Chip aging detection system and method for a gateway product

Abstract

This invention relates to aging detection technology for communication equipment, and discloses a chip aging detection system and method for gateway products, solving the problems of low efficiency and incomplete functional testing in traditional aging detection technologies. The invention first constructs a chip aging detection system, which includes: an OLT device, an ODN network, a telephone recording box, an aging server, a power relay, and two serial port log collectors. Furthermore, based on the aforementioned chip aging detection system, the invention performs stress tests on chips such as DDR and FLASH through an aging detection program, tests parameter compatibility through relay power-off restart and REBOOT hot restart, and tests the stability and compatibility of voice chips through voice call diagnostic software. This allows for the early detection of faults in key chips of gateway products, as well as incompatibility issues with some chip parameters.

Description

Technical Field

[0001] This invention relates to aging detection technology for communication equipment, and more specifically to a chip aging detection system and method for gateway products. Background Technology

[0002] With the advent of the optical communication era, the number of optical network terminal devices, namely gateways, is increasing exponentially. However, after the production of several key components of each gateway product is completed, chip aging tests are required to prevent problems in gateway operation caused by chip failure or incompatibility with software. Therefore, chip aging tests are a necessary basic process.

[0003] Currently, manufacturers either use manual inspection or only perform power-on aging tests on the chips when carrying out this process. The former requires a large number of experienced workers and is relatively inefficient, and carries the risk of operational errors, while the latter cannot detect all potential risks of major chips. Summary of the Invention

[0004] The technical problem to be solved by this invention is to propose a chip aging detection system and method for gateway products, which solves the problems of low aging detection efficiency and incomplete functional detection in traditional technologies.

[0005] The technical solution adopted by the present invention to solve the above-mentioned technical problems is as follows:

[0006] On one hand, the present invention provides a chip aging test system for gateway products, used to perform aging test on the chip of the gateway under test. The system includes: an OLT device, an ODN network, a telephone recording box, an aging server, a power relay, and two serial port log collectors.

[0007] Two gateways under test (DUTs) are connected to the OLT device via an ODN network; the power inputs of the two DUTs are connected to the power relay via power lines; the control terminals of the power relays are connected to the aging server via network cables; the two DUTs are respectively connected to two corresponding serial log collectors via serial cables; the serial log collectors are connected to the aging server via USB data cables; the two DUTs are also respectively connected to the telephone recording box via telephone lines; the telephone recording box is connected to the aging server via USB data cables.

[0008] Furthermore, the aging server is equipped with an automatic power-on / off stress test tool, which is used to control the opening or closing of the power relay to supply power or cut off the gateway under test based on the set power-on time and cycle, so as to realize the power-off restart detection of the gateway; it is also used to set the relay to a stable power supply mode, and configure the aging test program running on the gateway to the functional test items corresponding to the REBOOT, DDR, FLASH, WiFi and BOSA chips, so as to detect whether the corresponding chips of the gateway are normal.

[0009] Furthermore, the aging server is equipped with voice call diagnostic software, which is used to control a telephone recording box to simulate the operation of a telephone, such as picking up the phone, dialing, ringing, talking, and hanging up, by using one of the two gateways under test as the calling device and the other as the called device, in order to detect whether the voice chip of the gateway is operating normally over a long period of time.

[0010] Furthermore, the aging detection program includes an aging detection boot program and an aging detection sub-function program;

[0011] The aging test boot program is preset when the image burning file is generated. It is used to detect and process USB flash drive insertion events, including USB flash drive boot aging test and updating the aging test subroutine.

[0012] The aging detection sub-function program includes DDR stress test, FLASH stress test, WiFi stress test and BOSA stress test detection programs, as well as REBOOT hot restart test program, used to detect chip parameter compatibility issues.

[0013] On the other hand, based on the above system, the present invention also provides a chip aging detection method for gateway products, comprising:

[0014] The gateway under test starts up and reads the aging configuration file;

[0015] After initiating the aging test process, perform aging tests and determine the results according to the parameters in the aging configuration file;

[0016] Record the test results.

[0017] Furthermore, the initiation of the aging detection process includes:

[0018] The aging test process is started by burning the aging test program into a fixed directory of the gateway under test;

[0019] Alternatively, when a USB drive is inserted into the gateway, the aging test bootloader detects that there is an aging test program on the USB drive and automatically copies it to a fixed directory on the gateway, then restarts the gateway to start the aging test process.

[0020] Furthermore, the contents of the aging configuration file include:

[0021] Aging detection subroutine and aging data storage path, total aging test run time;

[0022] Configure the aging detection subroutine script to ensure it executes only once or repeatedly at startup;

[0023] The aging detection subroutine test function configuration includes: FLASH random generation size, DDR memory allocation size, enable switch, and interval execution time;

[0024] The aging detection silent configuration includes silent interval and silent time.

[0025] Furthermore, the detection method also includes:

[0026] When the set silence interval is reached, the silence service sends a silence start event, monitors the test status of the subroutine test items, and ensures that each test item does not enter the next round of testing after completing the current round of testing. After all test items stop, it enters a silence wait. After the silence wait, the silence service sends a silence end event, and the aging test program listens and restarts the aging test.

[0027] Furthermore, the detection method also includes:

[0028] If the gateway is determined to have not been caused by a power outage or REBOOT after power-on, an abnormal status will be indicated by an LED, and the aging detection program will not perform any aging test items.

[0029] If any aging test item malfunctions during the aging test, all aging tests will be stopped, the results will be recorded, and the LEDs will flash to indicate the abnormal state.

[0030] Furthermore, the silence interval is the time from the start of the aging test to the start of silence after the test item is executed, or the time from the start of each test after the last silence is stopped to the next start of silence.

[0031] When the relay and reboot restart the system, the silent interval time is recalculated. If a USB flash drive is inserted during the test to update the aging configuration file or program, the silent interval time is recalculated after the aging test restarts.

[0032] The beneficial effects of this invention are:

[0033] The chip aging test system built by the present invention performs stress tests on chips such as DDR and FLASH through an aging test program, tests parameter compatibility through relay power-off restart and REBOOT hot restart, and tests the stability and compatibility of voice chips through voice call diagnostic software; it can detect the faults of key chips in gateway products in advance, as well as some chip parameter incompatibility phenomena. This solution has high aging test efficiency and wide test coverage. Attached Figure Description

[0034] Figure 1 This is a schematic diagram of the chip aging detection system in an embodiment of the present invention;

[0035] Figure 2 This is a flowchart of the image burning startup aging test in an embodiment of the present invention;

[0036] Figure 3 This is a flowchart of the USB flash drive boot aging test in an embodiment of the present invention. Detailed Implementation

[0037] This invention aims to propose a chip aging test system and method for gateway products, solving the problems of low efficiency and incomplete functional testing in traditional technologies. The invention first constructs a chip aging test system, which includes: an OLT device, an ODN network, a telephone recording box, an aging server, a power relay, and two serial port log collectors. Two gateways under test are connected to the OLT device via the ODN network; the power inputs of the two gateways under test are connected to the power relay via power lines; the control terminal of the power relay is connected to the aging server via a network cable; the two gateways under test are respectively connected to two corresponding serial port log collectors via serial lines; the serial port log collectors are connected to the aging server via USB data cables; the two gateways under test are also respectively connected to the telephone recording box via telephone lines; the telephone recording box is connected to the aging server via USB data cables.

[0038] Furthermore, the chip aging detection system built by the present invention performs stress tests on chips such as DDR and FLASH through an aging detection program, tests parameter compatibility through relay power-off restart and REBOOT hot restart, and tests the stability and compatibility of voice chips through voice call diagnostic software; it can detect the faults of key chips in gateway products in advance, as well as some chip parameter incompatibility phenomena.

[0039] Example:

[0040] like Figure 1 As shown, the chip aging detection system in this embodiment includes an OLT (Optical Line Terminal) device, an ODN (Optical Distribution Network), a telephone recording box, an aging server, a power relay, and two serial port log collectors.

[0041] Connect the gateway to the OLT via the ODN network; power the gateway by connecting it to the relay via a power cord, and then connect the relay control port to the aging test server via a network cable; connect the gateway to the serial log collector via a serial cable, and connect the collector to the aging server via a USB data cable; connect the gateway to the telephone recording box via a telephone line, and connect the telephone recording box to the aging test server via a USB data cable.

[0042] The automatic power-on / off stress test tool on the aging test server is used to set the power-on time and cycle, and then control the opening and closing of the relay circuit to power on or power off the gateway, thereby realizing the gateway's power-off restart test. It is also used to set the relay to a stable power supply mode, and configure the aging test program running on the gateway to perform functional tests corresponding to the REBOOT, DDR, FLASH, WiFi, and BOSA chips, to detect whether there are any problems with the corresponding chips in the gateway.

[0043] The voice call diagnostic software on the aging test server controls a telephone recording box, using one gateway as the calling device and another gateway as the called device, to simulate the operations of a telephone such as picking up the phone, dialing, ringing, talking, and hanging up, in order to detect whether the gateway's voice chip is operating normally over a long period of time.

[0044] Based on the above system, the chip aging detection method for gateway products implemented in this embodiment includes:

[0045] The gateway under test starts up and reads the aging configuration file;

[0046] After initiating the aging test process, perform aging tests and determine the results according to the parameters in the aging configuration file;

[0047] Record the test results.

[0048] Specifically, the aging test program for gateway products consists of two parts: the aging test boot program and the aging test sub-function program.

[0049] The aging test bootloader is pre-installed when the image burning file is generated. The main function of this program is to detect and handle USB flash drive insertion events, such as USB flash drive boot aging test and updating the aging test subroutine.

[0050] The aging test sub-program mainly includes chip testing programs such as DDR stress test, FLASH stress test, WiFi stress test and BOSA stress test; it also includes a REBOOT hot restart test program to detect chip parameter compatibility issues.

[0051] Before performing aging tests, the aging detection subroutine must first read the aging configuration file to obtain the configuration information corresponding to each subroutine. During execution, it uses the parameter information to perform aging tests and determine the results. The subroutine's content includes:

[0052] Aging detection subroutine and aging data storage path, total aging test run time, etc.;

[0053] Configure the aging detection subroutine script to execute only once or repeatedly at startup.

[0054] The aging detection subroutine test function configuration includes FLASH random generation size, DDR memory allocation size, enable switch, interval execution time, etc.

[0055] This embodiment also includes an aging detection silent mechanism, which users can configure for the silent interval and silent time.

[0056] The silent mechanism simulates the scenario where live network users rest and wait after using the network for a period of time. It determines whether to enable the silent mechanism, the silent interval, and the silent duration based on the configuration file. The silent interval is the time from the start of the aging test to the activation of silent mode, or the time from the restart of tests after the last silent mode stop to the next activation of silent mode. The silent interval is recalculated after a relay or reboot. If a USB drive is inserted during the test to update the aging configuration file or program, the silent interval is recalculated upon restarting the aging test.

[0057] Once the set silence interval is reached, the silence service issues a silence start event, monitors the test status of the subroutine test items, and ensures that after each test item completes its current round of testing, it does not proceed to the next round of testing. It waits for all test items to stop before entering a silent waiting state (except for relay restarts).

[0058] After a period of silent waiting, the silent service sends a silent end event, which the aging test program listens for and then restarts the aging test.

[0059] In this embodiment, there are two ways to initiate the aging test process:

[0060] (1) Image burning aging test:

[0061] When creating the image burning file, place the aging test program in a fixed directory. The startup script reads the configuration parameters from the configuration file to execute the corresponding aging test program, such as... Figure 2 As shown.

[0062] (2) USB flash drive boot aging test:

[0063] After the gateway starts running, when a USB drive is inserted into the gateway, the aging test bootloader detects the aging test program on the USB drive, automatically copies it to the gateway's fixed directory, and then restarts the gateway to execute the aging test. Figure 3 As shown.

[0064] After the gateway is powered on, if the reason for the last restart is not a power outage or REBOOT, the LED light indicates an abnormal state, and the aging test program does not execute any test items.

[0065] During testing, if any test item malfunctions, all tests are stopped, the results are recorded, and the LED flashes according to the defined abnormal state. After restarting, the LED continues to flash according to the previous execution result to indicate the fault, and no further tests are executed. The aging test includes the following four test items:

[0066] DDR aging stress test, FLASH aging stress test, WiFi aging stress test and BOSA aging stress test.

[0067] If the aging test results are abnormal, the cause of the fault will be investigated and analyzed according to the recorded fault log, and then a new round of aging test will be carried out.

[0068] After completing the aging test, the gateway aging test program needs to save the test results. The aging test results and the test fault logs of the aging sub-functions are saved to a designated directory. If there are problems with the aging test results, the hardware faults are further investigated based on the error information in the fault logs. The LED lights on the gateway during and at the end of the aging test are used to display the test results for each step of the aging test.

[0069] Finally, it should be noted that the above embodiments are merely preferred embodiments and are not intended to limit the present invention. It should be pointed out that those skilled in the art can make various modifications, equivalent substitutions, and improvements without departing from the spirit and scope of the claims, and all such modifications, substitutions, and improvements should be included within the scope of protection of the present invention.

Claims

1. A chip aging test system for a gateway product, used to perform aging test on the chip of the gateway under test, characterized in that, The system comprises an OLT device, an ODN network, a telephone recording box, an aging server, a power supply relay and two serial port log collectors; Two to-be-tested gateways are connected to the OLT device through the ODN network; power supply inputs of the two to-be-tested gateways are connected to the power supply relay through power supply lines; a control end of the power supply relay is connected to the aging server through a network cable; the two to-be-tested gateways are respectively connected to the two serial port log collectors through serial port lines; the serial port log collectors are connected to the aging server through USB data lines; the two to-be-tested gateways are respectively connected to the telephone recording box through telephone lines; and the telephone recording box is connected to the aging server through a USB data line. The aging server is provided with an automatic power-on and power-off pressure test tool, which is used to control the opening or closing of the power supply relay to supply power or cut off power to the to-be-tested gateway based on the set power-on time and period, so as to realize the power-off restart detection of the gateway; the tool is also used to set the relay to a stable power supply mode, and configure the function test items corresponding to the REBOOT, DDR, FLASH, WiFi and BOSA chips based on the aging detection program running on the gateway, to detect whether the corresponding chips of the gateway are normal.

2. The chip aging detection system of a gateway product according to claim 1, wherein the aging server is provided with a voice call diagnosis software, which is used to detect whether the voice chip of the gateway is normal by controlling the telephone recording box to take one of the two to-be-tested gateways as a calling device and the other as a called device, and simulate the off-hook, dialing, ringing, calling and hang-up operations of a telephone set.

3. The chip aging detection system of a gateway product according to claim 1 or 2, wherein the aging detection program comprises an aging detection boot program and an aging detection sub-function program; The aging detection boot program is preset when generating an image burning file, and is used to detect the processing of a U disk insertion event, including U disk start of aging detection and updating of the aging detection sub-program; The aging detection sub-function program comprises DDR pressure test, FLASH pressure test, WiFi pressure test and BOSA pressure test detection programs and a REBOOT hot restart test program, and is used to detect chip parameter compatibility problems. The method comprises: The to-be-tested gateway is started, and an aging configuration file is read; 4. The chip aging detection method of the gateway product, applied to the chip aging detection system of the gateway product as claimed in any one of claims 1-3, characterized in that, After starting the aging detection process, the aging test and result judgment are performed according to the parameters in the aging configuration file; The detection result is recorded.

5. The chip aging detection method of a gateway product according to claim 4, wherein the starting of the aging detection process comprises: The aging detection process is started by the aging detection program burned in a fixed directory of the to-be-tested gateway; Or, when a U disk is inserted into the gateway, the aging detection boot program detects that there is an aging test program in the U disk and automatically copies the program to the fixed directory of the gateway, and then the gateway is restarted to start the aging detection process.

6. The chip aging detection method of a gateway product according to claim 4, wherein the content of the aging configuration file comprises: ​ ​ ​ ​ aging detection subprogram and aging data storage path, aging test running total time; aging detection subprogram configuration script startup whether only once or repeated execution; aging detection subprogram test function configuration, including: FLASH random generation size, DDR application memory size, enable switch, interval execution time; aging detection mute configuration, including mute interval time and mute time.

7. The chip aging detection method of a gateway product according to claim 4, characterized in that, the detection method further comprises: when the set mute interval is reached, the mute service sends a mute start event, the monitoring subprogram tests the test state, and after each test item completes the current round of testing, it does not enter the next round of testing, waits for all test items to stop, and then enters a mute waiting state, after the mute waiting state, the mute service sends a mute end event, and the aging test program listens and then restarts the aging test.

8. The chip aging detection method of a gateway product according to claim 4, characterized in that, the detection method further comprises: if it is determined that the last reboot was not caused by power failure or REBOOT after the gateway is started, the LED light indicates an abnormal state, and the aging detection program does not execute any aging test item; during the aging test, if any aging test item appears abnormal, all aging test items are stopped, the execution result is recorded, and the LED light flashes according to the abnormal state definition.

9. The chip aging detection method of a gateway product according to claim 6 or 7, characterized in that, the mute interval time is the time from the start of the test item to the start of the mute after the start of the aging test, or the time from the start of the execution of each test item to the start of the next mute after the last mute is stopped; after the relay and reboot restart the startup, the mute interval time is restarted; when a U disk is inserted during the test to update the aging configuration file or program, the aging test is restarted, and the mute interval time is restarted.

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