A method, device, electronic device and storage medium for determining cell capacity

Abstract

The present application provides a method, device, electronic device and storage medium for determining cell capacity. The method includes: obtaining SINR sample test data of a target service cell under a target base station; the target base station is an N-stream base station device, and N is an even number greater than 2; according to the SINR sample test data, determining the beam distribution positions of the M beams in the target service cell, and the SINR distribution diagram corresponding to each of the beam distribution positions; M is one-half of N; according to the SINR distribution diagram, determining the benchmark test position corresponding to each beam; placing M 2-stream test terminals at the benchmark test positions of the M beams to perform throughput tests, and obtaining the throughput of the M beams; according to the throughput of the M beams, determining the cell capacity of the target service cell. The present application can improve the accuracy of cell capacity assessment and reduce testing costs.

Description

Technical Field

[0001] The present application relates to the field of communication technology, and in particular to a method, device, electronic device and storage medium for determining cell capacity. Background Art

[0002] 5G (5th Generation Mobile Communication Technology) networks can provide enhanced mobile broadband services with high speed, ultra-low latency and massive connections. With the rapid development of 5G networks, the scale of 5G networks and the number of users are growing rapidly. With the intensification of market competition, the capacity of mobile communication networks has become a key factor in determining the competitiveness of operators. Improving network capacity and rational use of network capacity are one of the important goals of network operations. FDD-MM (32TR) equipment is the latest 4 / 5G 1.8G / 2.1G dual-band equipment. It is not yet commercially available and there is no mature and accurate capacity assessment method. The equipment is 16-stream but there is no 16-stream test terminal. The latest terminal is only 2T4R, and a single terminal cannot meet the test requirements.

[0003] There are two main types of network evaluation in the prior art: one is single terminal testing, and the other is traffic model capacity evaluation. The first method cannot test the FDD-MM32TR device because there is currently no 16-stream terminal. The second method is based on an abstract model of the business model and the traffic model. Generally, it is based on a single business model first, considering the actual rate requirements of the business data reaching the physical transmission layer after passing through each transmission protocol layer, and then combining the average air interface throughput to obtain the single business user capacity, and according to the user's traffic model distribution characteristics, obtain the user capacity of the comprehensive business. This traditional capacity evaluation method has the following main disadvantages:

[0004] 1. Some capacity assessment methods are based on business types. Currently, various mobile application businesses are developing rapidly, and their types and quantities have far exceeded the existing empirical models. The empirical models cannot accurately reflect the actual limit capacity of the actual (FDD-MM 32TR) equipment. Therefore, the capacity assessment method is not accurate enough;

[0005] 2. Some capacity assessment methods analyze business data and calculate capacity from the application layer through the overhead of each protocol layer. Since the processing of each protocol layer can only simplify the model analysis, there are many models due to the variety of business types, which reduces the accuracy, and the analysis process is more complicated, and the testing cost is higher;

[0006] 3. Traditional capacity assessment methods are fuzzy assessments in the early stages of network construction (when network frequency interference is small). After network construction and networking, the on-site conditions are complex and traditional methods cannot effectively predict network capacity. Summary of the invention

[0007] The technical problem to be solved by the embodiments of the present application is to provide a method, device, electronic device and storage medium for determining cell capacity, so as to solve the technical problems in the prior art of low accuracy, high testing cost and inability to effectively predict network capacity in network capacity assessment methods.

[0008] In a first aspect, an embodiment of the present application provides a method for determining cell capacity, including:

[0009] Obtain SINR (Signal to Interference plus Noise Ratio) sample test data of a target serving cell under a target base station; the target base station is an N-stream base station device, where N is an even number greater than 2;

[0010] Determine, according to the SINR sample test data, the beam distribution positions of the M beams in the target service cell and the SINR distribution graph corresponding to each of the beam distribution positions; M is half of N;

[0011] Determine a benchmark test position corresponding to each beam according to the SINR distribution diagram;

[0012] Placing M 2-stream test terminals at reference test positions of the M beams to perform a throughput test, and obtaining throughputs of the M beams;

[0013] The cell capacity of the target service cell is determined according to the throughput rates of the M beams.

[0014] Optionally, the obtaining of SINR (Signal to Interference plus Noise Ratio) sample test data of a target serving cell under the target base station includes:

[0015] Determining an initial coverage area of ​​the target serving cell according to a deployment location of the target base station;

[0016] Randomly adjusting the position of the 2-stream test terminal in the initial coverage area, and obtaining initial SINR test data of the 2-stream test terminal at different positions;

[0017] The SINR sample test data belonging to the target serving cell is screened out from the initial SINR test data.

[0018] Optionally, determining the beam distribution positions of the M beams in the target serving cell and the SINR distribution graph corresponding to each of the beam distribution positions according to the SINR sample test data includes:

[0019] Determine the beam distribution positions of the M beams in the target serving cell according to the beam identification information and the test longitude and latitude information in the SINR sample test data;

[0020] According to the SINR information corresponding to each beam in the SINR sample test data, an SINR distribution graph corresponding to each beam distribution position is generated.

[0021] Optionally, generating an SINR distribution graph corresponding to each beam distribution position according to the SINR information corresponding to each beam in the SINR sample test data includes:

[0022] The preset coverage simulation software is used to perform geographic graphical representation of the SINR information of each beam to obtain the SINR distribution map corresponding to each beam distribution position.

[0023] Optionally, determining a benchmark test position corresponding to each beam according to the SINR distribution graph includes:

[0024] According to the SINR value in the SINR sample test data, determine a first SINR interval, a second SINR interval, and a third SINR interval corresponding to each beam; wherein the first SINR interval is an interval in which the SINR value is greater than a first threshold, the second SINR interval is an interval in which the SINR value is less than or equal to the first threshold and greater than or equal to the second threshold, the third SINR interval is an interval in which the SINR value is less than the second threshold, and the first threshold is greater than the second threshold;

[0025] Determine, according to the SINR values ​​in the SINR sample test data, a first SINR distribution graph corresponding to the first SINR interval, a second SINR distribution graph corresponding to the second SINR interval, and a third SINR distribution graph corresponding to the third SINR interval in the SINR distribution graph;

[0026] Determine, according to the first SINR distribution graph, the second SINR distribution graph, and the third SINR distribution graph corresponding to each beam, a first benchmark test position corresponding to the first SINR interval, a second benchmark test position corresponding to the second SINR interval, and a third benchmark test position corresponding to the third SINR interval of each beam;

[0027] The first reference test position, the second reference test position and the third reference test position of each beam are used as reference test positions of each beam.

[0028] Optionally, the determining, according to the first SINR distribution graph, the second SINR distribution graph, and the third SINR distribution graph corresponding to each beam, a first benchmark test position corresponding to the first SINR interval of each beam, a second benchmark test position corresponding to the second SINR interval, and a third benchmark test position corresponding to the third SINR interval, includes:

[0029] Calculate the first centroid longitude and latitude of the first SINR interval of each beam according to the first SINR distribution diagram corresponding to each beam;

[0030] According to the second SINR distribution diagram corresponding to each beam, the second centroid longitude and latitude of the second SINR interval of each beam are calculated;

[0031] Calculate the third centroid longitude and latitude of the third SINR interval of each beam according to the third SINR distribution diagram corresponding to each beam;

[0032] Performing SINR test processing on the first centroid longitude and latitude of each beam to obtain a first benchmark test position corresponding to the first SINR interval of each beam;

[0033] Performing SINR test processing on the second centroid longitude and latitude of each beam to obtain a second benchmark test position corresponding to the second SINR interval of each beam;

[0034] Perform SINR test processing on the third centroid longitude and latitude of each beam to obtain a third benchmark test position corresponding to the third SINR interval of each beam.

[0035] Optionally, placing M 2-stream test terminals at reference test positions of the M beams to perform a throughput test to obtain the throughput of the M beams includes:

[0036] Arranging the M 2-stream test terminals at first benchmark test positions of the first SINR interval of each beam respectively;

[0037] Obtaining multiple first SINR values ​​reported by the M 2-stream test terminals;

[0038] Acquire a first throughput rate of each beam in a tested first SINR interval according to the multiple first SINR values;

[0039] The determining, according to the throughput rates of the M beams, the cell capacity of the target serving cell includes:

[0040] A sum of the M first throughput rates is obtained, and a maximum cell capacity of the target serving cell is determined according to the sum.

[0041] Optionally, placing M 2-stream test terminals at reference test positions of the M beams to perform a throughput test to obtain the throughput of the M beams includes:

[0042] Arranging the M 2-stream test terminals at second benchmark test positions of the second SINR interval of each beam respectively;

[0043] Obtaining multiple second SINR values ​​reported by the M 2-stream test terminals;

[0044] Acquire, according to the multiple second SINR values, a second throughput rate of each beam in a tested second SINR interval;

[0045] The determining, according to the throughput rates of the M beams, the cell capacity of the target serving cell includes:

[0046] A sum of M second throughput rates is obtained, and an average cell capacity of the target serving cell is determined according to the sum.

[0047] Optionally, placing M 2-stream test terminals at reference test positions of the M beams to perform a throughput test to obtain the throughput of the M beams includes:

[0048] Arranging the M 2-stream test terminals at third benchmark test positions of the third SINR interval of each beam respectively;

[0049] Obtaining multiple third SINR values ​​reported by the M 2-stream test terminals;

[0050] Acquire, according to the multiple third SINR values, a third throughput rate of each beam in a tested third SINR interval;

[0051] The determining, according to the throughput rates of the M beams, the cell capacity of the target serving cell includes:

[0052] A sum of the M third throughput rates is obtained, and the edge cell capacity of the target serving cell is determined according to the sum.

[0053] In a second aspect, an embodiment of the present application provides a cell capacity determination device, including:

[0054] A sample test data acquisition module is used to obtain SINR (Signal to Interference plus Noise Ratio) sample test data of a target serving cell under a target base station; the target base station is an N-stream base station device, where N is an even number greater than 2;

[0055] An SINR distribution map determination module, used to determine the beam distribution positions of the M beams in the target service cell and the SINR distribution map corresponding to each of the beam distribution positions according to the SINR sample test data; M is half of N;

[0056] A benchmark test position determination module, used to determine a benchmark test position corresponding to each beam according to the SINR distribution diagram;

[0057] A beam throughput acquisition module, used for placing M 2-stream test terminals at the reference test positions of the M beams to perform a throughput test and obtain the throughput of the M beams;

[0058] The cell capacity determination module is used to determine the cell capacity of the target service cell according to the throughput rates of the M beams.

[0059] Optionally, the sample test data acquisition module includes:

[0060] An initial coverage area determination unit, configured to determine an initial coverage area of ​​the target serving cell according to a deployment location of the target base station;

[0061] An initial test data acquisition unit, used for randomly adjusting the position of the 2-stream test terminal in the initial coverage area, and acquiring initial SINR test data of the 2-stream test terminal at different positions;

[0062] The sample test data screening unit is used to screen out the SINR sample test data belonging to the target serving cell from the initial SINR test data.

[0063] Optionally, the SINR distribution map determination module includes:

[0064] A beam distribution position determination unit, configured to determine the beam distribution positions of the M beams in the target service cell according to the beam identification information and the test longitude and latitude information in the SINR sample test data;

[0065] The SINR distribution diagram generating unit is used to generate an SINR distribution diagram corresponding to each beam distribution position according to the SINR information corresponding to each beam in the SINR sample test data.

[0066] Optionally, the SINR distribution map generating unit includes:

[0067] The SINR distribution map acquisition subunit is used to use the preset coverage simulation software to perform geographical graphic representation of the SINR information of each beam to obtain the SINR distribution map corresponding to each beam distribution position.

[0068] Optionally, the benchmark test position determination module includes:

[0069] An SINR interval determination unit is used to determine a first SINR interval, a second SINR interval and a third SINR interval corresponding to each beam according to the SINR value in the SINR sample test data; wherein the first SINR interval is an interval in which the SINR value is greater than a first threshold, the second SINR interval is an interval in which the SINR value is less than or equal to the first threshold and greater than or equal to the second threshold, the third SINR interval is an interval in which the SINR value is less than the second threshold, and the first threshold is greater than the second threshold;

[0070] An SINR distribution graph determining unit, configured to determine, according to the SINR values ​​in the SINR sample test data, a first SINR distribution graph corresponding to the first SINR interval, a second SINR distribution graph corresponding to the second SINR interval, and a third SINR distribution graph corresponding to the third SINR interval in the SINR distribution graph;

[0071] an interval reference position determination unit, configured to determine a first reference test position corresponding to the first SINR interval of each beam, a second reference test position corresponding to the second SINR interval, and a third reference test position corresponding to the third SINR interval according to the first SINR distribution graph, the second SINR distribution graph, and the third SINR distribution graph corresponding to each beam;

[0072] The reference test position acquisition unit is used to use the first reference test position, the second reference test position and the third reference test position of each beam as the reference test position of each beam.

[0073] Optionally, the interval reference position determination unit includes:

[0074] A first centroid longitude and latitude calculation subunit, configured to calculate the first centroid longitude and latitude of the first SINR interval of each beam according to the first SINR distribution diagram corresponding to each beam;

[0075] A second centroid longitude and latitude calculation subunit is used to calculate the second centroid longitude and latitude of the second SINR interval of each beam according to the second SINR distribution diagram corresponding to each beam;

[0076] A third centroid longitude and latitude calculation subunit, configured to calculate the third centroid longitude and latitude of the third SINR interval of each beam according to a third SINR distribution diagram corresponding to each beam;

[0077] A first benchmark test position acquisition subunit is used to perform SINR test processing on the first centroid longitude and latitude of each beam to obtain a first benchmark test position corresponding to the first SINR interval of each beam;

[0078] A second benchmark test position acquisition subunit is used to perform SINR test processing on the second centroid longitude and latitude of each beam to obtain a second benchmark test position corresponding to the second SINR interval of each beam;

[0079] The third benchmark test position acquisition subunit is used to perform SINR test processing on the third centroid longitude and latitude of each beam to obtain a third benchmark test position corresponding to the third SINR interval of each beam.

[0080] Optionally, the beam throughput acquisition module includes:

[0081] A first test terminal arrangement unit, configured to arrange the M 2-stream test terminals at first reference test positions of a first SINR interval of each beam respectively;

[0082] A first SINR value acquisition unit, configured to acquire a plurality of first SINR values ​​reported by the M 2-stream test terminals;

[0083] A first throughput acquisition unit, configured to acquire a first throughput of each beam in a tested first SINR interval according to the multiple first SINR values;

[0084] The cell capacity determination module includes:

[0085] The maximum cell capacity determination unit is used to obtain the sum of M first throughput rates and determine the maximum cell capacity of the target serving cell according to the sum.

[0086] Optionally, the beam throughput acquisition module includes:

[0087] A second test terminal arrangement unit, configured to arrange the M 2-stream test terminals at second reference test positions of a second SINR interval of each beam respectively;

[0088] A second SINR value acquisition unit, configured to acquire a plurality of second SINR values ​​reported by the M 2-stream test terminals;

[0089] A second throughput acquisition unit, configured to acquire a second throughput of each beam in a tested second SINR interval according to the multiple second SINR values;

[0090] The cell capacity determination module includes:

[0091] The average cell capacity determination unit is used to obtain the sum of M second throughput rates and determine the average cell capacity of the target serving cell according to the sum.

[0092] Optionally, the beam throughput acquisition module includes:

[0093] A third test terminal placement unit, configured to place the M 2-stream test terminals at third benchmark test positions of a third SINR interval of each beam respectively;

[0094] A third SINR value acquisition unit, configured to acquire a plurality of third SINR values ​​reported by the M 2-stream test terminals;

[0095] A third throughput acquisition unit, configured to acquire a third throughput of each beam in a tested third SINR interval according to the multiple third SINR values;

[0096] The cell capacity determination module includes:

[0097] The edge cell capacity determining unit is used to obtain the sum of the M third throughput rates and determine the edge cell capacity of the target serving cell according to the sum.

[0098] In a third aspect, an embodiment of the present application provides an electronic device, including:

[0099] A processor, a memory, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, any of the above methods for determining cell capacity is implemented.

[0100] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium. When instructions in the storage medium are executed by a processor of an electronic device, the electronic device is enabled to execute any of the cell capacity determination methods described above.

[0101] Compared with the prior art, the embodiments of the present application have the following advantages:

[0102] In an embodiment of the present application, by obtaining SINR sample test data of a target service cell under a target base station, the target base station is an N-stream base station device, N is an even number greater than 2, and according to the SINR sample test data, the beam distribution positions of the M beams in the target service cell and the SINR distribution diagram corresponding to each beam distribution position are determined, M is half of N, and according to the SINR distribution diagram, the benchmark test position corresponding to each beam is determined, and M 2-stream test terminals are used to perform throughput tests on the M beams to obtain the throughput of the M beams, and according to the throughput of the M beams, the cell capacity of the target service cell is determined. In an embodiment of the present application, by adopting a multi-point merging and convergence test method, the capacity test of a multi-stream base station device can be realized through a 2-stream test terminal, and the scheme refers to the signal coverage of the existing network and the actual experience of users, and the obtained capacity assessment results are more accurate, without the need to deploy multiple models, reducing the testing cost, and can realize the effective prediction of network capacity after network construction and access.

[0103] It should be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0104] Figure 1 A flowchart of a method for determining cell capacity provided in an embodiment of the present application;

[0105] Figure 2 A flow chart of the steps of a method for acquiring sample test data provided in an embodiment of the present application;

[0106] Figure 3 A flowchart of a method for determining a SINR distribution diagram provided in an embodiment of the present application;

[0107] Figure 4 A flowchart of a method for determining a benchmark test position provided in an embodiment of the present application;

[0108] Figure 5 A flowchart of another method for determining a benchmark test position provided in an embodiment of the present application;

[0109] Figure 6 A flowchart of a method for determining maximum cell capacity provided in an embodiment of the present application;

[0110] Figure 7 A flowchart of a method for determining average cell capacity provided in an embodiment of the present application;

[0111] Figure 8 A flowchart of a method for determining edge cell capacity provided in an embodiment of the present application;

[0112] Fig. 9A schematic diagram of the structure of a cell capacity determination device provided in an embodiment of the present application;

[0113] Fig.10 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0114] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, the present application is further described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0115] The terms used in the embodiments of the present application are only for the purpose of describing specific embodiments, and are not intended to limit the present application. The singular forms "a", "said" and "the" used in the embodiments of the present application and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings.

[0116] Reference Figure 1 , shows a flowchart of the steps of a method for determining cell capacity provided by an embodiment of the present application, such as Figure 1 As shown, the cell capacity determination method may include the following steps:

[0117] Step 101: Obtain SINR (Signal to Interference plus Noise Ratio) sample test data of a target serving cell under a target base station.

[0118] The embodiments of the present application can be applied to a scenario in which a plurality of 2-stream test terminals are used to test the cell capacity of each service cell of N (N is an even number greater than 2) stream base station devices.

[0119] The embodiment of the present application can be applied to a target base station, that is, the execution subject is a target base station. The target base station is an N-stream base station device, where N is an even number greater than 2, and N can be 16, 32, etc. Specifically, the value of N can be determined according to business requirements, and this embodiment does not limit this.

[0120] The target serving cell refers to one or more serving cells under the target base station that need to be capacity evaluated.

[0121] The SINR sample test data refers to the SINR test data collected by the test terminal within the coverage area of ​​the target service cell.

[0122] When predicting the cell capacity of the target serving cell under the target base station, SINR sample test data of the target serving cell under the target base station may be obtained.

[0123] In a specific implementation, the SINR sample test data within the coverage area of ​​the target serving cell can be obtained by traversing. Specifically, Figure 2 This is described in detail as follows.

[0124] Reference Figure 2 , shows a flow chart of the steps of a method for acquiring sample test data provided by an embodiment of the present application, such as Figure 2 As shown, the sample test data acquisition method may include: step 201, step 202 and step 203.

[0125] Step 201: Determine the initial coverage area of ​​the target service cell according to the deployment location of the target base station.

[0126] In this embodiment, the initial coverage area refers to the area estimated to be covered by the target serving cell.

[0127] When evaluating the cell capacity of the target service cell, the deployment location of the target base station may be obtained, and then the initial coverage area of ​​the target service cell may be estimated based on the deployment location of the target base station.

[0128] After the initial coverage area of ​​the target service cell is determined according to the deployment location of the target base station, step 202 is executed.

[0129] Step 202: Randomly adjust the position of the 2-stream test terminal in the initial coverage area, and obtain initial SINR test data of the 2-stream test terminal at different positions.

[0130] After determining the initial coverage area of ​​the target service cell, a 2-stream test terminal (such as a 2T4R terminal, etc.) can be placed in the initial coverage area, and the position of the 2-stream test terminal in the initial coverage area can be randomly adjusted to report measured SINR test data at different locations through the 2-stream test terminal, i.e., initial SINR test data.

[0131] After the initial SINR test data of the 2-stream test terminal at different locations are acquired, step 203 is executed.

[0132] Step 203: Filter out the SINR sample test data belonging to the target serving cell from the initial SINR test data.

[0133] After obtaining the initial SINR test data of the 2-stream test terminal at different locations, the SINR test data belonging to the target service cell can be screened out from the initial SINR test data, and the SINR test data can be used as SINR sample test data. That is, the SINR test data that does not belong to the target service cell in the initial SINR test data is excluded, and the remaining SINR test data is used as SINR sample test data.

[0134] In this practical application, a 2T4R terminal can be used to perform a traversal test on the target service cell under the target base station to obtain test data under all beams under the target service cell. During the test, as many points as possible are tested (traversed) under the target service cell, and the test results must include as much data as possible at good points, medium points, and poor points, and select as many data points with different SINRs as possible to improve the accuracy of subsequent cell capacity assessment.

[0135] After obtaining the SINR sample test data of the target serving cell under the target base station, step 102 is executed.

[0136] Step 102: Determine the beam distribution positions of the M beams in the target service cell and the SINR distribution diagram corresponding to each of the beam distribution positions according to the SINR sample test data; M is half of N.

[0137] The beam distribution position refers to the position distribution covered by each beam in the target service cell.

[0138] The SINR distribution graph refers to a graph formed by the SINR distribution within the position distribution covered by each beam.

[0139] In this example, the number of beams under the target service cell is M, where M is half of N. For example, when the target base station is a 16-stream base station, the number of beams in each service cell under the 16-stream base station is 8, and so on.

[0140] After obtaining the SINR sample test data of the target service cell, the beam distribution positions of the M beams in the target service cell and the SINR distribution map corresponding to the beam distribution position of each beam can be determined according to the SINR sample test data. Figure 3 This is described in detail as follows.

[0141] Reference Figure 3 , shows a flow chart of the steps of a method for determining a SINR distribution diagram provided by an embodiment of the present application, such as Figure 3 As shown, the method for determining the SINR distribution diagram may include: step 301 and step 302.

[0142] Step 301: Determine the beam distribution positions of the M beams in the target service cell according to the beam identification information and the test longitude and latitude information in the SINR sample test data.

[0143] In this embodiment, the obtained SINR sample test data includes beam identification information (ie, Beam ID) and test longitude and latitude information.

[0144] Among them, the beam identification information can be used to indicate the identification of the beam that sends the signal to the 2-stream test terminal.

[0145] The test longitude and latitude information refers to the longitude and latitude information corresponding to the location of the 2-stream test terminal.

[0146] After obtaining the SINR sample test data, the beam distribution positions of the M beams in the target service cell can be determined according to the beam identification information and test longitude and latitude information in the SINR sample test data, that is, the coverage position range of each beam in the M beams can be obtained.

[0147] Step 302: Generate an SINR distribution diagram corresponding to each beam distribution position according to the SINR information corresponding to each beam in the SINR sample test data.

[0148] After the SINR sample test data is acquired, an SINR distribution diagram corresponding to each beam distribution position may be generated according to the SINR information corresponding to each beam in the SINR sample test data.

[0149] In practical applications, the SINR distribution simulation can be completed based on the coverage scenario of the target service cell and the signal lobe characteristics, and the SINR distribution simulation model of the target service cell can be output. Through the preset coverage simulation software, the SINR information of each beam can be geographically represented to obtain the SINR distribution map corresponding to each beam distribution position.

[0150] The embodiment of the present application can facilitate the calculation of subsequent benchmark test positions through the SINR distribution diagram.

[0151] After obtaining the SINR sample test data, determining the beam distribution positions of the M beams in the target service cell, and the SINR distribution diagram corresponding to each beam distribution position, step 103 is performed.

[0152] Step 103: Determine a benchmark test position corresponding to each beam according to the SINR distribution diagram.

[0153] The reference test position refers to the standard position where the test terminal is deployed when testing the throughput of each beam.

[0154] After the SINR distribution diagram corresponding to the beam distribution position of each beam is acquired, the benchmark test position corresponding to each beam can be determined according to the SINR distribution diagram corresponding to each beam.

[0155] In a specific implementation, the good point, middle point, and bad point intervals corresponding to each beam can be determined according to the SINR value in the SINR sample test data, and then the distribution map corresponding to each interval can be determined to calculate the benchmark test position of each interval. Specifically, Figure 4 This is described in detail as follows.

[0156] Reference Figure 4 , shows a flowchart of the steps of a method for determining a benchmark test position provided by an embodiment of the present application, such as Figure 4 As shown, the benchmark test position determination method may include: step 401 , step 402 , step 403 and step 404 .

[0157] Step 401: Determine a first SINR interval, a second SINR interval, and a third SINR interval corresponding to each beam according to the SINR values ​​in the SINR sample test data.

[0158] In this embodiment, the SINR value is the signal-to-noise ratio value.

[0159] After obtaining the SINR sample test data, the SINR value corresponding to each beam can be obtained according to the beam identification information in the SINR sample test data, and then the first SINR interval, second SINR interval and third SINR interval corresponding to each beam can be determined according to the SINR value of each beam.

[0160] Among them, the first SINR interval is an interval in which the SINR value is greater than the first threshold, the second SINR interval is an interval in which the SINR value is less than or equal to the first threshold and greater than or equal to the second threshold, and the third SINR interval is an interval in which the SINR value is less than the second threshold, and the first threshold is greater than the second threshold. For example, the first threshold can be set to 25, the second threshold can be set to 3, the good point interval (i.e., the first SINR interval) is SINR>25; the midpoint interval (i.e., the second SINR interval) is 25≥SINR≤3; the bad point interval (i.e., the third SINR interval) is SINR<3.

[0161] After determining the first SINR interval, the second SINR interval, and the third SINR interval corresponding to each beam according to the SINR values ​​in the SINR sample test data, step 402 is performed.

[0162] Step 402: Determine, according to the SINR values ​​in the SINR sample test data, a first SINR distribution graph corresponding to the first SINR interval, a second SINR distribution graph corresponding to the second SINR interval, and a third SINR distribution graph corresponding to the third SINR interval in the SINR distribution graph.

[0163] After obtaining the first SINR interval, the second SINR interval, and the third SINR interval corresponding to each beam, the first SINR distribution graph corresponding to the first SINR interval in the SINR distribution graph, the second SINR distribution graph corresponding to the second SINR interval, and the third SINR distribution graph corresponding to the third SINR interval can be determined according to the SINR value in the SINR sample test data. That is, for each beam, the SINR distribution graphs corresponding to the first SINR interval, the second SINR interval, and the third SINR interval of the beam can be obtained in turn.

[0164] Step 403: Determine a first benchmark test position corresponding to the first SINR interval, a second benchmark test position corresponding to the second SINR interval, and a third benchmark test position corresponding to the third SINR interval of each beam according to the first SINR distribution diagram, the second SINR distribution diagram, and the third SINR distribution diagram corresponding to each beam.

[0165] After obtaining the SINR distribution diagram corresponding to the three SINR intervals of each beam, the first benchmark test position corresponding to the first SINR interval of each beam, the second benchmark test position corresponding to the second SINR interval, and the third benchmark test position corresponding to the third SINR interval can be determined according to the first SINR distribution diagram, the second SINR distribution diagram, and the third SINR distribution diagram corresponding to each beam.

[0166] In a specific implementation, the centroid longitude and latitude corresponding to each SINR interval can be calculated based on the SINR distribution map corresponding to each SINR interval, and the benchmark test position of each SINR interval can be determined based on the centroid longitude and latitude. Figure 5 This is described in detail as follows.

[0167] Reference Figure 5 , shows a flowchart of the steps of another method for determining a benchmark test position provided by an embodiment of the present application, such as Figure 5 As shown, the benchmark test position determination may include: step 501 , step 502 , step 503 , step 504 , step 505 and step 506 .

[0168] Step 501: Calculate the first centroid longitude and latitude of the first SINR interval of each beam according to the first SINR distribution diagram corresponding to each beam.

[0169] Step 502: Calculate the second centroid longitude and latitude of the second SINR interval of each beam according to the second SINR distribution diagram corresponding to each beam.

[0170] Step 503: Calculate the third centroid longitude and latitude of the third SINR interval of each beam according to the third SINR distribution diagram corresponding to each beam.

[0171] In this embodiment, the first centroid longitude and latitude refer to the centroid longitude and latitude corresponding to the first SINR interval of each beam.

[0172] The second centroid longitude and latitude refer to the centroid longitude and latitude corresponding to the second SINR interval of each beam.

[0173] The third centroid longitude and latitude refer to the centroid longitude and latitude corresponding to the third SINR interval of each beam.

[0174] After obtaining the first SINR distribution diagram for each beam, the first centroid longitude and latitude corresponding to the first SINR interval of each beam can be calculated according to the first SINR distribution diagram. Specifically, the centroid point of the first SINR distribution diagram can be determined by machine small sample model training, and the "centroid" longitude and latitude of the corresponding first SINR interval, i.e., the first centroid longitude and latitude, can be output.

[0175] After obtaining the second SINR distribution map for each beam, the second centroid longitude and latitude corresponding to the second SINR interval of each beam can be calculated according to the second SINR distribution map. Specifically, the centroid point of the second SINR distribution map can be determined by machine small sample model training, and the "centroid" longitude and latitude of the corresponding second SINR interval, i.e., the second centroid longitude and latitude, can be output.

[0176] After obtaining the third SINR distribution map of each beam, the third centroid longitude and latitude corresponding to the third SINR interval of each beam can be calculated according to the third SINR distribution map. Specifically, the centroid point of the third SINR distribution map can be determined by machine small sample model training, and the "centroid" longitude and latitude of the corresponding third SINR interval, i.e., the third centroid longitude and latitude, can be output.

[0177] Step 504: Perform SINR test processing on the first centroid longitude and latitude of each beam to obtain a first benchmark test position corresponding to the first SINR interval of each beam.

[0178] Step 505: Perform SINR test processing on the second centroid longitude and latitude of each beam to obtain a second reference test position corresponding to the second SINR interval of each beam.

[0179] Step 506: Perform SINR test processing on the third centroid longitude and latitude of each beam to obtain a third benchmark test position corresponding to the third SINR interval of each beam.

[0180] The first benchmark test position refers to the benchmark test position corresponding to the first SINR interval of each beam, that is, when testing the throughput of each beam, the 2-stream test terminal can be placed at the first benchmark test position of the first SINR interval of each beam at the same time.

[0181] The second benchmark test position refers to the benchmark test position corresponding to the second SINR interval of each beam, that is, when testing the throughput of each beam, the 2-stream test terminal can be placed at the second benchmark test position of the second SINR interval of each beam at the same time.

[0182] The third benchmark test position refers to the benchmark test position corresponding to the third SINR interval of each beam, that is, when testing the throughput of each beam, the 2-stream test terminal can be placed at the third benchmark test position of the third SINR interval of each beam at the same time.

[0183] After obtaining the first centroid longitude and latitude, the second centroid longitude and latitude, and the third centroid longitude and latitude corresponding to each beam, SINR test verification can be performed on these three centroid longitudes and latitudes to ensure that the tested SINR value is stable within the three SINR intervals. For each beam, a rotation test verification method can be adopted to ultimately determine the benchmark test positions corresponding to the three SINR intervals of each beam, that is, ultimately obtain the first benchmark test position of the first SINR interval of each beam, the second benchmark test position of the second SINR interval of each beam, and the third benchmark test position of the third SINR interval of each beam.

[0184] Step 404: Use the first reference test position, the second reference test position and the third reference test position of each beam as the reference test position of each beam.

[0185] After the first reference test position, the second reference test position and the third reference test position of each beam are obtained, the first reference test position, the second reference test position and the third reference test position of each beam can be used as the reference test position of each beam.

[0186] After the reference test position corresponding to each beam is determined according to the SINR distribution diagram, step 104 is performed.

[0187] Step 104: placing M 2-stream test terminals at the reference test positions of the M beams to perform a throughput test to obtain the throughput of the M beams.

[0188] After determining the benchmark test position corresponding to each beam according to the SINR distribution diagram, M 2-stream test terminals can be placed at the benchmark test positions of the M beams to perform throughput tests to obtain the throughput of the M beams, that is, the throughput of each beam. In this example, the throughput is proportional to the SINR. When performing the throughput test, the SINR value of the benchmark test position point of each beam can be obtained, and then the SINR value corresponding to each beam is converted to obtain the throughput of each beam.

[0189] In a specific implementation, when performing a throughput test of M beams, M 2-stream test terminals can be placed at the first benchmark test position of the first SINR interval of the M beams, or at the second benchmark test position of the second SINR interval, or at the third benchmark test position of the third SINR interval, respectively, to perform the test respectively. For example, taking a 16-stream terminal as an example, the target terminal has 8 beams. When testing the maximum throughput of each beam, 8 2-stream test terminals can be placed at the first benchmark test positions of the 8 beams to perform the throughput test, that is, the first 2-stream test terminal is placed at the first benchmark test position of the first beam, the second 2-stream test terminal is placed at the first benchmark test position of the second beam, ..., the eighth 2-stream test terminal is placed at the first benchmark test position of the eighth beam, etc.

[0190] It can be understood that the above examples are merely examples listed for a better understanding of the technical solutions of the embodiments of the present application, and are not intended to be the sole limitation to the embodiments.

[0191] After placing M 2-stream test terminals at the reference test positions of the M beams to perform throughput tests and obtain the throughputs of the M beams, step 105 is executed.

[0192] Step 105: Determine the cell capacity of the target service cell according to the throughput rates of the M beams.

[0193] After placing M 2-stream test terminals at the benchmark test positions of M beams to perform throughput tests to obtain the throughputs of the M beams, the cell capacity of the target service cell can be determined based on the throughputs of the M beams. Specifically, the sum of the throughputs of the M beams can be calculated, and the sum can be used as the cell capacity of the target service cell.

[0194] In a specific implementation, the first SINR interval, the second SINR interval, and the third SINR interval can be tested respectively to obtain the maximum cell capacity, the average cell capacity, and the edge cell capacity of the target serving cell. The process of testing and obtaining different cell capacities can be combined with Figure 6 , Figure 7 and Figure 8 Each is described in detail as follows.

[0195] Reference Figure 6 , shows a flowchart of the steps of a method for determining the maximum cell capacity provided by an embodiment of the present application, such as Figure 6 As shown, the method for determining the maximum cell capacity may include: step 601, step 602, step 603 and step 604.

[0196] Step 601: Arrange the M 2-stream test terminals at the first benchmark test positions of the first SINR interval of each beam respectively.

[0197] In this embodiment, when the maximum cell capacity of the target service cell is tested, M 2-stream test terminals can be respectively arranged at the first benchmark test position of the first SINR interval of each beam. For example, M=8, the M 2-stream test terminals are respectively: terminal 1, terminal 2,...terminal 8, and the 8 beams are respectively: beam 1, beam 2,...beam 8. When the maximum cell capacity is tested, terminal 1 can be arranged at the first benchmark test position of the first SINR interval of beam 1, terminal 2 can be arranged at the first benchmark test position of the first SINR interval of beam 2,..., terminal 8 can be arranged at the first benchmark test position of the first SINR interval of beam 8, etc.

[0198] It can be understood that the above examples are merely examples listed for a better understanding of the technical solutions of the embodiments of the present application, and are not intended to be the sole limitation to the embodiments.

[0199] After M 2-stream test terminals are respectively arranged at the first reference test positions of the first SINR interval of each beam, step 602 is performed.

[0200] Step 602: Acquire multiple first SINR values ​​reported by the M 2-stream test terminals.

[0201] When the 2-stream test terminal is tested, SINR test data can be reported, and multiple first SINR values ​​reported by M 2-stream test terminals can be obtained. That is, each 2-stream test terminal will perform multiple tests to report multiple SINR test data, thereby obtaining multiple first SINR values.

[0202] After obtaining multiple first SINR values ​​respectively reported by M 2-stream test terminals, step 603 is executed.

[0203] Step 603: Obtain a first throughput rate of each beam in a tested first SINR interval according to the multiple first SINR values.

[0204] After obtaining the multiple first SINR values, the first throughput rate of each beam in the tested first SINR interval can be acquired according to the multiple first SINR values.

[0205] In a specific implementation, after obtaining multiple first SINR values ​​corresponding to each beam, the multiple first SINR values ​​may be preprocessed to eliminate SINR values ​​that do not meet the conditions among the multiple first SINR values. For example, if the set first threshold is 25, then SINR values ​​less than 25 among the multiple first SINR values ​​are eliminated. Then, the average value of the remaining first SINR values ​​is calculated, and then, the first throughput rate of each beam in the tested first SINR interval may be determined based on the average.

[0206] Step 604: Obtain a sum of the M first throughput rates, and determine the maximum cell capacity of the target serving cell according to the sum.

[0207] After the first throughput rate of each of the M beams is obtained, the sum of the M first throughput rates may be calculated, and the maximum cell capacity of the target service cell may be determined according to the sum value.

[0208] Reference Figure 7 , shows a flowchart of the steps of a method for determining average cell capacity provided by an embodiment of the present application, such as Figure 7 As shown, the average cell capacity determination method may include: step 701, step 702, step 703 and step 704.

[0209] Step 701: Arrange the M 2-stream test terminals at the second benchmark test positions of the second SINR interval of each beam respectively.

[0210] In this embodiment, when testing the average cell capacity of the target service cell, M 2-stream test terminals can be respectively arranged at the second benchmark test position of the second SINR interval of each beam. For example, M=8, the M 2-stream test terminals are respectively: terminal 1, terminal 2,...terminal 8, and the 8 beams are respectively: beam 1, beam 2,...beam 8. When testing the average cell capacity, terminal 1 can be arranged at the second benchmark test position of the second SINR interval of beam 1, terminal 2 can be arranged at the second benchmark test position of the second SINR interval of beam 2,..., terminal 8 can be arranged at the second benchmark test position of the second SINR interval of beam 8, etc.

[0211] It can be understood that the above examples are merely examples listed for a better understanding of the technical solutions of the embodiments of the present application, and are not intended to be the sole limitation to the embodiments.

[0212] After the M 2-stream test terminals are respectively arranged at the second reference test positions of the second SINR interval of each beam, step 702 is performed.

[0213] Step 702: Acquire multiple second SINR values ​​reported by the M 2-stream test terminals.

[0214] When the 2-stream test terminal is tested, the SINR test data can be reported, and multiple second SINR values ​​reported by M 2-stream test terminals can be obtained. That is, each 2-stream test terminal will perform multiple tests to report multiple SINR test data, thereby obtaining multiple second SINR values.

[0215] After obtaining multiple second SINR values ​​reported by M 2-stream test terminals, step 703 is executed.

[0216] Step 703: Obtain a second throughput rate of each beam in a tested second SINR interval according to the multiple second SINR values.

[0217] After obtaining the multiple second SINR values, the second throughput rate of each beam in the tested second SINR interval can be acquired according to the multiple second SINR values.

[0218] In a specific implementation, after obtaining multiple second SINR values ​​corresponding to each beam, the multiple second SINR values ​​can be preprocessed to eliminate SINR values ​​that do not meet the conditions among the multiple second SINR values. For example, if the first threshold is set to 25 and the second threshold is set to 3, then SINR values ​​greater than or equal to 3 and 25, and less than or equal to 3 among the multiple second SINR values ​​are eliminated. Then, the average value of the remaining second SINR values ​​is calculated, and then the second throughput rate of each beam in the tested second SINR interval can be determined based on the average.

[0219] Step 704: Obtain a sum of M second throughput rates, and determine an average cell capacity of the target service cell according to the sum.

[0220] After the second throughput rate of each of the M beams is obtained, the sum of the M second throughput rates may be calculated, and the average cell capacity of the target service cell may be determined according to the sum.

[0221] Reference Figure 8 , shows a flow chart of the steps of a method for determining the capacity of an edge cell provided in an embodiment of the present application, such as Figure 8 As shown, the method for determining the capacity of an edge cell may include: step 801, step 802, step 803 and step 804.

[0222] Step 801: Arrange the M 2-stream test terminals at the third benchmark test positions of the third SINR interval of each beam respectively.

[0223] In this embodiment, when testing the edge cell capacity of the target service cell, M 2-stream test terminals can be respectively arranged at the third benchmark test position of the third SINR interval of each beam. For example, M=8, the M 2-stream test terminals are respectively: terminal 1, terminal 2,...terminal 8, and the 8 beams are respectively: beam 1, beam 2,...beam 8. When testing the edge cell capacity, terminal 1 can be arranged at the third benchmark test position of the third SINR interval of beam 1, terminal 2 can be arranged at the third benchmark test position of the third SINR interval of beam 2,..., terminal 8 can be arranged at the third benchmark test position of the third SINR interval of beam 8, etc.

[0224] It can be understood that the above examples are merely examples listed for a better understanding of the technical solutions of the embodiments of the present application, and are not intended to be the sole limitation to the embodiments.

[0225] Step 802: Acquire multiple third SINR values ​​reported by the M 2-stream test terminals.

[0226] When the 2-stream test terminal is tested, the SINR test data can be reported, and multiple third SINR values ​​reported by M 2-stream test terminals can be obtained. That is, each 2-stream test terminal will perform multiple tests to report multiple SINR test data, and then obtain multiple third SINR values.

[0227] After obtaining multiple third SINR values ​​reported by the M 2-stream test terminals, step 803 is executed.

[0228] Step 803: Obtain a third throughput rate of each beam in a tested third SINR interval according to the multiple third SINR values.

[0229] After obtaining the multiple third SINR values, the third throughput rate of each beam in the tested third SINR interval can be acquired according to the multiple third SINR values.

[0230] In a specific implementation, after obtaining multiple third SINR values ​​corresponding to each beam, the multiple third SINR values ​​may be preprocessed to eliminate SINR values ​​that do not meet the conditions in the multiple third SINR values. For example, if the second threshold is set to 3, SINR values ​​greater than 3 in the multiple third SINR values ​​are eliminated. Then, the average value of the remaining third SINR values ​​is calculated, and then the third throughput of each beam in the tested third SINR interval may be determined based on the average.

[0231] Step 804: Obtain a sum of the M third throughput rates, and determine the edge cell capacity of the target serving cell according to the sum.

[0232] After the third throughput rate of each of the M beams is obtained, the sum of the M third throughput rates may be calculated, and the edge cell capacity of the target service cell may be determined according to the sum value.

[0233] The embodiment of the present application can simultaneously adopt the latest small sample training method to simulate and obtain the SINR distribution diagram, and obtain the maximum cell capacity value, average cell capacity value, and edge cell capacity value according to the sum of each beam in the corresponding throughput relationship, so as to improve accuracy and reduce testing costs.

[0234] The cell capacity determination method provided in the embodiment of the present application obtains SINR sample test data of the target service cell under the target base station, where the target base station is an N-stream base station device, where N is an even number greater than 2, and determines the beam distribution positions of the M beams in the target service cell and the SINR distribution diagram corresponding to each beam distribution position according to the SINR sample test data, where M is half of N. According to the SINR distribution diagram, the benchmark test position corresponding to each beam is determined, and M 2-stream test terminals are used to perform throughput tests on the M beams to obtain the throughput of the M beams, and the cell capacity of the target service cell is determined according to the throughput of the M beams. The embodiment of the present application adopts a multi-point merging and convergence test method, and the capacity test of the multi-stream base station device can be realized through a 2-stream test terminal. Moreover, the scheme refers to the signal coverage of the existing network and the actual experience of users, and the obtained capacity evaluation results are more accurate, without the need to deploy multiple models, reducing the testing cost, and can realize the effective prediction of network capacity after network construction and access.

[0235] Reference Fig. 9 , shows a schematic diagram of the structure of a cell capacity determination device provided in an embodiment of the present application, such as Fig. 9 As shown, the cell capacity determination device 900 may include the following modules:

[0236] The sample test data acquisition module 910 is used to acquire SINR (Signal to Interference plus Noise Ratio) sample test data of a target serving cell under a target base station; the target base station is an N-stream base station device, where N is an even number greater than 2;

[0237] The SINR distribution diagram determination module 920 is used to determine the beam distribution positions of the M beams in the target serving cell and the SINR distribution diagram corresponding to each of the beam distribution positions according to the SINR sample test data; M is half of N;

[0238] A benchmark test position determination module 930, configured to determine a benchmark test position corresponding to each beam according to the SINR distribution diagram;

[0239] The beam throughput acquisition module 940 is used to place M 2-stream test terminals at the reference test positions of the M beams to perform a throughput test and obtain the throughput of the M beams;

[0240] The cell capacity determination module 950 is used to determine the cell capacity of the target serving cell according to the throughput rates of the M beams.

[0241] Optionally, the sample test data acquisition module includes:

[0242] An initial coverage area determination unit, configured to determine an initial coverage area of ​​the target serving cell according to a deployment location of the target base station;

[0243] An initial test data acquisition unit, used for randomly adjusting the position of the 2-stream test terminal in the initial coverage area, and acquiring initial SINR test data of the 2-stream test terminal at different positions;

[0244] The sample test data screening unit is used to screen out the SINR sample test data belonging to the target serving cell from the initial SINR test data.

[0245] Optionally, the SINR distribution map determination module includes:

[0246] A beam distribution position determination unit, configured to determine the beam distribution positions of the M beams in the target service cell according to the beam identification information and the test longitude and latitude information in the SINR sample test data;

[0247] The SINR distribution diagram generating unit is used to generate an SINR distribution diagram corresponding to each beam distribution position according to the SINR information corresponding to each beam in the SINR sample test data.

[0248] Optionally, the SINR distribution map generating unit includes:

[0249] The SINR distribution map acquisition subunit is used to use the preset coverage simulation software to perform geographical graphic representation of the SINR information of each beam to obtain the SINR distribution map corresponding to each beam distribution position.

[0250] Optionally, the benchmark test position determination module includes:

[0251] An SINR interval determination unit is used to determine a first SINR interval, a second SINR interval and a third SINR interval corresponding to each beam according to the SINR value in the SINR sample test data; wherein the first SINR interval is an interval in which the SINR value is greater than a first threshold, the second SINR interval is an interval in which the SINR value is less than or equal to the first threshold and greater than or equal to the second threshold, the third SINR interval is an interval in which the SINR value is less than the second threshold, and the first threshold is greater than the second threshold;

[0252] An SINR distribution graph determining unit, configured to determine, according to the SINR values ​​in the SINR sample test data, a first SINR distribution graph corresponding to the first SINR interval, a second SINR distribution graph corresponding to the second SINR interval, and a third SINR distribution graph corresponding to the third SINR interval in the SINR distribution graph;

[0253] an interval reference position determination unit, configured to determine a first reference test position corresponding to the first SINR interval of each beam, a second reference test position corresponding to the second SINR interval, and a third reference test position corresponding to the third SINR interval according to the first SINR distribution graph, the second SINR distribution graph, and the third SINR distribution graph corresponding to each beam;

[0254] The reference test position acquisition unit is used to use the first reference test position, the second reference test position and the third reference test position of each beam as the reference test position of each beam.

[0255] Optionally, the interval reference position determination unit includes:

[0256] A first centroid longitude and latitude calculation subunit, configured to calculate the first centroid longitude and latitude of the first SINR interval of each beam according to the first SINR distribution diagram corresponding to each beam;

[0257] A second centroid longitude and latitude calculation subunit is used to calculate the second centroid longitude and latitude of the second SINR interval of each beam according to the second SINR distribution diagram corresponding to each beam;

[0258] A third centroid longitude and latitude calculation subunit, configured to calculate the third centroid longitude and latitude of the third SINR interval of each beam according to a third SINR distribution diagram corresponding to each beam;

[0259] A first benchmark test position acquisition subunit is used to perform SINR test processing on the first centroid longitude and latitude of each beam to obtain a first benchmark test position corresponding to the first SINR interval of each beam;

[0260] A second benchmark test position acquisition subunit is used to perform SINR test processing on the second centroid longitude and latitude of each beam to obtain a second benchmark test position corresponding to the second SINR interval of each beam;

[0261] The third benchmark test position acquisition subunit is used to perform SINR test processing on the third centroid longitude and latitude of each beam to obtain a third benchmark test position corresponding to the third SINR interval of each beam.

[0262] Optionally, the beam throughput acquisition module includes:

[0263] A first test terminal arrangement unit, configured to arrange the M 2-stream test terminals at first reference test positions of a first SINR interval of each beam respectively;

[0264] A first SINR value acquisition unit, configured to acquire a plurality of first SINR values ​​reported by the M 2-stream test terminals;

[0265] A first throughput acquisition unit, configured to acquire a first throughput of each beam in a tested first SINR interval according to the multiple first SINR values;

[0266] The cell capacity determination module includes:

[0267] The maximum cell capacity determination unit is used to obtain the sum of M first throughput rates and determine the maximum cell capacity of the target serving cell according to the sum.

[0268] Optionally, the beam throughput acquisition module includes:

[0269] A second test terminal arrangement unit, configured to arrange the M 2-stream test terminals at second reference test positions of a second SINR interval of each beam respectively;

[0270] A second SINR value acquisition unit, configured to acquire a plurality of second SINR values ​​reported by the M 2-stream test terminals;

[0271] A second throughput acquisition unit, configured to acquire a second throughput of each beam in a tested second SINR interval according to the multiple second SINR values;

[0272] The cell capacity determination module includes:

[0273] The average cell capacity determination unit is used to obtain the sum of M second throughput rates and determine the average cell capacity of the target serving cell according to the sum.

[0274] Optionally, the beam throughput acquisition module includes:

[0275] A third test terminal placement unit, configured to place the M 2-stream test terminals at third benchmark test positions of a third SINR interval of each beam respectively;

[0276] A third SINR value acquisition unit, configured to acquire a plurality of third SINR values ​​reported by the M 2-stream test terminals;

[0277] A third throughput acquisition unit, configured to acquire a third throughput of each beam in a tested third SINR interval according to the multiple third SINR values;

[0278] The cell capacity determination module includes:

[0279] The edge cell capacity determining unit is used to obtain the sum of the M third throughput rates and determine the edge cell capacity of the target serving cell according to the sum.

[0280] The cell capacity determination device provided in the embodiment of the present application obtains the SINR sample test data of the target service cell under the target base station, the target base station is an N-stream base station device, N is an even number greater than 2, and determines the beam distribution positions of the M beams in the target service cell and the SINR distribution diagram corresponding to each beam distribution position according to the SINR sample test data, M is one-half of N, and determines the benchmark test position corresponding to each beam according to the SINR distribution diagram, and uses M 2-stream test terminals to perform throughput tests on the M beams to obtain the throughput of the M beams, and determines the cell capacity of the target service cell according to the throughput of the M beams. The embodiment of the present application adopts the method of multi-point merging and convergence testing, and the capacity test of the multi-stream base station device can be realized through the 2-stream test terminal. In addition, the scheme refers to the signal coverage of the existing network and the actual experience of users, and the obtained capacity evaluation results are more accurate, without the need to deploy multiple models, reducing the testing cost, and can realize the effective prediction of network capacity after network construction and access.

[0281] An embodiment of the present application also provides an electronic device, including: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program implements the above-mentioned cell capacity determination method when executed by the processor.

[0282] Fig.10 FIG. 1 is a schematic diagram showing the structure of an electronic device 1000 according to an embodiment of the present invention. Fig.10As shown, the electronic device 1000 includes a central processing unit (CPU) 1001, which can perform various appropriate actions and processes according to computer program instructions stored in a read-only memory (ROM) 1002 or computer program instructions loaded from a storage unit 1008 into a random access memory (RAM) 1003. In the RAM 1003, various programs and data required for the operation of the electronic device 1000 can also be stored. The CPU 1001, the ROM 1002, and the RAM 1003 are connected to each other via a bus 1004. An input / output (I / O) interface 1005 is also connected to the bus 1004.

[0283] Multiple components in the electronic device 1000 are connected to the I / O interface 1005, including: an input unit 1006, such as a keyboard, a mouse, a microphone, etc.; an output unit 1007, such as various types of displays, speakers, etc.; a storage unit 1008, such as a disk, an optical disk, etc.; and a communication unit 1009, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 1009 allows the electronic device 1000 to exchange information / data with other devices through a computer network such as the Internet and / or various telecommunication networks.

[0284] The various processes and processing described above may be performed by the processing unit 1001. For example, the method of any of the above embodiments may be implemented as a computer software program, which is tangibly contained in a computer-readable medium, such as the storage unit 1008. In some embodiments, part or all of the computer program may be loaded and / or installed on the electronic device 1000 via the ROM 1002 and / or the communication unit 1009. When the computer program is loaded into the RAM 1003 and executed by the CPU 1001, one or more actions in the method described above may be performed.

[0285] An embodiment of the present application provides a computer-readable storage medium having a computer program stored thereon, which implements a method for determining cell capacity when the program is executed by a processor.

[0286] The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the various embodiments can be referenced to each other.

[0287] Those skilled in the art will appreciate that the embodiments of the present application can be provided as methods, devices, or computer program products. Therefore, the present application can adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment in combination with software and hardware. Moreover, the present application can adopt the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0288] The embodiments of the present application are described with reference to the flowcharts and / or block diagrams of the methods, terminals (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing terminal to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing terminal generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0289] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing terminal to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture including an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0290] These computer program instructions can also be loaded onto a computer or other programmable data processing terminal so that a series of operating steps are executed on the computer or other programmable terminal to produce a computer-implemented process, thereby providing instructions for implementing the process in the computer or other programmable terminal. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0291] Although the preferred embodiments of the present application have been described, those skilled in the art may make additional changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications that fall within the scope of the embodiments of the present application.

[0292] Finally, it should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or terminal including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or terminal. In the absence of further restrictions, the elements defined by the statement "comprise a ..." do not exclude the presence of other identical elements in the process, method, article or terminal including the elements.

[0293] The above is a detailed introduction to a cell capacity determination method, a cell capacity determination device, an electronic device and a computer-readable storage medium provided in the present application. Specific examples are used in this article to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method of the present application and its core idea; at the same time, for general technical personnel in this field, according to the idea of ​​the present application, there will be changes in the specific implementation method and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.

Claims

1. A method for determining cell capacity, characterized in that: include: Obtain SINR (Signal to Interference plus Noise Ratio) sample test data of a target serving cell under a target base station; the target base station is an N-stream base station device, where N is an even number greater than 2; Determine, according to the SINR sample test data, the beam distribution positions of the M beams in the target serving cell and the SINR distribution graph corresponding to each of the beam distribution positions; M is half of N; Determine a benchmark test position corresponding to each beam according to the SINR distribution diagram; Placing M 2-stream test terminals at reference test positions of the M beams to perform a throughput test, and obtaining throughputs of the M beams; Determining a cell capacity of the target serving cell according to the throughput rates of the M beams; Determining a benchmark test position corresponding to each beam according to the SINR distribution diagram includes: According to the SINR value in the SINR sample test data, determine a first SINR interval, a second SINR interval, and a third SINR interval corresponding to each beam; wherein the first SINR interval is an interval in which the SINR value is greater than a first threshold, the second SINR interval is an interval in which the SINR value is less than or equal to the first threshold and greater than or equal to the second threshold, the third SINR interval is an interval in which the SINR value is less than the second threshold, and the first threshold is greater than the second threshold; Determine, according to the SINR values ​​in the SINR sample test data, a first SINR distribution graph corresponding to the first SINR interval, a second SINR distribution graph corresponding to the second SINR interval, and a third SINR distribution graph corresponding to the third SINR interval in the SINR distribution graph; Determine, according to the first SINR distribution graph, the second SINR distribution graph, and the third SINR distribution graph corresponding to each beam, a first benchmark test position corresponding to the first SINR interval, a second benchmark test position corresponding to the second SINR interval, and a third benchmark test position corresponding to the third SINR interval of each beam; The first reference test position, the second reference test position and the third reference test position of each beam are used as reference test positions of each beam.

2. The method according to claim 1, characterized in that The obtaining of SINR (Signal to Interference plus Noise Ratio) sample test data of a target serving cell under a target base station includes: Determining an initial coverage area of ​​the target serving cell according to a deployment location of the target base station; Randomly adjusting the position of the 2-stream test terminal in the initial coverage area, and obtaining initial SINR test data of the 2-stream test terminal at different positions; The SINR sample test data belonging to the target serving cell is screened out from the initial SINR test data.

3. The method according to claim 1, characterized in that The determining, according to the SINR sample test data, the beam distribution positions of the M beams in the target serving cell and the SINR distribution graph corresponding to each of the beam distribution positions includes: Determine the beam distribution positions of the M beams in the target serving cell according to the beam identification information and the test longitude and latitude information in the SINR sample test data; According to the SINR information corresponding to each beam in the SINR sample test data, an SINR distribution graph corresponding to each beam distribution position is generated.

4. The method according to claim 3, characterized in that The generating, according to the SINR information corresponding to each beam in the SINR sample test data, a SINR distribution diagram corresponding to each beam distribution position includes: The preset coverage simulation software is used to perform geographic graphical representation of the SINR information of each beam to obtain the SINR distribution map corresponding to each beam distribution position.

5. The method according to claim 1, characterized in that The determining, according to the first SINR distribution graph, the second SINR distribution graph, and the third SINR distribution graph corresponding to each beam, a first benchmark test position corresponding to the first SINR interval, a second benchmark test position corresponding to the second SINR interval, and a third benchmark test position corresponding to the third SINR interval of each beam, comprises: Calculate the first centroid longitude and latitude of the first SINR interval of each beam according to the first SINR distribution diagram corresponding to each beam; According to the second SINR distribution diagram corresponding to each beam, the second centroid longitude and latitude of the second SINR interval of each beam are calculated; Calculate the third centroid longitude and latitude of the third SINR interval of each beam according to the third SINR distribution diagram corresponding to each beam; Performing SINR test processing on the first centroid longitude and latitude of each beam to obtain a first benchmark test position corresponding to the first SINR interval of each beam; Performing SINR test processing on the second centroid longitude and latitude of each beam to obtain a second benchmark test position corresponding to the second SINR interval of each beam; Perform SINR test processing on the third centroid longitude and latitude of each beam to obtain a third benchmark test position corresponding to the third SINR interval of each beam.

6. The method according to claim 5, characterized in that Placing the M 2-stream test terminals at the reference test positions of the M beams to perform a throughput test to obtain the throughput of the M beams includes: Arranging the M 2-stream test terminals at first benchmark test positions of the first SINR interval of each beam respectively; Obtaining multiple first SINR values ​​reported by the M 2-stream test terminals; Acquire a first throughput rate of each beam in a tested first SINR interval according to the multiple first SINR values; The determining, according to the throughput rates of the M beams, the cell capacity of the target serving cell includes: A sum of the M first throughput rates is obtained, and a maximum cell capacity of the target serving cell is determined according to the sum.

7. The method according to claim 5, characterized in that Placing the M 2-stream test terminals at the reference test positions of the M beams to perform a throughput test to obtain the throughput of the M beams includes: Arranging the M 2-stream test terminals at second benchmark test positions of the second SINR interval of each beam respectively; Obtaining multiple second SINR values ​​reported by the M 2-stream test terminals; Acquire, according to the multiple second SINR values, a second throughput rate of each beam in a tested second SINR interval; The determining, according to the throughput rates of the M beams, the cell capacity of the target serving cell includes: A sum of M second throughput rates is obtained, and an average cell capacity of the target serving cell is determined according to the sum.

8. The method according to claim 5, characterized in that Placing the M 2-stream test terminals at the reference test positions of the M beams to perform a throughput test to obtain the throughput of the M beams includes: Arranging the M 2-stream test terminals at third benchmark test positions of the third SINR interval of each beam respectively; Obtaining multiple third SINR values ​​reported by the M 2-stream test terminals; Acquire, according to the multiple third SINR values, a third throughput rate of each beam in a tested third SINR interval; The determining, according to the throughput rates of the M beams, the cell capacity of the target serving cell includes: A sum of the M third throughput rates is obtained, and the edge cell capacity of the target serving cell is determined according to the sum.

9. A cell capacity determination device, characterized in that: include: A sample test data acquisition module is used to obtain SINR (Signal to Interference plus Noise Ratio) sample test data of a target serving cell under a target base station; the target base station is an N-stream base station device, where N is an even number greater than 2; An SINR distribution map determination module, used to determine the beam distribution positions of the M beams in the target service cell and the SINR distribution map corresponding to each of the beam distribution positions according to the SINR sample test data; M is half of N; A benchmark test position determination module, used to determine a benchmark test position corresponding to each beam according to the SINR distribution diagram; A beam throughput acquisition module, used for placing M 2-stream test terminals at the reference test positions of the M beams to perform a throughput test and obtain the throughput of the M beams; A cell capacity determination module, configured to determine the cell capacity of the target serving cell according to the throughput rates of the M beams; The benchmark test location determination module comprises: An SINR interval determination unit is used to determine a first SINR interval, a second SINR interval and a third SINR interval corresponding to each beam according to the SINR value in the SINR sample test data; wherein the first SINR interval is an interval in which the SINR value is greater than a first threshold, the second SINR interval is an interval in which the SINR value is less than or equal to the first threshold and greater than or equal to the second threshold, the third SINR interval is an interval in which the SINR value is less than the second threshold, and the first threshold is greater than the second threshold; An SINR distribution graph determining unit, configured to determine, according to the SINR values ​​in the SINR sample test data, a first SINR distribution graph corresponding to the first SINR interval, a second SINR distribution graph corresponding to the second SINR interval, and a third SINR distribution graph corresponding to the third SINR interval in the SINR distribution graph; an interval reference position determination unit, configured to determine a first reference test position corresponding to the first SINR interval of each beam, a second reference test position corresponding to the second SINR interval, and a third reference test position corresponding to the third SINR interval according to the first SINR distribution graph, the second SINR distribution graph, and the third SINR distribution graph corresponding to each beam; The reference test position acquisition unit is used to use the first reference test position, the second reference test position and the third reference test position of each beam as the reference test position of each beam.

10. An electronic device, characterized in that: include: A processor, a memory, and a computer program stored in the memory and executable on the processor, wherein the processor implements the cell capacity determination method according to any one of claims 1 to 8 when executing the program.

11. A computer-readable storage medium, characterized in that: When the instructions in the storage medium are executed by a processor of an electronic device, the electronic device is enabled to execute the cell capacity determination method according to any one of claims 1 to 8.

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