Method and system for testing electromagnetic radiation immunity of electronic devices

Abstract

The application provides a test method and a test system for electromagnetic radiation immunity of an electronic device. The test method comprises: applying an electromagnetic interference signal to the electronic device, the electromagnetic interference signal having a first interference frequency sequence composed of a plurality of first interference frequencies, the plurality of first interference frequencies gradually increasing or decreasing by a preset step within a preset frequency range; recording a working state of the electronic device when the electronic device is interfered by the electromagnetic interference signal according to a time sequence, the time sequence comprising a plurality of recording time points, the working state corresponding to the recording time point one by one; and establishing a first correspondence between the first interference frequency sequence and the working state. The test method and the test system according to the application help users to improve the test efficiency of the performance of the electronic device and ensure data traceability.

Description

Technical Field

[0001] This invention relates to the field of testing technology for electronic instruments, and in particular to a method and system for testing the electromagnetic radiation immunity of electronic devices. Background Technology

[0002] Electromagnetic compatibility (EMC) is an important indicator for evaluating the performance of electronic equipment. Generally, EMC includes two requirements: firstly, the electromagnetic interference generated by the equipment during normal operation must not exceed certain limits; secondly, the equipment must have a certain degree of immunity to electromagnetic interference present in its environment, i.e., electromagnetic susceptibility.

[0003] To test and analyze the electromagnetic susceptibility of electronic devices, the Radiated Radio-Frequency Electromagnetic Field Immunity (RS) test is commonly used. RS testing has corresponding international standards (IEC 61000-4-3) and national standards (GB / T17626.3). During RS testing, the tester observes the device under test through a camera to check its operating status and determine whether it functions normally under interference conditions. This method has the following disadvantages:

[0004] (1) It relies on the subjectivity and initiative of the testers, which can easily lead to tester fatigue and consume manpower. A complete RS test usually takes several hours, and the testers need to maintain a high level of concentration and manually record the working status of the device under test at each frequency point, which is a great challenge for the testers.

[0005] (2) It is impossible to trace past objective data records, and the data is difficult to use effectively. Summary of the Invention

[0006] The technical problem to be solved by the present invention is to provide a test method and test system for automatically testing the electromagnetic radiation immunity of electronic equipment.

[0007] To address the aforementioned technical problems, this invention provides a method for testing the electromagnetic radiation immunity of an electronic device, characterized by comprising: applying an electromagnetic interference signal to the electronic device, the electromagnetic interference signal having a first interference frequency sequence composed of a plurality of first interference frequencies, the plurality of first interference frequencies gradually increasing or decreasing within a preset frequency range with a preset step size; recording the operating state of the electronic device when subjected to the electromagnetic interference signal according to a time series, the time series including a plurality of recording times, the operating state corresponding to the recording times; and establishing a first correspondence between the first interference frequency sequence and the operating state.

[0008] In one embodiment of the present invention, the step of establishing a first correspondence between the first interference frequency sequence and the working state includes: reconstructing the first interference frequency sequence according to the time series to obtain a second interference frequency sequence, the second interference frequency sequence including a plurality of second interference frequencies, such that the plurality of second interference frequencies correspond one-to-one with the plurality of recording times; and using the second correspondence between the plurality of second interference frequencies and the plurality of working states as the first correspondence.

[0009] In one embodiment of the present invention, the time series includes N recording times, the first interference frequency sequence includes M first interference frequencies, and the second interference frequency sequence includes N second interference frequencies, where M and N are both positive integers greater than or equal to 1. The step of reconstructing the first interference frequency sequence according to the time series to obtain the second interference frequency sequence includes: obtaining the start time and end time of the time series; calculating the difference between the end time and the start time; dividing the difference by M-1 to obtain a ratio; obtaining a first frequency index of the first interference frequency sequence, the first frequency index including M positive integers from 1 to M, each first frequency index corresponding to a first interference frequency; dividing the time series by the ratio and rounding to obtain a second frequency index, each recording time corresponding to a second frequency index; and assigning a second interference frequency to each working state according to the second frequency index, the second interference frequency being equal to the first interference frequency corresponding to the second frequency index.

[0010] In one embodiment of the present invention, M is less than N.

[0011] In one embodiment of the present invention, the first correspondence is presented in the form of a chart and / or text.

[0012] To address the aforementioned technical problems, this invention also proposes a testing system for the electromagnetic radiation immunity of electronic devices. The system comprises: a testing device configured to apply an electromagnetic interference signal to the electronic device, the electromagnetic interference signal having a first interference frequency sequence composed of multiple first interference frequencies, the multiple first interference frequencies gradually increasing or decreasing within a preset frequency range with a preset step size; an electronic device configured to send its operating state to a controller; and a controller configured to receive and record the operating state of the electronic device when it is interfered with by the electromagnetic interference signal according to a time sequence, the time sequence including multiple recording times, the operating state corresponding to the recording times, and establishing a first correspondence between the first interference frequency sequence and the operating state.

[0013] In one embodiment of the present invention, the controller is further configured such that the step of establishing a first correspondence between the first interference frequency sequence and the operating state includes: reconstructing the first interference frequency sequence according to the time sequence to obtain a second interference frequency sequence, the second interference frequency sequence including a plurality of second interference frequencies, such that the plurality of second interference frequencies correspond one-to-one with the plurality of recording times; and using the second correspondence between the plurality of second interference frequencies and the plurality of operating states as the first correspondence.

[0014] In one embodiment of the present invention, the time series includes N recording times, the first interference frequency sequence includes M first interference frequencies, and the second interference frequency sequence includes N second interference frequencies, where M and N are both positive integers greater than or equal to 1. The step of reconstructing the first interference frequency sequence according to the time series to obtain the second interference frequency sequence includes: obtaining the start time and end time of the time series; calculating the difference between the end time and the start time; dividing the difference by M-1 to obtain a ratio; obtaining a first frequency index of the first interference frequency sequence, the first frequency index including M positive integers from 1 to M, each first frequency index corresponding to a first interference frequency; dividing the time series by the ratio and rounding to obtain a second frequency index, each recording time corresponding to a second frequency index; and assigning a second interference frequency to each working state according to the second frequency index, the second interference frequency being equal to the first interference frequency corresponding to the second frequency index.

[0015] In one embodiment of the present invention, M is less than N.

[0016] In one embodiment of the present invention, the controller is further configured to present the first correspondence in the form of a chart and / or text.

[0017] According to the test method and system of the present invention, the correspondence between the frequency of electromagnetic interference signals and the operating state of the electronic device under test can be automatically established, which helps users improve the testing efficiency of electronic device performance. Furthermore, by storing all data during the testing process, data traceability is ensured, facilitating various analyses and comparisons of the data to obtain richer and more useful information. Attached Figure Description

[0018] The accompanying drawings are included to provide a further understanding of this application; they are incorporated into and constitute a part of this application. The drawings illustrate embodiments of this application and, together with this specification, serve to explain the principles of the invention. In the drawings:

[0019] Figure 1 This is an exemplary flowchart of a method for testing the electromagnetic radiation immunity of an electronic device according to an embodiment of the present invention;

[0020] Figure 2 This is an example of a test method according to an embodiment of the present invention, illustrating the first correspondence relationship graphically;

[0021] Figure 3 This is a block diagram of a testing system for the electromagnetic radiation immunity of an electronic device according to an embodiment of the present invention. Detailed Implementation

[0022] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are merely some examples or embodiments of this application. For those skilled in the art, these drawings can be applied to other similar scenarios without creative effort. Unless obvious from the context or otherwise specified, the same reference numerals in the drawings represent the same structures or operations.

[0023] As indicated in this application and claims, unless the context clearly indicates otherwise, the words "a," "an," "an," and / or "the" are not specifically singular and may include plural forms. Generally speaking, the terms "comprising" and "including" only indicate the inclusion of explicitly identified steps and elements, which do not constitute an exclusive list, and the method or apparatus may also include other steps or elements.

[0024] Unless otherwise specifically stated, the relative arrangement, numerical expressions, and values ​​of the components and steps described in these embodiments do not limit the scope of this application. It should also be understood that, for ease of description, the dimensions of the various parts shown in the drawings are not drawn to actual scale. Techniques, methods, and devices known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and devices should be considered part of the specification. In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters in the following drawings denote similar items; therefore, once an item is defined in one drawing, it need not be further discussed in subsequent drawings.

[0025] In the description of this application, it should be understood that the orientation or positional relationship indicated by directional terms such as "front, back, up, down, left, right", "horizontal, vertical, horizontal" and "top, bottom" is usually based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing this application and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on the scope of protection of this application; the directional terms "inner" and "outer" refer to the inner and outer contours relative to the outline of each component itself.

[0026] For ease of description, spatial relative terms such as "above," "on top of," "on the upper surface of," "above," etc., are used herein to describe the spatial positional relationship of a device or feature as shown in the figures to other devices or features. It should be understood that spatial relative terms are intended to encompass different orientations in use or operation beyond the orientation of the device as described in the figures. For example, if the device in the figures were inverted, a device described as "above" or "on top of" other devices or structures would subsequently be positioned as "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below." The device may also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein will be interpreted accordingly.

[0027] Furthermore, it should be noted that the use of terms such as "first" and "second" to define components is merely for the purpose of distinguishing the corresponding components. Unless otherwise stated, these terms have no special meaning and therefore should not be construed as limiting the scope of protection of this application. In addition, although the terminology used in this application is selected from commonly known and used terms, some terms mentioned in this application's specification may have been chosen by the applicant according to his or her judgment, and their detailed meanings are explained in the relevant sections of this description. Moreover, this application should be understood not only through the actual terms used, but also through the meaning implied by each term.

[0028] Flowcharts are used in this application to illustrate the operations performed by the system according to embodiments of this application. It should be understood that the preceding or following operations are not necessarily performed in exact order. Instead, various steps can be processed in reverse order or simultaneously. Furthermore, other operations may be added to these processes, or one or more steps may be removed from these processes.

[0029] Figure 1 This is an exemplary flowchart of a method for testing the electromagnetic radiation immunity of an electronic device according to an embodiment of the present invention. (See reference) Figure 1 As shown, the testing method of this embodiment includes the following steps:

[0030] Step S110: Apply an electromagnetic interference signal to the electronic device. The electromagnetic interference signal has a first interference frequency sequence composed of multiple first interference frequencies. The multiple first interference frequencies gradually increase or decrease within a preset frequency range with a preset step size.

[0031] Step S120: Record the operating state of the electronic device when it is subjected to electromagnetic interference signals according to a time series. The time series includes multiple recording times, and the operating state corresponds one-to-one with the recording time; and

[0032] Step S130: Establish the first correspondence between the first interference frequency sequence and the operating state.

[0033] The following details steps S110-S130.

[0034] In step S110, the electronic device is prepared for RS testing. According to international and national standards, and in accordance with actual needs, an electromagnetic interference signal S is applied to the electronic device. This electromagnetic interference signal S has multiple first interference frequencies f. Index1 The first interference frequency sequence is composed of multiple first interference frequencies f. Index1 Within a preset frequency range, the frequency is gradually increased or decreased with a preset step size.

[0035] This invention does not limit the number of first interference frequencies in the first interference frequency sequence, nor does it limit the size of the preset step size. According to regulations, the preset step size is 1% of the previous frequency. That is, if the first interference frequency sequence is represented graphically, it is a straight line that gradually increases or decreases with a certain slope.

[0036] In some embodiments, the preset frequency range is 80MHz to 2.7GHz.

[0037] During RS testing, the field strength of the applied electromagnetic interference signal can be set. In some embodiments, the field strength includes multiple different field strengths such as 1V / m, 3V / m, 10V / m, and 30V / m. During RS testing, an electromagnetic interference signal S is applied to the electronic device under a fixed field strength, and multiple first interference frequencies are applied to the electronic device sequentially. The first interference frequencies can be applied one by one in an increasing or decreasing order.

[0038] The present invention does not limit the duration of each application of a certain first interference frequency.

[0039] In step S120, the working state of the electronic device when it is interfered with by an electromagnetic interference signal is recorded according to a time series t. The time series t includes multiple recording times t1, t2, t3... and the working states a1, a2, a3... correspond one-to-one with the recording times t1, t2, t3...

[0040] This invention does not limit the length of the time series t, nor does it limit the number of recording times t1, t2, t3... in the time series t. The intervals between recording times t1, t2, t3... can be equal or unequal.

[0041] In some embodiments, the intervals between recording times t1, t2, t3… are less than the period of change of the operating state of the electronic device. It can be understood that the period of change of the operating state of the electronic device is assumed to be T. work Then every T work The operating state of an electronic device changes over time. Therefore, the interval between recordings of the operating state of the electronic device should be less than the change period T. work This ensures that every change in the electronic device is recorded.

[0042] The operating state of electronic devices does not necessarily follow a fixed cycle T. work It changes, that is, the period of change T work Since the state is changing, the interval between recording times t1, t2, t3... should be less than the period T of the electronic device's operating state. work The minimum value in.

[0043] In some embodiments, the electronic device includes a load cell, an electrochemical instrument, etc. For a load cell, its operating state can be represented by its weighing data. When the load cell's operating state is stable, its weighing data remains stable. Electromagnetic interference may cause fluctuations in the weighing data; these fluctuations represent changes in the load cell's operating state and can be used to evaluate the load cell's electromagnetic interference immunity. Similarly, for an electrochemical instrument, its operating state can be represented by the pH value it measures. The measured value directly obtained by the electrochemical instrument is a voltage value, typically in mV, which corresponds to the pH value.

[0044] For ease of understanding, this manual uses an electronic device as an example of an electrochemical instrument.

[0045] In step S110, the first interference frequency in the first interference frequency sequence is gradually increased with a preset step size as an example for explanation.

[0046] Table 1 is an example of a first interference frequency sequence. In this example, the preset frequency range of the first interference frequency is 80-90.16MHz. The preset step size is 1% of the previous frequency.

[0047] In Table 1, the first column is the first frequency index, Index1, which corresponds to the serial number of each first interference frequency, including 13 serial numbers from 1 to 13. The second column of Table 1 is the first interference frequency corresponding to the first frequency index Index1, in MHz.

[0048] In this embodiment, the first interference frequency sequence includes 13 first interference frequencies {f1, f2, ..., f...} 13 The 13th first interference frequency f shown here. 13 =90.16MHz can be a preset cutoff frequency. In some cases, if the 12th first interference frequency f 12 Multiplying by 1.01 may result in a frequency exceeding the cutoff frequency, therefore let the 13th first interference frequency f 13 The frequency equal to the cutoff frequency.

[0049] Table 1:

[0050] First frequency index Index1 First interference frequency MHz 1 80 2 80.8 3 81.608 4 82.42408 5 83.24832 6 84.0808 7 84.92161 8 85.77083 9 86.62854 10 87.49482 11 88.36977 12 89.25347 13 90.16

[0051] In step S120, the recorded operating states a1, a2, a3… of the electronic device correspond one-to-one with the recording times t1, t2, t3… Table 2 lists the 60 operating states of the electrochemical instrument at 60 recording times, taking the electronic device as an example.

[0052] As shown in Table 2, the first column is the sequence number n, representing the sequence number of the recorded time t. n is a positive integer starting from 1, where n = 1:N, and N represents the total number of recorded times. In Table 2, N = 60. The second column in Table 2 is the recorded time t. n , representing the nth recording time, in seconds (s). The third column in Table 2 represents the working status a. n This represents the operating state of the electronic device at a specific recording time. In this example, operating state a n This corresponds to the pH value measured by the electrochemical instrument, and the unit is millivolts (mV).

[0053] Table 2: Recording time t n Corresponding working state a n Example

[0054]

[0055]

[0056] In step S130, a first correspondence is established between the first interference frequency sequence and the operating state.

[0057] It is understandable that the recording time t shown in Table 2... n It can provide information on the changes in the operating state of electronic devices in the time domain. However, it cannot directly derive the correspondence between interference frequencies and the operating states of electronic devices, which is a crucial indicator for evaluating the performance of electronic devices. Therefore, it is necessary to establish a primary correspondence between a primary interference frequency and the operating state.

[0058] This invention does not limit the specific method for establishing the first correspondence.

[0059] In some embodiments, the step of establishing a first correspondence between a first interference frequency sequence and an operating state includes the following steps:

[0060] Step S210: Reconstruct the first interference frequency sequence based on the time series t to obtain the second interference frequency sequence. The second interference frequency sequence includes multiple second interference frequencies, so that the multiple second interference frequencies correspond one-to-one with multiple recording times.

[0061] Step S220: The second correspondence between multiple second interference frequencies and multiple operating states is taken as the first correspondence.

[0062] Specifically, as shown in Tables 1 and 2, the time series t includes 60 recording times and 60 working states, while the first interference frequency sequence only includes 13 first interference frequencies. The first interference frequencies cannot be directly correlated with the working states. Instead, the first interference frequency sequence needs to be reorganized to include 60 second interference frequencies, so that the second interference frequencies correspond one-to-one with the recording times and thus also correspond one-to-one with the working states.

[0063] This invention does not limit the method of how to reconstruct the first interference frequency sequence based on the time series t.

[0064] In some embodiments, the time series t includes N recording times, the first interference frequency sequence includes M first interference frequencies, and the second interference frequency sequence includes N second interference frequencies, where M and N are both positive integers greater than or equal to 1. Step S210, which involves reconstructing the first interference frequency sequence from the time series t to obtain the second interference frequency sequence, includes:

[0065] Step S212: Obtain the start and end times of the time series, calculate the difference between the end and start times, and divide the difference by M-1 to obtain a ratio.

[0066] Based on the example shown in Table 2, M = 13. The start time t of the time series t. start =0.00S, end time t end =59.56S. The ratio η is calculated using the following formula:

[0067]

[0068] Step S214: Obtain the first frequency index of the first interference frequency sequence. The first frequency index includes M positive integers from 1 to M, and each first frequency index corresponds to a first interference frequency.

[0069] As shown in the example in Table 1, the first frequency index Index1 is as shown in the first column of Table 1, including 13 first frequency indexes Index1 from 1 to 13.

[0070] Step S216: Divide the time series by the ratio and round down to obtain the second frequency index. Each record time corresponds to a second frequency index.

[0071] Table 3 below adds a fourth column, the second frequency index Index2, to Table 1. It lists each record time t in the time series t. n Dividing by the aforementioned ratio η and rounding the result, we can obtain the second frequency index Index2.

[0072] Table 3:

[0073]

[0074]

[0075]

[0076] As shown in Table 3, the second frequency index Index2 corresponds to the recording time t. n One-to-one correspondence, and also with working state a n One-to-one correspondence.

[0077] Step S218: Assign a second interference frequency to each working state according to the second frequency index. The second interference frequency is equal to the first interference frequency corresponding to the second frequency index.

[0078] Table 4 below adds a fifth column to Table 3, namely the second interference frequency. Comparing Table 1 and Table 4, the second interference frequency f... Index2 The value is equal to the first interference frequency f corresponding to the second frequency index Index2. Index1 For example, if the second frequency index Index2 corresponding to operating states a1-a5 is 1, and the first interference frequency f1 = 80.00MHz is 1, then all five second interference frequencies are 80.00MHz, and so on.

[0079] Table 4:

[0080]

[0081]

[0082]

[0083] Based on the above steps, 60 second interference frequencies and 60 operating states can be obtained. n The second correspondence between them is used as the first correspondence to be obtained in step S130.

[0084] In some embodiments, the number M of the first interference frequencies in the first interference frequency sequence is less than the number N of the recording times.

[0085] In some embodiments, the test method of the present invention presents the first correspondence obtained in step S130 in the form of a chart and / or text.

[0086] Figure 2 This is an example of a test method according to an embodiment of the present invention, illustrating the first correspondence relationship graphically. (See reference) Figure 2As shown, the horizontal axis represents frequency in MHz, and the vertical axis represents pH value in mV. Figure 2 The example shown is an electrochemical instrument where pH data is represented by snowflake-shaped points on a coordinate system.

[0087] According to the test method of the present invention, a first correspondence between the interference frequency of the electromagnetic interference signal and the electrochemical instrument data can be obtained. For example... Figure 2 As shown, the electronic device exhibits fluctuating operating states when the interference frequency is in the range of 80-90.16MHz.

[0088] By adopting such Figure 2 The diagrams and / or text used to present the correspondence between interference frequencies and operating states allow users to easily understand the results of RS tests, helping them improve the efficiency of testing the performance of electronic devices.

[0089] Figure 3 This is a block diagram of a testing system for the electromagnetic radiation immunity of an electronic device according to an embodiment of the present invention. (Reference) Figure 3 As shown, the test system 300 of this embodiment includes a test device 310, an electronic device 320, and a controller 330. The test device 310 is configured to apply an electromagnetic interference signal to the electronic device 320. The electromagnetic interference signal has a first interference frequency sequence composed of multiple first interference frequencies, which gradually increase or decrease within a preset frequency range with a preset step size. The electronic device 320 is configured to send its operating state to the controller 330. The controller 330 is configured to receive and record the operating state of the electronic device 320 when it is subjected to electromagnetic interference, according to a time series. The time series includes multiple recording times, with a one-to-one correspondence between the operating state and the recording times, and a first correspondence between the first interference frequency sequence and the operating state.

[0090] The testing method of the present invention can be implemented by the testing system 300. The description of the testing method in this specification can be used to describe the testing system 300 of the present invention, and the same content will not be repeated.

[0091] In some embodiments, the electronic device 320 in the test system 300 communicates with the controller 330 via its own communication module. The electronic device 320 sends its own operating status to the controller 330 at certain communication cycles via the communication module. The controller 330 stores and analyzes the obtained operating status to obtain the correspondence between interference frequency and operating status.

[0092] In some embodiments, the test device 310 in the test system 300 also has a communication module, and sends the interference frequency to the controller 330 through the communication module.

[0093] In some embodiments, the controller 330 is further configured to establish a first correspondence between a first interference frequency sequence and an operating state, including:

[0094] Step S310: Reconstruct the first interference frequency sequence based on the time series to obtain a second interference frequency sequence. The second interference frequency sequence includes multiple second interference frequencies, such that the multiple second interference frequencies correspond one-to-one with multiple recording times; and

[0095] Step S320: The second correspondence between multiple second interference frequencies and multiple operating states is taken as the first correspondence.

[0096] In some embodiments, the time series includes N recording times, the first interference frequency sequence includes M first interference frequencies, and the second interference frequency sequence includes N second interference frequencies, where M and N are both positive integers greater than or equal to 1. The controller is further configured to perform the step S310 above, which involves reconstructing the first interference frequency sequence based on the time series to obtain the second interference frequency sequence, including:

[0097] Step S312: Obtain the start and end times of the time series, calculate the difference between the end and start times, and divide the difference by M-1 to obtain a ratio;

[0098] Step S314: Obtain the first frequency index of the first interference frequency sequence. The first frequency index includes M positive integers from 1 to M, and each first frequency index corresponds to a first interference frequency.

[0099] Step S316: Divide the time series by the ratio and round down to obtain the second frequency index; each record time corresponds to one second frequency index; and

[0100] Step S318: Assign a second interference frequency to each working state according to the second frequency index. The second interference frequency is equal to the first interference frequency corresponding to the second frequency index.

[0101] In some embodiments, M is less than N.

[0102] In some embodiments, the controller 330 is further configured to present the first correspondence in graphical and / or textual form. In these embodiments, the test system 300 may also include a display device connected to the controller 330, to which the controller 330 sends content to be displayed.

[0103] In some embodiments, the electronic device 320 includes a weighing sensor, an electrochemical instrument, etc.

[0104] According to the test method and system of the present invention, the correspondence between the frequency of electromagnetic interference signals and the operating state of the electronic device under test can be automatically established, which helps users improve the testing efficiency of electronic device performance. Furthermore, by storing all data during the testing process, data traceability is ensured, facilitating various analyses and comparisons of the data to obtain richer and more useful information.

[0105] The basic concepts have been described above. Obviously, for those skilled in the art, the above disclosure is merely illustrative and does not constitute a limitation of this application. Although not explicitly stated herein, those skilled in the art may make various modifications, improvements, and corrections to this application. Such modifications, improvements, and corrections are suggested in this application, and therefore remain within the spirit and scope of the exemplary embodiments of this application.

[0106] Furthermore, this application uses specific terms to describe embodiments of the application. For example, "an embodiment," "one embodiment," and / or "some embodiments" refer to a particular feature, structure, or characteristic related to at least one embodiment of the application. Therefore, it should be emphasized and noted that "an embodiment," "one embodiment," or "an alternative embodiment" mentioned twice or more in different locations in this specification do not necessarily refer to the same embodiment. In addition, certain features, structures, or characteristics in one or more embodiments of the application can be appropriately combined.

[0107] Some aspects of this application can be executed entirely by hardware, entirely by software (including firmware, resident software, microcode, etc.), or by a combination of hardware and software. The aforementioned hardware or software may be referred to as a "data block," "module," "engine," "unit," "component," or "system." The processor may be one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DAPDs), programmable logic devices (PLDs), field-programmable gate arrays (FPGAs), processors, controllers, microcontrollers, microprocessors, or combinations thereof. Furthermore, aspects of this application may manifest as computer products residing in one or more computer-readable media, including computer-readable program code. For example, computer-readable media may include, but are not limited to, magnetic storage devices (e.g., hard disks, floppy disks, magnetic tapes, etc.), optical discs (e.g., compressed CDs, digital multifunction DVDs, etc.), smart cards, and flash memory devices (e.g., cards, sticks, key drives, etc.).

[0108] A computer-readable medium may contain a propagated data signal containing computer program code, for example, on baseband or as part of a carrier wave. This propagated signal may take various forms, including electromagnetic, optical, and so on, or suitable combinations thereof. A computer-readable medium can be any computer-readable medium other than a computer-readable storage medium, which can be connected to an instruction execution system, apparatus, or device to enable communication, propagation, or transmission of a program for use. The program code located on the computer-readable medium can be propagated through any suitable medium, including radio, cable, fiber optic cable, radio frequency signals, or similar media, or any combination of the above media.

[0109] Similarly, it should be noted that, in order to simplify the description of the present application and thus aid in the understanding of one or more embodiments of the invention, the foregoing description of the embodiments of the present application sometimes combines multiple features into a single embodiment, drawing, or description thereof. However, this disclosure method does not imply that the subject matter of the application requires more features than those mentioned in the claims. In fact, the embodiments contain fewer features than all the features of the single embodiments disclosed above.

[0110] In some embodiments, numbers describing the quantity of components and attributes are used. It should be understood that such numbers used in the description of embodiments are modified in some examples with the terms "approximately," "approximately," or "generally." Unless otherwise stated, "approximately," "approximately," or "generally" indicates that the numbers are allowed to vary by ±20%. Accordingly, in some embodiments, the numerical parameters used in the specification and claims are approximate values, which may be changed depending on the characteristics required by individual embodiments. In some embodiments, numerical parameters should take into account specified significant digits and employ a general method of digit reservation. Although the numerical ranges and parameters used to confirm their breadth of scope in some embodiments of this application are approximate values, in specific embodiments, such values ​​are set as precisely as feasible.

Claims

1. A method for testing the electromagnetic radiation immunity of an electronic device, characterized in that, include: An electromagnetic interference signal is applied to an electronic device. The electromagnetic interference signal has a first interference frequency sequence composed of a plurality of first interference frequencies. The plurality of first interference frequencies gradually increase or decrease within a preset frequency range with a preset step size. The electronic device operates under the interference of the electromagnetic interference signal according to a time series record, wherein the time series includes multiple recording times, and the operating state corresponds one-to-one with the recording times; as well as Establishing a first correspondence between the first interference frequency sequence and the operating state includes: Reconstructing the first interference frequency sequence according to the time series to obtain a second interference frequency sequence, the second interference frequency sequence includes multiple second interference frequencies, such that the multiple second interference frequencies correspond one-to-one with the multiple recording times. The time series includes N recording times, the first interference frequency sequence includes M first interference frequencies, and the second interference frequency sequence includes N second interference frequencies, where M and N are both positive integers greater than or equal to 1. The step of reconstructing the first interference frequency sequence according to the time series to obtain the second interference frequency sequence includes: Obtain the start and end times of the time series, calculate the difference between the end time and the start time, and divide the difference by M-1 to obtain a ratio; Obtain a first frequency index of the first interference frequency sequence, wherein the first frequency index comprises M positive integers from 1 to M, and each first frequency index corresponds to a first interference frequency; Divide the time series by the ratio and round down to obtain a second frequency index, with each recorded time point corresponding to one second frequency index; and A second interference frequency is assigned to each operating state according to the second frequency index, and the second interference frequency is equal to the first interference frequency corresponding to the second frequency index; and The second correspondence between the plurality of second interference frequencies and the plurality of operating states is taken as the first correspondence.

2. The test method as described in claim 1, characterized in that, M is less than N.

3. The test method as described in claim 1, characterized in that, The first correspondence is presented in the form of a chart and / or text.

4. A testing system for the electromagnetic radiation immunity of electronic equipment, characterized in that, include: The testing equipment is configured to apply an electromagnetic interference signal to an electronic device. The electromagnetic interference signal has a first interference frequency sequence composed of a plurality of first interference frequencies, and the plurality of first interference frequencies gradually increase or decrease within a preset frequency range with a preset step size. An electronic device configured to send its operating status to a controller; The controller is configured to receive and record the operating state of the electronic device when it is interfered with by the electromagnetic interference signal according to a time series, wherein the time series includes multiple recording times, the operating state and the recording times correspond one-to-one, and establishing a first correspondence between the first interference frequency sequence and the operating state includes: reconstructing the first interference frequency sequence according to the time series to obtain a second interference frequency sequence, wherein the second interference frequency sequence includes multiple second interference frequencies, such that the multiple second interference frequencies correspond one-to-one with the multiple recording times, wherein the time series includes N recording times, the first interference frequency sequence includes M first interference frequencies, and the second interference frequency sequence includes N second interference frequencies, wherein M and N are both positive integers greater than or equal to 1, and the step of reconstructing the first interference frequency sequence according to the time series to obtain the second interference frequency sequence includes: Obtain the start and end times of the time series, calculate the difference between the end time and the start time, and divide the difference by M-1 to obtain a ratio; Obtain a first frequency index of the first interference frequency sequence, wherein the first frequency index comprises M positive integers from 1 to M, and each first frequency index corresponds to a first interference frequency; Divide the time series by the ratio and round down to obtain a second frequency index, with each recorded time point corresponding to one second frequency index; and A second interference frequency is assigned to each operating state according to the second frequency index, and the second interference frequency is equal to the first interference frequency corresponding to the second frequency index; and The second correspondence between the plurality of second interference frequencies and the plurality of operating states is taken as the first correspondence.

5. The testing system as described in claim 4, characterized in that, M is less than N.

6. The testing system as described in claim 4, characterized in that, The controller is also configured to present the first correspondence in graphical and / or textual form.

Images