the other end of the second connecting line 4 is connected to one end of the connector 5. The length of the first connecting line 2 is twice the length of the second connecting line 4, and the other end of the connector 5 is connected to the input port of the network analyzer through a cable.

[0057] It also includes a second reference circuit, which includes a pair of third connectors 6 and a third connecting line 7 connected between the third connectors 6. The third connectors 6 are all installed on the test board 0, and the third connecting line 7 is the same length as the second connecting line 4.

[0058] The device further includes a third reference line 8 , the length of which is twice the length of the second connecting line 4 , and the third reference line 8 is connected to the other end of the connector 5 .

[0059] A method for testing the net insertion loss of a board-side RF connector 5 is also provided, including the following test steps:

[0060] The network analyzer obtains the reference insertion loss I L参考 ;

[0061] The network analyzer obtains the test insertion loss I L测试 ;

[0062] Calculate the net insertion loss of connector 5 I L连接器 ;I L连接器 =I L测试 -n*I L参考 , where n is a real number.

[0063] In this embodiment, the test board 0 integrates the following two test modes, which can be used for comparative testing.

[0064] First: the reference insertion loss includes the second reference route insertion loss I L参考2 , the length of the second reference line is the same as the length of the test line, then the net insertion loss of connector 5 is:

[0065] I L连接器 =I L测试 -I L参考2 .

[0066] Second: the reference insertion loss includes the first reference line insertion loss I L参考1 , the insertion loss of the third reference line 8 is I L参考3 , the length of the first reference line and the length of the third reference line 8 are both twice the length of the test line, then the net insertion loss of connector 5 is:

[0067] I L连接器 =I L测试 -1 / 2I L参考2 -1 / 2I L参考3 .

[0068] In this embodiment, the second test method is mainly aimed at those who do not have a dedicated high-performance quality adapter. Instead, the wiring end connector 5 is connected to the network analyzer by adapter, and the cable insertion loss of the auxiliary line (third reference line 8) is subtracted, and the length is twice that of the test line.

[0069] In this embodiment, the third reference circuit 8 can be disassembled. After disassembly, the test device of this embodiment is the same as the test device of Example 2, which improves the practicality of the test device.

[0070] It should be noted that for the aforementioned various method embodiments, for the sake of simplicity, they are all expressed as a series of action combinations, but those skilled in the art should be aware that this application is not limited by the order of the actions described, because according to this application, some steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and units involved are not necessarily required by this application.

Claims

1. A method for testing the net insertion loss of a board-side RF connector, characterized by: The method is implemented based on a test device, the device comprising: a test board, and a first reference circuit and a test circuit arranged on the test board, wherein the length of the first reference circuit is twice the length of the test circuit; the first reference circuit comprises a pair of first connectors and a first connecting wire, the first connectors being mounted on the test board, and both ends of the first connecting wire being connected to corresponding first connectors; the first connecting wire being in a U-shaped structure; The test circuit includes a second connector, a second connecting wire, and a connector, the second connector being mounted on the test board, one end of the second connecting wire being connected to the second connector, the other end of the second connecting wire being connected to one end of the connector, and the length of the first connecting wire being twice the length of the second connecting wire; the device also includes a second reference circuit and a third reference circuit, the second reference circuit including a pair of third connectors and a third connecting wire connected between the third connectors, the third connectors being mounted on the test board, the third connecting wire being the same length as the second connecting wire; the length of the third reference circuit being twice the length of the second connecting wire, and the third reference circuit being connected to the other end of the connector; The method comprises the following testing steps: Get the reference insertion loss I L参考 ; Get the test insertion loss I L测试 ; Calculate the net insertion loss of the connector I L连接器 :I L连接器 =I L测试 -n*I L参考 , where n is a real number; The reference insertion loss includes a first reference route insertion loss I L参考1 , the second reference line insertion loss I L参考2 And the insertion loss of the third reference line insertion loss I L参考3 ; When the reference insertion loss is the first reference route insertion loss I L参考1 When , the net insertion loss of the connector is: AND L连接器 =I L测试 -1 / 2I L参考1 ; The reference insertion loss is the second reference route insertion loss I L参考2 When , the net insertion loss of the connector is: I L连接器 =I L测试 -I L参考2 ; The reference insertion loss is the first reference line insertion loss I L参考1 and the insertion loss of the third reference line I L参考3 When , the net insertion loss of the connector is: AND L连接器 =I L测试 -1 / 2I L参考2 -1 / 2I L参考3 。

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