Multi-pin IGBT testing mechanism

Abstract

The application relates to a multi-PIN IGBT testing mechanism, which comprises a workbench, the top of the workbench is provided with a conveying device for conveying a clamp loaded with an IGBT, two workstations are arranged on one side of the top of the workbench, the two workstations are the same in structure, and one of the two workstations is taken as an example: a clamping testing assembly for being docked with the clamp and a carrying assembly for pulling the clamp are arranged on one side of the top of the workbench through a support frame, a sliding transition piece is further arranged between the clamping testing assembly and the conveying device through the support frame, and the sliding transition piece is used for supporting and guiding the clamp during movement. After the clamp loaded with the IGBT on the conveying device is conveyed to a position to be docked, the carrying assembly is started to pull the clamp loaded with the IGBT, so that the clamp loaded with the IGBT passes through the sliding transition piece and the clamping testing assembly to complete testing. The application has the characteristics of double-workstation alternation, accurate testing and high testing efficiency.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of IGBT testing, and in particular to a multi-PIN IGBT testing mechanism. BACKGROUND

[0002] IGBT is a core device of energy conversion and transmission, commonly known as the "CPU" of power electronics devices. In modern society, IGBT is widely used in electric control systems and vehicle-mounted air conditioning control systems of new energy vehicles, and is also widely used in power generation, power transmission, power transformation and power consumption of smart grids. After manufacturing, in order to ensure that the manufactured IGBT is qualified, the IGBT is usually connected to a test piece and connected to a test instrument for testing to ensure that the functions of the IGBT to be realized are not problematic. The inventor found that when the IGBT is connected to the test piece, due to the large number of interfaces on the IGBT that need to be tested, the connection may not be accurate, which increases the time required for connection and reduces the testing efficiency. SUMMARY

[0003] In order to improve the testing efficiency, the present application provides a multi-PIN IGBT testing mechanism.

[0004] The multi-PIN IGBT testing mechanism provided by the present application adopts the following technical scheme:

[0005] A multi-PIN IGBT testing mechanism, comprising a workbench, further comprising a conveying device arranged on the workbench for conveying a clamp loaded with an IGBT, a clamping test assembly for connecting the clamp loaded with the IGBT is arranged on one side of the conveying device on the workbench, and a handling assembly for pulling the clamp loaded with the IGBT on the conveying device to connect with the clamping test assembly is further arranged on the workbench.

[0006] By adopting the above technical scheme, the conveying device can improve the continuity of the connection, the handling assembly can pull the clamp loaded with the IGBT from the conveying device to connect to the clamping test assembly, and the clamping test assembly can connect multiple PINs at a time and then test them.

[0007] Preferably, the handling assembly comprises a support, the support is installed on the top of the workbench, a first driving device is installed on the support, the output end of the first driving device can move horizontally and reciprocally, a connecting base is installed on the output end of the first driving device, a second driving device is arranged on the connecting base, and the output end of the second driving device can move vertically and reciprocally.

[0008] By adopting the technical scheme, the first driving device and the second driving device combination can realize automatic reciprocating movement in the horizontal direction and the vertical direction, and can drive the clamp with the IGBT on the conveying device to the clamping test assembly, and complete automation of the carrying assembly can improve the docking efficiency.

[0009] Preferably, the output end of the second driving device is provided with a matching block, and the connecting base is further provided with a connecting block, and the connecting block is located on the movement path of the matching block; and a notch is formed in the connecting block to allow the matching block to slide.

[0010] By adopting the technical scheme, the notch can guide the output end of the second driving device, and the clamp with the IGBT is provided with a groove, which can preliminarily ensure that the output end of the second driving device is inserted into the groove.

[0011] Preferably, the first driving device is an electric cylinder, a through hole is formed in the support, the output shaft of the electric cylinder passes through the through hole and is connected with the connecting base, and a linear bearing is installed between the output shaft of the electric cylinder and the through hole.

[0012] By adopting the technical scheme, the stroke amount of the output shaft of the electric cylinder can be relatively accurate, and the connecting base can be driven to move by an accurate stroke amount.

[0013] Preferably, the movement stroke of the matching block does not deviate from the notch, and the matching block is matched with the notch.

[0014] By adopting the technical scheme, the size of the matching block is matched with the size of the notch, and the movement of the matching block in the notch can further ensure that the output end of the second driving device is accurately inserted into the groove.

[0015] Preferably, a sliding rail is arranged on the connecting block, the arrangement direction of the sliding rail is consistent with the movement direction of the output end of the first driving device, and a sliding block is arranged on the support to slide with the sliding rail.

[0016] By adopting the technical scheme, when the first driving device is working, the movement of the sliding block on the sliding rail can guide the reciprocating movement of the output end of the first driving device, so as to improve the movement accuracy.

[0017] Preferably, the clamping test assembly comprises a connecting piece arranged on the workbench, and a clamping pin for fixing the clamp with the IGBT is arranged on the connecting piece.

[0018] By adopting the technical scheme, the clamp with the IGBT can be fixed on the clamping test assembly to complete the test, and the stability of the clamp with the IGBT during the test can be ensured.

[0019] Preferably, the workbench top is provided with a fixed plate, the fixed plate is provided with a fixed column near one end of the conveying device, the fixed column comprises a sliding column and a clamping column, one end of the sliding column is installed on the fixed plate, the other end of the sliding column is connected with the clamping column, a floating plate is sleeved on the sliding column, an abutting ring for abutting against the floating plate is sleeved on the clamping column, and a telescopic spring is further sleeved on the sliding column between the connecting piece and the floating plate.

[0020] By adopting the above technical scheme, the floating plate can eliminate the docking error between the docking piece on the clamp provided with an IGBT and the docking piece on the clamping test assembly, and ensure smooth docking.

[0021] Preferably, the end of the clamping column away from the sliding column is provided with a tapered head.

[0022] By adopting the above technical scheme, the tapered head can ensure that the docking between the clamp provided with an IGBT and the fixed column can be completed without being affected by the misalignment between the fixed column and the clamp provided with an IGBT.

[0023] Preferably, a sliding transition piece is arranged between the clamping test assembly and the conveying device, the sliding transition piece is provided with a protrusion, and the sliding transition piece is used for supporting and guiding the clamp provided with an IGBT during movement.

[0024] By adopting the above technical scheme, the clamp provided with an IGBT can be supported and guided during movement, and the stability of the clamp provided with an IGBT during movement is ensured.

[0025] In summary, the present application has at least one of the following beneficial technical effects:

[0026] 1. The conveying device can improve the continuity of docking, the carrying assembly can pull the clamp provided with an IGBT from the conveying device and dock it on the clamping test assembly, and the clamping test assembly can dock and test multiple PIN pins at one time;

[0027] 2. The sliding of the sliding block on the sliding rail can ensure the movement accuracy of the reciprocating movement of the output end of the first driving device, and the floating plate can eliminate the docking error between the docking piece on the clamp provided with an IGBT and the docking piece on the clamping test assembly, and ensure smooth docking. BRIEF DESCRIPTION OF DRAWINGS

[0028] Figure 1 is a schematic view of the overall structure of the clamp provided with an IGBT;

[0029] Figure 2 is a schematic view of the overall structure of a multiple-PIN IGBT test mechanism in the embodiment of the present application;

[0030] Figure 3is a structural schematic diagram for embodying a carrying assembly;

[0031] Figure 4 is Figure 3 is an enlarged view of part A in the middle;

[0032] Figure 5 is a structural schematic diagram for embodying a clamping test assembly;

[0033] Figure 6 is a structural schematic diagram for embodying one of the two identical structures on the fixed plate 47.

[0034] Marked in the drawing: 1, workbench; 11, belt conveying mechanism; 111, jacking opening; 12, supporting leg; 13, linear jacking mechanism; 2, clamp; 21, recess; 22, PIN leg; 221, connecting PIN leg; 23, sliding groove; 24, clamping hole; 25, floating hole; 3, clamping test assembly; 31, connecting piece; 32, fixed column; 321, sliding column; 3211, abutting ring; 3212, telescopic spring; 3213, floating plate; 322, clamping column; 3221, conical head; 33, clamping pin; 4, carrying assembly; 41, support; 411, through hole; 412, sliding block; 413, horizontal rack plate; 414, vertical rack plate; 415, bottom rack plate; 42, electric cylinder; 43, connecting base; 431, connecting block; 4311, notch; 4312, sliding rail; 44, linear bearing; 45, air cylinder; 46, matching block; 47, fixed plate; 5, sliding transition piece; 51, protruding block. DETAILED DESCRIPTION

[0035] The application will be further described in detail below in combination with the drawings.

[0036] With reference to Figure 1 , the application is based on a clamp 2 for loading IGBT to realize the test of IGBT, the clamp 2 is provided with multiple PIN legs 22, floating holes 25 and clamping holes 24 on one end face, the clamp 2 is provided with sliding grooves 23 on both end sidewalls, and the clamp 2 is further provided with a recess 21. After the IGBT is loaded on the clamp 2, the PIN legs on the IGBT will be in contact with the corresponding copper blocks on the clamp 2, and then be connected to the corresponding PIN legs 22 on the end face of the clamp 2 through the copper blocks.

[0037] The application discloses a multiple-PIN-leg IGBT test mechanism.

[0038] With reference to Figure 1 and Figure 2The utility model provides a kind of multi-PIN IGBT test mechanism, including workbench 1, workbench 1 top is equipped with for conveying clamp 2 conveying device, conveying device is belt conveying mechanism 11;Two stations are equipped with in workbench 1 top in the side of belt conveying mechanism 11, the structure is same on two stations, with an example of one of the stations: workbench 1 top is equipped with in the side of belt conveying mechanism 11 by support leg 12 for the clamping test assembly 3 for being docked with clamp 2 and for moving clamp 2 from belt conveying mechanism 11 to the handling assembly 4 side of clamping test assembly 3, clamping test assembly 3 is also equipped with sliding transition piece 5 between belt conveying mechanism 11, sliding transition piece 5 is equipped with protruding block 51 matched with recess 21, sliding transition piece 5 is used to carry and guide clamp 2 in movement.

[0039] Refer to Figure 2 Workbench 1 bottom is equipped with linear lifting mechanism 13 below the belt of belt conveying mechanism 11, the model of linear lifting mechanism 13 is TPA65S-P10-L200-M-P100W, and the belt of belt conveying mechanism 11 is opened lifting port 111 for the output end of linear lifting mechanism 13 to pass through.

[0040] Firstly, clamp 2 is placed on belt conveying mechanism 11, then when clamp 2 reaches the handling position of handling assembly 4 under the driving of belt conveying mechanism 11, linear lifting mechanism 13 is started to lift clamp 2, at this time, handling assembly 4 is started to drive clamp 2 to move, and clamp 2 reaches sliding transition piece 5 first in the moving process, and then clamp 2 is docked with clamping test assembly 3 under the support and guiding effect of sliding transition piece 5.

[0041] Refer to Figure 3 Handling assembly 4 includes support 41, and support 41 is erected on the top of workbench 1 by four support legs 12, and support 41 includes two vertical frame plates 414, a horizontal frame plate 413 mounted between the two vertical frame plates 414 and a bottom frame plate 415 mounted at the bottom of the two vertical frame plates, the horizontal frame plate 413 is provided with a first driving device, and the first driving device is an electric cylinder 42; Figure 4 A through hole 411 is formed in the horizontal frame plate 413 of support 41, and the output shaft of electric cylinder 42 is connected with a connecting base 43 penetrating through the through hole 411, and a linear bearing 44 for improving the stability of the output shaft of electric cylinder 42 is mounted between the through hole 411 and the output shaft of electric cylinder 42.

[0042] Refer to Figure 3 Both ends of connecting base 43 are provided with the same structure, for example, the structure of one end of connecting base 43: in combination with Figure 4The one end of the connecting base 43 is provided with a second driving device, which is a pneumatic cylinder 45, and the output end of the pneumatic cylinder 45 is connected with a matching block 46; the connecting base 43 is provided with a connecting block 431, which is located on the moving path of the matching block 46, and the connecting block 431 is provided with a gap 4311 for the matching block 46 to slide, the movement of the matching block 46 does not deviate from the gap 4311, and the shape of the matching block 46 is matched with the shape of the gap 4311; the vertical frame plate 414 is fixedly provided with a sliding block 412, and the one end of the connecting block 431 close to the sliding block 412 is fixedly provided with a sliding rail 4312, which is clamped on the sliding block 412, and the sliding block 412 cooperates with the sliding rail 4312 to guide the movement of the connecting base 43.

[0043] With reference to Figure 2 and Figure 3 , when the to-be-clamped fixture 2 moves to the to-be-carried position on the conveying device, the electric cylinder 42 drives the connecting base 43 to move transversely, and drives the pneumatic cylinder 45 to reach the specified working position, at this time, the electric cylinder 42 stops the pneumatic cylinder 45 to start, and the output end of the pneumatic cylinder 45 moves vertically to drive the matching block 46 to slide in the gap 4311, combined with Figure 1 , then the matching block 46 will move downward and be inserted into the groove 21 on the fixture 2, at this time, the pneumatic cylinder 45 stops the electric cylinder 42 to start, so that the output shaft of the electric cylinder 42 resets to drive the fixture 2 to move and the butt-joint end of the fixture 2 is butted with the butt-joint end on the clamping and testing assembly 3.

[0044] With reference to Figure 5 , the clamping and testing assembly 3 comprises a fixed plate 47, which is installed on the upper end face of the bottom frame plate 415, combined with Figure 2 , the one end of the fixed plate 47 close to the belt conveying mechanism 11 is connected with a connecting piece 31, the connecting piece 31 is provided with a plurality of connecting PIN feet 221 for butt-joint with a plurality of PIN feet 22 on the fixture 2, and the plurality of PIN feet 22 and the plurality of connecting PIN feet 221 are one-to-one corresponding.

[0045] With reference to Figure 6The two sides of the plate surface of the fixed plate 4 are provided with two same structures, and one of the structures is taken as an example: two fixed columns 32 are vertically arranged on the fixed plate 47, each fixed column 32 includes a sliding column 321 and a clamping column 322, one end of the sliding column 321 is fixedly installed on the fixed plate 47, the other end of the sliding column 321 is fixedly connected with one end of the clamping column 322, and the other end of the clamping column 322 is provided with a tapered head 3221. A floating plate 3213 is sleeved on the sliding column 321, a telescopic spring 3212 is sleeved on the sliding column 321 between the floating plate 3213 and the connecting piece 31, one end of the telescopic spring 3212 is fixed on the fixed plate 47, the other end of the telescopic spring 3212 is fixed on the floating plate 3213, a abutting ring 3211 is sleeved on the clamping column 322, and a gap for micro-motion of the floating plate 3213 is arranged at the connection position of the floating plate 3213 and the sliding column 321. The connecting piece 31 is provided with a clamping pin 33 at the same end of the connecting PIN 221, and the clamping pin 33 is inserted into the clamping hole 24 to fix the clamp 2 after the clamp 2 is connected with the clamping test assembly 3. Figure 1 The clamping pin 33 is inserted into the clamping hole 24 to fix the clamp 2 after the clamp 2 is connected with the clamping test assembly 3.

[0046] The implementation principle of the multi-PIN IGBT test mechanism in the embodiment of the present application is as follows: after the clamp 2 is placed on the belt conveying mechanism 11, the belt conveying mechanism 11 conveys the clamp 2 to a position to be carried by the carrying assembly 4, the clamp 2 is pushed out by the linear lifting mechanism 13 after reaching the carrying position, the electric cylinder 42 is started to drive the output shaft to move the connecting base 43 transversely to the working position of the air cylinder 45, the working position is that the projection position of the cooperating block 46 and the groove 21 in the vertical plane coincides, the air cylinder 45 is started to drive the output end to drive the cooperating block 46 to slide downward in the notch 4311 until the one end of the cooperating block 46 close to the groove 21 is inserted into the groove 21, and the air cylinder 45 stops working, then the electric cylinder 42 is started again to drive the connecting base 43 to reset and drive the clamp 2 to connect with the clamping test assembly 3, that is, a plurality of PINs 22 on the clamp 2 are connected with a plurality of connecting PINs 221 on the clamping test assembly 3, after the connection is completed, the clamping pin 33 and the clamping column 322 can maintain the clamp 2 beside the clamping test assembly 3, after the test is completed, the electric cylinder 42 is started again to drive the connecting base 43 to move and drive the clamp 2 clamped by the cooperating block 46 to move to the belt conveying mechanism 11, then the belt conveying mechanism 11 is started to take away the clamp 2, and the test is completed.

[0047] The embodiments of the specific embodiment are the preferred embodiments of the present application, and do not limit the protection scope of the present application, so that: any equivalent changes made according to the structure, shape, principle of the present application should be covered within the protection scope of the present application.

Claims

1. A multi-pin IGBT testing mechanism, comprising a workbench (1), characterized in that: It also includes a conveying device provided on the workbench (1) for conveying the clamp (2) containing IGBTs. The workbench (1) is provided on one side of the conveying device for docking with the clamp (2) containing IGBTs. The workbench (1) is also provided with a transporting component (4) for pulling the clamp (2) containing IGBTs on the conveying device to dock with the clamp (3). The conveying assembly (4) includes a bracket (41) which is mounted on the top of the workbench (1). A first driving device is mounted on the bracket (41), and the output end of the first driving device is capable of reciprocating laterally. A connecting base (43) is mounted on the output end of the first driving device, and a second driving device is provided on the connecting base (43), and the output end of the second driving device is capable of reciprocating vertically. The output end of the second drive device is provided with a mating block (46), and the connecting base (43) is also provided with a connecting block (431). The connecting block (431) is located on the moving path of the mating block (46). The connecting block (431) has a notch (4311) that allows the mating block (46) to slide. The snap-fit ​​test assembly (3) includes a connector (31) mounted on the workbench (1), and the connector (31) is equipped with a locking pin (33) for fixing the clamp (2) containing the IGBT; A sliding transition piece (5) is provided between the snap-fit ​​test assembly (3) and the transmission device. The sliding transition piece (5) is provided with a protrusion (51). The sliding transition piece (5) is used to support and guide the clamp (2) containing IGBTs during movement. The end face of the fixture (2) is provided with multiple pins (22), floating holes (25) and locking holes (24), and the fixture (2) is also provided with sliding grooves (23) and recesses (21); When the fixture (2) moves to the position to be transported on the conveying device, the first drive device starts and drives the connecting base (43) to move laterally, and at the same time drives the cylinder (45) to reach the designated working position. The first drive device stops, the second drive device starts, and the output end of the second drive device moves vertically and drives the mating block (46) to slide in the notch (4311). The mating block (46) moves downward and inserts into the groove (21) on the fixture (2). At this time, the second drive device stops, the first drive device starts, and the first drive device resets, thereby driving the fixture (2) to move. The mating end of the fixture (2) mates with the mating end on the snap-fit ​​test assembly (3).

2. The multi-pin IGBT testing mechanism according to claim 1, characterized in that: The first driving device is an electric cylinder (42). A through hole (411) is opened on the bracket (41). The output shaft of the electric cylinder (42) passes through the through hole (411) and is connected to the connecting base (43). A linear bearing (44) is installed between the output shaft of the electric cylinder (42) and the through hole (411).

3. The multi-pin IGBT testing mechanism according to claim 1, characterized in that: The movement of the mating block (46) does not disengage from the notch (4311), and the mating block (46) is adapted to the notch (4311).

4. The multi-pin IGBT testing mechanism according to claim 1, characterized in that: The connecting block (431) is provided with a slide rail (4312), the setting direction of the slide rail (4312) is consistent with the movement direction of the output end of the first driving device, and the bracket (41) is provided with a slider (412) that slides in conjunction with the slide rail (4312).

5. The multi-pin IGBT testing mechanism according to claim 1, characterized in that: The workbench (1) is supported by a fixed plate (47) on top. The fixed plate (47) is provided with a fixed post (32) near the end of the conveying device. The fixed post (32) includes a sliding post (321) and a snap-fit ​​post (322). One end of the sliding post (321) is installed on the fixed plate (47), and the other end of the sliding post (321) is connected to the snap-fit ​​post (322). A floating plate (3213) is sleeved on the sliding post (321). An abutment ring (3211) for abutting the floating plate (3213) is sleeved on the snap-fit ​​post (322). A telescopic spring (3212) is also sleeved on the sliding post (321) between the connector (31) and the floating plate (3213).

6. The multi-pin IGBT testing mechanism according to claim 5, characterized in that: The end of the snap-fit ​​post (322) away from the sliding post (321) is provided as a tapered head (3221).

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