A high-temperature temperature field detection device based on a Savart prism static interference imaging type

Abstract

The application belongs to the technical field of temperature field detection, and particularly relates to a high-temperature temperature field detection device based on a Savart prism static interference imaging type, which comprises a target light converging part, a reflector, an interference imaging part and a common imaging part. The reflector is arranged on the light path direction of the target light converging part. A slit is arranged in the middle of the reflector. The interference imaging part is arranged on the transmission light path of the slit of the reflector. The common imaging part is arranged on the reflection light path of the reflector. The application has the advantages of quick response, wide measurement temperature range, high precision and the like by means of the Savart prism light splitting and then interference on the detector. The application establishes the relationship between the temperature and the lowest point of the interference signal according to the distribution difference of the lowest point of the interference signal at different temperatures, so that the spectral measurement process of non-contact passive temperature measurement is omitted, and the response process is faster.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of temperature field detection, and particularly relates to a high-temperature temperature field detection device based on a Savart prism static interference imaging type. BACKGROUND

[0002] With the development of aerospace technology, higher requirements are put forward for engine performance. However, the engine combustion flame has the characteristics of high temperature, non-stability, strong radiation and the like, which leads to uneven and drastic changes of the temperature field distribution, and complex and harsh working conditions put forward higher requirements for accurate measurement of the engine combustion flame temperature. Therefore, fine testing of the combustion explosion temperature field has important significance for the new generation of aerospace technology, especially the measurement of the temperature field. The combustion explosion temperature is an important factor for reflecting the size of propellant capacity, and can guide the engine structure design. At present, the high-temperature temperature measurement methods mainly include contact type and non-contact type. In the contact type temperature measurement, thermocouples are most commonly used, but the contact type will interfere with the combustion flow field and has limited measurement range, and is not suitable for transient temperature measurement. The non-contact temperature measurement mainly includes active and passive types. The active type mainly has laser spectrum combustion flame temperature measurement technology, but cannot meet the complex working conditions. The passive temperature measurement mainly has atomic emission spectrum technology and radiation imaging spectrum technology, but both need to measure the spectrum, and the measurement accuracy is related to the spectral resolution. SUMMARY

[0003] In view of the above technical problems of low high-temperature measurement accuracy, limited measurement range and long measurement response time, the application provides a high-temperature temperature field detection device based on a Savart prism static interference imaging type, which utilizes Savart prism spectrometer, and then interferes on the detector. The optical path difference at the lowest intensity of the interference signal under different temperatures has a large degree of distinction, and has the advantages of fast response, wide measurement temperature range, high precision and the like.

[0004] In order to solve the above technical problems, the technical scheme adopted by the application is as follows:

[0005] A high-temperature temperature field detection device based on a Savart prism static interference imaging type, comprising a target light converging part, a reflector, an interference imaging part and a general imaging part. The reflector is arranged in the light path direction of the target light converging part. A slit is arranged in the middle of the reflector. The interference imaging part is arranged on the transmission light path of the slit of the reflector. The general imaging part is arranged on the reflection light path of the reflector.

[0006] The target light converging part comprises a measured high-temperature target and a pre-imaging lens. The pre-imaging lens is arranged in the light path direction of the measured high-temperature target. The reflector is arranged in the light path direction of the pre-imaging lens.

[0007] The interference imaging part comprises a first polarizer, a Savart prism, a second polarizer, a first rear imaging lens, a cylindrical lens and a first area array detector CCD, the first polarizer is arranged on the transmission light path of the mirror slit, the Savart prism is arranged on the light path direction of the first polarizer, the second polarizer is arranged on the light path direction of the Savart prism, and the first rear imaging lens is arranged on the light path direction of the second polarizer.

[0008] The cylindrical lens is arranged on the light path direction of the first rear imaging lens, and the first area array detector CCD is arranged on the light path direction of the cylindrical lens.

[0009] The first polarizer is a 0° polarizer, and the second polarizer is a 90° polarizer.

[0010] The ordinary imaging part comprises a second rear imaging lens and a second area array detector CCD, the second rear imaging lens is arranged on the reflection light path of the mirror, and the second area array detector CCD is arranged on the reflection light path of the second rear imaging lens.

[0011] The first area array detector CCD and the second area array detector CCD are both Sony IMX547-AAMJ area array detectors, the material of the Savart prism is quartz, and the single-plate thickness of the Savart prism is 3.46 mm.

[0012] A detection method of a Savart prism static interference imaging type high-temperature temperature field detection device, comprising the following steps:

[0013] S1, the measured high-temperature target light passes through the front imaging lens along the z-axis, and the target image is imaged on the mirror with a slit;

[0014] S2, the target image at the mirror slit passes through the first polarizer, the Savart prism, the second polarizer and the first rear imaging lens in turn, and the interference image of the corresponding target at the slit is imaged on the first area array detector CCD;

[0015] S3, the interference signal is gathered on the first area array detector CCD by the cylindrical lens, and the x-direction of the first area array detector CCD image is the spatial x-dimension information of the measured high-temperature target;

[0016] S4, the y-direction of the first area array detector CCD image is the intensity of the different optical path difference AL interference signals, the positions of the lowest points of the interference signals corresponding to different temperatures are different, and high-temperature measurement is carried out according to the principle, and two-dimensional temperature field imaging is realized by scanning the target in the y-direction.

[0017] S5, the Savart prism is inclined, so that the zero optical path difference position of the interference signal is at the edge of the first area array detector CCD, so that the minimum point of the interference signal can fully utilize the first area array detector CCD pixels;

[0018] S6, the light reflected by the mirror is imaged on the second area array detector CCD through the second rear imaging lens, the imaging of the second area array detector CCD corresponds to the target and the imaging of the first area array detector CCD is complementary and coaxial, and the position of the temperature measurement corresponding target of the first area array detector CCD is determined according to the imaging image of the second area array detector CCD.

[0019] Compared with the prior art, the present application has the beneficial effects that:

[0020] The present application has the advantages of fast response, wide measurement temperature range, high precision, etc. by using the Savart prism to split light and then interfere on the detector. And the present application establishes the relationship between temperature and the lowest point of the interference signal according to the distribution difference of the lowest point of the interference signal at different temperatures, so that the spectral measurement process of non-contact passive temperature measurement is saved, and the response process is faster. The present application uses the Savart prism to realize the static interference type high temperature temperature field imaging detection method, which has a wider application prospect and better temperature resolution than the traditional high temperature temperature measurement. BRIEF DESCRIPTION OF DRAWINGS

[0021] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the following embodiment or prior art description will be briefly introduced. Obviously, the drawings in the following description are only exemplary, and those skilled in the art can also obtain other implementation drawings according to the provided drawings without creating labor.

[0022] The structures, proportions, sizes, etc. shown in the specification are only used to cooperate with the content disclosed in the specification, so that those skilled in the art can understand and read, and are not used to limit the implementation conditions of the present application, so they do not have technical significance. Any modification of structure, change of proportion relationship or adjustment of size, without affecting the effect and purpose of the present application, should still fall within the scope of the technical content disclosed by the present application.

[0023] Figure 1 The whole structure of the present application is shown in the figure;

[0024] Figure 2 The optical path diagram of the Savart prism static interference temperature field detection of the present application is shown in the figure;

[0025] Figure 3The normalized interference signal diagram of the high-temperature blackbody or greybody radiation theorem at different temperatures of the present application;

[0026] Figure 4 The comparison diagram of the measured obtained temperature and the original incident temperature of the present application;

[0027] Figure 5 The comparison diagram of the simulated temperature and the actual temperature and the relative error diagram of the system of the present application.

[0028] Wherein, 1 is a converging target light part, 101 is a measured high-temperature target, 102 is a front imaging lens, 2 is a reflecting mirror, 3 is an interference imaging part, 301 is a first polarizer, 302 is a Savart prism, 303 is a second polarizer, 304 is a first rear imaging lens, 305 is a cylindrical mirror, 306 is a first area array detector CCD, 4 is a common imaging part, 401 is a second rear imaging lens, and 402 is a second area array detector CCD. DETAILED DESCRIPTION

[0029] In order to make the purpose, technical scheme and advantages of the embodiments of the present application more clear, the technical scheme in the embodiments of the present application will be clearly and completely described below. Obviously, the described embodiments are only some of the embodiments of the present application, but not all the embodiments. These descriptions are only for further explaining the features and advantages of the present application, but not for limiting the claims of the present application. Based on the embodiments in the present application, all the other embodiments obtained by those skilled in the art without creative work are within the protection scope of the present application.

[0030] The specific embodiments of the present application will be further described in detail below in combination with the drawings and embodiments. The following embodiments are used to illustrate the present application, but not to limit the scope of the present application.

[0031] The terms "first", "second" are only used for description purpose, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined with "first", "second" can explicitly or implicitly include one or more features. In the description of the present application, the meaning of "multiple" is two or more, unless otherwise specified.

[0032] In the description of the present application, it should be noted that, unless otherwise explicitly specified and limited, the terms "mounting", "connection" and "connecting" should be understood in a broad sense, for example, it can be fixed connection, or detachable connection, or integral connection; it can be mechanical connection, or electrical connection; it can be direct connection, or indirect connection through intermediate medium, or internal communication of two elements. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0033] In the embodiment, as shown in Figure 1 , Figure 2 , the light of the measured high-temperature target 101 passes through the front imaging lens 102 along the z-axis to form an image of the target on the mirror 2 with a slit; the image of the target at the slit of the mirror 2 passes through the first polarizer 301, the Savart prism 302, the second polarizer 303, and the first rear imaging lens 304 in turn to form a second image of the interference image of the target at the slit on the first area-array detector CCD 306, that is, the first area-array detector CCD 306 is just at the image plane of the first rear imaging lens 304 (with a distance of f1), and the interference signal is collected on the first area-array detector CCD 306 by the cylindrical lens 305, while the first area-array detector CCD 306 is also at the focal plane of the combined lens of the first rear imaging lens 304 and the cylindrical lens 305 (with an equivalent focal length of f2), and it can be seen that the x-direction of the image of the first area-array detector CCD 306 is the spatial x-dimension information of the measured high-temperature target, and the y-direction of the image of the first area-array detector CCD 306 is the intensity of the interference signal with different optical path differences ΔL, and the position of the lowest point of the interference signal corresponding to different temperatures is different, and the high-temperature temperature measurement is performed according to the principle, and the two-dimensional temperature field imaging is realized by scanning the target in the y-direction, wherein the Savart prism 302 is inclined so that the zero optical path difference position of the interference signal is at the edge of the first area-array detector CCD 306, so that the lowest point of the interference signal can fully utilize the pixels of the first area-array detector CCD 306; the light reflected by the mirror 2 is imaged on the second area-array detector CCD 402 by the second rear imaging lens 401, and it can be seen that the imaging of the second area-array detector CCD 402 corresponds to the target which is just complementary to the target imaged by the first area-array detector CCD 306 and coaxial, so that the position of the target corresponding to the temperature measurement of the first area-array detector CCD 306 is determined according to the image of the second area-array detector CCD 402.

[0034] In the embodiment, as shown in Figure 3 , the normalized interference signal images of different high-temperature blackbody or graybody radiation laws at different temperatures are shown, and it can be seen from the figure that the optical path difference at the lowest point of the interference signal intensity is different at different temperatures. In combination with the optical system and the pixel size of the first area-array detector CCD 306, the relationship between the pixel position corresponding to the lowest interference signal intensity Imin and the temperature T of the measured target can be obtained. Therefore, the temperature field range of the present application is wide.

[0035] In the embodiment, as shown in Figure 4 , the comparison chart of the measured temperature and the original incident temperature is shown, wherein the dotted curve shows that the measured temperature field interference image is brought into the fitting function to obtain the temperature at different positions by inversion; and the * curve shows the actual incident temperature.

[0036] In the present embodiment, Figure 5 The comparison chart of system simulation temperature and actual temperature and the relative error image are shown, and it can be seen that the measuring precision of the present application is high.

[0037] Further, the first area array detector CCD 306 and the second area array detector CCD 402 both adopt Sony IMX547-AAMJ area array detectors, the resolution can reach 2472*2064, and the pixel size is 2.74 mu m; according to the principle of the present application, the area array detector is arranged to detect the light path difference in the range of 200 nm-650 nm. Figure 3 It can be known that the minimum point of the interference signal of the 1000K-5000K high-temperature target is related to the light path difference Delta L min In 300 nm-500 nm, but in order to find the minimum interference light intensity according to the front and rear light path difference (such as Figure 3 ), the area array detector is designed to detect the light path difference in the range of 200 nm-650 nm. According to the spectral range, the Savart prism 302 is selected to be quartz, n o =1.55335, n e =1.54424, f2=300 mm, the maximum light path difference Delta L max =650 nm, according to the size of the area array detector and the light path difference requirement, x max =6.77 mm, the above parameters are brought into the light path difference relationship formula, and the single plate thickness t of the Savart prism 302 is 3.46 mm. Preferably, the first polarizer 301 adopts a 0° polarizer, and the second polarizer 303 adopts a 90° polarizer.

[0038] The above only details the preferred embodiment of the present application, but the present application is not limited to the above-mentioned embodiment, and various changes can be made within the knowledge of those skilled in the art without departing from the purpose of the present application, and various changes should be included in the protection scope of the present application.

Claims

1. A high-temperature temperature field detection device based on a Savart prism static interference imaging type, characterized by: It comprises a converging target light part (1), a mirror (2), an interference imaging part (3) and a common imaging part (4), the mirror (2) is arranged in the light path direction of the converging target light part (1), a slit is arranged in the middle of the mirror (2), the interference imaging part (3) is arranged on the transmission light path of the slit of the mirror (2), and the common imaging part (4) is arranged on the reflection light path of the mirror (2); the interference imaging part (3) comprises a first polarizer (301), a Savart prism (302), a second polarizer (303), a first rear imaging lens (304), a cylindrical mirror (305) and a first area array detector CCD (306), the first polarizer (301) is arranged on the transmission light path of the slit of the mirror (2), the Savart prism (302) is arranged in the light path direction of the first polarizer (301), the second polarizer (303) is arranged in the light path direction of the Savart prism (302), and the first rear imaging lens (304) is arranged in the light path direction of the second polarizer (303); the cylindrical mirror (305) is arranged in the light path direction of the first rear imaging lens (304), and the first area array detector CCD (306) is arranged in the light path direction of the cylindrical mirror (305).

2. The high-temperature temperature field detection device based on the Savart prism static interference imaging type according to claim 1, characterized in that: The converging target light part (1) comprises a measured high-temperature target (101) and a front imaging lens (102), the front imaging lens (102) is arranged in the light path direction of the measured high-temperature target (101), and the mirror (2) is arranged in the light path direction of the front imaging lens (102).

3. The high temperature temperature field detection device based on Savart prism static interference imaging type according to claim 1, characterized in that: The first polarizer (301) is a 0° polarizer, and the second polarizer (303) is a 90° polarizer.

4. The high temperature temperature field detection device based on Savart prism static interference imaging type according to claim 1, characterized in that: The common imaging part (4) comprises a second rear imaging lens (401) and a second area array detector CCD (402), the second rear imaging lens (401) is arranged on the reflection light path of the mirror (2), and the second area array detector CCD (402) is arranged on the reflection light path of the second rear imaging lens (401).

5. The high temperature temperature field detection device based on Savart prism static interference imaging type according to claim 4, characterized in that: The first area array detector CCD (306) and the second area array detector CCD (402) are both Sony IMX547-AAMJ area array detectors, the material of the Savart prism (302) is quartz, and the single-plate thickness of the Savart prism (302) is 3.46 mm.

6. A detection method of a high-temperature temperature field detection device based on a Savart prism static interference imaging type according to any one of claims 1-5, characterized in that: It comprises the following steps: S1, the measured high-temperature target light passes through the front imaging lens along the z axis, and the target image is imaged on the mirror with a slit; S2, the target image at the slit of the mirror passes through the first polarizer, the Savart prism, the second polarizer and the first rear imaging lens in sequence, and the interference image of the corresponding target at the slit is imaged on the first area array detector CCD for the second time; S3, the interference signal is gathered on the first area array detector CCD by the cylindrical mirror, and the image x direction of the first area array detector CCD is the spatial x dimension information of the measured high-temperature target. S4, the other y direction of the first area array detector CCD image is the intensity of the interference signal with different optical path difference AL, the position of the lowest interference signal corresponding to different temperature is different, thus the high temperature measurement is carried out, and the two-dimensional temperature field imaging is realized through the scanning of the target y direction; S5, the Savart prism is tilted, so that the zero optical path difference position of the interference signal is at the edge of the first area array detector CCD, and the lowest point of the interference signal can be fully utilized the first area array detector CCD pixel; S6, the light reflected by the mirror is imaged on the second area array detector CCD through the second rear imaging lens, the imaging of the second area array detector CCD corresponds to the complementary and coaxial target of the imaging of the first area array detector CCD, and the position of the target corresponding to the temperature measurement of the first area array detector CCD is determined according to the imaging image of the second area array detector CCD.

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