A method for transforming a non-standard electronic device test process

Abstract

The application relates to the technical field of electronic equipment testing, in particular to a conversion method of a non-standard electronic equipment testing process, which adopts the technical scheme of the following steps: a plurality of testing process forms are established according to testing information; in the first row of each testing process form, testing process labels and pin information used for testing are sequentially input; testing process information is sequentially input in the column where the testing process label is located, and key fields are used to mark the input types of the testing process information; input items and output items of each testing process are adjusted according to testing results until the process of a single testing process form is completely input; the process input of the testing process form is repeated; corresponding key fields are read to form new testing processes by using the processes corresponding to the key fields. The application can produce corresponding changes according to actual testing requirements, so that the testing process of testing equipment and tools matched with non-standard electronic equipment can be freely converted.

Description

Technical Field

[0001] This invention relates to the field of electronic equipment testing technology, and more specifically to a method for transforming the testing process of non-standard electronic equipment. Background Technology

[0002] In industrial production, various non-standard electronic devices require corresponding testing equipment and tools to verify their correct operation and performance. Generally, these testing equipment and tools are developed in conjunction with the electronic devices themselves. The testing functions implemented by these equipment and tools are determined in advance by analyzing the corresponding electronic device's functions and performance. Developers then use these pre-determined testing functions to develop the testing equipment and tools. However, these pre-determined electronic device functions and performance may be removed, added to, or changed as the design progresses. Therefore, the corresponding testing equipment and tools must change their testing methods accordingly. Existing testing methods are all pre-set and cannot adapt to actual testing needs. Summary of the Invention

[0003] To address the technical problem that existing testing methods for non-standard electronic devices cannot adapt to actual testing needs, this invention provides a method for changing the testing process of non-standard electronic devices. This method can adapt to actual testing needs, thereby enabling the free transformation of testing equipment and tools used with non-standard electronic devices.

[0004] This invention is achieved through the following technical solution:

[0005] This invention provides a method for transforming the testing process of non-standard electronic equipment, comprising the following steps:

[0006] S10. Based on the test information, establish multiple test process forms;

[0007] S20. In the first line of each process form, enter the test process label and the pin information used for the test in sequence;

[0008] S30. Enter the test process information sequentially in the column where the test process label is located, and use key fields to mark the input type of the test process information;

[0009] S40. Adjust the input and output items of each test process according to the test results until the process of a single process form is completely entered.

[0010] S50. Repeat steps S20 to S40 to complete the process entry for all the process forms.

[0011] S60. Read the corresponding key fields and obtain the process corresponding to the key fields.

[0012] In the existing technology, the test equipment and tools for non-standard electronic devices are developed based on the pre-determined test functions. However, these pre-determined electronic device functions and performance may be canceled, added, or changed as the design progresses. Therefore, the corresponding test equipment and tools must change accordingly, and the existing test methods cannot be adapted to actual test requirements.

[0013] The method for changing the testing process of non-standard electronic equipment provided by this invention first establishes multiple testing process forms based on test information. In the first row of each process form, the testing process label and pin information used for testing are entered sequentially. The testing process information is then entered sequentially in the column containing the testing process label. Key fields are used to mark the input type of the testing process information. Next, the input and output items of each testing process are adjusted according to the test results until the process of a single process form is fully entered and the process of all process forms is completed. Finally, the corresponding key fields are read to obtain the corresponding testing process through the testing processes corresponding to all key fields.

[0014] Therefore, the method for changing the testing process of non-standard electronic equipment provided by the present invention can change the testing process of non-standard electronic equipment testing equipment in real time and effectively.

[0015] Specifically, in step S10, the test information includes the test type and the test method.

[0016] Specifically, in step S20, the test process label is "STEP".

[0017] Specifically, in step S30, the test process information includes the test sequence number, test method name, manual operation method, input information required for the test, test output results, and steps requiring manual judgment.

[0018] Specifically, in step S40, the manual operation method selectively inputs data based on whether manual operation is required.

[0019] Specifically, in step S40, the input information required for the test is deleted or added based on the test results.

[0020] Specifically, the input information required for the test is added or deleted in the form of data columns.

[0021] Specifically, in step S40, the output result of the test is determined based on the comparison value between the preset test result and the actual test result.

[0022] Specifically, in step S40, the determination of the test output results includes the determination of the upper limit value and the lower limit value.

[0023] Specifically, steps S10 to S50 are all performed in an Excel spreadsheet.

[0024] The present invention has the following advantages and beneficial effects:

[0025] The method for changing the testing process of non-standard electronic equipment provided by this invention first establishes multiple testing process forms based on test information. In the first row of each process form, the testing process label and pin information used for testing are entered sequentially. The testing process information is then entered sequentially in the column containing the testing process label, and key fields are used to mark the input type of the testing process information. Next, the input and output items of each testing process are adjusted according to the test results until the process of a single process form is fully entered and the process of all process forms is completed. Finally, the corresponding key fields are read to form the corresponding testing process. Therefore, the testing process of non-standard electronic equipment testing equipment can be changed in real time and effectively. Attached Figure Description

[0026] The accompanying drawings, which are included to provide a further understanding of the embodiments of the present invention and form part of this application, are not intended to limit the embodiments of the present invention.

[0027] In the attached diagram:

[0028] Figure 1 This is a flowchart illustrating the transformation method of the testing process for non-standard electronic equipment according to an embodiment of the present invention;

[0029] Figure 2 This is a schematic diagram illustrating the implementation method of the present invention based on an Excel spreadsheet. Detailed Implementation

[0030] To make the objectives, technical solutions, and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the embodiments and accompanying drawings. The illustrative embodiments and descriptions of the present invention are only used to explain the present invention and are not intended to limit the present invention.

[0031] It should be noted that in the existing technology, the test equipment and tools for non-standard electronic devices are all developed based on the pre-determined test functions. However, these pre-determined electronic device functions and performance may be canceled, added, or changed as the design progresses. Therefore, the corresponding test equipment and tools must change accordingly, and the corresponding test methods must also change. Thus, the existing test methods cannot be adapted to the actual test requirements.

[0032] In view of this, this embodiment provides a method for changing the testing process of non-standard electronic equipment, which can be changed according to actual testing requirements, thereby realizing the free transformation of testing equipment and tools used with non-standard electronic equipment, as detailed below:

[0033] Example

[0034] Combination Figure 1 This embodiment provides a method for transforming the testing process of non-standard electronic equipment, including the following steps:

[0035] S10. Based on the test information, establish multiple test process forms.

[0036] Specifically, the test information includes test type and test method. The number of test process forms is determined by the number of test types; that is, one test process form corresponds to one test type.

[0037] S20. In the first line of each process form, enter the test process label and the pin information used for the test in sequence.

[0038] Specifically, test process labels typically occupy multiple columns to facilitate the entry and listing of various parameters in separate rows. For example, three columns might be used: a sequence number column, a test method name column, and a column detailing the test process. The test process label is usually located in the first column of the process form.

[0039] For the pin information used in the test, the number of columns occupied is determined according to the number of pins of the device under test.

[0040] The test process label is “STEP”, but it can also be a label for other fields, as long as it can be distinguished from other key fields.

[0041] S30. Enter the test process information sequentially in the column where the test process label is located, and use key fields to mark the input type of the test process information.

[0042] Specifically, the test process information includes the test number, test method name, manual operation method, required input information, test output results, and steps requiring manual judgment. In other words, the rows below the test process label are filled in from left to right with the following information: "Test Number," "Test Method Name," "Manual Operation Method," "Required Input Information," "Test Output Results," and "Steps Requiring Manual Judgment."

[0043] S40. Adjust the input and output items of each test process according to the test results until the process of a single process form is completely entered.

[0044] Specifically, the manual operation method selectively inputs data based on whether manual operation is required, and the input information required for the test is deleted or added based on the test results. The input information required for the test is added or deleted in the form of data columns.

[0045] It should be noted that when entering information, the sections for "Manual Operation Method" and "Places Requiring Manual Judgment" can be left blank if no manual operation is required. "Input Information Required for Testing" should be entered according to the actual testing needs. If later checks reveal that the number of input items is less than the actual requirement, simply add a column to the corresponding process form. If later checks reveal that the number of input items is more than the actual requirement, simply delete the extra entries. Similarly, "Output Results of Testing" should be entered according to the actual testing needs. If later checks reveal that the number of output items is less than the actual output, simply add a column to the corresponding process form. If later checks reveal that the number of output items is more than the actual output, simply delete the extra columns. If the test output results are inconsistent with the actual results, no additions or subtractions are required.

[0046] Meanwhile, the test output is determined based on a comparison between the preset test result and the actual test result. The determination of the test output includes the determination of upper and lower limits. It is understood that the keywords "<" and ">" are used to limit the output results. For example, if it is necessary to determine whether a certain output equals a certain value x, then this output is judged twice in turn: first, it is judged to be greater than xa, and second, it is judged to be less than x+a, where a is the allowable deviation of the output.

[0047] Furthermore, the above-entered test process applies to tests where the input is constant, and then the output is judged to be correct. For cases where the input changes dynamically in a single test, keywords need to be added to the "Input Information Required for Test" section for description. For example, if the input is a pulse signal, the keyword "Pulse:" should be added for limitation.

[0048] S50. Repeat steps S20 to S40 to complete the process entry for all the process forms.

[0049] S60. Read the corresponding key fields and obtain the process corresponding to the key fields.

[0050] Understandably, during initial data entry, the system is designed based on the normal operating functions of non-standard electronic equipment to ensure that any abnormalities are detected when the equipment malfunctions. In other words, no changes are needed if the input and corresponding output match, but if the output and actual result are inconsistent, it indicates either an incorrect input design or faulty data used for judgment. If the issue is verified to be with the test input, then appropriate modifications are made.

[0051] In summary, the method for changing the testing process of non-standard electronic equipment provided in this embodiment first establishes multiple testing process forms based on the test information. In the first row of each process form, the testing process label and the pin information used for testing are entered sequentially. The testing process information is then entered sequentially in the column containing the testing process label. Key fields are used to mark the input type of the testing process information. Then, the input and output items of each testing process are adjusted according to the test results until the process of a single process form is completely entered and the process of all process forms is completed. Finally, the corresponding key fields are read to obtain the corresponding testing process through the testing processes corresponding to all key fields.

[0052] Therefore, the method for changing the testing process of non-standard electronic equipment provided in this embodiment can change the testing process of non-standard electronic equipment testing equipment in real time and effectively.

[0053] Combination Figure 2 To facilitate further understanding, the method for transforming the testing process of non-standard electronic equipment described in this embodiment involves steps S10 to S50 being performed in an Excel spreadsheet. The specific steps are as follows:

[0054] S10. Based on the test information, establish multiple test process forms.

[0055] That is, classify information such as different test types and test methods in different sheets in Excel, and name each sheet according to the corresponding test type.

[0056] Among them, such as Figure 2 As shown, each page of the Excel spreadsheet (a test process form) contains countless rows and columns, forming a two-dimensional array. Different pages then form a three-dimensional array, which in turn contains all the test methods.

[0057] S20. In the first line of each process form, enter the test process label and the pin information used for the test in sequence.

[0058] Specifically, in a single sheet, the pin information required for the test is entered starting from the fourth column of the first row. The first column is filled with the keyword "STEP", and the rows below this keyword are descriptions of the specific test methods.

[0059] S30. Enter the test process information sequentially in the column where the test process label is located, and use key fields to mark the input type of the test process information.

[0060] Specifically, in the row below "STEP", fill in the following information from left to right: "Test number", "Test method name", "Manual operation method", "Input information required for the test", "Output result of the test", and "Places requiring manual judgment".

[0061] S40. Adjust the input and output items of each test process according to the test results until the process of a single process form is completely entered, that is, until the test method design of a single sheet is completed.

[0062] Specifically, if no manual operation is required, the "Manual Operation Method" field can be left blank;

[0063] Fill in the "Input Information Required for Testing" according to the actual needs of the test. If it is found that the input is insufficient during the later review, simply add a column to the sheet. If it is found that the input is excessive during the later review, simply delete the blank spaces in the extra fields.

[0064] The “Test Output Results” should be filled in according to the actual test requirements. If the output is found to be insufficient during later checks, a new column can be added to the sheet. If the output is found to be excessive during later checks, the blank spaces in the extra fields can be deleted.

[0065] Meanwhile, the output results are judged using the keywords "<" and ">". For example, if it is necessary to judge that an output is equal to a certain value x, the output is judged twice in turn. That is, the first judgment is that it is greater than xa, and the second judgment is that it is less than x+a, where a is the allowable deviation of the output.

[0066] If no manual judgment is required, the section "Places requiring manual judgment" can be left blank.

[0067] The test methods described above are applicable to tests where the input is constant, and then the output is judged to be correct. For cases where the input changes dynamically in a single test, keywords need to be added to the "Input Information Required for Test" section for description. For example, if the input is a pulse signal, the keyword "Pulse:" should be added for limitation.

[0068] Similarly, if it is later found that a certain row of test processes in a single sheet is not applicable, simply delete that row of test processes. If it is later found that there are not enough test methods in a single sheet, simply add a new row.

[0069] S50. Repeat steps S20 to S40 to complete the process entry for all the process forms.

[0070] S60. Read the corresponding key field and obtain the process corresponding to the key field. For example, through a set data acquisition program, obtain the relevant test process containing the key field "pulse:", thereby forming a test method related to it, and finally achieving the purpose of freely changing the test process.

[0071] The specific embodiments described above further illustrate the purpose, technical solution, and beneficial effects of the present invention. It should be understood that the above description is only a specific embodiment of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A method for transforming the testing process of non-standard electronic equipment, characterized in that, Includes the following steps: S10. Based on the test information, establish multiple test process forms, wherein the test information includes test type and test method; S20. In the first line of each process form, enter the test process label and the pin information used for the test in sequence; S30. Enter the test process information in the column where the test process label is located, and mark the input type of the test process information using key fields. The test process information includes test number, test method name, manual operation method, input information required for the test, output result of the test, and steps that require manual judgment. S40. Adjust the input and output items of each test process according to the test results until the process of a single process form is completely entered. The output result of the test is judged based on the comparison value between the preset test result and the actual test result. S50. Repeat steps S20 to S40 to complete the process entry for all the process forms. S60. Read the corresponding key fields and obtain the process corresponding to the key fields.

2. The method for transforming the testing process of non-standard electronic equipment according to claim 1, characterized in that, In step S20, the test process label is "STEP".

3. The method for transforming the testing process of non-standard electronic equipment according to claim 1, characterized in that, In step S40, the manual operation method selectively inputs data based on whether manual operation is required.

4. The method for transforming the testing process of non-standard electronic equipment according to claim 1, characterized in that, In step S40, the input information required for the test is deleted or added based on the test results.

5. The method for transforming the testing process of non-standard electronic equipment according to claim 4, characterized in that, The input information required for the test is added or deleted in the form of data columns.

6. The method for transforming the testing process of non-standard electronic equipment according to claim 1, characterized in that, In step S40, the determination of the test output results includes the determination of the upper limit value and the lower limit value.

7. A method for transforming the testing process of non-standard electronic equipment according to any one of claims 1 to 6, characterized in that, Steps S10 to S50 are all performed in an Excel spreadsheet.

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