Aging test apparatus and method for circuit boards

Abstract

This invention discloses an aging test apparatus and method for circuit boards. The aging test apparatus includes a controller, an aging processing module, a parameter monitoring module, and a heat dissipation module, all communicatively connected to the controller. The aging processing module is electrically connected to the circuit board. The aging processing module provides signal excitation to the circuit board according to set power parameters configured by the controller. The parameter monitoring module acquires the actual operating parameters of the circuit board, including its actual operating temperature, and sends these parameters to the controller. The controller controls the operating state of the aging processing module and / or the heat dissipation module when the actual operating temperature exceeds a set temperature range, until the actual operating temperature of the circuit board is adjusted back to the set temperature range. This invention provides signal excitation and a testing environment for the circuit board, enabling live aging tests and achieving accurate aging testing of the circuit board by obtaining diverse parameter data.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of aging test, and particularly to an aging test device and method for a circuit board card. BACKGROUND

[0002] Distributed Control System (DCS) is widely used in high-end industrial control field, and the circuit board card in the DCS system plays a key role in connecting the DCS controller and the field electrical equipment. The circuit board card test of the power station DCS system has high reliability and high test coverage requirements, and the normal and stable work of the circuit board card directly affects the work stability of the whole instrument control system.

[0003] The aging test can apply environmental stress to the product through high temperature or other methods, and can find potential defects that cannot be found by conventional monitoring methods. Therefore, the market needs an aging test device for a circuit board card.

[0004] On the other hand, in the existing aging test device, the tested product is only placed in high temperature or other environmental stress, and the working state in the test environment is not tested, the test result is single, and the defects of the tested product in the complex working environment cannot be completely exposed. SUMMARY

[0005] The technical problem to be solved by the present application is to overcome the defects that the circuit board card lacks an aging test device in the prior art, and the existing aging test device has a single function, and provide an aging test device and method for a circuit board card.

[0006] The present application solves the above technical problems by the following technical solutions:

[0007] The first aspect provides an aging test device for a circuit board card, the aging test device comprising a controller, an aging treatment module, a parameter monitoring module and a heat dissipation module which are respectively in communication connection with the controller, and the aging treatment module is electrically connected with the circuit board card.

[0008] The aging treatment module is configured to provide signal excitation for the circuit board card according to the set power parameters of the controller.

[0009] The parameter monitoring module is configured to obtain the actual working parameters of the circuit board card, and the actual working parameters include the actual working temperature of the circuit board card and are sent to the controller.

[0010] The controller is configured to control the working state of the aging treatment module and / or the heat dissipation module when the actual working temperature exceeds the set temperature range, until the actual working temperature of the circuit board card is adjusted to be within the set temperature range.

[0011] Preferably, the controller is further configured to input the actual working temperature parameter into a preset filter fitting model in a time sequence, and output an actual working temperature parameter filtered from interference, and determine whether the actual working temperature of the circuit board card exceeds a set temperature range based on the actual working temperature parameter filtered from interference.

[0012] Preferably, the aging test device further comprises a noise filter module, which is in communication connection with the controller.

[0013] The noise filter module is configured to collect an environmental noise signal of the circuit board card and send the environmental noise signal to the controller.

[0014] The controller is further configured to input the environmental noise signal into a preset environmental noise fitting model, and determine whether the aging test device is running normally based on an abnormal environmental noise signal filtered from the preset environmental noise fitting model.

[0015] The noise filter module is configured to collect an environmental noise signal of the circuit board card and send the environmental noise signal to the controller.

[0016] The controller is further configured to input the environmental noise signal into a preset environmental noise fitting model, and determine whether the environmental noise signal is abnormal based on an output result of the preset environmental noise fitting model.

[0017] When the environmental noise signal is abnormal, it is determined that the circuit board card is overheated, and an adjustment instruction is generated to increase the output power of the heat dissipation module.

[0018] Preferably, the preset environmental noise fitting model is constructed by an adaptive filter algorithm.

[0019] Preferably, the controller is further configured to control the aging processing module to stop providing signal excitation to the circuit board when an abnormal duration of the environmental noise signal exceeds a preset noise abnormal duration.

[0020] Preferably, the controller is further configured to control the aging processing module to configure the circuit board card to work at a first rated power, and control the output power of the heat dissipation module to be increased when the actual working temperature of the circuit board card exceeds a temperature threshold.

[0021] The controller is further configured to reduce the power configuration provided by the aging processing module to the circuit board card to reduce signal excitation when the actual working temperature of the circuit board card obtained by the parameter monitoring module within a set time still exceeds the set temperature range when the output power of the heat dissipation module reaches a second rated power.

[0022] Preferably, the controller is further configured to control the burn-in processing module to stop providing the signal excitation to the circuit board card if the actual working temperature of the circuit board card is still higher than the temperature threshold within a second preset time period after the power provided by the burn-in processing module to the circuit board card is configured to reduce the signal excitation.

[0023] Preferably, the burn-in testing device further comprises a display module connected with the controller.

[0024] The controller is further configured to generate abnormality reminding information of the circuit board card and control the display module to display the abnormality reminding information if the actual working temperature of the circuit board card is higher than the temperature threshold and / or the environmental noise signal is abnormal.

[0025] The display module is further configured to display the actual working parameters of the circuit board card and / or the environmental noise signal.

[0026] Preferably, the burn-in testing device further comprises a data storage module connected with the controller.

[0027] The data storage module is configured to store the working parameters of the circuit board card and / or the abnormality data of the working state of the circuit board card.

[0028] The second aspect provides a burn-in testing method of a circuit board card, which is implemented by using the burn-in testing device of the circuit board card.

[0029] The signal excitation of the circuit board card is provided according to the set power parameters configured by the controller.

[0030] The actual working parameters of the circuit board card are acquired, the actual working parameters comprising the actual working temperature of the circuit board card and being sent to the controller.

[0031] The working state of the burn-in processing module and / or the heat dissipation module is controlled if the actual working temperature is higher than the set temperature range, until the actual working temperature of the circuit board card is adjusted to the set temperature range.

[0032] The positive progress effect of the application is that: by using the principle of self-heating under the working of the circuit board card, the circuit board card aging automatic test device is designed and developed, the signal excitation and test environment are provided for the board card, the adaptive filtering algorithm and the classic control algorithm are adopted to control and adjust the working temperature of the circuit board card, the live aging test of the circuit board card under the specified time length is realized, the aging temperature of the circuit board card can be controlled in the target temperature ±2℃ precision range or even higher precision. And through obtaining diversified parameter data, the precise test of the circuit board card aging is realized, the purpose of exposing the defects of the trial product and evaluating the reliability index of the product is achieved for the live aging test of multiple sets of circuit board cards under the specified time length, and the aging test efficiency, timeliness and effectiveness and reliability of the test result of the circuit board card are greatly improved.

[0033] The method has good detection ability for the mutation fault of the control system, does not need the statistical characteristics of the system noise, and has good real-time performance BRIEF DESCRIPTION OF DRAWINGS

[0034] Figure 1 It is a first module schematic diagram of the aging test device of the circuit board card of the embodiment 1 of the application;

[0035] Figure 2 It is a second module schematic diagram of the aging test device of the circuit board card of the embodiment 1 of the application;

[0036] Figure 3 It is a heat dissipation module schematic diagram of the aging test device of the circuit board card of the embodiment 1 of the application;

[0037] Figure 4 It is an identification principle diagram of the adaptive digital filtering system of the aging test device of the circuit board card of the embodiment 1 of the application;

[0038] Figure 5 It is a flow chart of the aging test method of the circuit board card of the embodiment 2 of the application;

[0039] Figure 6 It is a working time sequence flow chart of the aging test method of the circuit board card of the embodiment 2 of the application;

[0040] Figure 7 It is a temperature regulation flow chart of the aging test method of the circuit board card of the embodiment 2 of the application. DETAILED DESCRIPTION

[0041] The application will be further described by the embodiments, but the application is not limited in the scope of the embodiments.

[0042] Embodiment 1

[0043] The embodiment provides an aging test device 200 of a circuit board card, the aging test device 200 includes a controller 204, an aging treatment module 201 module, a parameter monitoring module 202 and a heat dissipation module 203 which are connected with the controller 204 in communication respectively, the aging treatment module 201 module is electrically connected with the circuit board card;

[0044] The aging treatment module 201 module is used for providing signal excitation of the circuit board card according to set power parameters configured by the controller 204;

[0045] The parameter monitoring module 202 is used for obtaining actual working parameters of the circuit board card, and the actual working parameters include actual working temperature of the circuit board card and are sent to the controller 204;

[0046] The controller 204 is used for controlling working states of the aging treatment module 201 module and / or the heat dissipation module 203 when the actual working temperature exceeds a set temperature range, until the actual working temperature of the circuit board card is adjusted to the set temperature range.

[0047] Specifically, the aging test device 200 of the circuit board card adopts a cabinet rack type fixing structure, is combined by three unit cabinets, and the cabinet bears clamps and all instruments and meters needed in the component aging process. The size of the equipment is distributed according to the function of the system, and the cabinet includes but is not limited to four regions in structure: an electrical aging unit region, a power meter region, a man-machine interaction region and a multifunctional region.

[0048] The electrical aging unit region is the core unit of the system, includes the aging treatment module 201 module, the circuit board card measured product and the heat dissipation module 203, wherein the heat dissipation module 203 adopts a temperature sensor and a heat dissipation fan, and the main function of the unit region is to provide working excitation conditions for the circuit board card product, to collect actual working temperature of the circuit board card and to control the heat dissipation fan to work, so that the aging temperature of the circuit board card is controlled in the range of 70 DEG C ± 2 DEG C.

[0049] In one embodiment, as Figure 2As shown, two circuit board cards are arranged in the aging test device 200, each of which is independently arranged in a card clamp, and a heat dissipation base is arranged under the card clamp. A temperature acquisition module for acquiring the working temperature of the circuit board card is arranged at the heat dissipation base, and a fan is arranged at the heat dissipation base, which is controlled through the heat dissipation module. Correspondingly, a plurality of current and voltage sensors can be arranged on the circuit board card as a parameter monitoring module according to actual needs to acquire the working temperature, current, voltage and power of the circuit board card. The working parameters can be collected in time sequence through a time sequence control system, and the collected working parameters are transmitted to a controller. The controller can be a core control board, a direct current power supply is provided for each module, and a power distributor is used as an aging treatment module to provide signal excitation for the circuit board card according to the instruction of the controller.

[0050] In one embodiment, as shown in Figure 3 The temperature sensor for collecting the circuit board card can use a temperature acquisition sensor PT100, which has good uniform temperature-resistance conversion characteristics. Optionally, a three-wire PT100 temperature sensor is used, the analog of the PT100 temperature sensor is converted into a digital signal through a MAX31865 chip, and the digital signal is transmitted to an ARM (Advanced RISC Machines) controller through an STM32SPI (Serial Peripheral Interface).

[0051] In one embodiment, the controller 204 in the aging test device 200 of the circuit board card adopts an ARM+FPGA (Field Programmable Gate Array) architecture for design. The controller 204 includes the following functional circuits: an Ethernet interface, 1-way PWM (pulse width modulation) output, 4-way TTL (Transistor-Transistor-Logic) input, 16-way TTL output, 4-way MOS (metal-oxide semiconductor) tube (analog relay), 1-way PWM, 1-way temperature, 1-way current and 4-way voltage acquisition.

[0052] In one embodiment, after starting aging, the aging test device 200 enters an automatic test and control process. The temperature sensor collects and uploads the circuit board card temperature data to the controller 204 in real time, and the controller 204 performs adaptive adjustment and control according to the working state of the circuit board card. Among them, the heat dissipation module 203 is responsible for controlling the actual working temperature of the circuit board card, and adopts a double-loop control strategy to adjust the component temperature to keep it within a certain range.

[0053] As an implementable manner, the controller 204 is further configured to input the actual working temperature parameter in time sequence into a preset filter fitting model, and output an actual working temperature parameter filtered from interference, and determine whether the actual working temperature of the circuit board card exceeds a set temperature range based on the actual working temperature parameter filtered from interference.

[0054] As an implementable manner, the preset environmental noise fitting model is constructed by an adaptive filter algorithm.

[0055] Specifically, due to factors such as test environment influence and increased circuit noise under high temperature conditions, noise interference phenomenon is prone to occur when collecting the temperature of the circuit board card product, thereby affecting the effective real-time of the control strategy, and thus it is necessary to filter the collected temperature.

[0056] The adaptive digital filter is modeled by using the adaptive digital filter on the collected circuit board card working temperature data in time sequence, so as to obtain a fitting model of the measured parameter of the system, and analyze the residual sequence to determine whether an abnormality occurs in the system.

[0057] As shown in Figure 4 W(t) is the input of the adaptive digital filter, y(t) is the output thereof, X(t) is the input of the adaptive digital filter system, that is, the environmental noise process variable to be detected, M is the order of the adaptive digital filter, e(t) is the difference between X(t) and y(t), is the estimated value of the state X(t), wherein the estimated value at the current time is the measured value at the previous time, and the following relationship exists:

[0058] e(t) = X(t) - y(t)

[0059]

[0060] Wherein:

[0061]

[0062] W(t) = [ω(t), ω(t-1), …, ω(t-M+1)] T

[0063] is the weight of the filter at time t, and the recursive formula thereof is

[0064] Φ t+1 = Φ t + 2γW(t)e(t)

[0065] Wherein:

[0066] λ max represent the largest eigenvalue.

[0067] Taking the time delay ΔL = 1, the fitting model of state X(t) is obtained as:

[0068]

[0069] For a stationary time series {e(k), k = 1, 2, 3,...}, the adaptive digital filter will asymptotically converge, and it can be proved that the prediction error series {e(k)} is a zero-mean Gaussian white noise with a constant variance

[0070] After the adaptive digital filter converges to a stationary time series {X(k)}, when abnormal data X(k) caused by sudden component failure or sensor failure enters the system as shown in the figure, the prediction error {e(k)} will immediately change, and its white noise performance will also be destroyed. Figure 2

[0071] Therefore, according to this feature, abnormal conditions in the aging test device 200 and whether a failure occurs can be detected, and the detection standard adopts the 3σ criterion, and the judgment method adopts the statistical quantity defined as follows to calculate:

[0072] Definition of statistical quantity:

[0073]

[0074] is an index function for judging the white noise performance of the error series {e(j), j = t-N+1, t-N+2,..., k}.

[0075] where is the sample variance of {e(t)}, which is calculated by:

[0076]

[0077]

[0078] is the autocovariance of {e(t)};

[0079]

[0080] where P can be freely selected, but should be

[0081] It can be verified that δ(t) approximately obeys X 2 distribution with a degree of freedom of P, so whether δ(t) obeys X​2 If some of the continuous inputs {e(k)} do not have the white noise property, it can be determined that the input of the aging test device 200 is abnormal data, that is, the aging test device 200 has a fault; if a few individual or non-continuous data in a continuous input signal {e(k)} do not have the white noise property, and the white noise property of the entire data is not greatly affected, it can be determined that these data are poor quality data, indicating that the aging test device 200 has no fault.

[0082] The environmental noise fitting model used in this embodiment has good detection capability for sudden faults of the aging test device 200, does not require statistical characteristics of system noise, has good real-time performance, and has strong robustness to system model mismatch.

[0083] As an implementable manner, the aging test device 200 further comprises a noise filtering module, which is in communication connection with the controller 204.

[0084] The noise filtering module is configured to collect an environmental noise signal of the circuit board card and send the environmental noise signal to the controller.

[0085] The controller 204 is further configured to input the environmental noise signal to a preset environmental noise fitting model, filter out an abnormal environmental noise signal based on the preset environmental noise fitting model, and determine whether the aging test device 200 is running normally based on the abnormal environmental noise signal.

[0086] As an implementable manner, the controller 204 is further configured to control the aging processing module 201 to stop providing signal excitation to the circuit board when the duration of the abnormal environmental noise signal exceeds a preset noise abnormal duration.

[0087] Specifically, when it is found through the environmental noise fitting model that there is a fault in the aging test device 200, if the long-time fault cannot be processed, it may cause damage to the circuit board card, and even endanger the working safety of the aging test device 200. Therefore, by setting the preset noise abnormal duration, the aging test device 200 can timely control the development trend of the fault by stopping providing signal excitation to the circuit board.

[0088] As an implementable manner, the controller 204 is further configured to control the aging processing module 201 to configure the circuit board card to work at a first rated power, and control the output power of the heat dissipation module 203 to be increased when the actual working temperature of the circuit board card exceeds a temperature threshold.

[0089] The controller 204 is further configured to, when the output power of the heat dissipation module 203 reaches a second rated power and the actual working temperature of the circuit board obtained by the parameter monitoring module 202 within a set time still exceeds the set temperature range, reduce the power configuration provided by the aging processing module 201 to the circuit board to reduce signal excitation.

[0090] Specifically, in an embodiment, the heat dissipation module 203 adopts a heat dissipation fan. Compared with controlling the actual working temperature of the product under test by the heat dissipation module 203 alone, this embodiment diversifies the effective adjustment of the actual working temperature of the circuit board by increasing the output power of the heat dissipation module 203 and adjusting the signal excitation to the circuit board at the same time when the actual working temperature of the circuit board under test reaches or exceeds the temperature threshold, so as to maintain the stable environment of the aging test as much as possible. At the same time, when the heat dissipation fan reaches the rated power and is maintained at the rated power for a long time, the heat dissipation fan itself will become a safety hazard.

[0091] As an implementable manner, the controller 204 is further configured to, after the power configuration provided by the aging processing module 201 to the circuit board is reduced to reduce signal excitation, control the aging processing module 201 to stop providing signal excitation to the circuit board if the actual working temperature of the circuit board still exceeds the temperature threshold within a second preset time length.

[0092] Specifically, in order to guarantee the safe and stable operation environment of the aging test device 200, the second preset time length is set to timely find the complex fault condition that cannot be handled by the heat dissipation module 203 and the reduction of signal excitation to the circuit board. In an embodiment, a communication module can be arranged in the aging test device 200 to inform the corresponding staff of the complex fault condition currently occurring in the aging test device 200, so that the staff can timely adjust and restore the aging test device 200, thereby improving the working efficiency of the aging test device 200.

[0093] As an implementable manner, the aging test device 200 further comprises a display module 205, and the display module 205 is connected with the controller 204.

[0094] The controller 204 is further configured to, when the actual working temperature of the circuit board exceeds the temperature threshold and / or the environmental noise signal is abnormal, generate abnormal reminding information that the circuit board is abnormal and control the display module 205 to display; and / or,

[0095] The display module 205 is further configured to display the actual working parameters of the circuit board and / or the environmental noise signal.

[0096] Specifically, the display module 205 is used for the staff to observe the working parameters of the circuit board card in the test and whether the abnormal working state occurs or is in the abnormal working state, especially the display of the actual working temperature of the circuit board card. In an embodiment, the display module 205 can display the actual working temperature curve of the circuit board card in a preset time period according to the signal of the controller 204, and if the temperature threshold is exceeded in the time period, the corresponding time point of the abnormal working state is displayed on the display module 205, so as to facilitate the staff to retrieve the corresponding working parameters for detection and debugging.

[0097] In an embodiment, the display module 205 can also serve as a human-computer interaction interface, and the user can directly operate the aging test device 200 on the display module 205, including but not limited to parameter configuration, device control, and database operation. The parameter configuration includes system configuration information, aging conditions, and parameter limit value information, wherein the aging conditions are used to configure the component environment in the aging process, and the parameter limit value sets the critical value of the system automatic protection and alarm; the device control includes program control of the partial parameters of the instruments and meters in the aging test device 200 and management of the aging process of the component operation table; and the database operation records the real-time data such as the database in the aging process; after the aging is completed, the historical data can be retrieved and the formatted output and data analysis are supported.

[0098] As an implementable manner, the aging test device 200 further includes a data storage module 206 connected with the controller 204.

[0099] The data storage module 206 is used to store the working parameters of the circuit board card and / or the abnormal data of the working state of the circuit board card.

[0100] Specifically, in order to further improve the aging test of the circuit board card, the data storage module 206 records the working parameters, abnormal state, and corresponding data such as the power of the heat dissipation module 203 and the signal excitation of the aging processing module 201 of the circuit board card in the entire aging process, which is an important reference and research basis for finding the defects of the measured circuit board card. Through the actual working temperature, signal excitation, heat dissipation data, and environmental noise of the circuit board card, comprehensive aging test of the circuit board card is realized.

[0101] The aging test device 200 of the circuit board card provided by the embodiment utilizes the principle of self-heating of the circuit board card under operation, designs and develops an automatic aging test device of the circuit board card, provides signal excitation and a test environment for the board card, adopts an adaptive filtering algorithm and a classic control algorithm to control and adjust the working temperature of the circuit board card, realizes the live aging test of the circuit board card under a specified time length, controls the aging temperature of the circuit board card in a target temperature ±2℃ precision range, and realizes the precise test of the aging of the circuit board card through diversified parameter data.

[0102] Embodiment 2

[0103] The aging test method of the circuit board card provided by the embodiment is realized by the aging test device 200 of the circuit board card described in Embodiment 1, and the aging test method comprises the following steps. Figure 5

[0104] S101, providing signal excitation of the circuit board card according to the set power parameter configured by the controller 204;

[0105] S102, acquiring actual working parameters of the circuit board card, the actual working parameters comprising an actual working temperature of the circuit board card and sending the actual working parameters to the controller 204;

[0106] S103, when the actual working temperature exceeds the set temperature range, controlling the working state of the aging processing module 201 and / or the heat dissipation module 203 until the actual working temperature of the circuit board card is adjusted to the set temperature range.

[0107] The aging test method of the circuit board card provided by the embodiment utilizes the principle of self-heating of the circuit board card under operation, designs and develops an automatic aging test device of the circuit board card, provides signal excitation and a test environment for the board card, adopts an adaptive filtering algorithm and a classic control algorithm to control and adjust the working temperature of the circuit board card, realizes the live aging test of the circuit board card under a specified time length, controls the aging temperature of the circuit board card in a target temperature ±2℃ precision range, and realizes the precise test of the aging of the circuit board card through diversified parameter data.

[0108] As an implementable way, as shown in Figure 6 ​As shown, in the aging test method of the circuit board card, first, the working state of the aging test device of the circuit board card displayed by the controller and the aging processing module is observed by the staff, if the working state is normal, the aging conditions and related working parameters are configured, wherein the working parameters include but are not limited to the working current, working voltage, working temperature, rated power and corresponding set temperature range, set time of the circuit board card, the output voltage of the power supply, the frequency, power and signal output configured to the circuit board card; then, the aging test process of the circuit board card is started, the configured control parameters are sent to the controller and power is supplied, and the controller controls the aging processing module to provide signal excitation for the circuit board card. During the aging test process, the controller works under the preset conditions to provide the working state and fault information of each module and circuit board to the staff through the display module for observation.

[0109] When the controller obtains the working state exception or fault information of the circuit board card or other modules, the fault information prompt is embodied at the display module, and the corresponding aging processing module and module parameters are obtained, the fault information of the circuit board card and the corresponding module state information are stored in the local database for subsequent analysis and processing of the fault information.

[0110] In one embodiment, if the unit state and / or the fault information of the circuit board card reaches the preset condition for stopping the aging test, the controller performs the power-down operation, the aging test module stops the signal excitation of the circuit board card, and the fault information is sent to the display module. Alternatively, the staff discovers the fault information and operates the controller to stop the aging test device.

[0111] After the aging test device stops, the power supply of the aging test device is turned off, that is, the working of each module and the circuit board card is stopped.

[0112] In one embodiment, as shown in the figure, Figure 7 When the working temperature of the circuit board card is found to exceed the set temperature threshold, the controller adjusts the cooling fan through the PWM (Pulse Width Modulation) mode to cool the circuit board card; and / or, the controller adjusts the signal excitation of the aging processing module to the circuit board card, that is, adjusts the pulse duty cycle to adjust the pulse output, adjusts the working power of the circuit board card to realize the adjustment of the working temperature of the circuit board card.

[0113] Although the specific embodiments of the present application are described above, those skilled in the art should understand that this is only an example, the protection scope of the present application is defined by the appended claims. Those skilled in the art can make various changes or modifications to these embodiments without departing from the principles and essence of the present application, and these changes and modifications all fall within the protection scope of the present application.

Claims

1. An aging test apparatus for a circuit board card, characterized by comprising: The aging test device comprises a controller, an aging processing module, a parameter monitoring module and a heat dissipation module which are connected with the controller respectively, and the aging processing module is electrically connected with the circuit board card; The aging processing module is configured to provide signal excitation of the circuit board card according to the set power parameters configured by the controller; The parameter monitoring module is configured to obtain actual working parameters of the circuit board card, and the actual working parameters comprise actual working temperature of the circuit board card and are sent to the controller; The controller is configured to control working states of the aging processing module and / or the heat dissipation module when the actual working temperature exceeds the set temperature range, until the actual working temperature of the circuit board card is adjusted to the set temperature range. The aging test device further comprises a noise filtering module which is connected with the controller; The noise filtering module is configured to collect environmental noise signals of the circuit board card and send them to the controller; The controller is further configured to input the environmental noise signals into a preset environmental noise fitting model, filter out abnormal environmental noise signals based on the preset environmental noise fitting model, and determine whether the aging test device is running normally based on the abnormal environmental noise signals. The preset environmental noise fitting model is obtained by modeling the collected circuit board card working temperature data in time series using an adaptive digital filter; when abnormal data X(k) caused by sudden component failure or sensor failure enters, the white noise performance of the error sequence {e(k)} of the adaptive digital filter is destroyed after the adaptive digital filter converges to a stationary time series {X(k)}.

2. The burn-in test apparatus for a circuit board card according to claim 1, wherein The controller is further configured to input the actual working temperature parameters in time series into a preset filtering fitting model, output the actual working temperature parameters filtered out of interference, and determine whether the actual working temperature of the circuit board card exceeds the set temperature range based on the actual working temperature parameters filtered out of interference.

3. The burn-in test apparatus for a circuit board card according to claim 1, wherein The preset environmental noise fitting model is obtained by adaptive filtering algorithm.

4. The burn-in test apparatus for a circuit board card according to claim 1, wherein The controller is further configured to control the aging processing module to stop providing signal excitation to the circuit board when the abnormal duration of the environmental noise signals exceeds the preset noise abnormal duration.

5. The burn-in test apparatus for a circuit board card according to claim 1, wherein The controller is further configured to control the aging processing module to configure the circuit board card to work at a first rated power, and to control the output power of the heat dissipation module to be increased when the actual working temperature of the circuit board card exceeds a temperature threshold. The controller is further configured to reduce the power configuration provided by the aging processing module to the circuit board card to reduce signal excitation when the actual working temperature of the circuit board card obtained by the parameter monitoring module within a set time still exceeds the set temperature range when the output power of the heat dissipation module reaches a second rated power.

6. The burn-in test apparatus for a circuit board card according to claim 5, wherein The controller is further configured to control the burn-in processing module to stop providing the signal excitation to the circuit board card if the actual working temperature of the circuit board card is still higher than the temperature threshold within a second preset time period after the power provided by the burn-in processing module to the circuit board card is configured to reduce the signal excitation.

7. The burn-in test apparatus for a circuit board card according to any one of claims 1 to 6, wherein The burn-in testing device further comprises a display module connected with the controller. The controller is further configured to generate abnormality reminding information of the circuit board card and control the display module to display the abnormality reminding information if the actual working temperature of the circuit board card is higher than the temperature threshold and / or the environmental noise signal is abnormal. The display module is further configured to display the actual working parameters of the circuit board and / or the environmental noise signal.

8. The burn-in test apparatus for a circuit board card according to claim 7, wherein The burn-in testing device further comprises a data storage module connected with the controller. The data storage module is configured to store the actual working parameters of the circuit board card and / or abnormal data when the working state of the circuit board card is abnormal.

9. A method of burn-in testing a circuit board card, the method comprising: The burn-in testing method is implemented by using the burn-in testing device of the circuit board card according to any one of claims 1 to 8, and the burn-in testing method comprises: providing the signal excitation of the circuit board card according to the set power parameters configured by the controller; obtaining the actual working parameters of the circuit board card, the actual working parameters comprising the actual working temperature of the circuit board card and being sent to the controller; controlling the working state of the burn-in processing module and / or the heat dissipation module if the actual working temperature is higher than the set temperature range, until the actual working temperature of the circuit board card is adjusted to the set temperature range.

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