Product Defect Information Processing, Product Defect Information Querying Method and Device

Abstract

The present disclosure provides a method for processing product defect information, including: obtaining defect information in the current film layer and defect information in the historical film layer; determining whether there is defect information at the target position in the historical film layer when there is defect information at the target position in the current film layer; if there is defect information at the target position in the historical film layer, deleting the defect information detected at the target position in the current film layer; if there is no defect information at the target position in the historical film layer, retaining the defect information detected at the target position in the current film layer. Accordingly, for the defect information in the current film layer, only the defect information caused by the factors of the current film layer itself can be retained, and there is no need to retain the defect information caused by the historical film layer. On the one hand, the amount of stored data can be reduced, and on the other hand, the complexity of subsequent defect information analysis can be simplified.

Description

Technical Field

[0001] The present disclosure relates to the technical field of displays, and more particularly, to a method for processing product defect information, a method for querying product defect information, a device for processing product defect information, a device for querying product defect information, an electronic device, and a computer-readable storage medium. Background Art

[0002] In the process of manufacturing a display panel, multiple film layers need to be formed. For example, when manufacturing organic light-emitting diode (OLED) and liquid crystal display products, during the early film-forming stage, 15 to 20 film-forming processes are performed, and each time a film layer is formed, it needs to be inspected to determine the defect information therein. Summary of the Invention

[0003] In view of this, embodiments of the present disclosure provide a method for processing product defect information, a method for querying product defect information, a device for processing product defect information, a device for querying product defect information, an electronic device, and a computer-readable storage medium to solve the technical problems in the related art.

[0004] According to a first aspect of an embodiment of the present disclosure, a method for processing product defect information is provided. The product includes multiple film layers, and the method includes: obtaining defect information in the current film layer and defect information in a historical film layer, where the historical film layer is formed before the current film layer; determining a target position of the defect information in the current film layer, and determining whether there is defect information at a corresponding position of the target position in the historical film layer; if there is defect information at the target position in the historical film layer, deleting the defect information detected at the target position in the current film layer; if there is no defect information at the target position in the historical film layer, retaining the defect information detected at the target position in the current film layer.

[0005] According to a second aspect of the embodiments of the present disclosure, a method for querying product defect information is provided. The product includes multiple film layers, and the method includes: receiving a query instruction sent by a client; querying defect information in the multiple film layers according to the query instruction; generating front-end data according to the query result; wherein, the defect information in the multiple film layers is determined based on the following method: obtaining defect information in the current film layer and defect information in a historical film layer, where the historical film layer is formed before the current film layer; determining the target position of the defect information in the current film layer, and determining whether there is defect information at the corresponding position of the target position in the historical film layer; if there is defect information at the target position in the historical film layer, deleting the defect information detected at the target position in the current film layer; if there is no defect information at the target position in the historical film layer, retaining the defect information detected at the target position in the current film layer, and the defect information stored in the data table includes the recorded defect information.

[0006] According to a third aspect of the embodiments of the present disclosure, a product defect information processing device is provided. The product includes multiple film layers, and the device includes: a defect information obtaining module, configured to obtain defect information in the current film layer and defect information in a historical film layer, where the historical film layer is formed before the current film layer; a defect determination module, configured to determine the target position of the defect information in the current film layer, and determine whether there is defect information at the corresponding position of the target position in the historical film layer; an information deletion module, configured to delete the defect information detected at the target position in the current film layer when there is defect information at the target position in the historical film layer; an information recording module, configured to retain the defect information detected at the target position in the current film layer when there is no defect information at the target position in the historical film layer.

[0007] According to a fourth aspect of the embodiments of the present disclosure, a product defect information query system is provided. The product includes multiple film layers, and the system includes a data processing device, a display device, and a distributed storage device;

[0008] The distributed storage device is configured to store the defect information detected in the current film layer and the defect information in the historical film layer, where the historical film layer is formed before the current film layer;

[0009] The data processing device is used to obtain the defective information detected in the current film layer from the distributed storage device, determine the target position of the defective information in the current film layer, and judge whether there is defective information at the corresponding position of the target position in the historical film layer. In the case where there is defective information at the target position in the historical film layer, the defective information detected at the target position in the current film layer is deleted. In the case where there is no defective information at the target position in the historical film layer, the defective information detected at the target position in the current film layer is retained, and the retained defective information is stored in the distributed storage device;

[0010] The display device is used to query defective information in the distributed storage device according to the received query instruction and generate front-end data.

[0011] According to a fifth aspect of the embodiments of the present disclosure, a device for querying product defective information is provided. The product includes a plurality of film layers, and the device includes: an instruction receiving module, configured to receive a query instruction sent by a client; an information query module, configured to query defective information in the plurality of film layers according to the query instruction; a front-end generation module, configured to generate front-end data according to the query result; wherein, the defective information in the plurality of film layers is determined based on the following method: obtaining defective information in the current film layer and defective information in the historical film layer, where the historical film layer is formed before the current film layer; determining the target position of the defective information in the current film layer, and judging whether there is defective information at the corresponding position of the target position in the historical film layer; if there is defective information at the target position in the historical film layer, deleting the defective information detected at the target position in the current film layer; if there is no defective information at the target position in the historical film layer, retaining the defective information detected at the target position in the current film layer, and the defective information stored in the data table includes the recorded defective information.

[0012] According to a sixth aspect of the embodiments of the present disclosure, a detection device is provided, including: a processor; a memory for storing instructions executable by the processor; wherein, the processor is configured to implement the above-mentioned product defective information processing method.

[0013] According to a seventh aspect of the embodiments of the present disclosure, an electronic device is provided, including: a processor; a memory for storing instructions executable by the processor; wherein, the processor is configured to implement any of the above-mentioned product defective information query methods.

[0014] According to an eighth aspect of the embodiments of the present disclosure, a computer-readable storage medium is provided, on which a computer program is stored, characterized in that when the program is executed by a processor, the steps in the above-mentioned product defective information processing method are implemented.

[0015] According to a ninth aspect of the embodiments of the present disclosure, a computer-readable storage medium is provided, on which a computer program is stored. When the program is executed by a processor, the steps in the method for querying product defect information described above are implemented.

[0016] According to an embodiment of the present disclosure, when defect information is detected at a target position in the current film layer, instead of directly recording the detected defect information, it is possible to determine whether there is also defect information at the target position in the historical film layer formed previously. If there is also defect information, it indicates that the defect information at the target position in the current film layer is caused by the defect information at the target position in the historical film layer. Therefore, the defect information at the target position in the current film layer can be deleted; if there is no defect information, it indicates that the defect information at the target position in the current film layer is not caused by the defect information at the target position in the historical film layer, but by factors within the current film layer itself. Therefore, the defect information at the target position in the current film layer can be recorded.

[0017] Accordingly, for the defect information in the current film layer, only the defect information caused by factors within the current film layer itself can be retained, and there is no need to retain the defect information caused by the historical film layer. On the one hand, the amount of stored data can be reduced, and on the other hand, the complexity of subsequent analysis of defect information can be simplified. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present disclosure, the drawings required for the description of the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present disclosure. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0019] Figure 1 FIG. is a schematic flowchart of a method for processing product defect information according to an embodiment of the present disclosure.

[0020] Figure 2 FIG. is a schematic flowchart of another method for processing product defect information according to an embodiment of the present disclosure.

[0021] Figure 3 FIG. is a schematic flowchart of yet another method for processing product defect information according to an embodiment of the present disclosure.

[0022] Figure 4 FIG. is a schematic flowchart of data aggregation according to an embodiment of the present disclosure.

[0023] Figure 5A FIG. is a schematic diagram of a system for querying product defect information according to an embodiment of the present disclosure.

[0024] Figure 5B It is a schematic data flow diagram of a product defect information query system shown according to an embodiment of the present disclosure.

[0025] Figure 6 It is a schematic flowchart of a product defect information query method shown according to an embodiment of the present disclosure.

[0026] Figure 7 It is a schematic block diagram of a product defect information processing device shown according to an embodiment of the present disclosure.

[0027] Figure 8 It is a schematic block diagram of another product defect information processing device shown according to an embodiment of the present disclosure.

[0028] Figure 9 It is a schematic block diagram of yet another product defect information processing device shown according to an embodiment of the present disclosure.

[0029] Figure 10 It is a schematic block diagram of yet another product defect information processing device shown according to an embodiment of the present disclosure.

[0030] Figure 11 It is a schematic block diagram of a product defect information query device shown according to an embodiment of the present disclosure.

[0031] Figure 12 It is a schematic block diagram of another product defect information query device shown according to an embodiment of the present disclosure.

[0032] Figure 13 It is a schematic block diagram of yet another product defect information query device shown according to an embodiment of the present disclosure.

[0033] Figure 14 It is a schematic block diagram of yet another product defect information query device shown according to an embodiment of the present disclosure.

[0034] Figure 15 It is a schematic block diagram of a device for defect information query shown according to an embodiment of the present disclosure. Detailed implementation manners

[0035] Figure 1 It is a schematic flowchart of a product defect information processing method shown according to an embodiment of the present disclosure. The method shown in this embodiment can be applied in the process of film layer detection of a display panel. For example, it can be applied in the early film forming stage of manufacturing a display panel, in the process of detecting each film layer during film formation, or in the stage of forming other film layers, in the process of detecting other film layers. The display panel includes, but is not limited to, an organic light emitting diode display panel, a liquid crystal display panel, etc.

[0036] Such asFigure 1 As shown, the method for processing product defect information may include the following steps:

[0037] In step S101, obtain the defect information in the current film layer and the defect information in the historical film layer, where the historical film layer is formed before the current film layer;

[0038] In step S102, determine the target position of the defect information in the current film layer, and determine whether there is defect information at the corresponding position of the target position in the historical film layer;

[0039] In step S103, if there is defect information at the target position in the historical film layer, delete the defect information detected at the target position in the current film layer;

[0040] In step S104, if there is no defect information at the target position in the historical film layer, retain the defect information detected at the target position in the current film layer.

[0041] In the process of manufacturing an organic light-emitting diode display panel and a liquid crystal display panel, multiple film layers need to be formed. For example, when manufacturing an array substrate, the processes for forming each film layer include but are not limited to Thin Film (thin film deposition), Photo (exposure), Develop (development), Etch (etching), and Strip (stripping).

[0042] In the process of forming multiple film layers, the later-formed film layer will cover the earlier-formed film layer, which may cause defects in the earlier-formed film layer and result in defects in the later-formed film layer as well. For example, if there is a depression at a certain position in the earlier-formed layer, there may also be a certain depression at the same position in the later-formed film layer. If the defect information in each film layer is continuously recorded in this case, the complexity of subsequent defect information analysis will increase.

[0043] In one embodiment, the method for detecting the film layer can be selected as needed. For example, the film layer can be detected by means of Automated Optical Inspection (AOI).

[0044] In one embodiment, the current film layer can be the latest formed film layer. After forming the first film layer (such as the bottommost film layer), each time a film layer is formed, the formed film layer can be used as the current film layer to execute the above steps.

[0045] In one embodiment, the defect information detected in the film layer includes but is not limited to various types of defects such as protrusions, depressions, fractures, and missing parts.

[0046] In one embodiment, when detecting bad information, the position where the bad information is located (such as coordinates) can be recorded.

[0047] In one embodiment, during the process of manufacturing a display panel, if it is necessary to cut a glass substrate to obtain multiple display panels, and the detection of bad information occurs before cutting, the position where the bad information is located in the glass substrate can be recorded first, and then after cutting, based on the cutting method, the display panel where the bad information is located and the coordinates in the display panel can be determined. The display panel in all embodiments of the present disclosure may refer to the display panel after cutting.

[0048] According to an embodiment of the present disclosure, when bad information is detected at a target position in the current film layer, instead of directly recording the detected bad information, it is possible to determine whether there is also bad information at a corresponding position (such as the target position or a position within a certain range of the target position) in the previously formed historical film layer.

[0049] If there is also bad information, it indicates that the bad information existing at the target position in the current film layer is caused by the bad information existing at the target position in the historical film layer. Therefore, the bad information at the target position in the current film layer can be deleted; if there is no bad information, it indicates that the bad information existing at the target position in the current film layer is not caused by the bad information existing at the target position in the historical film layer, but is caused by the factors of the current film layer itself (the implementation environment of the current film layer, the process of forming the current film layer, etc.). Therefore, the bad information at the target position in the current film layer can be retained.

[0050] Accordingly, for the bad information in the current film layer, only the bad information caused by the factors of the current film layer itself can be retained, and there is no need to retain the bad information caused by the historical film layer. On the one hand, the amount of stored data can be reduced, and on the other hand, the complexity of subsequent analysis of bad information can be simplified.

[0051] Figure 2 It is a schematic flowchart of another method for processing product bad information shown according to an embodiment of the present disclosure. As Figure 2 shown, determining whether there is bad information at the corresponding position of the target position in the historical film layer includes:

[0052] In step S201, it is determined whether there is bad information within a preset distance threshold range of the target position in the historical film layer;

[0053] In step S202, if there is bad information, it is determined whether there is bad information at the corresponding position of the target position in the historical film layer.

[0054] In one embodiment, when defective information in a historical film layer causes defective information to also appear in the current film layer, due to factors such as manufacturing processes and film layer structures, there may be slight differences between the positions of the defective information in the historical film layer and the positions of the defective information in the current film layer.

[0055] Therefore, when determining whether there is defective information at the corresponding position of the target position in the historical film layer, it is possible to determine whether there is defective information within a preset distance threshold range of the target position in the historical film layer. For example, the distance between the coordinates of the defective information in the historical film layer and the coordinates of the target position in the historical film layer can be calculated. If this distance is less than the distance threshold, it can be determined that there is defective information at the target position in the historical film layer. If this distance is greater than the distance threshold, it can be determined that there is no defective information at the target position in the historical film layer.

[0056] In the case where this distance is equal to the distance threshold, it can be classified according to needs into the case where this distance is less than the distance threshold or the case where this distance is greater than the distance threshold.

[0057] In one embodiment, when there is a linear defect in the current film layer, such as a defect in the row direction, column direction, diagonal direction, etc., a corresponding straight line of the linear defect can be determined in the historical film layer, and then it is determined whether there is defective information in the defective information of the historical film layer whose distance to this straight line is less than a preset distance threshold. If so, it is determined that there is defective information at the corresponding position of the target position in the historical film layer.

[0058] In one embodiment, determining whether there is defective information within a preset distance threshold range of the target position in the historical film layer includes:

[0059] When there is a defect in the row direction in the current film layer, determine whether there is defective information within a preset distance threshold range in the column direction of the target position in the historical film layer;

[0060] If there is defective information, determine that there is defective information at the corresponding position of the target position in the historical film layer.

[0061] In one embodiment, determining the distance between the defective position with defective information in the historical film layer and the target position includes:

[0062] When there is a defect in the column direction in the current film layer, determine whether there is defective information within a preset distance threshold range in the row direction of the target position in the historical film layer;

[0063] If there is defective information, determine that there is defective information at the corresponding position of the target position in the historical film layer.

[0064] Since the structures in the display panel generally affect an entire row of pixels or an entire column of pixels. For example, problems with the query lines may affect an entire row of pixels, and problems with the data lines may affect an entire column of pixels. Therefore, the defective information in the film layer can be defective in the row direction, such as an entire row of pixels not lighting up or the emission being uncontrolled, or it can be defective in the column direction, such as an entire column of pixels not lighting up or the emission being uncontrolled.

[0065] For defects in the row direction, the defective information extends across the entire panel in the row direction, equivalent to a straight line along the row direction. Then, to determine the distance from a point to the line, only the distance in the perpendicular direction from the point to the line needs to be considered. For a line along the row direction, only the distance in the column direction from the position of the defective information in the historical film layer to this line needs to be considered. That is, it is necessary to calculate whether there is defective information within the preset distance threshold range in the column direction of the target position in the historical film layer. If there is defective information, it can be determined that there is defective information at the target position in the historical film layer. The target position referred to here can be not a single point but an entire row.

[0066] Correspondingly, for defects in the column direction, the defective information extends across the entire panel in the column direction, equivalent to a straight line along the column direction. Then, to determine the distance from a point to the line, only the distance in the perpendicular direction from the point to the line needs to be considered. For a line along the column direction, only the distance in the row direction from the position of the defective information in the historical film layer to this line needs to be considered. That is, it is necessary to calculate whether there is defective information within the preset distance threshold range in the row direction of the target position in the historical film layer. If there is defective information, it can be determined that there is defective information at the target position in the historical film layer. The target position referred to here can be not a single point but an entire column.

[0067] For example, if the row direction is the X direction and the column direction is the Y direction, the pseudocode for the above steps can be as follows:

[0068] INPUT: STEP_LIST: A list of defective points arranged in the order of stations; TOL is the tolerance for considering points to be the same point

[0069]

[0070]

[0071] The DISTANCE function therein means that for defects in the row direction, only the distance in the column direction from the position of the defective information in the historical film layer to the straight line in the row direction needs to be considered; for defects in the column direction, only the distance in the row direction from the position of the defective information in the historical film layer to the straight line in the column direction needs to be considered.

[0072] For example, the input data of STEP_LIST in the above code is in JSON format, and the input data may include, but is not limited to, the following content:

[0073]

[0074]

[0075]

[0076] Where x is the coordinate in the row direction, y is the coordinate in the column direction, and code is the type of defective information.

[0077] In one embodiment, before obtaining the defective information in the current film layer and the defective information in the historical film layer, the method further includes: determining the defective position of the defective information in the current film layer, and the cutting information of the display panel where the defective position is located; determining the association relationship between the coordinates in the display panel and the coordinates in the glass substrate where the display panel is located before cutting according to the cutting history information; determining the position of the defective position in the glass substrate according to the association relationship.

[0078] During the process of manufacturing a display panel, it is generally necessary to cut a relatively large-sized glass substrate to obtain multiple relatively small-sized display panels. The above-mentioned film layer may include the film layer formed before cutting, or may include the film layer formed after cutting.

[0079] The operation of detecting defective information in the film layer is generally performed after the current film layer is manufactured and before the next film layer is manufactured. Therefore, for the film layer formed on the glass substrate before cutting, the position of the defective information recorded during detection is the coordinate in the glass substrate coordinate system, and for the film layer formed in the display panel after cutting, the position of the defective information recorded during detection is the coordinate in the display panel coordinate system. This results in the positions of the defective information in different film layers may be in different coordinate systems, which is not convenient for subsequent processing.

[0080] In this embodiment, before obtaining the defective information in the current film layer and the defective information in the historical film layer, the defective position of the defective information in the current film layer and the cutting information of the display panel where the defective position is located may be determined first.

[0081] Among them, the cutting information may be, for example, the number of the glass substrate where the display panel is located before cutting, the cutting method of the glass substrate, the corresponding relationship between the number and the cutting method in space, etc.

[0082] Based on the cutting information, the association relationship between the coordinates in the display panel and the coordinates in the glass substrate where the display panel was located before cutting can be determined. This association relationship can characterize the relationship between the glass substrate coordinate system and the display panel coordinate system, including but not limited to relationships such as rotation and translation.

[0083] Furthermore, based on the association relationship, the position of the defective location in the glass substrate is determined. For example, if the association relationship is the transformation matrix from the coordinate system of the display panel to the coordinate system of the glass substrate, then the position information of the defective information detected in the display panel can be transformed through this transformation matrix to obtain the position of the defective information in the display panel in the glass substrate.

[0084] Accordingly, the position information of all defective information in the display panel can be transformed to the coordinate system of the glass substrate, which is convenient for subsequent processing. For example, determining the target position of the defective information in the current film layer, and judging whether there is defective information at the corresponding position of the target position in the historical film layer, and operations such as aggregating the defective information.

[0085] Figure 3 It is a schematic flowchart of another method for processing product defective information shown according to an embodiment of the present disclosure. As Figure 3 shown, the method further includes:

[0086] In step S301, the recorded defective information is stored in the first data table;

[0087] In step S302, the data in the first data table is aggregated according to the process flow information in the manufacturing process to obtain a second data table;

[0088] In step S303, data is queried (which can also be referred to as scanned) in the second data table according to the received query instruction.

[0089] Since in the manufacturing process of the display panel, multiple film layers need to be manufactured, and there may be a large amount of defective information detected on each film layer. Then, in the case of manufacturing a large number of display panels in multiple factories, when detecting all display panels in multiple factories, the number of detected defective information will be extremely large.

[0090] According to this embodiment, the recorded defective information can be first stored in the first data table, and then the data in the first data table is aggregated according to the process flow information in the manufacturing process to obtain a second data table, where the process flow information includes but is not limited to the following several types:

[0091] Factory (the factory that manufactures the film layer), Date (the date of manufacturing the film layer), Inspection Site (the site where the film layer is inspected), Equipment (the equipment to which the film layer belongs), Product (the product to which the film layer belongs), Defect Type (the type of defect information in the film layer).

[0092] Among them, aggregating the data in the first data table according to the process flow information in the manufacturing process may refer to integrating multiple pieces of defect information with the same process flow information into one piece of data.

[0093] Taking the process flow information including Date, Inspection Site, and Defect Type as an example, for example, for the following 9 pieces of defect information:

[0094] Defect Information 1: Date 2021.4.25, Inspection Site station1, Type codeA1, coordinates (x1, y1);

[0095] Defect Information 2: Date 2021.4.25, Inspection Site station1, Type codeA1, coordinates (x2, y2);

[0096] Defect Information 3: Date 2021.4.25, Inspection Site station1, Type codeA1, coordinates (x3, y3);

[0097] Defect Information 4: Date 2021.4.25, Inspection Site station1, Type codeA1, coordinates (x4, y4);

[0098] Defect Information 5: Date 2021.4.25, Inspection Site station1, Type codeA2, coordinates (x5, y5);

[0099] Defect Information 6: Date 2021.4.25, Inspection Site station1, Type codeA2, coordinates (x6, y6);

[0100] Defect Information 7: Date 2021.4.25, Inspection Site station1, Type codeA2, coordinates (x7, y7);

[0101] Defect Information 8: Date 2021.4.25, Inspection Site station1, Type codeA2, coordinates (x8, y8);

[0102] Defect Information 9: Date 2021.4.25, Inspection Site station1, Type codeA2, coordinates (x9, y9);

[0103] The dates, detection stations, and types of the above-mentioned bad information 1 to 4 are the same. Therefore, these 4 pieces of bad information can be aggregated into one piece of data. The dates, detection stations, and types of the above-mentioned bad information 5 to 9 are the same. Therefore, these 5 pieces of bad information can be aggregated into one piece of data. Thus, the above 9 pieces of data can be aggregated into 2 pieces of data. For example, the two pieces of aggregated data are as follows:

[0104] Date: April 25, 2021, detection station: station1, type: codeA1, coordinates: (x1,y1), (x2,y2), (x3,y3), (x4,y4); and Date: April 25, 2021, detection station: station1, type: codeA2, coordinates: (x5,y5), (x6,y6), (x7,y7), (x8,y8), (x9,y9).

[0105] Accordingly, multiple pieces of bad information with the same process flow information can be integrated into one piece of data instead of multiple pieces of data, which is beneficial to improving the subsequent query speed.

[0106] In one embodiment, the first data table and / or the second data table is a data table in the Hbase database.

[0107] Since the Hbase database has characteristics such as massive storage, columnar storage, easy expansion, high concurrency, and sparsity, it is convenient to store a large amount of bad information. Moreover, the primary key of Hbase can be designed according to the process flow information based on which the data is aggregated, so that the aggregated data can be stored more reasonably in the data table of Hbase.

[0108] In one embodiment, the primary key of the first data table is the identifier of the display panel; and / or the primary key of the second data table includes at least one of the following: factory, date, detection station, equipment, product, and bad type.

[0109] For example, the first data table can be as shown in Table 1 below, and the second data table can be as shown in Table 2 below:

[0110]

[0111]

[0112] Table 1

[0113]

[0114] Table 2

[0115] In the first data table, by using the identifier of the display panel as the primary key, it is convenient for data loading and storage. In the second data table, the primary key can be designed according to the process flow information based on which the aggregated data is obtained. For example, the process flow information is the same as the primary key, so that the aggregated data can be stored more reasonably in the second data table and it is convenient to query the data in the second data table according to the primary key later.

[0116] For example, one piece of data obtained by storing multiple pieces of defective information in the second data table can be as shown in Table 3 below:

[0117]

[0118]

[0119] Table 3

[0120] That is, for the data of 5 pieces of defective information:

[0121] Factory EAC2, Date 20191001, Site C33000N, Equipment BCXCT01, Product ABCD, Defect Type AD0100, Coordinates (98.01, 60.51);

[0122] Factory EAC2, Date 20191001, Site C33000N, Equipment BCXCT01, Product ABCD, Defect Type AD0100, Coordinates (198.1, 160.5);

[0123] Factory EAC2, Date 20191001, Site C33000N, Equipment BCXCT01, Product ABCD, Defect Type AD0100, Coordinates (298.1, 260.5);

[0124] Factory EAC2, Date 20191001, Site C33000N, Equipment BCXCT01, Product ABCD, Defect Type AD0100, Coordinates (180.1, 160.5);

[0125] Factory EAC2, Date 20191001, Site C33000N, Equipment BCXCT01, Product ABCD, Defect Type AD0100, Coordinates (218.1, 262.5);

[0126] The factory, date, site, equipment, product, and defect type of these 5 pieces of data are the same. Stored according to the storage structure of the second data table, one piece of data in Hbase as shown in Table 3 can be obtained, thus aggregating the data of multiple pieces of defective information into one piece of data for convenient subsequent query.

[0127] In one embodiment, the method further includes:

[0128] Statistically record at least one of the following in the second data table:

[0129] The ratio of the defective information deleted in the current film layer to all the defective information in the current film layer;

[0130] The ratio of the defective information recorded in the current film layer to all the defective information in the current film layer;

[0131] The ratio of the defective information recorded in the current film layer to the defective information in all film layers.

[0132] Due to the Figure 1 shown embodiment, the defective information in the current film layer affected by the historical film layer is deleted. However, these deleted defective information also have some analytical value. Therefore, although these defective information do not need to be specifically recorded, the relevant information of these defective information can be statistically recorded for subsequent analysis.

[0133] In one embodiment, the method further includes: before determining the target position of the defective information in the current film layer, the method further includes:

[0134] Aggregate the detected defective information according to the display panel to which the detected defective information belongs.

[0135] During the detection process, the detection object is all film layers in all display panels. If it is determined whether the defective information in the current film layer is affected by the defective information in the historical film layer for all display panels, it may be determined that the defective information in the current film layer of one display panel is affected by the defective information in the historical film layer of another display panel. However, this determination result is meaningless because there is no direct influence between the film layers of different display panels.

[0136] Therefore, in this embodiment, before determining the target position of the defective information in the current film layer, the detected defective information can be aggregated according to the display panel to which the detected defective information belongs to ensure that it is determined whether the defective information in the current film layer is affected by the defective information in the historical film layer for the same display panel, and to avoid recording unnecessary information.

[0137] In one embodiment, the method further includes: before aggregating the detected defective information according to the display panel to which the detected defective information belongs, the method further includes:

[0138] Read the historical defective information recorded for the historical film layer;

[0139] Load the defective information detected in the current film layer into the historical defective information.

[0140] During the manufacturing process of a display panel, multiple film layers are generally manufactured in sequence. The manufacturing times of different film layers are different, and even some film layers are not manufactured on the same day. The defective information detected for each film layer can be stored. Then, there will be defective information recorded for the previously formed film layers and defective information recorded for the subsequently formed film layers.

[0141] In this embodiment, when detecting the current film layer, the historical defective information recorded for the historical film layers can be read, and then the defective information detected in the current film layer can be loaded into the historical defective information, so that the loaded information contains the defective information of all film layers in the display panel, facilitating subsequent determination of whether there is defective information at the target position in the historical film layers for all film layers.

[0142] In one embodiment, the querying data in the second data table according to the received query instruction includes: receiving the query instruction sent by the client; querying the second data table according to the query instruction; and generating front-end data according to the query result.

[0143] In one embodiment, the generating front-end data according to the query result includes: displaying the trend of defective information according to the query result; and / or displaying the distribution of defective information according to the query result. By displaying the trend of defective information, it is convenient for users to view the changes in defective information in the time dimension. By displaying the distribution of defective information, it is convenient for users to view the distribution of defective information in each film layer and each panel.

[0144] In one embodiment, the method of the present disclosure can be implemented based on the data warehouse technology ETL (Extract Transform Load). ETL can be implemented based on YMS (Yield Manager System), Hive (a data warehouse tool), Spark (a computing engine), and Hbase database. The specific implementation method can refer to the subsequent embodiments of the product defective information query system.

[0145] First, all the detected defective information can be stored in YMS, then the defective information is extracted from YMS and landed in Hive, and then Spark queries the defective information from Hive and writes it into the Hbase database. The steps in the above embodiments can be mainly completed by Spark, such as recording, deleting defective information, and aggregating data.

[0146] Users can input query instructions on the client side, and the client side can input the query instructions into the server module. The server module is used to interact with Hbase, query data from the second data table of Hbase based on the query instructions, and send the queried data to the client side for display. The client side can display the query results according to the settings, such as displaying bar charts, the distribution of defective information, etc.

[0147] The interface of the client side can mainly include three parts. Its first area is for users to input query elements, such as the primary key in the second data table; the second area is used to display the trend of the query results. For example, the abscissa is time and the ordinate is the quantity of defective information. The display method can be a bar chart or other methods can be set according to needs; other areas in the interface are used to display the positions of defective information in each film layer and the distribution of defective information recorded in the display panel in the embodiment shown. Figure 1 The distribution of defective information recorded in the display panel in the embodiment shown.

[0148] Users can generate query instructions by inputting query elements in the interface of the client side and send them to the server module. The server module queries data from the second data table of Hbase based on the query instructions, feeds back the query results to the client side, and the client side displays them in the interface.

[0149] In addition, the embodiments of the present disclosure also provide a function for downloading data details. For example, data download can be performed based on defective information in a large number of display panels. For example, after the user clicks on the bar chart or inputs the LOT ID (each LOT can correspond to a large number of display panels) through the interface, the client side sends a LOT detail query request to the Server module, generates a query task for the original data table after the previous layer is filtered, generates a corresponding data detail file, and returns it to the front end for download.

[0150] Figure 4 It is a schematic flowchart of data aggregation shown according to the embodiments of the present disclosure.

[0151] As Figure 4 shown, first, a time range can be input to determine the defective information of the historical film layer within this time range;

[0152] Then Spark can record the defective information of the current film layer detected at each site from Hive. In the case where the glass substrate needs to be cut, the coordinates of the defective information in the glass substrate can also be converted to the cut panel.

[0153] When forming the historical film layer, the defective records in the historical film layer can be recorded in the first data table. Then, when forming the current film layer, the defective information of the historical film layer can be obtained from the first data table, and the defective information detected in the current film layer can be loaded into the defective information of the historical film layer.

[0154] Next, the detected defective information can be aggregated according to the display panel to which the detected defective information belongs;

[0155] Based on Figure 1 In the embodiment shown, the defective information that exists in the current film layer and is not affected by the historical film layer is recorded, and the recording result can be updated to the first data table. Thus, the defective information stored in the first data table includes both the defective information of the current film layer and the defective information of the historical film layer;

[0156] Finally, the data in the first data table can be aggregated according to the process flow information in the manufacturing process, and the aggregated data is stored in the second data table. The primary key of the second data table can be the same as the process flow information.

[0157] Figure 5A is a schematic diagram of a product defective information query system shown according to an embodiment of the present disclosure. As Figure 5A shown, the system includes a data processing device 300, a display device 200, and a distributed storage device 400; the query can be used to query the defective information of the product, and the product can include multiple film layers, and the product includes but is not limited to an organic light-emitting diode display panel, a liquid crystal display panel, etc.

[0158] The distributed storage device is used to store the defective information detected in the current film layer and the defective information in the historical film layer, where the historical film layer is formed before the current film layer;

[0159] The data processing device is used to obtain the defective information detected in the current film layer from the distributed storage device, determine the target position of the defective information in the current film layer, and judge whether there is defective information at the corresponding position of the target position in the historical film layer. When there is defective information at the target position of the historical film layer, the defective information detected at the target position in the current film layer is deleted. When there is no defective information at the target position of the historical film layer, the defective information detected at the target position in the current film layer is retained, and the retained defective information is stored in the distributed storage device;

[0160] The display device is used to query the defective information in the distributed storage device according to the received query instruction and generate front-end data.

[0161] In one embodiment, the data processing device is further used to store the recorded defective information in the first data table; aggregate the data in the first data table according to the process flow information in the manufacturing process to obtain a second data table; and the display device is used to query the defective information in the second data table according to the query instruction.

[0162] Currently, the production line of industrial products includes several process devices. Each process device may affect the yield of products when it malfunctions or its working parameters are abnormal. When defective products are produced, production personnel need to locate the cause of the defect. However, the process devices in the production line or the amount of data generated is relatively large, increasing the complexity of locating the cause, thus resulting in a large amount of time consumed in locating the device that causes the defect.

[0163] Embodiments of the present disclosure provide a product defect information query system. As Figure 5A shown, the product defect information query system includes a data processing device 300, a display device 200, and a distributed storage device 400. The data processing device 300 is respectively connected to the display device 200 and the distributed storage device 400.

[0164] The distributed storage device 400 is used to store production data generated by multiple sample production devices (or referred to as factory devices). For example, the production data generated by multiple sample production devices includes production records of multiple sample production devices; for example, the production records include information on the sample production devices passed by multiple samples during the production process and information on the types of defects that occur. Each sample experiences multiple sample production devices during the production process, and each sample production device participates in and only participates in the production process of some of the multiple samples.

[0165] Among them, relatively complete data (such as a database) is stored in the distributed storage device. The distributed storage device may include multiple hardware memories, and different hardware memories are distributed at different physical locations (such as in different factories or on different production lines), and information transmission between them is achieved through wireless transmission (such as a network, etc.), so that the data is in a distributed relationship, but logically constitutes a database based on big data technology.

[0166] Figure 5B is a data flow schematic diagram of a product defect information query system shown according to an embodiment of the present disclosure. As Figure 5BAs shown, a large amount of original data of different sample production devices, such as the defective information of the film layer in the product, is stored in the corresponding production manufacturing systems, such as relational databases (such as Oracle, Mysql, etc.) of systems like YMS (Yield Management System), FDC (Fault Detection & Classification), and MES (Manufacturing Execution System). And these original data can be extracted from the original table through data extraction tools (such as Sqoop, kettle, etc.) and transmitted to a distributed storage device (such as a distributed file system, Hadoop Distributed File System, abbreviated as HDFS) to reduce the load on the sample production devices and production manufacturing systems and facilitate subsequent data reading for device analysis.

[0167] The data in the distributed storage device can be stored based on the Hive tool and the Hbase database format. For example, according to the Hive tool, the above original data is first stored in the data lake; then, preprocessing such as data cleaning and data transformation can be continued in the Hive tool according to the application themes, scenarios, etc. of the data to obtain data warehouses with different themes (such as production resume theme, detection data theme, device data theme) and data marts with different scenarios (such as device analysis scenario, parameter analysis scenario), such as Hbase. These data marts can then be connected to display devices, analysis devices, etc. through different API interfaces to achieve data interaction with these devices.

[0168] Among them, since it involves multiple sample production devices in multiple factories, the data volume of the above original data is very large. For example, the original data generated by all sample production devices every day may be several hundred GB, and the data generated per hour may also be dozens of GB.

[0169] In one embodiment, there are mainly two solutions for storing and computing massive structured data: the grid computing solution of the RDBMS (Relational Database Management System); the big data solution of the distributed file management system (Distributed File System, DFS).

[0170] DFS-based big data technology allows the construction of large clusters using multiple inexpensive hardware devices to process massive amounts of data. For example, the Hive tool is a data warehouse tool based on Hadoop that can be used for Extract, Transform, Load (ETL). The Hive tool defines a simple SQL-like query language and also allows complex analysis tasks that the default tool cannot complete through custom MapReduce mappers and reducers. The Hive tool does not have a specific data storage format and does not create indexes for data. Users can freely organize the tables in it and process the data in the database. It can be seen that the parallel processing of distributed file management can meet the storage and processing requirements of massive data. Users can process simple data through SQL queries, and use custom functions for complex processing. Therefore, when analyzing the massive data of a factory, it is necessary to extract the data from the factory database to the distributed file system, which will not damage the original data on the one hand and improve the data analysis efficiency on the other hand.

[0171] In one embodiment, the distributed storage device 400 can be a memory, multiple memories, or a collective term for multiple storage elements. For example, the memory can include: Random Access Memory (RAM), Double Data Rate Synchronous Dynamic Random Access Memory (DDR SRAM), and can also include non-volatile memory, such as disk memory, Flash, etc.

[0172] The data processing device 300 is used to implement the product defect information query method described in any of the following embodiments, and can be implemented based on Spark (a computing engine) for example. The data processing device 300 can obtain production records of one or more sample production devices from the distributed storage device 400, such as defect information in the film layer of a product. Specifically, it can obtain the defect information detected in the current film layer from the distributed storage device 400 (such as from Hbase), determine the target location of the defect information in the current film layer, and determine whether there is defect information at the corresponding location of the target location in the historical film layer. In the case where there is defect information at the target location in the historical film layer, delete the defect information detected at the target location in the current film layer. In the case where there is no defect information at the target location in the historical film layer, retain the defect information detected at the target location in the current film layer and store the retained defect information in the distributed storage device (such as storing it in Hbase).

[0173] The display device 200 is used to display the interface of the front-end data and interact with the user. For example, the interface may include the first interface, the second interface, the third interface, etc. described below. For example, the display device 200 can display the processing result of the data processing device 300.

[0174] In one embodiment, the display device may be a display, or a product including a display, such as a television, a computer (all-in-one or desktop), a computer, a tablet, a mobile phone, an electronic picture screen, etc. In one embodiment, the display device may be any device that displays whether it is moving (e.g., video) or stationary (e.g., still image), and whether it is text or an image. More specifically, it is contemplated that the embodiments may be implemented in or associated with a variety of electronic devices, such as (but not limited to) game consoles, television monitors, flat panel displays, computer monitors, automotive displays (e.g., odometer displays, etc.), navigators, cockpit controllers and / or displays, electronic photos, electronic billboards or signs, projectors, architectural structures, packaging, and aesthetic structures (e.g., a display of an image of a piece of jewelry), etc.

[0175] In one embodiment, the display device described in the text may include one or more displays, including one or more terminals with display functions, so that the data processing device can send the data (e.g., impact parameters) processed by it to the display device, and the display device then displays it. That is to say, through the interface of the display device (i.e., the user interaction interface), the complete interaction (control and receiving results) between the user and the system for analyzing the causes of sample defects can be realized.

[0176] Embodiments of the present disclosure provide an electronic device. For example, the electronic device may be a computer, a computer, etc. As Figure 3 shown, the electronic device 500 includes a data processing device 300 and a display device 200. The display device 200 is connected to the data processing device 300.

[0177] The data processing device 300 is used to implement the product defect information query method described in any of the following embodiments. The display device 200 is used to display an interface. For example, the display device 200 is used to display the processing result of the data processing device 300.

[0178] It should be noted that the data processing device and the display device in the above electronic device are similar to the data processing device and the display device in the above product defect information query method. The specific content of the data processing device and the display device in the electronic device can refer to the previous description and will not be elaborated here.

[0179] In some embodiments, as Figure 5BAs shown, the data processing device 300 includes a memory 301 and a processor 302. Among them, the memory 301 is connected to the processor 302. In one embodiment, the processor and the memory are connected through, for example, an I / O interface, so as to enable information interaction.

[0180] One or more computer programs that can run on the processor 302 are stored in the memory 301.

[0181] When the processor 302 executes the computer program, the data processing device 300 implements the product defect information query method described in any of the following embodiments.

[0182] In one embodiment, the above-mentioned processor 302 can be a single processor or a collective term for multiple processing elements. For example, the processor 302 can be a general-purpose central processing unit (CPU), a microprocessor, an application specific integrated circuit (ASIC), or one or more integrated circuits for controlling the execution of the program of the present disclosure, such as: one or more microprocessors. Again, for example, the processor 302 can be a programmable device; for example, the programmable device is a CPLD (Complex Programmable Logic Device), an EPLD (Erasable Programmable Logic Device), or an FPGA (field-programmable gate array).

[0183] The above-mentioned memory 301 can be a single memory or a collective term for multiple storage elements, and is used to store executable program codes, etc. And the memory 301 can include a random access memory and can also include a non-volatile memory, such as a disk memory, a flash memory, etc.

[0184] Among them, the memory 301 is used to store the application program code for executing the present disclosure solution, and is controlled by the processor 320 for execution. The processor 302 is used to execute the application program code stored in the memory 301 to control the data processing device 300 to implement the product defect information query method provided in any of the following embodiments of the present disclosure.

[0185] Figure 6FIG. 0 is a schematic flow chart of a method for querying product defect information according to an embodiment of the present disclosure. The method shown in this embodiment can be used to query the defect information of the film layers in a product. The product includes a plurality of film layers, and the product may be a display panel, including but not limited to an organic light emitting diode display panel, a liquid crystal display panel, etc.

[0186] As Figure 6 shown, the method for processing product defect information may include the following steps:

[0187] In step S601, receive a query instruction sent by a client;

[0188] In step S602, query the defect information in the plurality of film layers according to the query instruction;

[0189] In step S603, generate front-end data according to the query result;

[0190] Among them, the defect information in the plurality of film layers is determined based on the following method: obtain the defect information in the current film layer and the defect information in the historical film layer, where the historical film layer is formed before the current film layer; determine the target position of the defect information in the current film layer, and determine whether there is defect information at the corresponding position of the target position in the historical film layer; if there is defect information at the target position in the historical film layer, delete the defect information detected at the target position in the current film layer; if there is no defect information at the target position in the historical film layer, retain the defect information detected at the target position in the current film layer. The defect information stored in the data table includes the recorded defect information.

[0191] In one embodiment, the method of the present disclosure may be implemented based on the data warehouse technology ETL (Extract Transform Load). ETL can be implemented based on YMS (Yield Manager System), Hive (a data warehouse tool), Spark (a computing engine) and Hbase database, and can be implemented according to the above embodiments of the product defect information query system, for example.

[0192] First, all detected defect information can be stored in YMS, then the defect information is extracted from YMS and landed in Hive, and then Spark queries the defect information from Hive and writes it into the Hbase database. The above operations of deleting and retaining defect information can be completed by Spark.

[0193] According to an embodiment of the present disclosure, since the defective information stored in the data table is not the defective information directly recorded when the defective information is detected at the target position in the current film layer, but it is determined whether there is also defective information at the target position in the historical film layer formed previously. If there is also defective information, it indicates that the defective information at the target position in the current film layer is caused by the defective information at the target position in the historical film layer. Therefore, the defective information at the target position in the current film layer can be deleted. If there is no defective information, it indicates that the defective information at the target position in the current film layer is not caused by the defective information at the target position in the historical film layer, but is caused by the factors of the current film layer itself (the implementation environment of the current film layer, the process of forming the current film layer, etc.). Therefore, the defective information at the target position in the current film layer can be recorded.

[0194] Accordingly, for the defective information in the current film layer, only the defective information caused by the factors of the current film layer itself can be retained, and there is no need to retain the defective information caused by the historical film layer. On the one hand, the amount of stored data can be reduced, and on the other hand, the complexity of subsequent analysis of defective information can be simplified. Thus, when querying the data table storing defective information according to the query instruction of the client and generating the front-end data according to the query result, the amount of queried data is relatively small, which is beneficial to shortening the query latency, and the complexity of distributing the defective information is also relatively low, facilitating user viewing.

[0195] In one embodiment, when the distance between the defective position with defective information in the historical film layer and the target position is less than the distance threshold, it is determined whether there is defective information at the corresponding position of the target position in the historical film layer.

[0196] In one embodiment, when the defective information in the historical film layer causes the current film layer to also have defective information, due to factors such as the manufacturing process and film layer structure, there may be slight differences between the position of the defective information in the historical film layer and the position of the defective information in the current film layer.

[0197] Therefore, when determining whether there is defective information at the corresponding position of the target position in the historical film layer, it can be determined whether there is defective information within the preset distance threshold range of the target position in the historical film layer. For example, the distance between the coordinates of the defective information in the historical film layer and the coordinates of the target position in the historical film layer can be calculated. When this distance is less than the distance threshold, it can be determined that there is defective information at the target position in the historical film layer, and if this distance is greater than the distance threshold, it can be determined that there is no defective information at the target position in the historical film layer.

[0198] In one embodiment, when there is a defect in the row direction in the current film layer, determine the first distance in the column direction between the defective position with defective information in the historical film layer and the row pixels corresponding to the row direction defect; when the distance is less than the first distance threshold, determine that there is defective information at the corresponding position of the target position in the historical film layer.

[0199] In one embodiment, when there is a defect in the column direction in the current film layer, determine the second distance in the row direction between the defective position with defective information in the historical film layer and the column pixels corresponding to the column direction defect; when the distance is less than the second distance threshold, determine that there is defective information at the corresponding position of the target position in the historical film layer.

[0200] Since the structure in the display panel generally affects the entire row of pixels or the entire column of pixels. For example, a problem with the query line may affect the entire row of pixels, and a problem with the data line may affect the entire column of pixels. Therefore, the defective information in the film layer can be defective in the row direction, such as the entire row of pixels not lighting up or the light emission being out of control, or it can be defective in the column direction, such as the entire column of pixels not lighting up or the light emission being out of control.

[0201] For the defect in the row direction, the defective information extends to the entire panel in the row direction, which is equivalent to a straight line along the row direction. Then, when determining the distance from a point to the straight line, only consider the distance in the perpendicular direction from the point to the straight line. For a straight line along the row direction, only consider the distance in the column direction from the position of the defective information in the historical film layer to the straight line. That is, calculate whether there is defective information within the preset distance threshold range in the column direction of the target position in the historical film layer. If there is defective information, it can be determined that there is defective information at the target position in the historical film layer. Here, the target position referred to may not be a point, but a row.

[0202] Correspondingly, for the defect in the column direction, the defective information extends to the entire panel in the column direction, which is equivalent to a straight line along the column direction. Then, when determining the distance from a point to the straight line, only consider the distance in the perpendicular direction from the point to the straight line. For a straight line along the column direction, only consider the distance in the row direction from the position of the defective information in the historical film layer to the straight line. That is, calculate whether there is defective information within the preset distance threshold range in the row direction of the target position in the historical film layer. If there is defective information, it can be determined that there is defective information at the target position in the historical film layer. Here, the target position referred to may not be a point, but a column.

[0203] In one embodiment, before obtaining the defective information in the current film layer and the defective information in the historical film layer, the method for determining the defective information in the multiple film layers further includes: determining the defective position of the defective information in the current film layer and the cutting information of the display panel where the defective position is located; determining the association relationship between the coordinates in the display panel and the coordinates in the glass substrate where the display panel is located before cutting according to the cutting history information; and determining the position of the defective position in the glass substrate according to the association relationship.

[0204] During the process of manufacturing a display panel, it is generally necessary to cut a relatively large-sized glass substrate to obtain multiple relatively small-sized display panels. The above-mentioned film layers may include the film layers formed before cutting or the film layers formed after cutting.

[0205] The operation of detecting the defective information in the film layer is generally carried out after the current film layer is manufactured and before the next film layer is manufactured. Therefore, for the film layer formed on the glass substrate before cutting, the position of the defective information recorded during detection is the coordinate in the glass substrate coordinate system, and for the film layer formed in the display panel after cutting, the position of the defective information recorded during detection is the coordinate in the display panel coordinate system. This results in the positions of the defective information in different film layers being possibly located in different coordinate systems, which is not convenient for subsequent processing.

[0206] In this embodiment, before obtaining the defective information in the current film layer and the defective information in the historical film layer, the defective position of the defective information in the current film layer and the cutting information of the display panel where the defective position is located can be determined first.

[0207] Among them, the cutting information may be, for example, the number of the glass substrate where the display panel is located before cutting, the cutting method of the glass substrate, the corresponding relationship between the number and the cutting method in space, etc.

[0208] Based on the cutting information, the association relationship between the coordinates in the display panel and the coordinates in the glass substrate where the display panel is located before cutting can be determined. This association relationship can represent the relationship between the glass substrate coordinate system and the display panel coordinate system, including but not limited to relationships such as rotation and translation.

[0209] Furthermore, according to the association relationship, the position of the defective position in the glass substrate can be determined. For example, if the association relationship is the transformation matrix from the coordinate system of the display panel to the coordinate system of the glass substrate, then the position information of the defective information detected in the display panel can be transformed through this transformation matrix to obtain the position of the defective information in the display panel in the glass substrate.

[0210] Accordingly, the position information of the defective information in all display panels can be converted to the coordinate system of the glass substrate, which is convenient for subsequent processing, such as determining the target position of the defective information in the current film layer, determining whether there is defective information at the corresponding position of the target position in the historical film layer, and aggregating the defective information, etc.

[0211] In one embodiment, before receiving the query instruction sent by the client, the method further includes:

[0212] Storing the recorded defective information into a first data table;

[0213] Aggregating the data in the first data table according to the process flow information in the manufacturing process to obtain the second data table.

[0214] Since multiple film layers need to be fabricated during the production of a display panel, and there may be a large number of defective information detected on each film layer, then in the case of fabricating a large number of display panels in multiple factories, when detecting all the display panels in multiple factories, the number of detected defective information will be extremely large.

[0215] According to this embodiment, the recorded defective information can be first stored in the first data table, and then the data in the first data table is aggregated according to the process flow information in the manufacturing process to obtain the second data table, where the process flow information includes but is not limited to the following:

[0216] Factory (the factory where the film layer is fabricated), Date (the date when the film layer is fabricated), Detection Site (the site where the film layer is detected), Equipment (the equipment to which the film layer belongs), Product (the product to which the film layer belongs), Defect Type (the type of defective information in the film layer).

[0217] Among them, aggregating the data in the first data table according to the process flow information in the manufacturing process may refer to integrating multiple pieces of defective information with the same process flow information into one piece of data. Accordingly, multiple pieces of defective information with the same process flow information can be integrated into one piece of data instead of multiple pieces of data, which is beneficial to improving the subsequent query speed.

[0218] In one embodiment, the first data table and / or the second data table is a data table in the Hbase database.

[0219] Since the Hbase database has characteristics such as massive storage, columnar storage, extremely easy expansion, high concurrency, and sparseness, it is convenient for storing a large amount of defective information, and the primary key of Hbase can be designed according to the process flow information based on which the data is aggregated, so that the aggregated data is stored more reasonably in the data table of Hbase.

[0220] In one embodiment, the primary key of the first data table is the identifier of the display panel; and / or the primary key of the second data table includes at least one of the following: factory, date, inspection site, equipment, product, and type of defect.

[0221] In one embodiment, before receiving the query instruction sent by the client, the method further includes:

[0222] Count and store at least one of the following in the second data table:

[0223] The ratio of the defective information deleted in the current film layer to all the defective information in the current film layer;

[0224] The ratio of the defective information recorded in the current film layer to all the defective information in the current film layer;

[0225] The ratio of the defective information recorded in the current film layer to the defective information in all film layers.

[0226] Although the defective information in the current film layer affected by the historical film layer has been deleted, this deleted defective information still has some analytical value. Therefore, although it is not necessary to specifically record this defective information, relevant information about this defective information can be counted for subsequent analysis.

[0227] In one embodiment, before determining the target position of the defective information in the current film layer, the method further includes:

[0228] Aggregate the detected defective information according to the display panel to which the detected defective information belongs.

[0229] During the detection process, the detection object is all film layers in all display panels. If it is determined whether the defective information in the current film layer is affected by the defective information in the historical film layer for all display panels, it may be determined that the defective information in the current film layer of one display panel is affected by the defective information in the historical film layer of another display panel. However, this determination result is meaningless because there is no direct influence between the film layers of different display panels.

[0230] Therefore, in this embodiment, before determining the target position of the defective information in the current film layer, the detected defective information can be aggregated according to the display panel to which the detected defective information belongs to ensure that it is determined whether the defective information in the current film layer is affected by the defective information in the historical film layer for the same display panel, and to avoid recording unnecessary information.

[0231] In one embodiment, before aggregating the detected defective information according to the display panel to which the detected defective information belongs, the method further includes:

[0232] Read the historical defective information recorded for the historical film layer;

[0233] Load the defective information detected in the current film layer into the historical defective information.

[0234] During the production process of the display panel, multiple film layers are generally fabricated in sequence. The fabrication times of different film layers are different, and even some film layers are not fabricated on the same day. The defective information detected for each film layer can be stored. Then, there will be defective information recorded for the previously formed film layer and defective information recorded for the subsequently formed film layer.

[0235] In this embodiment, when detecting the current film layer, the historical defective information recorded for the historical film layer can be read, and then the defective information detected in the current film layer can be loaded into the historical defective information, so that the loaded information contains the defective information of all film layers in the display panel, facilitating subsequent determination of whether there is defective information at the target position in the historical film layer for all film layers.

[0236] In one embodiment, the generating the front-end data according to the query result includes: displaying the trend of the defective information according to the query result; and / or displaying the distribution of the defective information according to the query result. By displaying the trend of the defective information, it is convenient for the user to view the change of the defective information in the time dimension. By displaying the distribution of the defective information, it is convenient for the user to view the distribution of the defective information in each film layer and each panel.

[0237] Corresponding to the foregoing embodiments of the product defective information processing method and the product defective information query method, the present disclosure also provides embodiments of a product defective information processing device and a product defective information query device.

[0238] Figure 7 FIG. is a schematic block diagram of a product defective information processing device shown according to an embodiment of the present disclosure. The device shown in this embodiment can be applied in the process of detecting the film layers of a product. The product includes multiple film layers. For example, it can be applied in the early film-forming stage of manufacturing a display panel, in the process of detecting each film layer, or in the stage of forming other film layers, in the process of detecting other film layers. The product can be a display panel, and the display panel includes, but is not limited to, an organic light-emitting diode display panel, a liquid crystal display panel, etc.

[0239] As Figure 7 shown, the product defective information processing device may include:

[0240] A defective information acquisition module 701, configured to acquire the defective information in the current film layer and the defective information in the historical film layer, where the historical film layer is formed before the current film layer;

[0241] A defect determination module 702, configured to determine a target position of defect information in the current film layer, and determine whether there is defect information at a corresponding position of the target position in the historical film layer;

[0242] An information deletion module 703, configured to delete the defect information detected at the target position in the current film layer if there is defect information at the target position in the historical film layer;

[0243] An information recording module 704, configured to retain the defect information detected at the target position in the current film layer if there is no defect information at the target position in the historical film layer.

[0244] In one embodiment, the defect determination module is configured to determine whether there is defect information within a preset distance threshold range of the target position in the historical film layer; if there is defect information, it is determined that there is defect information at the corresponding position of the target position in the historical film layer.

[0245] In one embodiment, the defect determination module is configured to determine whether there is defect information within a preset distance threshold range in the column direction of the target position in the historical film layer when there is a row-direction defect in the current film layer; if there is defect information, it is determined that there is defect information at the corresponding position of the target position in the historical film layer.

[0246] In one embodiment, the defect determination module is configured to determine whether there is defect information within a preset distance threshold range in the row direction of the target position in the historical film layer when there is a column-direction defect in the current film layer; if there is defect information, it is determined that there is defect information at the corresponding position of the target position in the historical film layer.

[0247] In one embodiment, the apparatus further includes:

[0248] A cutting determination module, configured to determine a defective position of the defect information in the current film layer, and cutting information of the display panel where the defective position is located;

[0249] A relationship determination module, configured to determine an association relationship between coordinates in the display panel and coordinates in the glass substrate where the display panel is located before cutting according to the cutting history information;

[0250] A position determination module, configured to determine the position of the defective position in the glass substrate according to the association relationship.

[0251] Figure 8 It is a schematic block diagram of another product defect information processing apparatus shown according to an embodiment of the present disclosure. AsFigure 8 As shown, the device further includes:

[0252] An information storage module 801, configured to store the recorded defective information into a first data table;

[0253] A data aggregation module 802, configured to aggregate the data in the first data table according to the process flow information in the manufacturing process to obtain a second data table;

[0254] A data query module 803, configured to query data in the second data table according to a received query instruction.

[0255] Figure 9 is a schematic block diagram of another product defective information processing device shown according to an embodiment of the present disclosure. As Figure 9 shown, the device further includes:

[0256] A statistics module 901, configured to statistically calculate at least one of the following and store it into the second data table:

[0257] The ratio of the defective information deleted in the current film layer to all the defective information in the current film layer;

[0258] The ratio of the defective information recorded in the current film layer to all the defective information in the current film layer;

[0259] The ratio of the defective information recorded in the current film layer to the defective information in all film layers.

[0260] In one embodiment, the data aggregation module is further configured to aggregate the detected defective information according to the display panel to which the detected defective information belongs.

[0261] Figure 10 is a schematic block diagram of another product defective information processing device shown according to an embodiment of the present disclosure. As Figure 10 shown, the device further includes:

[0262] An information reading module 1001, configured to read historical defective information recorded for a historical film layer;

[0263] An information loading module 1002, configured to load the defective information detected in the current film layer into the historical defective information.

[0264] In one embodiment, the first data table and / or the second data table is a data table in an Hbase database.

[0265] In one embodiment, the primary key of the first data table is the identifier of the display panel; and / or the primary key of the second data table includes at least one of the following: factory, date, inspection site, equipment, product, and defect type.

[0266] In one embodiment, the data query module is configured to receive a query instruction sent by a client; query the second data table according to the query instruction; and generate front-end data based on the query result.

[0267] In one embodiment, the data query module is configured to display the trend of defect information based on the query result; and / or display the distribution of defect information based on the query result.

[0268] Figure 11 FIG. is a schematic block diagram of a product defect information query device shown according to an embodiment of the present disclosure. The device shown in this embodiment can be used to query defect information of a film layer in a product. The product includes a plurality of film layers, and the product can be, for example, a display panel, including but not limited to an organic light-emitting diode display panel, a liquid crystal display panel, etc.

[0269] As Figure 11 shown, the product defect information processing device may include:

[0270] An instruction receiving module 1101, configured to receive a query instruction sent by a client;

[0271] An information query module 1102, configured to query defect information in the plurality of film layers according to the query instruction;

[0272] A front-end generation module 1103, configured to generate front-end data based on the query result;

[0273] Among them, the defect information in the plurality of film layers is determined in the following manner: obtaining defect information in the current film layer and defect information in a historical film layer, where the historical film layer is formed before the current film layer; determining the target position of the defect information in the current film layer, and determining whether there is defect information at the corresponding position of the target position in the historical film layer; if there is defect information at the target position in the historical film layer, deleting the defect information detected at the target position in the current film layer; if there is no defect information at the target position in the historical film layer, retaining the defect information detected at the target position in the current film layer, and the defect information stored in the data table includes the recorded defect information.

[0274] In one embodiment, when the distance between the defective position with defect information in the historical film layer and the target position is less than a distance threshold, it is determined that there is defect information at the corresponding position of the target position in the historical film layer.

[0275] In one embodiment, when there is a defect in the row direction in the current film layer, determine the first distance in the column direction between the defective position where defective information exists in the historical film layer and the row pixels corresponding to the defect in the row direction; when the distance is less than the first distance threshold, determine that there is defective information at the corresponding position of the target position in the historical film layer.

[0276] In one embodiment, when there is a defect in the column direction in the current film layer, determine the second distance in the row direction between the defective position where defective information exists in the historical film layer and the column pixels corresponding to the defect in the column direction; when the distance is less than the second distance threshold, determine that there is defective information at the corresponding position of the target position in the historical film layer.

[0277] In one embodiment, the method for determining defective information in the multiple film layers further includes: before obtaining the defective information in the current film layer and the defective information in the historical film layer, determine the defective position of the defective information in the current film layer and the cutting information of the display panel where the defective position is located; determine the association relationship between the coordinates in the display panel and the coordinates in the glass substrate where the display panel is located before cutting according to the cutting history information; determine the position of the defective position in the glass substrate according to the association relationship.

[0278] Figure 12 is a schematic block diagram of another product defective information query device shown according to an embodiment of the present disclosure. As Figure 12 shown, the device further includes:

[0279] An information storage module 1201, configured to store the recorded defective information into a first data table;

[0280] A data aggregation module 1202, configured to aggregate the data in the first data table according to the process flow information in the manufacturing process to obtain the second data table.

[0281] Figure 13 is a schematic block diagram of yet another product defective information query device shown according to an embodiment of the present disclosure. As Figure 13 shown, the device further includes:

[0282] A statistics module 1301, configured to statistically calculate and store at least one of the following into the second data table:

[0283] The ratio of the defective information deleted in the current film layer to all the defective information in the current film layer;

[0284] The ratio of the defective information recorded in the current film layer to all the defective information in the current film layer;

[0285] The ratio of the defective information recorded in the current film layer to the defective information in all film layers.

[0286] In one embodiment, the data aggregation module is further configured to aggregate the detected defective information according to the display panel to which the detected defective information belongs.

[0287] Figure 14 It is a schematic block diagram of another product defective information query device shown according to an embodiment of the present disclosure. As Figure 14 shown, the device further includes:

[0288] An information reading module 1401, configured to read historical defective information recorded for historical film layers;

[0289] An information loading module 1402, configured to load the defective information detected in the current film layer into the historical defective information.

[0290] In one embodiment, the first data table and / or the second data table are data tables in an Hbase database.

[0291] In one embodiment, the primary key of the first data table is the identifier of the display panel; and / or the primary key of the second data table includes at least one of the following: factory, date, detection site, device, product, defective type.

[0292] In one embodiment, the front-end generation module is configured to display the trend of defective information according to the query result; and / or display the distribution of defective information according to the query result.

[0293] Regarding the device in the above embodiments, the specific manners in which each module performs operations have been described in detail in the embodiments of the related method, and will not be elaborated herein.

[0294] For the device embodiments, since they basically correspond to the method embodiments, reference may be made to the partial descriptions of the method embodiments for the relevant parts. The device embodiments described above are merely illustrative. The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical modules, that is, they may be located in one place, or may be distributed to multiple network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art can understand and implement it without creative effort.

[0295] An embodiment of the present disclosure also provides a detection device, including: a processor; a memory for storing processor-executable instructions; wherein the processor is configured to implement the product defective information processing method described in any of the above embodiments.

[0296] Embodiments of the present disclosure also provide an electronic device, including: a processor; a memory for storing instructions executable by the processor; wherein the processor is configured to implement the product defective information query method according to any one of the above embodiments.

[0297] Embodiments of the present disclosure also provide a computer-readable storage medium, on which a computer program is stored, characterized in that when the program is executed by a processor, the steps in the product defective information processing method according to any one of the above embodiments are implemented.

[0298] Embodiments of the present disclosure also provide a computer-readable storage medium, on which a computer program is stored, and when the program is executed by a processor, the steps in the product defective information query method according to any one of the above embodiments are implemented.

[0299] Figure 15 FIG. 12 is a schematic block diagram of a device 1500 for querying defective information according to an embodiment of the present disclosure. For example, the device 1500 may be a mobile phone, a computer, a digital broadcast terminal, a messaging device, a game console, a tablet device, a medical device, a fitness device, a personal digital assistant, etc.

[0300] Referring to Figure 15 , the device 1500 may include one or more of the following components: a processing component 1502, a memory 1504, a power component 1506, a multimedia component 1508, an audio component 1510, an input / output (I / O) interface 1512, a sensor component 1514, and a communication component 1516.

[0301] The processing component 1502 generally controls the overall operation of the device 1500, such as operations associated with display, telephone calls, data communication, camera operations, and recording operations. The processing component 1502 may include one or more processors 1520 to execute instructions to complete all or part of the steps of the above product defective information query method. In addition, the processing component 1502 may include one or more modules to facilitate the interaction between the processing component 1502 and other components. For example, the processing component 1502 may include a multimedia module to facilitate the interaction between the multimedia component 1508 and the processing component 1502.

[0302] The memory 1504 is configured to store various types of data to support the operation of the device 1500. Examples of such data include instructions for any application or method operating on the device 1500, contact data, phone book data, messages, pictures, videos, etc. The memory 1504 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk.

[0303] The power supply component 1506 provides power for various components of the device 1500. The power supply component 1506 may include a power management system, one or more power supplies, and other components associated with generating, managing, and distributing power for the device 1500.

[0304] The multimedia component 1508 includes a screen that provides an output interface between the device 1500 and the user. In some embodiments, the screen may include a liquid crystal display (LCD) and a touch panel (TP). If the screen includes a touch panel, the screen can be implemented as a touch screen to receive input signals from the user. The touch panel includes one or more touch sensors to sense touches, swipes, and gestures on the touch panel. The touch sensors can not only sense the boundaries of touch or swipe actions, but also detect the duration and pressure associated with the touch or swipe operation. In some embodiments, the multimedia component 1508 includes a front camera and / or a rear camera. When the device 1500 is in an operating mode, such as a shooting mode or a video mode, the front camera and / or the rear camera can receive external multimedia data. Each of the front camera and the rear camera can be a fixed optical lens system or have a focal length and optical zoom capabilities.

[0305] The audio component 1510 is configured to output and / or input audio signals. For example, the audio component 1510 includes a microphone (MIC) that is configured to receive external audio signals when the device 1500 is in an operating mode, such as a call mode, a recording mode, and a voice recognition mode. The received audio signals can be further stored in the memory 1504 or transmitted via the communication component 1516. In some embodiments, the audio component 1510 further includes a speaker for outputting audio signals.

[0306] The I / O interface 1512 provides an interface between the processing component 1502 and a peripheral interface module, which can be a keyboard, a click wheel, buttons, etc. These buttons can include, but are not limited to: a home button, a volume button, a power-on button, and a lock button.

[0307] The sensor assembly 1514 includes one or more sensors for providing a status assessment of various aspects of the device 1500. For example, the sensor assembly 1514 can detect the on / off state of the device 1500, the relative positioning of components, such as the display and keypad of the device 1500. The sensor assembly 1514 can also detect a change in the position of the device 1500 or a component of the device 1500, the presence or absence of user contact with the device 1500, the orientation or acceleration / deceleration of the device 1500, and a change in the temperature of the device 1500. The sensor assembly 1514 can include a proximity sensor configured to detect the presence of nearby objects without any physical contact. The sensor assembly 1514 can also include a light sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, the sensor assembly 1514 can also include an acceleration sensor, a gyroscope sensor, a magnetic sensor, a pressure sensor, or a temperature sensor.

[0308] The communication component 1516 is configured to facilitate communication between the device 1500 and other devices in a wired or wireless manner. The device 1500 can access a wireless network based on communication standards, such as WiFi, 2G or 3G, 4G LTE, 5G NR, or a combination thereof. In an exemplary embodiment, the communication component 1516 receives a broadcast signal or broadcast-related information from an external broadcast management system via a broadcast channel. In an exemplary embodiment, the communication component 1516 further includes a near field communication (NFC) module to facilitate short-range communication. For example, the NFC module can be implemented based on radio frequency identification (RFID) technology, infrared data association (IrDA) technology, ultra-wideband (UWB) technology, Bluetooth (BT) technology, and other technologies.

[0309] In an exemplary embodiment, the device 1500 can be implemented by one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components for performing the above product defect information query method.

[0310] In an exemplary embodiment, a non-transitory computer-readable storage medium including instructions is also provided, such as a memory 1504 including instructions, and the above instructions can be executed by a processor 1520 of the device 1500 to complete the above product defect information query method. For example, the non-transitory computer-readable storage medium can be a ROM, a random access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, and an optical data storage device, etc.

[0311] Other embodiments of the present disclosure will be readily contemplated by those skilled in the art in view of the specification and practice of the disclosure herein. The present disclosure is intended to cover any variations, uses, or adaptations of the present disclosure that follow the general principles of the present disclosure and include known common knowledge or conventional technical means in the technical field not disclosed by the present disclosure. The specification and examples are only illustrative, and the true scope and spirit of the present disclosure are pointed out by the following claims.

[0312] It should be understood that the present disclosure is not limited to the exact structures described above and shown in the drawings, and various modifications and changes can be made without departing from its scope. The scope of the present disclosure is only limited by the appended claims.

[0313] It should be noted that, in this document, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. The term "comprising", "including" or any other variation thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "comprising a..." does not exclude the presence of additional identical elements in the process, method, article or device comprising the element.

[0314] The methods and devices provided by the embodiments of the present disclosure have been introduced in detail above. Specific examples are used herein to elaborate on the principles and implementation manners of the present disclosure. The description of the above embodiments is only used to help understand the method and its core idea of the present disclosure; at the same time, for those of ordinary skill in the art, according to the idea of the present disclosure, there will be changes in the specific implementation manners and application scopes. In summary, the content of this specification should not be construed as a limitation on the present disclosure.

Claims

1. A method for processing product defect information, characterized in that, The product includes multiple film layers, and the method includes: Obtaining the defective information in the current film layer and the defective information in the historical film layers, storing the defective information in the yield management system YMS, extracting the defective information from YMS to the data warehouse tool Hive, querying the defective information from Hive through the computing engine Spark and writing it into the Hbase database, where the historical film layers are formed before the current film layer; Determining the target position of the defective information in the current film layer, and judging whether there is defective information at the corresponding position of the target position in the historical film layer: If there is defective information at the target position in the historical film layer, deleting the defective information detected at the target position in the current film layer; If there is no defective information at the target position in the historical film layer, retaining the defective information detected at the target position in the current film layer; Storing the recorded defective information in the first data table; Aggregating the data in the first data table according to the process flow information in the manufacturing process to obtain a second data table, where the first data table and the second data table are data tables in the Hbase database; Querying data in the second data table according to the received query instruction; The judging whether there is defective information at the corresponding position of the target position in the historical film layer includes: determining whether there is defective information within a preset distance threshold range of the target position in the historical film layer; if there is defective information, determining that there is defective information at the corresponding position of the target position in the historical film layer; The determining whether there is defective information within a preset distance threshold range of the target position in the historical film layer includes: When there is a row-direction defect in the current film layer, determining whether there is defective information within a preset distance threshold range in the column direction of the target position in the historical film layer, and the target position is a row; if there is defective information, determining that there is defective information at the corresponding position of the target position in the historical film layer; When there is a column-direction defect in the current film layer, determining whether there is defective information within a preset distance threshold range in the row direction of the target position in the historical film layer, and the target position is a column; if there is defective information, determining that there is defective information at the corresponding position of the target position in the historical film layer.

2. The method according to claim 1, wherein Before obtaining the defective information in the current film layer and the defective information in the historical film layers, the method further includes: Determining the defective position of the defective information in the current film layer, and the cutting information of the display panel where the defective position is located; Determining the association relationship between the coordinates in the display panel and the coordinates in the glass substrate where the display panel is located before cutting according to the cutting history information; Determining the position of the defective position in the glass substrate according to the association relationship.

3. The method according to claim 1, wherein The method further includes: Statistically storing at least one of the following in the second data table: The ratio of the defective information deleted in the current film layer to all the defective information in the current film layer; The ratio of the defective information recorded in the current film layer to all the defective information in the current film layer; The ratio of the defective information recorded in the current film layer to the defective information in all film layers.

4. The method according to claim 1, characterized in that Before determining the target position of the defective information in the current film layer, the method further includes: Aggregating the detected defective information according to the display panel to which the detected defective information belongs.

5. The method according to claim 4, characterized in that, Before aggregating the detected defective information according to the display panel to which the detected defective information belongs, the method further includes: Reading the historical defective information recorded for the historical film layer; Loading the defective information detected in the current film layer into the historical defective information.

6. The method according to claim 1, characterized in that The primary key of the first data table is the identifier of the display panel; and / or, the primary key of the second data table includes at least one of the following: Factory, date, inspection site, equipment, product, defective type.

7. A method for querying product defective information, characterized in that, The product includes a plurality of film layers, and the method includes: Receiving a query instruction sent by a client; Querying the defective information in the plurality of film layers according to the query instruction; Generating front-end data according to the query result; Among them, the defective information in the plurality of film layers is determined based on the following method: obtaining the defective information in the current film layer and the defective information in the historical film layer, storing the defective information in the rate management system YMS, extracting the defective information from YMS to the data warehouse tool Hive, querying the defective information from Hive through the computing engine Spark and writing it into the Hbase database, and the historical film layer is formed before the current film layer; determining the target position of the defective information in the current film layer, and judging whether there is defective information at the corresponding position of the target position in the historical film layer; if there is defective information at the target position in the historical film layer, deleting the defective information detected at the target position in the current film layer; if there is no defective information at the target position in the historical film layer, retaining the defective information detected at the target position in the current film layer, and the defective information stored in the data table includes the recorded defective information; storing the recorded defective information in the first data table; aggregating the data in the first data table according to the process flow information in the manufacturing process to obtain a second data table, where the first data table and the second data table are data tables in the Hbase database; querying data in the second data table according to the received query instruction; When the distance between the defective position with defective information in the historical film layer and the target position is less than the distance threshold, it is determined whether there is defective information at the corresponding position of the target position in the historical film layer; when there is a row-direction defect in the current film layer, the first distance between the defective position with defective information in the historical film layer in the column direction and the row pixels corresponding to the row-direction defect is determined; when the distance is less than the first distance threshold, it is determined whether there is defective information at the corresponding position of the target position in the historical film layer; when there is a column-direction defect in the current film layer, the second distance between the defective position with defective information in the historical film layer in the row direction and the column pixels corresponding to the column-direction defect is determined; when the distance is less than the second distance threshold, it is determined that there is defective information at the corresponding position of the target position in the historical film layer.

8. The method according to claim 7, wherein The method for determining defective information in the multiple film layers further includes: Before obtaining the defective information in the current film layer and the defective information in the historical film layer, determine the defective position of the defective information in the current film layer and the cutting information of the display panel where the defective position is located; Determine the association relationship between the coordinates in the display panel and the coordinates in the glass substrate where the display panel was located before cutting according to the cutting historical information; Determine the position of the defective position in the glass substrate according to the association relationship.

9. The method according to claim 7, wherein Before receiving the query instruction sent by the client, the method further includes: Statistically store at least one of the following in the second data table: The ratio of the defective information deleted in the current film layer to all the defective information in the current film layer; The ratio of the defective information recorded in the current film layer to all the defective information in the current film layer; The ratio of the defective information recorded in the current film layer to the defective information in all the film layers.

10. The method according to claim 7, wherein Before determining the target position of the defective information in the current film layer, the method further includes: Aggregate the detected defective information according to the display panel to which the detected defective information belongs.

11. The method according to claim 10, wherein Before aggregating the detected defective information according to the display panel to which the detected defective information belongs, the method further includes: Read the historical defective information recorded for the historical film layer; Load the defective information detected in the current film layer into the historical defective information.

12. The method according to claim 7, wherein The primary key of the first data table is the identifier of the display panel; and / or The primary key of the second data table includes at least one of the following: Factory, date, detection site, equipment, product, defective type.

13. The method according to any one of claims 7 to 12, characterized in that Generating the front-end data according to the query result includes: Displaying the trend of defective information according to the query result; and / or Displaying the distribution of defective information according to the query result.

14. A product defective information query system, characterized in that, The product includes multiple film layers, and the system includes a data processing device, a display device, and a distributed storage device; The distributed storage device is used to store the defective information detected in the current film layer and the defective information in the historical film layers, store the defective information into the yield management system YMS, extract the defective information from YMS into the data warehouse tool Hive, and query the defective information from Hive through the computing engine Spark and write it into the Hbase database, where the historical film layers are formed before the current film layer; The data processing device is used to obtain the defective information detected in the current film layer from the distributed storage device, determine the target position of the defective information in the current film layer, and judge whether there is defective information at the corresponding position of the target position in the historical film layer. When there is defective information at the target position in the historical film layer, delete the defective information detected at the target position in the current film layer. When there is no defective information at the target position in the historical film layer, retain the defective information detected at the target position in the current film layer and store the retained defective information into the distributed storage device; The judgment of whether there is defective information at the corresponding position of the target position in the historical film layer includes: determining whether there is defective information within a preset distance threshold range of the target position in the historical film layer; if there is defective information, it is determined that there is defective information at the corresponding position of the target position in the historical film layer; The determination of whether there is defective information within a preset distance threshold range of the target position in the historical film layer includes: When there is a row-direction defect in the current film layer, determine whether there is defective information within a preset distance threshold range in the column direction of the target position in the historical film layer; if there is defective information, it is determined that there is defective information at the corresponding position of the target position in the historical film layer; When there is a column-direction defect in the current film layer, determine whether there is defective information within a preset distance threshold range in the row direction of the target position in the historical film layer; if there is defective information, it is determined that there is defective information at the corresponding position of the target position in the historical film layer; The display device is used to query the defective information in the distributed storage device according to the received query instruction and generate front-end data; The data processing device is also used to store the recorded defective information into the first data table; aggregate the data in the first data table according to the process flow information in the manufacturing process to obtain the second data table; the display device is used to query the defective information in the second data table according to the query instruction.

15. A product defective information processing device, characterized in that, The product includes multiple film layers, and the device includes: A defective information acquisition module, which is used to acquire the defective information in the current film layer and the defective information in the historical film layers, store the defective information into the yield management system YMS, extract the defective information from YMS into the data warehouse tool Hive, and query the defective information from Hive through the computing engine Spark and write it into the Hbase database, where the historical film layers are formed before the current film layer; A defect determination module, configured to determine the target position of the defect information in the current film layer and determine whether there is defect information at the corresponding position of the target position in the historical film layer; An information deletion module, configured to delete the defect information detected at the target position in the current film layer when there is defect information at the target position in the historical film layer; An information recording module, configured to retain the defect information detected at the target position in the current film layer when there is no defect information at the target position in the historical film layer; store the recorded defect information in a first data table; aggregate the data in the first data table according to the process flow information in the manufacturing process to obtain a second data table, where the first data table and the second data table are data tables in an Hbase database; query data in the second data table according to the received query instruction; The determination of whether there is defect information at the corresponding position of the target position in the historical film layer includes: determining whether there is defect information within a preset distance threshold range of the target position in the historical film layer; if there is defect information, determining that there is defect information at the corresponding position of the target position in the historical film layer; The determination of whether there is defect information within a preset distance threshold range of the target position in the historical film layer includes: When there is a row-direction defect in the current film layer, determining whether there is defect information within a preset distance threshold range in the column direction of the target position in the historical film layer; if there is defect information, determining that there is defect information at the corresponding position of the target position in the historical film layer; When there is a column-direction defect in the current film layer, determining whether there is defect information within a preset distance threshold range in the row direction of the target position in the historical film layer; if there is defect information, determining that there is defect information at the corresponding position of the target position in the historical film layer.

16. A device for querying product defective information, characterized in that, The product includes multiple film layers, and the device includes: An instruction receiving module, configured to receive a query instruction sent by a client; An information query module, configured to query the defect information in the multiple film layers according to the query instruction; A front-end generation module, configured to generate front-end data according to the query result Among them, the defective information in the multiple film layers is determined in the following manner. Obtain the defective information in the current film layer and the defective information in the historical film layer. Store the defective information in the yield management system YMS. Extract the defective information from YMS into the data warehouse tool Hive. Query the defective information from Hive through the computing engine Spark and write it into the Hbase database. The historical film layer is formed before the current film layer. Determine the target position of the defective information in the current film layer, and judge whether there is defective information at the corresponding position of the target position in the historical film layer. If there is defective information at the target position in the historical film layer, delete the defective information detected at the target position in the current film layer. If there is no defective information at the target position in the historical film layer, retain the defective information detected at the target position in the current film layer. The defective information stored in the data table includes the recorded defective information. Store the recorded defective information in the first data table. Aggregate the data in the first data table according to the process flow information in the manufacturing process to obtain a second data table. Among them, the first data table and the second data table are data tables in the Hbase database. Query the data in the second data table according to the received query instruction. When the distance between the defective position with defective information in the historical film layer and the target position is less than the distance threshold, judge whether there is defective information at the corresponding position of the target position in the historical film layer. When there is a row-direction defect in the current film layer, determine the first distance in the column direction between the defective position with defective information in the historical film layer and the row pixels corresponding to the row-direction defect. When the distance is less than the first distance threshold, judge whether there is defective information at the corresponding position of the target position in the historical film layer. When there is a column-direction defect in the current film layer, determine the second distance in the row direction between the defective position with defective information in the historical film layer and the column pixels corresponding to the column-direction defect. When the distance is less than the second distance threshold, determine that there is defective information at the corresponding position of the target position in the historical film layer.

17. A detection device, characterized in that, Including: A processor; A memory for storing processor-executable instructions; Among them, the processor is configured to implement the product defective information processing method described in any one of claims 1 to 6.

18. An electronic device, characterized in that, Including: A processor; A memory for storing processor-executable instructions; Among them, the processor is configured to implement the product defective information query method described in any one of claims 7 to 13.

19. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the program is executed by the processor, it implements the steps in the product defective information processing method described in any one of claims 1 to 6.

20. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the program is executed by the processor, it implements the steps in the product defective information query method described in any one of claims 7 to 13.

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