A temperature compensation test method for OTA test system

Abstract

The present invention discloses a temperature compensation test method for an OTA test system. It includes the following steps: an air interface test path and a conduction test path are arranged between the air interface and conduction test common front end and the air interface and conduction test common back end; during calibration, the air interface test path and the conduction test path are tested, and the calibration values ​​are retained, which are recorded as Cr and Cc respectively; during testing, the air interface test path and the conduction test path are tested respectively; recorded as Tr and Tc; temperature compensation is performed to obtain the final result. The present invention makes the air interface test path and the conduction test path share the front end and the back end, only the middle part is separated, and both are affected by the same temperature change; the change of the conduction test with temperature can represent the change of the air interface test with temperature; the value of the conduction test result with temperature change is used to compensate the air interface test result; and the temperature compensation stability of the OTA test system is improved.

Description

Technical Field

[0001] The invention belongs to the technical field of OTA testing, and in particular relates to a temperature compensation testing method for an OTA testing system. Background Art

[0002] Nowadays, OTA test systems use port-to-air test. The test results of the test system change with the change of test environment temperature and the change of internal temperature of the system after the test system is started, resulting in temperature drift, and the port-to-air test results change accordingly; the temperature stability of OTA test results is poor. To solve this problem, a temperature compensation test method for OTA test system is now designed. Summary of the invention

[0003] The object of the present invention is to provide a temperature compensation test method for an OTA test system, in which an air interface test path and a conduction test path share a front end and a back end, and only a middle part is separated, and both are affected by the same temperature change; the change of the conduction test with temperature can represent the change of the air interface test with temperature; the value of the conduction test result with temperature change is used to compensate the air interface test result; thereby, the change of the air interface test result caused by the temperature change inside the system is greatly eliminated; that is, the temperature compensation stability of the OTA test system is improved.

[0004] In order to solve the above technical problems, the present invention is achieved through the following technical solutions:

[0005] The present invention is a temperature compensation test method for an OTA test system, comprising the following steps:

[0006] An air interface test path and a conduction test path are provided between Stp1, the air interface and conduction test common front end and the air interface and conduction test common back end;

[0007] Stp2. During calibration, test the air interface test path and the conduction test path, and retain the calibration values, which are recorded as Cr and Cc respectively;

[0008] During Stp3 testing, the air interface test path and the conduction test path are tested separately; they are denoted as Tr and Tc;

[0009] Stp4, perform temperature compensation to obtain the final result;

[0010] The air interface test path is temperature compensated according to the value of the test conducted test path and the value of the calibrated test conducted test path; that is, the final result is equal to Tr+(Cc-Cr).

[0011] Preferably, the conduction test path is in parallel with the air interface test path, and is switched with the air interface path using a switch.

[0012] Preferably, the conductive test path is coupled to an air interface test path through a coupler to form a complete conductive test path.

[0013] The present invention has the following beneficial effects:

[0014] The present invention allows an air interface test path and a conduction test path to share a front end and a back end, with only a middle part being separated and both being affected by the same temperature change; the change of the conduction test with temperature can represent the change of the air interface test with temperature; the value of the conduction test result with temperature change is used to compensate the air interface test result; thereby, the change of the air interface test result caused by the temperature change inside the system is largely eliminated; that is, the temperature compensation stability of the OTA test system is improved.

[0015] Of course, any product implementing the present invention does not necessarily need to achieve all of the advantages described above at the same time. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for describing the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative work.

[0017] Figure 1 The system block diagram of a temperature compensation test system for an OTA test system of the present invention. DETAILED DESCRIPTION

[0018] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0019] See also Figure 1 As shown, the present invention is a temperature compensation test method for an OTA test system, comprising the following steps:

[0020] An air interface test path and a conduction test path are provided between Stp1, the air interface and conduction test common front end and the air interface and conduction test common back end;

[0021] Stp2. During calibration, test the air interface test path and the conduction test path, and retain the calibration values, which are recorded as Cr and Cc respectively;

[0022] The specific calibration steps are as follows: use the horn antenna, align it with the probe antenna, connect it to the vector network analyzer, record S21, and get the calibration value;

[0023] During Stp3 testing, the air interface test path and the conduction test path are tested separately; they are denoted as Tr and Tc;

[0024] The specific test steps are as follows: connect the vector network analyzer and record the S21 between the object under test and the probe antenna; get the test value;

[0025] Stp4, perform temperature compensation to obtain the final result;

[0026] The air interface test path is temperature compensated according to the value of the test conducted test path and the value of the calibrated test conducted test path; that is, the final result is equal to Tr+(Cc-Cr).

[0027] Preferably, the conduction test path is in parallel with the air interface test path; and the conduction test path and the air interface test path are switched by a switch.

[0028] Preferably, the conductive test path is coupled to an air interface test path through a coupler to form a complete conductive test path.

[0029] It is worth noting that in the above system embodiment, the various units included are only divided according to functional logic, but are not limited to the above division, as long as the corresponding functions can be achieved; in addition, the specific names of the functional units are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of the present invention.

[0030] In addition, a person skilled in the art can understand that all or part of the steps in the above-mentioned embodiments can be completed by instructing related hardware through a program, and the corresponding program can be stored in a computer-readable storage medium, such as a ROM / RAM, a disk or an optical disk.

[0031] The preferred embodiments of the present invention disclosed above are only used to help illustrate the present invention. The preferred embodiments do not describe all the details in detail, nor do they limit the invention to the specific implementation methods described. Obviously, many modifications and changes can be made according to the content of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present invention, so that those skilled in the art can understand and use the present invention well. The present invention is limited only by the claims and their full scope and equivalents.

Claims

1. A temperature compensation test method for an OTA test system, characterized in that: The steps include: An air interface test path and a conduction test path are provided between Stp1, the air interface and conduction test common front end and the air interface and conduction test common back end; Stp2. During calibration, test the air interface test path and the conduction test path, and retain the calibration values, which are recorded as Cr and Cc respectively; During Stp3 testing, the air interface test path and the conduction test path are tested separately; they are denoted as Tr and Tc; Stp4, perform temperature compensation to obtain the final result; The air interface test path is temperature compensated according to the value of the test conducted test path and the value of the calibrated test conducted test path; that is, the final result is equal to Tr+(Cc-Cr).

2. A temperature compensation test method for an OTA test system according to claim 1, characterized in that: The conduction test path is parallel to the air interface test path, and is switched with the air interface path by using a switch.

3. A temperature compensation test method for an OTA test system according to claim 1, characterized in that: The conduction test path is coupled to a complete conduction test path by using a coupler on the air interface test path.

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