Sensor Electrical Performance Test Fixture

By using the design of insulating material pressing parts and conductive material power supply parts in the sensor electrical performance test fixture, the contact area is increased and heat dissipation is accelerated, which solves the problem that traditional fixtures are prone to burn under high currents, and achieves higher testing reliability and accuracy.

CN115236578BActive Publication Date: 2025-08-01SHENZHEN ZHENHUA FU ELECTRONICS
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Patent Information

Application Number
CN202210973033.9
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-08-15
Publication Date
2025-08-01
Estimated Expiration
2042-08-15

AI Technical Summary

Technical Problem

Traditional sensor electrical performance test fixtures are prone to burning the fixture or product due to heat accumulation under high current conditions.

Method used

A sensor electrical performance test fixture was designed. The pressing parts made of insulating materials were arranged one by one with the pins, increasing the contact area, and accelerating heat dissipation through the heat dissipation holes and heat dissipation tank structures. At the same time, the test power supply part and compression assembly made of conductive materials were used to improve contact stability.

Benefits of technology

It effectively reduces the contact resistance between the pin and the test power supply unit, reduces heat accumulation, avoids the risk of burning of fixtures or products during high current testing, and improves the reliability and accuracy of the test.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present application is applicable to the technical field of testing instruments, and provides a sensor electrical performance test fixture. The sensor electrical performance test fixture is used to test the sensor to be tested, and the sensor to be tested includes a sensor body and a first pin; the sensor electrical performance test fixture includes an insulating base, a test power supply part and a pressing part, and the test power supply part is arranged on the insulating base; the pressing part is arranged on the insulating base, and the pressing part includes a pressing body and a first insulating pressing piece, and the first insulating pressing piece is arranged on the pressing body; the sensor to be tested is placed on the test power supply part, and abuts against the test power supply part through the first pin, and the first insulating pressing piece presses on the first pin. This design of the present application increases the contact area between each first pin and the test power supply part, reduces the contact resistance between each first pin and the test power supply part, and avoids as much as possible the occurrence of such problems as the fixture or product burning caused by the test of the sensor to be tested under high current conditions.
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Description

Technical Field

[0001] This application belongs to the technical field of test instruments. More specifically, it relates to a sensor electrical performance test fixture. Background Art

[0002] A chip-type Hall current sensor (hereinafter referred to as Hall current sensor) is a sensor based on the Hall effect and fabricated on a silicon substrate using semiconductor processes. It is mainly used to convert the measured current signal into an electrical signal that meets certain standards or other required forms of signals according to certain rules.

[0003] Currently, the maximum measured current of the Hall current sensor with an SOP-8 package is 50A, and the output voltage signal is 4.5V. At the same time, due to the too small product shape, the size of this Hall current sensor is 5.0mm * 6.0mm * 1.75mm. The traditional sensor electrical performance test fixture has insufficient current-carrying capacity. Under the condition of large current, a large amount of heat will be generated after the lead-out end of the Hall current sensor contacts the test fixture, and it is easy to cause the fixture or the product to burn out. Summary of the Invention

[0004] The purpose of the embodiments of this application is to provide a sensor electrical performance test fixture, aiming to solve the technical problem that the fixture or the product is easily burned during the test of the sensor under the condition of large current in the prior art.

[0005] To achieve the above purpose, according to one aspect of this application, a sensor electrical performance test fixture is provided for testing a sensor to be tested. The sensor to be tested includes a sensor body and a first pin. The first pin is arranged on the sensor body and is electrically connected to the sensor body. The sensor electrical performance test fixture includes an insulating base, a test power supply part, and a pressing part. The test power supply part is arranged on the insulating base and is used to provide a test current for the sensor to be tested. The pressing part is arranged on the insulating base. The pressing part includes a pressing body and a first insulating pressing member. The first insulating pressing member is arranged on the pressing body. The pressing body is arranged on the side of the test power supply part away from the insulating base. The sensor to be tested is placed on the test power supply part, and the first pin abuts against the test power supply part and is electrically connected to the test power supply part. The first insulating pressing member presses on the first pin.

[0006] Optionally, the test power supply part is arranged on the insulating base. The sensor electrical performance test fixture further includes a covering part. The inside of the covering part is hollow and covers the test power supply part. A plurality of first heat dissipation holes are opened on the side wall of the covering part.

[0007] Optionally, a heat dissipation groove is opened on the upper surface of the insulating base. The test power supply part is correspondingly arranged with the heat dissipation groove. The inside of the insulating base is hollow, and a plurality of second heat dissipation holes are opened on both the side wall and the bottom wall.

[0008] Optionally, the pressing part further includes a pressing component, which is rotatably arranged on the insulating base, and the output end of the pressing component has an initial position and a pressing position for pressing the pressing body in the direction towards the test power supply part.

[0009] Optionally, the pressing component includes a carrier seat, a transmission structure and a pressing member. The carrier seat is arranged on the insulating base, the transmission structure is rotatably arranged on the carrier seat, the pressing member is drivingly connected to the output end of the transmission structure, the pressing member is a pressing column, and the pressing column forms the output end of the pressing component.

[0010] Optionally, the pressing component further includes an adjusting screw and an adjusting nut. The first end of the adjusting screw is fixedly connected to the pressing column, the adjusting nut is fixedly connected to the output end of the transmission structure, and the second end of the adjusting screw is threadedly connected to the adjusting nut.

[0011] Optionally, the sensor to be tested further includes a second pin, which is arranged on the sensor body and electrically connected to the sensor body; the sensor electrical performance test fixture further includes a signal output component, which includes a PCB, a first terminal, a second terminal, a third terminal and a fourth terminal. The PCB is arranged on one side of the test power supply part and is used for electrically connecting to the second pin of the sensor to be tested; the first terminal is electrically connected to the PCB and is used for electrically connecting to the positive pole of an external voltage source; the second terminal is electrically connected to the PCB and is used for electrically connecting to the input end of a detection device; the third terminal is electrically connected to the PCB and is used for electrically connecting to the input end of a filtering device; the fourth terminal is electrically connected to the PCB and is used for electrically connecting to the negative pole of an external voltage source, the output end of the detection device and the output end of the filtering device.

[0012] Optionally, the test power supply part includes a first power supply body, a second power supply body and a third power supply body which are arranged at intervals in sequence. There are two pressing parts, one of the two pressing parts is correspondingly arranged with the first power supply body and the second power supply body, and the other pressing part is correspondingly arranged with the second power supply body and the third power supply body; the sensor electrical performance test fixture further includes five terminals, and there are three five terminals. One of the three five terminals is electrically connected to the first power supply body, the second power supply body and the third power supply body respectively.

[0013] Optionally, the sensor electrical performance test fixture further includes a limiting portion disposed on the covering portion. A first placement groove for placing the pressing body is formed in the limiting portion. A limiting through groove for limiting the first pin and the second pin, and a second placement groove for placing the sensor body are formed at the bottom of the first placement groove. The first pin can be placed in the limiting through groove and abuts against the test power supply portion, and the second pin can be placed in the limiting through groove and abuts against the PCB. The sensor electrical performance test fixture further includes a support column disposed inside the covering portion. An isolation layer for isolating the electromagnetic field is provided on the end face of the support column away from the insulating base.

[0014] Optionally, the sensor electrical performance test fixture further includes an adjustment assembly disposed on the pressing column. The adjustment assembly includes a rack, a gear, a driving rod, a ratchet wheel, a ratchet pawl, and a driving handwheel. The rack is slidably disposed on the pressing column along the length direction of the pressing column. A sliding groove for the rack to slide is formed on the pressing column. The first end of the rack is disposed inside the pressing column, and the second end of the rack is disposed outside the pressing column and is detachably connected to the pressing body. The gear is rotatably disposed inside the pressing column and meshes with the rack. The first end of the driving rod is fixedly connected to the gear, and the second end of the driving rod is disposed outside the pressing column. The ratchet wheel is disposed outside the pressing column, sleeved on the outer periphery of the driving rod, and fixedly connected to the driving rod. The ratchet pawl is rotatably disposed on the outer wall of the pressing column. The driving rod is kept stationary through the cooperation of the ratchet wheel and the ratchet pawl. The driving handwheel is sleeved on the second end of the driving rod and fixedly connected to the second end of the driving rod.

[0015] The sensor electrical performance test fixture further includes a fixing assembly. The fixing assembly includes a fixing rod, a return spring, and a traction rope. A receiving groove for receiving the second end of the rack is formed on the pressing body. An installation groove is formed on the groove wall of the receiving groove. The fixing rod is disposed in the installation groove. The length direction of the fixing rod is perpendicular to the length direction of the rack. A fixing groove for the fixing rod to insert is formed on the outer wall of the second end of the rack. The rack and the pressing body are connected through the cooperation of the fixing rod and the fixing groove. The return spring is disposed between the fixing rod and the bottom of the installation groove. The first end of the return spring is fixedly connected to the fixing rod, and the second end of the return spring is fixedly connected to the bottom of the installation groove. The first end of the traction rope is fixedly connected to the end of the fixing rod close to the return spring. A through hole for the traction rope to pass outwards is formed on the pressing body. The second end of the traction rope reaches the outside of the pressing body through the through hole.

[0016] The beneficial effect of the sensor electrical performance test fixture provided by the present application is that, compared with the prior art, when testing the sensor to be tested, the first insulating pressing piece and the first pin are arranged in a one-to-one correspondence, so that each first pin can receive the pressing force applied by the corresponding first insulating pressing piece, thereby enabling each first pin to achieve good contact with the test power supply part. This design of the present application increases the contact area between each first pin and the test power supply part, reduces the contact resistance between each first pin and the test power supply part, reduces the heat generated by the sensor to be tested and the test power supply part when the test current is turned on, and avoids as much as possible the occurrence of such problems as the fixture or product burning caused by the sensor to be tested under high current conditions. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments or descriptions of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0018] Figure 1 A schematic diagram of the structure of the sensor electrical performance test fixture provided in an embodiment of the present application from one perspective;

[0019] Figure 2 A schematic diagram of the structure of the sensor electrical performance test fixture provided in an embodiment of the present application from another perspective;

[0020] Figure 3 A schematic structural diagram of a compression assembly provided in an embodiment of the present application;

[0021] Figure 4 A schematic diagram of a partial cross-section of a sensor electrical performance test fixture provided in an embodiment of the present application;

[0022] Figure 5 for Figure 4 A magnified schematic diagram of point A in the middle;

[0023] Figure 6 A schematic structural diagram of the pressing body, the first insulating pressing member, and the second insulating pressing member provided in an embodiment of the present application;

[0024] Figure 7 A schematic diagram showing the positions of the test power supply unit, the first insulating pressing member, the PCB, and the sensor to be tested provided in an embodiment of the present application;

[0025] Figure 8 A schematic diagram of the structure of the adjustment component and the fixing component provided in an embodiment of the present application;

[0026] Figure 9 is Figure 8 an enlarged schematic view of part B in

[0027] The label details related to the above-mentioned drawings are as follows:

[0028] 100, insulating base; 110, second heat dissipation hole; 200, covering part; 210, first heat dissipation hole; 300, test power supply part; 310, first power supply body; 320, second power supply body; 330, third power supply body; 400, pressing part; 410, pressing body; 420, first insulating pressing piece; 430, pressing component; 431, bearing seat; 432, first rotating piece; 433, pressing column; 434, second rotating piece; 435, connecting piece; 436, limiting piece; 437, adjusting screw; 438, adjusting nut; 500, signal output component; 510, PCB; 520, first wiring terminal; 530, second wiring terminal; 540, third wiring terminal; 550, fourth wiring terminal; 600, fifth wiring terminal; 700, limiting part; 800, support column; 900, adjusting component; 910, rack; 920, gear; 930, driving rod; 940, ratchet; 950, pawl; 960, driving handwheel; 1000, fixing component; 1010, fixing rod; 1020, return spring; 1030, traction rope; 1100, sensor to be tested; 1110, sensor body; 1120, first pin. Specific embodiments

[0029] In order to make the technical problems, technical solutions and beneficial effects to be solved by this application clearer, the following further details this application in conjunction with the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not used to limit this application.

[0030] It should be noted that when an element is referred to as "fixed to" or "disposed on" another element, it can be directly on the other element or indirectly on the other element. When an element is referred to as "connected to" another element, it can be directly connected to the other element or indirectly connected to the other element. Without conflict, the embodiments in this application and the features in the embodiments can be combined with each other. The following will refer to the drawings and combine the embodiments to detail this application.

[0031] It should be understood that the orientation or positional relationship indicated by terms such as "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present application.

[0032] In addition, the terms "first" and "second" are only used for descriptive purposes and should not be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the present application, "a plurality" means two or more unless otherwise specifically defined.

[0033] As described in the background art, currently, for a Hall current sensor with an SOP-8 package type, the maximum measured current is 50 A, the output voltage signal is 4.5 V. At the same time, due to the too small size of the product, the size of this Hall current sensor is 5.0 mm * 6.0 mm * 1.75 mm. The current-carrying capacity of the traditional sensor electrical performance test fixture is insufficient. Under the condition of high current, a large amount of heat will be generated after the lead-out end of the Hall current sensor contacts the test fixture, and it is easy to cause the phenomenon of fixture or product burnout.

[0034] Referring to Figures 1 to 7 , to solve the above problems, according to one aspect of the present application, an embodiment of the present application provides a sensor electrical performance test fixture for testing a to-be-tested sensor 1100. The to-be-tested sensor 1100 includes a sensor body 1110 and a first lead 1120. The first lead 1120 is arranged on the sensor body 1110 and is electrically connected to the sensor body 1110. The sensor electrical performance test fixture includes an insulating base 100, a test power supply unit 300, and a pressing unit 400. Among them, the test power supply unit 300 is arranged on the insulating base 100 for providing a test current for the to-be-tested sensor 1100; the pressing unit 400 is arranged on the insulating base 100. The pressing unit 400 includes a pressing body 410 and a first insulating pressing member 420. The first insulating pressing member 420 is arranged on the pressing body 410, and the pressing body 410 is arranged on the side of the test power supply unit 300 away from the insulating base 100. During the test, the to-be-tested sensor 1100 is arranged on the test power supply unit 300, and is in contact with the test power supply unit 300 through the first lead 1120 and is electrically connected to the test power supply unit 300, and the first insulating pressing member 420 presses on the first lead 1120.

[0035] In an embodiment of the present application, the insulating base 100 is made of bakelite, the test power supply part 300 is made of conductive material, brass in this application; there are four first pins 1120, of course in other instances, the first pins 1120 can also be set to two, three or other numbers; the first insulating pressing piece 420 is made of insulating material, rubber in this application, and the number of the first insulating pressing pieces 420 is the same as the number of the first pins 1120.

[0036] In a specific application, when the sensor to be tested 1100 is tested, the first insulating pressing piece 420 and the first pin 1120 are arranged in a one-to-one correspondence, so that each first pin 1120 can receive the pressing force applied by the corresponding first insulating pressing piece 420, so that each first pin 1120 can achieve good contact with the test power supply unit 300. This design of the present application increases the contact area between each first pin 1120 and the test power supply unit 300, reduces the contact resistance between each first pin 1120 and the test power supply unit 300, and reduces the heat generated by the sensor to be tested 1100 and the test power supply unit 300 when the test current is turned on, thereby avoiding as much as possible the occurrence of problems such as burning of the fixture or product caused by testing the sensor to be tested 1100 under high current conditions.

[0037] Reference Figure 1 、 Figure 2 and Figure 4 In this embodiment, the test power supply part 300 is arranged on the insulating base 100, and the sensor electrical performance test fixture also includes a cover part 200. The cover part 200 is hollow inside and is covered on the test power supply part 300. The side wall of the cover part 200 is provided with multiple first heat dissipation holes 210.

[0038] In the embodiment of the present application, the test power supply unit 300 is disposed on the upper surface of the insulating base 100, and the cover unit 200 is a cover block made of bakelite. The test power supply unit 300 is located inside the cover unit 200. When the sensor 1100 to be tested is tested, the heat generated between the first pin 1120 of the sensor 1100 to be tested and the test power supply unit 300 can be discharged outward through the first heat dissipation hole 210, thereby accelerating the heat dissipation and greatly improving the heat dissipation performance of the sensor electrical performance test fixture. At the same time, the cover unit 200 provides protection for the test power supply unit 300. In addition, the cover unit 200 is fixedly connected to the insulating base 100.

[0039] Reference Figure 1 As an optional method in the embodiment of the present application, a heat dissipation groove is opened on the upper surface of the insulating base 100, the test power supply part 300 is arranged corresponding to the heat dissipation groove, the interior of the insulating base 100 is hollow, and the side wall and bottom wall of the insulating base 100 are both opened with a second heat dissipation hole 110.

[0040] In this alternative mode, the test power supply unit 300 is connected to the covering unit 200 by bolts. A part of the test power supply unit 300 is located above the heat dissipation groove, and the other part is located above the insulating base 100. When the sensor under test 1100 is being tested, the heat generated between the first pin 1120 of the sensor under test 1100 and the test power supply unit 300 can be discharged outward through the heat dissipation groove and the second heat dissipation hole 110. In addition, since the test power supply unit 300 is located above the insulating base 100, there is a large height difference between the test power supply unit 300 and the second heat dissipation hole 110, and this height difference is more conducive to heat dissipation.

[0041] As another alternative mode in the embodiments of the present application, the outer surface of the test power supply unit 300 is wrapped with a gold layer. Such a design can further reduce the contact resistance between the first pin 1120 and the test power supply unit 300, and further reduce the heat generated between the sensor under test 1100 and the test power supply unit 300 when a test current is conducted.

[0042] Refer to Figure 6 , in addition, a placement space is provided on the side of the pressing body 410 close to the insulating base 100. When the first insulating pressing member 420 presses on the first pin 1120, the sensor body 1110 is located in the placement space.

[0043] Refer to Figures 1 to 4 , in this embodiment, the pressing portion 400 further includes a pressing component 430. The pressing component 430 is rotatably provided on the insulating base 100. The output end of the pressing component 430 has an initial position and a pressing position for pressing the pressing body 410 in the direction towards the test power supply unit 300.

[0044] In the embodiments of the present application, the pressing component 430 includes a bearing seat, a transmission structure, and a pressing member. The bearing seat 431 is provided on the insulating base 100. The transmission structure is rotatably provided on the bearing seat 431. The pressing member is drivingly connected to the output end of the transmission structure. The pressing member is a pressing column 433, and the pressing column 433 forms the output end of the pressing component 430.

[0045] Among them, the transmission structure includes a first rotating member 432, a second rotating member 434, and a connecting member 435. The first end of the first rotating member 432 is rotatably arranged on the bearing seat 431; a pressing column 433 is arranged at the second end of the first rotating member 432. The pressing column 433 can press the pressing body 410 towards the direction of the test power supply unit 300. The pressing column 433 can be separated from the pressing body 410 or connected to each other. The first end of the second rotating member 434 is rotatably arranged on the bearing seat 431; the connecting member 435 is arranged between the first rotating member 432 and the second rotating member 434. The first end of the connecting member 435 is rotatably arranged on the first rotating member 432, and the second end of the connecting member 435 is rotatably arranged on the second rotating member 434. When the pressing column 433 is in the pressing position, the first rotating member 432 is horizontally arranged, the second rotating member 434 is vertically arranged, the connecting member 435 is vertically arranged, and the pressing column 433 is vertically arranged and is used for pressing on the pressing body 410.

[0046] In the embodiment of the present application, the first rotating member 432 is two first rotating plates. The two first rotating plates are rotatably arranged on the bearing seat 431 through a connecting pin. Specifically, the two first rotating plates are arranged between the bearing seats 431. The connecting pin sequentially passes through the first end face of the bearing seat 431, the two first rotating plates, and the second end face of the bearing seat 431. The first end face and the second end face are oppositely arranged. The connecting pin is fixedly connected to the two first rotating plates, and both ends of the connecting pin are rotatably connected to the bearing seat 431. The first rotating member 432 forms the output end of the transmission structure.

[0047] The second rotating member 434 is two second rotating plates. The two second rotating plates are rotatably arranged on the bearing seat 431 through a connecting pin and a bearing seat. Specifically, the two second rotating plates are arranged on both sides of the bearing seat 431. The bearing seat is arranged between the bearing seats 431 and is fixedly connected to the bearing seat 431. The connecting pin sequentially passes through a second rotating plate, the first end face of the bearing seat 431, the bearing seat, the second end face of the bearing seat 431, and the other second rotating plate. The first end face and the second end face are oppositely arranged. The connecting pin is fixedly connected to the two second rotating plates, and the connecting pin is rotatably arranged in the bearing seat 431 and the bearing seat.

[0048] The diameter of the pressing post 433 gradually increases along the direction from far away to close to the first rotating member 432. The connecting member 435 is two connecting plates, and the two connecting plates are rotatably arranged on the first rotating member 432 and the second rotating member 434 through two connecting pins. Specifically, the two connecting plates are respectively located on both sides of the two first rotating plates and are simultaneously located between the two second rotating plates. One connecting pin sequentially passes through one connecting plate, the two first rotating plates and the other connecting plate. The connecting pin is rotatably arranged on the two connecting plates and is fixedly connected to the two first rotating plates. The other connecting pin sequentially passes through one second rotating plate, the two connecting plates and the other second rotating plate. The connecting pin is rotatably arranged on the two connecting plates and is fixedly connected to the two second rotating plates.

[0049] By adopting the above design, when the pressing post 433 is in the pressing position, the first rotating member 432 is horizontally arranged, the second rotating member 434, the connecting member 435 and the pressing post 433 are all vertically arranged. At the same time, the pressing post 433 presses on the pressing body 410. In this case, the pressing assembly 430 can apply a pressing force in the vertical direction to the pressing body 410 and the first insulating pressing member 420, thereby further increasing the contact area between the first pin 1120 and the test power supply unit 300, reducing the contact resistance between the first pin 1120 and the test power supply unit 300, and reducing the heat generated between the sensor under test 1100 and the test power supply unit 300 when a test current is conducted.

[0050] Refer to Figure 1 , as an optional way in the embodiment of the present application, the transmission structure further includes a limiting member 436. The limiting member 436 is fixedly connected to the side of the connecting member 435 close to the pressing post 433. The length direction of the limiting member 436 is parallel to the length direction of the connecting member 435; when the pressing post 433 is in the pressing position, the end face of the limiting member 436 close to the first rotating member 432 is used to abut against the first rotating member 432.

[0051] In this optional way, the limiting member 436 is a limiting plate, and the limiting member 436 and the connecting member 435 are integrally formed. When the pressing post 433 is in the pressing position, the first rotating member 432 is in a horizontal state, the second rotating member 434 and the connecting member 435 are both in a vertical state. At this time, under the action of the connecting member 435, the limiting member 436 will also be in a vertical state, and the end face of the limiting member 436 close to the first rotating member 432 will also abut against the first rotating member 432. In this case, the second rotating member 434 will not be able to continue to rotate towards the direction close to the pressing post 433, and at the same time, it also reminds the operator not to continue to drive the second rotating member 434 to rotate.

[0052] Refer to Figure 2 and Figure 7, the sensor under test 1100 in this embodiment further includes a second pin, which is arranged on the sensor body 1110 and electrically connected to the sensor body 1110. There are four second pins, and the first pin 1120 is arranged opposite to the second pins.

[0053] The sensor electrical performance test fixture further includes a signal output component 500. The signal output component 500 includes a PCB 510 (Printed Circuit Board), whose Chinese name is printed circuit board, a first terminal 520, a second terminal 530, a third terminal 540, and a fourth terminal 550. The PCB 510 is arranged on one side of the test power supply unit 300 and is used for electrically connecting to the second pins of the sensor under test 1100; the first terminal 520 is electrically connected to the PCB 510 and is used for electrically connecting to the positive pole of an external voltage source; the second terminal 530 is electrically connected to the PCB 510 and is used for electrically connecting to the input end of a detection device; the third terminal 540 is electrically connected to the PCB 510 and is used for electrically connecting to the input end of a filtering device, and the fourth terminal 550 is electrically connected to the PCB 510 and is used for electrically connecting to the negative pole of an external voltage source, the output end of the detection device, and the output end of the filtering device.

[0054] In the embodiment of the present application, a connecting piece is arranged on the PCB 510, and the connecting piece is electrically connected to the PCB 510. The second pin can abut against the connecting piece, and at this time, the second pin will be electrically connected to the PCB 510. The flame retardant rating of the PCB 510 is FR-4. The detection device uses a digital multimeter, and the filtering device uses a filtering capacitor.

[0055] In specific applications, the first terminal 520 is connected to the positive pole of an external voltage source, the second terminal 530 is electrically connected to the input end of the digital multimeter, the third terminal 540 is electrically connected to the input end of the filtering capacitor. The fourth terminal 550 is not only electrically connected to the negative pole of an external voltage source to form a closed circuit, but also electrically connected to the output end of the digital multimeter and the output end of the filtering capacitor, so that the digital multimeter and the filtering capacitor are connected in series in the closed circuit. The provided filtering capacitor is used for filtering the output signal to obtain a relatively accurate electrical signal. When testing the sensor under test 1100, the test power supply unit 300 provides a test current for the sensor under test 1100, the PCB 510 provides a working voltage for the sensor under test 1100, and it is judged whether the sensor under test 1100 is qualified and whether the contact between the first pin 1120 and the test power supply unit 300 is good according to the data on the digital multimeter.

[0056] Refer to Figure 7, as an alternative in the embodiments of the present application, the pressing part 400 further includes a second insulating pressing member, which is fixedly connected to the pressing body 410. The second insulating pressing member is arranged corresponding to the first insulating pressing member 420, and the shapes and sizes of the second insulating pressing member and the first insulating pressing member 420 are the same. There are four second insulating pressing members, which are respectively arranged corresponding to the second pins one by one. The arranged second insulating pressing members not only facilitate the good contact between the second pins and the PCB 510, but also enable the first insulating pressing member 420 to apply a good pressing force when the first insulating pressing member 420 presses the first pin 1120, and as much as possible avoid the possibility of the first insulating pressing member 420 tilting.

[0057] Referring to Figure 2 and Figure 3 , the pressing component 430 in this embodiment further includes an adjusting screw 437 and an adjusting nut 438. The adjusting nut 438 is fixedly connected to the output end of the transmission structure, and the second end of the adjusting screw 437 is threadedly connected to the adjusting nut 438.

[0058] In the embodiments of the present application, there are two adjusting nuts 438, which are respectively arranged on both sides of the transmission structure. The adjusting screw 437 is threadedly connected to the two adjusting nuts 438 respectively. The adjusting nut 438 arranged far from the pressing column 433 is fixedly connected to the transmission structure, and the adjusting nut 438 arranged close to the pressing column 433 is not connected to the transmission structure, but only threadedly connected to the adjusting screw 437. At this time, the adjusting screw 437 passes through the output end of the transmission structure, that is, the first rotating member 432.

[0059] In the embodiments of the present application, the length direction of the adjusting screw 437 is perpendicular to the length direction of the first rotating member 432. The two adjusting nuts 438 are respectively fixedly connected to the opposite side surfaces of the second end of the first rotating member 432. The first end of the adjusting screw 437 sequentially passes through an adjusting nut 438, the second end of the first rotating member 432, and the other adjusting nut 438.

[0060] In the embodiment of the present application, a through space for the adjusting screw 437 to pass through is formed between the two first rotating plates. When the sensor under test 1100 is connected to an external voltage source, if the value displayed on the digital multimeter is not the standard value, it is determined at this time that the first pin 1120 is not in good contact with the test power supply unit 300. At this time, rotate the adjusting nut 438 close to the pressing column 433 so that the first end of the adjusting screw 437 can move toward the test power supply unit 300, so that the pressing column 433 can also move toward the test power supply unit 300, thereby strengthening the contact between the first pin 1120 and the test power supply unit 300, increasing the contact area between the first pin 1120 and the test power supply unit 300, and reducing the contact resistance between the first pin 1120 and the test power supply unit 300 until the value displayed on the digital multimeter is approximately the same as the standard value. The provided adjusting screw 437 and adjusting nut 438 can enable the first pin 1120 and the test power supply unit 300 to achieve better contact.

[0061] In addition, in the embodiment of the present application, two connecting plates are provided between the two adjusting nuts 438. One connecting plate is located between the first rotating member 432 and the adjusting nut 438 away from the pressing column 433, and is fixedly connected to the first rotating member 432 and the adjusting nut 438 respectively. The other connecting plate is located between the first rotating member 432 and the adjusting nut 438 close to the pressing column 433, and is fixedly connected to the first rotating member 432.

[0062] Of course, in other examples, both adjusting nuts 438 can be fixedly connected to both sides of the first rotating member 432, and both connecting plates are also fixedly connected to the adjusting nuts 438. When the sensor under test 1100 is connected to an external voltage source, if the value displayed on the digital multimeter is not the standard value, rotate the adjusting screw 437 at this time to drive the pressing column 433 to move toward the test power supply unit 300.

[0063] Refer to Figure 8, as an alternative in the embodiments of the present application, the sensor electrical performance test fixture further includes an adjustment assembly 900. The adjustment assembly 900 is disposed on the pressing post 433. The adjustment assembly 900 includes a rack 910, a gear 920, a driving rod 930, a ratchet 940, a pawl 950, and a driving handwheel 960. Among them, the rack 910 is slidably disposed on the pressing post 433 along the length direction of the pressing post 433. A sliding groove for the rack 910 to slide is formed in the pressing post 433. The first end of the rack 910 is disposed inside the pressing post 433, and the second end of the rack 910 is disposed outside the pressing post 433 and is detachably connected to the pressing body 410; the gear 920 is rotatably disposed in the pressing post 433 and meshes with the rack 910. A rotating space for the gear 920 to rotate is formed in the pressing post 433; the first end of the driving rod 930 is fixedly connected to the gear 920, and the second end of the driving rod 930 is disposed outside the pressing post 433. An extension groove for the driving rod 930 to extend outward is formed in the pressing post 433; the ratchet 940 is disposed outside the pressing post 433. The ratchet 940 is sleeved on the outer periphery of the driving rod 930 and is fixedly connected to the driving rod 930; the pawl 950 is rotatably disposed on the outer wall of the pressing post 433. The driving rod 930 is kept stationary through the cooperation of the ratchet 940 and the pawl 950; the driving handwheel 960 is sleeved on the second end of the driving rod 930 and is fixedly connected to the second end of the driving rod 930.

[0064] In this alternative, the pressing post 433 is a cuboid. Of course, in other examples, the pressing post 433 can also be of other shapes. The length direction of the rack 910 is parallel to the length direction of the pressing post 433, and the length direction of the driving rod 930 is perpendicular to the length direction of the rack 910. In specific applications, when the first pin 1120 does not make good contact with the test power supply unit 300, first rotate the adjustment screw 437 for rough adjustment to strengthen the contact between the first pin 1120 and the test power supply unit 300. When the value displayed by the digital multimeter is close to the standard value, rotate the driving rod 930 to drive the gear 920 to rotate. The gear 920 drives the rack 910 to move towards the test power supply unit 300 until the value displayed by the digital multimeter is approximately the same as the standard value. At this time, the driving rod 930 is kept stationary by using the ratchet 940 and the pawl 950. The provided adjustment assembly 900 plays a fine-tuning role, further strengthening the contact between the first pin 1120 and the test power supply unit 300, increasing the contact area between the first pin 1120 and the test power supply unit 300, reducing the contact resistance between the first pin 1120 and the test power supply unit 300, and improving the accuracy of the test operation of the sensor electrical performance test fixture.

[0065] Refer to Figure 9, In addition, the sensor electrical performance test fixture further includes a fixing component 1000. The fixing component 1000 includes a fixing rod 1010, a return spring 1020, and a traction rope 1030. A receiving groove for receiving the second end of the rack 910 is formed on the pressing body 410. An installation groove is formed on the groove wall of the receiving groove. The fixing rod 1010 is disposed in the installation groove. The length direction of the fixing rod 1010 is perpendicular to the length direction of the rack 910. A fixing groove for inserting the fixing rod 1010 is formed on the outer wall of the second end of the rack 910. The rack 910 and the pressing body 410 are connected through the cooperation of the fixing rod 1010 and the fixing groove; the return spring 1020 is disposed between the fixing rod 1010 and the bottom of the installation groove. The first end of the return spring 1020 is fixedly connected to the fixing rod 1010, and the second end of the return spring 1020 is fixedly connected to the bottom of the installation groove; the first end of the traction rope 1030 is fixedly connected to one end of the fixing rod 1010 close to the return spring 1020. A through hole for the traction rope 1030 to pass outwards is formed on the pressing body 410. The second end of the traction rope 1030 reaches the outside of the pressing body 410 through the through hole.

[0066] Specifically, when the rack 910 needs to be connected to the pressing body 410, first pull the traction rope 1030 to move away from the pressing body 410, so that the end of the fixing rod 1010 away from the return spring 1020 moves into the installation groove. At this time, place the second end of the rack 910 in the receiving groove, and then release the traction rope 1030. Under the action of the return spring 1020, the fixing rod 1010 will directly insert into the fixing groove to connect the rack 910 and the pressing body 410. The provided fixing component 1000 makes the rack 910 and the pressing body 410 be detachably connected, which is convenient for the pressing body 410 to be used alone and also convenient for use with the adjusting component 900.

[0067] In this alternative, two sets of fixing components 1000 are provided, and the two sets of fixing components 1000 are oppositely arranged on the pressing body 410.

[0068] Refer to Figure 4 , As an alternative in the embodiment of the present application, the test power supply unit 300 includes a first power supply body 310, a second power supply body 320, and a third power supply body 330 that are sequentially arranged at intervals. Two pressing parts 400 are provided. One of the two pressing parts 400 is correspondingly arranged with the first power supply body 310 and the second power supply body 320, and the other pressing part 400 is correspondingly arranged with the second power supply body 320 and the third power supply body 330. The sensor electrical performance test fixture further includes a fifth wiring terminal 600. Three fifth wiring terminals 600 are provided, and the three fifth wiring terminals 600 are electrically connected to the first power supply body 310, the second power supply body 320, and the third power supply body 330 respectively. At the same time, two external connection ports are provided on each fifth wiring terminal 600.

[0069] In this alternative mode, there are also two covering parts 200, which are arranged corresponding to the pressing part 400. There are also two signal output components 500, which are arranged corresponding to the pressing part 400. The first power supply body 310, the second power supply body 320, and the third power supply body 330 are all made of brass. Among them, the first power supply body 310 and the second power supply body 320 are of the same size, and the size of the second power supply body 320 is twice that of the first power supply body 310. This design of the present application facilitates both the simultaneous testing of two sensors under test 1100 and the individual testing of a single sensor under test 1100.

[0070] Refer to Figure 4 and Figure 5 , as an alternative mode in the embodiment of the present application, the sensor electrical performance test fixture further includes a limiting part 700. The limiting part 700 is arranged on the covering part 200. A first placement groove for placing the pressing body 410 is opened in the limiting part 700. A limiting through groove for limiting the first lead 1120 and the second lead, and a second placement groove for placing the sensor body 1110 are opened at the bottom of the first placement groove. The first lead 1120 can be placed in the limiting through groove and is in contact with the test power supply part 300, and the second lead can be placed in the limiting through groove and is in contact with the PCB 510.

[0071] Refer to Figure 7 , the sensor electrical performance test fixture further includes a support column 800. The support column 800 is arranged inside the covering part 200. An isolation layer for isolating the electromagnetic field is provided on the end face of the support column 800 away from the insulating base 100; in the case of testing the sensor under test 1100, the sensor body 1110 is in contact with the end face of the support column 800 away from the insulating base 100.

[0072] In this alternative mode, eight limiting through grooves are opened. Among them, the bottoms of four limiting through grooves opened on the same side extend to the upper surface of the test power supply part 300, and the bottoms of the other four limiting through grooves opened on the same side extend to the connecting pieces of the PCB 510. The provided limiting through grooves play a role in limiting the sensor under test 1100, avoiding the possibility of the sensor under test 1100 shifting during the test process, and improving the accuracy of the test results. The isolation layer is made of one of tin foil paper, copper foil paper, or aluminum foil paper, minimizing the influence of the electromagnetic field generated by other external objects on the sensor being tested and ensuring the normal operation of the sensor during the test.

[0073] In summary, the sensor electrical performance test fixture provided by this embodiment has at least the following beneficial technical effects: when the sensor 1100 to be tested is tested, the first insulating pressing piece 420 and the first pin 1120 are arranged in a one-to-one correspondence, so that each first pin 1120 can receive the pressing force applied by the corresponding first insulating pressing piece 420, so that each first pin 1120 can achieve good contact with the test power supply part 300. This design of the present application increases the contact area between each first pin 1120 and the test power supply part 300, reduces the contact resistance between each first pin 1120 and the test power supply part 300, and reduces the heat generated by the sensor 1100 to be tested and the test power supply part 300 when the test current is turned on, thereby avoiding as much as possible the occurrence of problems such as burning of the fixture or product caused by testing the sensor 1100 to be tested under high current conditions.

[0074] The above are only preferred embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent replacements, and improvements made within the spirit and principles of the present application should be included in the scope of protection of the present application.

Claims

1. A sensor electrical performance test fixture is used to test a sensor to be tested (1100). The sensor to be tested (1100) includes a sensor body (1110) and a first pin (1120). The first pin (1120) is disposed on the sensor body (1110) and is electrically connected to the sensor body (1110). It is characterized in that, The sensor electrical performance test fixture includes: An insulating base (100); A test power supply unit (300) which is arranged on the insulating base (100) and is used to provide a test current for the sensor to be tested (1100); and, A pressing part (400) which is arranged on the insulating base (100), the pressing part (400) includes a pressing body (410) and a first insulating pressing piece (420), the first insulating pressing piece (420) is arranged on the pressing body (410), and the pressing body (410) is arranged on the side of the test power supply unit (300) away from the insulating base (100); The sensor to be tested (1100) is placed on the test power supply unit (300), abuts against the test power supply unit (300) through the first pin (1120), and is electrically connected to the test power supply unit (300), and the first insulating pressing piece (420) presses on the first pin (1120); The pressing part (400) further includes a pressing and clamping assembly (430), the pressing and clamping assembly (430) is rotatably arranged on the insulating base (100), and the output end of the pressing and clamping assembly (430) has an initial position and a pressing position for pressing the pressing body (410) in the direction towards the test power supply unit (300); The pressing and clamping assembly (430) includes a bearing seat (431), a transmission structure and a pressing piece, the bearing seat (431) is arranged on the insulating base (100), the transmission structure is rotatably arranged on the bearing seat (431), the pressing piece is drivingly connected to the output end of the transmission structure, the pressing piece is a pressing column (433), and the pressing column (433) forms the output end of the pressing and clamping assembly (430); The sensor electrical performance test fixture further includes an adjusting assembly (900), the adjusting assembly (900) is arranged on the pressing column (433), and the adjusting assembly (900) includes: A rack (910) which is slidably arranged on the pressing column (433) along the length direction of the pressing column (433), a sliding groove for the rack (910) to slide is formed on the pressing column (433), the first end of the rack (910) is arranged inside the pressing column (433), the second end of the rack (910) is arranged outside the pressing column (433) and is detachably connected to the pressing body (410); A gear (920) which is rotatably arranged inside the pressing column (433) and meshes with the rack (910); A driving rod (930) whose first end is fixedly connected to the gear (920), and whose second end is arranged outside the pressing column (433); A ratchet wheel (940) is provided outside the pressing column (433). The ratchet wheel (940) is sleeved on the outer periphery of the driving rod (930) and fixedly connected to the driving rod (930). A ratchet pawl (950) is rotatably provided on the outer wall of the pressing column (433). The driving rod (930) is kept stationary through the cooperation of the ratchet wheel (940) and the ratchet pawl (950). A driving handwheel (960) is sleeved on the second end of the driving rod (930) and fixedly connected to the second end of the driving rod (930).

2. The sensor electrical performance test fixture according to claim 1, wherein The test power supply unit (300) is provided on the insulating base (100). The sensor electrical performance test fixture further includes a covering part (200). The interior of the covering part (200) is hollow and covers the test power supply unit (300). A plurality of first heat dissipation holes (210) are formed in the side wall of the covering part (200).

3. The sensor electrical performance test fixture according to claim 1, wherein A heat dissipation groove is formed on the upper surface of the insulating base (100). The test power supply unit (300) is correspondingly arranged with the heat dissipation groove. The interior of the insulating base (100) is hollow, and a plurality of second heat dissipation holes (110) are formed in both the side wall and the bottom wall.

4. The sensor electrical performance test fixture according to claim 1, wherein, The pressing assembly (430) further includes an adjusting screw rod (437) and an adjusting nut (438). The first end of the adjusting screw rod (437) is fixedly connected to the pressing column (433). The adjusting nut (438) is fixedly connected to the output end of the transmission structure. The second end of the adjusting screw rod (437) is threadedly connected to the adjusting nut (438).

5. The sensor electrical performance test fixture according to claim 2, wherein The sensor under test (1100) further includes a second pin, which is provided on the sensor body (1110) and electrically connected to the sensor body (1110). The sensor electrical performance test fixture further includes a signal output assembly (500), and the signal output assembly (500) includes: A PCB (510) is provided on one side of the test power supply unit (300) and is used for electrically connecting to the second pin of the sensor under test (1100). A first terminal (520) is electrically connected to the PCB (510) and is used for electrically connecting to the positive pole of an external voltage source. A second terminal (530) is electrically connected to the PCB (510) and is used for electrically connecting to the input end of a detection device. A third terminal (540) is electrically connected to the PCB (510) and is used for electrically connecting to the input end of a filtering device. A fourth terminal (550) is electrically connected to the PCB (510) and is used for electrically connecting to the negative pole of the external voltage source, the output end of the detection device, and the output end of the filtering device.

6. The sensor electrical performance test fixture according to any one of claims 1 to 4, characterized in that, The test power supply unit (300) includes a first power supply body (310), a second power supply body (320), and a third power supply body (330) that are sequentially arranged at intervals. There are two pressing parts (400). One of the two pressing parts (400) is correspondingly arranged with the first power supply body (310) and the second power supply body (320), and the other pressing part (400) is correspondingly arranged with the second power supply body (320) and the third power supply body (330); The sensor electrical performance test fixture further includes a fifth terminal (600). There are three fifth terminals (600), and the three fifth terminals (600) are electrically connected to the first power supply body (310), the second power supply body (320), and the third power supply body (330) respectively.

7. The sensor electrical performance test fixture according to claim 5, characterized in that The sensor electrical performance test fixture further includes a limiting part (700). The limiting part (700) is arranged on the covering part (200). A first placement groove for placing the pressing body (410) is formed in the limiting part (700). A limiting through groove for limiting the first pin (1120) and the second pin, and a second placement groove for placing the sensor body (1110) are formed at the bottom of the first placement groove. The first pin (1120) can be placed in the limiting through groove and abuts against the test power supply unit (300), and the second pin can be placed in the limiting through groove and abuts against the PCB (510); The sensor electrical performance test fixture further includes a support column (800). The support column (800) is arranged in the covering part (200). An isolation layer for isolating electromagnetic fields is arranged on the end face of the support column (800) away from the insulating base (100).

8. The sensor electrical performance test fixture according to any one of claims 1 or 4, characterized in that The sensor electrical performance test fixture further includes a fixing component (1000). The fixing component (1000) includes a fixing rod (1010), a return spring (1020), and a traction rope (1030). A receiving groove for receiving the second end of the rack (910) is formed on the pressing body (410). An installation groove is formed on the groove wall of the receiving groove. The fixing rod (1010) is arranged in the installation groove. The length direction of the fixing rod (1010) is perpendicular to the length direction of the rack (910). A fixing groove for inserting the fixing rod (1010) is formed on the outer wall of the second end of the rack (910). The rack (910) and the pressing body (410) are connected through the cooperation of the fixing rod (1010) and the fixing groove; The return spring (1020) is arranged between the fixing rod (1010) and the bottom of the installation groove. The first end of the return spring (1020) is fixedly connected to the fixing rod (1010), and the second end of the return spring (1020) is fixedly connected to the bottom of the installation groove; The first end of the towing rope (1030) is fixedly connected to one end of the fixed rod (1010) close to the return spring (1020). A through hole for the towing rope (1030) to pass outwards is formed in the pressing body (410), and the second end of the towing rope (1030) reaches the outside of the pressing body (410) through the through hole.

Citation Information

Patent Citations

  • Hall current sensor testing device and method

    CN110488213A

  • Testing clamp

    CN201654074U

  • Multi-channel heat dissipation type semiconductor test fixture

    CN217112596U

  • Sensor electrical performance test fixture

    CN218331939U