Testing method and device for loop-through system, electronic equipment and storage medium

Abstract

The present invention discloses a testing method and apparatus, electronic equipment, and storage medium for a loop-through system. The testing method includes: configuring a loop-through test platform to establish an association between the loop-through test platform and loop shuttle vehicle signals and loop shuttle vehicle scheduling strategies in the loop-through system; and testing targets in the loop-through system on the loop-through test platform to obtain test results. The present invention solves the technical problem of poor overall stability of loop-through systems in related technologies.

Description

Technical Field

[0001] The present invention relates to the field of testing technology, and in particular to a testing method and device, electronic equipment and storage medium for a loop-through system. Background Art

[0002] Nowadays, the research and development of the dispatching logic for circular shuttles tends to be diversified. However, there are still major problems in testing the designed dispatching logic algorithms. Often, the designed logic algorithms are limited to design ideas and cannot be applied to actual problems. In addition, the algorithm logic that has not been verified in practice is directly applied to actual scenarios, resulting in an unlimited extension of the overall project debugging cycle and the inability to guarantee overall stability. Summary of the Invention

[0003] The purpose of the present invention is to overcome the above technical deficiencies, provide a testing method and device for a loop-through system, an electronic device and a storage medium, and solve the technical problem of poor overall stability of the loop-through system in related technologies.

[0004] In order to achieve the above technical objectives, the present invention adopts the following technical solutions:

[0005] In a first aspect, the present invention provides a testing method for a loop-through system, the method comprising: configuring a loop-through test platform to establish an association between the loop-through test platform and a loop shuttle signal and a loop shuttle scheduling strategy in the loop-through system; testing the target in the loop-through system in the loop-through test platform to obtain a test result.

[0006] Optionally, the targets in the loop-through system are tested in the loop-through test platform to obtain test results, including: testing the test equipment in the loop-through system according to the loop-through shuttle scheduling strategy of the loop-through test platform to obtain the test results indicating the stability of the equipment; and / or testing the loop-through shuttle scheduling strategy to be tested in the loop-through system in the loop-through test platform to obtain the test results indicating whether the loop-through shuttle scheduling strategy is available.

[0007] Optionally, configuring the loop-through test platform includes: determining a test mode of the loop-through system; and configuring the loop-through test platform according to the determined test mode.

[0008] Optionally, the loop test platform is configured according to the determined test mode, including: when the determined test mode is the physical device test mode, configuring the device parameters and device signal point parameters in the loop test platform; when it is necessary to use the loop shuttle scheduling strategy of the loop test platform, selecting the loop shuttle scheduling strategy used in this test from the loop shuttle scheduling strategy of the loop test platform; when it is necessary to use an external loop shuttle scheduling strategy, configuring a scheduling algorithm interface in the loop test platform to call the external loop shuttle scheduling strategy.

[0009] Optionally, the loop test platform is configured according to the determined test mode, including: when the determined test mode is the simulation device test mode, configuring the simulation device signal point parameters in the loop test platform; when an external loop shuttle scheduling strategy needs to be used, configuring a scheduling algorithm interface in the loop test platform to call the external loop shuttle scheduling strategy.

[0010] Optionally, before configuring the loop test platform, the method also includes: creating the operating logic, interactive interface, data table and functional configuration interface of the loop test platform, wherein the data table is used to record interface configuration information, and the functional configuration interface is used to configure corresponding interface information.

[0011] Optionally, before configuring the loop penetration test platform, the method further includes: displaying a visual interactive interface of the loop penetration test platform, where the interactive interface is used to configure the loop penetration test platform.

[0012] In the second aspect, the present invention also provides a testing device for a loop-through system, which includes: a configuration unit for configuring a loop-through test platform to establish an association between the loop-through test platform and the loop shuttle signal and the loop shuttle scheduling strategy in the loop-through system; a testing unit for testing the target in the loop-through system in the loop-through test platform to obtain a test result.

[0013] Optionally, the configuration unit is also used to test the targets in the loop-through system in the loop-through test platform. When the test results are obtained, the test equipment in the loop-through system is tested according to the loop-through shuttle scheduling strategy of the loop-through test platform to obtain the test results indicating the stability of the equipment; and / or, the loop-through shuttle scheduling strategy to be tested in the loop-through system is tested in the loop-through test platform to obtain the test results indicating whether the loop-through shuttle scheduling strategy is available.

[0014] Optionally, the configuration unit is further configured to determine a test mode of the loop-through system when configuring the loop-through test platform; and configure the loop-through test platform according to the determined test mode.

[0015] Optionally, the configuration unit is also used to configure the equipment parameters and equipment signal point parameters in the loop test platform when configuring the loop test platform according to the determined test mode, when the determined test mode is the physical device test mode; when it is necessary to use the loop shuttle scheduling strategy of the loop test platform, select the loop shuttle scheduling strategy used in this test from the loop shuttle scheduling strategy of the loop test platform; when it is necessary to use an external loop shuttle scheduling strategy, configure the scheduling algorithm interface in the loop test platform to call the external loop shuttle scheduling strategy.

[0016] Optionally, the configuration unit is also used to configure the analog device signal point parameters in the loop test platform when configuring the loop test platform according to the determined test mode, when the determined test mode is the analog device test mode; and when an external loop shuttle scheduling strategy needs to be used, a scheduling algorithm interface is configured in the loop test platform to call the external loop shuttle scheduling strategy.

[0017] Optionally, the device of the present application may also include: a preprocessing unit, used to create the operating logic, interactive interface, data table and functional configuration interface of the loop test platform before configuring the loop test platform, wherein the data table is used to record interface configuration information, and the functional configuration interface is used to configure corresponding interface information.

[0018] Optionally, the pre-processing unit is further used to display a visual interactive interface of the loop penetration test platform before configuring the loop penetration test platform, and the interactive interface is used to configure the loop penetration test platform.

[0019] In a third aspect, the present invention also provides an electronic device comprising: a processor and a memory; the memory stores a computer-readable program that can be executed by the processor; and when the processor executes the computer-readable program, it implements the steps of any one of the methods in the first and second aspects.

[0020] In a fourth aspect, the present invention further provides a computer-readable storage medium, which stores one or more programs, and the one or more programs can be executed by one or more processors to implement the steps in any method of the first aspect and the second aspect.

[0021] The testing method and device, electronic equipment and storage medium of the loop-through system provided by the present invention can configure the loop-through test platform to establish an association between the loop-through test platform and the loop shuttle vehicle signal and the loop shuttle vehicle scheduling strategy in the loop-through system; the targets in the loop-through system are tested in the loop-through test platform, and the stability of the entire system can be improved based on the results, which can solve the technical problem of poor overall stability of the loop-through system in related technologies. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 is a flow chart of an optional method for testing a loop-through system according to an embodiment of the present application;

[0023] Figure 2 is a schematic diagram of an optional task strategy of a loop-through system according to an embodiment of the present application;

[0024] Figure 3 is a schematic diagram of configuration logic of an optional loop-through system according to an embodiment of the present application;

[0025] Figure 4 is a schematic diagram of an optional test platform main interface according to an embodiment of the present application;

[0026] Figure 5 is a schematic diagram of an optional test platform functional interface according to an embodiment of the present application;

[0027] Figure 6 is a schematic diagram of an optional testing device for a loop-through system according to an embodiment of the present application;

[0028] as well as

[0029] Figure 7 This is a structural block diagram of a terminal according to an embodiment of the present application. DETAILED DESCRIPTION

[0030] In order to enable those skilled in the art to better understand the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts should fall within the scope of protection of this application.

[0031] It should be noted that the terms "first", "second", etc. in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequential order. It should be understood that the data used in this way can be interchangeable where appropriate, so that the embodiments of the present application described herein can be implemented in a sequence other than those illustrated or described herein. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device comprising a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0032] According to one aspect of the embodiments of the present application, an embodiment of a testing method for a loop-through system is provided. Figure 1 is a flow chart of an optional method for testing a loop-through system according to an embodiment of the present application, such as Figure 1 As shown, the method may include the following steps:

[0033] Step S1 : configuring the loop-through test platform to establish a relationship between the loop-through test platform and the loop-through shuttle signal and the loop-through shuttle scheduling strategy in the loop-through system.

[0034] Optionally, before configuring the loop test platform, the method also includes: creating the operating logic, interactive interface, data table and functional configuration interface of the loop test platform, wherein the data table is used to record interface configuration information, and the functional configuration interface is used to configure corresponding interface information.

[0035] Optionally, before configuring the loop penetration test platform, the method further includes: displaying a visual interactive interface of the loop penetration test platform, where the interactive interface is used to configure the loop penetration test platform.

[0036] In the technical solution of this application, Visual Studio programming software can be used (of course, other programming software can also be used as needed) to write the test platform operation logic and the system built-in software interface docking protocol. Design SQL Sever data table and data view logic, adopt configurable data architecture design, and realize configurable operation of docking call scheduling algorithm. Design the test platform UI interface, based on the purpose of human-computer friendly visualization and comprehensive functions, to realize the construction of the test platform. It effectively solves the problems of low stability and applicability caused by insufficient testing of the new scheduling logic algorithm, and effectively improves the stability of the test equipment operation.

[0037] Step S2: testing the target in the loop-through system in the loop-through test platform to obtain a test result.

[0038] Optionally, the targets in the loop-through system are tested in the loop-through test platform to obtain test results, including: testing the test equipment in the loop-through system according to the loop-through shuttle scheduling strategy of the loop-through test platform to obtain the test results indicating the stability of the equipment; and / or testing the loop-through shuttle scheduling strategy to be tested in the loop-through system in the loop-through test platform to obtain the test results indicating whether the loop-through shuttle scheduling strategy is available.

[0039] Optionally, configuring the loop-through test platform includes: determining a test mode of the loop-through system; and configuring the loop-through test platform according to the determined test mode.

[0040] Optionally, the loop test platform is configured according to the determined test mode, including: when the determined test mode is the physical device test mode, configuring the device parameters and device signal point parameters in the loop test platform; when it is necessary to use the loop shuttle scheduling strategy of the loop test platform, selecting the loop shuttle scheduling strategy used in this test from the loop shuttle scheduling strategy of the loop test platform; when it is necessary to use an external loop shuttle scheduling strategy, configuring a scheduling algorithm interface in the loop test platform to call the external loop shuttle scheduling strategy.

[0041] Optionally, the loop test platform is configured according to the determined test mode, including: when the determined test mode is the simulation device test mode, configuring the simulation device signal point parameters in the loop test platform; when an external loop shuttle scheduling strategy needs to be used, configuring a scheduling algorithm interface in the loop test platform to call the external loop shuttle scheduling strategy.

[0042] The significance of building this test platform is that through the construction of the experimental platform, the designed and developed scheduling logic algorithm can be run tested, which can solve the problem of insufficient equipment operation stability and indefinite extension of the equipment installation and adjustment experiment cycle due to insufficient system testing or lack of system testing.

[0043] Through the above steps, the loop test platform can be configured to establish an association between the loop test platform and the loop shuttle signal and the loop shuttle scheduling strategy in the loop system; the targets in the loop system can be tested in the loop test platform, and the stability of the entire system can be improved based on the results, which can solve the technical problem of poor overall stability of the loop system in related technologies.

[0044] The inventive point of the present invention is: by using programming software to write the test platform system logic, and based on the API interface strategy, design the interface docking logic. Build a PLC communication simulation module, simulate the circular shuttle signal interaction in multiple dimensions, and set the task trigger mode. By looping dynamic task points, the stability of the equipment can be tested according to the test platform's own logic algorithm. Similarly, the availability of the scheduling logic algorithm can be tested through docking. Use SQL sever database software to design database query data logic. Create a new T_APISetting data table to record the API interface docking details and the configurable design test platform function. The constructed test platform meets the conditions of equipment configurability, reusability, and easy operation.

[0045] As an optional embodiment, the following Figures 2 to 5 Further details of the technical solution of this application:

[0046] This loop-through test platform system utilizes API-based interface strategies and designed interface logic. A PLC communication simulation module is built to simulate the signal interactions of a loop-through shuttle in multiple dimensions. Task triggering modes and methods can be set, and through dynamic loop task points, equipment stability can be tested using the test platform's built-in logic algorithms.

[0047] An optional task strategy is Figure 2 As shown in the figure, 80X represents the location where the circular shuttle picks up materials; 90X represents the delivery terminal of the circular shuttle; HC-RGV and RGV represent the same type of circular shuttle equipment; the front car and the rear car represent the front and back of the equipment properties set in the counterclockwise direction; the SQL Sever statement represents the query statement written according to the database syntax; HC-WCS represents the equivalent of the circular shuttle scheduling test platform.

[0048] Similarly, the system can also integrate with test scheduling logic algorithms to determine availability. API integration allows for configurable design of test platform functionality. The resulting test platform meets the requirements of device configurability, reusability, and ease of operation.

[0049] The specific design program logic is as follows: First, the test platform logic program is written and designed through Visual Studio, and SQL Sever is used to create a new data table T_APISetting in the database to store and record API interface configuration information, including API interface name, interface configuration IP, port, call field and other information; the corresponding interface information is configured through the function block.

[0050] Design system equipment configuration interface, such as Figure 4 and Figure 5 As shown, Figure 4 Indicates the main interface of the test platform. Figure 5Indicates the test platform function interface, setting the device level test mode, such as Figure 3 As shown, the test modes are physical device testing and algorithm testing. During physical device testing, the PLC address block connecting the looped device and the docking signal point must be configured. A simultaneous determination is made as to whether algorithm testing is necessary. If algorithm testing is not required, the test platform's own algorithm logic can be invoked to perform device stability testing. Without physical devices, the algorithm logic and scheduling effectiveness can be tested by setting device simulation signals to trigger the scheduling logic. Simulate the device's operating status, and ultimately determine the algorithm scheduling effectiveness and device operational stability through output data logs and test data analysis.

[0051] The test platform itself is configured with algorithm logic, which uses the time sorting of transportation requirements and the task triggering logic of the tail car in the queue to realize the scheduling operation of the ring-through equipment. By simulating the transportation request signal of the docking station, a transportation instruction is created and the timing statistics of the instruction are performed. The algorithm logic is executed to sort the queue sequence time. The longer the time, the higher the priority. After obtaining the transportation request, it is determined whether the equipment status is idle. For equipment that is in an idle state, the tail car triggers the transportation action and the front car avoids the action. If one of the devices is in an idle state, a corresponding device task instruction is generated and sent to the task device for execution. If all devices are in a non-idle state, the request instruction loop is performed, the timing statistics are performed, and the loop judgment business is entered.

[0052] The significance of building this test platform is to conduct operational tests on the scheduling logic algorithm designed and developed through the construction of the experimental platform, so as to solve the problem of insufficient equipment operation stability and indefinite extension of the equipment installation and adjustment experiment cycle due to insufficient system testing or lack of system testing.

[0053] It should be noted that for the aforementioned method embodiments, for the sake of simplicity, they are all expressed as a series of action combinations, but those skilled in the art should be aware that this application is not limited by the order of the actions described, because according to this application, certain steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by this application.

[0054] Through the description of the above implementation methods, those skilled in the art can clearly understand that the method according to the above embodiment can be implemented by means of software plus the necessary general hardware platform, and of course it can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), and includes a number of instructions for enabling a terminal device (which can be a mobile phone, computer, server, or network device, etc.) to execute the methods described in each embodiment of the present application.

[0055] According to another aspect of an embodiment of the present application, a testing device for a loop-through system is provided for implementing the above-mentioned testing method for the loop-through system. Figure 6 is a schematic diagram of an optional testing device for a loop-through system according to an embodiment of the present application, such as Figure 6 As shown, the device may include:

[0056] A configuration unit 61 is configured to configure the loop-through test platform to establish an association between the loop-through test platform and the loop shuttle signal and the loop shuttle scheduling strategy in the loop-through system;

[0057] The testing unit 63 is used to test the target in the loop-through system in the loop-through test platform to obtain a test result.

[0058] Through the above modules, the loop test platform can be configured to establish an association between the loop test platform and the loop shuttle signal and loop shuttle scheduling strategy in the loop system; the targets in the loop system can be tested in the loop test platform, and the stability of the entire system can be improved based on the results, which can solve the technical problem of poor overall stability of the loop system in related technologies.

[0059] Optionally, the configuration unit is also used to test the targets in the loop-through system in the loop-through test platform. When the test results are obtained, the test equipment in the loop-through system is tested according to the loop-through shuttle scheduling strategy of the loop-through test platform to obtain the test results indicating the stability of the equipment; and / or, the loop-through shuttle scheduling strategy to be tested in the loop-through system is tested in the loop-through test platform to obtain the test results indicating whether the loop-through shuttle scheduling strategy is available.

[0060] Optionally, the configuration unit is further configured to determine a test mode of the loop-through system when configuring the loop-through test platform; and configure the loop-through test platform according to the determined test mode.

[0061] Optionally, the configuration unit is also used to configure the equipment parameters and equipment signal point parameters in the loop test platform when configuring the loop test platform according to the determined test mode, when the determined test mode is the physical device test mode; when it is necessary to use the loop shuttle scheduling strategy of the loop test platform, select the loop shuttle scheduling strategy used in this test from the loop shuttle scheduling strategy of the loop test platform; when it is necessary to use an external loop shuttle scheduling strategy, configure the scheduling algorithm interface in the loop test platform to call the external loop shuttle scheduling strategy.

[0062] Optionally, the configuration unit is also used to configure the analog device signal point parameters in the loop test platform when configuring the loop test platform according to the determined test mode, when the determined test mode is the analog device test mode; and when an external loop shuttle scheduling strategy needs to be used, a scheduling algorithm interface is configured in the loop test platform to call the external loop shuttle scheduling strategy.

[0063] Optionally, the device of the present application may also include: a preprocessing unit, used to create the operating logic, interactive interface, data table and functional configuration interface of the loop test platform before configuring the loop test platform, wherein the data table is used to record interface configuration information, and the functional configuration interface is used to configure corresponding interface information.

[0064] Optionally, the pre-processing unit is further used to display a visual interactive interface of the loop penetration test platform before configuring the loop penetration test platform, and the interactive interface is used to configure the loop penetration test platform.

[0065] It should be noted that the examples and application scenarios implemented by the above modules and corresponding steps are the same, but are not limited to the contents disclosed in the above embodiments. It should be noted that the above modules, as part of the device, can run in a corresponding hardware environment and can be implemented by software or hardware, wherein the hardware environment includes a network environment.

[0066] According to another aspect of the embodiments of the present application, a server or terminal for implementing the above-mentioned loop-through system testing method is also provided.

[0067] Figure 7 is a structural block diagram of a terminal according to an embodiment of the present application, such as Figure 7 As shown, the terminal may include: one or more (only one is shown) processors 701, a memory 703, and a transmission device 705, as shown in FIG. Figure 7 As shown, the terminal may further include an input and output device 707 .

[0068] Among them, the memory 703 can be used to store software programs and modules, such as the program instructions / modules corresponding to the test method and device of the loop-through system in the embodiment of the present application. The processor 701 executes various functional applications and data processing by running the software programs and modules stored in the memory 703, that is, implementing the above-mentioned test method of the loop-through system. The memory 703 may include a high-speed random access memory and may also include a non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some instances, the memory 703 may further include a memory remotely located relative to the processor 701, and these remote memories may be connected to the terminal via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0069] The transmission device 705 is used to receive or send data via a network, and can also be used for data transmission between a processor and a memory. Specific examples of the above-mentioned network may include a wired network and a wireless network. In one embodiment, the transmission device 705 includes a network adapter (Network Interface Controller, NIC), which can be connected to other network devices and a router via a network cable so as to communicate with the Internet or a local area network. In one embodiment, the transmission device 705 is a radio frequency (RF) module, which is used to communicate with the Internet wirelessly.

[0070] Specifically, the memory 703 is used to store application programs.

[0071] The processor 701 may call the application stored in the memory 703 through the transmission device 705 to perform the following steps:

[0072] The loop test platform is configured to establish an association between the loop test platform and the loop shuttle signal and the loop shuttle scheduling strategy in the loop test system; the target in the loop test system is tested in the loop test platform to obtain a test result.

[0073] The processor 701 is further configured to perform the following steps:

[0074] When the determined test mode is the physical device test mode, the device parameters and device signal point parameters are configured in the loop test platform; when it is necessary to use the loop shuttle scheduling strategy of the loop test platform, the loop shuttle scheduling strategy used in this test is selected from the loop shuttle scheduling strategy of the loop test platform; when it is necessary to use an external loop shuttle scheduling strategy, a scheduling algorithm interface is configured in the loop test platform to call the external loop shuttle scheduling strategy.

[0075] Optionally, the specific examples in this embodiment may refer to the examples described in the above embodiments, and this embodiment will not be described in detail here.

[0076] It can be understood by those skilled in the art that Figure 7 The structure shown is for illustration only, and the terminal may be a smart phone (such as an Android phone, an iOS phone, etc.), a tablet computer, a PDA, a mobile Internet device (Mobile Internet Devices, MID), a PAD, or other terminal devices. Figure 7 It does not limit the structure of the above electronic device. For example, the terminal may also include Figure 7 More or fewer components (such as network interfaces, display devices, etc.) shown in, or with Figure 7 Different configurations shown.

[0077] A person skilled in the art will understand that all or part of the steps in the various methods of the above embodiments can be completed by instructing the hardware related to the terminal device through a program, and the program can be stored in a computer-readable storage medium, which may include: a flash drive, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, etc.

[0078] The embodiment of the present application further provides a storage medium. Optionally, in this embodiment, the storage medium can be used to execute the program code of the loop-through system testing method.

[0079] Optionally, in this embodiment, the above-mentioned storage medium may be located on at least one network device among the multiple network devices in the network shown in the above-mentioned embodiment.

[0080] Optionally, in this embodiment, the storage medium is configured to store program codes for executing the following steps:

[0081] The loop test platform is configured to establish an association between the loop test platform and the loop shuttle signal and the loop shuttle scheduling strategy in the loop test system; the target in the loop test system is tested in the loop test platform to obtain a test result.

[0082] Optionally, the storage medium is further configured to store program codes for executing the following steps:

[0083] When the determined test mode is the physical device test mode, the device parameters and device signal point parameters are configured in the loop test platform; when it is necessary to use the loop shuttle scheduling strategy of the loop test platform, the loop shuttle scheduling strategy used in this test is selected from the loop shuttle scheduling strategy of the loop test platform; when it is necessary to use an external loop shuttle scheduling strategy, a scheduling algorithm interface is configured in the loop test platform to call the external loop shuttle scheduling strategy.

[0084] Optionally, the specific examples in this embodiment may refer to the examples described in the above embodiments, and this embodiment will not be described in detail here.

[0085] Optionally, in this embodiment, the above-mentioned storage medium may include but is not limited to: a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk or an optical disk, and other media that can store program codes.

[0086] The serial numbers of the above embodiments of the present application are for description only and do not represent the advantages or disadvantages of the embodiments.

[0087] If the integrated units in the above embodiments are implemented in the form of software functional units and sold or used as independent products, they can be stored in the above-mentioned computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for enabling one or more computer devices (which can be personal computers, servers, or network devices, etc.) to execute all or part of the steps of the methods described in each embodiment of the present application.

[0088] In the above embodiments of the present application, the description of each embodiment has its own focus. For parts that are not described in detail in a certain embodiment, please refer to the relevant description of other embodiments.

[0089] In the several embodiments provided in this application, it should be understood that the disclosed client can be implemented in other ways. Among them, the device embodiments described above are merely illustrative. For example, the division of the units is merely a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of units or modules, and can be electrical or other forms.

[0090] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0091] In addition, the functional units in the various embodiments of the present application may be integrated into a single processing unit, or each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or software functional units.

[0092] The above is only a preferred embodiment of the present application. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present application. These improvements and modifications should also be regarded as the scope of protection of the present application.

Claims

1. A testing method for a loop-through system, characterized in that: include: Configuring the loop test platform to establish an association between the loop test platform and loop shuttle signals and loop shuttle scheduling strategies in the loop system; Testing the target in the loop penetration system in the loop penetration test platform to obtain a test result; Configure the loop test platform, including: determining a test mode of the loop-through system; Configuring the loop-through test platform according to the determined test mode; Configuring the loop-through test platform according to the determined test mode includes: When the determined test mode is a physical device test mode, configuring device parameters and device signal point parameters in the loop-through test platform; If it is necessary to use the circular shuttle scheduling strategy provided by the circular penetration test platform, the circular shuttle scheduling strategy used in this test is selected from the circular shuttle scheduling strategies provided by the circular penetration test platform; In the case where an external circular shuttle scheduling strategy is required, a scheduling algorithm interface is configured in the circular test platform to call the external circular shuttle scheduling strategy; Configuring the loop-through test platform according to the determined test mode includes: When the determined test mode is the analog device test mode, configuring analog device signal point parameters in the loop-through test platform; In the case where an external circular shuttle scheduling strategy is required, a scheduling algorithm interface is configured in the circular testing platform to call the external circular shuttle scheduling strategy.

2. The method according to claim 1, characterized in that Testing the target in the loop penetration system in the loop penetration test platform to obtain test results includes: Testing the test equipment in the loop-through system according to the loop shuttle scheduling strategy of the loop-through test platform to obtain the test results indicating the stability of the equipment; and / or The circular shuttle scheduling strategy to be tested in the circular shuttle system is tested in the circular shuttle testing platform to obtain the test result indicating whether the circular shuttle scheduling strategy is applicable.

3. The method according to claim 1, characterized in that Before configuring the loop-through test platform, the method further includes: Create the operating logic, interactive interface, data table and function configuration interface of the loop test platform, wherein the data table is used to record interface configuration information, and the function configuration interface is used to configure the corresponding interface information.

4. The method according to any one of claims 1 to 3, characterized in that Before configuring the loop-through test platform, the method further includes: A visual interactive interface of the loop penetration test platform is displayed, and the interactive interface is used to configure the loop penetration test platform.

5. A testing device for a ring-through system, characterized in that: The method according to any one of claims 1 to 3, wherein the device comprises: A configuration unit, configured to configure the loop-through test platform to establish an association between the loop-through test platform and the loop shuttle vehicle signal and the loop shuttle vehicle scheduling strategy in the loop-through system; The testing unit is used to test the target in the loop-through system in the loop-through test platform to obtain the test result.

6. A storage medium, characterized in that The storage medium includes a stored program, wherein the program executes the method described in any one of claims 1 to 3 when executed.

7. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: The processor executes the method according to any one of claims 1 to 3 through the computer program.

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