Ion analysis device

Abstract

The present invention relates to an ion analysis device (1), comprising: a first component (16) fixed relative to an ion flow outlet, provided with a fixing pin (1621) on one side across the ion flow outlet and a pin hole (1631) on the other side; a second component (12), which is a component that can be fixed to the first component and includes an ion flow control unit (121) for controlling the movement of ions flowing out of the ion flow outlet, and has a first recess (1231) and a second recess (1241), wherein the first recess is used to engage with the fixing pin from a first direction perpendicular to the axis of the fixing pin, and the second recess is used to engage with an insertion pin inserted into the pin hole from a second direction different from the first direction; and a pin component (17), which has an insertion pin (172) inserted into the pin hole and a head (171) that clamps and fixes the second recess between the first component and the second recess.

Description

Technical Field

[0001] The present invention relates to an ion analysis device. Background Art

[0002] One type of device used to analyze substances contained in liquid samples is a liquid chromatograph mass spectrometer. In a liquid chromatograph mass spectrometer, the liquid sample is introduced into the chromatographic column along with a flow of mobile phase, where the target substance is separated from other substances. The target substance exiting the column is ionized by the mass spectrometer's ionization source and then separated and measured based on its mass-to-charge ratio in the mass spectrometer.

[0003] As the ionization source of a mass spectrometer, an electrospray ionization (ESI) source can be used, for example. The ESI source is one type of atmospheric pressure ionization source that ionizes a target substance under atmospheric pressure. In the ESI source, a liquid sample is charged, and a nebulizer gas is blown over it, spraying it into an ionization chamber. The charged droplets sprayed into the ionization chamber are ionized by the repulsive force of the charge within the droplets and by vaporization (desolvation) of the mobile phase.

[0004] In a mass spectrometer, if a large number of droplets containing substances other than ions derived from the target substance, such as neutral molecules from the mobile phase, enter the mass spectrometer, the mass spectrometer may be contaminated. Therefore, in many ESI sources, the ESI nozzle and ion introduction unit are positioned so that the direction of spraying charged droplets from the ESI nozzle is orthogonal to the direction of ion introduction from the ionization chamber into the mass spectrometer. Ions generated within the ionization chamber are drawn into the mass spectrometer along the gas flow generated by the pressure difference between the ionization chamber, which is at atmospheric pressure, and the mass spectrometer, which is in a vacuum state.

[0005] Patent Document 1 describes a structure for improving the efficiency of ion absorption into the mass spectrometer in an ESI source having the above-described structure. The ESI source comprises: a ground electrode having an opening through which the jet from the ESI nozzle passes; a convergent electrode having an opening surrounding the inlet through which ions are drawn from the ionization chamber into the mass spectrometer; and an injection electrode disposed on the opposite side of the convergent electrode across the jet from the ESI nozzle. A first voltage having the same polarity as the ions being measured is applied to the injection electrode. Furthermore, a second voltage having the same polarity as the ions being measured and having an absolute value smaller than the first voltage is applied to the convergent electrode. After passing through the opening in the ground electrode, ions contained in the jet ejected from the ESI nozzle are pushed toward the convergent electrode due to the potential gradient from the injection electrode toward the convergent electrode. Near the convergent electrode, they are converged toward the ion inlet due to the potential gradient from the convergent electrode toward the ion inlet. Neutral molecules, on the other hand, are not affected by the potential gradient. Therefore, it is possible to suppress the contamination of the mass spectrometry section by neutral molecules originating from the mobile phase or the like, and to improve the efficiency of taking in ions originating from the target substance.

[0006] Prior art literature

[0007] Patent Literature

[0008] Patent Document 1: International Publication No. 2018 / 078693 Summary of the Invention

[0009] Technical problem to be solved by the invention

[0010] Although Patent Document 1 describes the placement of three electrodes, namely a ground electrode, a convergence electrode, and a press-in electrode, within the ionization chamber, it does not describe a specific method for actually securing these electrodes within the chamber. Of these electrodes, the ground electrode, which is positioned closest to the ESI nozzle, accumulates surface contamination due to the jet from the ESI nozzle during repeated analysis of liquid samples, necessitating removal and cleaning at an appropriate time. Furthermore, since these electrodes form an electric field within the ionization chamber that guides ions toward the ion intake port, achieving higher ion intake efficiency requires a high degree of precision in the relative position of these electrodes. Therefore, a technology is needed that allows for easy assembly and disassembly of electrodes with high positional reproducibility.

[0011] Here, the ESI source of a mass spectrometer is described as a specific example. However, the same technique as described above is required in various situations where electrodes to which a voltage for controlling ion movement is applied are arranged in a limited space within an ion analyzer.

[0012] The technical problem to be solved by the present invention is to provide a technology that can easily attach and detach electrodes with high position reproducibility even in a narrow space.

[0013] Solutions for solving the above technical problems

[0014] The ion analysis device of the present invention, which was developed to solve the above-mentioned technical problems, comprises:

[0015] The first component is fixed relative to the ion flow outlet, and is provided with a fixing pin on one side across the ion flow outlet and a pin hole on the other side;

[0016] a second member, comprising an ion flow control portion for controlling the movement of ions flowing out of the ion outflow port, and being fixable to the first member, the second member comprising a first recess and a second recess, the first recess being configured to engage the fixing pin in a first direction perpendicular to the axis of the fixing pin, and the second recess being configured to engage the insertion pin inserted into the pin hole in a second direction different from the first direction;

[0017] The pin member includes an insertion pin inserted into the pin hole and a head portion for sandwiching and fixing the second recessed portion between the pin member and the first member.

[0018] Effects of the Invention

[0019] The ion analyzer of the present invention has a second member including an ion flow control unit mounted on a first member fixed to an ion flow outlet, and the ion flow control unit controls the direction of ions flowing out of the ion flow outlet. The ion flow control unit is typically an electrode member.

[0020] When attaching the second component to the first component, an insertion pin, serving as a pin member, is pre-inserted into the pinhole of the first component. The first recess of the second component is then engaged with the fixing pin of the first component from a first direction perpendicular to the axis of the fixing pin, and the second recess of the second component is engaged with the insertion pin of the pin member from a second direction different from the first direction. This can be accomplished in a single operation by sliding the second component relative to the first component. Finally, the second recess of the second component is sandwiched and fixed between the first component and the head of the pin member.

[0021] In the ion analysis device of the present invention, the first recess of the second component is engaged with the fixing pin of the first component, and the second recess of the second component is engaged with the insertion pin of the pin component, thereby positioning the second component in a plane perpendicular to the fixing pin and the insertion pin. In addition, by clamping and fixing the second recess of the second component between the head of the pin component and the first component, positioning can also be performed in a direction perpendicular to the above-mentioned plane. Therefore, the ion flow control unit can be fixed with high position reproducibility. In addition, the second component can be easily installed by sliding the second component close to the first component and fixing it with the pin component, and can be easily removed by loosening the pin component and sliding the second component away from the first component. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 This is a schematic diagram of the configuration of a mass spectrometer as one embodiment of the ion analyzer of the present invention.

[0023] Figure 2 It is a diagram illustrating the configuration of an ionization source of the mass spectrometer of this embodiment.

[0024] Figure 3 It is an XY top view of the auxiliary component in this embodiment.

[0025] Figure 4 It is an XZ side view of the auxiliary component in this embodiment.

[0026] Figure 5 This is an XZ side view of a state where the auxiliary component in this embodiment is attached to the ESI ionization probe.

[0027] Figure 6 It is an XY top view of the ground electrode in this embodiment.

[0028] Figure 7 It is an XZ side view of the auxiliary component in this embodiment.

[0029] Figure 8 It is a YZ side view of the auxiliary component in this embodiment.

[0030] Figure 9 This is another YZ side view of the auxiliary component in this embodiment.

[0031] Figure 10 It is a perspective view of the pin member in this embodiment.

[0032] Figure 11 This is a diagram for explaining how the ground electrode is attached to the auxiliary component in this embodiment.

[0033] Figure 12 This is another diagram illustrating how the ground electrode is mounted on the auxiliary component in this embodiment.

[0034] Figure 13 It is an XY plan view of a ground electrode according to a modification.

[0035] Figure 14 It is an XZ side view of the auxiliary component of a modified example.

[0036] Figure 15 This is an XZ front view of an auxiliary component of yet another modified example. DETAILED DESCRIPTION

[0037] Hereinafter, a mass spectrometer as one embodiment of the ion analysis apparatus of the present invention will be described with reference to the drawings.

[0038] Figure 1 This is a diagram showing the main components of the mass spectrometer 1 of this embodiment. The mass spectrometer 1 of this embodiment comprises an ionization chamber 10, a first intermediate vacuum chamber 20, a second intermediate vacuum chamber 30, and an analysis chamber 40. The ionization chamber 10 is substantially at atmospheric pressure. The analysis chamber 40 is evacuated to a pressure of, for example, 10°C by a high-performance vacuum pump (not shown). -3 ~10 -4 The first intermediate vacuum chamber 20 and the second intermediate vacuum chamber 30 sandwiched between the ionization chamber 10 and the analysis chamber 40 are also evacuated by vacuum pumps (not shown), forming a multi-stage differential exhaust system in which the vacuum level increases stepwise from the ionization chamber 10 to the analysis chamber 40.

[0039] An ESI ionization probe 11 is disposed in the ionization chamber 10. Figure 2 As schematically shown, the ESI ionization probe 11 includes an ESI nozzle 111 and an assist gas nozzle 112. The ESI nozzle 111 applies a predetermined high voltage (ESI voltage) to the liquid sample and sprays the sample with atomizing gas to thereby spray the sample into the ionization chamber 10 as charged droplets.

[0040] Heating gas is supplied to the assist gas nozzle 112, promoting the vaporization (desolvation) of the mobile phase contained in the liquid sample sprayed from the ESI nozzle 111. The charged droplets sprayed from the ESI ionization probe 11 come into contact with the surrounding atmosphere and become finer. As the mobile phase and other solvents evaporate from the droplets, sample components become charged and ejected as ions. A ground electrode 12, an indentation electrode 13, and a convergence electrode 14 are positioned in front of the spray stream from the ESI ionization probe 11. The ground electrode 12 is grounded, and a predetermined DC voltage is applied to the indentation electrode 13 and the convergence electrode 14 from a power supply (not shown).

[0041] The ionization chamber 10 and the first intermediate vacuum chamber 20 are connected via a thin-diameter heated capillary 15. A pressure difference exists between the two open ends of the heated capillary 15, creating a gas flow from the ionization chamber 10 to the first intermediate vacuum chamber 20. Ions generated within the ionization chamber 10 are drawn into the heated capillary 15 along with the gas flow and are then introduced into the first intermediate vacuum chamber 20 from its outlet end along with the gas flow.

[0042] A skimmer 22 with a small-diameter opening is located at the top of the partition wall separating the first intermediate vacuum chamber 20 from the second intermediate vacuum chamber 30. An ion guide 21, consisting of multiple annular electrodes arranged around the ion beam axis, is located within the first intermediate vacuum chamber 20. Ions introduced into the first intermediate vacuum chamber 20 are attracted to the vicinity of the opening of the skimmer 22 by the electric field generated by the ion guide 21 and are then transported through this opening into the second intermediate vacuum chamber 30.

[0043] A multipole (e.g., octupole) ion guide 31 composed of a plurality of rod electrodes is provided in the second intermediate vacuum chamber 30. Ions are converged by the high-frequency electric field generated by the ion guide 31 and are then introduced into the analysis chamber 40 through the opening of a skimmer cone 32 provided in the partition wall separating the second intermediate vacuum chamber 30 from the analysis chamber 40.

[0044] A quadrupole mass filter 41 and an ion detector 42 are disposed in the analysis chamber 40. Ions introduced into the analysis chamber 40 are introduced into the quadrupole mass filter 41. Due to the electric field formed by the high-frequency voltage and direct current voltage applied to the quadrupole mass filter 41, only ions with a specific mass-to-charge ratio pass through the quadrupole mass filter 41 and reach the ion detector 42. The ion detector 42 generates a detection signal corresponding to the amount of ions that have arrived and outputs the detection signal to the control and processing unit 6 (not shown).

[0045] The control and processing unit 6 controls the measurement operations of the above-mentioned units and performs processing such as generating mass spectrum data based on the detection signal output from the ion detector 42 .

[0046] Reference Figure 2 The structure of the ionization chamber 10 will be described in more detail. In the following description, for convenience, the blowing direction along the central axis of the spray stream from the ESI ionization probe 11 is referred to as the Z-axis direction, the ion intake direction along the central axis of the heated capillary 15, which is perpendicular to the Z-axis direction, is referred to as the X-axis direction, and the direction perpendicular to the X-axis and Z-axis directions is referred to as the Y-axis direction.

[0047] In the ionization chamber 10, a ground electrode 12 is disposed closest to the ESI ionization probe 11. The ground electrode 12 has a flat plate-shaped main body 122 parallel to the XY plane and has an opening 121 centered on the central axis of the spray stream from the ESI ionization probe 11.

[0048] A convergent electrode 14 is disposed at the inlet-side end of the heating capillary 15. The convergent electrode 14 is a flat plate-shaped electrode parallel to the YZ plane, and has an opening 141 surrounding the inlet-side end of the heating capillary 15.

[0049] A flat plate-shaped indentation electrode 13 parallel to the YZ plane is disposed across the spray stream, facing the inlet end of the heating capillary 15 and the converging electrode 14. Specifically, the spray stream from the ESI ionization probe 11 passes through the opening 121 of the ground electrode 12 and then enters the space between the indentation electrode 13 and the converging electrode 14.

[0050] A first voltage having the same polarity as the target ions is applied to the indentation electrode 13 from a power supply (not shown). Furthermore, a second voltage having the same polarity as the target ions and a smaller absolute value than the first voltage is applied to the convergence electrode 14 from a power supply (not shown). The ground electrode 12 and the heating capillary 15 are grounded.

[0051] The electric field formed by the potential difference between the first and second voltages pushes the ions that have entered the space between the intrusion electrode 13 and the convergence electrode 14 from the intrusion electrode 13 toward the convergence electrode 14. Furthermore, near the convergence electrode 14, the ions converge toward the inlet end of the heating capillary 15 and are introduced into the heating capillary 15.

[0052] The ion analyzer of this embodiment is characterized in that the ground electrode 12 is detachable from the auxiliary member 16. Figures 3 to 11 The attachment and detachment structure of the ground electrode 12 will be described. In this embodiment, the ground electrode 12 is fixed to the auxiliary member 16 via a pin member 17, and the auxiliary member 16 is fixed to the ESI ionization probe 11. Specifically, the auxiliary member 16 corresponds to the first member in the present invention, and the ground electrode corresponds to the second member in the present invention.

[0053] First, the structure of the auxiliary component 16 will be described. Figure 3 is an XY top view of the auxiliary component 16, Figure 4 is an XZ side view of the auxiliary component 16, Figure 5 It is an XZ side view of a state where the auxiliary component 16 is attached to the ESI ionization probe 11 .

[0054] The auxiliary component 16 has a flat plate-shaped main body 161. Half of the main body 161 is disc-shaped, and the remaining half is rectangular plate-shaped. An opening 1611 for attaching to the ESI ionization probe 11 is formed in the center of the main body 161. A first extension 162 and a second extension 163 are provided on the side of the rectangular plate-shaped portion of the main body 161 opposite to the disc-shaped portion. The first extension 162 and the second extension 163 are both small flat plate-shaped pieces. A fixing pin 1621 is arranged in the center of the first extension 162 toward the outside of the main body 161. An opening 1631 is formed in the center of the second extension 163. A screw groove corresponding to the screw thread of the insertion pin 172 of the pin component 17 described later is formed on the inner peripheral surface of the opening 1631.

[0055] like Figure 5 As shown, the ESI ionization probe 11 is fixed to the chamber of the ionization chamber 10 with the tip of the ESI nozzle 111 facing vertically downward. The auxiliary component 16 is fixed to a position near the tip of the ESI ionization probe 11 with its flat plate-shaped main body 161 facing horizontally. The auxiliary component 16 is made of a conductive material (e.g., stainless steel) and is grounded while fixed to the ESI ionization probe 11.

[0056] Next, the structure of the ground electrode 12 will be described. Figure 6 is an XY top view of the ground electrode 12, Figure 7 is an XZ side view of the ground electrode 12, Figure 8 It is from Figure 6 The YZ side view of the ground electrode 12 is observed from the left side of the paper. Figure 9 It is from Figure 6 The ground electrode 12 is viewed from the right side of the paper in a YZ side view. The ground electrode 12 is entirely made of a conductive material (eg, stainless steel).

[0057] The ground electrode 12 has a rectangular flat plate-shaped main body 122 with a central opening 121. A first extension portion 123 extends from one end of a long side of the rectangular flat plate-shaped main body 122, and a second extension portion 124 extends from a short side not adjacent to the one end.

[0058] The first extension portion 123 is a small, flat plate. A U-shaped first notch 1231 is formed in the first extension portion 123, opening outward (i.e., on the side opposite to the side where the opening portion 121 is formed). This U-shaped first notch 1231 corresponds to the first recess in the present invention.

[0059] The second extension portion 124 is an L-shaped member when viewed from above, with the short side of the L connected to the main body 122. A J-shaped second notch 1241 is formed on the surface of the long side of the L, opening vertically downward when the ground electrode 12 is mounted. This J-shaped second notch 1241 corresponds to the second recess in the present invention. This J-shaped second notch 1241 becomes shallower toward the inside (i.e., toward the side where the opening 121 of the main body 122 is formed) and has an inclined portion 1242 extending diagonally downward.

[0060] like Figure 10 As shown, the pin member 17 is composed of a head 171 and an insert pin 172 connected to the head and having a thread. Both the head 171 and the insert pin 172 are made of a conductive material (such as stainless steel). For example, a knurled bolt can be used as the pin member 17.

[0061] Next, refer to Figure 11 and Figure 12 The procedure for mounting the ground electrode 12 on the auxiliary member 16 will be described.

[0062] First, the insertion pin 172 of the pin member 17 is preliminarily inserted into and temporarily fixed to the opening 1631 formed in the second extension portion 163 of the auxiliary member 16. Next, the ground electrode 12 is Figure 11 The ground electrode 12 is positioned obliquely to the upper left of the mounting position on the paper, and the inclined portion 1242 of the second notch 1241 formed in the second extension portion 124 of the ground electrode 12 is brought into contact with the insertion pin 172. The ground electrode 12 is then slid along the inclined portion 1242.

[0063] The ground electrode 12 is slid so that the first extension portion 123 of the ground electrode 12 approaches the fixing pin 1621 provided on the first extension portion 162 of the auxiliary member 16 , and the first notch 1231 formed in the first extension portion 123 is inserted into the fixing pin 1621 .

[0064] When the second notch 1241 formed in the second extended portion 124 of the ground electrode 12 is inserted into the insertion pin 172 of the pin member 17, the ground electrode 12 then easily slides along the inclined portion 1242 provided in the second notch 1241 due to its own weight, stopping with the upper surface of the insertion pin 172 abutting the top of the second notch 1241. Similarly, due to the own weight of the ground electrode 12, the upper side surface of the first notch 1231 of the first extended portion 123 of the ground electrode 12 abuts the fixing pin 1621. This positions the ground electrode 12 relative to the auxiliary member 16 in the XZ plane.

[0065] Then, the head portion 171 of the pin member 17 is rotated clockwise, pressing and securing the second extended portion 124 of the ground electrode 12 against the second extended portion 163 of the auxiliary member 16. This secures the ground electrode 12 in the Y-axis direction. When the head portion 171 of the pin member 17 is rotated, the second extended portion 124 of the ground electrode 12 abuts against the head portion 171. This applies a clockwise rotational force to the ground electrode 12 in response to the rotation of the head portion 171, securing the ground electrode 12 with the upper end of the first notch 1231 of the first extended portion 123 pressed against the securing pin 1621. The auxiliary member 16, ground electrode 12, and pin member 17 are all made of conductive materials. Since the auxiliary member 16 is grounded, the ground electrode 12 secured to the auxiliary member 16 is also grounded.

[0066] The most common method for securing components such as the ground electrode of this embodiment is to pre-form multiple screw grooves in the component securing the ground electrode, pre-form openings in the ground electrode equal in number to the screw grooves, align the ground electrode, and then secure the ground electrode with bolts by inserting bolts from the openings into the screw grooves. However, in a confined space such as the ionization chamber 10, inserting bolts into the respective screw grooves and securing the components (e.g., the ground electrode) with the bolts is difficult while holding the component to be secured (e.g., the ground electrode).

[0067] As a method of fixing components that is simpler than the above-mentioned operation, there is also a method of pre-forming U-shaped cutouts on the component that open in the same direction (for example, horizontally). In this case, bolts are temporarily fixed to multiple positions of the fixing component, and after the U-shaped cutouts are inserted into each of them, each bolt is officially tightened. In this method, since the component is held while the cutouts of the component fixed to the temporarily fixed bolts are inserted, there is no need to fix the bolts while holding the component. In addition, since the bolts are temporarily fixed in advance, there is no need to insert the bolts into the screw groove position. Therefore, if this method is adopted, the operation itself is easier than the most common method mentioned above. However, in this method, the fixing position may deviate depending on how far the user inserts the U-shaped cutout relative to the bolt. Therefore, the reproducibility of the position of the fixed ground electrode is poor.

[0068] In contrast, in this embodiment, the first notch 1231 and the second notch 1241, which open in two different directions, are inserted into the fixing pin 1621 and the insertion pin 172, respectively. Since the second notch 1241 is vertically downwardly open, positioning is achieved with the top of the second notch 1241 abutting the insertion pin and the upper side of the first notch 1231 abutting the insertion pin 172. Therefore, the fixed position does not vary, and the ground electrode 12 can be fixed with high reproducibility.

[0069] Furthermore, since the second extended portion 124 of the ground electrode 12 is provided with a second notch 1241 opening vertically downward, the weight of the ground electrode 12 causes the top of the second notch 1241 to abut against the insertion pin 172 of the pin member 17, and the upper side of the first notch 1231 to abut against the insertion pin 172. Therefore, even if the user releases their grip in this state, the position of the ground electrode 12 remains unchanged. This improves workability when installing the ground electrode 12.

[0070] Furthermore, since the second notch 1241 is provided with the inclined portion 1242, after inserting the second notch 1241 with the insertion pin 172 of the pin member 17 abutting the inclined portion 1242, the ground electrode 12 can be slid along the inclined portion 1242 to move the top of the second notch 1241 to a position abutting the insertion pin 172, further improving workability. Furthermore, since the second notch 1241 becomes shallower toward the inside, the ground electrode 12 can be slid by approaching the auxiliary member 16 from obliquely above rather than vertically above. Therefore, as in this embodiment, even when there is insufficient space vertically above the installation position of the ground electrode 12, the ground electrode 12 can be easily attached and detached.

[0071] The above-described embodiment is merely an example and can be modified appropriately based on the spirit of the present invention.

[0072] In the above embodiment, the first extension portion 162 and the second extension portion 163 of the auxiliary member 16 are provided separately, and the first extension portion 123 and the second extension portion 124 of the ground electrode 12 are provided separately, but they can also be provided as a single extension portion. Figure 13 and Figure 14 A ground electrode 212 according to a modified example is shown in which the first extended portion 123 and the second extended portion 124 of the ground electrode 12 are formed as a single extended portion.

[0073] Figure 13 is an XY top view of the ground electrode 212, Figure 14 is an XZ side view of the ground electrode 212. Figure 6 and Figure 7 The corresponding parts of the ground electrode 12 of the above embodiment described in are denoted by the same reference numerals, and detailed description thereof is omitted.

[0074] In the modified ground electrode 212, an extension portion 125 is formed vertically below the long side of the main body 122. A first notch 1231 and a second notch 1241 are provided at one end and the other end, respectively. The shapes of the first notch 1231 and the second notch 1241 are the same as those in the above-described embodiment. Using this configuration of the ground electrode 212, the ground electrode 212 can be secured to the auxiliary member 16 using the same procedures as in the above-described embodiment.

[0075] Furthermore, in the above embodiment, a bolt (knurled bolt) is used as the pin member 17. However, the pin member is not limited to a bolt as long as it has the following functions: the function of pressing the notch 1231 of the ground electrode 12 against the fixing pin 1621 through rotation of the member to position the ground electrode 12; the function of pressing and fixing the ground electrode 12 to the auxiliary member 16; and the function of grounding the ground electrode 12 through the auxiliary member 16. For example, a biasing member such as a spring made of a conductive material that is rotatably attached to the auxiliary member 16 and presses the ground electrode 12 toward the auxiliary member 16 may also be used. However, when used in a location subject to high temperatures, as in the ground electrode of the above embodiment, the elasticity of the spring or the like may be lost. Therefore, as in the above embodiment, a bolt is preferably used.

[0076] In addition to the ground electrode 12 of the embodiment and the ground electrode 212 of the modified example described above, various configurations may be employed. Since the main body 122 of these ground electrodes 12 and 212 is fixed horizontally, an extension portion substantially perpendicular to the main body 122 is provided. However, the present invention is also applicable to ground electrodes in which the main body 122 is fixed vertically.

[0077] Figure 15 This is an XZ front view of another modified example of a ground electrode 312 in which the main body 122 is fixed vertically. As shown in this example, when the main body 122 is fixed vertically, an extension portion can be provided that is placed on the same plane as the main body 122. Furthermore, as in the ground electrode 312 of this modified example, the first notch 1231 can be configured to open in two directions, vertically downward and outward. Even when using a ground electrode 312 with a first notch 1231 in this shape, the upper portion of the first notch 1231 can be brought into contact with the fixing pin 1621 for positioning.

[0078] The above embodiments and modifications all illustrate cases where the ground electrodes 12, 212, and 312 are fixed inside the ionization chamber 10. However, the same configuration can also be used to fix various components that control ion flow. Furthermore, the same configuration can also be used in ion analyzers other than mass analyzers, such as ion mobility analyzers.

[0079] [plan]

[0080] Those skilled in the art will appreciate that the above-mentioned exemplary embodiments are specific examples of the following schemes.

[0081] (Item 1)

[0082] An ion analysis device according to one embodiment includes:

[0083] The first component is fixed relative to the ion flow outlet, and is provided with a fixing pin on one side across the ion flow outlet and a pin hole on the other side;

[0084] a second member, comprising an ion flow control portion for controlling the movement of ions flowing out of the ion outflow port, and being fixable to the first member, the second member comprising a first recess and a second recess, the first recess being configured to engage the fixing pin in a first direction perpendicular to the axis of the fixing pin, and the second recess being configured to engage the insertion pin inserted into the pin hole in a second direction different from the first direction;

[0085] The pin member includes an insertion pin inserted into the pin hole and a head portion for sandwiching and fixing the second recessed portion between the pin member and the first member.

[0086] The ion analyzer of item 1 has a second component including an ion flow control unit mounted on a first component fixed relative to an ion flow outlet. The ion flow control unit controls the direction of ions flowing out of the ion flow outlet. The ion flow control unit is typically an electrode component. When mounting the second component on the first component, an insertion pin, serving as a pin component, is pre-inserted into the pin hole of the first component. Then, the first recess of the second component is engaged with the fixing pin of the first component in a first direction perpendicular to the axis of the fixing pin, and the second recess of the second component is engaged with the insertion pin of the pin component in a second direction different from the first direction. These engagements can be achieved by sliding the second component relative to the first component and bringing it closer. Finally, the second recess of the second component is clamped and fixed between the first component and the head of the pin component. In the ion analyzer of item 1, the first recess of the second component is engaged with the fixing pin of the first component for positioning in one direction, and the second recess of the second component is engaged with the insertion pin of the pin component for positioning in the other direction. Furthermore, by sandwiching and securing the second recess of the second component between the head of the pin member and the first component, positioning is achieved in a further direction that is not coplanar with the two aforementioned directions. Therefore, the ion flow control unit can be secured with high positional reproducibility. Furthermore, the second component can be easily installed by simply sliding it closer to the first component and securing it with the pin member, and easily removed by simply releasing the pin member and sliding it away from the first component.

[0087] (Item 2)

[0088] In the ionization device described in item 1,

[0089] The first component is a component fixed to the ionization probe,

[0090] The second member is a ground electrode having an opening formed therein for allowing the jet from the ionization probe to pass therethrough.

[0091] The ionization device described in Item 1 can be preferably applied to an ionization device including a ground electrode having an opening formed therein for allowing the jet from the ionization probe to pass therethrough, as in Item 2.

[0092] (Item 3)

[0093] In the ionization device described in item 1 or 2,

[0094] The first recess is a cutout that opens on the side opposite to the side where the second recess is formed.

[0095] In the ionization device described in item 3, the second component is slid relative to the first component from the side opposite to the side where the second recess is formed, so that the first recess of the second component can be engaged with the fixing pin of the first component, and the second recess of the second component can be engaged with the insertion pin of the pin component.

[0096] (Item 4)

[0097] In the ionization device according to any one of items 1 to 3,

[0098] The second recess is a cutout that opens vertically downward when the second member is attached to the first member.

[0099] In the ionization device of item 4, the second part is supported by the fixing pin of the first part when the first recess of the second part is engaged with the fixing pin of the first part and the second recess of the second part is engaged with the insertion pin of the pin part inserted into the pin hole of the first part. Therefore, the operation of clamping and fixing the second recess of the second part between the first part and the head of the pin part can be performed with one hand.

[0100] (Item 5)

[0101] In the ionization device according to any one of items 1 to 4,

[0102] The second recess has a J-shaped cutout, and the J-shaped cutout is formed shallower on the side where the first recess is formed than on the opposite side.

[0103] In the ionization device described in item 5, since the cutout of the second recess on the side where the first recess is formed has a J-shape that is shallower than that on the opposite side, it is easy to engage with the insertion pin of the first component, and operation can be performed more simply.

[0104] (Item 6)

[0105] In the ionization device according to any one of items 1 to 5,

[0106] The second recess has a cutout on the side where the first recess is formed, the cutout being inclined downward when the second member is attached to the first member.

[0107] In the ion analysis device described in Item 6, when the second recess of the second component is engaged with the insertion pin of the pin component inserted into the pin hole of the first component, the second component can be slid along the inclination of the second recess formed in the second component, thereby making the operation easier.

[0108] Description of Reference Numerals

[0109] 1. Mass analysis device

[0110] 10 Ionization chamber

[0111] 11 ESI ionization probe

[0112] 111 ESI nozzle

[0113] 112 auxiliary gas nozzle

[0114] 12, 212, 312 ground electrodes

[0115] 121 opening

[0116] 122 Main body

[0117] 123 First Extension Department

[0118] 1231 1st incision (1st recess)

[0119] 124 Second Extension Department

[0120] 1241 2nd notch (2nd recess)

[0121] 1242 inclined part

[0122] 125 Extension Department

[0123] 13 Press-in electrode

[0124] 14 Convergent electrode

[0125] 141 opening

[0126] 15 Heated capillary

[0127] 16 Auxiliary parts

[0128] 161 Main body

[0129] 1611 Opening

[0130] 162 First Extension Department

[0131] 1621 fixing pin

[0132] 163 Second Extension Department

[0133] 1631 Opening

[0134] 17 Pin assembly

[0135] 171 Head

[0136] 172 Insert pin.

Claims

1. An ion analysis device, characterized in that have: The first component is fixed relative to the ion flow outlet, and is provided with a fixing pin on one side across the ion flow outlet and a pin hole on the other side; a second member, comprising an ion flow control portion for controlling the movement of ions flowing out of the ion outflow port, and being fixable to the first member, the second member comprising a first recess and a second recess, the first recess being configured to engage the fixing pin in a first direction perpendicular to the axis of the fixing pin, and the second recess being configured to engage the insertion pin inserted into the pin hole in a second direction different from the first direction; The pin member includes an insertion pin inserted into the pin hole and a head portion for sandwiching and fixing the second recessed portion between the pin member and the first member.

2. The ion analysis device according to claim 1, wherein The first component is a component fixed to the ionization probe, The second member is a ground electrode having an opening formed therein for allowing the jet from the ionization probe to pass therethrough.

3. The ion analysis device according to claim 1, wherein The first recess is a cutout that opens on the side opposite to the side where the second recess is formed.

4. The ion analysis device according to claim 1, wherein The second recess is a cutout that opens vertically downward when the second member is attached to the first member.

5. The ion analysis device according to claim 1, wherein The second recess has a J-shaped cutout, and the J-shaped cutout is formed shallower on the side where the first recess is formed than on the opposite side.

6. The ion analysis device according to claim 1, wherein The second recess has a cutout on the side where the first recess is formed, the cutout being inclined downward when the second member is attached to the first member.

Images