Electronic accessory test processor and method of controlling the same

Abstract

The present invention relates to an electronic accessory test handler and a control method thereof. Specifically, an electronic accessory test handler according to an embodiment of the present invention can include a hand body; and a closing unit selectively opening and closing a socket provided in a first tray, supported by the hand body, the opening and closing unit including a hook portion, a support portion spaced apart from the hook portion in a first direction and relative to the hook portion, and a rail portion including a first rail guiding movement of the hook portion in the first direction and a second rail guiding movement of the support portion in the first direction, the first rail and the second rail being spaced apart from each other along a second direction different from the first direction, the hook portion and the support portion being respectively configured to move along the first rail and the second rail to approach or move away from each other in order to open and close the socket.

Description

TECHNICAL FIELD

[0001] The present invention relates to an electronic component test handler and a control method thereof. BACKGROUND

[0002] A test handler is a device that supports testing of electronic components such as semiconductor devices manufactured through a prescribed manufacturing process and classifies the electronic components according to test results. Such a test handler can test electronic components such as semiconductor devices by electrically connecting the electronic components to a tester.

[0003] On the other hand, in order to test electronic components, a conventional test handler places an electronic component placed on a shuttle on a test socket and electrically connects the electronic component loaded on the test socket to a tester. In addition, a space in which the electronic component is placed is formed inside the test socket, and such a space is opened and closed by a cover.

[0004] On the other hand, in order to open the space formed on the test socket in order to place the electronic component, it is necessary to close the test socket again in order to test when the electronic component is placed. However, in order to open and close the space formed in the test socket as needed, a user has difficulty in opening the cover one by one. Also, in order to test a plurality of electronic components at the same time, when a plurality of test sockets are provided, the user's work is burdensome, thereby prolonging the test process time.

[0005] Therefore, there is a need for an electronic component test handler that can automatically open and close a plurality of test sockets while opening and closing the test socket. SUMMARY

[0006] An embodiment of the present invention, as an invention in view of the above background, provides an electronic component test handler that can automatically open and close a plurality of test sockets while opening and closing a test socket.

[0007] In addition, an embodiment of the present invention also provides an electronic component test handler that can reduce the work burden of a user by automatically opening and closing a test socket and has an effect of shortening the process time.

[0008] According to an aspect of the present application, there can be provided an electronic component test handler configured to include a hand body; and an opening and closing unit supported by the hand body and selectively opening and closing a socket provided in a first tray, the opening and closing unit including a hook portion, a support portion spaced apart from the hook portion in a first direction, and a rail portion including a first rail guiding movement of the hook portion in the first direction and a second rail guiding movement of the support portion in the first direction, the first rail and the second rail being spaced apart from each other in a second direction different from the first direction, the hook portion and the support portion being configured to move along the first rail and the second rail, respectively, to approach or move away from each other in order to open and close the socket.

[0009] Further, there can be provided an electronic component test handler configured to include the hook portion including a first bracket supported by the support portion and a first hook member and a second hook member curved on one side toward the support portion and supported by the first bracket on the other side, the support portion including a second bracket supported by the rail portion and a first support roller and a second support roller, the first hook member and the second hook member being spaced apart from each other in the second direction, the first support roller and the second support roller being spaced apart from each other in the second direction, the first hook member and the second hook member being supported by the first tray and positioned in positions corresponding to the first support roller and the second support roller, respectively, in the first direction.

[0010] Further, there can be provided an electronic component test handler configured to include the first hook member and the second hook member each curved on one side toward the support portion and formed with an inclined surface on an end portion of the one side, the inclined surface having a prescribed inclination with respect to the first direction and extending downward.

[0011] Further, there can be provided an electronic component test handler configured to include the first bracket provided to have a length from one end portion supported by the rail portion in a vertical direction to the other end portion supporting the first hook member longer than a length from one end portion supported by the rail portion of the second bracket in the vertical direction to the other end portion supporting the first support roller.

[0012] Further, there can be provided an electronic component test handler configured to further include a guide portion supported by the hand body and extending in a vertical direction, the opening and closing unit being configured to move upward along the guide portion in order to open the socket or to move downward along the guide portion in order to close the socket.

[0013] Further, there can be provided an electronic component test handler configured to further include a picker unit capable of gripping an electronic component disposed in the socket, the picker unit including a plurality of pickers capable of gripping the electronic component, and a gap variable portion that adjusts a gap between the plurality of pickers in the second direction.

[0014] Further, there can be provided an electronic component test handler control method including a first open-hand moving step of moving a hook portion to one side in a first direction to support a latch of a first tray, an ascending step of ascending the hook portion supporting the latch, a second open-hand moving step of a support portion supporting the latch rotating in a direction in which an angle formed with a seating portion provided in the first tray becomes larger and moving to one side in the first direction, and a third open-hand moving step of the hook portion supporting a housing rotating in a direction in which an angle formed with the seating portion becomes larger and moving to the other side in the first direction.

[0015] Further, there can be provided an electronic component test handler control method in which, in the first open-hand moving step, when the hook portion moves in the first direction to support the latch, the support portion moves to the other side in the first direction by a distance longer than a distance by which the hook portion moves.

[0016] Further, there can be provided an electronic component test handler control method in which the ascending step includes a first ascending step of ascending the hook portion to a prescribed distance while the hook portion supports the latch, and a second ascending step of ascending while moving to one side in the first direction to bring the hook portion close to the support portion.

[0017] Further, there can be provided an electronic component test handler control method further including a picker driving step of driving a picker unit to cause the picker unit to dispose an electronic component in the seating portion or grip an electronic component disposed in the seating portion, the picker driving step being performed after the third open-hand moving step.

[0018] Further, there can be provided an electronic component test handler control method including a first close-hand moving step of moving a hook portion to one side in a first direction to support a housing while rotating the housing in a direction in which an angle formed with a seating portion provided in a first tray becomes smaller, a first descending step of descending the hook portion supporting the housing, a third close-hand moving step of a support portion supporting a latch while moving to the other side in the first direction to rotate the latch in a direction in which an angle formed with the seating portion becomes smaller, and a second descending step of descending the hook portion supporting the latch.

[0019] Further, an electronic component test handler control method can be provided, which further includes a second closing hand movement step of moving to the other side of the first direction to disengage the hook portion from the rotation path of the latch, the third closing hand movement step being performed after the second closing hand movement step.

[0020] Further, an electronic component test handler control method can be provided, which further includes a pickup unit driving step of driving the pickup unit to place the electronic component in the placement portion or to grip the electronic component placed in the placement portion, the pickup unit driving step being performed before the first closing hand movement step.

[0021] Advantageous Effects

[0022] An embodiment of the present application has an effect of being able to open and close a plurality of test sockets while being able to automatically open and close a test socket.

[0023] Further, in an embodiment of the present application, a user's work burden can be reduced by automatically opening and closing a test socket, and an effect of shortening engineering time is obtained. BRIEF DESCRIPTION OF DRAWINGS

[0024] Figure 1 A conceptual diagram of an electronic component test handler according to an embodiment of the present application is shown schematically;

[0025] Figure 2 A perspective view of a first tray, a second tray, and a test hand of Figure 1

[0026] Figure 3 A plan view of Figure 2

[0027] Figure 4 An oblique view and a partially enlarged view of an opening and closing unit of Figure 2

[0028] Figure 5 A bottom perspective view of Figure 4

[0029] Figure 6 A front view of Figure 4

[0030] Figure 7 A perspective view of a pickup unit of Figure 2

[0031] Figure 8 Figures sequentially showing opening steps of sockets of a first tray of Figure 2

[0032] Figure 9 Figures sequentially showing opening steps of sockets of a first tray of​​​​​​​Figure 8 a figure sequentially showing an opening step of opening the socket provided in the first tray;

[0033] Figure 10 a figure sequentially showing a closing step of closing the socket provided in the first tray; Figure 2

[0034] Figure 11 a figure sequentially showing a closing step of closing the socket provided in the first tray; Figure 10

[0035] Figure 12 a sequence diagram for schematically showing a control method of an electronic parts tester according to an embodiment of the present application. DETAILED DESCRIPTION

[0036] Hereinafter, specific embodiments for implementing the technical idea of the present application will be described in detail with reference to the accompanying drawings.

[0037] Further, in explaining the present application, if it is judged that a detailed explanation of a related known configuration or function can obscure the gist of the present application, a detailed explanation thereof will be omitted.

[0038] Further, when a certain configuration element is referred to as being "connected" or "supported" to another configuration element, although it can be directly connected or supported to the other configuration element, it should be understood that there can be other configuration elements therebetween.

[0039] The terms used in the present specification are used only to explain specific embodiments and are not intended to limit the present application. Unless the context clearly indicates otherwise, the singular expression includes the plural expression.

[0040] Further, although terms including ordinal numbers such as first, second, etc. can be used to describe various configurations, the corresponding configuration elements are not limited to the terms. The terms are used only to distinguish one configuration element from another configuration element.

[0041] The meaning of "include" used in the specification is to specifically embody a certain characteristic, field, positive number, step, action, element, and / or component, and does not exclude the presence or addition of other specific characteristics, fields, positive numbers, steps, actions, elements, components, and / or groups.

[0042] Further, the expressions of upper, lower, etc. in the present specification are explained on the drawing surface as a standard, and it should be previously noted that if the direction of the corresponding object is changed, it can have a different expression. On the other hand, the first direction of the present specification can be the x-axis direction of Figure 1 and Figure 2 , and the second direction can be the y-axis direction of Figure 1 and Figure 2 . Further, the up-down direction can be​​Figure 1 and Figure 2 The first direction can be defined as a direction in which the hook portion and the support portion approach or move away from each other on the horizontal plane, and the second direction can be defined as a direction perpendicular to the first direction on the horizontal plane.

[0043] Hereinafter, referring to the drawings, specific features of an electronic parts test handler 1 according to an embodiment of the present application will be described.

[0044] Hereinafter, referring to the drawings, Figure 1 and Figure 2 The electronic parts test handler 1 according to an embodiment of the present application can electrically connect electronic parts 2 manufactured through a prescribed manufacturing process to a tester and classify the electronic parts 2 according to test results. For example, the electronic parts 2 can be semiconductor devices. Further, the electronic parts test handler 1 can be manufactured in various forms so as to be optimized for the type of electronic parts 2 to be tested. Such an electronic parts test handler 1 can be combined with a tester (not shown) capable of testing the electronic parts 2, and the electronic parts can be electrically connected to the tester. Such an electronic parts test handler 1 can include a frame 10, a stacker 20, a transfer hand 30, a first tray 40, a second tray 50, a test hand 60, a conveyor 70, and a control portion 80.

[0045] The frame 10 can support the stacker 20, the transfer hand 30, the first tray 40, the second tray 50, the test hand 60, the conveyor 70, and the control portion 80. Such a frame 10 can provide a space to transfer a customer tray (not shown). Further, the frame 10 can include a conveyer (not shown) capable of transferring the customer tray from the stacker 20 to a position adjacent to the transfer hand 30.

[0046] The stacker 20 can store the customer tray on which the electronic parts are loaded. Such a stacker 20 can be supported by the frame 10. Further, the customer tray loaded on the stacker 20 can be transferred to a position adjacent to the transfer hand 30 by the conveyer.

[0047] The transfer hand 30 can transfer the electronic parts loaded on the customer tray to the second tray 50. For example, the transfer hand 30 can be supported by a transfer rail (not shown) and move, and can transfer a plurality of electronic parts at the same time.

[0048] The first tray 40 can provide a space to seat a plurality of electronic parts, and can fixedly support a plurality of electronic parts. Such a first tray 40 can include a tray plate 41 and a socket 42.

[0049] The tray board 41 can support a plurality of sockets 42. Such a tray board 41 can be provided in plural. For example, the tray board 41 can be placed in a loading position for setting electronic components during a period in which the tray board 41 is connected with a tester and testing is performed.

[0050] The socket 42 can provide a space for setting electronic components, and selectively expose the set electronic components to the outside. In addition, the socket 42 can be provided in plural. For example, the socket 42 can be a clamshell socket. Such a socket 42 can include a latch 42a, a cover 42b, and a setting portion 42c.

[0051] The latch 42a can be rotatably connected to the setting portion 42c. Such a latch 42a can prevent rotation of the cover 42b, and can be linked to the cover 42b to rotate. For example, when the latch 42a is rotated within a predetermined angle range, the cover 42b can be set in a closed state, and when the latch 42a is rotated outside the predetermined angle range, the cover 42b can be set in an open state. In addition, the latch 42a can be placed in a fixed position in which rotation is not possible by the hook portion 130 while maintaining the cover 42b in the closed state, and can be rotated to escape from the fixed position by the hook portion 130. The latch 42a can maintain the cover 42b in the closed state even in the fixed position, and in addition, even if escape from the fixed position, if the degree of rotation is within the above-described predetermined angle range, the cover 42b can be maintained in the closed state. If the latch 42a is rotated outside the predetermined angle, support of the cover 42b can be released.

[0052] The cover 42b can be rotatably connected to the setting portion 42c. In addition, the cover 42b can be set in any one of an open state and a rotated state by rotation of the latch 42a. Among them, the open state of the cover 42b means a state in which at least a part of the setting portion 42c is open to the outside, and the electronic components set in the setting portion 42c are exposed to the outside. In addition, the closed state of the cover 42b means a state in which the setting portion 42c is closed to the outside, and the electronic components set in the setting portion 42c are isolated from the outside.

[0053] The setting portion 42c can rotatably support the latch 42a and the cover 42b, and can provide a space for setting electronic components.

[0054] The second tray 20 can be moved between the stacker 20 and the first tray 40 for transferring electronic components. For example, the second tray 50 can receive the electronic components from the transfer hand 30 at a position adjacent to the stacker 20. Also, the electronic components disposed in the second tray 50 can be transferred to the first tray 40 by the test hand 60 at a position adjacent to the first tray 40. Also, a plurality of pockets in which a plurality of electronic components can be disposed can be formed in the second tray 50. Meanwhile, the second tray 50 can be named as a shuttle or a shuttle table.

[0055] The test hand 60 can transfer the electronic components loaded in the second tray 50 to the first tray 40. Such a test hand 60 can grip the electronic components, and selectively open the sockets 42 of the first tray 40. Also, the test hand 60 can be moved on the first tray 40 in the first direction by the conveyor 70. Such a test hand 60 can include an opening unit 100, a picker unit 200, a hand body 300, a guide 400, and a driving unit 500.

[0056] Referring to Figure 4 and Figure 5 , the opening and closing unit 100 can selectively open and close the sockets 42 of the first tray 40. Also, the opening and closing unit 100 can be supported by the hand body 300, and can be moved in the up and down direction along the first guide 410. Such an opening and closing unit 100 can include a main body 110, a rail 120, a hook 130, a support 140, and an opening actuator 150.

[0057] The main body 110 can support the rail 120, the hook 130, the support 140, and the opening actuator 150. Such a main body 110 can be moved in the up and down direction along the first guide 410.

[0058] The rail 120 can guide the movement of the hook 130 and the support 140. Such a rail 120 can be provided to a bottom surface of the main body 110. Also, the rail 120 can include a first rail 121 and a second rail 122.

[0059] The first rail 121 can guide the hook 130 to move in the first direction. Such a first rail extends in the first direction, and can be provided as a plurality.

[0060] The second rail 122 can guide the support 140 to move in the first direction. Such a second rail extends in the first direction, and can be provided as a plurality. Also, the second rail 122 can be supported by the main body 110 to be spaced apart from the first rail 121 in the second direction.

[0061] In order to rotate the latch 42a or the cover 42b with respect to the seating portion 42c, a hook portion 130 can be provided. Such a hook portion 130 can approach or move away from the support portion 140 toward the support portion 140 to open or close the socket 42. Also, the hook portion 130 can be spaced apart from the support portion 140 in the first direction. Such a hook portion 130 can include a first bracket 131 and a hook unit 132.

[0062] Referring to Figure 6 The first bracket 131 can support a plurality of hook units 132. Such a first bracket 131 can be slidably supported on the first rail 121. Also, the first bracket 131 can be provided to have a length L1 in the up-down direction that is longer than a length L2 in the up-down direction of the second bracket 141. Accordingly, lower end portions of the hook units 132 can be positioned lower than lower end portions of the support units 142, which will be described later.

[0063] The hook units 132 can be provided as a plurality of hook units 132 that can be supported by the first bracket 131 to be spaced apart from each other in the second direction. Such a hook unit 132 can include a first hook member 132a, a second hook member 132b, and a hook roller 132c.

[0064] The first hook member 132a and the second hook member 132b can support the latch 42a while moving to rotate the latch 42a. Such a first hook member 132a and a second hook member 132b can be supported by the first bracket 131 to be spaced apart from each other in the second direction. Also, the first hook member 132a and the second hook member 132b can be supported by the first bracket 131 to be respectively positioned in the first direction at positions corresponding to the first support roller 142a and the second support roller 142b from each other. For example, the first hook member 132a and the first support roller 142a can be positioned on an imaginary straight line extending in the first direction.

[0065] On the other hand, one side end portion of each of the first hook member 132a and the second hook member 132b can be supported by the first bracket 131, and the other side end portion can be formed to be bent toward the support portion 140. Also, the first hook member 132a and the second hook member 132b can each be formed to have an inclined surface 132a-1 at the other side end portion toward the support portion 140. Such an inclined surface 132a-1 can extend downward at an angle inclined by a prescribed angle with respect to the first direction. The inclined surface 132a-1 can be in contact with the cover 42b to slide along an upper surface of the cover 42b at the moment when the cover 42b is rotated to be opened while the support of the cover 42b by the latch 42a is released in order for the cover 42b to be separated from the closed state, so as not to rotate the cover 42b by an excessive rotation angle at the moment. The cover 42b can be prevented from being damaged by the moment rotation by such an inclined surface 132a-1.

[0066] The hook roller 132c can support the cover 42b when opening or closing the socket 42. Also, the hook roller 132c can move while supporting the cover 42b, and rotate the cover 42b. The hook roller 132c can move in the up-and-down direction of the first bracket 131 to press the cover 42b. Such a hook roller 132c can be provided between the first hook member 132a and the second hook member 132b. Also, the hook roller 132c can include a rubber material to minimize impact on the cover 42b.

[0067] In order to rotate the latch 42a or the cover 42b with respect to the seating portion 42c, a support portion 140 can be provided. Such a support portion 140 moves to be close to or spaced apart from the hook portion 130 in order to open or close the socket 42. Also, the support portion 140 can include a second bracket 141 and a support unit 142.

[0068] The second bracket 141 can support a plurality of support units 142. Such a second bracket can be slidably supported on a second rail 142.

[0069] The support unit 142 can be provided in a plurality, and the plurality of support units 142 can be supported by the second bracket 141 to be spaced apart from each other in the second direction. Such a support unit 142 can include a first support roller 142a and a second support roller 142b.

[0070] The first support roller 142a and the second support roller 142b can support the latch 42a, and can rotate the latch 42a while supporting the latch 42a. Also, the first support roller 142a and the second support roller 142b can move in the up-and-down direction of the second bracket 141 to press the latch 42a. Such a first support roller 142a and a second support roller 142b can include a buffer member such as rubber or the like when in contact with the latch 42a to minimize impact applied to the latch 42a.

[0071] The opening actuator 150 can move the first bracket 131 along the first rail 121 and move the second bracket 141 along the second rail 122.

[0072] Referring to Figure 7 , the picker unit 200 can grip or release the electronic component. Such a picker unit 200 can be supported by the hand body 300 to move along the second guide 420. That is, the picker unit 200 can move in the second direction along the second guide 420. For example, the picker unit 200 can move back and forth between the upper side of the first tray 40 and the upper side of the second tray 50. Such a picker unit 200 can include a picker body 210, a picker 220, and a pitch variable portion 230.

[0073] The picker body 210 can support a plurality of pickers 220. Such a picker body 210 can be moved by the second driving unit 520 along the second direction.

[0074] The picker 220 can grip or release the electronic component, and in addition, the picker 220 can transfer a plurality of electronic components into either one of the first tray 40 and the second tray 50. For example, the picker 220 can grip the electronic component by vacuum pressure or air pressure formed by a pump (not shown). Such a picker 220 can be provided in a plurality, and the plurality of pickers 220 can be supported by the picker body 210.

[0075] The pitch variable part 230 can adjust the interval between the plurality of pickers 220. Such a pitch variable part 230 can include a pitch rail 231 and a picker driving unit 232.

[0076] The pitch rail 231 is elongated along the second direction, and can guide the movement of the plurality of pickers 220 in the second direction. Such a pitch rail 231 can be supported by the picker body 210.

[0077] The picker driving unit 232 moves the plurality of pickers 220 along the second direction, respectively, in order to adjust the interval between the plurality of pickers 220. For example, the picker driving unit 232 can include an actuator or a hydraulic cylinder.

[0078] As such, the interval between the plurality of pickers 220 can be adjusted by the pitch variable part 230. However, this is only an example, and the pitch variable part 230 includes a cam and a cam follower (not shown), and adjusts the interval between the plurality of pickers 220 by driving the cam and the cam follower. In addition, the plurality of pickers 220 can be provided to be independently raised and lowered from each other.

[0079] The hand body 300 can support the opening and closing unit 100 and the picker unit 200. In addition, the hand body 300 can be supported by the conveyer 70 and moved along the first direction by the conveyer 70.

[0080] The guide part 400 can guide the movement of the opening and closing unit 100 and the movement of the picker unit 200. Such a guide part 400 can include a first guide 410 and a second guide 420.

[0081] The first guide 410 can guide the up-and-down direction movement of the opening and closing unit 100. Such a first guide 410 is supported by the hand body 300 and can be elongated in the up-and-down direction. In addition, the first guide 410 can be provided in a plurality.

[0082] The second guide 420 can guide the second direction movement of the pickup unit 200. Such a second guide 420 is supported by the hand body 300, and can be elongated in the second direction. In addition, the second guide 420 can be provided in plural.

[0083] The driving part 500 can include a first driving unit 510 moving the opening and closing unit 100 in the up and down direction, and a second driving unit 520 moving the pickup unit 200 in the second direction. Such a driving part 500 can include an actuator or a hydraulic cylinder, for example.

[0084] The conveyer 70 can move the test hand 60 in the first direction. Such a conveyer 70 can include an actuator or a hydraulic cylinder, for example.

[0085] The control part 80 can control the driving of the convey hand 30, the second tray 50, the test hand 60, and the conveyer 70. Such a control part 80 can be implemented by an arithmetic device including a microprocessor, a measurement device of a sensor, and a memory, and the implementation thereof is obvious to those skilled in the art, and thus a more detailed description is omitted.

[0086] Hereinafter, a control method S10 of an electronic component test handler for controlling the electronic component test handler 1 according to an embodiment of the present application will be described with reference to Figures 8 to 12

[0087] The control method S10 of the electronic component test handler can place the electronic component in the socket 42 or grip the electronic component placed in the socket 42. Such a control method S10 of the electronic component test handler can include an opening step S100, a closing step S200, and a pickup unit driving step S300.

[0088] In the opening step S100, the opening and closing unit 100 can open the socket 42 to the outside. Such an opening step S100 can include a first opening hand moving step S110, a rising step S120, a second opening hand moving step S130, and a third opening hand moving step S140.

[0089] In the first opening hand moving step S110, the hook part 130 and the support part 140 can be lowered toward the socket 42 so that the socket 42 is positioned between the hook part 130 and the support part 140 (see Figure 8 (a), Figure 8 (b)). In addition, in the first opening hand moving step S110, in order for the hook part 130 to support the latch 42a, it can be moved to one side of the first direction (for example, the left side of Figure 8 In this case, the support part 140 can be moved to the other side of the first direction (for example, the right side of Figure 8 ​The right side moves a greater distance than the hook 130 (see...). Figure 8 (c)).

[0090] In the lifting step S120, the hook portion 130 of the support latch 42a can be raised. Such a lifting step S120 may include a first lifting step S121 and a second lifting step S122.

[0091] In the first rising step S121, the hook portion 130 can rise a predetermined distance from the mounting portion 42c while supporting the latch 42a. In this case, by rising the hook portion 130, the latch 42a can rotate in a direction where the angle formed with the mounting portion 42c increases (see...). Figure 8 (d)).

[0092] In the second rising step S122, the support portion 140 supports the latch 42a while simultaneously rising in response to the rotation of the latch 42a. In this case, the support portion 140 can support the latch 42a at a position adjacent to the initial rotational position of the latch 42a. Thus, in the second rising step S122, the support portion 140 rises while supporting the upper side of the latch 42a, allowing the latch 42a to rotate slowly without sudden rotation.

[0093] Therefore, it can prevent vibration from occurring inside the socket 42, and has the effect of preventing electronic components placed inside the socket 42 from falling out of the correct position or being impacted.

[0094] On the other hand, during the rising step S122, while the latch 42a rotates, it moves to one side in the first direction and rises to bring the hook portion 130 closer to the support portion 140.

[0095] In the second opening hand movement step S130, the support portion 140 can support the latch 42a, which rotates in a direction that forms a larger angle with the placement portion 42c, while moving to one side in the first direction (e.g., Figure 9 (Left side) moves. Furthermore, in the second opening hand movement step S130, when the latch 42a is perpendicular to the placement portion 42c, the support portion 140 can move to space away from the latch 42a. In this case, the outer cover 42b can be supported by the hook roller 132c by disengaging from the closed state. That is, it can prevent abrupt opening due to the hook roller 132c disengaging from the closed state, and it can minimize the vibration applied to the outer cover 120 (see...). Figure 9 (e)).

[0096] In the third opening hand movement step S140, the support part 130 can support the outer cover 42b rotating in a direction that forms a larger angle with the placement part 42c, while simultaneously moving to the other side of the first direction (e.g., Figure 9to the right) (see (e) of FIG. 6). In addition, during the movement of the hook portion 130 in the third open-hand movement step S140, the cover 42b can be supported to rotate by the hook roller 132c (see (c) of FIG. 6). Figure 9 After the third open-hand movement step S140, the hook portion 130 and the support portion 140 can be raised from the seating portion 42c (see (d) of FIG. 6). Figure 9 (g)

[0097] In the closing step S200, the socket 42 can be closed to the outside. Such a closing step S200 can include a first closing-hand movement step S210, a lowering step S220, a second closing-hand movement step S230, and a third closing-hand movement step S240.

[0098] In the first closing-hand movement step S210, in order to position the socket 42 between the hook portion 130 and the support portion 140, the hook portion 130 and the support portion 140 can be lowered toward the socket 42 (see (a) of FIG. 7). Figure 10 (a) Figure 10 (b)) In addition, in the first closing-hand movement step S210, in order to rotate the cover 42b in a direction in which the angle formed by the hook portion 130 and the seating portion 42c becomes smaller, the cover 42b can be moved to the first direction side (for example, to the left) while being supported. During the movement of the hook portion 130 in the first closing-hand movement step S210, the cover 42b can be rotated while being supported by the hook roller 132c (see (c) of FIG. 7). Figure 10 Figure 10 (c)) In addition, in the first closing-hand movement step S210, in order to rotate the cover 42b in a direction in which the angle formed by the hook portion 130 and the seating portion 42c becomes smaller, the cover 42b can be moved to the first direction side (for example, to the left) while being supported. During the movement of the hook portion 130 in the first closing-hand movement step S210, the cover 42b can be rotated while being supported by the hook roller 132c (see (c) of FIG. 7).

[0099] In the lowering step S220, the hook portion 130 can be lowered in order to press the cover 42b, or the support portion 140 can be lowered in order to press the latch 42a. Such a lowering step S220 can include a first lowering step S221 and a second lowering step S222.

[0100] In the first lowering step S221, in order to bring the cover 42b to the closed state, the hook portion 130 can press the cover 42b (see (d) of FIG. 7). Figure 10

[0101] In the second lowering step S222, in order to prevent the cover 42b from coming off the closed state, the support portion 140 that supports the latch 42a can be lowered (see (g) of FIG. 7). Figure 11

[0102] In the second closing-hand movement step S230, in order to bring the hook portion 130 out of the rotational locus of the latch 42a, the hook portion 130 can be moved to the other side of the first direction (for example, to the right) (see (e) of FIG. 7). In this case, the hook portion 130 can not be positioned above the socket 42. Figure 11 Figure 11 (e)) In this case, the hook portion 130 can not be positioned above the socket 42.​​​​

[0103] In the third closing hand movement step S240, the support portion 40 supports the latch 42a so as to rotate in a direction in which the angle formed with the seating portion 42c becomes smaller, and can move to the other side of the first direction (for example, the right side of the Figure 11 (f)). After the third closing hand movement step S240, the hook portion 130 and the support portion 140 move in a direction in which they are spaced apart from each other, and can be lifted from the seating portion 42c (see Figure 11 (h)). Figure 11

[0104] In the picker driving step S300, when the seating portion 42c is open, an electronic component can be seated in the seating portion 42c, or the picker unit 200 can be driven so as to grip an electronic component seated in the seating portion 42c. In such a picker driving step S300, the intervals between the plurality of pickers 220 can be adjusted. Further, in the picker driving step S300, the picker unit 200 can be moved in the second direction so as to be seated on the first tray 40 or the second tray.

[0105] Although the embodiments of the present application have been described as specific embodiments, these are merely examples, and the present application is not limited thereto, and should be interpreted as having the broadest scope in accordance with the technical idea disclosed in the present specification. A person skilled in the art can realize a pattern of an unassigned shape by combining / replacing the disclosed embodiments, but this is also within the scope of the present application. Further, a person skilled in the art can easily make changes or modifications to the disclosed embodiments based on the present specification, and obviously these changes or modifications are also within the scope of the present application.​

Claims

1. An electronic accessory test handler, comprising: Comprising: a hand body; and an opening and closing unit supported by the hand body and selectively opening and closing a socket provided in a first tray, the opening and closing unit comprising: a hook portion; a support portion spaced apart from the hook portion in a first direction in which the hook portion and the support portion approach or move away from each other in a horizontal plane, and relative to the hook portion; and a rail portion including a first rail guiding movement in the first direction of the hook portion and a second rail guiding movement in the first direction of the support portion, the first rail and the second rail being spaced apart from each other in a second direction different from the first direction, the hook portion and the support portion being respectively configured to move along the first rail and the second rail to approach or move away from each other in order to open and close the socket.

2. The electronic component test handler of claim 1, wherein the hook portion comprises: a first bracket supported on the first rail, and a first hook member and a second hook member each having one side end portion bent toward the support portion and the other side end portion supported by the first bracket, the support portion comprises: a second bracket supported by the rail portion, and a first support roller and a second support roller, the first hook member and the second hook member are spaced apart from each other in the second direction, the first support roller and the second support roller are spaced apart from each other in the second direction, the first hook member and the second hook member are supported by the first tray and are respectively positioned in the first direction at positions corresponding to the first support roller and the second support roller.

3. The electronic component test handler of claim 2, wherein the first hook member and the second hook member each have an inclined surface formed at the side end portion bent toward the support portion, the inclined surface has a prescribed inclination with respect to the first direction and extends downward.

4. The electronic component test handler of claim 2, wherein the first bracket is provided such that a length in a vertical direction from one side end portion supported by the rail portion to the other side end portion supporting the first hook member is longer than a length in the vertical direction from one side end portion supported by the rail portion of the second bracket to the other side end portion supporting the first support roller.

5. The electronic accessory test handler of claim 1, wherein, Further comprising: a guide portion supported by the hand body and extending in a vertical direction, the opening and closing unit being configured to move upward along the guide portion in order to open the socket, or move downward along the guide portion in order to close the socket.

6. The electronic accessory test handler of claim 1, wherein, Further comprising: a picker unit capable of gripping an electronic component disposed in the socket, the picker unit comprising: a plurality of pickers capable of gripping the electronic component; and a spacing variable portion adjusting a spacing between the plurality of pickers in the second direction. Comprising:

7. An electronic accessory test handler control method, comprising: a first opening hand moving step moving the hook portion to one side in the first direction to support a latch having the first tray; a rising step rising the hook portion supporting the latch; and a second opening hand moving step moving the support portion to one side in the first direction to support the latch. The second open-hand moving step, the support portion supports the latch which rotates in a direction in which an angle formed with the seating portion becomes larger, and moves to one side of the first direction; The third open-hand moving step, the hook portion supports the cover which rotates in a direction in which an angle formed with the seating portion becomes larger, and moves to the other side of the first direction; In the first direction in which the hook portion and the support portion approach or depart from each other in a horizontal plane, the support portion is spaced from the hook portion and is opposite to the hook portion; The support portion includes a second bracket supported by a rail portion, and a first support roller and a second support roller; The hook portion includes a first bracket, a first hook member, and a second hook member, the first bracket is supported on a first rail of the rail portion, one side end portion of each of the first hook member and the second hook member is bent toward the support portion, and the other side end portion is supported by the first bracket.

8. The electronic parts test handler control method of claim 7, wherein, in the first open-hand moving step, when the hook portion moves to the first direction in order to support the latch, the support portion moves to the other side of the first direction by a distance longer than a distance by which the hook portion moves.

9. The electronic parts test handler control method of claim 7, wherein, the raising step includes: a first raising step in which the hook portion raises from the seating portion by a prescribed distance while supporting the latch; and a second raising step in which the hook portion is raised while moving to one side of the first direction so as to approach the support portion.

10. The electronic accessory test handler control method of claim 7, wherein, Further comprising: a picker driving step of driving a picker unit capable of gripping an electronic part seated on a socket so that the picker unit seats the electronic part on the seating portion or grips the electronic part seated on the seating portion, the picker driving step is executed after the third open-hand moving step; the picker unit includes: a plurality of pickers capable of gripping the electronic part; and a spacing variable portion which adjusts a spacing between the plurality of pickers in a second direction different from the first direction. including:

11. An electronic accessory test handler control method, comprising: a first open-hand moving step in which the hook portion supports the cover while moving to one side of the first direction so that the cover rotates in a direction in which an angle formed with the seating portion becomes smaller; a first lowering step of lowering the hook portion which supports the cover; a third open-hand moving step in which the support portion supports the latch while moving to the other side of the first direction so that the latch rotates in a direction in which an angle formed with the seating portion becomes smaller; and a second lowering step of lowering the hook portion which supports the latch; in the first direction in which the hook portion and the support portion approach or depart from each other in a horizontal plane, the support portion is spaced from the hook portion and is opposite to the hook portion; the support portion includes a second bracket supported by a rail portion, and a first support roller and a second support roller; ​ The hook portion includes a first support that is supported on a first rail of the rail portion, and a first hook member and a second hook member each of which has one side end portion bent toward the support portion and the other side end portion supported by the first support.

12. The electronic accessory test handler control method of claim 11, wherein, Further comprising: a second closing hand movement step of moving to the other side of the first direction to disengage the hook portion from the rotation path of the latch, the third closing hand movement step is executed after the second closing hand movement step.

13. The electronic accessory test handler control method of claim 11, wherein, Further comprising: a picker driving step of driving a picker unit capable of holding an electronic component disposed in a socket to cause the picker unit to dispose the electronic component in the disposing portion or hold the electronic component disposed in the disposing portion, the picker driving step is executed before the first closing hand movement step; the picker unit includes: a plurality of pickers capable of holding the electronic component; and a spacing variable portion that adjusts the spacing between the plurality of pickers in a second direction different from the first direction. ​

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