Product portfolio evaluation system and evaluation methods

Abstract

This invention provides a product layout evaluation system and method. The system first identifies a process platform identical to the design process platform of the product layout to be evaluated. This yields rule data for existing product layouts under the same inspection rules for a given evaluation, and then uses this rule data as a reference rule database. Without manually defining inspection rules, the system can determine whether the product layout (a new product layout) to be evaluated has potential risks based solely on the reference rule database. This novel product layout evaluation method overcomes the shortcomings of existing technologies that rely on design rules to determine the existence of design risks in product layouts.

Description

Technical Field

[0001] This invention relates to the field of semiconductor technology, and in particular to a product layout evaluation system and evaluation method. Background Technology

[0002] With the development of integrated circuit technology, the feature size of transistors in integrated circuits has become increasingly smaller, leading to an increase in the density of the layout pattern on the mask corresponding to the target pattern. Since light waves diffract at the layout pattern on the mask, this high-density layout pattern can introduce defects during actual production. These defects can potentially cause open circuits or short circuits during the actual operation of the integrated circuit, burning it out. These potentially defective local layout patterns are commonly referred to as hotspots. Manufacturers need to summarize the impact of numerous key parameters on the performance and yield of integrated circuits caused by hotspots, and provide more manufacturing-related information to designers to guide their layout design. However, the degree to which key parameters such as simulation parameters used in design, wafer data during the production process, and layout layout affect hotspots varies across different process technologies. Therefore, assessing the impact of hotspots in the layout is crucial for defect analysis.

[0003] Currently, for semiconductor wafer foundries, launching new products is always a high-risk endeavor, especially for new customers' products. Unverified designs can easily lead to insufficient process windows due to layout issues, ultimately impacting yield. The current standard solution is to conduct design rule checks, developing layout design rules based on verification data from the platform's establishment phase, and requiring customers to adhere to them to reduce the likelihood of insufficient process windows caused by layout design. However, design rule checks have several problems: first, rules are manually formulated, inevitably leading to oversights and rule omissions; second, the numerical values ​​in design rules may not have verified data and may not represent the true risk, making historical mass production data a better benchmark; third, products transferred from other foundries do not adhere to the foundry's design rules, inevitably causing numerous problems during design rule checks and interfering with judgment. Therefore, there is currently a lack of layout checking methods that are not based on design rules. Summary of the Invention

[0004] The purpose of this invention is to provide a product layout evaluation system and method, so as to propose a new evaluation method that can determine whether the product layout meets the design requirements without the need for manually defined inspection rules, thereby improving the scoring efficiency of the product layout.

[0005] In a first aspect, to solve the above-mentioned technical problems, the present invention provides a product layout evaluation system, comprising:

[0006] The layout output module can be used to output the coordinate information of each layer contained in the target layout information data through the input target layout information data. The target layout information data includes layout information data of existing products and layout information data to be evaluated, and the layout information data includes multiple layers.

[0007] The design feature calculation module is electrically connected to the layout output module. Upon receiving the coordinate information of each layer contained in the target layout information data, it can obtain the rule data corresponding to each layer contained in the target layout information data under the inspection rules to be calculated in this evaluation, based on the pre-set inspection rules to be calculated in this evaluation.

[0008] The evaluation module is electrically connected to the design feature calculation module. Based on a pre-set evaluation method, it first uses the rule data corresponding to each layer of the existing product's layout information under the inspection rules to be calculated in this evaluation as reference rule data. Then, it compares the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation with the reference rule data. If the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is within a preset threshold range, it determines that the product layout corresponding to the layout information data to be evaluated meets the design requirements.

[0009] Furthermore, the functions that the layout output module can implement can be written using calibre statements.

[0010] Furthermore, the functions that the design feature calculation module can implement can be written using JAVA statements.

[0011] Furthermore, the rule data corresponding to each layer in the layout information data to be evaluated under the inspection rules to be calculated in this evaluation and / or the rule data corresponding to each layer in the layout information of the existing product under the inspection rules to be calculated in this evaluation may include: the graphic size of each layer, the graphic spacing, and at least one of the following: the amount of enclosure, extension, overlap, and distance between multiple layers.

[0012] Secondly, based on the product landscape evaluation system described above, the present invention also provides a product landscape evaluation method, which may specifically include the following steps:

[0013] Acquire target map information data, which includes map information data of existing products and map information data to be evaluated, and the map information data includes multiple layers;

[0014] The target layout information data is used as the input of the layout output module to obtain the coordinate information of each layer corresponding to the layout information data of the existing product and the coordinate information of each layer corresponding to the layout information data to be evaluated.

[0015] The coordinate information of each layer obtained through the layout output module is used as the input of the design feature calculation module. Based on the inspection rules to be calculated in this evaluation, which are preset by the design feature calculation module, the rule data corresponding to each layer in the target layout information data under the inspection rules to be calculated in this evaluation is obtained.

[0016] The rule data corresponding to each layer of the existing product layout information under the inspection rules to be calculated in this evaluation is used as reference rule data. According to the evaluation method preset by the evaluation module, the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is compared with the reference rule data. When the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is within a preset threshold range, it is determined that the product layout corresponding to the layout information data to be evaluated meets the design requirements.

[0017] Furthermore, the layout information data of the existing product and the layout information data to be evaluated can be layout information data obtained from the same process platform.

[0018] Furthermore, the existing product layout information data and the layout information data to be evaluated are layout information data obtained using the same or different layout design rules.

[0019] Furthermore, the product type of the existing product layout information data can be the same as or different from the product type of the layout information data to be evaluated, and the more product types, the better.

[0020] Furthermore, the rule data corresponding to each layer in the layout information data to be evaluated under the inspection rules to be calculated in this evaluation and / or the rule data corresponding to each layer in the layout information of the existing product under the inspection rules to be calculated in this evaluation may include: the graphic size of each layer, the graphic spacing, and at least one of the following: the amount of enclosure, extension, overlap, and distance between multiple layers.

[0021] Furthermore, the evaluation method preset by the evaluation module may include: when the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is smaller than the rule data corresponding to each layer of the layout information of the existing product under the inspection rules to be calculated in this evaluation, the score of the product corresponding to the layout information data to be evaluated is reduced by 2 based on the preset initial score.

[0022] Furthermore, when the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is equal to the minimum rule data corresponding to each layer of the layout information of the existing product under the inspection rules to be calculated in this evaluation, and the proportion of the minimum size in its rule data is greater than the proportion of the minimum size in each layer of the layout information of the existing product under the inspection rules to be calculated in this evaluation, the score of the product corresponding to the layout information data to be evaluated is reduced by 1 based on the preset initial score.

[0023] Thirdly, based on the product layout evaluation method described above, the present invention also provides an electronic device, including a processor, a communication interface, a memory, and a communication bus, wherein the processor, the communication interface, and the memory communicate with each other through the communication bus.

[0024] Memory, used to store computer programs;

[0025] The processor, when executing a program stored in memory, implements the product layout evaluation method described above.

[0026] Fourthly, the present invention also provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps of the above-described product layout evaluation method.

[0027] Compared with the prior art, the technical solution of the present invention has at least one of the following beneficial effects:

[0028] In the product layout evaluation method provided by this invention, by utilizing the product layout evaluation system provided by this invention, the same process platform as the design process platform of the product layout (new product layout) to be evaluated is first determined. This yields the rule data corresponding to the existing product layout under the inspection rules to be calculated in a certain evaluation, and the rule data corresponding to the product layout to be evaluated under the inspection rules to be calculated in a certain evaluation. Then, the rule data corresponding to the existing product layout under the inspection rules to be calculated in a certain evaluation is used as a reference rule database. Afterwards, without the need for manually defining inspection rules, it is only necessary to determine whether the product layout (new product layout) to be evaluated has potential risks based on the rule data corresponding to the existing product layout under the inspection rules to be calculated in a certain evaluation. This proposes a novel product layout evaluation method and overcomes the shortcomings of existing technologies that determine the existence of design risks in product layouts based on design rule checks. Attached Figure Description

[0029] Figure 1 This is a schematic diagram of the structure of a product layout evaluation system provided in one embodiment of the present invention.

[0030] Figure 2 This is a flowchart illustrating a product layout evaluation method provided in one embodiment of the present invention.

[0031] Figure 3 This is a schematic diagram of the structure of an electronic device according to an embodiment of the present invention. Detailed Implementation

[0032] As mentioned in the background section, for semiconductor wafer foundries, launching new products is always a high-risk endeavor, especially for new customers' products. Unverified designs can easily lead to insufficient process windows due to layout issues, ultimately impacting yield. The current standard solution is to conduct design rule checks, developing layout design rules based on verification data from the platform's establishment phase and requiring customers to adhere to them to reduce the likelihood of insufficient process windows caused by layout design. However, design rule checks have several problems: first, rules are manually formulated, inevitably leading to oversights and rule omissions; second, the numerical values ​​in design rules may not have verified data and may not represent the true risk, making historical mass production data a better benchmark; third, products transferred from other foundries do not adhere to the foundry's design rules, inevitably causing numerous problems during design rule checks and interfering with judgment. Therefore, there is currently a lack of layout checking methods that are not based on design rules.

[0033] Therefore, the present invention provides a product layout evaluation system and method, which proposes a new evaluation method that can determine whether a product layout meets design requirements without the need for manually defined inspection rules, thereby improving the scoring efficiency of product layout.

[0034] The product layout evaluation system and method proposed in this invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. The advantages and features of this invention will become clearer from the following description. It should be noted that the drawings are all in a very simplified form and use non-precise scales, and are only used to facilitate and clarify the illustration of the embodiments of this invention. Many specific details are set forth in the following description to provide a thorough understanding of this invention; however, this invention can also be implemented in other ways different from those described herein, and therefore this invention is not limited to the specific embodiments disclosed below.

[0035] As shown in this application and claims, unless the context clearly indicates otherwise, the words "a," "an," "an," and / or "the" do not specifically refer to the singular and may also include the plural. Generally speaking, the terms "comprising" and "including" only indicate the inclusion of explicitly identified steps and elements, which do not constitute an exclusive list, and the method or apparatus may also include other steps or elements. In detailing the embodiments of the present invention, for ease of explanation, the cross-sectional views showing the device structure may be partially enlarged without adhering to the general scale, and the schematic diagrams are merely examples and should not limit the scope of protection of the present invention. Furthermore, in actual manufacturing, the three-dimensional spatial dimensions of length, width, and depth should be included.

[0036] The following section will first introduce a product layout evaluation system provided by an embodiment of the present invention.

[0037] See Figure 1 , Figure 1 This is a schematic diagram of the structure of a product layout evaluation system provided in one embodiment of the invention, such as... Figure 1 As shown, the product layout evaluation system provided by the present invention may include a layout output module 10, a design feature calculation module 20, and an evaluation module 30, wherein,

[0038] The layout output module 10 can be specifically used to output the coordinate information of each layer contained in the target layout information data through the input target layout information data. The target layout information data includes the layout information data of existing products and the layout information data to be evaluated, and the layout information data includes multiple layers.

[0039] The design feature calculation module 20 can be electrically connected to the layout output module 10, and can obtain the rule data corresponding to each layer in the target layout information data under the inspection rules to be calculated in this evaluation, based on the pre-set inspection rules to be calculated in this evaluation, when receiving the coordinate information of each layer in the target layout information data.

[0040] The evaluation module 30 can be electrically connected to the design feature calculation module 20. According to a preset evaluation method, it can first use the rule data corresponding to each layer of the existing product layout information under the inspection rules to be calculated in this evaluation as reference rule data. Then, it compares the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation with the reference rule data. When the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is within a preset threshold range, it is determined that the product layout corresponding to the layout information data to be evaluated meets the design requirements.

[0041] Furthermore, the functions of the layout output module can be written using calibre statements, while the functions of the design feature calculation module can be written using JAVA statements.

[0042] Furthermore, the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation and / or the rule data corresponding to each layer of the layout information of the existing product under the inspection rules to be calculated in this evaluation may specifically include: the graphic size of each layer, the graphic spacing, and at least one of the following: the enclosure amount, extension amount, overlap amount, and distance between multiple layers.

[0043] The present invention will now incorporate the product layout evaluation system described above, and combine it with the appendix. Figure 2 This invention introduces the product layout evaluation method provided by the present invention.

[0044] See details Figure 2 , Figure 2 This is a flowchart illustrating a product layout evaluation method provided in one embodiment of the invention, such as... Figure 2 As shown, the novel product layout evaluation method provided by the present invention may include the following steps:

[0045] Step S201: Obtain target map information data. The target map information data includes map information data of existing products and map information data to be evaluated, and the map information data includes multiple layers.

[0046] In this embodiment, the existing product layout information data is used as reference rule data. Therefore, when using the evaluation module provided by this invention to evaluate the layout of a new product, it is possible to determine whether the layout of the product to be evaluated (the layout of the new product) has potential risks without manually defining inspection rules, simply based on the reference rule data. This overcomes the shortcomings of existing technologies that determine the existence of design risks in product layouts based on design rule checks. Therefore, the existing product layout information data and the layout information data to be evaluated need to be layout information data obtained from the same process platform, or layout information data obtained using the same layout design rules.

[0047] Step S202: The target layout information data is used as the input of the layout output module to obtain the coordinate information of each layer corresponding to the layout information data of the existing product and the coordinate information of each layer corresponding to the layout information data to be evaluated.

[0048] In this embodiment, a calibre script can be written first using the calibre statement to solve for the coordinate information of each layer contained in the layout, as required by the present invention, thus creating a layout output module. Then, the target layout information data, which includes the layout information data of the existing product and the layout information data to be evaluated, obtained in step S201, is used as the input parameter value of the calibre script. In this way, the coordinate information of each layer contained in the layout information data of the existing product and the layout information data to be evaluated can be obtained.

[0049] It should be noted that the coordinate information of each layer contained in the layout information data mentioned in this invention can be the overall coordinate information of a certain layer, or the coordinate information of each graphic contained in a certain layer, which is determined according to the rule data set by the design feature calculation module.

[0050] Step S203: The coordinate information of each layer obtained through the layout output module is used as the input of the design feature calculation module. According to the inspection rules to be calculated in this evaluation, which are preset by the design feature calculation module, the rule data corresponding to each layer in the target layout information data under the inspection rules to be calculated in this evaluation is obtained.

[0051] The rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation and / or the rule data corresponding to each layer of the layout information of the existing product under the inspection rules to be calculated in this evaluation may include: the graphic size of each layer, the graphic spacing, and at least one of the following: the amount of enclosure, extension, overlap and distance between multiple layers.

[0052] In this embodiment, the inspection rules to be calculated in this evaluation can be pre-set in the design feature calculation module. For example, the inspection rule to be calculated in this evaluation can be set to check the graphic size of each layer contained in the layout of the new product. Then, after determining the coordinate information of each layer contained in the layout information data of the existing product and the layout information data to be evaluated in step S201, the graphic size corresponding to each layer contained in the layout information data of the existing product and the layout information data to be evaluated can be solved by using the program script of the design feature calculation module, which is written in JAVA in advance and can solve the rule data.

[0053] It should be noted that the explanation given here is merely illustrative, referring to the inspection rules as checking the graphic dimensions of each layer in the new product layout. These rules can also be one or more of the various inspection rules proposed in this invention, such as the graphic dimensions of each layer, the graphic spacing, and the enclosing amount, extension amount, overlap amount, and distance between multiple layers.

[0054] Step S204: The rule data corresponding to each layer of the existing product layout information under the inspection rules to be calculated in this evaluation is used as reference rule data. According to the evaluation method preset by the evaluation module, the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is compared with the reference rule data. When the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is within a preset threshold range, it is determined that the product layout corresponding to the layout information data to be evaluated meets the design requirements.

[0055] In this embodiment, the evaluation method preset by the evaluation module may include: when the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is smaller than the rule data corresponding to each layer of the layout information data of the existing product under the inspection rules to be calculated in this evaluation, the score of the product corresponding to the layout information data to be evaluated is reduced by 2 based on the preset initial score; and when the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is equal to the minimum rule data corresponding to each layer of the layout information data of the existing product under the inspection rules to be calculated in this evaluation, and the proportion of the minimum size in its rule data is greater than the proportion of the minimum size in the layout information data of the existing product under the inspection rules to be calculated in this evaluation, the score of the product corresponding to the layout information data to be evaluated is reduced by 1 based on the preset initial score.

[0056] The preset threshold range can be determined according to the actual situation. For example, the preset threshold range specified in this invention is 70 to 100, such as 70, 80, 90 and 100.

[0057] As an example, assuming a preset threshold of 100, and taking the analysis of a new product layout design on a certain platform (Product T) as an example, we prepared layouts of 10 mass-produced and verified products on the same platform to generate a database (Products A to J). First, we wrote a calibre script to output the coordinate information of each layer of the product layout, obtaining the coordinate information of each layer of these 11 layouts. Then, we input this coordinate information into the design rule calculation module, setting the rules to be calculated in the rule setting file of the design rule calculation module as minimum width, distance, and area of ​​a single layer. After calculation, the minimum width, distance, and area information of each layer of the 11 layouts are generated. We use the design rule information of Products A to J as a reference rule database, and input it together with the design rule information of Product T into the evaluation system. This allows us to determine which rules of Product T are smaller than any product in the database, and which rules have the same value as the smallest product in the database, but with a higher minimum size percentage. In the scoring rule list, we deduct 2 points for being smaller than any product in the reference rule database, and deduct 1 point for having the same value as the smallest product in the database but with a higher minimum size percentage. Finally, we obtained a score of 93 points for Product T, as shown in Table 1 below.

[0058] Table 1

[0059]

[0060] In summary, the product layout evaluation method provided by this invention utilizes the product layout evaluation system provided by this invention to first determine the process platform that is the same as the design process platform of the product layout (new product layout) to be evaluated. This obtains the rule data corresponding to the existing product layout under the inspection rules to be calculated in a certain evaluation, and the rule data corresponding to the product layout to be evaluated under the inspection rules to be calculated in a certain evaluation. Then, the rule data corresponding to the existing product layout under the inspection rules to be calculated in a certain evaluation is used as a reference rule database. Afterwards, without manually defining inspection rules, it is only necessary to determine whether the product layout (new product layout) to be evaluated has potential risks based on the rule data corresponding to the existing product layout under the inspection rules to be calculated in a certain evaluation. This proposes a novel product layout evaluation method and overcomes the shortcomings of existing technologies that determine the existence of design risks in product layouts based on design rule checks.

[0061] This invention also provides an electronic device, such as... Figure 3 As shown, it includes a processor 301, a communication interface 302, a memory 303, and a communication bus 304, wherein the processor 301, the communication interface 302, and the memory 303 communicate with each other through the communication bus 304.

[0062] Memory 303 is used to store computer programs;

[0063] The processor 301, when executing the program stored in the memory 303, implements a product layout evaluation method provided in this embodiment of the invention.

[0064] Specifically, the above-mentioned product portfolio evaluation method includes:

[0065] Acquire target map information data, which includes map information data of existing products and map information data to be evaluated, and the map information data includes multiple layers;

[0066] The target layout information data is used as the input of the layout output module to obtain the coordinate information of each layer corresponding to the layout information data of the existing product and the coordinate information of each layer corresponding to the layout information data to be evaluated.

[0067] The coordinate information of each layer obtained through the layout output module is used as the input of the design feature calculation module. Based on the inspection rules to be calculated in this evaluation, which are preset by the design feature calculation module, the rule data corresponding to each layer in the target layout information data under the inspection rules to be calculated in this evaluation is obtained.

[0068] The rule data corresponding to each layer of the existing product layout information under the inspection rules to be calculated in this evaluation is used as reference rule data. According to the evaluation method preset by the evaluation module, the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is compared with the reference rule data. When the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is within a preset threshold range, it is determined that the product layout corresponding to the layout information data to be evaluated meets the design requirements.

[0069] In addition, other implementations of the product layout evaluation method implemented by the processor 301 executing the program stored in the memory 303 are the same as those mentioned in the aforementioned method embodiment section, and will not be repeated here.

[0070] The communication bus mentioned in the control terminal above can be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. This communication bus can be divided into address bus, data bus, control bus, etc. For ease of illustration, only one thick line is used to represent it in the diagram, but this does not indicate that there is only one bus or one type of bus.

[0071] The communication interface is used for communication between the aforementioned electronic devices and other devices.

[0072] The memory may include random access memory (RAM) or non-volatile memory (NVM), such as at least one disk storage device. Optionally, the memory may also be at least one storage device located remotely from the aforementioned processor.

[0073] The processors mentioned above can be general-purpose processors, including central processing units (CPUs), network processors (NPs), etc.; they can also be digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components.

[0074] In another embodiment of the present invention, a computer-readable storage medium is also provided, which stores instructions that, when executed on a computer, cause the computer to perform the product layout evaluation method described in any of the above embodiments.

[0075] In the above embodiments, implementation can be achieved entirely or partially through software, hardware, firmware, or any combination thereof. When implemented using software, it can be implemented entirely or partially in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, all or part of the processes or functions described in the embodiments of the present invention are generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, the computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., coaxial cable, fiber optic, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center that integrates one or more available media. The available medium can be a magnetic medium (e.g., floppy disk, hard disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium (e.g., solid state disk (SSD)).

[0076] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0077] The various embodiments in this specification are described in a related manner. Similar or identical parts between embodiments can be referred to mutually. Each embodiment focuses on describing the differences from other embodiments. In particular, the embodiments of apparatus, electronic devices, and computer-readable storage media are basically similar to the method embodiments, and therefore the descriptions are relatively simple; relevant parts can be referred to the descriptions of the method embodiments.

[0078] The above description is merely a preferred embodiment of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention are included within the scope of protection of the present invention.

Claims

1. A product portfolio evaluation system, characterized in that, include: The layout output module is used to output the coordinate information of each layer contained in the target layout information data through the input target layout information data. The target layout information data includes the layout information data of existing products and the layout information data to be evaluated, and the layout information data includes multiple layers. The design feature calculation module is electrically connected to the layout output module. Upon receiving the coordinate information of each layer contained in the target layout information data, it obtains the rule data corresponding to each layer contained in the target layout information data under the check rules to be calculated in this evaluation, based on the check rules to be calculated in this evaluation, which are preset in the module. The evaluation module is electrically connected to the design feature calculation module. According to a pre-set evaluation method, it first uses the rule data corresponding to each layer of the existing product's layout information under the inspection rules to be calculated in this evaluation as reference rule data. Then, it compares the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation with the reference rule data. When the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is within a preset threshold range, it is determined that the product layout corresponding to the layout information data to be evaluated meets the design requirements.

2. The product layout evaluation system as described in claim 1, characterized in that, The functions of the layout output module are written using calibre statements.

3. The product layout evaluation system as described in claim 1, characterized in that, The functions implemented by the design feature calculation module are written in Java.

4. The product layout evaluation system as described in claim 1, characterized in that, The rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation and / or the rule data corresponding to each layer of the layout information of the existing product under the inspection rules to be calculated in this evaluation include: the graphic size of each layer, the graphic spacing, and at least one of the following: the amount of enclosure, extension, overlap, and distance between multiple layers.

5. A method for evaluating a product layout based on an evaluation system for product layout according to any one of claims 1 to 4, characterized in that, Includes the following steps: Acquire target map information data, which includes map information data of existing products and map information data to be evaluated, and the map information data includes multiple layers; The target layout information data is used as the input of the layout output module to obtain the coordinate information of each layer corresponding to the layout information data of the existing product and the coordinate information of each layer corresponding to the layout information data to be evaluated. The coordinate information of each layer obtained through the layout output module is used as the input of the design feature calculation module. Based on the inspection rules to be calculated in this evaluation, which are preset by the design feature calculation module, the rule data corresponding to each layer in the target layout information data under the inspection rules to be calculated in this evaluation is obtained. The rule data corresponding to each layer of the existing product layout information under the inspection rules to be calculated in this evaluation is used as reference rule data. According to the evaluation method preset by the evaluation module, the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is compared with the reference rule data. When the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is within a preset threshold range, it is determined that the product layout corresponding to the layout information data to be evaluated meets the design requirements.

6. The product portfolio evaluation method as described in claim 5, characterized in that, The layout information data of the existing products and the layout information data to be evaluated are layout information data obtained from the same process platform.

7. The product layout evaluation method as described in claim 5, characterized in that, The existing product layout information data and the layout information data to be evaluated are layout information data obtained using the same or different layout design rules.

8. The product layout evaluation method as described in claim 6 or 7, characterized in that, The product type of the existing product's layout information data may be the same as or different from the product type of the layout information data to be evaluated.

9. The product layout evaluation method as described in claim 5, characterized in that, The rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation and / or the rule data corresponding to each layer of the layout information of the existing product under the inspection rules to be calculated in this evaluation include: the graphic size of each layer, the graphic spacing, and at least one of the following: the amount of enclosure, extension, overlap, and distance between multiple layers.

10. The product layout evaluation method as described in claim 9, characterized in that, The evaluation module has a pre-set evaluation method including: when the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is smaller than the rule data corresponding to each layer of the layout information of the existing product under the inspection rules to be calculated in this evaluation, the score of the product corresponding to the layout information data to be evaluated is reduced by 2 based on the preset initial score. Furthermore, when the rule data corresponding to each layer of the layout information data to be evaluated under the inspection rules to be calculated in this evaluation is equal to the minimum rule data corresponding to each layer of the layout information of the existing product under the inspection rules to be calculated in this evaluation, and the proportion of the minimum size in its rule data is greater than the proportion of the minimum size in each layer of the layout information of the existing product under the inspection rules to be calculated in this evaluation, the score of the product corresponding to the layout information data to be evaluated is reduced by 1 based on the preset initial score.

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