Shmoo Test Method, Device, Host Computer, and Storage Medium Based on Prerequisites

Abstract

The present invention provides a Shmoo test method, device, host computer, and storage medium based on preconditions. The method includes: obtaining test station information, Shmoo test position information, and Shmoo test parameters; determining available stations of the ATE tester, and determining a target station from the available stations according to the test station information; obtaining a test program recording multiple functional test operations, and determining a target writing position in the test program according to the Shmoo test position information, where the target writing position is before the start of the functional test operation; configuring Shmoo test operations and generating Shmoo test instructions according to the Shmoo test parameters; sending the Shmoo test instructions to the ATE tester for testing to obtain Shmoo test results. According to the technical solution of this embodiment, it is possible to flexibly configure the test station, test position, and test parameters without modifying the pin definition, effectively improving the flexibility and convenience of the Shmoo test.

Description

Technical Field

[0001] The present invention belongs to the technical field of chip testing, and particularly relates to a Shmoo testing method, device, host computer, and storage medium based on preconditions. Background Art

[0002] Digital chips are widely used in many electronic products such as computers and mobile phones. The production process of chips includes multiple steps such as design, manufacturing, packaging, and testing. The purpose of chip testing is to check whether the performance of the chip meets the design expectations. The performance of digital chips is affected by many working parameters, including power supply voltage value, input signal period, input / output high and low level values, etc. Testing the chip under different working conditions to obtain the parameter range within which the chip can work properly, and displaying the results on a graph. The obtained graph is called a Shmoo graph, and this testing process is called Shmoo testing.

[0003] The general testing process is that first, the ATE tester connects to the pins of the chip under test and the host computer. After setting up the testing environment, the device parameters are set in the testing program of the host computer as the preconditions for the chip to work in the Shmoo testing, and then the testing is carried out. However, such a process is very cumbersome when testing multiple different parameters or performing different function tests, and it is necessary to frequently change the testing program of the host computer and compile it, which is not convenient for the tester to debug. At the same time, when using the existing technology to test some of a group of chips under parallel testing, it is necessary to change and recompile the pin definition file, which also brings inconvenience to debugging. Summary of the Invention

[0004] The following is an overview of the subject matter described in detail in this document. This overview is not intended to limit the scope of protection of the claims.

[0005] Embodiments of the present invention provide a Shmoo testing method, device, host computer, and storage medium based on preconditions, which can flexibly configure Shmoo testing and improve the convenience of Shmoo testing.

[0006] In a first aspect, an embodiment of the present invention provides a Shmoo testing method based on preconditions, which is applied to a host computer. The host computer is communicatively connected to an ATE tester. The method includes:

[0007] Obtain test requirement information, where the test requirement information includes test station information, Shmoo test position information, and Shmoo test parameters;

[0008] Determine the available stations of the ATE tester, and determine the target station from the available stations according to the test station information;

[0009] Obtain a test program recording multiple functional test operations, and determine a target writing position in the test program according to the Shmoo test position information, where the target writing position is before the start of the functional test operation;

[0010] Configure the Shmoo test operation according to the Shmoo test parameters, and generate a Shmoo test instruction according to the target writing position and the Shmoo test operation;

[0011] Send the Shmoo test instruction to the ATE tester for testing to obtain a Shmoo test result.

[0012] In some embodiments, the functional test operation is a functional test item, and the Shmoo test position information includes target test item information and target vector information. Determining the target writing position in the test program according to the Shmoo test position information includes:

[0013] Obtain a test vector configuration file, which records the optional test vectors corresponding to each functional test item;

[0014] Determine a target functional test item from multiple functional test items according to the target test item information;

[0015] Determine a target test vector from the optional test vectors corresponding to the target functional test item according to the target vector information;

[0016] Determine the target writing position according to the position recorded in the test program where the target test vector is located, where the target writing position is before the start of the target test vector test.

[0017] In some embodiments, the Shmoo test position information further includes a vector position identifier, and the target test vector includes multiple lines of vector test statements. Determining the target writing position according to the position recorded in the test program where the target test vector is located includes:

[0018] Based on the vector position identifier, determine a target vector test statement from the vector test statements;

[0019] Determine the position before the execution of the target vector test statement as the target writing position.

[0020] In some embodiments, determining the target vector test statement from the vector test statements includes:

[0021] Determine line number information according to the vector position identifier;

[0022] Determine the first vector test statement indicated by the line number information as the target vector test statement.

[0023] In some embodiments, the functional test operation is a functional test statement, and determining a target write position in the test program according to the Shmoo test position information includes:

[0024] Determine a target functional test statement from multiple functional test statements according to the Shmoo test position information;

[0025] Set a target breakpoint at the previous position of the position corresponding to the target functional test statement in the test program;

[0026] Determine the target breakpoint as the target write position.

[0027] In some embodiments, the ATE tester is installed with multiple chips under test. Determining the available workstations of the ATE tester and determining a target workstation from the available workstations according to the test workstation information includes:

[0028] Obtain a pin configuration file, which records the pin configuration information of each workstation of the ATE tester;

[0029] Determine the workstations corresponding to the pins recorded in the pin configuration file as the available workstations;

[0030] Determine the enable state of each available workstation according to the test workstation information, and determine the available workstations with the enable state characterized as enabled as the target workstations.

[0031] In some embodiments, configuring the Shmoo test operation according to the Shmoo test parameters includes:

[0032] Determine the testable mode and testable parameters of the target workstation according to the pin configuration file;

[0033] Determine the target test mode and target test parameters of each target workstation according to the Shmoo test parameters;

[0034] Generate the Shmoo test operation according to the target test mode and the target test parameters.

[0035] In a second aspect, an embodiment of the present invention provides a Shmoo test device based on preconditions, including:

[0036] A requirement acquisition unit, configured to acquire test requirement information, where the test requirement information includes test workstation information, Shmoo test position information, and Shmoo test parameters;

[0037] A station determination unit, configured to determine available stations of the ATE tester, and determine a target station from the available stations according to the test station information;

[0038] A writing position determination unit, configured to obtain a test program recording multiple functional test operations, and determine a target writing position in the test program according to the Shmoo test position information, where the target writing position is before the start of the functional test operation;

[0039] A writing unit, configured to configure a Shmoo test operation according to the Shmoo test parameters, and generate a Shmoo test instruction according to the target writing position and the Shmoo test operation;

[0040] A test unit, configured to send the Shmoo test instruction to the ATE tester for testing to obtain a Shmoo test result.

[0041] In a third aspect, an embodiment of the present invention provides a host computer, including: a memory, a processor, and a computer program stored on the memory and executable on the processor, where when the processor executes the computer program, it implements the precondition-based Shmoo test method as described in the first aspect.

[0042] In a fourth aspect, an embodiment of the present invention provides a computer-readable storage medium storing a computer program, where the computer program is used to execute the precondition-based Shmoo test method as described in the first aspect.

[0043] Embodiments of the present invention include: obtaining test requirement information, where the test requirement information includes test station information, Shmoo test position information, and Shmoo test parameters; determining available stations of the ATE tester, and determining a target station from the available stations according to the test station information; obtaining a test program recording multiple functional test operations, determining a target writing position in the test program according to the Shmoo test position information, where the target writing position is before the start of the functional test operation; configuring a Shmoo test operation according to the Shmoo test parameters, and generating a Shmoo test instruction according to the target writing position and the Shmoo test operation; sending the Shmoo test instruction to the ATE tester for testing to obtain a Shmoo test result. According to the technical solution of this embodiment, it is possible to customize the target station to be tested through the test station information, determine the position where the Shmoo test operation needs to be written in the test program through the Shmoo test position information, and realize the customization of the Shmoo test operation through the Shmoo test parameters. Without modifying the pin definition, the flexible configuration of the test station, test position, and test parameters can be achieved, effectively improving the flexibility and convenience of the Shmoo test.

[0044] Other features and advantages of the present invention will be described in the following specification, and, in part, will be obvious from the specification, or will be understood by implementing the present invention. The objectives and other advantages of the present invention can be realized and obtained by the structures specifically pointed out in the specification, claims, and drawings. Description of the Drawings

[0045] The drawings are used to provide a further understanding of the technical solution of the present invention, and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the technical solution of the present invention, and do not constitute a limitation to the technical solution of the present invention.

[0046] Figure 1 is a flowchart of a Shmoo test method based on preconditions provided by an embodiment of the present invention;

[0047] Figure 2 is an example diagram of the implementation environment of the present invention;

[0048] Figure 3 is a flowchart of determining a target writing position according to a test vector provided by another embodiment of the present invention;

[0049] Figure 4 is a schematic diagram of selecting a test vector provided by another embodiment of the present invention;

[0050] Figure 5 is a flowchart of determining a target writing position according to a vector identifier provided by another embodiment of the present invention;

[0051] Figure 6 It is a flowchart for determining a target writing position according to a breakpoint provided by another embodiment of the present invention;

[0052] Figure 7 It is a flowchart for a writing test program provided by another embodiment of the present invention;

[0053] Figure 8 It is a flowchart for determining a target work station provided by another embodiment of the present invention;

[0054] Figure 9 It is a flowchart for generating a Shmoo test operation provided by another embodiment of the present invention;

[0055] Figure 10 It is a structural diagram of a Shmoo test device based on preconditions provided by another embodiment of the present invention;

[0056] Figure 11 It is a device diagram of a host computer provided by another embodiment of the present invention. Detailed implementation manners

[0057] In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.

[0058] It should be noted that although the functional modules are divided in the device schematic diagram and the logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in a different order from the module division in the device or the order in the flowchart. Terms such as "first" and "target" in the description, claims or the above-mentioned drawings are used to distinguish similar objects, and do not necessarily need to describe a specific order or sequence.

[0059] The present invention provides a Shmoo test method, apparatus, host computer, and storage medium based on preconditions. The method includes: obtaining test requirement information, where the test requirement information includes test station information, Shmoo test position information, and Shmoo test parameters; determining available stations of the ATE tester, and determining a target station from the available stations according to the test station information; obtaining a test program recording multiple functional test operations, determining a target writing position in the test program according to the Shmoo test position information, where the target writing position is before the start of the functional test operation; configuring Shmoo test operations according to the Shmoo test parameters, and generating a Shmoo test instruction according to the target writing position and the Shmoo test operations; sending the Shmoo test instruction to the ATE tester for testing to obtain a Shmoo test result. According to the technical solution of this embodiment, it is possible to customize the target station to be tested through the test station information, determine the position where the Shmoo test operation needs to be written in the test program through the Shmoo test position information, and customize the Shmoo test operation through the Shmoo test parameters, realizing flexible configuration of the test station, test position, and test parameter without modifying the pin definition, effectively improving the flexibility and convenience of the Shmoo test.

[0060] As Figure 1 shown, Figure 1 is a flowchart of a Shmoo test method based on preconditions provided by an embodiment of the present invention. The Shmoo test method based on preconditions is applied to a host computer, and the host computer is communicatively connected to an ATE tester. The method includes:

[0061] Step S110, obtaining test requirement information, where the test requirement information includes test station information, Shmoo test position information, and Shmoo test parameters;

[0062] Step S120, determining available stations of the ATE tester, and determining a target station from the available stations according to the test station information;

[0063] Step S130, obtaining a test program recording multiple functional test operations, determining a target writing position in the test program according to the Shmoo test position information, where the target writing position is before the start of the functional test operation;

[0064] Step S140, configuring Shmoo test operations according to the Shmoo test parameters, and generating a Shmoo test instruction according to the target writing position and the Shmoo test operations;

[0065] Step S150: Send the Shmoo test instruction to the ATE tester for testing to obtain the Shmoo test result.

[0066] It should be noted that the implementation environment of this embodiment can be referred to Figure 2 as shown in the figure, including a host computer 210, an Automatic Test Equipment (ATE) tester 220, and a device under test (DUT) chip 230. The ATE tester 220 is communicatively connected to the host computer 210 through a USB serial port. The ATE tester 220 is connected to the DUT chip 230 through a wire. Among them, the ATE tester 220 can be provided with multiple test stations, and each test station can be connected to a DUT chip 230 through a wire. The number of test stations and DUT chips 230 in this embodiment is not limited. Based on the above implementation environment, the technical solution of this embodiment will be described below.

[0067] It should be noted that the test requirement information can be generated by the host computer. For example, the host computer parses the compiled test program file, Pindefine file, and Pattern file, and after configuration, they are combined to form the test requirement information. The configuration file of the ATE tester is compiled according to the three files, so as to realize the deployment of the test program.

[0068] Among them, the test program file records the test program, and the test program includes multiple functional test operations; the Pindefine file is used to define the connection method between the DUT chip and the ATE tester channels, that is, it defines each pin of the ATE tester; the Pattern file is used for the functional test of the DUT chip. Each functional test operation can be obtained by parsing the content recorded in the Pattern file. The available stations can be determined by parsing the Pindefine file, and the recording position of each test item in the program can be determined by parsing the test program file. Thus, the position between two test items is determined as the Shmoo test position information.

[0069] It should be noted that since the host computer is communicatively connected to the ATE tester, and the host computer controls the pins of the ATE tester through the Pindefine file, the available workstations of the ATE tester can be determined by identifying the workstation corresponding to each pin recorded in the Pindefine file, and the target workstation can be determined according to the test workstation information in the test requirement information. It should be noted that the test workstation information can be descriptive information about the workstation. For example, the test workstation information is used to indicate "configuring all available workstations as the target workstation", or it can be matching information for selecting available workstations, such as "setting the first and third available workstations as the target workstation", etc. For the convenience of testers to manage and control, a visualization interface can be generated on the host computer and each available workstation can be displayed. The available workstation selected in the visualization interface is determined as the target workstation, and the corresponding test workstation information is generated. Of course, the above method is only an example of this embodiment, and the test workstation information can also be generated by other means, as long as it can be used to determine the target workstation from multiple test workstations.

[0070] It should be noted that in the host computer, the test program file is a pre-compiled file, and multiple functional test items or test statements for performing functional tests are recorded in the test program file. Each functional test item or functional test statement is a function program. Therefore, a Shmoo test can be inserted at the start position of the functional test operation. For example, taking the test item as an example, after completing functional test item 1 and before starting functional test item 2, the ATE tester is in the standby state after the test ends. Using this position as the target writing position, the Shmoo test operation obtained according to the Shmoo test parameters is written to the target writing position, so that after the ATE tester runs functional test item 1, it first executes the Shmoo test operation to perform the Shmoo test, and then executes functional test item 2. Of course, the target writing position does not have to be the position between two functional test items. It can also be determined according to the specific test requirement object of the Shmoo test before the start of the first functional test item.

[0071] It should be noted that the Shmoo test parameters can be any parameters that can be used for the Shmoo test. The specific type of the Shmoo test parameters is not limited in this embodiment. Through the configuration of the Shmoo test parameters, the customization of the Shmoo test operation can be realized through the test requirement information. There is no need to additionally define and compile the pins of the test workstation. Only by changing and adjusting the Shmoo parameters can the customization of the Shmoo test operation be realized, effectively improving the convenience and flexibility of the Shmoo test.

[0072] It should be noted that the test program file, Pindefine file, and Pattern file have been compiled and parsed on the host computer. Therefore, after generating the Shmoo test operation and determining the target writing position, the Shmoo test instruction can be generated and sent to the ATE tester, so that the ATE tester uses the target writing position as the execution start position of the Shmoo test operation according to the Shmoo test instruction, executes the Shmoo test operation for corresponding tests, and returns the test result after the test passes. Then, the tests are repeated until all combinations of parameters and values are tested, and all test results are combined into the entire Shmoo graph to obtain the Shmoo test result.

[0073] In addition, in another embodiment, the function test operation is a function test item, and the Shmoo test position information includes target test item information and target vector information. Referring to Figure 3 , Figure 1 the steps of step S130 in the illustrated embodiment further include but are not limited to the following steps:

[0074] Step S310, obtaining a test vector configuration file, which records the optional test vectors corresponding to each function test item;

[0075] Step S320, determining a target function test item from multiple function test items according to the target test item information;

[0076] Step S330, determining a target test vector from the optional test vectors corresponding to the target function test item according to the target vector information;

[0077] Step S340, determining a target writing position according to the position recorded in the test program of the target test vector, where the target writing position is before the start of the target test vector test.

[0078] It should be noted that the test vector configuration file can be the pattern file described in the above embodiment, and the optional test vectors corresponding to each function test item are recorded in this file. Those skilled in the art know that the optional test vector is also a logical truth table. Signals are input to the chip according to the logical truth table and the output signals of the chip are judged to perform function tests. Therefore, after obtaining the test vector configuration file, each optional test vector can be displayed on the interface of the host computer, so that the tester can select the required target test vector, thereby generating target test item information, enabling the host computer to determine the target function test item and target test vector from the function test items according to the target test item information.

[0079] It should be noted that after determining the target test vector, since the ATE tester is in a standby state before the execution of the target test vector and can be used to set the Shmoo test, the position before the target test vector can be determined as the target writing position, so as to insert the Shmoo test operation and realize the customization of the Shmoo test for the test vector.

[0080] Exemplarily, as Figure 4 shown, there are 5 functional test items recorded in the test program file. After the host computer reads them, the 5 functional test items are displayed. When functional test item 1 is selected, N (N is a natural number) corresponding test vectors are obtained from the Pattern file. Taking the selection of test vector 1 as the target test vector as an example, the vector identifier corresponding to test vector 1 includes test start and test end. Taking the vector position identifier as the test start as an example, in the test program, the Shmoo test operation is written at the position before test vector 1, so that the Shmoo test operation is executed after the previous functional test of test vector 1.

[0081] In addition, in another embodiment, the Shmoo test position information further includes a vector position identifier. The target test vector includes multiple lines of vector test statements. Referring to Figure 5 , Figure 3 the steps of step S340 in the shown embodiment further include but are not limited to the following steps:

[0082] Step S510, based on the vector position identifier, determine the target vector test statement from the vector test statements;

[0083] Step S520, determine the position before the execution of the target vector test statement as the target writing position.

[0084] It should be noted that each test vector usually includes multiple lines of test statements, and each line of test statement can implement a certain functional test. The target writing position of the Shmoo test can be further customized for the test part in the test vector, and the target writing position of the Shmoo test is refined to the statement-level granularity, making the Shmoo test more flexible.

[0085] Exemplarily, the vector position identifier is used to indicate the position in the target test vector where the Shmoo test needs to be performed. For example, the common "start" identifier, then the first line of vector test statement in the target test vector can be determined as the target vector test statement, and the position before its execution can be determined as the target writing position to perform the Shmoo test on the content starting from the first line in the target test vector; another example is that the vector position identifier is used to indicate the second line in the target test vector, and the content after the vector test statement in the second line of the target test vector can be used to perform the Shmoo test.

[0086] In addition, in another embodiment, referring to Figure 6 , Figure 5 step S510 of the illustrated embodiment further includes but is not limited to the following steps:

[0087] Step S610, determining line number information according to the vector position identifier;

[0088] Step S620, determining the first vector test statement indicated by the line number information as the target vector test statement.

[0089] It should be noted that the vector position identifier can be used to identify multiple segments of vector test statements in the target test vector, so as to customize the part that needs to perform Shmoo test from the target test vector through the vector position identifier.

[0090] Exemplarily, as Figure 5 shown, the vector position identifier can include both identifier 1 and identifier 2 at the same time. When identifier 1 is "start" and identifier 2 is "over", the object of the Shmoo test can be determined as the entire target test vector, and the first vector test statement is the first vector test statement, and a Shmoo test operation is inserted before it. For another example, if identifier 1 is "2" and identifier 2 is "10", the object of the Shmoo test can be determined as the vector test statements from the second to the tenth lines. Then, the Shmoo operation can be written before the second line vector test statement, and the Shmoo test is performed on the content corresponding to the vector test statements from the second line to the tenth line, so as to improve the flexibility of the Shmoo test.

[0091] In addition, in another embodiment, the functional test operation is a functional test statement. Referring to Figure 6 , Figure 1 step S130 of the illustrated embodiment further includes but is not limited to the following steps:

[0092] Step S710, determining the target functional test statement from multiple functional test statements according to the Shmoo test position information;

[0093] Step S720, setting a target breakpoint at the previous position corresponding to the target functional test statement in the test program;

[0094] Step S730, determining the target breakpoint as the target writing position.

[0095] It should be noted that in addition to inserting the Shmoo test operation before the start of the test item, a functional test statement can also be used as the functional test operation. After determining the target functional test statement in the test program, a target breakpoint is set before the target functional test statement, and the Shmoo test operation is inserted at the target breakpoint for the Shmoo test.

[0096] It should be noted that, similar to the above test item embodiments, when selecting a target function statement for breakpoint setting, it is also necessary to first complete the selection of the target work station, determine the target function test statement according to the Shmoo test position information in the test program corresponding to the target work station, and then set a target breakpoint before the target function test statement, using the target breakpoint as the target writing position.

[0097] In addition, in another embodiment, the ATE tester is installed with multiple chips under test. Referring to Figure 8 , Figure 1 the step S120 of the embodiment shown also includes but is not limited to the following steps, including:

[0098] Step S810, obtaining a pin configuration file, which records the pin configuration information of each work station of the ATE tester;

[0099] Step S820, determining the work stations corresponding to the pins recorded in the pin configuration file as available work stations;

[0100] Step S830, determining the enable state of each available work station according to the test work station information, and determining the available work stations with the enable state characterized as enabled as the target work stations.

[0101] It should be noted that the pin configuration file can be the above-mentioned pindefine file, which records the definition information of each work station (site). Therefore, the pin configuration information of each work station can be determined according to the Pindefine file, and the work stations corresponding to the pins with configuration information are the available work stations.

[0102] It should be noted that after determining the available work stations, before the Shmoo test, the target work station to be tested can be selected through the work station enable switch. The attributes of the pins include the enable state of the work stations where they are located. Set the enable of the available work stations in the on state to true and those in the off state to false, and then obtain the defined pins through the selected test pattern. Determine the target work station according to the enable state of the work station, and only select the pins of the target work station for function testing, so as to achieve the purpose of performing Shmoo tests on different work stations.

[0103] In addition, in another embodiment, referring to Figure 9 , Figure 1 the step S140 of the embodiment shown also includes but is not limited to the following steps, including:

[0104] Step S910, determining the testable modes and testable parameters of the target work station according to the pin configuration file;

[0105] Step S920, determining the target test mode and target test parameters of each target work station according to the Shmoo test parameters;

[0106] Step S930: Generate a Shmoo test operation according to the target test mode and target test parameters.

[0107] It should be noted that the Shmoo test parameters may include the output voltage, output current, high and low level values, signal period, relevant parameters of the signal time edge of the Precision Measurement Unit (PMU), the output voltage of the device power supply unit, etc. The Shmoo test operation can obtain a specific target test model according to one or two Shmoo test parameters. The optional test models may include one-dimensional test and two-dimensional test. For example, when the test requirement information includes two Shmoo test parameters, if the target test mode is determined to be two-dimensional test, the selected two Shmoo test parameters can be determined as the target test parameters and configured to the x-axis or y-axis of the Shmoo test result respectively. The ATE tester can determine whether test parameters are selected for both coordinate axes through the test program, so as to select to enter the one-dimensional or two-dimensional Shmoo test process. The Shmoo test parameters can be incremented according to the measured number of test points within the set range, and each time the parameters are increased, they are set into the ATE tester. The two-dimensional test is to use double traversal to set different combinations of test parameters into the ATE tester, and the test results of two Shmoo test parameters are displayed on both coordinate axes simultaneously, effectively improving the convenience of the Shmoo test.

[0108] In addition, referring to Figure 10 , an embodiment of the present invention provides a Shmoo test device based on preconditions. The Shmoo test device 1000 based on preconditions includes

[0109] A requirement acquisition unit 1010, configured to acquire test requirement information, where the test requirement information includes test station information, Shmoo test position information, and Shmoo test parameters;

[0110] A station determination unit 1020, configured to determine the available stations of the ATE tester, and determine the target station from the available stations according to the test station information;

[0111] A write position determination unit 1030, configured to acquire a test program recording multiple functional test operations, and determine the target write position in the test program according to the Shmoo test position information, where the target write position is before or after the start or end of the functional test operation;

[0112] A write unit 1040, configured to configure the Shmoo test operation according to the Shmoo test parameters, and generate a Shmoo test instruction according to the target write position and the Shmoo test operation;

[0113] A test unit 1050 is used to send Shmoo test instructions to an ATE tester for testing to obtain Shmoo test results.

[0114] In addition, referring to Figure 11 , an embodiment of the present invention further provides a host computer, and the host computer 1100 includes: a memory 1110, a processor 1120, and a computer program stored on the memory 1110 and executable on the processor 1120.

[0115] The processor 1120 and the memory 1110 can be connected through a bus or other means.

[0116] The non-transitory software program and instructions required to implement the precondition-based Shmoo test method in the above embodiment are stored in the memory 1110. When executed by the processor 1120, the precondition-based Shmoo test method in the above embodiment is executed. For example, the method steps S110 to step S150 described above are executed, Figure 1 the method steps S310 to step S340 in Figure 3 the method steps S510 to step S520 in Figure 5 the method steps S610 to step S620 in Figure 6 the method steps S710 to step S730 in Figure 7 the method steps S810 to step S830 in Figure 8 the method steps S910 to step S930 in Figure 9 are executed.

[0117] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separated, that is, they may be located in one place or distributed to multiple network units. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0118] In addition, an embodiment of the present invention further provides a computer-readable storage medium. The computer-readable storage medium stores a computer program. When the computer program is executed by a processor or a controller, for example, executed by a processor in the above host computer embodiment, the processor can execute the precondition-based Shmoo test method in the above embodiment. For example, the method steps S110 to step S150 described above are executed, Figure 1 the method steps S310 to step S340 in Figure 3 the method steps S510 to step S520 in Figure 5 the method steps S510 to step S520 in Figure 6 the method steps S610 to step S620 in Figure 7Method steps S710 to S730 in Figure 8 Method steps S810 to S830 in Figure 9 Method steps S910 to S930 in. Those of ordinary skill in the art can understand that all or some of the steps and devices in the methods disclosed above can be implemented as software, firmware, hardware, and their appropriate combinations. Some physical components or all physical components can be implemented as software executed by a processor, such as a central processing unit, a digital signal processor, or a microprocessor, or implemented as hardware, or implemented as an integrated circuit, such as an application-specific integrated circuit. Such software can be distributed on a computer-readable storage medium, which can include a computer storage medium (or non-transitory storage medium) and a communication storage medium (or transitory storage medium). As is well known to those of ordinary skill in the art, the term computer storage medium includes volatile and non-volatile, removable and non-removable storage media implemented in any method or technology for storing information, such as computer-readable instructions, data structures, program modules, or other data. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technologies, CD-ROM, digital versatile disk (DVD) or other optical disk storage, magnetic cassette, tape, magnetic disk storage or other magnetic storage devices, or any other storage medium that can be used to store the desired information and can be accessed by a computer. In addition, as is well known to those of ordinary skill in the art, a communication storage medium typically contains computer-readable instructions, data structures, program modules, or other data in a modulated data signal such as a carrier wave or other transmission mechanism, and can include any information delivery storage medium.

[0119] After considering the specification and practicing the disclosed embodiments herein, those skilled in the art will readily conceive of other embodiments of the present application. The present application is intended to cover any variations, uses, or adaptations of the present application that follow the general principles of the present application and include known common general knowledge or conventional technical means in the technical field not disclosed in the present application.

[0120] It should be understood that the present application is not limited to the exact structures described above and shown in the drawings, and various modifications and changes can be made without departing from its scope. The scope of the present application is only limited by the appended claims.

[0121] The above has specifically described the preferred embodiments of the present invention, but the present invention is not limited to the above embodiments. Those skilled in the art can also make various equivalent deformations or substitutions without departing from the spirit of the present invention, and these equivalent deformations or substitutions are all included within the scope defined by the claims of the present invention.

Claims

1. A Shmoo test method based on preconditions, characterized in that, Applied to a host computer, the host computer is communicatively connected to an ATE tester, and the method includes: Obtain test requirement information, where the test requirement information includes test station information, Shmoo test position information, and Shmoo test parameters; Determine the available stations of the ATE tester, and determine a target station from the available stations according to the test station information; Obtain a test program recording multiple functional test operations, and determine a target writing position in the test program according to the Shmoo test position information, where the target writing position is before the start of the functional test operation; Configure a Shmoo test operation according to the Shmoo test parameters, and generate a Shmoo test instruction according to the target writing position and the Shmoo test operation; Send the Shmoo test instruction to the ATE tester for testing to obtain a Shmoo test result; The functional test operation is a functional test item, and the Shmoo test position information includes target test item information and target vector information. Determining the target writing position in the test program according to the Shmoo test position information includes: Obtain a test vector configuration file, which records the optional test vectors corresponding to each functional test item; Determine a target functional test item from multiple functional test items according to the target test item information; Determine a target test vector from the optional test vectors corresponding to the target functional test item according to the target vector information; Determine the target writing position according to the position recorded in the test program of the target test vector, where the target writing position is before the start of the target test vector test; The ATE tester is installed with multiple devices under test. Determining the available stations of the ATE tester and determining a target station from the available stations according to the test station information includes: Obtain a pin configuration file, which records the pin configuration information of each station of the ATE tester; Determine the stations corresponding to the pins recorded in the pin configuration file as the available stations; Determine the enable state of each available station according to the test station information, and determine the available stations with the enable state characterized as enabled as the target stations; Configuring the Shmoo test operation according to the Shmoo test parameters includes: Determine the testable mode and testable parameters of the target station according to the pin configuration file; Determine the target test mode and target test parameters of each target station according to the Shmoo test parameters; Generate the Shmoo test operation according to the target test mode and the target test parameters.

2. The Shmoo test method based on preconditions according to claim 1, characterized in that, The Shmoo test position information further includes a vector position identifier, and the target test vector includes multiple lines of vector test statements. Determining the target writing position according to the position recorded in the test program of the target test vector includes: Based on the vector position identifier, determine a target vector test statement from the vector test statements; Determine the position before the execution of the target vector test statement as the target write position.

3. The Shmoo test method based on preconditions according to claim 2, wherein, The determining the target vector test statement from the vector test statements includes: Determine the line number information according to the vector position identifier; Determine the first vector test statement indicated by the line number information as the target vector test statement.

4. The Shmoo test method based on preconditions according to claim 1, characterized in that The functional test operation is a functional test statement. The determining the target write position in the test program according to the Shmoo test position information includes: Determine the target functional test statement from multiple functional test statements according to the Shmoo test position information; Set a target breakpoint at the position immediately before the position corresponding to the target functional test statement in the test program; Determine the target breakpoint as the target write position.

5. A Shmoo test device based on preconditions, characterized in that, Includes: A requirement acquisition unit for acquiring test requirement information, where the test requirement information includes test station information, Shmoo test position information, and Shmoo test parameters; A station determination unit for determining the available stations of the ATE tester and determining the target station from the available stations according to the test station information; A write position determination unit for obtaining a test program recording multiple functional test operations and determining the target write position in the test program according to the Shmoo test position information, where the target write position is before the start of the functional test operation; A write unit for configuring the Shmoo test operation according to the Shmoo test parameters and generating a Shmoo test instruction according to the target write position and the Shmoo test operation; A test unit for sending the Shmoo test instruction to the ATE tester for testing to obtain a Shmoo test result; The functional test operation is a functional test item. The Shmoo test position information includes target test item information and target vector information. The determining the target write position in the test program according to the Shmoo test position information includes: Obtain a test vector configuration file, which records the optional test vectors corresponding to each functional test item; Determine the target functional test item from multiple functional test items according to the target test item information; Determine the target test vector from the optional test vectors corresponding to the target functional test item according to the target vector information; Determine the target write position according to the position recorded in the test program of the target test vector, where the target write position is before the start of the target test vector test; The ATE tester is installed with multiple chips under test. The determining the available stations of the ATE tester and determining the target station from the available stations according to the test station information includes: Obtain a pin configuration file, which records the pin configuration information of each station of the ATE tester; Determine the stations corresponding to the pins recorded in the pin configuration file as the available stations; Determine the enabling status of each of the available workstations according to the test workstation information, and determine the available workstations with the enabling status indicating being enabled as the target workstations; The configuring the Shmoo test operation according to the Shmoo test parameters includes: Determine the testable modes and testable parameters of the target workstations according to the pin configuration file; Determine the target test modes and target test parameters of each of the target workstations according to the Shmoo test parameters; Generate the Shmoo test operation according to the target test modes and the target test parameters.

6. An upper computer, comprising: A memory, a processor, and a computer program stored on the memory and executable on the processor, wherein when the processor executes the computer program, the method for Shmoo test based on preconditions as described in any one of claims 1 to 4 is implemented.

7. A computer-readable storage medium storing a computer program, characterized in that, The computer program is used to execute the method for Shmoo test based on preconditions as described in any one of claims 1 to 4.

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