A high-uniformity and high-precision high-low temperature aging test machine for solid-state drives

Abstract

The present invention provides a high and low temperature aging test machine for solid state drives with high uniformity and high precision, comprising: a box body; two test chambers symmetrically arranged in the box body, and filter air holes are uniformly arranged on the left and right side walls of each test chamber; an air inlet air duct arranged on one side of each test chamber and an air outlet air duct arranged on the other side of each test chamber, and the test chamber is communicated with the corresponding air inlet air duct and air outlet air duct through the filter air holes on the left and right side walls; a blower arranged above each test chamber, the air outlet of each blower is communicated with the upper part of the corresponding air inlet air duct, and the air inlet of each blower is connected with a return air duct; a temperature adjustment chamber arranged at the lower part of the box body, and the temperature adjustment chamber is respectively communicated with each air outlet air duct and each return air duct; hot air can only pass through the filter air holes, and the wind direction passing through the test chamber is single from one side wall of the test chamber to the other side wall, and the solid state drives at each height position are traversed by hot air once, preventing the continuous accumulation of heat caused by inconsistent temperatures upstream and downstream of the air path.

Description

Technical Field

[0001] The present invention relates to the technical field of high and low temperature test equipment, and particularly to a high and low temperature aging test machine for solid state drives with high uniformity and high precision. Background Art

[0002] A storage device is a memory device in a computer system used to store programs and data. The development of modern computers is closely related to storage devices. Among storage devices, solid state drives are gradually widely used in the industry due to their strong performance, high speed, small size, etc. During the use of a solid state drive, due to the fast data transmission speed and large data volume, and its inherently small size, the heat generated during reading and writing is relatively concentrated on its own main control and NAND storage particles. Under the condition of frequent and large amounts of reading and writing, heat accumulation is likely to occur and the temperature remains high. Therefore, strict high and low temperature tests are usually carried out during the production and testing of solid state drives. However, because a solid state drive generates a large amount of heat during use, when the solid state drive is connected to the test equipment and put into the test chamber, the large amount of heat generated by the solid state drive under the test state has a great impact on the temperature in the test chamber, resulting in a relatively high local temperature near the solid state drive and a relatively low temperature far from the solid state drive, and the temperature uniformity in the test chamber cannot be guaranteed.

[0003] The invention patent with the publication number of CN111330653A discloses a novel environmental test chamber for improving temperature uniformity, including a test chamber body, a blower, an air conditioner, an air conditioner front panel, a wind guide plate, a blowing plate, and a lower air outlet; the blower penetrates through the upper end on the left side of the test chamber body; the air conditioner is arranged below the blower, and an air conditioner front panel is arranged on the right outer wall of the air conditioner; the air conditioner front panel and the blower form an air supply port, and the air conditioner front panel and the bottom end of the test chamber body form a return air port; the wind guide plate is arranged at the air supply port; the blowing plate is arranged on the right side of the wind guide plate and forms a lower air outlet with the air conditioner front panel.

[0004] However, if a solid state drive is placed in the novel environmental test chamber of this invention, the heat of the solid state drive located upstream of the air flow path is brought to the vicinity of the solid state drive located downstream of the air flow path to form reheating of the solid state drive located downstream of the air flow path, and heat continues to accumulate. That is, the temperature of the area of the solid state drive located upstream of the air flow path is always lower than that of the solid state drive located downstream of the air flow path, and the temperature is always uneven. The temperature uniformity in the test chamber still cannot be guaranteed. Summary of the Invention

[0005] In view of the above-mentioned disadvantages of the prior art, the object of the present invention is to provide a high-temperature and low-temperature aging test machine for solid-state drives with high uniformity and high precision, which is used to solve the problems that a large amount of heat is generated during the test of solid-state drives in the prior art, resulting in uneven temperature in the test chamber, and the heat of the solid-state drive located upstream of the air path is brought to the vicinity of the solid-state drive located downstream of the air path, forming re-heating of the solid-state drive located downstream of the air path.

[0006] To achieve the above object and other related objects, the present invention provides a high-temperature and low-temperature aging test machine for solid-state drives with high uniformity and high precision, including:

[0007] A box body;

[0008] Two test chambers for placing solid-state drives, symmetrically arranged in the box body, and filter air holes are uniformly arranged on the left and right side walls of each test chamber, forming a rectangular space that is not ventilated up, down, front, and back and is ventilated on the left and right sides;

[0009] An air inlet air duct arranged on one side of each test chamber and an air outlet air duct arranged on the other side of each test chamber. The lower part of the air inlet air duct is sealed, and the upper part of the air outlet air duct is sealed. The test chamber is communicated with the corresponding air inlet air duct and air outlet air duct through the filter air holes on the left and right side walls;

[0010] A blower arranged above each test chamber. The air outlet of each blower is communicated with the upper part of the corresponding air inlet air duct, and a return air duct is connected to the air inlet of each blower;

[0011] A temperature control chamber arranged at the lower part of the box body, and the temperature control chamber is respectively communicated with each air outlet air duct and each return air duct;

[0012] The blower blows out hot air, which enters the test chamber through the air inlet air duct and flows out to the air outlet air duct, then the temperature of the air is adjusted in the temperature control chamber, enters the return air duct and returns to the blower, forming an air path circulation.

[0013] By adopting the above technical solution, the hot air can only pass through the air filter holes on the left and right side walls of the test chamber. The direction of the hot air passing through the test chamber is single, from one side wall of the test chamber to the other side wall. The hot air passing through the solid-state drive located above will not flow to the solid-state drive located below, and at the same time, the hot air passing through the solid-state drive located below will not flow to the solid-state drive located above. The solid-state drives at each height position are traversed by the hot air once, preventing the situation where the upstream air temperature affects the downstream air temperature due to inconsistent temperatures in the upstream and downstream of the air path, resulting in continuous heat accumulation; the hot air is output from the blower, enters the test chamber through the air inlet duct and flows out to the air outlet duct, then the air temperature is adjusted in the temperature adjustment chamber, enters the return air duct and returns to the blower, forming an air path circulation, further improving the temperature uniformity and temperature accuracy in the test chamber; since the hot air can only enter and exit the test chamber through the air filter holes on the left and right side walls of the test chamber, combined with the characteristics of the uniform distribution of the air filter holes, the uniformity of the hot air entering and exiting the test chamber is improved, further improving the temperature uniformity in the test chamber.

[0014] In an embodiment of the present invention, the aperture of the air filter holes from top to bottom of each test chamber gradually increases.

[0015] By adopting the above technical solution, the upper part of the air inlet duct is close to the air outlet of the blower. Combining with the characteristic that hot air naturally rises, the air pressure from top to bottom of the air inlet duct gradually decreases. The aperture of the air filter holes at the upper part with larger air pressure is set smaller, and the aperture of the air filter holes at the lower part with smaller air pressure is set larger. Then the air volume from top to bottom passing through the test chamber is consistent, ensuring that the heating effects on the solid-state drives at different heights are the same, and further improving the temperature uniformity at different height positions in the test chamber.

[0016] In an embodiment of the present invention, a plurality of air filter plate groups are arranged on the side wall of the test chamber from top to bottom; each air filter plate group includes: a first combined plate arranged on one side of the air filter plate group, and a second combined plate arranged on the other side of the air filter plate group and exactly the same as the first combined plate; ventilation holes are uniformly arranged on the first combined plate and the second combined plate in one-to-one correspondence; a corresponding group of the first combined plate and the second combined plate are arranged in a staggered manner, and the ventilation holes at the corresponding positions on the first combined plate and the second combined plate are staggered and overlapped to form air filter holes with an aperture smaller than that of the ventilation holes. The staggered distance of a group of the first combined plate and the second combined plate from top to bottom gradually increases.

[0017] By adopting the above technical solution, the first combined plate and the second combined plate are staggered and overlapped. The smaller the staggered distance, the larger the overlapping part of the ventilation holes at the corresponding positions, that is, the larger the aperture of the formed air filter holes; the larger the staggered distance, the smaller the overlapping part of the ventilation holes at the corresponding positions, that is, the smaller the aperture of the formed air filter holes; each air filter plate group from top to bottom is adjusted separately, so that the staggered distance of a group of the first combined plate and the second combined plate from top to bottom gradually increases, realizing the situation where the aperture of the air filter holes from top to bottom gradually increases.

[0018] In an embodiment of the present invention, a number of brackets for placing solid-state drives are arranged in parallel from top to bottom in each test chamber. Each bracket includes: a support frame, a number of trays fixedly arranged on the support frame from top to bottom, and test interfaces arranged at the rear of each tray and plugged into the solid-state drives; the trays correspond to the solid-state drives one by one.

[0019] By adopting the above technical solution, the solid-state drives are arranged in multiple layers from top to bottom in the bracket, and there is only one column of solid-state drives in the longitudinal space. The hot air passing through one solid-state drive will not pass through another solid-state drive, and the heat generated during the test of one solid-state drive will not affect another solid-state drive, further preventing the situation of continuous heat accumulation caused by the upstream air temperature affecting the downstream air temperature due to inconsistent temperatures in the upstream and downstream of the air path; a relatively large number of solid-state drives can be placed in a single test, ensuring the temperature uniformity in the test chamber while improving the working efficiency of the solid-state drive test; plugging each solid-state drive into each test interface improves the convenience of loading during the solid-state drive test.

[0020] In an embodiment of the present invention, each of the trays is made of a heat-conducting material, and aluminum alloy can be used.

[0021] By adopting the above technical solution, the heat generated during the solid-state drive test is quickly conducted to the tray, preventing the situation of excessive heat concentration leading to too high local temperature, and further improving the temperature uniformity in the test chamber.

[0022] In an embodiment of the present invention, a test chamber is arranged at the rear of the test chamber, and a test equipment group connected to each test interface is arranged in the test chamber.

[0023] By adopting the above technical solution, it is convenient to access and install the test equipment group, improving the convenience during the test.

[0024] In an embodiment of the present invention, each of the return air ducts is arranged at the gap between two test chambers.

[0025] In an embodiment of the present invention, the temperature adjustment chamber includes: a first input port communicating with the lower part of one air outlet duct, a second input port communicating with the lower part of the other air outlet duct, an output port communicating with the lower parts of both return air ducts, and a temperature adjustment equipment group for adjusting the temperature in the temperature adjustment chamber. The temperature adjustment equipment group includes an evaporator for refrigeration and a heater for heating.

[0026] By adopting the above technical solution, the air flowing through the two test chambers flows into the temperature adjustment chamber from the air outlet duct, and after the air temperature is adjusted by the temperature adjustment equipment group, it then flows back to the blower through the return air duct for the next round of hot air circulation. The two test chambers share one temperature adjustment chamber, and there is no need to separately set a set of temperature adjustment equipment group for each test chamber, reducing the equipment cost.

[0027] As described above, a high and low temperature aging test machine for solid state drives with high uniformity and high precision of the present invention has the following beneficial effects:

[0028] 1. Hot air is output from the blower, enters the test chamber through the air inlet duct and flows out to the air outlet duct, then the air temperature is adjusted in the temperature adjustment chamber, enters the return air duct and returns to the blower to form an air path circulation, further improving the temperature uniformity and temperature precision in the test chamber;

[0029] 2. The hot air can only pass through the air filtering holes on the left and right side walls of the test chamber, and the wind direction passing through the test chamber is single from one side wall of the test chamber to the other side wall. The wind passing through the solid state drive located above will not flow to the solid state drive located below, and at the same time, the wind passing through the solid state drive located below will not flow to the solid state drive located above. The solid state drives at each height position are traversed by the hot air once, preventing the situation that the upstream air temperature affects the downstream air temperature due to inconsistent temperatures in the upstream and downstream of the air path, resulting in continuous heat accumulation;

[0030] 3. Since the hot air can only enter and exit the test chamber through the air filtering holes on the left and right side walls of the test chamber, combined with the characteristics of the uniform distribution of the air filtering holes, the uniformity of the hot air entering and exiting the test chamber is improved, further improving the temperature uniformity in the test chamber;

[0031] 4. The adjustment of the air filtering holes at different height positions is realized by the staggered overlap of the first combined plate and the second combined plate, so that the aperture of the air filtering holes from top to bottom gradually increases. The aperture of the air filtering holes at the upper height with larger air pressure is set smaller, and the aperture of the air filtering holes at the lower height with smaller air pressure is set larger. Then the air volume from top to bottom passing through the test chamber is consistent, ensuring that the heating effects on the solid state drives at different heights are the same, and further improving the temperature uniformity at different height positions in the test chamber;

[0032] 5. The solid state drives are arranged in multiple layers from top to bottom in the bracket, and there is only one column of solid state drives in the longitudinal space. The hot air passing through one solid state drive will not pass through another solid state drive, and the heat generated during the test of one solid state drive will not affect another solid state drive, further preventing the situation that the upstream air temperature affects the downstream air temperature due to inconsistent temperatures in the upstream and downstream of the air path, resulting in continuous heat accumulation;

[0033] 6. A relatively large number of solid state drives can be placed from top to bottom in a single test, ensuring the temperature uniformity in the test chamber while improving the working efficiency of the solid state drive test;

[0034] 7. The air flowing through the two test chambers flows into the temperature adjustment chamber from the air outlet duct, and after the air temperature is adjusted by the temperature adjustment equipment group, it then returns to the blower from the return air duct for the next round of hot air circulation. The two test chambers share one temperature adjustment chamber, and there is no need to set a set of temperature adjustment equipment group for each test chamber separately, reducing the equipment cost. Brief Description of the Drawings

[0035] Figure 1 It shows a schematic internal structure diagram of the main perspective of a high - uniformity and high - precision high - and low - temperature aging test machine for solid - state drives disclosed in an embodiment of the present invention.

[0036] Figure 2 It shows a schematic structural diagram of the air - filtering plate group of a high - uniformity and high - precision high - and low - temperature aging test machine for solid - state drives disclosed in an embodiment of the present invention.

[0037] Figure 3 It shows a schematic structural diagram of the bracket of a high - uniformity and high - precision high - and low - temperature aging test machine for solid - state drives disclosed in an embodiment of the present invention.

[0038] Figure 4 It shows a schematic internal structure diagram of the side perspective of a high - uniformity and high - precision high - and low - temperature aging test machine for solid - state drives disclosed in an embodiment of the present invention.

[0039] Description of the Reference Numerals

[0040] 1 - Cabinet; 2 - Test chamber; 21 - Air - filtering holes; 22 - Air - filtering plate group; 221 - First combined plate; 222 - Second combined plate; 223 - Ventilation holes; 3 - Inlet air duct; 4 - Outlet air duct; 5 - Blower; 51 - Air outlet; 52 - Air inlet; 6 - Return air duct; 7 - Temperature - regulating chamber; 71 - First input port; 72 - Second input port; 73 - Output port; 8 - Bracket; 81 - Support frame; 82 - Tray; 83 - Test interface; 9 - Test cavity. Detailed Embodiments

[0041] The following specific embodiments illustrate the implementation manners of the present invention. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification.

[0042] Please refer to Figures 1 to 4 . It should be noted that the structures, ratios, sizes, etc. shown in the drawings of this specification are only used to cooperate with the content disclosed in the specification for those skilled in the art to understand and read, and are not used to limit the limiting conditions for the implementation of the present invention. Therefore, they do not have technical essential significance. Any modification of the structure, change of the proportional relationship, or adjustment of the size, without affecting the effects that the present invention can produce and the purposes that can be achieved, should still fall within the scope that can be covered by the technical content disclosed in the present invention. At the same time, the terms such as "upper", "lower", "left", "right", "middle", and "one" cited in this specification are only for the convenience of clear narration, and are not used to limit the scope for the implementation of the present invention. The change or adjustment of their relative relationships, without substantial change in the technical content, should also be regarded as the scope within which the present invention can be implemented.

[0043] Please refer to Figures 1-4 , the present invention provides a high and low temperature aging test machine for solid state drives with high uniformity and high precision, comprising:

[0044] A box body 1;

[0045] Two test chambers 2 for placing solid state drives, symmetrically arranged in the box body 1. Filter holes 21 are uniformly arranged on the left and right side walls of each test chamber 2, forming a rectangular space that is not ventilated up, down, front, and back and is ventilated on the left and right sides;

[0046] An air inlet duct 3 arranged on one side of each test chamber 2 and an air outlet duct 4 arranged on the other side of each test chamber 2. The lower part of the air inlet duct 3 is sealed, and the upper part of the air outlet duct 4 is sealed. The test chamber 2 is communicated with the corresponding air inlet duct 3 and air outlet duct 4 through the filter holes 21 on the left and right side walls;

[0047] A blower 5 arranged above each test chamber 2. The air outlet 51 of each blower 5 is communicated with the upper part of the corresponding air inlet duct 3, and the air inlet 52 of each blower 5 is connected with a return air duct 6;

[0048] A temperature control chamber 7 arranged at the lower part of the box body 1. The temperature control chamber 7 is respectively communicated with each air outlet duct 4 and each return air duct 6;

[0049] The blower 5 blows out hot air, which enters the test chamber 2 through the air inlet duct 3 and flows out to the air outlet duct 4, then the temperature of the air is adjusted by the temperature control chamber 7, enters the return air duct 6 and returns to the blower 5, forming an air path circulation;

[0050] The hot air can only pass through the filter holes 21 on the left and right side walls of the test chamber 2. The direction of the hot air passing through the test chamber 2 is single, from one side wall of the test chamber 2 to the other side wall. The hot air passing through the solid state drive located above will not flow to the solid state drive located below, and at the same time, the hot air passing through the solid state drive located below will not flow to the solid state drive located above. The solid state drives at each height position are traversed by the hot air once, preventing the situation that the temperature of the upstream air affects the temperature of the downstream air due to inconsistent temperatures in the upstream and downstream of the air path, resulting in continuous heat accumulation; The hot air is output from the blower 5, enters the test chamber 2 through the air inlet duct 3 and flows out to the air outlet duct 4, then the temperature of the air is adjusted by the temperature control chamber 7, enters the return air duct 6 and returns to the blower 5, forming an air path circulation, further improving the temperature uniformity and temperature precision in the test chamber 2; Since the hot air can only enter and exit the test chamber 2 through the filter holes 21 on the left and right side walls of the test chamber 2, combined with the uniform distribution characteristics of the filter holes 21, the uniformity of the hot air entering and exiting the test chamber 2 is improved, further improving the temperature uniformity in the test chamber 2.

[0051] The aperture of the air filtering holes 21 of each test chamber 2 gradually increases from top to bottom. The upper part of the air inlet duct 3 is relatively close to the air outlet 51 of the blower 5. Considering the characteristic that hot air naturally rises, the air pressure of the air inlet duct 3 gradually decreases from top to bottom. The aperture of the air filtering holes 21 at the position with a relatively higher height and a relatively larger air pressure is set to be smaller, and the aperture of the air filtering holes 21 at the position with a relatively lower height and a relatively smaller air pressure is set to be larger. Then, the air volume passing through the test chamber 2 from top to bottom is consistent, ensuring that the heating effects on the solid-state drives at different heights are the same, and further improving the temperature uniformity at different height positions in the test chamber 2.

[0052] A plurality of air filtering plate groups 22 are arranged on the side wall of the test chamber 2 from top to bottom; each air filtering plate group 22 includes: a first combined plate 221 arranged on one side of the air filtering plate group 22, and a second combined plate 222 arranged on the other side of the air filtering plate group 22 and exactly the same as the first combined plate 221; ventilation holes 223 are uniformly arranged on the first combined plate 221 and the second combined plate 222 in a one-to-one correspondence; a corresponding set of the first combined plate 221 and the second combined plate 222 are arranged in a staggered manner, and the ventilation holes 223 at the corresponding positions on the first combined plate 221 and the second combined plate 222 are staggered and overlapped to form air filtering holes 21 with an aperture smaller than that of the ventilation holes 223. The staggered distance of a set of the first combined plate 221 and the second combined plate 222 from top to bottom gradually increases; when the first combined plate 221 and the second combined plate 222 are staggered and overlapped, the smaller the staggered distance, the larger the overlapping part of the ventilation holes 223 at the corresponding positions, that is, the larger the aperture of the formed air filtering holes 21; the larger the staggered distance, the smaller the overlapping part of the ventilation holes 223 at the corresponding positions, that is, the smaller the aperture of the formed air filtering holes 21; each air filtering plate group 22 from top to bottom is adjusted independently, so that the staggered distance of a set of the first combined plate 221 and the second combined plate 222 from top to bottom gradually increases, realizing the situation that the aperture of the air filtering holes 21 gradually increases from top to bottom.

[0053] A plurality of brackets 8 for placing solid-state drives are arranged in parallel in each test chamber 2 from top to bottom. Each bracket 8 includes: a support frame 81, a plurality of trays 82 fixedly arranged on the support frame 81 from top to bottom, and a test interface 83 arranged at the rear side of each tray 82 and inserted into the solid-state drive; the trays 82 correspond to the solid-state drives one by one; the solid-state drives are arranged in multiple layers from top to bottom in the bracket 8, and there is only one column of solid-state drives in the longitudinal space. The hot air passing through one solid-state drive will not pass through another solid-state drive, and the heat generated during the test of one solid-state drive will not affect another solid-state drive, further preventing the situation where the upstream air temperature affects the downstream air temperature due to inconsistent temperatures in the upstream and downstream of the air path, resulting in continuous heat accumulation; a relatively large number of solid-state drives can be placed in a single test, ensuring the temperature uniformity in the test chamber 2 while improving the working efficiency of the solid-state drive test; each solid-state drive is inserted into each test interface 83, improving the convenience of loading during the solid-state drive test.

[0054] Each of the trays 82 is made of a heat-conducting material, such as aluminum alloy. The heat generated during the solid-state drive test is quickly conducted to the tray 82, preventing the heat from being too concentrated and causing the local temperature to be too high, and further improving the temperature uniformity in the test chamber 2.

[0055] A test chamber 9 is provided at the rear of the test chamber 2. A test equipment group connected to each test interface 83 is provided in the test chamber 9, which is convenient for accessing and installing the test equipment group and improves the convenience during testing.

[0056] Each of the return air ducts 6 is provided at the gap between two test chambers 2.

[0057] The temperature adjustment chamber 7 includes: a first input port 71 communicating with the lower part of one air outlet duct 4, a second input port 72 communicating with the lower part of the other air outlet duct 4, an output port 73 communicating with the lower parts of two return air ducts 6 at the same time, and a temperature adjustment equipment group for adjusting the temperature in the temperature adjustment chamber 7. The temperature adjustment equipment group includes an evaporator for refrigeration and a heater for heating. The air flowing through the two test chambers 2 flows into the temperature adjustment chamber 7 from the air outlet duct 4, and after the air temperature is adjusted by the temperature adjustment equipment group, it then flows back to the blower 5 through the return air duct 6 for the next round of hot air circulation. The two test chambers 2 share one temperature adjustment chamber 7, and there is no need to separately set a set of temperature adjustment equipment group for each test chamber 2, reducing the equipment cost.

[0058] The working principle of a high-uniformity and high-precision high-low temperature aging test machine for solid-state drives of the present invention is as follows: The hot air can only pass through the air filtration holes 21 on the left and right side walls of the test chamber 2. The direction of the hot air passing through the test chamber 2 is single, from one side wall of the test chamber 2 to the other side wall. The air passing through the solid-state drive located above will not flow to the solid-state drive located below, and at the same time, the air passing through the solid-state drive located below will not flow to the solid-state drive located above. The solid-state drives at each height position are traversed by the hot air once, preventing the situation that the upstream air temperature affects the downstream air temperature due to inconsistent temperatures in the upstream and downstream of the air path and causing continuous heat accumulation. By using the staggered overlap of the first combination plate 221 and the second combination plate 222 to adjust the air filtration holes 21 at different height positions, the aperture of the air filtration holes 21 from top to bottom gradually increases. The aperture of the air filtration holes 21 at the upper part with higher height and larger air pressure is set smaller, and the aperture of the air filtration holes 21 at the lower part with lower height and smaller air pressure is set larger. Then the air volume from top to bottom passing through the test chamber 2 is consistent, ensuring that the heating effects received by the solid-state drives at different heights are the same, and further improving the temperature uniformity at different height positions in the test chamber 2. The control accuracy of the embodiment of the present invention can reach ±0.5°C, and the resolution accuracy is 0.01°C.

[0059] In summary, in the present invention, hot air is output from the blower 5, enters the test chamber 2 through the air inlet duct 3 and then flows out to the air outlet duct 4, and then the air temperature is adjusted in the temperature adjustment chamber 7, enters the return air duct 6 and returns to the blower 5 to form an air path circulation, further improving the temperature uniformity in the test chamber 2; the hot air can only pass through the air filtering holes 21 on the left and right side walls of the test chamber 2, and the direction of the hot air passing through the test chamber 2 is single, from one side wall of the test chamber 2 to the other side wall. The air passing through the solid-state drive located above will not flow to the solid-state drive located below, and at the same time, the air passing through the solid-state drive located below will not flow to the solid-state drive located above. The solid-state drives at each height position are traversed by the hot air once, preventing the situation where the temperature of the upstream air affects the temperature of the downstream air due to inconsistent temperatures in the upstream and downstream of the air path, resulting in continuous heat accumulation; since the hot air can only enter and exit the test chamber 2 through the air filtering holes 21 on the left and right side walls of the test chamber 2, combined with the characteristics of the uniform distribution of the air filtering holes 21, the uniformity of the hot air entering and exiting the test chamber 2 is improved, further improving the temperature uniformity in the test chamber 2. Therefore, the present invention effectively overcomes various disadvantages in the prior art and has high industrial utilization value.

[0060] The above embodiments are only illustrative of the principles and effects of the present invention, and are not intended to limit the present invention. Any person familiar with this technology can modify or change the above embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or changes made by those with ordinary knowledge in the technical field without departing from the spirit and technical idea disclosed by the present invention should still be covered by the claims of the present invention.

Claims

1. A high and low temperature aging test machine for solid state drives with high uniformity and high precision, characterized in that, Comprising: A box body (1); Two test chambers (2) for placing solid-state drives, symmetrically arranged within the box body (1), with air filter holes (21) evenly arranged on the left and right side walls of each test chamber (2), forming a rectangular space that is not ventilated in the up, down, front, and back directions but ventilated on the left and right sides; An air inlet duct (3) arranged on one side of each test chamber (2) and an air outlet duct (4) arranged on the other side of each test chamber (2), the lower part of the air inlet duct (3) is sealed, the upper part of the air outlet duct (4) is sealed, and the test chamber (2) communicates with the corresponding air inlet duct (3) and air outlet duct (4) through the air filter holes (21) on the left and right side walls; A blower (5) arranged above each test chamber (2), the air outlet (51) of each blower (5) communicates with the upper part of the corresponding air inlet duct (3), and an air return duct (6) is connected to the air inlet (52) of each blower (5); A temperature control chamber (7) arranged at the lower part of the box body (1), and the temperature control chamber (7) communicates with each air outlet duct (4) and each air return duct (6) respectively; The blower (5) blows out hot air, which enters the test chamber (2) through the air inlet duct (3) and then flows out to the air outlet duct (4), and then the air temperature is adjusted through the temperature control chamber (7), enters the air return duct (6) and returns to the blower (5), forming an air path circulation, The apertures of the air filter holes (21) of each test chamber (2) gradually increase from top to bottom.

2. The high and low temperature aging test machine for solid state drives with high uniformity and high precision according to claim 1, characterized in that: A plurality of air filter plate groups (22) are arranged on the side wall of the test chamber (2) from top to bottom; each air filter plate group (22) includes: a first combined plate (221) arranged on one side of the air filter plate group (22), and a second combined plate (222) arranged on the other side of the air filter plate group (22) and identical to the first combined plate (221); ventilation holes (223) are evenly arranged on the first combined plate (221) and the second combined plate (222) in one-to-one correspondence; a corresponding set of the first combined plate (221) and the second combined plate (222) are arranged in a staggered manner, and the ventilation holes (223) at the corresponding positions on the first combined plate (221) and the second combined plate (222) are staggered and overlapped to form an air filter hole (21) with an aperture smaller than that of the ventilation hole (223), and the staggered distance of a set of the first combined plate (221) and the second combined plate (222) from top to bottom gradually increases.

3. The high and low temperature aging test machine for solid state drives with high uniformity and high precision according to claim 2, wherein: A plurality of brackets (8) for placing solid-state drives are arranged in parallel from top to bottom in each test chamber (2), and each bracket (8) includes: a support frame (81), a plurality of trays (82) fixedly arranged on the support frame (81) from top to bottom, and a test interface (83) arranged at the rear of each tray (82) and inserted with the solid-state drive; the trays (82) correspond to the solid-state drives one by one.

4. A high and low temperature aging test machine for solid state drives with high uniformity and high precision according to claim 3, characterized in that: The texture of each tray (82) is a heat-conducting material.

5. A high and low temperature aging test machine for solid state drives with high uniformity and high precision according to claim 3, characterized in that: A test chamber (9) is arranged at the rear of the test chamber (2), and a test equipment group connected to each test interface (83) is arranged in the test chamber (9).

6. The high and low temperature aging test machine for solid state drives with high uniformity and high precision according to claim 1, characterized in that: Each air return duct (6) is arranged at the gap between the two test chambers (2).

7. A high-low temperature aging test machine for solid-state drives with high uniformity and high precision according to claim 6, characterized in that: The temperature adjustment chamber (7) includes: a first input port (71) communicating with the lower part of an air outlet duct (4), a second input port (72) communicating with the lower part of another air outlet duct (4), an output port (73) communicating with the lower parts of two return air ducts (6) simultaneously, and a temperature adjustment equipment group for adjusting the temperature inside the temperature adjustment chamber (7).

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