TIS fast testing method based on modified algorithm

Abstract

The present invention discloses a TIS fast testing method based on a correction algorithm, comprising the following steps: obtaining the EIRP value of an antenna probe; a terminal calculating an estimated EIS value of the antenna probe using the obtained EIRP value of the antenna probe, and obtaining the final EIS value of the first antenna according to the EIS1 test; an instrument testing the estimated EIS value of the first antenna sent by the antenna probe to obtain a terminal feedback bit error rate, and obtain the final EIS value of the first antenna; compensating to obtain estimated EIS value data closer to the actual EIS according to the difference between the final EIS value of the first antenna probe and EIS1; and obtaining the final TIS by spherical integration and averaging the EIS of each antenna probe. The present invention first tests the EIS value of the first antenna probe, and estimates all antenna probes according to the difference between the estimated EIS value of the first antenna probe and the actual EIS value, thereby reducing the number of bit error rate tests, improving test efficiency, and increasing the test speed of TIS in OTA testing.

Description

Technical Field

[0001] The present invention belongs to the technical field of terminal testing, and in particular relates to a TIS fast testing method based on a correction algorithm. Background Art

[0002] The traditional TIS testing process is as follows: 1. After the terminal and instrument establish a connection through the antenna probe, the EIS value of each antenna probe is first tested. 2. The EIS values ​​of each antenna probe are then integrated over the spherical area and averaged. Due to the lack of more accurate EIS values, 3. The EIS value of each antenna probe is tested as follows: the instrument sends a large power level through the antenna probe, and the terminal feedbacks the bit error rate. 4. Depending on the bit error rate, the instrument lowers or raises the power level and sends it back to the terminal through the antenna probe. After five to six steps of lowering and raising the power level, the terminal obtains a power level that just meets the bit error rate, which serves as the final EIS value for the antenna probe. 5. In these five to six steps, the bit error rate is obtained at each test step. This results in a long test time and slow test speed for each antenna probe's EIS value, and ultimately, a long test time and slow test speed for the TIS. Summary of the Invention

[0003] The purpose of the present invention is to provide a TIS fast testing method based on a correction algorithm. By first testing the EIS value of the first antenna probe, all antenna probes are estimated according to the difference between the estimated EIS value and the actual EIS value of the first antenna probe, thereby reducing the number of test bit error rates, improving test efficiency, and increasing the test speed of TIS in OTA testing.

[0004] To solve the above technical problems, the present invention is achieved through the following technical solutions:

[0005] The present invention is a TIS rapid testing method based on a correction algorithm, comprising the following steps:

[0006] Stp1. Get the EIRP value of the antenna probe;

[0007] The meter and the terminal are connected through antenna probes and then tested to obtain the EIRP value of each antenna probe;

[0008] Stp2, estimate the EIS value of the antenna probe;

[0009] The terminal calculates the estimated EIS value of the antenna probe, namely EIS1, based on the obtained EIRP value of the antenna probe. The calculation formula is as follows:

[0010] EIS1=EIRP-P+S-Et+Er;

[0011] Among them, the conducted transmit power P, the conducted receive sensitivity S, the antenna transmit frequency band efficiency Et, and the receive frequency band efficiency Er;

[0012] Step 3: Get the final EIS value of the first antenna based on the EIS1 test;

[0013] The instrument sends the estimated EIS value of the first antenna through the antenna probe, which is the level value of EIS1. The test obtains the bit error rate fed back by the terminal. Then, based on the bit error rate, the level is lowered or raised until the terminal feedback level meets the bit error rate. This is the final EIS value of the first antenna.

[0014] Step 4: Further correct the estimated EIS value of each antenna probe;

[0015] According to the difference between the final EIS value of the first antenna probe and EIS1, further compensation is performed to obtain estimated EIS value data that is closer to the actual EIS, namely EIS2 for each antenna probe;

[0016] Step 5: Get the EIS of each antenna based on the EIS2 test.

[0017] The instrument sends the estimated EIS value of each antenna probe through the antenna probe, that is, the level of EIS2, and the test obtains the terminal feedback bit error rate. Then, the level is lowered or raised according to the bit error rate until the terminal feedback level value meets the bit error rate. This is the EIS value of the first antenna.

[0018] Stp6, get TIS;

[0019] The final TIS is obtained by spherical integration and averaging based on the EIS of each antenna probe.

[0020] Furthermore, the terminal device adopts a computer or a single chip microcomputer.

[0021] The present invention has the following beneficial effects:

[0022] The present invention first tests the EIS value of the first antenna probe and estimates all antenna probes based on the difference between the estimated EIS value and the actual EIS value of the first antenna probe, thereby reducing the number of test bit error rates, improving test efficiency, and increasing the test speed of TIS in OTA testing.

[0023] Of course, any product implementing the present invention does not necessarily need to achieve all of the advantages described above at the same time. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for describing the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0025] Figure 1 Flowchart of the TIS rapid testing method based on the correction algorithm. DETAILED DESCRIPTION

[0026] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making any creative efforts shall fall within the scope of protection of the present invention.

[0027] See also Figure 1 As shown, the present invention is a TIS fast testing method based on a correction algorithm, comprising the following steps:

[0028] Stp1. Get the EIRP value of the antenna probe;

[0029] The meter and the terminal are connected through antenna probes and then tested to obtain the EIRP value of each antenna probe. The time to test the EIRP value of each antenna probe is only less than one-tenth of the time to obtain the bit error rate of each test.

[0030] Stp2, estimate the EIS value of the antenna probe;

[0031] The terminal calculates the estimated EIS value of the antenna probe, namely EIS1, based on the obtained EIRP value of the antenna probe. The calculation formula is as follows:

[0032] EIS1=EIRP-P+S-Et+Er;

[0033] Among them, the conducted transmit power P, the conducted receive sensitivity S, the antenna transmit frequency band efficiency Et, and the receive frequency band efficiency Er;

[0034] Step 3: Get the final EIS value of the first antenna based on the EIS1 test;

[0035] The instrument uses the antenna probe to send the estimated EIS value of the first antenna, which is the level value of EIS1. The test obtains the bit error rate fed back by the terminal. Based on the bit error rate, the level is lowered or raised until the terminal feedback level meets the bit error rate. This is the final EIS value of the first antenna. Because the estimated EIS is more consistent with the actual EIS, generally only four bit error rate tests are required.

[0036] Step 4: Further correct the estimated EIS value of each antenna probe;

[0037] According to the difference between the final EIS value of the first antenna probe and EIS1, further compensation is performed to obtain estimated EIS value data that is closer to the actual EIS, namely EIS2 for each antenna probe;

[0038] Step 5: Get the EIS of each antenna based on the EIS2 test.

[0039] The instrument sends the estimated EIS value of each antenna probe through the antenna probe, that is, the level of EIS2, and tests the terminal feedback bit error rate. Then, according to the bit error rate, the level is lowered or raised until the terminal feedback level value meets the bit error rate, which is the EIS value of the first antenna. Generally, only three bit error rate tests are required, and each antenna probe reduces the bit error rate test time by 2-3 times.

[0040] Stp6, get TIS;

[0041] The final TIS is obtained by spherical integration and averaging based on the EIS of each antenna probe.

[0042] Among them, the terminal equipment adopts a computer or a single-chip microcomputer.

[0043] Throughout this specification, references to terms such as "one embodiment," "example," or "specific example" indicate that the specific features, structures, materials, or characteristics described in conjunction with that embodiment or example are included in at least one embodiment or example of the present invention. In this specification, schematic representations of these terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0044] The preferred embodiments of the present invention disclosed above are intended only to help illustrate the present invention. These preferred embodiments do not exhaustively describe all details, nor do they limit the present invention to the specific embodiments described. Obviously, many modifications and variations are possible based on the content of this specification. These embodiments are selected and described in detail in this specification to better explain the principles and practical applications of the present invention, thereby enabling those skilled in the art to better understand and utilize the present invention. The present invention is limited only by the claims and their full scope and equivalents.

Claims

1. A TIS rapid testing method based on a modified algorithm, characterized in that: The following steps are involved: Stp1. Get the EIRP value of the antenna probe; The meter and the terminal are connected through antenna probes and then tested to obtain the EIRP value of each antenna probe; Stp2, estimate the EIS value of the antenna probe; The terminal calculates the estimated EIS value of the antenna probe, namely EIS1, based on the obtained EIRP value of the antenna probe. The calculation formula is as follows: EIS1=EIRP-P+S-Et+Er; Among them, the conducted transmit power P, the conducted receive sensitivity S, the antenna transmit frequency band efficiency Et, and the receive frequency band efficiency Er; Step 3: Get the final EIS value of the first antenna based on the EIS1 test; The instrument sends the estimated EIS value of the first antenna through the antenna probe, which is the level value of EIS1. The test obtains the bit error rate fed back by the terminal. Then, based on the bit error rate, the level is lowered or raised until the terminal feedback level meets the bit error rate. This is the final EIS value of the first antenna. Step 4: Further correct the estimated EIS value of each antenna probe; According to the difference between the final EIS value of the first antenna probe and EIS1, further compensation is performed to obtain estimated EIS value data that is closer to the actual EIS, namely EIS2 for each antenna probe; Step 5: Get the EIS of each antenna based on the EIS2 test. The instrument sends the estimated EIS value of each antenna probe through the antenna probe, that is, the level of EIS2, and the test obtains the terminal feedback bit error rate. Then, the level is lowered or raised according to the bit error rate until the terminal feedback level value meets the bit error rate. This is the EIS value of the first antenna. Stp6, get TIS; According to the EIS of each antenna probe, the final TIS is obtained by spherical integration and averaging; The terminal adopts a computer or a single chip microcomputer.

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