A current testing device and method

Abstract

The present invention relates to the field of current testing, and specifically discloses a current testing device and method. A gold finger slot and a power connector are provided on the adapter card. The gold finger on the GPU card is inserted into the gold finger slot, and the power connector is connected to the external power connector on the GPU card. The power supply outputs the first power supply through the first cable and connects it to the gold finger slot, and outputs the second power supply through the second cable and connects it to the power connector, so that the first power supply and the second power supply supply power to the GPU card. A first resistor is provided on the first cable, and a second resistor is provided on the second cable. The voltage collector collects the average voltages of the first resistor and the second resistor within a preset time period and outputs them to the upper computer. The upper computer calculates the average currents flowing through the first resistor and the second resistor based on the average voltages of the first resistor and the second resistor, and obtains the EDPP current of the GPU card within the preset time period. The present invention provides accurate current test data, and the test method is simple and efficient, which is convenient for scheme selection and system design.

Description

Technical Field

[0001] The present invention relates to the field of current testing, and particularly to a current testing device and method. Background Art

[0002] Currently, for mainstream graphics card manufacturers (hereinafter all referred to as GPU cards), the developed GPU cards all have a performance parameter called EDPP (Electrical Date Peak Processing). The specific definition is: under certain test conditions, when the GPU card is working and the performance of the GPU chip can reach more than 90%, the average current of the 12V power supply input to the GPU card within 200us / 1ms / 5ms respectively is called the EDPP of the GPU card.

[0003] In different system configurations of the server, GPU cards from different manufacturers may be used. Designers can refer to the EDPP data according to the GPU card specification provided by the manufacturer to guide system design, such as the selection of AC power supply, the OCP design of the system, the power consumption allocation design, etc. However, under some special application conditions, or when the existing GPU cards cannot meet the special requirements of customers, it is necessary to develop a GPU card with special functions or stronger computing power by oneself. The EDPP current of this kind of GPU card cannot be obtained from the GPU card specification, and designers need to test it by themselves.

[0004] Figure 1 It is a schematic diagram of the power supply structure of the GPU card. The 12V power supply of the GPU card is divided into two paths. The first path is from the X16 PCIE gold finger slot on the motherboard, through the gold finger for power supply. The second path is from the external power connector, which is connected to the motherboard through a cable.

[0005] One of the current testing methods is to use a current gun for testing. However, the current gun can only measure the current magnitude on the cable and cannot measure the total 12V current supplied to the GPU card. Another current testing method is that the motherboard can read the current register of the power monitor on the GPU card through the I2C interface of the X16 PCIE gold finger on the GPU card to obtain the 12V current value, or read the current register of the power monitor on the motherboard that only supplies 12V to the GPU card.

[0006] The current current testing method has the following defects for testing the EDPP current of the GPU card: 1) The definition of EDPP is the average current of the input 12V within 200us / 1ms / 5ms. Under the existing applications and testing conditions, using a current gun, only the 12V current data of the cable can be measured; 2) The current register of the 12V power monitor is the average current over a period of time, and there will be a delay in I2C communication. Using the method of reading the current register, the transient current cannot be obtained, and there will be a large difference between the read data and the actual EDPP data. Summary of the Invention

[0007] To solve the above problems, the present invention provides a current testing device and method, which can provide accurate current testing data, and the testing method is simple and efficient, facilitating scheme selection and system design.

[0008] In a first aspect, the technical solution of the present invention provides a current testing device, including: an adapter card, a power supply, a host computer, and a voltage collector;

[0009] The adapter card is provided with a gold finger slot and a power connector, where the gold finger slot is used to plug in the gold fingers on the GPU card, and the power connector is used to connect to the external power connector on the GPU card;

[0010] The power supply supplies power to the adapter card, and outputs a first power supply connected to the gold finger slot through a first cable, and outputs a second power supply connected to the power connector through a second cable, so that the first power supply and the second power supply supply power to the GPU card; a first resistor is provided on the first cable, and a second resistor is provided on the second cable;

[0011] The voltage collector collects the average voltages of the first resistor and the second resistor within a preset duration and outputs them to the host computer. The host computer calculates the average currents flowing through the first resistor and the second resistor based on the average voltages of the first resistor and the second resistor, and obtains the EDPP current of the GPU card within the preset duration.

[0012] Further, the voltage collector uses an oscilloscope.

[0013] Further, coaxial cable connectors are respectively provided on both sides of the first resistor on the first cable, and the two coaxial cable connectors are connected to the corresponding channels of the oscilloscope through coaxial cables, so that the oscilloscope obtains the voltage values at the two coaxial cable connectors, and the oscilloscope calculates the difference between the two voltage values to obtain the voltage of the first resistor;

[0014] Coaxial cable connectors are respectively provided on both sides of the second resistor on the second cable, and the two coaxial cable connectors are connected to the corresponding channels of the oscilloscope through coaxial cables, so that the oscilloscope obtains the voltage values at the two coaxial cable connectors, and the oscilloscope calculates the difference between the two voltage values to obtain the voltage of the second resistor.

[0015] Further, the host computer also communicates with the GPU card. After the GPU card is powered on, the host computer controls the GPU card to reach the working conditions for testing the EDPP current.

[0016] Further, a USB-to-I2C chip is also provided on the adapter card. The USB interface of the host computer is connected to the USB-to-I2C chip, and the USB-to-I2C chip is connected to the gold finger slot on the adapter card to realize the communication between the host computer and the GPU card.

[0017] Further, the power supply uses a PSU power supply, and a PSU connector is provided on the adapter board to connect to the PSU power supply.

[0018] Further, a cooling fan is also provided on the adapter card.

[0019] In a second aspect, the technical solution of the present invention provides a current testing method, including the following steps:

[0020] [[ID=1--17]]Connect the adapter card, the power supply, the host computer, the voltage collector, and the GPU card;

[0021] Start the power supply to supply power to the adapter card and the GPU card;

[0022] The host computer sends an instruction to make the GPU card reach the working conditions for testing the EDPP current;

[0023] The voltage collector collects the average voltages of the first resistor and the second resistor within a preset duration and transmits them to the host computer;

[0024] The host computer calculates the average currents flowing through the first resistor and the second resistor according to the average voltages of the first resistor and the second resistor, and obtains the EDPP current of the GPU card within the preset duration.

[0025] Further, the method specifically includes:

[0026] Configure multiple preset durations;

[0027] The voltage collector collects the average voltages of the first resistor and the second resistor within one of the preset durations, so that the host computer obtains the EDPP current of the GPU card within the preset duration;

[0028] Judge whether the EDPP currents within all the preset durations have been obtained;

[0029] If not, the voltage collector continues to collect the average voltages of the first resistor and the second resistor within the next preset duration, so that the host computer obtains the EDPP current of the GPU card within the next preset duration;

[0030] If so, the host computer sends an instruction to make the GPU card stop working.

[0031] Further, the voltage collector collects the average voltage of the resistor within a preset time period, which specifically includes:

[0032] Collect two voltage values on both sides of the resistor on the cable where the resistor is located;

[0033] Calculate the difference between the two voltage values to obtain the voltage of the resistor;

[0034] The resistor includes a first resistor and a second resistor.

[0035] A current testing device and method provided by the present invention have the following beneficial effects compared with the prior art: A transfer card is set to be connected to the GPU card, and two power supplies are supplied to the GPU card by the power supply through the transfer card. Resistors are configured on the two power supply lines. By collecting the voltage of the resistors, the current is calculated, so as to obtain the actual real-time average current flowing into the GPU card and obtain the accurate EDPP current. The device of the present invention has a simple structure, low cost, a simple and efficient testing method, realizes the automatic acquisition of accurate EDPP current, has high testing efficiency, saves manpower, is applicable to the research and development of GPU cards with different architectures and platforms, and provides an accurate basis for the system design, power consumption distribution, selection of PSU, etc. of each project. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] In order to more clearly illustrate the technical solutions of the embodiments of the present application or the prior art, the following will briefly introduce the drawings required to be used in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0037] Figure 1 It is a schematic diagram of the power supply structure of the GPU card.

[0038] Figure 2 It is a schematic diagram of the structure of a current testing device provided by an embodiment of the present invention.

[0039] Figure 3 It is a schematic diagram of the structure of a preferred embodiment of a current testing device provided by an embodiment of the present invention.

[0040] Figure 4 It is a schematic diagram of the flow of a current testing method provided by an embodiment of the present invention.

[0041] Figure 5 It is a schematic diagram of the flow of a specific embodiment of a current testing method provided by an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0042] The following explains some English terms related to the present invention.

[0043] GPU card: Graphics Processing Unit Card, video card.

[0044] EDPP: Electrical Data Peak Processing, power supply data peak processing.

[0045] GPIB: General Purpose Interface Bus, general - purpose interface bus.

[0046] Power Monitor: Power monitor.

[0047] To enable those skilled in the art to better understand the solution of this application, the following further detailed description of this application will be given in conjunction with the accompanying drawings and specific implementation manners. Obviously, the described embodiments are only a part of the embodiments of this application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.

[0048] Figure 2 It is a schematic structural diagram of a current - testing device provided by an embodiment of the present invention, including: an adapter card, a power supply, a host computer, and a voltage collector.

[0049] The adapter card is provided with a gold - finger slot and a power connector. The gold - finger slot is used to plug the gold - finger on the GPU card, provide a path of power to the GPU card, and send instructions to the GPU card when necessary; the power connector is used to connect with the external power connector on the GPU card. The power connector on the adapter card is connected to the external power connector on the GPU card through a cable to provide another path of power to the GPU card.

[0050] The power supplies of the adapter card and the GPU card are both supplied by the power supply. The power supply not only supplies power to the adapter card, but also outputs a first path of power connected to the gold - finger slot through a first cable, and outputs a second path of power connected to the power connector through a second cable, so that the first path of power and the second path of power supply power to the GPU card. It can be understood that the first path of power supplies power to the GPU card through the gold - finger, and the second path of power supplies power to the GPU card through the external power connector, realizing two - path power supply for the GPU card.

[0051] To obtain the EDPP current, a first resistor R1 is set on the first cable, and a second resistor R2 is set on the second cable. The EDPP current of the GPU card can be obtained by collecting the current flowing through the first resistor R1 and the second resistor R2 in real - time.

[0052] In this embodiment, the EDPP current is finally obtained by collecting the voltages of the first resistor R1 and the second resistor R2 and then calculating the current based on the voltage. Specifically, the voltage collector collects the average voltages of the first resistor R1 and the second resistor R2 within a preset time period and outputs them to the host computer. The host computer calculates the average currents flowing through the first resistor R1 and the second resistor R2 based on the average voltages of the first resistor R1 and the second resistor R2, and obtains the EDPP current of the GPU card within the preset time period.

[0053] It should be noted that the host computer has obtained the average voltages of the first resistor R1 and the second resistor R2, and the resistance values of the first resistor R1 and the second resistor R2 are also known in advance. Therefore, based on the formula I = V / R for simple calculation, the average currents flowing through the first resistor R1 and the second resistor R2 can be obtained, and then the EDPP current of the GPU card within the preset time period can be obtained.

[0054] A current testing device provided by an embodiment of the present invention is configured to connect a transfer card to a GPU card, and the power supply supplies two paths of power to the GPU card through the transfer card. Resistors are configured on the two power supply lines, and the current is calculated by collecting the voltages of the resistors, so as to obtain the actual real-time average current flowing into the GPU card and obtain an accurate EDPP current. The device has a simple structure, low cost, a simple and efficient testing method, can automatically obtain an accurate EDPP current, has high testing efficiency, saves manpower, is applicable to the research and development of GPU cards with different architectures and platforms, and provides an accurate basis for system design, power consumption distribution, and PSU selection for each project.

[0055] Based on the above embodiment, a preferred embodiment is provided below. Figure 3 It is a schematic structural diagram of the preferred embodiment. Among them, the voltage collector uses an oscilloscope, the power supply uses a PSU power supply, and a cooling fan is also provided on the transfer card to cool the transfer card. In addition, it can be understood that to test the EDPP current of the GPU card, the GPU card needs to reach the corresponding working conditions (the performance of the GPU chip can be exerted to more than 90%). As a preferred implementation method, the host computer communicates with the GPU card to give instructions to the GPU card to make the GPU card reach the corresponding working conditions.

[0056] First, the voltage collector using an oscilloscope is described. Each channel of the oscilloscope only collects the voltage value at one point. Therefore, in order to collect the voltage across a resistor, it is necessary to collect the voltage values at two points on both sides of the resistor, and then take the difference between these two voltage values to obtain the resistor voltage. Specifically, on the first cable, coaxial cable connectors are respectively arranged on both sides of the first resistor R1. The two coaxial cable connectors are connected to the corresponding channels of the oscilloscope via coaxial cables, so that the oscilloscope obtains the voltage values at the two coaxial cable connectors, and the oscilloscope calculates the difference between the two voltage values to obtain the voltage of the first resistor R1; on the second cable, coaxial cable connectors are respectively arranged on both sides of the second resistor R2. The two coaxial cable connectors are connected to the corresponding channels of the oscilloscope via coaxial cables, so that the oscilloscope obtains the voltage values at the two coaxial cable connectors, and the oscilloscope calculates the difference between the two voltage values to obtain the voltage of the second resistor R2.

[0057] In this preferred embodiment, the power supply uses a PSU power supply. Therefore, a PSU connector is correspondingly arranged on the adapter card to connect to the PSU power supply to supply power to the adapter card and the GPU card.

[0058] In this preferred embodiment, the host computer communicates with the GPU card to control the GPU card. After the GPU card is powered on, it controls the GPU card to reach the working conditions for testing the EDPP current. To achieve this function, a USB-to-I2C chip is arranged on the adapter card. The USB interface of the host computer is connected to this USB-to-I2C chip via a USB cable, and this USB-to-I2C chip is connected to the gold finger slot on the adapter card. The host computer can control the operation of the GPU card through USB-to-I2C and then through the gold finger.

[0059] The functions of the components on the adapter card are as follows:

[0060] 1) PSU connector: Connects to the PSU power supply to supply power to the adapter card and the GPU card.

[0061] 2) USB-to-I2C chip: Used for the connection conversion between the host computer and the adapter card, and then controls the operation of the GPU card through the I2C bus.

[0062] 3) Gold finger slot (X16 PCIE SLOT): Used to connect to the GPU card, playing the role of power supply and signal connection.

[0063] 4) Power connector: Used to supply power to the external power connector of the GPU card, and the two are connected by a cable.

[0064] 5) Two precision resistors (first resistor R1 / second resistor R2): Used to test the voltage across the resistor. The oscilloscope respectively calculates the voltage differences across R1 and R2, and transmits the data back to the host computer via GPIB. The host computer calculates the current value using the formula I = △V / R based on the voltage difference and the resistances of R1 and R2.

[0065] 6) Heat dissipation fan: cools down the adapter card.

[0066] The current test device of this preferred embodiment includes three parts: a host computer, an oscilloscope, and an adapter card.

[0067] Host computer: used to control the operation of the GPU card and collect test data.

[0068] Oscilloscope: used to measure the voltage differences of two precision resistors (R1, R2) of 12V respectively to the GPU card's gold fingers and the external power connector, and transmit the data to the host computer through the GPIB interface.

[0069] Adapter card: used to supply power to the GPU card and send instructions, and provide two 12V voltage detection points and test points for the GPU card.

[0070] When conducting the test, the GPU card is inserted into the gold finger slot of the adapter board. At the same time, the external power connector of the GPU card is also powered by the adapter board, and the two are connected by a power supply cable; the host computer is connected to the adapter board with a USB cable. There is a USB-to-I2C chip on the adapter board. The host computer can control the operation of the GPU card to be tested through USB-to-I2C and then through the gold fingers; the oscilloscope is connected to the host computer through a GPIB cable; two BNC connectors are placed at both ends of R1 and R2 on the adapter board and connected to the oscilloscope through coaxial cables. The oscilloscope collects four voltage values. The voltage difference of R1 is CH2 - CH1, and the voltage difference of R2 is CH3 - CH4. This data is transmitted to the host computer through the GPIB cable. The host computer calculates the current value using the formula I = △V / R based on the voltage difference and the resistance values of R1 and R2, so as to obtain the EDPP current of the GPU card.

[0071] In the above text, an embodiment of a current test device has been described in detail. Based on the current test device described in the above embodiment, the embodiment of the present invention also provides a current test method corresponding to this device.

[0072] Figure 4 It is a schematic flow diagram of a current test method provided by an embodiment of the present invention. This method includes the following steps.

[0073] S1, connect the adapter card, power supply, host computer, voltage collector, and GPU card.

[0074] Connect according to the structure of the current test device in the above embodiment.

[0075] S2, start the power supply to supply power to the adapter card and the GPU card.

[0076] S3, the host computer sends instructions to make the GPU card reach the working conditions for testing the EDPP current.

[0077] In S4, the voltage collector collects the average voltages of the first resistor R1 and the second resistor R2 within a preset duration and transmits them to the host computer.

[0078] In S5, the host computer calculates the average currents flowing through the first resistor R1 and the second resistor R2 based on the average voltages of the first resistor R1 and the second resistor R2, and obtains the EDPP current of the GPU card within a preset duration.

[0079] It can be understood that testing the EDPP current requires configuring multiple preset durations. To implement the EDPP current test for multiple preset durations, the above steps S4 and S5 are specifically implemented through the following steps.

[0080] Step 1: The voltage collector collects the average voltages of the first resistor R1 and the second resistor R2 within one of the preset durations, so that the host computer obtains the EDPP current of the GPU card within this preset duration.

[0081] Step 2: Determine whether the EDPP currents within all preset durations have been obtained.

[0082] Step 3: If not, the voltage collector continues to collect the average voltages of the first resistor R1 and the second resistor R2 within the next preset duration, so that the host computer obtains the EDPP current of the GPU card within this next preset duration.

[0083] Step 4: If so, the host computer sends an instruction to make the GPU card stop working.

[0084] For example, sort the multiple preset durations. First, measure the EDPP current of the first preset duration. After obtaining the EDPP current, determine whether the EDPP currents of all preset durations have been obtained. If not, continue with the second one until the EDPP currents of all preset durations have been obtained.

[0085] When the voltage collector uses an oscilloscope, the voltage collector collects the average voltage of the resistor within a preset duration, specifically including: collecting two voltage values on both sides of the resistor on the cable where the resistor is located; calculating the difference between the two voltage values to obtain the voltage of the resistor; where the resistor includes the first resistor R1 and the second resistor R2.

[0086] To further understand the present invention, the following provides a specific embodiment of a current test method. Figure 5 It is a schematic diagram of the process of this specific embodiment, including the following steps.

[0087] (1) According to the schematic of Figure 3 , correctly connect the host computer, the adapter card, the PSU power supply, the GPU card, and the oscilloscope.

[0088] (2) Connect the AC power cord to supply power to the adapter card and the GPU card.

[0089] After the adapter card is powered on, the fan starts and works.

[0090] The PSU 12V on the adapter card passes through R1 to supply power to the gold finger slot P12V_1. The PSU 12V passes through R2 to supply power to the power connector P12V_2. Eventually, both P12V_1 and P12V_2 supply power to the GPU card.

[0091] (3) The host computer sends commands to the GPU card through the USB interface, via the adapter card, and through the I2C of the gold finger, enabling the GPU card to reach the working conditions for testing the EDPP current.

[0092] After the adapter card and the GPU card are powered on, the host computer sends commands to the GPU card to make it work to reach the conditions for testing the EDPP current.

[0093] (4) The four channels of the oscilloscope respectively collect the voltages at both ends of R1 and R2, and perform subtraction calculations. The calculation results are transmitted back to the host computer.

[0094] Two BNC connectors are respectively placed at both ends of R1 and R2, and are connected to the four channels (CH1~CH4) of the oscilloscope with coaxial cables. The average voltages at both ends of R1 and R2 are measured within 5ms, and subtraction is performed with the oscilloscope to measure and calculate the voltage difference across the R1 resistor: CH2 - CH1, and the voltage difference across the R2 resistor: CH3 - CH4. And these two data are transmitted to the host computer through GPIB.

[0095] (5) The host computer calculates the average current passing through R1 and R2 based on the received data.

[0096] After the host computer receives these two data, combined with the resistance values of R1 and R2, the average current passing through R1 and R2 within 5ms can be calculated using the formula I = △V / R, and the data is recorded.

[0097] (6) Determine whether the voltage value tests and data calculations at different time intervals have all been completed. If not, repeat the operations in (5) and (6) to continue measuring the EDPP current of the GPU card at other time intervals; when all data tests are completed, the host computer sends an instruction for the GPU to stop working.

[0098] In addition, since the current testing method in this embodiment is implemented based on the aforementioned current testing device, its function corresponds to that of the above - mentioned device, and will not be elaborated here.

[0099] The above-disclosed are only the preferred embodiments of the present invention, but the present invention is not limited thereto. Any non-creative changes that can be conceived by those skilled in the art, as well as several improvements and refinements made without departing from the principles of the present invention, shall fall within the protection scope of the present invention.

Claims

1. A current testing device, characterized in that, Including: A transfer card, a power supply, a host computer, and a voltage collector; The transfer card is provided with a gold finger slot and a power connector. The gold finger slot is used for plugging the gold fingers on the GPU card, and the power connector is used for connecting to the external power connector on the GPU card; The power supply powers the transfer card, and outputs a first path of power to be connected to the gold finger slot through a first cable, and outputs a second path of power to be connected to the power connector through a second cable, so that the first path of power and the second path of power supply the GPU card; A first resistor is provided on the first cable, and a second resistor is provided on the second cable; The voltage collector collects the average voltages of the first resistor and the second resistor within a preset duration and outputs them to the host computer. The host computer calculates the average currents flowing through the first resistor and the second resistor based on the average voltages of the first resistor and the second resistor, and obtains the EDPP current of the GPU card within the preset duration.

2. The current testing device according to claim 1, wherein, The voltage collector uses an oscilloscope.

3. The current testing device according to claim 2, wherein On the first cable, a coaxial cable connector is provided on each side of the first resistor. The two coaxial cable connectors are connected to the corresponding channels of the oscilloscope through a coaxial cable, so that the oscilloscope obtains the voltage values at the two coaxial cable connectors, and the oscilloscope calculates the difference between the two voltage values to obtain the voltage of the first resistor; On the second cable, a coaxial cable connector is provided on each side of the second resistor. The two coaxial cable connectors are connected to the corresponding channels of the oscilloscope through a coaxial cable, so that the oscilloscope obtains the voltage values at the two coaxial cable connectors, and the oscilloscope calculates the difference between the two voltage values to obtain the voltage of the second resistor.

4. The current testing device according to claim 3, wherein The host computer also communicates with the GPU card. After the GPU card is powered on, it controls the GPU card to reach the working conditions for testing the EDPP current.

5. The current testing device according to claim 4, wherein The transfer card is also provided with a USB to I2C chip. The USB interface of the host computer is connected to the USB to I2C chip, and the USB to I2C chip is connected to the gold finger slot on the transfer card to realize the communication between the host computer and the GPU card.

6. The current testing device according to claim 5, wherein The power supply uses a PSU power supply, and a PSU connector is provided on the transfer board to connect to the PSU power supply.

7. The current testing device according to any one of claims 1-6, characterized in that, The transfer card is also provided with a cooling fan.

8. A current testing method, characterized in that, Implemented based on the device according to any one of claims 1 to 7, the method includes the following steps: Connect the transfer card, the power supply, the host computer, the voltage collector, and the GPU card; Start the power supply to power the transfer card and the GPU card; The host computer sends an instruction to make the GPU card reach the working conditions for testing the EDPP current; The voltage collector collects the average voltages of the first resistor and the second resistor within a preset duration and transmits them to the host computer; The host computer calculates the average currents flowing through the first resistor and the second resistor according to the average voltages of the first resistor and the second resistor, and obtains the EDPP current of the GPU card within the preset duration.

9. The current testing method according to claim 8, wherein The method specifically includes: Configure multiple preset durations; The voltage collector collects the average voltages of the first resistor and the second resistor within one of the preset durations, so that the host computer obtains the EDPP current of the GPU card within the preset duration; Judge whether the EDPP currents within all the preset durations have been obtained; If not, the voltage collector continues to collect the average voltages of the first resistor and the second resistor within the next preset time period, so that the host computer obtains the EDPP current of the GPU card within the next preset time period. If so, the host computer sends an instruction to stop the GPU card from working.

10. The current testing method according to claim 9, wherein The voltage collector collects the average voltage of the resistor within the preset time period, which specifically includes: Collecting two voltage values on both sides of the resistor on the cable where the resistor is located; Calculating the difference between the two voltage values to obtain the voltage of the resistor; where the resistors include a first resistor and a second resistor.

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