A testing device and method for correcting precision of an active optical correction system of a telescope

Abstract

A kind of telescope active optical correction system correction accuracy testing device, including laser interferometer, multidimensional adjusting table, wave aberration measurement component and plane mirror, laser interferometer is placed in the outside of optical telescope for emitting test light to the inside of optical telescope, to detect the wave aberration data of multiple fields of view;Multidimensional adjusting table is used to adjust the position, angle of optical element in optical telescope, to simulate the situation that telescope imaging quality drops;Wave aberration measurement component is set at the image plane of telescope for measuring the wave aberration after optical telescope imaging quality drops, and plane mirror is used to reflect test light.The present application relates to a kind of telescope active optical correction system correction accuracy testing method, the displacement amount and rotation angle of optical element when comparing when simulating image quality drop and when correcting judge the correction accuracy of active optical correction system, compare wave aberration before simulating image quality drop and after correction, judge whether the image quality after correction reaches the image quality before simulating image quality drop.

Description

Technical Field

[0001] This invention relates to the field of optical measurement, and more specifically, to a method and apparatus for testing the calibration accuracy of an active optical calibration system for a telescope. Background Technology

[0002] Large-aperture optical telescopes play a vital role in numerous fields, including earth science, astronomy, military applications, and civilian production, and have broad application prospects in environmental monitoring, Earth radiation monitoring, astronomical observation, and deep space exploration. With the continuous progress and development of technology across various industries in my country, optical telescopes are increasingly larger in aperture and focal length, resulting in larger overall dimensions. When the supporting structure of an optical telescope is affected by factors such as temperature or external forces, its structure deforms, causing changes in the relative positions of different optical elements within the system. Simultaneously, the state between the optical mirror and the supporting structure is also altered by external factors, leading to changes in stress on different parts of the mirror, causing mirror displacement or deformation. These problems degrade the imaging quality of the optical telescope, reduce its observation performance, and ultimately prevent the acquisition of effective data, resulting in significant economic losses. Furthermore, the larger the aperture of the optical telescope, the more significantly its imaging quality is affected by external factors such as gravity and the environment.

[0003] In existing technologies, active optical correction systems are used to correct the optical elements in an optical telescope, restoring their imaging quality to normal operating conditions. A commonly used active optical correction system involves mounting an actuator or multi-dimensional adjustment stage on the back of a specific optical element within the telescope. Active optical correlation algorithms are used to calculate the displacement or deflection angle between the optical elements. Based on the calculation results, the actuator or multi-dimensional adjustment stage is adjusted to ensure the relative positions of the optical elements are correct, achieving real-time adjustment of the telescope's imaging quality and guaranteeing that the system's wavefront aberrations meet imaging quality requirements. For example, Chinese patent application number 201910918913.4, entitled "An Active Optical Adaptive Force Application Method and Device for Large-Aperture Telescopes," sets a safety threshold for the correction force increment of the primary mirror shape force actuator based on the characteristics of the telescope's primary mirror side support structure system. While acquiring the wavefront aberration of the telescope system, it also acquires the current applied force value of the primary mirror shape force actuator. Based on the wavefront aberration of the optical system and the primary mirror shape response function, it calculates the correction force increment of the primary mirror shape force actuator. Using the safety threshold as a benchmark, it differentiates the calculated correction force increment to calculate the force value to be applied in the sub-force application process of each force actuator. Based on the force value to be applied in the sub-force application process of each force actuator, it performs the current sub-force application process and determines whether the current sub-force application process meets the force control accuracy requirements. If it does, it proceeds to the next sub-force application process; otherwise, it maintains the current force application process. For example, in the Chinese patent application number 202010668627.X, entitled "A method for correcting the misalignment error of a large-aperture, large-field telescope", the correction is achieved by changing the position of the secondary mirror through a six-degree-of-freedom actuator.

[0004] However, the actual correction accuracy of the active optical correction system is directly related to whether it can correctly correct the imaging quality of large-aperture optical telescopes. Therefore, it is necessary to test the correction accuracy of the active optical correction system. Summary of the Invention

[0005] To address the testing requirements for the calibration accuracy of active optical correction systems in existing technologies, this invention proposes a testing device and method for the calibration accuracy of active optical correction systems for telescopes, which can be used to test the calibration accuracy of active optical correction systems.

[0006] An active optical correction system for an optical telescope includes a calibration accuracy testing device comprising a laser interferometer, a multidimensional adjustment stage, a plane mirror, and a wave aberration measurement component. The laser interferometer is positioned outside the optical telescope and is used to emit detection light into the interior of the optical telescope to detect wave aberration data in the field of view. The multidimensional adjustment stage is located inside the optical telescope and is positioned behind the optical elements, used to adjust the position and angle of the optical elements to simulate a decrease in the imaging quality of the optical telescope. The wave aberration measurement component is positioned at the image plane of the optical telescope and is used to measure the wave aberration after the decrease in the imaging quality of the optical telescope. The plane mirror is positioned outside the telescope, and the reflecting surface of the plane mirror is opposite to the direction in which the test light is reflected by the primary mirror.

[0007] In the above technical solution, a laser interferometer is used to measure wavefront aberration data of the field of view before and after simulated image quality degradation. A multi-dimensional adjustment stage is used to change the position or angle of optical elements in the optical telescope within the correction range of the active optical correction system to simulate image quality degradation. A wavefront aberration measurement component is used to measure the wavefront aberration data of the optical elements after the position is changed. The active optical correction system processes the wavefront aberration results measured by the wavefront aberration measurement component, calculates the amount of correction required for the optical elements, and corrects the optical elements according to the calculation results. The displacement and rotation angle of the optical elements during simulated image quality degradation are compared with the displacement and rotation angle of the optical elements during correction to determine the correction accuracy. The wavefront aberration data of the simulated corrected field of view is measured by the laser interferometer and compared with the wavefront aberration data before simulated correction to determine whether the image quality after simulated correction reaches the image quality before the simulated image quality degradation.

[0008] Preferably, the wavefront aberration measurement assembly includes a wavefront sensor, a test light source, and a clamping frame; the wavefront sensor is mounted on the clamping frame, and the wavefront sensor and the clamping frame are located at the image plane of the optical telescope, with the wavefront sensor and the edge field of view of the optical telescope corresponding to each other; the test light source is mounted next to the wavefront sensor, and the number of wavefront sensors and test light sources is equal, and there are at least three.

[0009] In the above technical solution, by setting a wavefront sensor at the image plane, the wavefront aberration data of the optical telescope can be tested more accurately, providing basic wavefront aberration data for subsequent active optical correction system correction. The number of test light sources is at least three, which can realize the testing of wavefront aberration data of multiple fields of view, providing more data support for the active optical correction system and increasing the correction accuracy.

[0010] Preferably, the optical element is a secondary mirror.

[0011] Preferably, the multidimensional adjustment stage is an H811.I2 / 12V type six-legged displacement stage.

[0012] A test method for a calibration accuracy testing device based on an active optical correction system for an optical telescope includes the following steps:

[0013] S1: Wavelength aberrations in the field of view of an optical telescope are detected using a laser interferometer, providing a comparative basis for subsequent evaluation of image quality after correction by the active optical correction system;

[0014] S2: Change the position and angle of the optical elements in the optical telescope to simulate the image quality degradation of the optical telescope, and record the displacement and rotation angle of the optical elements; test the wave aberration data of different fields of view at the image plane position using different wavefront sensors;

[0015] S3: The active optical correction system corrects the moving or rotating optical elements in S2 based on the wave aberration data measured in S2; and records the displacement and rotation angle of the corrected optical elements.

[0016] S4: Compare the displacement and rotation angle of the optical element during simulated image quality degradation with those during correction to determine the correction accuracy;

[0017] S5: Waveform aberration of the optical telescope field of view detected by a modal laser interferometer under the same positional conditions as S1;

[0018] S6: Compare the aberration values ​​of S1 and S5 to determine whether the corrected image quality has reached the image quality before the simulated image quality degradation.

[0019] In the above technical solution, a laser interferometer is used to test the wavefront aberration data of the optical telescope's field of view, serving as a comparative basis for evaluating image quality. Simulating a decline in the image quality of the optical telescope, multiple wavefront sensors are used to test the wavefront aberration data of different fields of view after the simulated image quality degradation, without moving the wavefront aberration testing components. The active optical correction system uses an algorithm to calculate the displacement and rotation of the optical elements based on the wavefront aberration data measured after the simulated image quality degradation, and then corrects the optical elements based on the calculated results, thereby completing the optical image quality adjustment. The correction accuracy is evaluated by comparing the simulated image quality degradation with the displacement and rotation angle of the corrected optical elements. Finally, a laser interferometer is used to detect the corrected field of view wavefront aberration to determine whether the corrected wavefront aberration has reached the image quality before the simulated image quality degradation.

[0020] Preferably, step S1 is divided into two steps:

[0021] S1.1: Detects wavefront aberration in the central field of view of an optical telescope.

[0022] S1.2: Detect the wave aberrations of different fields of view of the optical telescope, excluding the central field of view.

[0023] The preferred detailed steps for S1.1 of detecting wavelet aberration in the central field of view of an optical telescope are as follows:

[0024] S1.1.1: Place a laser interferometer outside the optical telescope and record its position. Place a plane mirror outside the optical telescope with its reflecting surface facing the optical telescope.

[0025] S1.1.2: The test light is emitted towards the central field of view of the optical telescope through the laser interferometer, and the optical telescope reflects the test light to the plane mirror;

[0026] S1.1.3: Adjust the angle of the plane mirror to emit the test light to the optical telescope, and then reflect it to the laser interferometer so that the focal points of the test light emitted and received by the laser interferometer coincide.

[0027] S1.1.4: At this time, the wavefront aberration at the central field of view is measured using a laser interferometer, and the wavefront aberration data is recorded.

[0028] In the above technical solution, test light is emitted through laser interference. The test light passes through an optical telescope and reaches a plane mirror. The plane mirror rotates to reflect the test light back to the optical telescope. The optical telescope reflects the test light back to the laser interferometer. The test light emitted and received by the laser interferometer coincide in focus. Only after interference can the laser interferometer measure the wavelet aberration in the current state. In addition, the wavelet aberration data measured is in the nanometer range, which can effectively ensure the test accuracy.

[0029] Preferably, the specific steps for S1.2 to detect wave aberrations in different fields of view of the optical telescope, excluding the central field of view, are as follows:

[0030] S1.2.1: Move the laser interferometer to different positions to obtain different fields of view, and record the position of the laser interferometer;

[0031] S1.2.2: Test light is emitted into the field of view of the optical telescope via a laser interferometer, and the optical telescope reflects the test light to the plane mirror:

[0032] S1.2.3: Adjust the angle of the plane mirror and then reflect the test light into the optical telescope. The test light emitted by the optical telescope is then reflected into the laser interferometer, and the test light received by the laser interferometer intersects with the test light emitted by the laser interferometer.

[0033] S1.2.4: Test wavelet aberration data using a laser interferometer and record the wavelet aberration data.

[0034] In the above technical solution: wave aberration can intuitively reflect the imaging quality. By testing wave aberration data under different fields of view, a basis can be provided for judging whether the corrected image quality has reached the image quality before the simulated image quality degradation.

[0035] Preferably, the laser interferometer is changed at least three times to test wavefront aberrations under more different fields of view.

[0036] In the above technical solution, testing more wave aberration data can more accurately reflect the imaging quality of the current optical telescope, providing more criteria for judging the image quality after correction.

[0037] Preferably, the specific steps for step S2, which simulates the image quality degradation of an optical telescope and tests the wavelet aberration data after the image quality degradation, are as follows:

[0038] S2.1: Adjust the angle or position of the optical elements in the optical telescope to simulate the situation where the image quality deteriorates due to the displacement or rotation of the optical elements;

[0039] S2.2: Turn on a test light source to emit test light into the optical telescope. The test light is reflected by the optical telescope to the plane mirror.

[0040] S2.3: Adjust the angle of the plane mirror to emit test light to the optical telescope. The test light is reflected by the optical telescope to the wavefront sensor. The wavefront sensor is used to test the wave aberration data under the current state.

[0041] S2.4: Turn on different test light sources and repeat steps S2.2 and S2.3.

[0042] In the above technical solution, by testing different wavelet aberration data multiple times, more data can be obtained to provide data support for the active optical correction system.

[0043] Preferably, S2.1 The specific method for adjusting the position or angle of the optical element in the optical telescope is to change the position or angle of the optical element by using a multi-dimensional adjustment stage (22).

[0044] In the above technical solution, by setting a position adjuster, the optical element can be rotated and moved in different directions, simulating the image quality degradation in actual situations to the greatest extent.

[0045] Beneficial effects:

[0046] 1. The experimental method is simple. The accuracy of the correction can be determined by comparing the displacement and rotation angle of the same optical element when the image quality deteriorates and when it is corrected.

[0047] 2. A laser interferometer is used as the testing tool for wavefront aberration before and after correction. The testing accuracy of the laser interferometer can reach the nanometer level, which can effectively ensure the testing accuracy.

[0048] 3. Wavelength aberration data from different fields of view are measured multiple times before the active optical correction system is calibrated. This ensures that there is sufficient data to support the calculation of the correction amount, thereby ensuring that the active optical correction system can perform accurate calibration.

[0049] 4. By setting up a multi-dimensional adjustment stage, the position and angle of the optical elements can be changed, which can simulate the displacement or rotation that occurs in actual use to the greatest extent. Attached Figure Description

[0050] Figure 1 This is a flowchart of a method for testing the correction accuracy of an active optical correction system;

[0051] Figure 2 This is a schematic diagram of the aberration data structure for testing waves using a laser interferometer;

[0052] Figure 3 This is a schematic diagram of the structure where the multi-dimensional adjustment platform is located on the back of the secondary mirror;

[0053] Figure 4 This is a schematic diagram of the structure of the wave aberration component and the clamping frame.

[0054] 1. Laser interferometer; 21. Secondary mirror; 22. Multidimensional adjustment stage; 23. Primary mirror; 3. Plane mirror; 4. Wavefront aberration measurement assembly; 41. Wavefront sensor; 42. Test light source; 5. Clamping frame. Detailed Implementation

[0055] The accompanying drawings are for illustrative purposes only and should not be construed as limiting this patent. To better illustrate this embodiment, some components in the drawings may be omitted, enlarged, or reduced, and do not represent the actual dimensions of the product. It is understandable to those skilled in the art that some well-known structures and their descriptions may be omitted in the drawings. The positional relationships described in the drawings are for illustrative purposes only and should not be construed as limiting this patent.

[0056] In the accompanying drawings of the embodiments of the present invention, the same or similar reference numerals correspond to the same or similar components. In the description of the present invention, it should be understood that if terms such as "upper," "lower," "left," "right," "long," and "short" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, they are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, the terms used to describe positional relationships in the drawings are only for illustrative purposes and should not be construed as limiting the present patent. For those skilled in the art, the specific meaning of the above terms can be understood according to the specific circumstances.

[0057] The technical solution of the present invention will be further described in detail below through specific embodiments and with reference to the accompanying drawings:

[0058] Example 1

[0059] An embodiment 1 of a telescope active optical correction system calibration accuracy testing device includes a laser interferometer 1, a multi-dimensional adjustment stage 22, a plane mirror 3, and a wave aberration measurement component 4. The laser interferometer 1 is disposed outside the optical telescope and is used to emit detection light into the interior of the optical telescope to detect wave aberration data of the field of view. The multi-dimensional adjustment stage 22 is an H811.I2 / 12V type hexapod displacement stage and is disposed behind the secondary mirror 21 in the optical telescope. It is used to change the position and angle of the secondary mirror 21 to simulate the situation of decreased imaging quality of the optical telescope. The wave aberration measurement component 4 is disposed at the image plane position of the optical telescope and is used to measure the wave aberration after the decrease in imaging quality of the optical telescope. The plane mirror 3 is disposed outside the telescope, and the reflecting surface of the plane mirror 3 is opposite to the direction of the test light reflected by the primary mirror 23 in the optical telescope.

[0060] The working principle of this embodiment is as follows: First, the wavefront aberration data of the simulated image quality degradation forward optical telescope field of view is measured using a laser interferometer 1. Then, within the correction range of the active optical correction system, the position and angle of the secondary mirror 21 are changed using an H811.I2 / 12V type hexapod displacement stage to simulate the image quality degradation. The wavefront aberration measurement component 4 is set at the image plane, and the wavefront aberration data of the secondary mirror 21 after the position change is tested using the wavefront aberration measurement component 4. The active optical correction system processes the wavefront aberration results measured by the wavefront aberration measurement component 4, calculates the amount that the secondary mirror 21 needs to change, and corrects the secondary mirror 21 according to the calculation results. Finally, under the same position conditions as the previous field of view wavefront aberration measurement, the laser interferometer 1 measures the wavefront aberration data of the same field of view. The correction accuracy of the active optical correction system is judged by comparing the displacement and rotation angle of the secondary mirror 21 under simulated image quality degradation and during correction. Finally, the field of view wavefront aberration before and after the simulated image quality degradation is compared to determine whether the corrected image quality reaches the image quality before the simulated image quality degradation.

[0061] The beneficial effects of this embodiment are: it uses a small number of devices and has strong versatility. It uses a laser interferometer as a test tool for wavefront aberration before and after correction. The test accuracy of the laser interferometer can reach the nanometer level, which can effectively ensure the test accuracy.

[0062] Example 2

[0063] An embodiment 2 of a telescope active optical correction system calibration accuracy testing device includes a laser interferometer 1, a multi-dimensional adjustment stage 22, a plane mirror 3, and a wave aberration measurement component 4. The laser interferometer 1 is disposed outside the optical telescope and is used to emit detection light into the interior of the optical telescope to detect field wave aberration data. The multi-dimensional adjustment stage 22 is disposed behind the secondary mirror 21 in the optical telescope and is used to adjust the position and angle of the secondary mirror 21 to simulate the situation of decreased imaging quality of the optical telescope. The wave aberration measurement component 4 is disposed at the image plane position of the optical telescope and is used to measure the wave aberration after the decrease in imaging quality of the optical telescope. The plane mirror 3 is disposed outside the telescope, and the reflective surface of the plane mirror 3 faces the optical telescope to reflect the test light.

[0064] Furthermore, a clamping frame 5 is set at the image plane position of the optical telescope, and four wavefront sensors 41 are set on the clamping frame 5. The wavefront sensors 41 are also located at the image plane position of the optical telescope, and the wavefront sensors 41 correspond to the edge field of view position of the optical telescope. A test light source 42 is set next to each wavefront sensor 41, and the test light source 42 can emit test light towards the edge field of view position.

[0065] The working principle of this embodiment is as follows: First, the wavefront aberration data of the forward optical telescope field of view, simulating image quality degradation, is measured by the laser interferometer 1. Then, the position and angle of the secondary mirror 21 are changed within the correction range of the active optical correction system using the multi-dimensional adjustment stage 22 to simulate image quality degradation. The wavefront aberration measurement component is placed at the image plane, and the test light source 42 emits test light towards the edge field of view. The test light is then reflected to the wavefront sensor 41 via the plane mirror 3 and the imaging system. The wavefront sensor 41 detects the current wavefront aberration data, which reflects the image quality. Next, other test light sources 42 are turned on sequentially to measure the wavefront aberration data of different edge fields of view, providing a more accurate reflection of the current image quality. The active optical correction system processes the wavefront aberration results measured by the wavefront aberration measurement component 4, calculates the amount that the secondary mirror 21 needs to be changed, and corrects the secondary mirror 21 based on the calculation results. Finally, the laser interferometer 1 measures the wavefront aberration data of the same field of view under the same position conditions as the previous wavefront aberration measurement. The correction accuracy of the active optical correction system is judged by comparing the displacement and rotation angle of the secondary mirror 21 under simulated image quality and under correction; the field wave aberration before the simulated image quality degradation and the field wave aberration after correction are compared to determine whether the corrected image quality has reached the image quality before the simulated image quality degradation.

[0066] The beneficial effects of this embodiment are: by setting up multiple wavefront sensors and test light sources, the true data after the image quality deteriorates can be reflected more accurately, so that the active optical correction system can make accurate corrections to the imaging system based on this data.

[0067] Example 3

[0068] Example 3 of a method for testing the calibration accuracy of an active optical correction system for a telescope specifically includes the following steps:

[0069] S1: Wavelength aberrations in the field of view of the optical telescope are detected by laser interferometer 1, providing a basis for comparison in subsequent judgment of image quality after correction by the active optical correction system;

[0070] S2: Change the position and angle of the secondary mirror 21 in the optical telescope to simulate the decrease in image quality of the optical telescope, record the displacement and rotation angle of the secondary mirror 21, and test the wave aberration data of different fields of view at the image plane position through different wavefront sensors 41.

[0071] S3: The active optical correction system corrects the moving or rotating secondary mirror 21 in S2 based on the wavelet aberration data measured in S2, and records the displacement and rotation angle of the secondary mirror 21 after correction.

[0072] S4: Compare the displacement and rotation angle of secondary mirror 21 during simulated image quality degradation and during correction to determine the correction accuracy;

[0073] S5: Waveform aberration of the optical telescope field of view detected by laser interferometer 1 under the same position and conditions as S1;

[0074] S6: Compare the wave aberration values ​​of S1 and S5 to determine whether the corrected image quality reaches the image quality before correction.

[0075] The principle of the above technical solution is as follows: A laser interferometer 1 is used to test the wavefront aberration data of the optical telescope's field of view, serving as a comparative basis for evaluating image quality. The position and angle of the secondary mirror 21 are changed to simulate a decrease in the image quality of the optical telescope, and the wavefront aberration data after the image quality deterioration is tested. Based on the wavefront aberration data measured after the simulation, the active optical correction system uses an algorithm to calculate the displacement of the secondary mirror 21, and then corrects the secondary mirror 21 according to the calculated results, thereby completing the image quality adjustment. The correction accuracy is evaluated by comparing the simulated image quality deterioration with the displacement and rotation angle of the corrected secondary mirror 21. Finally, the wavefront aberration of the corrected field of view is detected to determine whether the corrected wavefront aberration has reached the image quality before the simulated image quality deterioration.

[0076] The beneficial effects of this embodiment are: the testing method is simple and the equipment used is simple, and it has the characteristics of strong versatility.

[0077] Example 4

[0078] Example 4 of a method for testing the correction accuracy of an active optical correction system specifically includes the following steps:

[0079] S1: The wavefront aberration of the current optical telescope field of view is detected by laser interferometer 1, providing a basis for subsequent judgment of the optical telescope's calibration accuracy;

[0080] Specifically, step S1 is divided into S1.1: detecting wave aberrations in the central field of view of the optical telescope;

[0081] S1.2: Detect wavefront aberration at the edge of the field of view of an optical telescope.

[0082] Step S1.1 is further subdivided into

[0083] S1.1.1: Place a laser interferometer 1 outside the optical telescope and record the current position of the laser interferometer 1. Place a plane mirror 3 outside the telescope, so that the reflecting surface of the plane mirror 3 is opposite to the direction of the test light reflected by the optical telescope.

[0084] S1.1.2: The test light is emitted from the laser interferometer 1 towards the central field of view of the optical telescope, and the optical telescope reflects the test light to the plane mirror 3;

[0085] S1.1.3: Adjust the angle of the plane mirror 3 to emit the test light to the optical telescope, and then reflect it to the laser interferometer 1, so that the test light emitted by the laser interferometer 1 and the test light received by the laser interferometer 1 intersect.

[0086] S1.1.4: Measure the wavefront aberration at the central field of view using laser interferometer 1 and record the wavefront aberration data.

[0087] Step S1.2 is further subdivided into

[0088] S1.2.1: Based on the position in S1.1.1, translate the laser interferometer 1 to change its position, obtain different fields of view, and record the position of the laser interferometer 1;

[0089] S1.2.2: Test light is emitted into the field of view of the optical telescope via laser interferometer 1, and the optical telescope reflects the test light to plane mirror 3.

[0090] S1.2.3: Adjust the angle of plane mirror 3 and reflect the test light to the optical telescope, and then reflect it to laser interferometer 1 through the optical telescope, so that the test light emitted by the laser interferometer and the test light received by the laser interferometer intersect.

[0091] S1.2.4: Test the wavelet aberration of the current situation using laser interferometer 1 and record the wavelet aberration data.

[0092] Furthermore, repeat steps S1.2.1-S1.2.4 four times, with each measurement taken at a different location, to ensure that wave aberration data for different fields of view are obtained.

[0093] S2: Change the position and angle of the optical elements in the optical telescope to simulate the image quality degradation of the optical telescope, and record the displacement and rotation angle of the optical elements; test wavefront aberration data under multiple fields of view at the image plane position using different wavefront sensors 41.

[0094] S3: The active optical correction system corrects the moving or rotating optical elements in S2 based on the wave aberration data measured in S2; and records the displacement and rotation angle of the corrected optical elements.

[0095] S4: Compare the displacement and rotation angle of the optical element during simulated image quality degradation with those during correction to determine the correction accuracy;

[0096] S5: Waveform aberration of the optical telescope field of view detected by the laser interferometer under the same position conditions as S1 after simulation correction;

[0097] S6: Compare the aberration data of S1 and S5 to determine whether the corrected image quality has reached the image quality before correction.

[0098] The working principle of this embodiment is as follows: A laser interferometer 1 is used to test the wavefront aberration data of the optical telescope's field of view, serving as a comparative basis for evaluating image quality. By repeatedly changing the position of the laser interferometer 1, wavefront aberration data of different fields of view are detected through translation. The more data available, the more accurate the subsequent judgment of the corrected image quality. The system simulates a decrease in the image quality of the optical telescope and tests the wavefront aberration data at the image plane after the decrease. Based on the simulated wavefront aberration data, the active optical correction system uses an algorithm to calculate the displacement of the optical element and then corrects the optical element according to the calculated result, thus completing the optical image quality correction. The correction accuracy is evaluated by comparing the simulated image quality decrease with the displacement and rotation angle of the corrected optical element. Finally, the corrected wavefront aberration is detected to determine whether the corrected wavefront aberration has reached the image quality before the simulated image quality decrease.

[0099] The beneficial effects of this embodiment are: the laser interferometer 1 has high testing accuracy, which can ensure the accuracy of the detected wavelet aberration data; by testing multiple sets of wavelet aberration data before and after correction, the correction accuracy of the active optical correction system can be evaluated more accurately.

[0100] Example 5

[0101] Example 5 of a method for testing the calibration accuracy of an active optical correction system for a telescope includes the following steps:

[0102] S1: Wavelength aberrations in the field of view of an optical telescope are detected using a laser interferometer, providing a comparative basis for subsequent evaluation of image quality after correction by the active optical correction system;

[0103] S2: Change the position and angle of the optical elements in the optical telescope to simulate the image quality degradation of the optical telescope, and record the displacement and rotation angle of the optical elements; test wavefront aberration data under multiple fields of view at the image plane position using different wavefront sensors 41.

[0104] The more specific S2 steps are as follows:

[0105] S2.1: Adjust the angle or position of the secondary mirror (21) in the optical telescope to simulate the situation where the imaging quality deteriorates due to the displacement or rotation of optical elements;

[0106] S2.2: Turn on a test light source 42 to emit test light to the optical telescope. The test light is reflected by the optical telescope to the plane mirror 3.

[0107] S2.3: Adjust the angle of the plane mirror 3 to emit test light to the optical telescope. The test light is reflected by the optical telescope to the wavefront sensor 41. The wavefront sensor 41 is used to test the wave aberration data under the current state.

[0108] S2.4: Turn on different test light sources 42 and repeat steps S2.2 and S2.3.

[0109] S3: The active optical correction system corrects the secondary mirror (21) based on the wave aberration data measured in S2; and records the displacement and rotation angle of the secondary mirror (21) after correction;

[0110] S4: Compare the displacement and rotation angle of the secondary mirror (21) during simulated image quality degradation and during correction to determine the correction accuracy;

[0111] S5: Waveform aberration of the optical telescope field of view detected by the laser interferometer under the same position conditions as S1 after simulation correction;

[0112] S6: Compare the wave aberration values ​​of S1 and S5 to determine whether the corrected image quality reaches the image quality before correction. The working principle of this embodiment is as follows: A laser interferometer 1 is used to test the wavefront aberration data of the optical telescope before simulation correction, serving as a comparison basis for evaluating image quality. A multi-dimensional adjustment stage 22 mounted on the back of the secondary mirror 21 is used to change the position and angle of the secondary mirror 21, simulating a situation where optical elements shift or rotate, leading to a decrease in image quality. A test light source 42 emits test light towards the edge of the field of view, which is then reflected by the plane mirror 3 and the imaging system to the wavefront sensor 41. The wavefront sensor 41 detects the current wavefront aberration data, which reflects the image quality. By using multiple wavefront sensors 41 and test light sources 42 in conjunction, wavefront aberration data at different edge fields of view can be measured, more accurately reflecting the current image quality. The active optical correction system calculates the displacement of the optical element based on the wavefront aberration data measured after simulation using its algorithm, and then corrects the optical element based on the calculated result. After correction, the laser interferometer 1 tests the simulated wavefront aberration data at the same position as before simulation, and the two sets of wavefront aberration data are compared to evaluate the correction accuracy.

[0113] The beneficial effects of this embodiment are: by setting up multiple wavefront sensors and test light sources, the true data after the image quality deteriorates can be reflected more accurately, so that the active optical correction system can make accurate corrections to the imaging system based on this data.

[0114] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the implementation of the present invention. Those skilled in the art can make other variations or modifications based on the above description. It is neither necessary nor possible to exhaustively describe all embodiments here. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the scope of protection of the claims of the present invention.

Claims

1. A device for testing the calibration accuracy of an active optical correction system for a telescope, characterized in that, It includes a laser interferometer (1), a multi-dimensional adjustment stage (22), a plane mirror (3), and a wave aberration measurement assembly (4). The laser interferometer (1) is located outside the optical telescope and is used to emit detection light into the interior of the optical telescope to detect the wave aberration data of the field of view. The multidimensional adjustment stage (22) is located inside the optical telescope and is set on the back of the optical element. It is used to adjust the position and angle of the optical element to simulate the decline in the imaging quality of the optical telescope. The wave aberration measurement component (4) is set at the image plane of the optical telescope and is used to measure the wave aberration after the decline in the imaging quality of the optical telescope. The plane mirror (3) is set outside the telescope, and the reflecting surface of the plane mirror (3) is opposite to the direction of the test light reflected by the primary mirror (23) in the optical telescope. The testing method for the telescope active optical correction system calibration accuracy testing device includes the following steps: S1: Waveform aberration data of the field of view of the optical telescope are detected by laser interferometer (1); S2: Change the position and angle of the optical elements in the optical telescope to simulate the decrease in image quality of the optical telescope, record the displacement and rotation angle of the optical elements, and test the wave aberration data of different fields of view at the image plane position using different wavefront sensors (41). S3: The active optical correction system corrects the moving or rotating optical element in S2 based on the wave aberration data measured in S2, and records the displacement and rotation angle of the optical element correction. S4: Compare the displacement and rotation angle of the optical element during simulated image quality degradation with those during correction to determine the correction accuracy; S5: Waveform aberration of the optical telescope field of view detected by laser interferometer (1) under the same position conditions as S1; S6: Compare the aberration values ​​of S1 and S5 to determine whether the corrected image quality has reached the image quality before the simulated image quality degradation.

2. The device for testing the correction accuracy of a telescope active optical correction system according to claim 1, characterized in that, It also includes a clamping frame (5), and the wavefront aberration measurement component (4) includes a wavefront sensor (41) and a test light source (42); the clamping frame (5) is located at the image plane of the optical telescope, the wavefront sensor (41) is mounted on the clamping frame (5), and the wavefront sensor (41) corresponds to the edge field of view of the optical telescope; the test light source (42) is mounted next to the wavefront sensor (41), and the number of the wavefront sensor (41) and the test light source (42) is equal and at least three.

3. The device for testing the correction accuracy of a telescope active optical correction system according to claim 1, characterized in that, The optical element is a secondary mirror (21).

4. The device for testing the correction accuracy of a telescope active optical correction system according to claim 1, characterized in that, The multidimensional adjustment stage (22) is an H811.I2 / 12V type six-legged displacement stage.

5. The device for testing the correction accuracy of a telescope active optical correction system according to claim 1, characterized in that, The specific steps for detecting wavelet aberration in the current field of view of an optical telescope are as follows: S1.1: Detect wavefront aberration in the central field of view of an optical telescope; S1.2: Detect the wave aberrations of different fields of view of the optical telescope, excluding the central field of view.

6. The device for testing the correction accuracy of a telescope active optical correction system according to claim 5, characterized in that, S1.1 Detecting wavefront aberration in the central field of view of an optical telescope and S1.2 Detecting wavefront aberration in different fields of view of an optical telescope other than the central field of view are the specific steps as follows: S1.1.1: Place a laser interferometer (1) outside the optical telescope and record the position of the laser interferometer (1). Place a plane mirror (3) outside the telescope so that the reflecting surface of the plane mirror (3) is opposite to the direction of the test light reflected by the optical telescope. S1.1.2: The test light is emitted from the laser interferometer (1) towards the central field of view of the optical telescope, and the test light is reflected by the optical telescope to the plane mirror (3); S1.1.3: Adjust the angle of the plane mirror (3) to emit the test light to the optical telescope, and then reflect it to the laser interferometer (1) through the optical telescope, so that the test light emitted by the laser interferometer (1) and the test light received interfere with each other; S1.1.4: Measure the wavefront aberration at the central field of view using a laser interferometer (1) and record the wavefront aberration data; S1.2.1: Based on the position in S1.1.1, the laser interferometer (1) is translated to change its position in order to obtain different fields of view, and the position of the laser interferometer (1) is recorded; S1.2.2: The test light is emitted into the field of view of the optical telescope through the laser interferometer (1), and the test light is reflected to the plane mirror (3) by the optical telescope; S1.2.3: Adjust the angle of the plane mirror (3) and reflect the test light into the optical telescope, and then reflect it into the laser interferometer (1) through the optical telescope, so that the test light emitted by the laser interferometer and the test light received interfere with each other. S1.2.4: Test wavelet aberration data using a laser interferometer (1) and record the wavelet aberration data.

7. The device for testing the correction accuracy of a telescope active optical correction system according to claim 6, characterized in that, The laser interferometer (1) in S1.2.1 is changed at least three times to test wavefront aberrations under different fields of view.

8. The device for testing the correction accuracy of a telescope active optical correction system according to claim 1, characterized in that, Step S2 involves changing the position and angle of the optical elements in the optical telescope to simulate the image quality degradation of the optical telescope, recording the displacement and rotation angle of the optical elements, and testing the wavelet aberration data after the image quality degradation. S2.1: Adjust the angle or position of the optical elements in the optical telescope to simulate the situation where the image quality deteriorates due to the displacement or rotation of the optical elements; S2.2: Turn on a test light source (42) to emit test light to the optical telescope. The test light is reflected by the optical telescope to the plane mirror (3); S2.3: Adjust the angle of the plane mirror (3) to emit the test light to the optical telescope. The test light is reflected by the optical telescope to the wavefront sensor (41). The wavefront sensor (41) is used to test the wave aberration data in the current state. S2.4: Turn on different test light sources (42) and repeat steps S2.2 and S2.

3.

9. The device for testing the correction accuracy of a telescope active optical correction system according to claim 8, characterized in that, Step S2.1 Adjusting the angle or position of the optical elements in the optical telescope is specifically done by changing the position and angle of the optical elements through a multi-dimensional adjustment stage (22).

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