A method, apparatus, device and medium for deformation of a survey line

Abstract

This invention discloses a method, apparatus, device, and medium for deforming a measuring line. The method includes: reading the coordinates of each measuring point in the measuring line used to measure the object under test; determining a reference point, wherein the reference point is composed of coordinates in a first direction and coordinates in a second direction; determining the distance between adjacent measuring points based on the coordinates of each measuring point; and extending unidirectionally along the first or second direction from the reference point, based on the distance between adjacent measuring points, to obtain a deformed measuring line. This technical solution, by deforming the measuring line, makes the data of the measuring line more closely correspond to the actual information of the object under test, improves the processing efficiency of measurement data, and can effectively detect and process the object under test.

Description

Technical Field

[0001] This invention relates to the field of data processing, and in particular to a method, apparatus, equipment, and medium for deforming a measuring line. Background Technology

[0002] With the development of urban construction and the gradual rise of digital city technology, more and more attention is being paid to the investigation and management of urban hidden dangers, such as the detection of underground road defects.

[0003] Existing detection technologies use detection equipment to detect and process data on the object being measured according to fixed detection patterns. For example, ground-penetrating radar (GPR) can detect underground road lines by measuring the underground lines along the road, obtaining measurement data, drawing survey lines of different shapes based on the measurement data, and processing the data based on the survey lines to further maintain the underground road lines.

[0004] However, in urban environments, the measurement lines are formed in various shapes due to the obstruction of tall buildings, overpasses, tree canopies, and other obstacles. When data is processed based on these measurement lines, the data will appear fragmented, which is not conducive to data processing and makes it impossible to effectively detect and process the measured object. Summary of the Invention

[0005] This invention provides a method, apparatus, device, and medium for deforming measuring lines, which solves the problems of diverse measuring line shapes and fragmented data in the prior art. It makes the measuring line data more consistent with the actual information of the measured object, improves the processing efficiency of measurement data, and enables effective detection and processing of the measured object.

[0006] According to one aspect of the present invention, a method for deforming a survey line is provided, the method comprising:

[0007] Read the coordinates of each measuring point in the survey line measuring the object under test; and determine the reference point; wherein the reference point is composed of the coordinates of the first direction and the coordinates of the second direction;

[0008] The distance between adjacent measuring points is determined based on the coordinates of each measuring point.

[0009] Starting from the reference point, and based on the distance between adjacent measuring points, the deformation measuring line is extended unidirectionally along the first or second direction to obtain the deformation measuring line.

[0010] Optionally, determine the reference point, including:

[0011] Generate a prompt message indicating the determination of the benchmark point;

[0012] In response to the selection of a benchmark point, a benchmark point is determined within the preset range of the survey line.

[0013] Optionally, in response to the selection of a benchmark point, a benchmark point is determined within a preset range of the survey line, including:

[0014] If the reference point selection operation specifies one of the measurement points, then the specified measurement point is determined as the reference point;

[0015] If the reference point selection operation does not specify one of the measurement points, then the target point location of the selection operation is the distance between the measurement line and the measurement point.

[0016] If the distance is less than or equal to the set threshold, then the target point of the selection operation is determined as the reference point;

[0017] If the distance is greater than the set threshold, the selection operation is deemed invalid, and a prompt to reconfirm is generated.

[0018] Optionally, determining the distance between adjacent measuring points based on the coordinates of each measuring point includes:

[0019] The distance between adjacent measuring points is determined based on the first and second direction coordinates of the first measuring point and the first and second direction coordinates of the second measuring point.

[0020] Optionally, the distance between adjacent measuring points is determined using the following formula:

[0021]

[0022] Where distance is the distance between adjacent measuring points, Xori0 is the first direction coordinate of the first measuring point, Xori1 is the first direction coordinate of the second measuring point, Yori0 is the second direction coordinate of the first measuring point, and Yori1 is the second direction coordinate of the second measuring point.

[0023] Optionally, after obtaining the deformation survey lines, the method further includes:

[0024] The number of processing grids is determined based on the first direction, the second direction, and the distribution of the survey lines;

[0025] The survey line is segmented according to the number of grid arrangements.

[0026] According to another aspect of the present invention, a deformation device for a measuring line is provided, comprising:

[0027] The coordinate processing module is used to read the coordinates of each measuring point in the survey line measuring the object under test; and to determine the reference point; wherein the reference point is composed of a first direction coordinate and a second direction coordinate;

[0028] The distance determination module determines the distance between adjacent measuring points based on the coordinates of each measuring point.

[0029] The survey line processing module takes the reference point as the starting point and extends it unidirectionally along the first or second direction based on the distance between adjacent survey points to obtain the deformed survey line.

[0030] According to another aspect of the present invention, an electronic device is provided, the electronic device comprising:

[0031] At least one processor; and

[0032] A memory communicatively connected to the at least one processor; wherein,

[0033] The memory stores a computer program that can be executed by the at least one processor, which is then executed by the at least one processor to enable the at least one processor to perform the deformation method for measuring lines provided in the embodiments of this application.

[0034] According to another aspect of the present invention, a computer-readable storage medium is provided, the computer-readable storage medium storing computer instructions for causing a processor to execute and implement the deformation method of the survey line provided in the embodiments of the present application.

[0035] The technical solution of this invention involves reading the coordinates of each measuring point in a measurement line used to measure the object under test; determining a reference point; wherein the reference point is composed of coordinates in a first direction and coordinates in a second direction; determining the distance between adjacent measuring points based on the coordinates of each measuring point; and extending unidirectionally along either the first or second direction from the reference point, based on the distance between adjacent measuring points, to obtain a deformed measurement line. This technical solution, by deforming the measurement line, makes the data of the measurement line more closely correspond to the actual information of the object under test, improving the processing efficiency of the measurement data and enabling effective detection and processing of the object under test.

[0036] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of the present invention, nor is it intended to limit the scope of the invention. Other features of the invention will become readily apparent from the following description. Attached Figure Description

[0037] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0038] Figure 1This is a flowchart of a deformation method for a measuring line according to Embodiment 1 of the present invention;

[0039] Figure 2 This is a schematic diagram of the structure of a deformation device for measuring lines according to Embodiment 2 of the present invention;

[0040] Figure 3 This is a schematic diagram of the structure of an electronic device that implements an embodiment of the present invention. Detailed Implementation

[0041] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0042] It should be noted that the terms "one aspect," "another aspect," "objective," etc., used in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0043] Example 1

[0044] Figure 1 This is a flowchart of a survey line deformation method according to Embodiment 1 of the present invention. This embodiment is applicable to situations where probe data needs to be processed. The method can be executed by a survey line deformation device, which can be implemented in hardware and / or software and can be configured in an electronic device with data processing capabilities. Figure 1 As shown, the method includes:

[0045] S110, read the coordinates of each measuring point in the measuring line of the measured object; and determine the reference point; wherein, the reference point is composed of the first direction coordinates and the second direction coordinates.

[0046] The technical solution of this embodiment can be executed by data processing software or an electronic device containing data processing software. This embodiment is suitable for scenarios where vehicle-mounted ground-penetrating radar uses three-dimensional radar technology to detect data along roads or survey lines. For example, when detecting underground lines, the software reads the measurement data, draws survey lines based on the measurement data, and deforms the survey lines to achieve effective processing of underground lines.

[0047] The object being measured can be a road, underground pipeline, or underground line, etc. The survey line can be drawn using data from the measurement points, either point by point or from the beginning and end, or along the road. The reference point can be a target point selected during data processing on the user interface to determine the starting point of the deformation survey line; the target point can be any point on the user interface. The first direction can be the positive or negative direction of the x-axis, and the second direction can be the positive or negative direction of the y-axis. For example, on the user interface, upward can be the positive direction of the x-axis, rightward can be the positive direction of the y-axis, downward can be the x-axis, and leftward can be the negative direction of the y-axis.

[0048] Based on this technical solution, optionally, the reference point can be determined, including:

[0049] Generate a prompt message indicating the determination of the benchmark point;

[0050] In response to the selection of a benchmark point, a benchmark point is determined within the preset range of the survey line.

[0051] The prompt information can be for determining the reference point. For example, it can be set to indicate whether a selected point can be used as the reference point or not. When the reference point is determined, the operation interface will display the message indicating whether a selected point can be used as the reference point or not.

[0052] The preset range of the survey line can be each survey point, or a certain threshold range can be set for the distance between the target point and the survey line. For example, if the operation interface is set to plot in centimeters (cm) and the threshold range is set to 2cm, then when the distance between the target point and the survey line is less than or equal to 2cm, the target point can be selected as the reference point. When the distance between the target point and the survey line is greater than 2cm, the target point will be invalid, and a new target point will be selected for comparison.

[0053] In this embodiment, the user can independently select and determine the reference point, which allows the user to flexibly define the starting point of the deformation survey line according to their needs, and facilitates a better display of the drawn deformation survey line in the operation interface.

[0054] Based on this technical solution, optionally, in response to the selection operation of the benchmark point, the benchmark point is determined within a preset range of the survey line, including:

[0055] If the reference point selection operation specifies one of the measurement points, then the specified measurement point is determined as the reference point;

[0056] If the reference point selection operation does not specify one of the measurement points, then the target point location of the selection operation is the distance between the measurement line and the measurement point.

[0057] If the distance is less than or equal to the set threshold, then the target point of the selection operation is determined as the reference point;

[0058] If the distance is greater than the set threshold, the selection operation is deemed invalid, and a prompt to reconfirm is generated.

[0059] In this embodiment, in response to the selection operation of the benchmark point, the benchmark point is determined within the preset range of the survey line. The benchmark point can be automatically and effectively selected in the operation interface, which more accurately explains the selection rules of the benchmark point and is conducive to the determination of the benchmark point.

[0060] S120, determine the distance between adjacent measuring points based on the measuring point coordinates of each measuring point;

[0061] The coordinates of the measuring points can be rectangular coordinates, planar polar coordinates, spherical coordinates, or cylindrical coordinates, and can be determined based on the coordinates of the first direction and the coordinates of the second direction. Adjacent measuring points can be the first and second measuring points. The measuring points are arranged sequentially along the measuring line, and the second measuring point of the previous pair of adjacent measuring points becomes the first measuring point of the next pair of adjacent measuring points. For example, measuring points 1, 2, and 3 can be three measuring points arranged sequentially along the measuring line direction. Measuring points 1 and 2 are the first group of adjacent measuring points, and measuring points 2 and 3 are the second group of adjacent measuring points. Therefore, measuring point 2 can be the second measuring point of the first group or the first measuring point of the second group.

[0062] The distance between adjacent measuring points can be obtained by taking the square root of the difference between the first and second coordinates of adjacent measuring points.

[0063] In this embodiment, optionally, determining the distance between adjacent measuring points based on the measuring point coordinates of each measuring point includes:

[0064] The distance between adjacent measuring points is determined based on the first and second direction coordinates of the first measuring point and the first and second direction coordinates of the second measuring point.

[0065] The distance between adjacent measuring points is determined using the following formula:

[0066]

[0067] Where distance is the distance between adjacent measuring points, Xori0 is the first direction coordinate of the first measuring point, Xori1 is the first direction coordinate of the second measuring point, Yori0 is the second direction coordinate of the first measuring point, and Yori1 is the second direction coordinate of the second measuring point.

[0068] In this embodiment, the distance between adjacent measuring points is determined based on the coordinates of each measuring point. A simple distance formula is used to determine the distance between adjacent measuring points, realizing the automatic processing of a large amount of data, which is beneficial for drawing deformation measurement lines.

[0069] S130, taking the reference point as the starting point, and based on the distance between adjacent measuring points, extend unidirectionally along the first direction or the second direction to obtain the deformation measuring line.

[0070] In this context, unidirectional extension can be along the positive direction of the x-axis, the negative direction of the x-axis, the positive direction of the y-axis, or the negative direction of the y-axis.

[0071] For example, after obtaining the measurement data of the underground line through ground penetrating radar, the coordinates of each measuring point are determined sequentially along the direction of the measuring line. The distance between each adjacent measuring point is obtained by the distance formula. Then, taking the benchmark point as the starting point, the distance between each adjacent measuring point is extended sequentially along one direction to draw the deformed measuring line.

[0072] Based on the above technical solutions, optionally, after obtaining the deformation measurement line, the method further includes:

[0073] The number of processing grids is determined based on the first direction, the second direction, and the distribution of the survey lines;

[0074] The survey line is segmented according to the number of grid arrangements.

[0075] The grid is set according to the actual configuration. For example, it can be set as a 50-meter by 25-meter square grid, where the length is 50 meters and the width is 25 meters.

[0076] The number of grid cells can be determined by the smallest positive integer representing the ratio of the lateral distribution range of the deformation survey line to the grid width. The ratio is limited to 1 and can be less than or equal to 1 or greater than 1. If the ratio is less than or equal to 1, a single column or row of grid cells is generated; if the ratio is greater than 1, a column or row of grid cells with the smallest positive integer value of the ratio is generated. The lateral direction can be either a first direction or a second direction.

[0077] Segmentation processing can be performed by dividing the data into segments according to the size of a grid, and then processing the data corresponding to each grid separately.

[0078] In this technical solution, the number of grids is determined by using the obtained deformed survey lines, and the survey lines are segmented to avoid the fragmentation of data, so that the grids are fully utilized and the data can be processed efficiently.

[0079] The technical solution of this embodiment reads the coordinates of each measuring point in the measurement line of the measured object; and determines a reference point; wherein the reference point is composed of a first direction coordinate and a second direction coordinate; the distance between adjacent measuring points is determined according to the coordinates of each measuring point; starting from the reference point, based on the distance between adjacent measuring points, the line is extended unidirectionally along the first or second direction to obtain a deformed measurement line. This technical solution, by deforming the measurement line, makes the data of the measurement line more consistent with the actual information of the measured object, improves the processing efficiency of measurement data, and can effectively detect and process the measured object.

[0080] Example 2

[0081] Figure 2 This is a schematic diagram of a line deformation device according to Embodiment 2 of the present invention. This device can execute the line deformation method provided in any embodiment of the present invention, and possesses the corresponding functional modules and beneficial effects for executing the method. For example... Figure 2 As shown, the device includes:

[0082] The coordinate processing module 210 is used to read the coordinates of each measuring point in the survey line measuring the object being measured; and to determine the reference point; wherein the reference point is composed of a first direction coordinate and a second direction coordinate;

[0083] The distance determination module 220 is used to determine the distance between adjacent measuring points based on the measuring point coordinates of each measuring point.

[0084] The survey line processing module 230 is used to extend the line unidirectionally along a first direction or a second direction, starting from the reference point and based on the distance between adjacent survey points, to obtain a deformed survey line.

[0085] Optionally, the coordinate processing module includes: a reference point determination unit, which is specifically used for:

[0086] Generate a prompt message indicating the determination of the benchmark point;

[0087] In response to the selection of a benchmark point, a benchmark point is determined within the preset range of the survey line.

[0088] Among them, in response to the selection operation of the benchmark point, the benchmark point is determined within the preset range of the survey line, including:

[0089] If the reference point selection operation specifies one of the measurement points, then the specified measurement point is determined as the reference point;

[0090] If the reference point selection operation does not specify one of the measurement points, then the target point location of the selection operation is the distance between the measurement line and the measurement point.

[0091] If the distance is less than or equal to the set threshold, then the target point of the selection operation is determined as the reference point;

[0092] If the distance is greater than the set threshold, the selection operation is deemed invalid, and a prompt to reconfirm is generated.

[0093] Optional, the distance determination module 220 is specifically used for:

[0094] The distance between adjacent measuring points is determined based on the first and second direction coordinates of the first measuring point and the first and second direction coordinates of the second measuring point.

[0095] The distance between adjacent measuring points is determined using the following formula:

[0096]

[0097] Where distance is the distance between adjacent measuring points, Xori0 is the first direction coordinate of the first measuring point, Xori1 is the first direction coordinate of the second measuring point, Yori0 is the second direction coordinate of the first measuring point, and Yori1 is the second direction coordinate of the second measuring point.

[0098] Optionally, the device further includes: a mesh processing module, used for:

[0099] The number of processing grids is determined based on the first direction, the second direction, and the distribution of the survey lines;

[0100] The survey line is segmented according to the number of grid arrangements.

[0101] The deformation device for measuring lines provided in this embodiment of the invention can execute the deformation method for measuring lines provided in any embodiment of the invention, and has the corresponding functional modules and beneficial effects of the method.

[0102] Example 3

[0103] Figure 3This is a schematic diagram of the structure of an electronic device implementing an embodiment of the present invention. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices (such as helmets, glasses, watches, etc.), and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the invention described and / or claimed herein.

[0104] like Figure 3 As shown, the electronic device 10 includes at least one processor 11 and a memory, such as a read-only memory (ROM) 12 or a random access memory (RAM) 13, communicatively connected to the at least one processor 11. The memory stores computer programs executable by the at least one processor. The processor 11 can perform various appropriate actions and processes based on the computer program stored in the ROM 12 or loaded from storage unit 18 into the RAM 13. The RAM 13 may also store various programs and data required for the operation of the electronic device 10. The processor 11, ROM 12, and RAM 13 are interconnected via a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0105] Multiple components in electronic device 10 are connected to I / O interface 15, including: input unit 16, such as keyboard, mouse, etc.; output unit 17, such as various types of displays, speakers, etc.; storage unit 18, such as disk, optical disk, etc.; and communication unit 19, such as network card, modem, wireless transceiver, etc. Communication unit 19 allows electronic device 10 to exchange information / data with other devices through computer networks such as the Internet and / or various telecommunications networks.

[0106] Processor 11 can be a variety of general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. Processor 11 performs the various methods and processes described above.

[0107] In some embodiments, the modification of the method probe can be implemented as a computer program tangibly contained in a computer-readable storage medium, such as storage unit 18. In some embodiments, part or all of the computer program can be loaded and / or mounted on electronic device 10 via ROM 12 and / or communication unit 19. When the computer program is loaded into RAM 13 and executed by processor 11, one or more steps of the modification of the method probe described above can be performed. Alternatively, in other embodiments, processor 11 can be configured to perform the modification of the method probe by any other suitable means (e.g., by means of firmware).

[0108] Various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), systems-on-a-chip (SoCs), payload-programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0109] Computer programs used to implement the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, such that when executed by the processor, the computer programs cause the functions / operations specified in the flowcharts and / or block diagrams to be performed. The computer programs may be executed entirely on a machine, partially on a machine, or as a standalone software package, partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0110] In the context of this invention, a computer-readable storage medium can be a tangible medium that may contain or store a computer program for use by or in conjunction with an instruction execution system, apparatus, or device. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination thereof. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0111] To provide interaction with a user, the systems and techniques described herein can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the electronic device. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0112] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as data servers), or computing systems that include middleware components (e.g., application servers), or computing systems that include frontend components (e.g., user computers with graphical user interfaces or web browsers through which users can interact with implementations of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., communication networks). Examples of communication networks include local area networks (LANs), wide area networks (WANs), blockchain networks, and the Internet.

[0113] A computing system can include clients and servers. Clients and servers are generally located far apart and typically interact through communication networks. The client-server relationship is created by computer programs running on the respective computers and having a client-server relationship with each other. The server can be a cloud server, also known as a cloud computing server or cloud host, which is a hosting product within the cloud computing service system to address the shortcomings of traditional physical hosts and VPS services, such as high management difficulty and weak business scalability.

[0114] It should be understood that the various forms of processes shown above can be used, with steps reordered, added, or deleted. For example, the steps described in this invention can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution of this invention can be achieved, and no limitation is imposed herein.

[0115] The specific embodiments described above do not constitute a limitation on the scope of protection of this invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this invention should be included within the scope of protection of this invention.

Claims

1. A method for deforming a measuring line, characterized in that, include: Read the coordinates of each measuring point in the survey line measuring the object under test; and determine the reference point; wherein the reference point is composed of the coordinates of the first direction and the coordinates of the second direction; The distance between adjacent measuring points is determined based on the coordinates of each measuring point. Starting from the reference point, and based on the distance between adjacent measuring points, a deformation measuring line is obtained by extending unidirectionally along a first direction or a second direction; the first direction is the positive or negative direction of the x-axis, and the second direction is the positive or negative direction of the y-axis.

2. The method according to claim 1, characterized in that, Determining the reference point includes: Generate a prompt message indicating the determination of the benchmark point; In response to the selection of a benchmark point, a benchmark point is determined within the preset range of the survey line.

3. The method according to claim 2, characterized in that, In response to the reference point selection operation, the reference point is determined within the preset range of the survey line, including: If the reference point selection operation specifies one of the measurement points, then the specified measurement point is determined as the reference point; If the reference point selection operation does not specify one of the measurement points, then the target point location of the selection operation is the distance between the measurement line and the measurement point. If the distance is less than or equal to the set threshold, then the target point of the selection operation is determined as the reference point; If the distance is greater than the set threshold, the selection operation is deemed invalid, and a prompt to reconfirm is generated.

4. The method according to claim 1, characterized in that, Determining the distance between adjacent measuring points based on the coordinates of each measuring point includes: The distance between adjacent measuring points is determined based on the first and second direction coordinates of the first measuring point and the first and second direction coordinates of the second measuring point.

5. The method according to claim 4, characterized in that, The distance between adjacent measuring points is determined using the following formula: ； in, The distance between adjacent measuring points. Let the coordinates of the first measuring point be in the first direction. The coordinates of the second measuring point are in the first direction. The coordinates of the second direction of the first measuring point are: The coordinates of the second measuring point are in the second direction.

6. The method according to claim 5, characterized in that, After obtaining the deformation survey line, the method further includes: The number of processing grids is determined based on the first direction, the second direction, and the distribution of the survey lines; The survey line is segmented according to the number of grid arrangements.

7. A deformation device for measuring lines, characterized in that, include: The coordinate processing module is used to read the coordinates of each measuring point in the survey line measuring the object under test; and to determine the reference point; wherein the reference point is composed of a first direction coordinate and a second direction coordinate; The distance determination module is used to determine the distance between adjacent measuring points based on the measuring point coordinates of each measuring point. The survey line processing module is used to extend unidirectionally along a first direction or a second direction, starting from the reference point and based on the distance between adjacent survey points, to obtain a deformed survey line; the first direction is the positive or negative direction of the x-axis, and the second direction is the positive or negative direction of the y-axis.

8. The apparatus according to claim 7, characterized in that, The coordinate processing module, which determines the reference point, includes a reference point determination unit, specifically used for: Generate a prompt message indicating the determination of the benchmark point; In response to the selection of a benchmark point, a benchmark point is determined within the preset range of the survey line.

9. An electronic device, characterized in that, The electronic device includes: At least one processor; and A memory communicatively connected to the at least one processor; wherein, The memory stores a computer program that can be executed by the at least one processor, the computer program being executed by the at least one processor to enable the at least one processor to perform the deformation method of the survey line according to any one of claims 1-6.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer instructions that, when executed by a processor, implement the deformation method of the survey line according to any one of claims 1-6.

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