High frequency test contact elements and test probe apparatus

Abstract

The invention relates to a high-frequency test contact element (10) for releasable establishing contact between a contact partner, in particular a board-to-board plug connector, and a test probe device, said test contact element comprising a lamella main body (10a) having at one end a first contact area (1) for contacting a contact partner (30), an opposite second contact area (2) for contacting a contact probe device (20) receiving the test contact element, and a meandering elastic region (3) located therebetween and having a preferably centrally arranged cavity (5) extending along a running direction (V) of the elastic region, the cavity being provided for elasticity along a longitudinal extension direction (L) of the test contact element (10), wherein the meandering elastic region (3) has a plurality of bending elements (8a, 8b, 8c, 8d) having a respective bending angle (a1, a2, b1, b2) of 5° to 70°, the bending elements following one another in the running direction (V). The invention further relates to a high-frequency test probe device (20) comprising a test contact element (10) according to the invention, and to a test contact attachment (40) for a high-frequency test probe device (20) according to the invention.

Description

Technical Field

[0001] This invention relates to a high-frequency test contact element, and to a test pin device for establishing non-permanent electrical contact with a contact mating object in the high-frequency range. Background Technology

[0002] High-frequency test pin devices with contact heads are generally known in the prior art and are used in testing fields or for other testing purposes to test the functionality of test matings (e.g., groups of electronic components including suitable socket sections). For this purpose, the test pin device is attached to the contact mating under test as a plug, or makes contact with the contact mating under test by means of a contact element (e.g., a contact pin or contact sheet) disposed on or extending to one end. A test signal is then applied to the contact mating via suitable electrical contacts.

[0003] In regularly performed testing operations, engagement sequences typically occur at periodic intervals, utilizing the relative proximity of the test pin device and the corresponding test object. High contact quality is required during the testing process (especially in high-frequency technology areas) because faulty electrical contacts not only lead to increased wear and thus shortened lifespan, but also to faulty resistance conditioning and consequently waveform conditioning, resulting in undesirable reflections and potentially faulty contact and measurement results. Simultaneously, the design of contact elements and devices needs to be optimized for the transmission characteristics of high-frequency signals (particularly minimizing the possibility of signal loss).

[0004] Specification WO 2019 / 138505A1 describes a test head pin for a test device in the high-frequency range. The test head pin includes first and second linear sheet-like regions connected to corresponding opposing contact sections, and includes an intermediate elastic region having a central cavity extending along an extension direction. The elastic region includes several curved sections arranged in a row along the extension direction, the corresponding curves or bending angles of the curved sections being between 90° and 180°.

[0005] CN 109782034A describes a test head pin for a high-frequency range and associated test equipment. The test head pin is implemented as a continuous stamped part and has a contact section for establishing electrical contact between contact mating parts and a connection section for connecting a circuit board of the test equipment. An elastic arm comprising a plurality of strong bending or bending sections is formed between the contact section and the connection section. Summary of the Invention

[0006] Based on the known state of the prior art, the object of the present invention is to provide an improved contact element and a test pin device that achieve optimized high-frequency signal transmission and simultaneously ensure reliable electrical contact between the contact pairs to be tested.

[0007] This objective is achieved by the contact element and test pin device according to the independent claim. The dependent claims describe advantageous embodiments of the invention. Furthermore, the invention addresses further problems discussed in the following description.

[0008] In a first aspect, the present invention relates to a high-frequency test contact element for establishing non-permanent electrical contact between contact mating objects, particularly board-to-board plug connectors, and test pin devices. The high-frequency test contact element comprises a sheet-shaped substrate body having a first contact area at one end for establishing contact with the contact mating object, opposing second contact areas for establishing electrical contact between contact pin devices accommodating the test contact element, and an intermediate zigzag elastic region having a cavity preferably centrally located, the cavity extending along the extension direction of the elastic region and for suspending along the longitudinal extension direction of the test contact element. The zigzag elastic region has a plurality of bending elements that follow each other in the extension direction and have bending angles of 5° to 70°.

[0009] The high-frequency test contact element provides elasticity in the longitudinal direction via a tortuous elastic region, thereby establishing optimized electrical contact between the contact pairs. Furthermore, compared to the prior art, the tortuous region of the bending element according to the invention has a relatively small bending angle, which means optimized signal transmission is achieved by means of the test contact element. In particular, the occurrence of oscillation, emission, and / or attenuation is minimized by the relatively slight bending angle, thereby significantly improving signal transmission compared to the prior art, and further enabling a larger number of load variations.

[0010] When viewed from the side, the test contact element has a generally elongated or rectangular base body. In this case, in particular, the first and second contact areas of the test contact element preferably extend substantially along the longitudinal extension direction of the contact element. The first and / or second contact areas are preferably substantially linear. The first and / or second contact areas may have slightly inclined and / or curved sections. The intermediate zigzag elastic region has an extension direction generally in the longitudinal extension direction of the test contact element and includes a plurality of bending elements arranged in a curved manner relative to the longitudinal extension direction.

[0011] The corresponding bending elements, or the bending angles of these elements, preferably belong to corresponding bends in the same plane, particularly corresponding bends in the same plane parallel to the longitudinal extension direction of the contact element. Specifically, the sheet-shaped substrate body of the test contact element and its aforementioned area extend in a plane. The test contact element or sheet-shaped substrate body is preferably formed or designed as a single component. The test contact element is preferably made of a conductive material, particularly a metal.

[0012] The zigzag elastic region preferably has two consecutive bending segments in the extension direction, and each bending segment has two consecutive opposing bending elements, particularly bending elements arranged in an S-shape. The corresponding consecutive bending segments are also preferably bends, particularly arranged in an S-shape. The two bending elements of the bending segments preferably have two substantially identical bending angles.

[0013] In a preferred embodiment, the bending element of the first (preferably S-shaped) bending section has a corresponding bending angle of 40° to 70°, more preferably 45° to 65°. The bending element of the second bending section preferably has a corresponding bending angle of 5° to 25°, more preferably 5° to 15°. Alternatively, the bending element of the second bending section may have a corresponding bending angle similar to that of the first bending section. The first bending section is preferably assigned to a first contact area for establishing electrical contact with a contact mating object, or is configured to follow the first contact area. The second bending section is preferably assigned to a second contact area for establishing electrical contact with a test pin device.

[0014] In a preferred exemplary embodiment, the elastic region generally has only two preferably curved sections. Each of these sections preferably has only two preferably curved elements.

[0015] The cavity extending in the direction of extension of the elastic region preferably extends through the entire material thickness of the sheet-shaped substrate body and preferably has a substantially uniform width. The cavity divides the sheet-shaped substrate body into two preferably parallel connecting elements in the longitudinal direction. Therefore, they preferably extend parallel to the direction of extension of the elastic region together with the intermediate cavity.

[0016] The thickness, or more precisely, the material thickness, of the sheet-like substrate body for testing contact elements is preferably constant. The thickness of the substrate body, or more precisely, the material thickness, is preferably between 0.1 mm and 0.3 mm.

[0017] The elastic region preferably has a substantially uniform total cross-sectional surface that extends preferably perpendicular to the extension direction. The total cross-sectional surface is the sum of the cross-sectional surfaces of the parallel connecting elements separated by the cavity. The cross-sectional surfaces of the first and second contact areas of the sheet-shaped substrate body also preferably have substantially uniform cross-sectional surfaces that extend perpendicular to their corresponding extension directions.

[0018] In a preferred embodiment, the elastic region has a total cross-sectional surface that is preferably uniform in the extension direction and deviates from the cross-sectional surface of the adjacent segment of the first and / or second contact region by less than 20%, more preferably less than 15%, and particularly preferably less than 10%. In other words, the cross-sectional surface of the elastic region preferably has a deviation of less than 20%, more preferably less than 15%, and particularly preferably less than 10% of the cross-sectional surface of the segment of the elastic region adjacent to the first and / or second contact region. This also allows for particularly optimized signal transmission within the elastic region.

[0019] The corresponding widths of the first and second contact areas are preferably substantially constant in the extension direction. The corresponding width of the elastic area is also preferably constant in the extension direction. The width of the elastic area in the extension direction is relatively greater than the width of the first and / or second contact areas.

[0020] In a preferred embodiment, the tortuous elastic region has at least one connecting bridge at which the cavity extending along the extension direction is interrupted. In this case, the connecting bridge is a connection portion of the connecting element extending in the extension direction, which preferably extends perpendicular to the extension direction. The connecting bridge is preferably formed in the substrate body of the contact element and is thus integrally implemented with the remaining contact element. The connecting bridge is preferably a jumper for shortening the cavity region in the extension direction. This allows for the increase of the resonant frequency of the contact element that interferes with signal transmission and causes it to move in the frequency band to be transmitted. The elastic region preferably has only two, more preferably only one connecting bridge.

[0021] In a preferred embodiment, the second contact region has an end segment that is preferably at least partially bent relative to the longitudinal extension direction and is designed to establish electrical contact with a contact segment of the printed circuit board at the test pin device in a at least partially suspended manner. The end segment preferably has a reduced cross-sectional surface relative to the remaining cross-sectional surface of the second contact region.

[0022] The first contact area of ​​the contact element has a contact segment disposed distally for establishing electrical contact with the contact mating object. It preferably has a preferably flat contact surface at one end. The contact segment has a preferred sheet-like design similar to the remaining first contact area. Alternatively, the contact segment can be V-shaped or U-shaped, and is thus implemented as a tapered contact segment. Additionally, the contact segment can alternatively have an extended shape, such as an inverted V-shape or U-shape.

[0023] On the other hand, the present invention relates to a high-frequency test pin device for making non-permanent electrical contact with multi-pole contact mating objects, particularly board-to-board plug connectors, the high-frequency test pin device comprising an inner housing and an outer housing, the inner housing having a contact section at one end for interacting with the contact mating object to achieve a testing purpose, the inner housing being at least partially and relative to the outer housing in such a manner as to be movably guided, particularly along the longitudinal device direction, i.e., the inner housing being configured to be fixed in its position in a first non-contact relative position and movably mounted, particularly in a rotatable and / or tiltable manner, relative to the outer housing for making electrical contact with a second contact mating object in a second relative position, the test pin device having at least one printed circuit board and a plurality of high-frequency test contact elements, the at least one printed circuit board having contact elements for establishing external electrical contact with the test pin device, the plurality of high-frequency test contact elements contacting the printed circuit board and extending toward the contact section of the inner housing as described above, the printed circuit board and the test contact elements being arranged in the inner housing in such a manner as to extend substantially in the longitudinal device direction.

[0024] In this example, the extension "substantially in the longitudinal direction of the device" is specifically understood to mean that the printed circuit board and the test contact element extend substantially in or parallel to the longitudinal extension direction. In particular, neither the printed circuit board nor the test contact element deviates significantly from the longitudinal extension direction, or even extends orthogonally to it.

[0025] As contemplated by the present invention, optimized signal transmission in the high-frequency range is achieved by means of the position of the printed circuit board and the test contact element in contact with it. In particular, compared to the prior art, where the printed circuit board is orthogonally positioned to the extension of the test contact element, optimized signal transmission can be obtained by means of the positioning according to the invention, while minimizing the occurrence of interfering oscillation circuits or attenuation. Simultaneously, the design according to the invention allows for precise orientation of the device on the contact mat at the first relative position and provides tolerance for any deviations in the position and / or measurement of the contact mat at the second relative position. In this case, the first relative position preferably corresponds to the end position of the inner housing within the outer housing, wherein the inner housing is preloaded within the outer housing by means of a power storage device, particularly a spring element. The second relative position preferably corresponds to the partial spring deflection state of the inner housing within the outer housing in the longitudinal device direction.

[0026] The inner housing and the outer housing are preloaded by abutting each other in a first relative position using a spring element. The spring element is specifically arranged in such a way that the contact section of the inner housing is back-push away from the outer housing in one direction. The spring element disposed between the inner housing and the outer housing is referred to below as the first spring element.

[0027] The outer casing preferably at least partially completely surrounds the inner casing, or surrounds the outer diameter of the inner casing. In this case, the outer casing may have an inner cylindrical section in which the inner casing is guided or guided through the inner cylindrical section. The outer casing preferably has a fastening mechanism for mounting the test pin device on the test equipment. These can be implemented as flanges for the remaining outer casing. The outer casing may also have a substantially flange-like design including a preferably central inner cylindrical section for guiding and / or passing through the inner casing.

[0028] At least one printed circuit board of the device includes conductive traces disposed thereon, particularly for correspondingly connecting contact sections for establishing electrical contact with assigned test contact elements and contact elements for externally transmitting signals to and from the test pin device. The conductive traces disposed on the printed circuit board preferably extend substantially in the longitudinal direction of the device. In this case, the conductive traces preferably do not have bent sections, bends, or bend elements having a bending angle greater than 70°, more preferably greater than 45°. This allows for further optimized signal transmission by means of the conductive traces and the printed circuit board.

[0029] The corresponding contact segment of the conductive trace on the printed circuit board used to establish electrical contact with the test contact element preferably has a cross-sectional surface that matches the cross-sectional surface of the curved end segment of the test contact element in contact with it, such that the deviation between the resulting total cross-sectional surface of the contact element and the cross-sectional surface of the adjacent end segment of the second contact area of ​​the high-frequency test contact element is less than 20%, more preferably less than 15%, and even more preferably less than 10%. The conductive trace preferably has an enlarged cross-sectional surface relative to the contact segment on the outer side of the contact segment.

[0030] The contact elements of the printed circuit board for establishing external electrical contact with the test pin device are preferably arranged and implemented in such a way that the corresponding conductors connected thereto, such as connecting cables for establishing external electrical contact with the test pin device, extend substantially in the longitudinal device direction. The contact elements preferably include connecting plugs (which are disposed in a rectangular slot of the printed circuit board and preferably oriented in the longitudinal device direction) or correspondingly arranged solder joints for providing a permanent connection to the provided external connector or conductor.

[0031] In a preferred embodiment, the test pin device has two opposing, particularly parallel, printed circuit boards (PCBs), which are preferably radially positioned outside the test contact elements that are electrically in contact with them. In this case, the PCBs are oriented such that the conductive traces disposed thereon are opposite to each other, i.e., facing each other. Positioning the PCBs in this way particularly allows for spatial separation of the PCBs and thus reduces mutual signal interference. Furthermore, this orientation allows for a further reduction in the bending angle of the assigned test contact elements.

[0032] In an alternative embodiment, the test pin device has two printed circuit boards (PCBs) placed parallel to each other or directly adjacent to each other, and preferably substantially centered on the test pin device, i.e., along the central axis of the device. The conductive traces of the PCBs are preferably located on opposite sides of each other. Alternatively, a single PCB with conductive traces on opposite sides can be provided.

[0033] The test pin device preferably has an insulating material disposed between the various high-frequency test contact elements. The insulating material may be disposed as a carrier unit or designed inside the inner housing. The insulating material preferably comprises a plastic body disposed between the test contact elements. The plastic body preferably has multiple lateral, particularly slit-like cuts in which the test contact elements extend and / or are guided. The cuts are preferably each implemented parallel to each other within the plastic body.

[0034] Preferably, the two cuts in each plane are oriented adjacent to each other, such that each cut can receive and / or guide a test contact element. The respective cuts are specifically formed as slit-like cuts by opposite sides of a plastic body, and the test contact element is disposed in each of the two cuts. The two test contact elements disposed in one plane are arranged in a bent manner relative to their elastic regions and make electrical contact with the correspondingly assigned printed circuit board. Between the two cuts disposed in one plane, a plastic body, particularly as a continuous solid, is disposed to separate the adjacent cuts. The plastic body preferably extends to the contact section of the test pin device.

[0035] The contact section is preferably multi-electrode. Each electrode is formed by a contact element, as described above. The contact elements are preferably disposed in the device for selective replacement. For this purpose, the device may have a fixing or mounting device for the contact elements specifically designed for this purpose.

[0036] The contact section of the test pin device preferably has an elliptical or polygonal, particularly rectangular, inner and / or circular profile. The inner and / or circular profiles are preferably adapted or implemented for establishing electrical contact with board-to-board plug connectors or multi-wire plug connectors.

[0037] In a preferred embodiment, the contact section has a centering section at one end, elastically mounted in the longitudinal direction of the device, particularly elastically mounted relative to the high-frequency test contact element. Preferably, the centering section is elastically mounted relative to the test contact element(s) by means of a distributed power storage element, particularly at least one spring element. The spring-mounted centering section allows for further optimized orientation of the test pin device when establishing electrical contact with the contact mating element for testing purposes.

[0038] In a preferred embodiment, the inner housing includes a piston disposed at one end for mobility, and a spring force is applied to the piston, with a contact section for the test pin device also formed at the end of the piston. The piston is preferably configured to be movable relative to the remaining inner housing, the plastic body disposed therein, and the respective test contact elements; it also has a central opening or orifice through which the test contact elements and the plastic body or insulating material disposed therebetween can pass.

[0039] The centering section is preferably integrated with the movable piston and formed on the inner circumferential surface facing the contact mat. The centering section preferably has an inner contour that tapers radially inward, or more precisely, toward the centrally located test contact element. The inner contour may have at least one correspondingly inclined centering ramp. This type of positioning is preferably implemented to surround or center the outer contour of the contact mat. In another embodiment, the centering section may have an outer contour that extends in a curved manner relative to the previous embodiment, particularly increasing radially outward or away from the centrally located test contact element, and is implemented for engagement in the preferably centrally located opening of the contact mat.

[0040] The movable piston is preferably mounted on and / or at least partially mounted in the base body of the plastic body of the inner housing by means of a preferred spring element, particularly by means of a plurality of circumferentially distributed spring elements, especially by means of spring-mounted contact pins, and is preloaded in a direction pointing away from the base body of the inner housing. In this case, the movable piston can be configured to push against the inner protrusion of the piston surrounding the movable piston, and is configured to be immovable relative to the remaining inner housing. The spring element disposed between the piston and the plastic body, or more precisely the remaining inner housing, is referred to below as the second spring element.

[0041] Specifically, the movable piston can occupy an initial first position relative to the test contact element and the assigned plastic body. The corresponding contact area of ​​the test contact element for establishing electrical contact with a contact pair in a contact section at one end or a centering section assigned thereto is configured to be protected in the initial first relative position, i.e., not protruding relative to the circumference or sidewall of the contact section when the device is viewed from the side. This first relative position corresponds to a position where no external force is applied or the device is removed from the contact pair. In the second relative position, particularly in the case of establishing electrical contact with the contact pair, the movable piston is configured to move inward toward the base body of the inner housing, preferably in such a manner that the corresponding contact area for establishing electrical contact with the contact pair protrudes further from the contact section and toward the contact pair relative to the first relative position.

[0042] In a preferred embodiment, the insulating material or plastic body of the device is designed in two parts. For this purpose, the plastic body preferably has a guide element assigned to a contact section of the device and movable relative to a rearward base body of the plastic body. The guide element is preferably disposed within the plastic base body for partial guidance, and a power storage device, particularly at least one spring element, more preferably a compression spring (which preloads the guide element toward the contact section or the contact pair to be contacted), is disposed between the base body and the guide element. The spring element between the plastic base body and the guide element of the plastic body is hereinafter referred to as a third spring element.

[0043] In this configuration, the guiding element is preferably preloaded against a limiting element that is electrically in contact with the guiding element, and preferably against a pin or spring locating pin disposed substantially orthogonal to the direction of movement of the guiding element. The pin or spring locating pin is preferably disposed within the inner housing for secure positioning and may be disposed in a recess or orifice extending substantially orthogonal to the direction of movement of the guiding element. In this configuration, the sidewall of the limiting element may serve as the abutting surface of the inner wall of the recess or orifice. The maximum stroke of the guiding element may also be defined by the limiting element, particularly through interaction with the aforementioned recess or orifice. For this purpose, the opposing sidewall of the limiting element may serve as the abutting surface of the opposing inner wall of the notch or orifice.

[0044] The guide element is preferably configured to be movable relative to each test contact element. Specifically, the guide element may occupy a first position relative to the test contact element, where the corresponding contact area of ​​the test contact element for establishing electrical contact with a contact mating element within an opening formed on the end side of the guide element is positioned in a first relative position to be protected, i.e., not protruding or preferably only partially protruding when the device is viewed from the side. This first relative position preferably corresponds to a position where no external force is applied or where the contact mating element is not removed. In a second relative position, particularly in the case of electrical contact with the contact mating element, the corresponding contact area for establishing electrical contact with the contact mating element protrudes at least partially from the corresponding opening in the guide element, or protrudes further from the assigned opening relative to the first relative position. In the second relative position, the contact mating element overcomes a preload force and applies a force externally to the guide element towards the substrate body.

[0045] An opening at one end of the contact area for testing contact elements is preferably integrally formed with a corresponding slit-like cutout laterally disposed in the plastic body for mounting and / or guiding the individual contact elements. When electrical contact is established with the contact mating element, the individual test contact elements can move within the correspondingly allocated cutouts in the plastic body, particularly within the corresponding cutouts of the guiding element in the base body, independent of the guiding element. This positioning allows for further improved tolerance compensation when electrical contact is established with the individual contacts of the contact mating element.

[0046] In a preferred embodiment, the guide element is implemented or arranged relative to the test contact element in such a way that, upon establishing electrical contact with the contact mat, the guide element first moves from its initial first relative position toward a second or spring-deflected relative position, and during further movement of the guide element, the contact mat establishes electrical contact via the contact area of ​​the test contact element. During further stroke movement of the device toward the contact mat, the guide element and the test contact element are spring-deflected simultaneously or in parallel with each other.

[0047] The guiding element preferably has a distal centering section disposed on the end section of the guiding element that is assigned to the contact mating element to be electrically contacted. The centering section advantageously has a protrusion or a recess preferably oriented centrally within the contact section of the device, the protrusion or recess being formed to engage in a corresponding central recess or protrusion in the contact mating element to be electrically contacted when establishing electrical contact. The centering section may have a front end substantially orthogonal to the longitudinal extension direction of the device. An opening is formed at one end of a lateral cut (particularly a slit-like cut) for mounting and / or guiding a test contact element, the distal contact area of ​​which protrudes or is pulled out from the opening depending on its position relative to the guiding element.

[0048] Alternatively or additionally, the centering section may have multiple protrusions or recesses, each of which is configured as an opening for guiding the test contact element through a cut on the side of an adjacent contact section.

[0049] In another preferred embodiment, the movable piston of the inner housing can be connected to shortened contact elements according to its position. In this case, in addition to a plurality of high-frequency test contact elements extending toward the contact section of the inner housing, the shortened contact elements are arranged and configured such that they can be connected to the movable piston to transmit signals according to their position. The shortened contact elements are arranged parallel to the remaining test contact elements and have a shortened first contact area compared to the remaining test contact elements. In all other cases, the shortened contact elements have substantially the same design as the test contact elements described above. The shortened contact elements preferably also make electrical contact with the printed circuit board, similar to the test contact elements according to the invention.

[0050] The movable piston is made of a conductive material and is configured to establish electrical contact, specifically with the mass block contacts of the contact pair. The movable piston has a rearwardly facing, and preferably annular or stepped, contact protrusion that establishes electrical contact with shortened contact elements when the movable piston is spring-deflected from its initial first relative position to a second relative position. In this configuration, the shortened contact elements are advantageously positioned radially outward relative to the remaining test contact elements. Specifically, the shortened contact elements are positioned at four outer edge locations relative to the remaining contact elements.

[0051] When electrical contact is established with the contact pair, the movable piston first springs against the spring force of the assigned second spring element or, more precisely, the advantageously provided circumferentially distributed (second) spring element. After traveling the piston's predetermined working stroke, the piston establishes electrical contact with the shortened contact element via its rearward contact protrusion, thus the shortened contact element is connected to the contact pair, particularly to the mass block contact of the contact pair, by means of the piston in a signal-conductive manner. In this case, the shortened contact elements, due to their inherent spring effect via their elastic regions, are an additional means for applying a spring force to the piston in the longitudinal direction of the device. When the piston is removed from the contact pair, the piston moves back to its initial first relative position by the provided spring force applied, on the one hand by the spring force of the shortened contact element and on the other hand by the spring force of the assigned second spring element or, more precisely, the advantageously provided circumferentially distributed (second) spring element.

[0052] In a preferred embodiment, the first spring element disposed between the inner housing and the outer housing has a stronger spring force than the second spring element disposed between the movable piston and the base body of the inner housing, or more specifically, the plastic base body. This delays the deformation of the first spring element relative to the second spring element when electrical contact is established with the contact mating element, and thus delays the spring deflection of the first spring element relative to the second spring element. Specifically, the second spring element, and therefore the movable piston, first spring deflects relative to the plastic base body, and the first spring element, and therefore the inner housing, does not spring deflect relative to the outer housing until another and / or stronger force is applied.

[0053] Furthermore, in a preferred embodiment, the first spring element has a stronger spring force than the third spring element disposed between the plastic substrate body and the guide element. In another preferred embodiment, the first spring element has a stronger spring force than the combined spring force of the second and third spring elements.

[0054] The second spring element can have a stronger spring force than the third spring element disposed between the plastic substrate body and the guide element. This preferably, primarily or precisely initially, allows the movement of the guide element to overcome the spring force when the contact matings make electrical contact via the guide element, thereby guiding the individual contacts of the contact matings and thus making contact in a further improved manner. This can occur parallel to the movable piston, at least partially becoming spring-deflected, provided the piston is first centered on the contact matings, particularly when the contact matings are laterally offset relative to the piston.

[0055] In an alternative embodiment, the spring forces of the second and third spring elements may also be approximately the same. In this embodiment, the second and third spring elements preferably have weaker spring forces than the first spring element. Alternatively, the spring force of the third spring element may be stronger than that of the second spring element.

[0056] The spring force of the first spring element is preferably 4N to 18N, more preferably 4N to 8N, and even more preferably 5.5N to 6.5N. The spring force of the second spring element is preferably 2N to 7N, more preferably 2.5N to 4.5N, and even more preferably 2.5N to 3N. The spring force of the second spring element is preferably composed of the spring forces of multiple parallel (second) spring elements. Advantageously, the second spring element comprises four circumferentially distributed spring elements, and the aforementioned spring force is the combined spring force of the four spring elements.

[0057] The spring force of the third spring element is preferably 0.1N to 2N, more preferably 0.3N to 1.2N, and even more preferably 0.5N to 0.8N. The spring force of the high-frequency test contact element according to the invention and the shortened test contact element in the longitudinal extension of the test contact element is preferably 0.1N to 0.5N, more preferably 0.15N to 0.3N, and even more preferably 0.18N to 0.25N.

[0058] In another aspect, the present invention relates to a test contact attachment for a test pin device as described above, the test contact attachment comprising a first housing section extending in a longitudinal direction and preferably having a connecting element for selectively connecting to the test pin device, and a second housing section at one of its protruding ends, the second housing section comprising a cutout extending particularly in the longitudinal direction for receiving a section of the test pin device at one end, and comprising a contact section radially disposed outside the cutout for establishing a non-permanent electrical contact with a contact mating element, and the contact section being at least partially elastically formed relative to the second housing section in the longitudinal direction.

[0059] The contact attachment according to the invention allows for the selective extension and adaptation of the test pin device according to the invention, depending on the contact mating to be tested. The contact attachment allows for the simultaneous and simple testing, particularly of, additional test matings positioned directly adjacent to the contact mating to be tested by the test pin device.

[0060] The contact attachment preferably has a continuous housing. When viewed from the side, the first and second housing sections are preferably formed or precisely arranged in a substantially L-shape. The connecting element disposed in the first housing section may have, for example, a threaded connection by means of which the test contact attachment can be selectively connected. Alternatively, the connecting element may have a clamp or snap-fit ​​mechanism for selectively interacting with a test pin device or with a suitable receiving element disposed thereon.

[0061] The first housing section is preferably plate-shaped or slightly bent perpendicular to the longitudinal extension. The first housing section is preferably designed with thin walls. When connected to the test pin device, the thin walls should remain relatively thin, especially around the lateral extensions of the test contact attachment. The width of the first housing section (i.e., the extension orthogonal to the longitudinal extension) is preferably less than 6 mm, more preferably less than 4 mm.

[0062] The first housing section preferably has contact elements for establishing external contact with the test contact attachment. The contact elements are preferably disposed on a housing region at the end opposite the contact section for establishing non-permanent contact with the test mating object. The contact elements may in particular include at least one plug connector for selectively establishing electrical contact with the test contact attachment. Alternatively, a conductor extending within the housing may be directly guided from the end of the first housing section. Corresponding contact elements, particularly plug connectors, may also be disposed, for example, at the end of the conductor and on the outside of the housing.

[0063] The cutout in the second housing section is preferably cylindrical or rectangular. More preferably, the cutout matches the outer contour of the section containing the test pin device located at one end.

[0064] The contact section of the test pin attachment is preferably multi-pole. The individual poles are preferably formed in series within the contact section. However, the poles can also be arranged in any other manner.

[0065] In another preferred embodiment, the contact section has at least one electrical conductor that is at least partially resiliently mounted in the second housing section, in a cutout, particularly an orifice, preferably extending parallel to the receiving portion. The resilient mounting of the electrical conductor is achieved by means of guidance through at least partial bending of the conductor within the housing of the test contact attachment and / or by providing additional power storage, particularly via a spring element acting on the conductor.

[0066] In an alternative embodiment, the contact section has at least one contact pin, preferably spring-loaded at both ends, which is provided, in particular, installed, to be secured in place in a receiving portion, preferably parallel to the cut. For example, the contact pin may be fitted into a corresponding receiving portion. Attached Figure Description

[0067] The details and beneficial effects of the present invention are described below using purely illustrative and exemplary diagrams.

[0068] Figure 1a , Figure 1b A side view and a perspective side view of a high-frequency test contact element according to a preferred embodiment of the present invention are shown;

[0069] Figure 2a An alternative preferred embodiment of the high-frequency test contact element according to the present invention is shown;

[0070] Figure 2b An alternative embodiment of a contact segment disposed on the distal side of a test contact element is shown;

[0071] Figure 3A perspective side view of a preferred embodiment of the high-frequency test pin device is shown;

[0072] Figure 4 It shows that according to Figure 3 Exploded view of the high-frequency test pin equipment;

[0073] Figure 5a , Figure 5b It shows that according to Figure 3 and Figure 4 A partial cross-sectional side view of a high-frequency test pin device;

[0074] Figures 6a to 6c It shows that according to Figure 3 and Figure 4 A side sectional view of a high-frequency test pin device;

[0075] Figure 7a , Figure 7b A side cross-sectional view of the contact section of a high-frequency test pin device for interacting with contact mating objects is shown.

[0076] Figures 8a to 8d A side sectional view and a corresponding detailed view of a preferred embodiment of a high-frequency test pin device in which test contact elements are provided are shown;

[0077] Figure 9 A perspective side sectional view of the high-frequency test pin device according to Figure 8 is shown;

[0078] Figure 10a It shows that according to Figure 1a A perspective side view of a preferred embodiment of a high-frequency test pin device with test contact elements, omitting some components to improve the overview;

[0079] Figure 10b It shows that according to Figure 2a A perspective side view of an alternative preferred embodiment of a high-frequency test pin device with test contact elements, omitting some components to improve the overview;

[0080] Figure 10c It shows that according to Figure 10a Detailed view of the printed circuit board of the embodiment;

[0081] Figures 11a to 11c A side sectional view of another preferred embodiment of the high-frequency test pin device is shown;

[0082] Figure 12a , Figure 12b A perspective side view of the insulating material with test contact elements guided therein is shown, and according to... Figures 11a to 11c A partial perspective sectional view of a high-frequency test pin device;

[0083] Figures 13a to 13c This illustrates the method of establishing an electrical contact with a multi-pole contact pair, including a test contact element guided therein and an insulating material disposed therebetween. Figures 11a to 11c A partial lateral cross-sectional view of the movable piston of the test pin device;

[0084] Figure 14a , Figure 14b It shows that according to Figures 11a to 11c A cross-sectional view of the test pin device in the non-contact relative position of the device components and in the relative position of the device components to establish electrical contact with the contact mating object;

[0085] Figures 15a to 15c A partial lateral cross-sectional view of a movable piston of another preferred test pin device, having a test contact element guided therein and insulating material disposed therebetween, when establishing electrical contact with another multipole contact pair;

[0086] Figure 16a , Figure 16b It shows that according to Figures 15a to 15c A side cross-sectional view of the test pin device in the non-contact relative position of the device components and in the relative position of the device components to establish electrical contact with the contact mating object;

[0087] Figures 17a to 17c A perspective view and a corresponding side view of a preferred embodiment of the test contact attachment according to the present invention are shown; and

[0088] Figure 18a , Figure 18b A side sectional view of two preferred embodiments of the test contact attachment according to the present invention is shown. Detailed Implementation

[0089] Figure 1a , Figure 1b A first preferred embodiment of the high-frequency test contact element 10 according to the present invention is shown. The test contact element has a substantially sheet-shaped substrate body 10a, which has a preferably uniform thickness or, more precisely, a uniform material thickness t. The test contact element 10 is implemented as an integral, i.e., adjacent component, preferably implemented as a component produced by stamping, etching or electroforming, and extends along the longitudinal extension direction L.

[0090] The test contact element, or more precisely its base body 10a, has a first contact region 1 at one end for establishing electrical contact with the contact mating object 30 (see, for example, see...). Figure 10b A second contact area 2 is provided on the opposite ends of the base body 10b for establishing electrical contact with the test pin device 20 that receives the test contact element (see, for example, see...). Figure 3The first and second contact areas 1 and 2 preferably extend substantially in the longitudinal direction L and have preferably uniform widths b1 and b2 when viewed from the side. The widths b1 and b2 of the first and second contact areas 1 and 2 are preferably the same size and can be between 0.25 mm and 0.45 mm.

[0091] The tortuous region 3 between the first and second contact regions 1 and 2 has a tortuous extending direction V, which winds along the longitudinal extending direction L. Region 3 has a cavity 5 preferably centrally formed therein and extending in the extending direction V. The cavity 5 divides the substrate body 10a in region 3 into two preferably identical and parallel connecting elements 4a and 4b. The resulting total thickness b3 is preferably greater than the widths b1 and b2 of the first and second contact segments 1 and 2, and preferably between 0.35 mm and 0.65 mm. The tortuous design with the cavity 5 allows for flexibility in region 3, particularly along the longitudinal extending direction L of the test contact element 10.

[0092] The tortuous elastic region 3 has multiple bending elements 8a, 8b, 8c, and 8d of the base body 10a, which are sequentially arranged in the extension direction V and have corresponding bending angles α1, α2, β1, and β2. The corresponding bending angles preferably range from 5° to 70°. Specifically, the tortuous elastic region 3 does not have a bending angle greater than 70°. The extension direction V of the tortuous region 3 is preferably in a single plane. This means that the bending elements 8a, 8b, 8c, and 8d all extend within the same plane.

[0093] Specifically, the tortuous elastic region 3 has two bending segments 6a and 6b, which are preferably directly successive in the extension direction V, i.e., one after the other. The bending segments 6a and 6b are bent or arranged in a turning manner in the extension direction. Each of the two bending segments has two bending elements 8a, 8b, 8c, and 8d, preferably each having the same bending angles α1 and α2 and β1 and β2. The bending elements 8a and 8b of the first bending segment 6a have corresponding bending angles of 40° to 70°, preferably 45° to 65°. The bending elements 8c and 8d of the second bending segment 6b have corresponding bending angles of 5° to 25°, preferably 5° to 15°.

[0094] The first contact region 1 has a contact segment 1a at its distal end for establishing electrical contact with the contact mating object 30. The contact segment 1a may have a planar contact surface orthogonal to the remaining extension of the contact region 1.

[0095] The second contact area 2 has a curved end section 2a, which is opposite to the contact area 1, or more precisely, its distal contact section 1a, and is configured to establish electrical contact with the contact section 18 on the test pin device 20 (see [link]). Figure 10c Adjacent to it, the second contact area 2 has a laterally protruding lug 2b, which is implemented for fastening in the receiving part of the test pin device and specifically for loading the test contact element.

[0096] In the preferred central section, the elastic region 3 has a connecting bridge 7 at which the cavity extending along the extension direction V is interrupted.

[0097] The geometry of the base body in the extension direction V from the first contact region 1 through the elastic region 3 to the second contact region 2 is preferably achieved in such a way that the corresponding cross-sectional surfaces F1, F2, F3 remain substantially constant. In this case, this means that the deviation of the cross-sectional surfaces from the remaining cross-sectional surfaces is less than 20%, preferably less than 15%, and particularly preferably less than 10%. Specifically, the elastic region 3 has a total cross-sectional surface F3 (i.e., the sum of the cross-sectional surfaces of the first and second connecting elements 4a, 4b), which extends parallel to the first connecting element and deviates from the cross-sectional surfaces F1, F2 of the corresponding adjacent segments of the first and / or second contact regions 1, 2 by less than 20%, more preferably less than 15%, and even more preferably less than 10%.

[0098] Figure 2a Another preferred embodiment of the test contact element 10 is shown, which differs from the first embodiment described above by having two substantially identical, directly successive bending sections 6a and 6b. The bending elements 8a and 8b of the first bending section 6a have corresponding bending angles α1 and α2 of 40° to 70°, preferably 45° to 65°. The bending elements 8c′ and 8d′ of the second bending section 6b also have corresponding bending angles β1′ and β2′ of 40° to 70°, preferably 45° to 65°.

[0099] like Figure 2a As shown, the second contact region 2 may also have a cavity 5'. Similar to the embodiment of the elastic region 3, in this case, a corresponding geometry is selected such that the corresponding total cross-sectional surface in region 2 is substantially without deviation from the remaining cross-sectional surface of the test contact element. Although not shown in the figure, the test contact element 10 may also have a connecting bridge 7 with the cavity 5.

[0100] Figure 2b An alternative embodiment of the distal contact segment 1a of the test contact element 10 is shown. It may have at least partially protruding V-shaped contact points. The contact segment 1a may have an extended shape, such as an inverted V or a U, as an alternative to a conical shape.

[0101] Figures 3 to 5b A preferred embodiment of a high-frequency test pin device 20 for non-permanent contact of multi-pole contact mating elements 30 (particularly board-to-board plug connectors or multi-wire plug connectors) is shown. The test pin device 20 has an inner housing 11 and an outer housing 13, the inner housing having a contact section 12 at one end for interacting with, and particularly electrically contacting, the contact mating elements 30 to achieve testing purposes. The outer housing 13 preferably has a flange 13a that projects specifically from the central housing section and has mounting and / or connecting elements 13b formed therein. Thus, the outer housing 13 can be mounted on a fastening device, such as a fastening screen for a movable test unit.

[0102] On the rear side of the device 20, on the section opposite to the contact section 12, the inner housing 11 has a coupling section 9 for coupling and / or decoupling electrical signals, specifically by means of electrical conductors and / or cables 17a, 17b and connected to the contact section 12.

[0103] The inner housing 11 is at least partially mounted within and guided within the outer housing 13. For this purpose, the inner housing 11 is substantially movably guided within the outer housing 13 along the longitudinal device direction L1. A power storage device 21 (preferably a first spring element) disposed between the inner housing 11 and the outer housing 13 provides a preload force that holds the device between the inner housing 11 and the outer housing 13 in a non-contact end position, or more precisely... Figure 3 and Figure 5a The first relative position is shown in the diagram. Figure 5b The diagram shows a second relative position of the inner housing 11 and the outer housing 13, wherein the inner housing 11 is movably mounted, particularly so as to be rotatable, tiltable and / or laterally offset relative to the outer housing 13, thereby preferably providing a few degrees of clearance for moving the inner housing 11 when establishing electrical contact with the test contact or contact mating 30, and thus allowing effective tolerance compensation between the contact section 12 of the inner housing 11 and the contact mating 30.

[0104] like Figure 4 As shown, the device 20 also includes at least one, preferably two, printed circuit boards 14a, 14b and a plurality of high-frequency test contact elements 10, as described above, that are electrically in contact with the printed circuit boards and extend toward the contact section 12. The printed circuit boards are disposed in the inner housing 11 of the carrier unit (particularly the insulating material 19, such as a plastic body). In this case, the printed circuit boards 14a, 14b can be fastened to the carrier unit 19 using, for example, a contemplated fastening or mounting mechanism (such as threaded connectors 22a, 22b).

[0105] The contact section 12 may have a centering section 12a that is elastically mounted relative to the remaining inner housing, and particularly relative to the high-frequency test contact element 10, and disposed at one end. The centering section 12a may be mounted on the carrier unit or, more precisely, the insulating material 19 by means of a distributed power storage device 23, particularly by means of a second spring element (e.g., comprising several preferably circumferentially distributed spring elements 23). The contact section 12 and the centering section 12a assigned to it are preferably formed in a movable piston 27 of the inner housing 11, particularly disposed at one end and configured to point toward the contact mating object 30 to be electrically contacted. The piston 27 is disposed at one end of the inner housing 11 and is subjected to a spring force applied by the second spring element 23.

[0106] The movable piston 27 is preloaded in a direction pointing away from the base body 11a (preferably a hollow cylindrical base body) of the inner housing 11. In this case, the movable piston 27 can be configured to push against the inner protrusion 34a of the piston 34 surrounding the movable piston 34, and is configured to be immovable relative to the remaining inner housing.

[0107] The inner housing 11 preferably comprises a plurality of particularly mountable individual components 11a to 11e. They can preferably be screwed together in the longitudinal equipment direction L1 to form a unit.

[0108] Figures 6a to 6c Several side sectional views of the high-frequency test pin device 20 are shown to illustrate the first and second relative positions of the inner housing 11 and the outer housing 13. As shown, the inner housing 11 has an outer contour that interacts with the inner contour of the outer housing 13 according to its position. In particular, the inner housing 11 has a support shaft section 24 with a varying outer contour and extending axially between a contact section 12 and a coupling section 9 formed at the other end. The support shaft section 24 is at least partially received or guided in a guide recess 25 of the outer housing 13 extending along the longitudinal device direction L. The support shaft section 24 has at least one preferably substantially tapered protrusion 24a that is mounted in a first relative position in a recess 25a of the guide recess 25, which is complementary to it. To prevent the protrusion 24a and the recess 25a from rotating in this position, they preferably have a shape that is not rotationally symmetric in the circumferential direction. For example, when viewed from above, the protrusion 24a may be rectangular (see Figure 4 ).

[0109] The first spring element 21 (particularly a helical spring) preloads the inner housing 11 and outer housing 13 against each other and pushes them axially apart. The helical spring 21 acts on a first annular protrusion 26a of the inner housing 11 at one end and on a second annular protrusion 26b of the outer housing 13, which is disposed on opposite sides along the longitudinal equipment direction L1 and separates the inner housing 11 and the outer housing 13, at the other end. In this case, the maximum stroke movement of the inner housing 11 in the outer housing 13 is limited by the centering section 24b of the support shaft section 24 of the inner housing 11, which is disposed on the outer side and engages at one end in the enlargement 25b of the outer housing, or abuts against the enlargement at the maximum stroke.

[0110] If as Figure 6b and Figure 6c As shown, when electrical contact is established, the inner housing 11 is at least partially spring-deflected (second relative position) within the outer housing 13, and the protrusion 24a and the assigned recess 25 are spaced apart from each other. Furthermore, the support shaft section 24 has a smaller outer diameter than the assigned guide recess 25 of the outer housing 13, meaning that within this second position, within the defined boundaries of the inner housing 11, rotation, tilting, and / or offset are now permitted within the outer housing 13.

[0111] Figure 6c It shows relative to Figure 6b A sectional view in a radially offset plane. Figure 6c The centering section 12a of the contact section 12 is shown to be deflected by a spring via a power storage device (particularly a second spring element, or more precisely, spring element 23, preferably circumferentially distributed). The second spring element 23 preferably comprises spring-loaded contact pins arranged parallel to the longitudinal direction L1 of the device 10.

[0112] Figure 7a A contact section 12 with a centering section 12a at one end is shown. The latter is specifically resiliently mounted opposite a test contact element 10 protruding into the centering section 12a. This is achieved, in particular, by positioning the contact section 12 in or on the end of a movable piston 27 to which a spring force is applied. The centering section has an inner contour that tapers toward the test contact element and preferably has circumferentially distributed centering ramps 12b. Figure 7b The contact section 12 is shown when it is in electrical contact with the contact mating object 30. When the contact section 12 and the contact mating object 30 approach each other, the contact mating object 30 is centered by the centering section 12a having a circumferential centering ramp 12b and is thus guided toward the contact section 12 so as to be fixed in place.

[0113] Figures 8a to 8dA side sectional view of a preferred embodiment of a high-frequency test pin device 20 having a test contact element 10 disposed therein is shown, along with corresponding detailed views B, C, and D. Figure 9 A corresponding perspective sectional view of the test pin device is shown.

[0114] like Figure 8a As shown, the device 20 preferably has two opposing printed circuit boards 14a, 14b spaced apart from each other. They are disposed on the side of the centrally located carrier unit 19 in the longitudinal device direction L1. Figure 8b The general positioning of the test contact elements 10 is shown, extending from the corresponding ends of the printed circuit boards 14a, 14b to which these test contact elements electrically contact each other to the opposing contact areas 12 of the device. In this case, the contact elements 10 are preferably disposed on both sides of the centrally located carrier unit 19. In this case, the corresponding contact elements 10 extend into the corresponding cutouts 19a of the carrier element, or more precisely, the carrier unit 19 (see...). Figure 9 The notch 19a is achieved in such a way that it is possible for the contact element 10 to be deflected by a spring in the longitudinal device direction L1, or more precisely, in the longitudinal extension direction L of the test contact element 10.

[0115] Figure 8c A detailed view shows the manner in which the test contact element 10 is mounted on the printed circuit board 14a. For this purpose, the test contact element 10 rests on the printed circuit board 14a with its curved end section 2a, and thus establishes an electrical contact via a corresponding conductive trace 15a of one of the assigned contact sections 18 on the printed circuit board 14a (see [reference]). Figure 10c The lateral protruding lug 2b of the test contact element 10 engages in the recess 19b of the carrier unit 19, which is intended for engagement. Figure 8b As shown in the detailed view, the opposite ends of the test contact element 10, particularly its first contact area 1, at least partially abut against the guide section 12c of the inner housing 11 or the movable piston 27, or are linearly guided along the piston 27 in the longitudinal device direction L1.

[0116] Figure 10a , Figure 10b An alternative embodiment of a high-frequency test pin device 20 with test contact element 10 according to the present invention is shown, while omitting the external components of the outer housing 13 and inner housing 11 to improve the overview. Figure 10c It shows Figure 10a Detailed view of the corresponding printed circuit board 14a.

[0117] like Figure 10a , Figure 10bAs shown, in each case, multiple high-frequency test contact elements 10 are electrically connected to printed circuit boards 14a, 14b. The test contact elements 10 and the printed circuit boards 14a, 14b are arranged within the inner housing 11 in such a way that they extend substantially in or parallel to the longitudinal device direction L1. The corresponding longitudinal extension direction L of the test contact elements 10 (see...) Figure 1a It extends specifically parallel to the longitudinal direction of the device, L1. This essentially linear direction allows for optimal signal transmission from the contact mat 30 for signal tapping at the coupling section 9 located at the rear of the device.

[0118] Printed circuit boards 14a and 14b each have conductive traces 15a and 15b, which are disposed on the printed circuit boards and are used to connect the contact section 18 of the corresponding test contact element 10 for electrical contact with the corresponding coupling section 9. The conductive traces 15a and 15b disposed on the printed circuit boards preferably extend substantially in or parallel to the longitudinal device direction L1. The conductive traces 15a and 15b preferably extend in or parallel to the longitudinal direction L1 without having a bending section, bending portion, or bending element having a bending angle greater than 70°, more preferably greater than 45°.

[0119] The coupling section 9 of the printed circuit board for establishing external electrical contact with the test pin device is preferably arranged or formed in such a way that the corresponding conductors 17a, 17b coupled thereto extend substantially from the printed circuit boards 14a, 14b in the longitudinal device direction L1. The coupling section 9 preferably includes a contact element 9a, such as a solder contact location, for soldering to the provided external connector or conductor 9b, and thus providing a permanent connection. The connector, or more precisely the conductor 9b, may be at least partially disposed in a rectangular slot 16 extending in the longitudinal device direction L1 of the printed circuit board. Alternatively, the contact element 9b may also have a plug connector (not shown), which preferably extends in the longitudinal device direction L1 and is used to establish electrical contact via an assigned external plug connector 9b disposed in the rectangular slot 16 of the printed circuit boards 14a, 14b. Additionally, alternatively, the coupling section 9 may preferably have a plug connector 9a disposed on one end of the surface of the printed circuit board (see [link to relevant documentation]). Figure 10b ).

[0120] according to Figure 10a In the embodiment shown, the test pin device 20 has two opposing, particularly parallel, printed circuit boards 14a, 14b radially disposed outside the test contact element that is in electrical contact with it. The printed circuit boards 14a, 14b are oriented such that the conductive traces 15a, 15b disposed thereon are opposite to each other, i.e., facing each other.

[0121] according to Figure 10b In the embodiment shown, the test pin device 20 has two printed circuit boards 14a and 14b, which are arranged parallel to each other or directly adjacent to each other, and preferably substantially centrally located within the test pin device, i.e., along the central axis of the device. The conductive traces 15a and 15b of the printed circuit boards 14a and 14b are preferably arranged on opposite sides of each other. Test contact elements 10, which are electrically in contact with these circuit boards, are arranged radially relative to the device 20 on the outer side of the printed circuit boards 14a and 14b.

[0122] like Figure 10c As shown, the test contact element 10 establishes electrical contact with a corresponding contact segment 18 of the corresponding conductive trace 15a. The contact segment 18 preferably has a cross-sectional surface perpendicular to the conductive trace, or more precisely, the extension direction of the contact segment 18, which matches the cross-sectional surface of the end segment 2a of the test contact element 10 that contacts it, such that the deviation between the resulting total cross-sectional surface of the contacted element and the cross-sectional surface of the second contact area 2 of the high-frequency test contact element 10 adjacent to the end segment 2a is less than 20%, more preferably less than 15%, and even more preferably less than 10%. The conductive trace preferably has an enlarged cross-sectional surface relative to the contact segment, preferably outside the contact segment 18. Through its further extension, the conductive trace preferably has a substantially constant cross-sectional surface.

[0123] Figures 11a to 11c A side sectional view of another preferred embodiment of the high-frequency test pin device 10 is shown. Figure 11c The mold in the middle is represented as being orthogonal to Figure 11b The cross-section shown in the diagram is cut in the plane.

[0124] In this embodiment, the carrier unit, or more precisely, the insulating material 19, is implemented in two parts. Specifically, the carrier unit has a base body 19c, which is fixedly positioned within the inner housing as a non-movable unit, and printed circuit boards 14a, 14b are disposed on this base body, while also having guide elements 19d movable relative to the base body. Laterally disposed in the carrier unit, cutouts 19a for mounting and guiding the various test contact elements 10 are implemented to conform to the base body 19c and the guide elements 19d. Figure 11bAs shown, two lateral cutouts 19a face each other on each plane, with the carrier unit, or more precisely, the solid insulating material, disposed between them. A power storage device, specifically a third spring element 19e, is provided between the base body 19c and the guide element 19d. The third spring element 19e is implemented as a compression spring and provides a preload force on the guide element 19d toward the contact section, or more precisely, the contact pair to be electrically contacted.

[0125] The guide element 19d is preloaded as an abutment pin, or more precisely, a spring-loaded locating pin 28, which is substantially orthogonal to the direction of movement of the guide element, preferably disposed within the inner housing 11 for securing in its position, and disposed within an aperture 19e extending orthogonally to the direction of movement of the guide element 19d. For this purpose, the lateral or outer surface of the spring-loaded locating pin 28 serves as an abutment surface for the inner wall of the aperture 19e. The maximum stroke of the guide element 19d can also be limited by the interaction between the spring-loaded locating pin 18 and the relative inner walls of the aperture 19e.

[0126] In this first relative position, the corresponding contact segments 1a of the test contact elements 10 for establishing electrical contact with the contact mating object 30 are at least partially configured to be protected, preferably, within an opening 29 formed at one end of the guide element 19d, i.e., they do not protrude completely when the device is viewed from the side. In the second relative position of the guide element 19d, which moves toward the base body 19c against the preload force of the third spring element 19e, the contact segments 1a of the test contact elements 10 preferably protrude further into the allocated opening 29 than in the first relative position. The opening 29 at the aforementioned one end of the contact area 1a for the test contact elements 10 is preferably integrally formed with a corresponding laterally arranged slit-like cutout 19a for mounting and / or guiding the respective contact elements 10, or forms the front end segment of the cutout 19a (see...). Figure 12a , Figure 12b ).

[0127] The guide element 19d preferably includes at least one distal centering section 31 disposed on an end section of the guide element 19 assigned to the contact mating object 30 to be electrically contacted. The centering section 31 preferably includes at least one protrusion or recess, which is preferably centrally oriented in the contact section 12 of the device 20 and is formed to engage in a corresponding central recess or protrusion in the contact mating object 30 to be contacted upon electrical contact. Figure 12a , Figure 12bAs shown, the centering section 31 may include a front and a centrally located recess. Moreover, the centering section 31 has a plurality of protrusions 31a that are formed laterally toward the centrally located recess and are used to at least partially surround the partially protruding contact section 1a of the contact element 10.

[0128] like Figure 12a , Figure 12b As shown, the embodiment preferably has shortened contact elements 32 that make electrical contact with printed circuit boards 14a, 14b, similar to the high-frequency test contact elements 10. The contact elements 32 are preferably each positioned radially outward relative to the remaining high-frequency test contact elements 10. Specifically, the shortened contact elements 32 are positioned at four outer edges relative to the remaining test contact elements 10. The shortened contact elements 32 are configured to interact with a movable piston 27 such that there is no contact between the contact elements 32 and the piston 27 in a first relative position, and the contact elements 32 make electrical contact with the piston 27 in a second relative position, where force is applied, and thus signal tapping is possible via the piston 27, particularly via the mass block contact. Position-dependent contact occurs via a rearward and preferably annular or stepped contact protrusion 33 of the piston 27 (see [link to documentation]). Figure 11c At the relative position of the piston 27 and the spring deflection of the corresponding contact front side 32a, the shortened contact element 32 rests or pushes on the contact protrusion.

[0129] Figures 13a to 13c It shows that according to Figures 11a to 11c A partial lateral cross-sectional view of the movable piston 27 of the test pin device 20 when it is in electrical contact with the mating object 30, and when the movable piston 27 interacts with the shortened contact element 32 regardless of its position. (See attached image.) Figure 13a As shown, the contact mating element 30 can be initially centered by means of the centering section 12b of the device, or more precisely, the piston 27. Relative movement between the movable piston 27 and the inner and / or outer housings 11, 13 preferably has not yet occurred. The resulting positioning is also shown in... Figure 14a and Figure 15a In the corresponding detailed view. However, especially when the offset of the contact mating object 30 relative to the piston 27 is more pronounced, the movable piston 27 can be partially spring deflected relative to the remaining inner housing 11a against the spring force of the second spring element 23.

[0130] like Figure 13bAs shown, when force continues to be applied to the device 20 in the direction of the contact pair 30, the movable piston 27 overcomes the spring force of the second spring element, or more precisely, the spring force of the second spring element 23 circumferentially distributed relative to the remaining inner housing 11, and is spring deflected. After the piston 27 has traveled a predetermined stroke, the piston establishes electrical contact with the shortened contact element 32 via its rearward contact protrusion 33, and the shortened contact element 32 is thus connected to the contact pair 30, particularly to the mass block contact of the contact pair, for signal transmission. In this case, the shortened contact element 32, via its elastic region 3, constitutes an additional means for applying force to the piston 27 in the longitudinal device direction L due to its inherent spring effect. With the relative movement of the piston 27 described above, when in electrical contact with the contact pair 30, the guide element 19d of the carrier unit 19 is spring deflected. In this case, by means of the centering section 31 of the guide element 19d, the contact pair 30 can be further centered or optimized in the direction toward the device 20. The resulting position is in Figure 14b As shown in the image.

[0131] In a preferred embodiment, the first spring element 21 disposed between the inner housing 11 and the outer housing 13 has a stronger spring force than the second spring element 23, or more precisely, than the combined spring force of the second spring element 23 disposed between the movable piston 27 and the base body 11a of the inner housing 11 and / or the carrier unit base body 19c. This delays the deformation and spring deflection of the first spring element 21 relative to the second spring element 23 upon electrical contact of the contact mating objects 30. In particular, the (plural) second spring elements 23 and therefore the movable piston 27 preferably spring deflection relative to the carrier unit base body 19c first, and the first spring element 21 and therefore the inner housing 11 are spring deflected only after another and / or stronger force has been applied.

[0132] exist Figures 15a to 15c and corresponding Figure 16a , Figure 16b In this context, the alternative contact pair 30 and the electrical contact of the device 20 according to another preferred embodiment of the invention are shown as similar to... Figures 13a to 13c The above-described embodiment is shown in the figure. This alternative embodiment essentially corresponds to the above-described device, with differences that will be described below.

[0133] The movable piston 27 of this embodiment has a contact protrusion 27a radially outward of the centering section 12b, the contact protrusion 27a tapering towards the contact mating element 30 relative to its outer contour. The contact protrusion 27a is formed for engagement in a corresponding intended opening or cutout 30a of the contact mating element 30, and preferably has at least two opposing bevels, which are preferably arranged in opposite directions adjacent to the bevels of the centering section 12b and located radially outward therefrom. The centering section 12b may be a separate component and is implemented as an attachment element 27b on a distal end of the movable piston 27. The centering section 27a is preferably integrally formed with the remaining piston 27 and is preferably used to establish a mass block contact with the contact mating element 30, particularly via a position-related interaction between the piston 27 and the shortened contact element 32, as previously discussed. Figures 13a to 13c As stated above.

[0134] From the corresponding Figure 16a , Figure 16b As can be seen, the guide element 19d has a distal centering section 31, which, unlike the embodiment described above, is implemented as a front central protrusion and engages in the central opening or cutout 30b of the contact mating member 30 upon contact establishment. The opposing lateral surfaces of the protrusion 31 taper towards the contact mating member 30, allowing for optimal guidance upon contact establishment.

[0135] In this embodiment, the contact section 1a of the corresponding contact element 10 is inverted U-shaped. This allows for optimal electrical contact with the contact elements 30c of the contact mating pair 30 protruding in the direction of the device 20. The inverted U-shape particularly allows for improved alignment of the individual contact elements 30c during contact.

[0136] Figures 17a to 17c A perspective view of a preferred embodiment of the test contact attachment 40 according to the present invention is shown, as well as a corresponding side view when it is attached to a test pin device. Figure 18a , Figure 18b A corresponding cross-sectional view of the test contact attachment 40 is shown.

[0137] Viewed from the side, the test contact attachment 40 has a substantially L-shaped housing having a first housing section 41 and a second housing section 42 connected thereto and extending away from the first housing section 41. The first housing section is preferably plate-shaped and / or has thin walls and extends along the longitudinal direction L2 of the attachment 40. The second housing section 42 preferably extends substantially orthogonal to the longitudinal direction L2 and in this case has a cutout 43 extending in the longitudinal direction L2 for receiving a section 12 of the test pin device 20 disposed at one end. The inner contour of the cutout 43 is preferably adapted to the outer contour of the contact section 12 of the device 20 to be received. Thus, the test contact attachment 40 can slide onto the contact section 12 of the test pin device 20 disposed at one end and be selectively secured to the test pin device 20 by means of a connecting element 48 disposed on the first housing section 41 (see...). Figure 17c ).

[0138] Radially outward from the receiving portion 43, the second housing section 42 has a contact section 44 for establishing non-permanent contact with a contact mating object (not shown). The contact section 44 preferably protrudes from a flat surface 46 of the second housing section 42, which is disposed at one end and extends orthogonally to the longitudinal direction L2, and is at least partially designed to be resilient in the longitudinal direction L2. In this case, the contact section 44 may include at least one electrical conductor 45a, which is resiliently mounted and / or guided in the receiving portion 45b of the second housing section 42 extending parallel to the cutout 43. According to... Figure 18a In this embodiment, the axial elasticity of conductor 45a is achieved via a segment 51 of conductor 45a, which is stored in a curved shape and is at least partially movably mounted within the curved housing segment 51a in the longitudinal direction L2. Electrical conductor 45a preferably extends through the entire housing 41, 42 and is connected to the opposite housing side using a contact element 47 for establishing external contact with test contact attachment 40. Contact element 47 can be implemented as a plug connector, for example, for establishing external electrical contact between contact segment 44 and outer conductor 49.

[0139] According to Figure 18b In an alternative embodiment, the axial elasticity of the contact section 44 is achieved by contact pins 45a', which are preferably spring-loaded on both sides and disposed in corresponding receiving portions 45b. The contact pins 45a can make electrical contact with a conductor or circuit board 50 disposed in the second housing section 42. The circuit board 50 can be connected to an external conductor 49 by means of provided contact elements 47.

[0140] The contact attachments according to the invention allow for selective extension and adaptation of the test pin device according to the invention, depending on the contact mating to be tested. In particular, the test pin device can be used to easily test additional test matings simultaneously, which are, for example, positioned directly adjacent to the contact mating to be tested by the test pin device.

[0141] List of reference numerals

[0142] 1. First contact area

[0143] 1a Contact section

[0144] 2 Second contact area

[0145] 2a Curved end section

[0146] 2b Convex ear

[0147] 3. Flexible area

[0148] 4a,b Connecting elements

[0149] 5. Cavity

[0150] 6a,b Curved sections

[0151] 7 Connecting Bridge

[0152] 8a-d Bending elements

[0153] 9. Coupling Section

[0154] 9a Contact element

[0155] 9b External conductor

[0156] 10 High-frequency test contact elements

[0157] 10a Thin sheet-shaped base body

[0158] 11 Inner shell

[0159] 11a Inner shell base body

[0160] 11a-e Components of the inner shell

[0161] 12 Contact Section

[0162] 12a Centering Section

[0163] 12b Centering Inclined Plane

[0164] 12c Guide Section

[0165] 13. Outer shell

[0166] 13a Flange

[0167] 13b Connecting element

[0168] 14a,b Printed Circuit Boards

[0169] 15a,b Conductive traces

[0170] 16 Rectangular slits

[0171] 17a,b Electrical conductors

[0172] 18 Contact Section

[0173] 19 Carrier units, plastic main body

[0174] 19a Cutout of carrier element

[0175] 19b Incision for the protruding ear

[0176] 19c Base Body

[0177] 19d guiding element

[0178] 19e Third Spring Element

[0179] 19f Hole for spring locating pin

[0180] 20 Test Pin Equipment

[0181] 21 First Spring Element

[0182] 22a,b Threaded fasteners

[0183] 23 Second Spring Element

[0184] 24 Support Shaft Section

[0185] 24a protrusion

[0186] 24b Centering Section

[0187] 25 guide recess

[0188] 25a Depression

[0189] 25b Enlarged section of the outer casing

[0190] 26a,b Annular protrusions

[0191] 27. Movable piston

[0192] 27a Contact slope

[0193] 27b Piston attachment element

[0194] 28 Spring locating pins

[0195] 29. Opening at the middle end of the guide element

[0196] 30 Contact Pairing

[0197] 30a Cuttings in contact with the mating material

[0198] 30b central incision

[0199] 31. Centering Section

[0200] 31a protrusion

[0201] 32. Shortened contact element

[0202] 32a Contact front side

[0203] 33 Contact protrusion

[0204] 34. Immovable piston

[0205] 34a Inner protrusion

[0206] 40 Test contact attachments

[0207] 41 First Shell Section

[0208] 42 Second shell section

[0209] 43 Incision

[0210] 44 Contact Section

[0211] 45A electrical conductor

[0212] 45a′ spring is mounted on contact pins on both sides

[0213] 45b Receiving Section

[0214] 46 Surface

[0215] 47 Contact Unit

[0216] 49 External conductor

[0217] 50 conductors, circuit boards

[0218] 48 Connecting elements

[0219] 51. Bending section of conductor

[0220] 51a Curved shell section

[0221] α 1,2 ,β 1,2 Bending angle

[0222] b1 wide first contact area

[0223] b2 wide second contact area

[0224] b3 Total thickness of the elastic region

[0225] F 1-3 Cross-sectional surface

[0226] L longitudinal extension direction

[0227] L1 Longitudinal Equipment Direction

[0228] L2 Attachment Longitudinal Direction

[0229] t is the thickness of the base body.

[0230] V extension direction

Claims

1. A high-frequency test contact element (10) for detachably contacting a contact mating object with a high-frequency test pin device (20), the high-frequency test contact element (10) comprising a sheet-shaped substrate body (10a), the sheet-shaped substrate body (10a) having a first contact area (1) at one end for establishing contact with a contact mating object (30), an opposing second contact area (2) for establishing electrical contact with the high-frequency test pin device (20) accommodating the high-frequency test contact element (10), and an intermediate tortuous elastic region (3) having a cavity (5) extending along the extending direction (V) of the elastic region for suspension along the longitudinal extending direction (L) of the high-frequency test contact element (10), characterized in that, The zigzag elastic region (3) has a plurality of bending elements that follow each other in the extension direction (V) and have corresponding bending angles of 5° to 70°, and the high-frequency test contact element (10) is formed and / or designed as an integral part.

2. The high-frequency test contact element (10) according to claim 1, characterized in that, The tortuous elastic region (3) has two bending segments that follow each other in the extension direction (V), and each bending segment has two consecutive opposing bending elements, each bending element having a substantially the same corresponding bending angle.

3. The high-frequency test contact element (10) according to claim 1, characterized in that, The tortuous elastic region (3) has a first bending segment (6a) and a second bending segment (6b), wherein the bending element of the first bending segment (6a) has a corresponding bending angle of 40° to 70°, and / or the bending element of the second bending segment (6b) has a corresponding bending angle of 5° to 25°.

4. The high-frequency test contact element (10) according to claim 1, characterized in that, The elastic region (3) has a total cross-sectional surface that is uniform in the extension direction (V) and deviates from the cross-sectional surface of the corresponding adjacent segments of the first contact region (1) and / or the second contact region (2) by less than 20%.

5. The high-frequency test contact element (10) according to claim 1, characterized in that, The tortuous elastic region has at least one connecting bridge (7), and the cavity (5) extending along the extension direction (V) is interrupted at the at least one connecting bridge (7).

6. The high-frequency test contact element (10) according to claim 1, characterized in that, The second contact area (2) has a curved end section (2a) formed on the high-frequency test pin device (20) for establishing at least partially elastic electrical contact with the contact section (18) and has a smaller cross-sectional surface than the remaining second contact area (2).

7. A high-frequency test pin device (20) for detachably connecting a multi-pole contact mating object (30), the high-frequency test pin device (20) comprising an inner housing (11) and an outer housing (13), the inner housing (11) having a contact section (12) at one end for interacting with the contact mating object (30) to achieve a testing purpose, the inner housing (11) being at least partially and relative to the outer housing (13) along a longitudinal device direction (L1) in such a way that the inner housing is configured to be fixed in its position in a non-contact first relative position and to be at least partially movably mounted relative to the outer housing (13) in a second relative position to make electrical contact with a second contact mating object (30). The high-frequency test pin device (20) has at least one printed circuit board (14a, 14b) and a plurality of high-frequency test contact elements (10) according to any one of claims 1 to 6, wherein at least one of the printed circuit boards (14a, 14b) has a contact element (9a) for establishing external electrical contact with the high-frequency test pin device (20), the plurality of high-frequency test contact elements (10) contact the printed circuit board (14a, 14b) and extend toward the contact section (12) of the inner housing (11), the printed circuit board (14a, 14b) and the high-frequency test contact elements (10) being arranged in the inner housing (11) in such a way that the printed circuit board and the high-frequency test contact elements extend substantially in the longitudinal device direction (L1); The high-frequency test contact element (10) is formed and / or designed as an integral component.

8. The high-frequency test pin device (20) according to claim 7, characterized in that, The conductive traces (15a, 15b) disposed on the printed circuit board (14a, 14b) extend substantially in the longitudinal device direction (L1) and do not have curved sections with a bending angle greater than 45° relative to the longitudinal device direction (L1).

9. The high-frequency test pin device (20) according to claim 7 or 8, characterized in that, The contact element (9a) is configured such that the corresponding conductors (17a, 17b) connected thereto extend substantially in the longitudinal device direction (L1) for establishing external electrical contact with the high-frequency test pin device (20).

10. The high-frequency test pin device according to claim 7, characterized in that, The corresponding contact segments (18) of the conductive traces (15a, 15b) of the printed circuit board (14a, 14b) have cross-sectional surfaces that are coordinated with the cross-sectional surfaces of the end segments (2a) of the high-frequency test contact element (10) in such a way that the resulting total cross-sectional surface deviates less than 20% from the cross-sectional surface of the adjacent second contact area (2) of the high-frequency test contact element (10).

11. The high-frequency test pin device according to claim 7, characterized in that, The high-frequency test pin device (20) has two opposing printed circuit boards that are radially disposed on the outside of the test contact element (10) in contact with it.

12. The high-frequency test pin device according to claim 7, characterized in that, The high-frequency test pin device (20) has two adjacent printed circuit boards or a printed circuit board with conductive traces (15b) disposed on opposite sides, the conductive traces (15b) being substantially centrally disposed in the high-frequency test pin device.

13. The high-frequency test pin device according to claim 7, characterized in that, The high-frequency test pin device (20) has insulating material disposed between each high-frequency test contact element (10).

14. The high-frequency test pin device according to claim 7, characterized in that, The contact section (12) of the high-frequency test pin device has a contact section on one end and is elastically mounted in the longitudinal device direction (L1).

15. The high-frequency test pin device according to claim 7, characterized in that, The inner housing (11) and the outer housing (13) are preloaded against each other at the first relative position by means of a first spring element (21), and / or wherein the inner housing (11) has a piston (27) disposed at one end for mobility, and the spring force of a second spring element (23) is applied to the piston, and the contact section (12) of the high-frequency test pin device (20) is formed at the end of the piston.

16. The high-frequency test pin device according to claim 7, characterized in that, The carrier unit (19) has the contact section (12) assigned to the high-frequency test pin device (20) and a guide element (19d) movable relative to the rearward carrier unit base body (19c); and a power storage device assigned between the carrier unit base body (19c) and the guide element (19d).

17. The high-frequency test pin device according to claim 7, characterized in that, The movable piston (27) of the inner housing (11) is designed to be able to connect, depending on its position, to the shortened contact element (32) of the high-frequency test pin device (20), the shortened contact element (32) being arranged parallel to the high-frequency test contact element (10).

18. The high-frequency test pin device according to claim 16, characterized in that, The first spring element (21) of the high-frequency test pin device (20) disposed between the inner housing (11) and the outer housing (13) has a stronger spring force than the second spring element (23) disposed between the movable piston (27) of the inner housing (11) and the base body (11a) of the inner housing (11).

19. The high-frequency test pin device according to claim 18, characterized in that, The power storage device includes a third spring element (19e), the first spring element (21) and the second spring element (23) having a stronger spring force than the third spring element (19e), the third spring element (19e) being disposed between the carrier unit base body (19c) and the guide element (19d) of the carrier unit (19) assigned to the high-frequency test contact element (10).

20. A test contact attachment (40) for a high-frequency test pin device (20) according to any one of claims 7 to 19, the test contact attachment (40) comprising a first housing section (41) extending in a longitudinal direction (L2) and having a connecting element (48) for selectively connecting to the high-frequency test pin device (20), and having a second housing section (42) at one of its protruding ends. The second housing section (42) includes a cutout (43) extending in the longitudinal direction (L2) for receiving a contact section (12) of the high-frequency test pin device (20) at one end, and includes an attachment contact section (44) radially disposed outside the cutout (43) for establishing a non-permanent electrical contact with a contact mating element. The attachment contact section (44) is at least partially elastically formed in the longitudinal direction (L2) relative to the second housing section (42); The test contact attachment (40) is formed and / or designed as an integral part.

21. The test contact attachment according to claim 20, characterized in that, The attachment contact section (44) includes at least one electrical conductor (45a) which is at least partially resiliently mounted in a receiving portion (45b) in the second housing section (42) and the receiving portion (45b) extends parallel to the cutout (43).

22. The test contact attachment according to claim 20, characterized in that, The attachment contact section (44) includes at least one contact pin (45a'), which is spring-loaded on both sides and disposed in a receiving portion (45b) arranged parallel to the cutout (43).

23. The test contact attachment according to claim 20, characterized in that, The first housing section (41) includes an electrical conductor contact element (47) that is opposite to and electrically connected to the attachment contact section (44) in order to establish external electrical contact with it.

24. The test contact attachment according to claim 20, characterized in that, When viewed from the side, the first housing section (41) and the second housing section (42) are arranged in a substantially L-shape.

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