Method, System and Device for Testing Chip Faults Based on an Integrated Circuit Tester

Abstract

This application relates to the field of chip testing, and particularly to a method, system and device for testing chip faults based on an integrated circuit tester. The method includes generating an image data array to enable the chip to receive the image data array and process the image data array to obtain a valid data array; determining whether the valid data array is similar to a preset data array; if the valid data array is similar to the preset data array, the chip is not damaged; if the valid data array is not similar to the preset data array, the chip is damaged. Data can be transmitted to multiple chips simultaneously to save the time of data acquisition, and then the data is processed simultaneously, achieving parallel acquisition and serial processing of data, thereby improving the testing efficiency of the chip.

Description

Technical Field

[0001] The present application relates to the field of chip testing, and in particular, to a method, system, and device for testing chip faults based on an integrated circuit tester. Background Art

[0002] Fingerprint recognition is a technology for identifying identities based on the uniqueness of the fingerprint characteristics of organisms, that is, the fingerprint images of different individuals are different. Fingerprint recognition is applied in multiple fields such as mobile phone identification and payment door locks, which facilitates people's lives.

[0003] Fingerprint recognition relies on a chip to process image data, including data acquisition and data recognition capabilities. Before leaving the factory, the chip needs to be tested for its data acquisition and data recognition capabilities, and can only be stored and used after being confirmed to be in good condition. To test the chip, data is mainly input into each chip separately, and the chip recognizes the input data to determine whether it is the same as the input data to detect whether the chip is in good condition.

[0004] In view of the above related technologies, when detecting a chip, only one chip can be detected at a time, and it takes a long time to collect data, resulting in low test efficiency for the chip. Summary of the Invention

[0005] In order to improve the test efficiency of chips, the present application provides a method, system, and device for testing chip faults based on an integrated circuit tester.

[0006] The method, system, and device for testing chip faults based on an integrated circuit tester provided by the present application adopt the following technical solutions:

[0007] A method for testing chip faults based on an integrated circuit tester, which is applied to an integrated circuit tester. The integrated circuit tester is connected to multiple chips, and is characterized by including:

[0008] Generating an image data array so that the chip receives the image data array and processes the image data array to obtain a valid data array;

[0009] Judging whether the valid data array is similar to a preset data array;

[0010] If the valid data array is similar to the preset data array, the chip is not damaged;

[0011] If the valid data array is not similar to the preset data array, the chip is damaged.

[0012] By adopting the above technical solution, the integrated circuit tester is connected to multiple chips. After the integrated circuit tester is powered on, the integrated circuit tester transmits data to the chips. After receiving the data, the chips process the data, extract the valid data and then transmit it to the integrated circuit tester. The integrated circuit tester obtains the valid data array after the chips' processing, and compares it with the preset valid data array. If the valid data array is the same as the preset valid data array, the chip is not damaged; if not, it means that the chip's ability to collect data or process data is damaged. It can transmit data to multiple chips simultaneously, saving the time for data acquisition, and then process the data simultaneously, achieving parallel acquisition and serial processing of data, and improving the test efficiency of the chips.

[0013] Optionally, the generating the image data array includes:

[0014] Obtain the preset image array data volume;

[0015] Based on the chip frequency and the image array data volume, obtain the acquisition time;

[0016] Based on the acquisition time, generate the image data array.

[0017] By adopting the above technical solution, when the integrated circuit tester generates data in the image data array, it first obtains how many image array data need to be generated, then gets the time required to generate one data according to the chip frequency, and then gets the acquisition time according to the total data volume, and then generates the image data array according to the acquisition time.

[0018] Optionally, after generating the image data array, it includes:

[0019] Based on the image data array, obtain the image data quantity;

[0020] Judge whether the current image data quantity is greater than the preset quantity;

[0021] If the current image data quantity is greater than the preset quantity, stop generating the image data;

[0022] If the current image data quantity is less than or equal to the preset quantity, based on the current image data quantity and the preset image array data volume, obtain the extension time.

[0023] By adopting the above technical solution, when generating an image data array, the integrated circuit tester will give a pulse signal to the chip, and continuously generate image array data during the duration of the pulse signal. In order to prevent the pulse signal from fluctuating at the beginning of power-on, resulting in no data generation and the total data volume not reaching the preset quantity, after generating the image array data, it will be verified whether the generated data volume is reached. If not enough, the pulse time will be extended to continue generating data to ensure that the total data volume is sufficient.

[0024] Optionally, obtaining the extension time based on the current image data quantity and the preset image array data quantity includes:

[0025] Based on the current image data quantity and the preset image array data quantity, obtain a data difference;

[0026] Based on the data difference and the chip frequency, obtain the extension time.

[0027] By adopting the above technical solution, according to the preset data volume and the current data volume, and then according to the time for the chip to generate a single data, calculate the extension time.

[0028] Optionally, processing the image data array includes:

[0029] Send the image data array to the chip so that the chip can obtain the chip type. Based on the chip type, obtain the row header flag and the number of matrix rows. Based on the row header flag, locate the row header position of the row header flag in the image data array. Based on the row header position and the number of matrix rows, sequentially extract the row data in the image data array to generate a valid data matrix.

[0030] By adopting the above technical solution, after receiving the image array data, the chip will only extract the valid data from the image array data. Each chip will have its own row header flag. Extract the data of the first row according to the first row header flag, and then extract the data of the second row according to the second row header flag until the data required by the chip is extracted to generate a valid data matrix.

[0031] Optionally, determining whether the valid data array is similar to the preset data array includes:

[0032] Based on the valid data array, obtain each element and the element position in the valid data array;

[0033] Based on the element position and each element, determine whether the element corresponding to the element position in the preset data array is the same as the element in the valid data array;

[0034] If the element corresponding to the element position in the preset data array is the same as the element in the valid data array, the valid data array is similar to the preset data array.

[0035] By adopting the above technical solution, each data and its position in the valid data represent the characteristic data of the fingerprint. Therefore, when the elements in the valid data array are compared with the elements in the preset data array, if they are the same, the valid data array is similar to the preset data array, indicating that the acquired fingerprint is the same as the preset fingerprint, and both the acquisition function and data processing function of the chip are intact.

[0036] Optionally, when there are differences between the element corresponding to the element position in the preset data array and the element in the valid data array, it includes:

[0037] Obtain the error quantity of the different elements and the total data quantity of the valid matrix;

[0038] Based on the error quantity and the total data quantity, obtain the recognition error rate;

[0039] Judge whether the recognition error rate is greater than the error threshold;

[0040] If the recognition error rate is greater than the error threshold, the valid data array is not similar to the preset data array;

[0041] If the recognition error rate is less than or equal to the error threshold, the valid data array is similar to the preset data array.

[0042] By adopting the above technical solution, if there are different elements between the preset data array and the valid data array, then compare the quantity of the different elements with the total acquired data quantity to obtain the failure rate. In fingerprint acquisition, partial incorrect data is allowed. As long as the error data rate is less than the error threshold, a person's fingerprint can still be recognized, indicating that the data acquisition and data processing capabilities of the chip are intact.

[0043] In a second aspect, the present application provides a system for testing chip faults based on an integrated circuit tester, adopting the following technical solution:

[0044] A system for testing chip faults based on an integrated circuit tester includes:

[0045] A data generation module, configured to generate an image data array so that the chip receives the image data array and processes the image data array to obtain a valid data array and transmit it;

[0046] A judgment module, configured to judge whether the valid data array is similar to the preset data array;

[0047] The first execution module is used to determine that the chip is not damaged if the valid data array is similar to the preset data array;

[0048] The second execution module is used to determine that the chip is damaged if the valid data array is not similar to the preset data array.

[0049] By adopting the above technical solution, after the data review generation module generates the image data array, the judgment module determines whether the valid data array is similar to the preset data array. When they are similar, the first execution module outputs that the chip is not damaged. If they are not similar, the second execution module outputs that the chip is damaged. Data can be transmitted to multiple chips simultaneously, saving the time for data acquisition. Then, the data is processed simultaneously, achieving parallel data acquisition and serial data processing, and improving the test efficiency of the chips.

[0050] In a third aspect, the present application provides a terminal device, adopting the following technical solution:

[0051] A terminal device includes a memory and a processor. The memory stores a computer program that can run on the processor. When the processor loads and executes the computer program, it adopts the method described in any one of the above.

[0052] By adopting the above technical solution, the method described above is used to generate a computer program and store it in the memory to be loaded and executed by the processor. Thus, a terminal device is manufactured based on the memory and the processor, which is convenient to use.

[0053] In summary, the present application includes at least one of the following beneficial technical effects:

[0054] An integrated circuit tester is connected to multiple chips. When the integrated circuit tester is powered on, the integrated circuit tester transmits data to the chips. After the chips receive the data, they process the data, extract the valid data, and then transmit it to the integrated circuit tester. The integrated circuit tester obtains the valid data array processed by the chips and compares it with the preset valid data array. If the valid data array is the same as the preset valid data array, the chip is not damaged. If they are different, it means that the chip's ability to collect or process data is damaged. Data can be transmitted to multiple chips simultaneously, saving the time for data acquisition. Then, the data is processed simultaneously, achieving parallel data acquisition and serial data processing, and improving the test efficiency of the chips. BRIEF DESCRIPTION OF THE DRAWINGS

[0055] Figure 1 It is a flowchart of one implementation manner of a method for testing chip faults based on an integrated circuit tester in an embodiment of the present application;

[0056] Figure 2It is a schematic flowchart of one implementation manner of a method for testing chip faults based on an integrated circuit tester in an embodiment of the present application;

[0057] Figure 3 It is a schematic flowchart of one implementation manner of a method for testing chip faults based on an integrated circuit tester in an embodiment of the present application;

[0058] Figure 4 It is a schematic flowchart of one implementation manner of a method for testing chip faults based on an integrated circuit tester in an embodiment of the present application;

[0059] Figure 5 It is a schematic flowchart of one implementation manner of a method for testing chip faults based on an integrated circuit tester in an embodiment of the present application;

[0060] Figure 6 It is a schematic flowchart of one implementation manner of a method for testing chip faults based on an integrated circuit tester in an embodiment of the present application;

[0061] Figure 7 It is a system block diagram of a system for testing chip faults based on an integrated circuit tester in an embodiment of the present application.

[0062] Description of reference numerals:

[0063] 1. Data generation module; 2. Judgment module; 3. First execution module; 4. Second execution module. Specific implementation manner

[0064] The following further describes the present application in detail with reference to all the drawings.

[0065] Refer to Figure 1 , an embodiment of the present application discloses a method for testing chip faults based on an integrated circuit tester, which is applied to an integrated circuit tester. The integrated circuit tester is connected to multiple chips, including:

[0066] S100. Form an image data array so that the chip receives the image data array and processes the image data array to obtain a valid data array.

[0067] Specifically, an integrated circuit tester is used to test whether the data acquisition function and data processing function of a chip are intact. An integrated circuit tester can test multiple chips simultaneously. There are also chips inside the integrated circuit tester for generating data. After receiving the data from the integrated circuit tester, the chips process the data and then send it back to the integrated circuit tester. The image data array is a set of data generated by the integrated circuit tester. The image data array has N rows and M columns, with a total of M * N data. The image data array is a set of simulated fingerprint data. The integrated circuit tester can send the image array data to the chips connected to it simultaneously. The valid data array is the data obtained after the chips connected to the integrated circuit tester receive the image data array and extract it. The size of the valid data array of each type of chip is different. Extraction means removing the redundant data from the image data array and only leaving the data with the specified number of rows and columns of the chip. For example, if the image data array is data with 10 rows and 10 columns, and the specification of a certain chip is 6 rows and 10 columns, then the extracted valid data array is 6 rows and 10 columns.

[0068] S110. Determine whether the valid data array is similar to the preset data array.

[0069] Specifically, the preset data array is the valid data array extracted after a certain type of chip receives the generated image data array under normal circumstances, including that both the number of rows and columns of the valid data array and the data in the rows and columns should be the same. For example, if the preset data array is a 3 * 3 matrix, the first row is 1, 2, 3, the second row is 3, 4, 5, and the third row is 4, 5, 6, then the extracted valid data array has the first row as 1, 2, 3, the second row as 3, 4, 5, and the third row as 4, 5, 6. In this case, it is exactly the same, indicating that both the data acquisition function and the data processing function of the chip are intact. Similarity does not necessarily require all the data in the valid data matrix to be the same as the preset data array, as long as most of them are the same.

[0070] S120. If the valid data array is similar to the preset data array, the chip is not damaged;

[0071] S130. If the valid data array is not similar to the preset data array, the chip is damaged.

[0072] The implementation principle of a method for testing chip faults based on an integrated circuit tester in an embodiment of the present application is as follows: Multiple chips are connected to the integrated circuit tester. After the integrated circuit tester is powered on, the integrated circuit tester transmits data to the chips. After receiving the data, the chips process the data, extract the valid data, and then transmit it to the integrated circuit tester. The integrated circuit tester obtains the valid data array processed by the chips and compares it with the preset valid data array. If the valid data array is the same as the preset valid data array, the chip is not damaged; if not, it means that the chip's ability to collect or process data is damaged. Data can be transmitted to multiple chips simultaneously, saving the time for data acquisition. Then, the data is processed simultaneously, achieving parallel acquisition and serial processing of data, and improving the test efficiency of the chips.

[0073] Referring to Figure 2 , generating an image data array includes:

[0074] S200. Obtain the preset image array data volume.

[0075] Specifically, the image array data volume is the number of data included in the image array. For example, for a graphic array of 6 rows and 5 columns, it includes 6 * 5 = 30 data, so the data volume is 30.

[0076] S210. Based on the chip frequency and the image array data volume, obtain the acquisition time.

[0077] Specifically, generating each data in the image array requires a pulse signal, and the chip frequency determines the generation time of the pulse signal. For example, if the chip frequency is 1M, then one cycle is 1 microsecond, that is, it takes 1 microsecond to generate one data. Then, it takes 30 microseconds to generate 30 data. Of course, in actual data generation, the data volume is definitely much larger than 30.

[0078] S220. Based on the acquisition time, generate the image data array.

[0079] Specifically, after determining the data volume to be generated. The acquisition time is determined, and then the integrated circuit tester generates a pulse signal according to the acquisition time, continuously generating the elements in the image data array to form the image data array. Of course, in actual pulse signal generation, the time of the pulse signal can be appropriately extended based on the acquisition time to facilitate the acquisition of complete data.

[0080] The implementation principle of generating an image data array in an embodiment of the present application is as follows: When the integrated circuit tester generates data in the image data array, it first obtains how many image array data need to be generated, then obtains the time required to generate one data according to the chip frequency, and then obtains the acquisition time based on the total data volume. Then, it generates the image data array according to the acquisition time.

[0081] Referring to Figure 3 , after generating the image data array, it includes:

[0082] S300. Regarding the image data array, obtain the quantity of image data.

[0083] Specifically, after determining the number of rows and columns of the image data array to be generated, the quantity of image data can be obtained according to the number of rows and columns. The quantity of image data is the collection of all elements in the image data array. For example, for a 3*4 array, the quantity of image data is 12. Different quantities of image data can represent different amounts of fingerprint feature data collected due to different fingerprint areas when different people record their fingerprints in fingerprint data.

[0084] S310. Determine whether the current quantity of image data is greater than the preset quantity.

[0085] Specifically, the preset quantity is the quantity of image data to be collected, that is, the quantity of the image data array. The current quantity of image data is the quantity of the image data that has been generated.

[0086] S320. If the current quantity of image data is greater than the preset quantity, stop generating image data.

[0087] Specifically, if the current quantity of image data is greater than the preset quantity, it means that the currently generated data has met the requirements of chip detection, and there is no need to continue generating data, so stop generating image data.

[0088] S330. If the current quantity of image data is less than or equal to the preset quantity, based on the current quantity of image data and the preset quantity of image array data, obtain the extended time.

[0089] Specifically, if the currently generated quantity of image data is less than the preset quantity, but the acquisition time has ended, it means that some acquisition time pulse signals may not have been triggered, resulting in no data being generated. In order to collect enough data, the data generation time needs to be extended. Calculate the extended time according to the difference between the current quantity of image data and the preset data quantity. For example, a total of 100 data need to be generated, 80 data have been generated currently, and 20 more data are needed. Since it takes 1 microsecond to generate each data, the extended time is 20 microseconds. The significance of the extended time is, on the one hand, to simulate fingerprint acquisition to ensure that enough data for identifying a person's fingerprint is collected, and on the other hand, to simulate fingerprint data in some edge areas when the fingerprint is recorded relatively off-center.

[0090] The implementation principle after the image data array is generated in the embodiment of the present application is as follows: When generating the image data array, the integrated circuit tester will give a pulse signal to the chip, and image array data will be continuously generated during the duration of the pulse signal. To prevent the pulse signal from fluctuating at the beginning of power-on, resulting in no data being generated and the total data volume not reaching the preset quantity, after generating the image array data, it will be verified whether the amount of generated data is reached. If not enough, the pulse time will be extended to continue generating data to ensure that the total data volume is sufficient.

[0091] Referring to Figure 4 , based on the current image data quantity and the preset image array data volume, obtaining the extension time includes:

[0092] S400. Based on the current image data quantity and the preset image array data volume, obtain the data difference.

[0093] Specifically, the current image data is the quantity of generated image data, and the preset image array data volume is the total quantity of data to be generated.

[0094] Data difference = preset image array data volume - current image data quantity.

[0095] S410. Based on the data difference and the chip frequency, obtain the extension time.

[0096] Specifically, the frequency of the chip determines the time to generate one data. One pulse period is equal to the reciprocal of the frequency. Therefore, the extension time is the data difference * period.

[0097] The implementation principle of obtaining the extension time based on the current image data quantity and the preset image array data volume in the embodiment of the present application is as follows: According to the preset data volume and the current data volume, and then according to the time for the chip to generate a single data, calculate the extension time.

[0098] After the integrated circuit tester generates the image data, it transmits the image data array to the chip to be tested. The chip will process the image data array and then transmit the processed data to the integrated circuit tester. The integrated circuit tester determines whether the chip is faulty based on the data transmitted back by the chip to be tested. The specific process of the chip processing the data is as follows:

[0099] Processing the image data array includes:

[0100] Send the image data array to the chip so that the chip can obtain the chip type. Based on the chip type, obtain the row head flag and the number of matrix rows. Based on the row head flag, locate the row head position of the row head flag in the image data array. Based on the row head position and the number of matrix rows, sequentially extract the row data in the image data array to generate a valid data matrix.

[0101] Specifically, each chip has its own specified number of rows and columns for data acquisition during design. After receiving the image array data, the chip will screen out the data it needs from the image data array. Each chip has a specified row header, which is the row header address of the image data array. When the data is stored in the register, it becomes the register address. For example, if the chip specifies that 0X0A00 represents the first row in the data, then 0X0A01 represents the second row. The chip retrieves the data of the first row at 0X0A00 and 0X0A01 as the data of the second row. According to the number of rows specified by the chip, all the data is retrieved as the valid data matrix. The valid data matrix can represent a person's fingerprint data. The chip first processes the numerous generated data, which can effectively reduce the data processing pressure of the integrated circuit tester, improve the data processing efficiency, and accelerate the chip testing efficiency.

[0102] Referring to Figure 5 , determining whether the valid data array is similar to the preset data array includes:

[0103] S500. Based on the valid data array, obtain each element and its position in the valid data array.

[0104] Specifically, each element in the valid data array and the position of each element in the matrix represent fingerprint feature data. The element is the data in the valid data array, and all the elements constitute the valid data array.

[0105] S510. Based on the element position and each element, determine whether the element corresponding to the element position in the preset data array is the same as the element in the valid data array.

[0106] Specifically, the element corresponding to the element position in the preset data array is, for example, in a 3*3 matrix, the first row is 1, 2, and 3, the second row is 3, 4, and 5, and the third row is 5, 6, and 7. Then, in this matrix, the element represented by the element position is, for example, the element represented by the second column in the first row is 2. When comparing, the data should be compared for equality at the same position.

[0107] S520. If the element corresponding to the element position in the preset data array is the same as the element in the valid data array, then the valid data array is similar to the preset data array.

[0108] Specifically, if all the elements and their positions in the preset data array are the same as those in the valid data array, then the valid data array is similar to the preset data array. The reason for similarity is that identifying a person's fingerprint data does not require all the data to be the same to identify a person's fingerprint data.

[0109] The implementation principle for the embodiments of this application to determine whether the valid data array is similar to the preset data array is as follows: Each data and its position in the valid data represent the characteristic data of the fingerprint. Therefore, the elements in the valid data array are compared with the elements in the preset data array. If they are the same, the valid data array is similar to the preset data array, indicating that the acquired fingerprint is the same as the preset fingerprint, and both the acquisition function and data processing function of the chip are intact.

[0110] Referring to Figure 6 , if there are differences between the elements corresponding to the element positions in the preset data array and the elements in the valid data array, it includes:

[0111] S600. Obtain the error quantity of the different elements and the total data volume of the valid data matrix.

[0112] Specifically, when there are differences between the elements corresponding to the element positions in the preset data array and the elements in the valid data array, it means that in the data array, the data of the elements at the same position are different. For example, for a 3*3 matrix, the first row of the preset data matrix is 1, 2, and 3, the second row is 3, 4, and 5, and the third row is 5, 6, and 7. While the first row of the valid data matrix is 1, 2, and 3, the second row is 3, 4, and 5, and the third row is 5, 8, and 7. From this, we can see that for the second element in the third row, it is 6 in the preset data matrix and 8 in the valid data matrix, showing a difference. The total data volume of the valid data matrix is the number of all elements in the matrix, that is, 3*3 = 9 data. Among them, the number of error data is 1.

[0113] S610. Based on the error quantity and the total data volume, obtain the recognition error rate.

[0114] Specifically, the recognition error rate = error quantity / total data volume. For example, if there is 1 error data and 20 total data, the error rate = 0.05.

[0115] S620. Determine whether the recognition error rate is greater than the error threshold.

[0116] Specifically, the error threshold is the maximum allowable recognition error rate when identifying data. For example, if the error threshold is 0.1, and the current error rate is 0.05 which is less than 0.1, it means that the current error data is within the allowable range. For fingerprint recognition, it means that the degree of error data identified is not sufficient to affect the correctness of fingerprint recognition. For fingerprint recognition, it is not necessary for all data to be the same for recognition. As long as the specification is met and the error rate is within the allowable range, the valid data array can be considered similar to the preset data array.

[0117] S630. If the recognition error rate is greater than the error threshold, the valid data array is not similar to the preset data array.

[0118] S640. If the recognition error rate is less than or equal to the error threshold, the valid data array is similar to the preset data array.

[0119] The implementation principle when there are differences between the elements corresponding to the element positions in the preset data array and the elements of the valid data array in the embodiments of the present application is as follows: If there are different elements between the preset data array and the valid data array, then the failure rate is obtained by comparing the number of different elements with the total amount of collected data. In fingerprint collection, it is allowed to have some incorrect data. Only when the error data rate is less than the error threshold can a person's fingerprint still be recognized, indicating that the data collection and data processing capabilities of the chip are intact.

[0120] If there are different elements between the preset data array and the valid data array, then the failure rate is obtained by comparing the number of different elements with the total amount of collected data. In fingerprint collection, it is allowed to have some incorrect data. Only when the error data rate is less than the error threshold can a person's fingerprint still be recognized, indicating that the data collection and data processing capabilities of the chip are intact.

[0121] The above has described in detail a method for testing chip faults based on an integrated circuit tester. Next, a system for testing chip faults based on an integrated circuit tester will be described in detail.

[0122] Refer to Figure 7 , a system for testing chip faults based on an integrated circuit tester includes:

[0123] A data generation module 1, configured to generate an image data array so that the chip receives the image data array, processes the image data array, obtains a valid data array, and transmits it;

[0124] A judgment module 2, configured to judge whether the valid data array is similar to the preset data array;

[0125] A first execution module 3, configured to, if the valid data array is similar to the preset data array, indicate that the chip is not damaged;

[0126] A second execution module 4, configured to, if the valid data array is not similar to the preset data array, indicate that the chip is damaged.

[0127] The implementation principle of a system for testing chip faults based on an integrated circuit tester in an embodiment of the present application is as follows: After the data review generation module generates an image data array, the judgment module determines whether the valid data array is similar to the preset data array. When they are similar, the first execution module outputs that the chip is not damaged; if they are not similar, the second execution module outputs that the chip is damaged. Data can be transmitted to multiple chips simultaneously, saving the time for data acquisition, and then the data is processed simultaneously, achieving parallel acquisition and serial processing of data, thereby improving the test efficiency of the chips.

[0128] An embodiment of the present application also discloses a terminal device, including a memory and a processor. It is characterized in that the memory stores a computer program capable of running on the processor, and when the processor loads and executes the computer program, it adopts any of the above methods for testing chip faults based on an integrated circuit tester.

[0129] Among them, the terminal device can be a computer device such as a desktop computer, a laptop computer, or a cloud server. Moreover, the terminal device includes, but is not limited to, a processor and a memory. For example, the terminal device may also include input / output devices, network access devices, and a bus, etc.

[0130] Among them, the processor can adopt a central processing unit (CPU). Of course, according to the actual usage situation, other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. can also be adopted. The general-purpose processor can adopt a microprocessor or any conventional processor, etc. The present application does not make any restrictions in this regard.

[0131] Among them, the memory can be an internal storage unit of the terminal device. For example, the hard disk or memory of the terminal device, or it can also be an external storage device of the terminal device. For example, a plug-in hard disk, a smart media card (SMC), a secure digital card (SD), or a flash card (FC), etc. equipped on the terminal device. Moreover, the memory can also be a combination of the internal storage unit and the external storage device of the terminal device. The memory is used to store the computer program and other programs and data required by the terminal device. The memory can also be used to temporarily store the data that has been output or will be output. The present application does not make any restrictions in this regard.

[0132] Among them, through this terminal device, a method for testing chip faults based on an integrated circuit tester in the above embodiment is stored in the memory of the terminal device and is loaded and executed on the processor of the terminal device, which is convenient for use.

[0133] The above are all preferred embodiments of this application, and the protection scope of this application is not limited thereby. Therefore, all equivalent changes made according to the structure, shape, and principle of this application shall be covered within the protection scope of this application.

Claims

1. A method for testing chip faults based on an integrated circuit tester, which is applied to the integrated circuit tester. The integrated circuit tester is connected to multiple chips, and is characterized in that, Including: Generating an image data array to enable the chip to receive the image data array and process the image data array to obtain a valid data array; Judging whether the valid data array is similar to a preset data array; If the valid data array is similar to the preset data array, the chip is not damaged; If the valid data array is not similar to the preset data array, the chip is damaged; Wherein, the generating of the image data array includes: Obtaining a preset image array data volume; Based on the chip frequency and the image array data volume, obtaining an acquisition time; Based on the acquisition time, generating an image data array.

2. A method for testing chip faults based on an integrated circuit tester according to claim 1, characterized in that, After generating the image data array, it includes: Based on the image data array, obtaining the number of image data; Judging whether the number of image data is greater than a preset number; If the number of image data is greater than the preset number, stopping generating image data; If the number of image data is less than or equal to the preset number, based on the current number of image data and the preset image array data volume, obtaining an extension time.

3. A method for testing chip faults based on an integrated circuit tester according to claim 2, characterized in that, The obtaining of the extension time based on the current number of image data and the preset image array data volume includes: Based on the current number of image data and the preset image array data volume, obtaining a data difference; Based on the data difference and the chip frequency, obtaining an extension time.

4. A method for testing chip faults based on an integrated circuit tester according to claim 1, wherein, The processing of the image data array includes: Sending the image data array to the chip so that the chip obtains the chip type, based on the chip type, obtaining a row header flag and the number of matrix rows, based on the row header flag, positioning the row header position of the row header flag in the image data array, and based on the row header position and the number of matrix rows, sequentially extracting the row data in the image data array to generate a valid data matrix.

5. A method for testing chip faults based on an integrated circuit tester according to claim 1, characterized in that, The judging whether the valid data array is similar to the preset data array includes: Based on the valid data array, obtaining each element and the element position in the valid data array; Based on the element position and each element, judging whether the element corresponding to the element position in the preset data array is the same as the element in the valid data array; If the element corresponding to the element position in the preset data array is the same as the element in the valid data array, the valid data array is similar to the preset data array.

6. A method for testing chip faults based on an integrated circuit tester according to claim 5, characterized in that, If there are differences between the element corresponding to the element position in the preset data array and the element in the valid data array, it includes: Obtaining the number of incorrect elements and the total data volume of the valid data array; Based on the number of incorrect elements and the total data volume, obtaining an identification error rate; Judging whether the identification error rate is greater than an error threshold; If the identification error rate is greater than the error threshold, the valid data array is not similar to the preset data array; If the identification error rate is less than or equal to the error threshold, the valid data array is similar to the preset data array.

7. A system for testing chip faults based on an integrated circuit tester, characterized in that, Including: A data generation module (1) for generating an image data array to enable the chip to receive the image data array and process the image data array to obtain a valid data array and transmit it; A judgment module (2) for judging whether the valid data array is similar to a preset data array; The first execution module (3), which is used to determine that the chip is not damaged if the valid data array is similar to the preset data array; The second execution module (4), which is used to determine that the chip is damaged if the valid data array is not similar to the preset data array; Wherein, the generation of the image data array includes: Obtaining a preset image array data volume; Based on the chip frequency and the image array data volume, obtaining an acquisition time; Based on the acquisition time, generating an image data array.

8. A terminal device, comprising a memory and a processor, characterized in that, The memory stores a computer program capable of running on a processor. When the processor loads and executes the computer program, the method according to any one of claims 1-6 is adopted.

Images