4.5 inch probe card rubbing fixture

Abstract

The present invention discloses a 4.5-inch probe card rubbing clamp, comprising a first base and an adjusting mechanism, wherein a clamp base is arranged on the upper sides of the first base and the adjusting mechanism, a sliding groove is arranged on one side of the clamp base, a clamping bar is slidably connected to the inner side of the sliding groove through a lifting mechanism, the lifting mechanism comprises a lifting screw rotatably installed in the clamp base through a bearing, a lifting nut fixed on one side of the clamping bar and a rotating wheel fixed on the lower end of the lifting screw, the lifting nut is sleeved on the lifting screw, and a stop plate is arranged on the upper side of the clamp base; the present invention is based on a universal interface of 4.5 inches wide for fixing and clamping a probe card on a client probe station, the probe card clamping tool of the present invention can clamp a probe card made of a 4.5-inch wide PCB, and when in use, only the rubbing rotating wheel is needed to realize the lifting and lowering of the pressure bar block to clamp and loosen the probe card PCB, eliminating the action of screwing a screwdriver and the operation of regularly replacing screws.

Description

Technical Field

[0001] The invention belongs to the technical field of probe card production, and in particular relates to a 4.5-inch probe card rubbing fixture. Background Art

[0002] The probe card fixture is a necessary tool for clamping the probe card during the production and maintenance process to facilitate the operation. Its main functions are: clamping the probe card. After the probe card is assembled, there are protruding objects on the upper and lower surfaces of the PCB (there are test head components on the lower surface of the PCB, and signal connectors, electronic components, etc. on the upper surface of the PCB). When performing subsequent work on the probe card, a clamping tool is required to clamp it from the edge of the PCB so that the protruding objects on the upper and lower surfaces are in a suspended state, which is convenient for subsequent work without bumping or contacting; correcting the warping of the PCB, through the clamping force, the warping value of the warped PCB is forced to decrease, thereby improving the overall flatness of the probe card and improving the contact performance of the probe card.

[0003] The prior art has the following disadvantages:

[0004] 1) In the probe card industry, screws are tightened or loosened to create pressure on the pressure strip to clamp or loosen the probe card PCB. During the process, a screwdriver must be used to tighten or loosen the screws. The screwdriver is easily worn out, and the screws need to be replaced from time to time.

[0005] 2) PCB is made of multiple layers of FR4 (glass fiber epoxy resin) or polymid (polyamide), and there will be different degrees of warping. The quality of each PCB is different, and the overall warping and flatness will vary greatly. The fixture is often used to clamp PCBs of various material numbers. Conventional fixtures rely on tightening screws to generate pressure on the pressure strips. The pressure is mainly distributed in a point shape around the screws, and has little effect on flattening and correcting the warping of the PCB;

[0006] 3) The clamping direction of the probe card is that the needle tip faces upward, the pressure strip contacts the lower surface of the PCB, the pressure is on the lower surface of the PCB, and the static surface is the upper surface of the PCB. When the client uses the probe card, the needle tip faces downward, the fastening pressure strip contacts the upper surface of the PCB, the pressure is on the upper surface of the PCB, and the static surface is the lower surface of the PCB. When the PCB warps greatly, the conventional clamp suppresses the PCB warping differently from the actual surface, and the effect is very different.

[0007] To this end, we propose a 4.5-inch probe card rubbing fixture. Summary of the invention

[0008] The object of the present invention is to provide a 4.5-inch probe card rubbing fixture to solve the problems raised in the above-mentioned background technology.

[0009] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a 4.5-inch probe card rubbing clamp, comprising a first base and an adjustment mechanism, wherein a clamp base is arranged on the upper side of the first base and the adjustment mechanism, a sliding groove is opened on one side of the clamp base, and a clamping bar is slidably connected to the inner side of the sliding groove through a lifting mechanism, and the lifting mechanism comprises a lifting screw rotatably installed in the clamp base through a bearing, a lifting nut fixed on one side of the clamping bar and a rotating wheel fixed on the lower end of the lifting screw, the lifting nut is sleeved on the lifting screw, a stop plate is arranged on the upper side of the clamp base, and the position of one side of the stop plate corresponds to the position of the clamping bar, and a pressure strip block is arranged on the upper end of the clamping bar.

[0010] Preferably, a rotation groove is provided at the lower end of the clamp base at a position corresponding to the rotating wheel, and the outer side of the rotating wheel is located outside the clamp base.

[0011] Preferably, the cross-sectional shape of the clamping bar is set to be L-shaped, the lifting nut is located on one side of the lower end of the clamping bar, and the pressure bar block is located on the upper end surface of the clamping bar.

[0012] Preferably, the upper surface of the pressure strip block matches the shape of the two ends of the probe card, a connecting plug plate is provided on the lower side of the pressure strip block, a connecting slot is provided on the upper side of the clamping bar, and the connecting plug plate is inserted into the connecting slot.

[0013] Preferably, the cross-sectional shape of the connecting plug plate is set to be T-shaped, and both ends of the connecting plug plate are rotatably connected to limited rotation blocks through a damping shaft, and the limited rotation blocks are attached to both ends of the clamping strip.

[0014] Preferably, the first base and the second base are connected to each other via an adjusting mechanism, connecting seats are provided at both ends of the first base and the second base, and both ends of the adjusting mechanism are mounted on the connecting seats.

[0015] Preferably, the adjustment mechanism includes an adjusting screw sleeve, an adjusting screw and a fixing rod, one end of the adjusting screw sleeve is rotatably mounted on a connecting seat at one end of the first base through a bearing, one end of the fixing rod is fixed to a connecting seat at one end of the second base, the adjusting screw is integrally formed at the other end of the fixing rod, and the adjusting screw is screwed into the inside of the adjusting screw sleeve.

[0016] Preferably, a guide column and a guide groove are provided on one side of the first base and the second base, and the first base and the second base are slidably connected via the guide column and the guide groove.

[0017] Preferably, a limiting sliding groove is provided on one side of the guide column, and a limiting sliding block is provided at the other end of the guide column, and the limiting sliding block is slidably installed in the limiting sliding groove.

[0018] Preferably, the guide posts and guide grooves are alternately arranged between the first base and the second base, and the width of the guide posts is the same as the width of the guide grooves.

[0019] Compared with the prior art, the present invention has the following beneficial effects:

[0020] 1. The probe card clamping tool of the present invention is based on the universal interface of 4.5 inches wide for fixing and clamping the probe card of the client probe station. It can clamp the probe card made of a 4.5-inch wide PCB, and when in use, it only needs to use a rubbing wheel to realize the lifting and lowering of the pressure bar block to clamp and loosen the probe card PCB, eliminating the action of twisting the screwdriver and the operation of regularly replacing the screws.

[0021] 2. The clamping force generated by rubbing the pressure strip block upward is in the shape of a strip. The pressure strip block is wide, and the surface area it contacts has a distribution of clamping force, which has a better correction effect on PCB warping.

[0022] 3. The pressure action surface of the clamp pressure bar block of the present invention is consistent with the action surface on the PCB surface when the client uses the probe card, which is more suitable for actual use. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 It is a structural schematic diagram of the present invention;

[0024] Figure 2 It is a schematic diagram of the lifting and clamping structure of the present invention;

[0025] Figure 3 It is a schematic diagram of the connection structure of the layering block of the present invention;

[0026] Figure 4 For the present invention Figure 1 The enlarged structural diagram at A in the middle;

[0027] Figure 5 It is a schematic diagram of the base adjustment guide structure of the present invention;

[0028] In the figure: 1. first base; 2. adjusting mechanism; 3. second base; 4. clamp base; 5. sliding groove; 6. clamping strip; 7. pressure strip block; 8. stop plate; 9. lifting mechanism; 10. rotating wheel; 11. lifting screw; 12. lifting nut; 13. limit rotating block; 14. connecting slot; 15. connecting plug plate; 16. adjusting screw sleeve; 17. adjusting screw; 18. fixing rod; 19. guide column; 20. guide groove; 21. limit sliding groove; 22. limit sliding block. DETAILED DESCRIPTION

[0029] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0030] Embodiment 1:

[0031] See also Figures 1 to 5 The present invention provides a technical solution: a 4.5-inch probe card rubbing fixture, comprising a first base 1 and an adjustment mechanism 2, wherein a fixture base 4 is arranged on the upper side of the first base 1 and the adjustment mechanism 2, a sliding groove 5 is arranged on one side of the fixture base 4, a clamping bar 6 is slidably connected to the inner side of the sliding groove 5 through a lifting mechanism 9, the lifting mechanism 9 comprises a lifting screw 11 rotatably installed in the fixture base 4 through a bearing, a lifting nut 12 fixed on one side of the clamping bar 6 and a rotating wheel 10 fixed on the lower end of the lifting screw 11, the lifting nut 12 is sleeved on the lifting screw 11, a stop plate 8 is arranged on the upper side of the fixture base 4, and a position of one side of the stop plate 8 corresponds to the position of the clamping bar 6, and the rotating wheel 10 is rotated by rubbing the rotating wheel 10 by hand. The lifting screw 11 is moved, thereby driving the lifting nut 12 to rotate, and the lifting screw 11 drives the lifting nut 12 and the clamping bar 6 to rise, so that the clamping bar 6 drives the pressure bar block 7 and the 4.5-inch probe card to rise and press on the stop plate 8. The upper end of the clamping bar 6 is provided with a pressure bar block 7, and the pressure bar block 7 is used to conveniently clamp the probe card PCB. The lower end of the clamp base 4 is provided with a rotating groove corresponding to the position of the rotating wheel 10, and the outer side of the rotating wheel 10 is located on the outer side of the clamp base 4, which is convenient for manually rubbing the rotating wheel 10; the cross-sectional shape of the clamping bar 6 is set to be L-shaped, the lifting nut 12 is located on one side of the lower end of the clamping bar 6, and the pressure bar block 7 is located on the upper end surface of the clamping bar 6, which is convenient for the clamping bar 6 to lift and slide to clamp the probe card PCB when in use.

[0032] From the above description, it can be seen that the present invention has the following beneficial effects: the rubbing wheel 10 is rotated to drive the lifting screw 11 to rotate, and the lifting screw 11 drives the lifting nut 12 and the clamping bar 6 to rise, so that the clamping bar 6 drives the pressure bar block 7 and the 4.5-inch probe card to rise and fall, thereby clamping and loosening the probe card PCB, eliminating the action of twisting the screwdriver and the operation of regularly replacing the screws.

[0033] The clamping force generated by rubbing the pressure strip block upward is in the shape of a strip. The pressure strip block is wide, and the surface area it contacts has the distribution of clamping force, which can better correct the warping of the PCB.

[0034] The pressure action surface of the clamp pressure strip block of the present invention is consistent with the action surface on the PCB surface when the client uses the probe card, which is more suitable for practical use.

[0035] Embodiment 2:

[0036] See also Figures 1 to 5 As shown, on the basis of the first embodiment, the present invention provides a technical solution: the upper surface of the pressure strip block 7 matches the shape of the two ends of the probe card, a connecting plug plate 15 is arranged on the lower side of the pressure strip block 7, a connecting slot 14 is opened on the upper side of the clamping bar 6, the connecting plug plate 15 is inserted into the connecting slot 14, the cross-sectional shape of the connecting plug plate 15 is set to be T-shaped, and the two ends of the connecting plug plate 15 are rotatably connected to the limited rotation block 13 through the damping shaft, and the limited rotation block 13 is attached to the two ends of the clamping bar 6. Before use, according to the round or square 4.5-inch probe card or other shaped probe cards, the pressure strip block 7 of the corresponding shape is installed on the clamping bar 6. During installation, only the connecting plug plate 15 needs to be inserted into the connecting slot 14, and then the limited rotation block 13 is screwed down to fit and fix on the two ends of the clamping bar 6.

[0037] By adopting the above technical solution, the connecting plug plate 15 is inserted into the connecting slot 14, and then the limit rotating block 13 is screwed down to fit the two ends of the clamping bar 6 for installation, so that it can be installed according to the shape of the two ends of the probe card PCB.

[0038] The first base 1 and the second base 3 are connected to each other through an adjusting mechanism 2. Connecting seats are provided at both ends of the first base 1 and the second base 3. Both ends of the adjusting mechanism 2 are installed on the connecting seats. The adjusting mechanism 2 includes an adjusting screw sleeve 16, an adjusting screw 17 and a fixing rod 18. One end of the adjusting screw sleeve 16 is rotatably installed on the connecting seat at one end of the first base 1 through a bearing. One end of the fixing rod 18 is fixed to the connecting seat at one end of the second base 3. The adjusting screw 17 is integrally formed at the other end of the fixing rod 18, and the adjusting screw 17 is screwed into the inside of the adjusting screw sleeve 16. The adjusting screw sleeve 16 is rotated to make the adjusting screw 17 at one end of the fixing rod 18 move in the adjusting screw sleeve 16, so that the adjusting screw sleeve 16 and the fixing rod 18 drive the first base 1 and the second base 3 to move the adjustment distance.

[0039] By adopting the above technical solution, the distance between the adjusting screw sleeve 16 and the fixing rod 18 is adjusted by rotating the adjusting screw sleeve 16 and cooperating with the adjusting screw rod 17, thereby driving the clamp base 4 of the first base 1 and the second base 3 to move the adjustment distance, which is convenient for clamping and processing probe card PCBs of different sizes.

[0040] For further information, see Figure 1 and Figure 4A guide column 19 and a guide groove 20 are provided on one side of the first base 1 and the second base 3, and the first base 1 and the second base 3 are slidably connected by the guide column 19 and the guide groove 20, and the first base 1 and the second base 3 are guided by the guide column 19 and the guide groove 20 to make the movement of the first base 1 and the second base 3 stable; a limited sliding groove 21 is provided on one side of the guide column 19, and a limited sliding block 22 is provided on the other end of the guide column 19. The limited sliding block 22 is slidably installed in the limited sliding groove 21, and the limited sliding block 22 and the limited sliding groove 21 slide, so that the sliding between the guide column 19 and the guide groove 20 is stable and limited; the guide column 19 and the guide groove 20 are alternately arranged between the first base 1 and the second base 3, and the width of the guide column 19 is the same as the width of the guide groove 20, so that the sliding between the guide column 19 and the guide groove 20 is convenient and stable when in use.

[0041] With the rapid development of the domestic integrated circuit industry, the entire chip industry will operate rapidly. As the interface component between the chip and the tester, the probe card is a must-have in the chip testing process. On a macro level, improving the production efficiency of the probe card is also to improve the operating efficiency of the chip industry. Improving efficiency at the company level and reducing production time and production costs is one of the company's energy efficiency improvements.

[0042] In the actual production process, there are about 300 probe cards per month that use the 4.5-inch probe card rubbing fixture. In the production process of each probe card (fixing, inspection, grinding, adjustment, QC, maintenance), the fixture is used for loading and unloading an average of more than 30 times. Each loading and unloading can save more than 1 minute of working time, which means that each probe card using the fixture of this invention can save more than 0.5 hours of production time.

[0043] The working principle and use process of the present invention are as follows: when in use, the corresponding pressure strip block 7 is installed on the clamping bar 6 according to the shape of the two ends of the 4.5-inch probe card. When installing, just insert the connecting plug plate 15 into the connecting slot 14, and then screw down the limit rotating block 13 to fit the two ends of the clamping bar 6 to install the pressure strip block 7 on the upper end of the clamping bar 6. Then, place the 4.5-inch probe card on the pressure strip block 7, rub the rotating wheel 10 by hand to rotate, thereby driving the lifting screw 11 to rotate, and the lifting screw 11 drives the lifting nut 12 and the clamping bar 6 to rise, so that the clamping bar 6 drives the pressure strip block 7 and the 4.5-inch probe The probe card is pressed up and fixed on the stop plate 8, which is more convenient when clamping and installing, so it is convenient to process the 4.5-inch probe card, and when clamping probe cards of other sizes, it is only necessary to rotate the adjusting screw sleeve 16 to move the adjusting screw 17 at one end of the fixing rod 18 in the adjusting screw sleeve 16, so that the adjusting screw sleeve 16 and the fixing rod 18 drive the first base 1 and the second base 3 to move the adjustment distance, and cooperate with the guiding sliding of the limiting slide groove 21 and the limiting slider 22, and cooperate with the guide column 19 and the guide groove 20 to make the sliding between the first base 1 and the second base 3 more stable.

[0044] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0045] The above description is only used to illustrate the technical solution of the present invention rather than to limit it. Other modifications or equivalent substitutions made to the technical solution of the present invention by ordinary technicians in this field should be included in the scope of the claims of the present invention as long as they do not depart from the spirit and scope of the technical solution of the present invention.

Claims

1. 4.5 inch probe card rubbing fixture, characterized by: The invention comprises a first base (1) and an adjusting mechanism (2), wherein a clamp base (4) is arranged on the upper side of the first base (1) and the adjusting mechanism (2), a sliding groove (5) is provided on one side of the clamp base (4), the inner side of the sliding groove (5) is slidably connected to a clamping strip (6) via a lifting mechanism (9), the lifting mechanism (9) comprises a lifting screw (11) rotatably mounted in the clamp base (4) via a bearing, a lifting nut (12) fixed on one side of the clamping strip (6), and a rotary wheel (10) fixed on the lower end of the lifting screw (11), the lifting nut (12) is sleeved on the lifting screw (11), a stop plate (8) is arranged on the upper side of the clamp base (4), and the position of one side of the stop plate (8) corresponds to the position of the clamping strip (6), and a pressure strip block (7) is arranged on the upper end of the clamping strip (6); The upper surface of the pressure strip block (7) matches the shape of the two ends of the probe card, a connecting plug plate (15) is provided on the lower side of the pressure strip block (7), a connecting slot (14) is provided on the upper side of the clamping strip (6), and the connecting plug plate (15) is inserted into the connecting slot (14); The first base (1) and the second base (3) are connected to each other via an adjustment mechanism (2); connecting seats are provided at both ends of the first base (1) and the second base (3); and both ends of the adjustment mechanism (2) are mounted on the connecting seats; The adjusting mechanism (2) comprises an adjusting screw sleeve (16), an adjusting screw rod (17) and a fixing rod (18); one end of the adjusting screw sleeve (16) is rotatably mounted on a connecting seat at one end of the first base (1) via a bearing; one end of the fixing rod (18) is fixed to a connecting seat at one end of the second base (3); the adjusting screw rod (17) is integrally formed at the other end of the fixing rod (18), and the adjusting screw rod (17) is screwed into the interior of the adjusting screw sleeve (16); A guide column (19) and a guide groove (20) are provided on one side of the first base (1) and the second base (3), and the first base (1) and the second base (3) are slidably connected via the guide column (19) and the guide groove (20); A limiting slide groove (21) is provided on one side of the guide column (19), and a limiting slide block (22) is provided on the other end of the guide column (19), wherein the limiting slide block (22) is slidably mounted in the limiting slide groove (21); The guide columns (19) and the guide grooves (20) are alternately arranged between the first base (1) and the second base (3), and the width of the guide columns (19) is the same as the width of the guide grooves (20).

2. The 4.5-inch probe card rubbing fixture according to claim 1, characterized in that: A rotating groove is provided at the lower end of the clamp base (4) at a position corresponding to the rotating wheel (10), and the outer side of the rotating wheel (10) is located outside the clamp base (4).

3. The 4.5-inch probe card rubbing fixture according to claim 1, characterized in that: The cross-sectional shape of the clamping bar (6) is set to be L-shaped, the lifting nut (12) is located on one side of the lower end of the clamping bar (6), and the pressure bar block (7) is located on the upper end surface of the clamping bar (6).

4. The 4.5-inch probe card rubbing fixture according to claim 1, characterized in that: The cross-sectional shape of the connecting plug plate (15) is set to be T-shaped, and the two ends of the connecting plug plate (15) are connected to the limit rotation block (13) through the damping shaft rotation, and the limit rotation block (13) is attached to the two ends of the clamping strip (6).

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