A fool-proof testing method, system and computer terminal for light-emitting diodes

Abstract

The present invention provides a foolproof test method for light emitting diodes, comprising the following steps: S1: turning off multiple light emitting diode light signals; S2: generating a multi-bit array code according to the number of the multiple light emitting diode light signals, wherein the number of the multi-bit array code is the same as the number of the multiple light emitting diode light signals; S3: lighting up one of the multiple light emitting diode light signals one by one according to the order of the multi-bit array code; S4: after lighting up one of the multiple light emitting diode light signals, obtaining the light emitting diode state test program code corresponding to the lighted light emitting diode light signal under test, judging whether the light emitting diode state test program code matches the lighted light emitting diode light signal under test, if so, lighting up the next light emitting diode light signal of the multiple light emitting diode light signals, if not, prompting the light emitting diode state test program code reporting an error. The foolproof test method provided by the present invention solves the problem of foolproofing and reduces the influence of human factors on the test results.

Description

Technical Field

[0001] The present invention relates to the technical field of fool-proof testing, and in particular to a fool-proof testing method, system and computer terminal for light emitting diodes. Background Art

[0002] Generally speaking, the Light Emitting Diode (LED) lamp test procedure is just to light up and turn off all LED lamps, which is completely dependent on manual judgment and is basically not foolproof. The test results are greatly affected by human factors. Summary of the invention

[0003] In view of the above problems, the present invention provides a fool-proof testing method, system and computer terminal for light emitting diodes (LEDs), which are used to improve the problem of test results being misjudged by personnel.

[0004] In order to achieve the above object, the present invention adopts the following technical solution:

[0005] In a first aspect, the present invention provides a foolproof testing method for a light emitting diode, the foolproof testing method comprising the following steps:

[0006] S1: Turn off multiple LED lights;

[0007] S2: generating a multi-bit array code according to the number of the plurality of LED light signals, wherein the number of the multi-bit array code is the same as the number of the plurality of LED light signals;

[0008] S3: lighting up one of the plurality of light emitting diode signals one by one according to the sequence of the multi-digit code; and

[0009] S4: After lighting up one of the multiple LED light signals, obtain the LED status test program code corresponding to the tested LED light signal that lights up, and determine whether the LED status test program code matches one of the multiple LED light signals that lights up. If so, light up the next LED light signal of the multiple LED light signals. If not, prompt the LED status test program code that reports an error.

[0010] As an optional implementation, before S1 turns off the multiple LED lights, the foolproofing test method further includes the following steps:

[0011] Suspends the embedded controller's test mode for multiple light emitting diode (LED) signals.

[0012] As an optional implementation, in S2, a multi-bit array code is generated according to the number of the plurality of LED light signals, wherein the number of the multi-bit array code is the same as the number of the plurality of LED light signals, the foolproofing test method further comprises the following steps:

[0013] The generated multi-digit array code is a random and non-repeating multi-digit array code.

[0014] As an optional implementation, after one of the multiple LED light signals is lit up in S4, an LED state test program code corresponding to the tested LED light signal that is lit up is obtained, and it is determined whether the LED state test program code matches one of the multiple LED light signals that are lit up. If so, the next LED light signal of the multiple LED light signals is lit up. If not, the LED state test program code that prompts an error is used. The foolproof test method further includes the following steps:

[0015] After lighting up one of the multiple LED light signals, obtain the LED state test program code with the universal input and output corresponding address corresponding to the lit LED light signal under test or obtain the LED state test program code with the computer memory corresponding address corresponding to the lit LED light signal under test.

[0016] As an optional implementation, after one of the multiple LED lights is turned on in S4, an LED state test program code corresponding to the tested LED light that is turned on is obtained, and it is determined whether the LED state test program code matches one of the multiple LED lights that are turned on. If so, the next LED light of the multiple LED lights is turned on. If not, after prompting the LED state test program code that reports an error, the foolproof test method further includes the following steps:

[0017] Determine whether all the tests of the multiple LED lights have been completed. If so, clear the LED status test program code corresponding to the tested LED light that is lit, and exit the mode of determining whether the LED status test program code matches one of the multiple LED lights that are lit, and restore the embedded controller to update the test mode of the multiple LED lights in real time according to the current system state. If not, return to S3 to light up one of the multiple LED lights one by one according to the order of the multi-bit array code.

[0018] In a second aspect, the present invention provides a foolproof testing system for LEDs, the foolproof testing system comprising:

[0019] A control circuit, the control circuit is used to turn off multiple LED lights;

[0020] A calculation circuit, wherein the calculation circuit generates a multi-bit array code according to the number of the plurality of LED light numbers, wherein the number of the multi-bit array code is the same as the number of the plurality of LED light numbers;

[0021] A driving circuit, the driving circuit lighting up one of the plurality of LED light signals one by one according to the sequence of the multi-digit array code; and

[0022] The processing circuit is electrically connected to the control circuit, the calculation circuit and the calculation circuit. After lighting up one of the multiple LED light signals, the processing circuit obtains the LED status test program code corresponding to the tested LED light signal that is lit up, and determines whether the LED status test program code matches one of the multiple LED light signals that are lit up. If so, the next LED light signal of the multiple LED light signals is lit up. If not, the LED status test program code that prompts an error is displayed.

[0023] As an optional implementation, the foolproofing test system further includes:

[0024] The embedded circuit is electrically connected to the processing circuit, and is used for suspending the test mode of the embedded controller for multiple LED light signals.

[0025] As an optional implementation, the foolproofing test system further includes:

[0026] A generating circuit is electrically connected to the processing circuit, and the generating circuit is used to generate a random and non-repetitive multi-bit array code;

[0027] An acquisition circuit is electrically connected to the processing circuit. The acquisition circuit is used to acquire an LED state test program code having a universal input and output corresponding address corresponding to the tested LED light signal that is lit, or to acquire an LED state test program code having a computer memory corresponding address corresponding to the tested LED light signal that is lit, after one of the multiple LED light signals is lit.

[0028] As an optional implementation, the foolproofing test system further includes:

[0029] The judgment circuit is electrically connected to the processing circuit. The judgment circuit is used to judge whether all the tests of the multiple LED lights have been completed. If so, the LED status test program code corresponding to the tested LED light that is lit is cleared, and the judgment LED status test program code is exited to determine whether the mode matches one of the multiple LED lights that are lit, and the embedded controller is restored to update the test mode of the multiple LED lights in real time according to the current system state. If not, return to S3 to light up one of the multiple LED lights one by one according to the order of the multi-bit array code.

[0030] In a third aspect, the present invention provides a computer terminal, including a memory and a processor, wherein the memory is used to store a computer program, and the processor runs the computer program to enable the computer terminal to execute the aforementioned fool-proofing test method for LEDs.

[0031] In summary, according to the present invention, a foolproof test method for a light emitting diode (LED) is provided, comprising the following steps: S1: turning off a plurality of LED light signals; S2: generating a multi-bit array code according to the number of the plurality of LED light signals, wherein the number of the multi-bit array code is the same as the number of the plurality of LED light signals; S3: lighting up one of the plurality of LED light signals one by one according to the order of the multi-bit array code; S4: after lighting up one of the plurality of LED light signals, obtaining an LED state test program code corresponding to the lighted LED light signal under test, determining whether the LED state test program code matches one of the lighted LED light signals, if so, lighting up the next LED light signal of the plurality of LED light signals, if not, prompting an LED state test program code reporting an error.

[0032] The foolproof test method provided by the present invention solves the foolproof problem, reduces the influence of human factors on the test results, and can extend the technical solution of the foolproof test method to other models by simply modifying the corresponding GPIO and / or Register address.

[0033] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, preferred embodiments are given below and described in detail with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope of the present invention.

[0035] Figure 1 It is a flow chart of the fool-proof testing method for LED provided in Example 1 of the present invention.

[0036] Figure 2 Schematic diagram of a circuit for a foolproof testing system for LEDs provided in Embodiment 2 of the present invention. DETAILED DESCRIPTION

[0037] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. The components of the embodiments of the present invention generally described and shown in the drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present invention provided in the drawings is not intended to limit the scope of the claimed invention, but merely represents the selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making creative work belong to the scope of protection of the present invention.

[0038] Example 1

[0039] Please also see Figure 1 , Figure 1 1 is a flow chart of a foolproof testing method for light emitting diodes (LEDs) (hereinafter referred to as “foolproof testing method”) provided in Example 1 of the present invention. Figure 1 As shown, the foolproof test method includes the following steps:

[0040] S1: Turn off multiple light emitting diode (LED) lights.

[0041] In one embodiment, the foolproofing test method proposed in the present invention can be applied to the LED light test program of B360 (for example, Intel B360 ATX gaming motherboard equipped with Aura Sync LED lighting effect). B360 mainly has 5 LED lights, namely PowerLED, Battery LED, CAPs LED, NumLK LED, RF LED, among which Battery LED has two light signals, red and green, and the rest are green, so B360 mainly has 6 light signals. First, turn off all LED light signals, and then enter the foolproofing test step. Before S1, S0: Pause the embedded controller's test mode for multiple LED light signals to clear the program and not affect the current foolproofing test function. In addition, the embedded controller (EC, Embedded Controller), the embedded controller is a control system used to execute specified independent control functions and has the ability to process data in a complex manner. Because the EC will update the LED light signal according to the system status, so as not to affect the control of the LED by the foolproofing test method of the present invention.

[0042] S2: Generate a multi-bit array code according to the number of the plurality of LED light numbers, wherein the number of the multi-bit array code is the same as the number of the plurality of LED light numbers.

[0043] In one embodiment, the generated multi-bit array code is a random non-repeating multi-bit array code. In other words, when applied to B360, a random non-repeating 6-bit array is generated. The number of the multi-bit array code is used to control the order in which each LED light gradually lights up. It is not like an embedded controller that uses a fixed update mode to detect whether the functions of the Power LED, Battery LED, CAPs LED, NumLK LED, and RF LED of B360 are normal. This solution proposes to use a random non-repeating multi-bit array code for testing, which can improve test efficiency and avoid the previous technology that wastes a lot of time by constantly updating the test method.

[0044] S3: Light up one of the multiple LED lights one by one according to the order of the multi-digit code.

[0045] In one embodiment, the foolproof test method is applied to B360, and the six lights are lit one by one without duplication and in sequence. In other words, the Power LED, Battery LED, CAPs LED, NumLK LED, and RF LED lights are lit one by one, and then wait for the tester to judge the response.

[0046] S4: After lighting up one of the multiple LED light signals, obtain the LED status test program code corresponding to the tested LED light signal that lights up, and determine whether the LED status test program code matches one of the multiple LED light signals that light up. If so, enter S41: light up the next LED light signal of the multiple LED light signals. If not, enter S43: prompt the LED status test program code for an error.

[0047] In one embodiment, the present invention proposes that after lighting up one of the multiple LED light signals, the tester checks one of the names of the corresponding tested Power LED, Battery LED, CAPs LED, NumLK LED, and RF LED, and then obtains the LED status test program code with the corresponding general input and output address corresponding to the tested LED light signal that is lit, or obtains the LED status test program code with the corresponding address of the computer memory corresponding to the tested LED light signal that is lit.

[0048] Furthermore, the LED status test program code at the corresponding address of the general-purpose input / output (GPIO, General-purpose input / output, the function is similar to P0-P3 of 8051, and its pins can be freely used by the user through program control) and the LED status test program code at the corresponding address of the computer memory (Register is the computer memory used to temporarily store instructions, data and addresses in the central processing unit) can be conveniently recorded in the memory, and the state of the LED at the corresponding address can be matched with the displayed light signal.

[0049] In one embodiment, after S41, S5: determine whether all the tests of multiple LED lights have been completed. If so, enter S51: clear and obtain the LED status test program code corresponding to the LED light number under test, and exit the mode of determining whether the LED status test program code matches one of the multiple LED lights that are lit, and restore the test mode of the embedded controller to update the multiple LED lights in real time according to the current system state. If not, return to S3 to light up one of the multiple LED lights one by one according to the order of the multi-bit array code. In other words, each time one of the Power LED, Battery LED, CAPs LED, NumLK LED, and RFLED light name is lit, the tester needs to check the corresponding LED name. For example, there are two results after matching the mode. If it is correct, the next light number will be displayed until all LED light numbers are tested. If it is wrong, an error will be prompted and an error code will be returned (which can be regarded as an LED status test program code that prompts an error). For example, after all six light signals of B360 are tested correctly, clear the control made by the previous software tool, gradually adjust all Power LEDs, Battery LEDs, CAPs LEDs, NumLK LEDs, and RFLEDs from the lowest brightness to the highest brightness, restore the embedded controller to control the LEDs, and update the LEDs in real time according to the current system status.

[0050] The fool-proof testing method proposed by the present invention can avoid human errors through the function of automatic testing of random codes, thereby increasing the efficiency, accuracy and timeliness of LED testing.

[0051] Example 2

[0052] See also Figure 2 , Figure 2 1 is a circuit diagram of a foolproof test system for light emitting diodes (LEDs) (hereinafter referred to as “foolproof test system”) provided in Embodiment 2 of the present invention. For example, the control circuit 210, the calculation circuit 220, the drive circuit 230, the processing circuit 240, the embedding circuit 250, the generation circuit 260, the acquisition circuit 270 and the judgment circuit 280 may be integrated on one or more circuit boards.

[0053] The foolproof test system 200 comprises:

[0054] A control circuit 210, the control circuit 210 is used to turn off multiple LED lights;

[0055] A calculation circuit 220, the calculation circuit 220 generates a multi-bit array code according to the number of the plurality of LED light numbers, wherein the number of the multi-bit array code is the same as the number of the plurality of LED light numbers;

[0056] A driving circuit 230, the driving circuit 230 lights up one of the plurality of LED light signals one by one according to the sequence of the multi-bit array code;

[0057] The processing circuit 240 is electrically connected to the control circuit 210, the calculation circuit 220 and the calculation circuit 230. After lighting up one of the multiple LED light signals, the processing circuit 240 obtains the LED status test program code corresponding to the tested LED light signal that is lit up, and determines whether the LED status test program code matches one of the multiple LED light signals that are lit up. If so, the next LED light signal of the multiple LED light signals is lit up. If not, the LED status test program code that prompts an error is prompted.

[0058] In one embodiment, the foolproof testing system 200 further includes:

[0059] The embedded circuit 250 is electrically connected to the processing circuit 240 . The embedded circuit 250 is used to suspend the test mode of the embedded controller for the multiple LED light signals.

[0060] In one embodiment, the foolproof testing system 200 further includes:

[0061] The generating circuit 260 is electrically connected to the processing circuit 240, and the generating circuit 260 is used to generate a random and non-repetitive multi-bit array code;

[0062] The acquisition circuit 270 is electrically connected to the processing circuit 240. The acquisition circuit 270 is used to acquire the LED status test program code with the universal input and output corresponding address corresponding to the tested LED light signal that is lit, or acquire the LED status test program code with the computer memory corresponding address corresponding to the tested LED light signal that is lit, after one of the multiple LED light signals is lit.

[0063] In one embodiment, the foolproof testing system 200 further includes:

[0064] The judgment circuit 280 is electrically connected to the processing circuit 240. The judgment circuit 280 is used to judge whether all the tests of the multiple LED lights have been completed. If so, the LED status test program code corresponding to the tested LED light that is lit is cleared, and the mode of judging whether the LED status test program code matches one of the multiple LED lights that are lit is exited, and the embedded controller is restored to the test mode of updating the multiple LED lights in real time according to the current system state. If not, it returns to lighting one of the multiple LED lights one by one according to the order of the multi-bit array code.

[0065] In addition, the present invention also provides a computer terminal, which may include a smart phone, a tablet computer, a desktop computer, a portable computer, etc., but is not limited thereto. The terminal device includes a memory and a processor (which may be regarded as a processing circuit 240), the memory may be used to store a computer program, and the processor runs the computer program, so that the terminal device executes the functions of each circuit or module in the above-mentioned foolproofing test method for LED or the above-mentioned foolproofing test system for LED.

[0066] In addition, the functional circuits, modules or units in the various embodiments of the present invention can be integrated together to form an independent part or multiple circuit boards, or each circuit or module can exist separately, or two or more circuits or modules can be integrated to form an independent part or multiple circuit boards.

[0067] If the functions are implemented in the form of software function modules and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a smart phone, a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods described in each embodiment of the present invention. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a disk or an optical disk.

[0068] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

Claims

1. A foolproof testing method for light emitting diodes, characterized in that: The foolproof testing method for light emitting diodes comprises the following steps: S1: Turn off multiple LED lights. Before turning off multiple LED lights, the foolproof testing method for LEDs further includes the following steps: suspending the embedded controller's test mode for the plurality of light emitting diode light signals; S2: generating a random non-repeating multi-bit array code according to the number of the plurality of LED light signals, wherein the number of the random non-repeating multi-bit array code is the same as the number of the plurality of LED light signals; S3: lighting up one of the plurality of light emitting diode light signals one by one according to the sequence of the multi-digit group code; and S4: After lighting up one of the multiple LED light signals, obtain the LED status test program code corresponding to the tested LED light signal that is lit, and determine whether the LED status test program code matches one of the multiple LED light signals that is lit. If so, light up the next LED light signal of the multiple LED light signals. If not, prompt the LED status test program code that reports an error.

2. The foolproof testing method for light emitting diodes according to claim 1, characterized in that: After lighting up one of the plurality of LED light signals, in S4, a LED state test program code corresponding to the LED light signal under test is obtained, and it is determined whether the LED state test program code matches the one of the plurality of LED light signals that is lit up. If so, the next LED light signal of the plurality of LED light signals is lit up, and if not, an LED state test program code that prompts an error is used. The foolproof test method for LEDs further includes the following steps: After lighting up one of the multiple LED light signals, obtain the LED state test program code with the general input and output corresponding address corresponding to the lit LED light signal under test, or obtain the LED state test program code with the computer memory corresponding address corresponding to the lit LED light signal under test.

3. The foolproof testing method for light emitting diodes according to claim 1, characterized in that: In S4, after lighting up one of the plurality of LED light signals, a LED state test program code corresponding to the tested LED light signal that is lit is obtained, and it is determined whether the LED state test program code matches the one of the plurality of LED light signals that is lit up. If so, the next LED light signal of the plurality of LED light signals is lit up. If not, after prompting the LED state test program code that reports an error, the foolproof test method for LEDs further includes the following steps: Determine whether all the multiple LED light signals have been tested. If so, clear the LED status test program code corresponding to the tested LED light signal that is lit, and exit the determination mode of whether the LED status test program code matches the mode of lighting up one of the multiple LED light signals, and restore the embedded controller to update the test mode of the multiple LED light signals in real time according to the current system status. If not, return to S3 to light up one of the multiple LED light signals one by one according to the order of the multi-bit array code.

4. A foolproof test system for light emitting diodes, characterized in that: The fool-proof test system for light emitting diodes comprises: A control circuit, the control circuit is used to turn off multiple light emitting diode lights; A calculation circuit, wherein the calculation circuit generates a random non-repeating multi-bit array code according to the number of the plurality of LED light signals, wherein the number of the random non-repeating multi-bit array code is the same as the number of the plurality of LED light signals; a driving circuit, the driving circuit lighting up one of the plurality of light emitting diode light signals one by one according to the sequence of the multi-bit array code; and a processing circuit electrically connected to the control circuit, the calculation circuit and the calculation circuit, wherein after lighting up one of the plurality of LED light signals, the processing circuit obtains an LED state test program code corresponding to the tested LED light signal that is lit, determines whether the LED state test program code matches the one of the plurality of LED light signals that is lit up, and if so, lights up the next LED light signal of the plurality of LED light signals, and if not, prompts an LED state test program code that reports an error; The embedded circuit is electrically connected to the processing circuit, and the embedded circuit is used to suspend the test mode of the embedded controller for the plurality of light emitting diode light signals.

5. The foolproof testing system for light emitting diodes according to claim 4, characterized in that: The foolproof test system also includes: A generating circuit electrically connected to the processing circuit, wherein the generating circuit is used to generate a random and non-repetitive multi-bit code; and An acquisition circuit is electrically connected to the processing circuit, and is used for acquiring, after lighting up one of the multiple LED light signals, an LED state test program code having a universal input / output corresponding address corresponding to the tested LED light signal that is lit, or acquiring an LED state test program code having a computer memory corresponding address corresponding to the tested LED light signal that is lit.

6. The foolproof testing system for light emitting diodes according to claim 4, characterized in that: The foolproof test system also includes: A judgment circuit is electrically connected to the processing circuit, and the judgment circuit is used to judge whether all the multiple LED light signals have been tested. If so, the judgment circuit clears the LED state test program code corresponding to the tested LED light signal that is lit, and exits the judgment mode of whether the LED state test program code matches the mode of lighting up one of the multiple LED light signals, and restores the embedded controller to update the test mode of the multiple LED light signals in real time according to the current system state. If not, it returns to lighting up one of the multiple LED light signals one by one according to the order of the multi-bit array code.

7. A computer terminal, characterized in that: The invention comprises a memory and a processor, wherein the memory is used to store a computer program, and the processor runs the computer program to enable the computer terminal to execute the foolproof testing method for a light emitting diode according to any one of claims 1 to 3.

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