Switch testing methods and related equipment

By using an automated testing platform to generate and apply combined test cases, the problem of a lack of combined scenarios in switch testing has been solved, achieving more comprehensive test coverage and cost reduction.

CN115695261BActive Publication Date: 2026-01-30INSPUR SUZHOU INTELLIGENT TECH CO LTD
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Patent Information

Application Number
CN202211182051.1
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-09-27
Publication Date
2026-01-30
Estimated Expiration
2042-09-27

AI Technical Summary

Technical Problem

Existing switch testing methods lack combined scenarios, leading to probabilistic problems gradually emerging in the later stages of testing or during customer use, increasing high maintenance costs.

Method used

The automated testing platform obtains test commands, captures test case libraries for each functional module, generates combined test cases, and uses these combined test cases to test the switch, covering more probabilistic issues.

Benefits of technology

It enables more comprehensive switch testing, covers more probabilistic issues, and reduces subsequent maintenance costs.

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Abstract

This application discloses a switch testing method applied to an automated testing platform, comprising: obtaining a test command; retrieving target test cases from a test case library corresponding to each functional module according to the test command; combining the target test cases to obtain combined test cases; and testing the target switch using the combined test cases. Applying the technical solution provided in this application enables more comprehensive switch testing, covering more probabilistic issues and reducing subsequent maintenance costs. This application also discloses a switch testing device, electronic device, and computer-readable storage medium, which similarly possess the aforementioned technical effects.
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