A reflective lighting device and a curved surface detection system

Abstract

This application relates to the field of visual inspection technology, specifically to a reflective illumination device and a curved surface inspection system, which can, to some extent, solve the problem of inconsistent illumination brightness on curved surfaces caused by illumination devices. This application provides a reflective illumination device and a curved surface inspection system. The curved surface inspection system includes a camera and a reflective illumination device. The reflective illumination device includes a coaxial light source and at least one reflector mechanism. The coaxial light source provides coaxial light to the test object, which includes a curved surface. The reflector mechanism facing the curved surface includes a plane reflector and an aspherical reflector. One end of the aspherical reflector is connected to one end of the plane reflector. The plane reflector and the aspherical reflector are used to supplement the illumination of the curved surface. By supplementing the illumination of the curved surface through the reflector mechanism, the illumination distribution of the curved surface is made more uniform, improving the uniformity of the image of the curved surface and further improving the inspection effect of the curved surface.

Description

Technical Field

[0001] This application relates to the field of visual inspection technology, and more specifically, to a reflective illumination device and a curved surface inspection system. Background Technology

[0002] With the development of electronic devices, there are more and more electronic devices with curved structures such as curved screens and curved shells. In the visual inspection of the appearance of electronic devices, it is necessary to inspect the curved structures of electronic devices.

[0003] In particular, the curved structure of an electronic device often includes one or more curved regions. In related technologies, a coaxial light source of a detection illumination device illuminates the curved structure of the electronic device, and different cameras are set at positions perpendicular to the different sub-regions included in each curved region. By capturing curved images of each sub-region through each camera, the curved structure can be detected. Figure 1a A schematic diagram of an existing testing illumination device illuminating electronic equipment, such as... Figure 1a As shown, a coaxial light source 110 illuminates a curved area of ​​a curved structure 120 of an electronic device, and images of different sub-regions within this curved area are captured by multiple cameras.

[0004] However, the illumination angle of the coaxial light source results in different illumination brightness for each sub-region in the curved structure, causing significant grayscale differences in the images captured by each camera. This leads to poor detection results when using these images to detect the curved structure. Summary of the Invention

[0005] To address the problem that existing lighting devices result in varying illumination brightness on curved surfaces, leading to poor detection performance, this application provides a reflective lighting device and a curved surface detection system.

[0006] The embodiments of this application are implemented as follows:

[0007] A first aspect of this application provides a reflective lighting device, including a coaxial light source and at least one reflector mechanism, wherein:

[0008] Coaxial light sources are used to provide coaxial light to test objects, including those with curved surfaces.

[0009] At least one mirror mechanism facing the curved structure, the mirror mechanism including a plane mirror and an aspherical mirror; wherein one end of the aspherical mirror is connected to one end of the plane mirror, and the plane mirror and the aspherical mirror are used to provide supplementary lighting for the curved structure.

[0010] In one possible implementation, the plane mirror faces a first sub-region within a first curved region of the curved structure, and the plane mirror is used for supplementary lighting of the first sub-region;

[0011] An aspherical mirror belonging to the same mirror mechanism as the plane mirror faces the second sub-region in the first curved surface region. The aspherical mirror is used for supplementary lighting in the second sub-region.

[0012] In one possible implementation, the fitting curve of the aspherical mirror corresponds to the aspherical parameters of the aspherical mirror, and the aspherical parameters of the aspherical mirror correspond to the surface radius and radian of the curved surface structure.

[0013] Among them, the aspherical parameters include angle, inner diameter, radius, curvature coefficient, fourth-order aspherical coefficient, and sixth-order aspherical coefficient.

[0014] In one possible implementation, the coaxial light source and the object under test are located on the same reference line, the first angle between the first aspherical mirror and the reference line is smaller than the second angle between the first planar mirror and the reference line, and the first aspherical mirror and the first planar mirror belong to the same mirror mechanism.

[0015] In one possible implementation, the planar mirror is also used to image curved structures.

[0016] In one possible implementation, if the curved structure of the object under test includes N curved regions, the reflective illumination device includes no less than N reflector mechanisms, each of which provides supplementary lighting for the curved regions.

[0017] In one possible implementation, if N is two, the curved surface region includes a second curved surface region and a third curved surface region, and the reflective lighting device includes a second reflector mechanism and a third reflector mechanism.

[0018] The second reflector mechanism includes a second plane reflector and a second aspherical reflector; the third reflector mechanism includes a third plane reflector and a third aspherical reflector.

[0019] The second planar mirror faces the fourth sub-region in the second curved surface region and is used for supplementary lighting of the fourth sub-region in the second curved surface region; the second aspherical mirror faces the fifth sub-region in the second curved surface region and is used for supplementary lighting of the fifth sub-region in the second curved surface region.

[0020] The third plane mirror faces the seventh sub-region in the third curved surface region and is used for supplementary lighting of the seventh sub-region in the third curved surface region; the third aspherical mirror faces the eighth sub-region in the third curved surface region and is used for supplementary lighting of the eighth sub-region in the third curved surface region.

[0021] In one possible implementation, when the second and third curved surface regions are symmetrical about the centerline of the object to be measured, the second and third reflecting mirror mechanisms are also symmetrical about the centerline of the object to be measured.

[0022] In one possible implementation, the distance between the other end of the aspherical mirror and the coaxial light source is no greater than a preset first gap.

[0023] A second aspect of the application provides a surface detection system, including a camera and a reflective illumination device as described in the first aspect;

[0024] The camera receives the light beam reflected from the object under test, including the curved surface structure, through a light source reflector, and the camera is used to photograph the curved surface structure.

[0025] This application provides a reflective illumination device and a curved surface detection system. The curved surface detection system includes a camera and a reflective illumination device. The reflective illumination device includes a coaxial light source and at least one reflector mechanism. The coaxial light source is used to provide coaxial light to the test object, which includes a curved surface structure. The reflector mechanism facing the curved surface structure includes a plane reflector and an aspherical reflector. One end of the aspherical reflector is connected to one end of the plane reflector. The plane reflector and the aspherical reflector are used to supplement the light for the curved surface structure. By supplementing the light for the curved surface structure through the reflector mechanism, the illumination distribution of the curved surface structure is made more uniform, improving the uniformity of the imaging of the curved surface structure and further improving the detection effect of the curved surface structure. Attached Figure Description

[0026] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0027] Figure 1a A schematic diagram of an existing testing illumination device illuminating electronic equipment;

[0028] Figure 1b Show Figure 1a Energy distribution diagram of the curved area under the lighting device;

[0029] Figure 2 A schematic diagram of the structure of a reflective lighting device according to an embodiment of this application is shown;

[0030] Figure 3 This illustration shows a partial light path of coaxial light illuminating the first curved surface region through a mirror mechanism according to an embodiment of this application.

[0031] Figure 4A cross-sectional schematic diagram of the first reflecting mirror mechanism according to an embodiment of this application is shown;

[0032] Figure 5 A schematic diagram of the formula corresponding to a Lambertian light source is shown;

[0033] Figure 6 A schematic diagram of the structure of another reflective lighting device according to an embodiment of this application is shown;

[0034] Figure 7 It shows Figure 6 Energy distribution diagram of curved surface area under reflective lighting device;

[0035] Figure 8 A schematic diagram of the structure of a surface inspection system according to an embodiment of this application is shown;

[0036] Wherein, 110 - coaxial light source; 120 - curved surface structure; 210 - coaxial light source; 220 - coaxial light source; 310 - first reflecting mirror mechanism; 311 - first aspherical reflecting mirror; 321 - first plane reflecting mirror; 320 - second reflecting mirror mechanism; 312 - second aspherical reflecting mirror; 322 - second plane reflecting mirror; 330 - third reflecting mirror mechanism; 313 - third aspherical reflecting mirror; 323 - third plane reflecting mirror; 410 - curved surface structure; 411 - first curved surface region; 4111 - first sub-region; 4112 - second sub-region; 4113 - third sub-region; 420 - curved surface structure; 500 - camera. Detailed Implementation

[0037] To make the objectives, implementation methods and advantages of this application clearer, the exemplary implementation methods of this application will be clearly and completely described below with reference to the accompanying drawings of the exemplary embodiments of this application. Obviously, the described exemplary embodiments are only some embodiments of this application, and not all embodiments.

[0038] It should be noted that the brief descriptions of terms in this application are only for the convenience of understanding the embodiments described below, and are not intended to limit the embodiments of this application. Unless otherwise stated, these terms should be understood in their ordinary and common meaning.

[0039] The terms "first," "second," "third," etc., used in the specification, claims, and accompanying drawings of this application are used to distinguish similar or related objects or entities, and do not necessarily imply a specific order or sequence, unless otherwise specified. It should be understood that such terms are interchangeable where appropriate.

[0040] The terms “comprising” and “having”, and any variations thereof, are intended to cover but not exclude inclusion, for example, a product or device that includes a range of components is not necessarily limited to all of the components that are clearly listed, but may include other components that are not clearly listed or that are inherent to such product or device.

[0041] Electronic devices have curved structures such as curved screens and curved shells. The inspection of the appearance of electronic devices involves the inspection of curved structures. The curved structure of an electronic device often includes one or more curved surfaces (i.e. curved areas). For example, a curved screen has two curved areas.

[0042] When a coaxial light source in a detection illumination device illuminates the curved structure of an electronic device, the illumination angle is uniform. However, due to the structural characteristics of the curved structure, the angle at which the light reaches different locations within the curved area varies. This means that the illumination is uneven across different sub-regions of the curved surface, resulting in significant grayscale differences. For example, when the coaxial light source illuminates the center of the curved surface perpendicularly, the image captured by the camera will show a grayscale distribution that is bright in the center and dark at the edges. Related technologies have attempted to detect the curved structure by placing different cameras perpendicular to the different sub-regions of the curved surface and capturing images of each sub-region. However, the varying illumination angles of the coaxial light source result in different brightness levels across the sub-regions of the curved structure, leading to significant grayscale differences in the images captured by each camera. This results in poor detection performance when using these images for the curved structure, especially when the curved structure exhibits specular reflections, where the grayscale differences between different images are even more pronounced and have a greater impact on the detection results.

[0043] In some related technical solutions, shooting multiple sub-regions requires setting up multiple cameras, which in turn requires the corresponding detection system to set up multiple camera installation areas, resulting in a large space required for the detection system and increased demand on cameras.

[0044] Figure 1b Show Figure 1a Energy distribution diagram of curved area under lighting device, such as Figure 1b As shown, Figure 1a The grayscale difference in the energy distribution diagram of the curved area of ​​the lighting device is 96. The two sides of the curved area are dark and the middle is bright. It should be understood that the grayscale distribution of the curved area ranges from 0 to 255, that is, from black to white. The smaller the difference, the more uniform the lighting.

[0045] To address the varying illumination brightness of a curved surface structure by an illumination device, this application provides a reflective illumination device and a curved surface detection system. The curved surface detection system includes a camera and a reflective illumination device. The reflective illumination device includes a coaxial light source and at least one reflector mechanism. The coaxial light source provides coaxial light to the test object, which includes a curved surface structure. The reflector mechanism facing the curved surface structure includes a plane reflector and an aspherical reflector. One end of the aspherical reflector is connected to one end of the plane reflector. The plane reflector and the aspherical reflector are used to supplement the illumination of the curved surface structure. By supplementing the illumination of the curved surface structure through the reflector mechanism, the illumination distribution of the curved surface structure becomes more uniform, improving the uniformity of the imaging of the curved surface structure and further enhancing the detection effect of the curved surface structure.

[0046] The following describes the reflective lighting device according to the embodiments of this application in detail with reference to the accompanying drawings.

[0047] This application provides a reflective lighting device, including a coaxial light source and at least one reflector mechanism. Figure 2 A schematic diagram of a reflective lighting device according to an embodiment of this application is shown, as follows: Figure 2 As shown, the reflective lighting device includes a coaxial light source 210 and a reflector mechanism (i.e., the first reflector mechanism 310).

[0048] The coaxial light source 210 is used to provide coaxial light to the test object including the curved surface structure 410, that is, to provide uniform illumination. It should be noted that the coaxial light is a forward light.

[0049] It should be noted that the power of the coaxial light source 210 is adjustable. Power is a value that reflects brightness. In order to adapt to the camera's movement speed, the faster the speed, the higher the power.

[0050] For example, the power of the coaxial light source 210 can be 450W-500W.

[0051] like Figure 2 As shown, the coaxial light source 210 only includes a light source. In some embodiments, the coaxial light source 210 includes a light source and a light source reflector, which is disposed between the light source of the coaxial light source 210 and the reflector mechanism included in the reflective lighting device.

[0052] The first reflecting mirror mechanism 310 includes a first planar reflecting mirror 321 and a first aspherical reflecting mirror 311, wherein one end of the first aspherical reflecting mirror 311 is connected to one end of the first planar reflecting mirror 321.

[0053] The first reflecting mirror mechanism 310 faces the curved surface structure 410 of the object to be measured. That is, the first plane reflecting mirror 321 and the first aspherical reflecting mirror 311 both face the curved surface structure 410. The first plane reflecting mirror 321 and the first aspherical reflecting mirror 311 are used to supplement the light for the curved surface structure 410, so that the illumination distribution of the curved surface structure 410 is more uniform and the uniformity of the imaging of the curved surface structure 410 is improved.

[0054] Meanwhile, the plane mirror can also be used to image the curved structure 410. Based on the reversibility of light, we can understand that during the imaging process of the curved structure, the curved area can be imaged by the plane mirror. That is to say, after the light from the coaxial light source is irradiated onto the curved area through the mirror mechanism, the curved area is imaged by the plane mirror, which further improves the uniformity of the imaging of the curved area.

[0055] It should be noted that the distance between the coaxial light source 210 and the object under test is determined by various factors, including the size of the object under test, the size of the curved structure 410 in the object under test, and the application scenario of the reflective lighting source. This distance can be a preset value, which can be set by the designer based on experience. Based on this preset value, the first planar reflector 321 and the first aspherical reflector 311 in the first reflector structure are optimized. For example, the distance between the coaxial light source 210 and the curved structure under test is 65mm-75mm.

[0056] If the aforementioned distance changes, the setting angles of the plane mirror and aspherical mirror in the corresponding reflector mechanism may change, as may the dimensions and other parameters of the plane mirror and aspherical mirror.

[0057] When the curved surface structure 410 includes a first curved surface region 411, the first reflecting mirror mechanism 310 faces the first curved surface region 411 of the object to be measured. Figure 3 This illustration shows a partial light path of coaxial light illuminating a first curved surface region through a mirror mechanism, as shown in the embodiment of this application. Figure 2 , Figure 3 As shown, the first planar reflector 321 faces the first sub-region 4111 in the first curved surface region 411, and the first planar reflector 321 is used for supplementary lighting of the first sub-region 4111; the first aspherical reflector 311 faces the second sub-region 4112 in the first curved surface region 411, and the first aspherical reflector 311 is used for supplementary lighting of the second sub-region 4112.

[0058] Figure 4 A cross-sectional schematic diagram of the first reflecting mirror mechanism according to an embodiment of this application is shown, as follows: Figure 4The diagram shown is a cross-sectional view with the coaxial light source 210 and the object under test on the same reference line. The first angle β between the first aspherical mirror 311 and the reference line is smaller than the second angle γ between the first planar mirror 321 and the reference line.

[0059] The first and second included angles play an important role in determining the uniformity of the curved surface region of the object under test. The first included angle determines the angle of the first aspherical mirror 311 toward the first curved surface region 411, as well as the range of the angle. The second included angle determines the angle of the first planar mirror 321 toward the first curved surface region 411, as well as the range of the angle.

[0060] For example, the first aspherical mirror 311 has a first angle of 25° with the reference line, and the first planar mirror 321 has a second angle of 35° with the reference line. The first angle is smaller than the second angle.

[0061] like Figure 3 As shown, the first part of the light emitted by the coaxial light source 210 illuminates the planar region of the curved structure 410 and the third sub-region 4113 in the first curved region 411. The second part of the light emitted by the coaxial light source 210 illuminates the second sub-region 4112 in the first curved region 411 through the first aspherical reflector 311. The third part of the light emitted by the coaxial light source 210 illuminates the first sub-region 4111 in the first curved region 411 through the first planar reflector 321.

[0062] The first sub-region 4111, the second sub-region 4112, and the third sub-region 4113 are connected in sequence. The second sub-region 4112 is the rounded corner part in the first curved surface region 411. The illumination of the rounded corner part corresponding to the second sub-region 4112 needs to be supplemented by first aspherical reflectors 311 with different curvatures at each position. The first aspherical reflectors 311 can change the light emitted by the coaxial light source 210 into light at different angles and uniformly cover the rounded corner part.

[0063] For example, the first part of the light beam has an angle of 0° with the horizontal, and the illuminance covers the planar area of ​​the curved surface structure 410 and the first curved surface area 411 from 0° to 20° (i.e., the third sub-region 4113); the second part of the light beam has an angle of 0° with the horizontal, and the direction of the light beam is changed by the first aspherical reflector 311, providing light beams at different angles, illuminating the first curved surface area 411 from 20° to 70° (i.e., the second sub-region 4112); the third part of the light beam has an angle of 0° with the horizontal, and the direction of the light beam is changed by the first flat reflector, illuminating the first curved surface area 411 from 70° to 90° (i.e., the first sub-region 4111).

[0064] For the first aspherical mirror 311, its fitting curve corresponds to the aspherical parameters of the first aspherical mirror 311, and the aspherical parameters of the first aspherical mirror 311 correspond to the surface radius and radian of the curved surface structure 410; that is, the aspherical parameters of the first aspherical mirror 311 correspond to the surface radius and radian of the first curved surface region 411; among them, the aspherical parameters include angle, inner diameter, radius, curvature coefficient, 4th order aspherical coefficient, and 6th order aspherical coefficient.

[0065] It should be understood that the fitted curve corresponds to the cross-sectional surface of the aspherical mirror.

[0066] Therefore, in this application, the aspherical parameters of the corresponding aspherical reflector can be determined based on the radius and radian of the curved surface region to be detected. Then, based on the aspherical parameters, the fitting curve of the aspherical reflector can be determined. Finally, based on the fitting curve of the aspherical reflector, a suitable aspherical reflector can be selected to obtain a reflective lighting device that meets the requirements.

[0067] For the first aspherical mirror 311, through reverse reasoning, its fitting curve corresponds to the aspherical parameters of the first aspherical mirror 311, and the aspherical parameters of the first aspherical mirror 311 correspond to the radius and curvature of the curved surface structure 410. The light emitted by the coaxial light source 210 illuminates the object under test, which includes the curved surface structure 410, and is then reflected and collected by the acquisition device. Through the reversibility of the optical path, the curved surface structure can be assumed to be the light source, and the aspherical mirror can be determined in reverse.

[0068] First, if we assume the curved surface structure 410 is a light source, and according to the Lambertian formula for a light source:

[0069] I θ =I0cosθ

[0070] In the formula, I0 is the luminous intensity in the direction perpendicular to the light source, θ is the angle with the vertical direction, and I θ Let θ be the luminous intensity at the angle θ with respect to the vertical direction.

[0071] Figure 5 A schematic diagram of the formula corresponding to a Lambertian light source is shown. Combined with the above formula, it can be seen that the larger the included angle θ, the greater the luminous intensity I. θ The smaller.

[0072] If a Lambertian light source with a divergence angle of 66.6° is perpendicularly incident on a plane, the light intensity at the center is 25% higher than that at the ends. If the radius of curvature of the first curved surface region 411 is 1.34 mm and the radian is 1.162 rad, the light intensity perpendicularly incident on the center of the first curved surface region 411 is 40% higher than that at the ends of the curved surface.

[0073] Secondly, if the first curved surface region 411 of the curved surface structure 410 is uniform, the light directly reflected to the acquisition device will definitely be non-uniform. By setting the first aspherical reflector 311 of the first reflecting mirror mechanism 310, and continuously updating the correspondence between the surface radius and radian of the first curved surface region 411 and the aspherical parameters (angle, inner diameter, radius, curvature coefficient, 4th-order aspherical coefficient, 6th-order aspherical coefficient) of the first aspherical reflector 311, and the correspondence between the aspherical parameters of the first aspherical reflector 311 and the fitting curve of the first aspherical reflector 311, the light reflected to the acquisition device is made uniform. This corresponds to the first aspherical reflector 311.

[0074] The fitting curve for the first aspherical mirror 311 can be calculated using the following formula:

[0075]

[0076] In the formula, r is the X coordinate, z is the Y coordinate, c is the curvature, and c = 1 / R, R is the radius of the aspherical mirror, k is the aspherical coefficient (curvature coefficient), α1 is the 4th order coefficient, and α2 is the 6th order coefficient.

[0077] For example, if the aspherical parameters of the first aspherical mirror 311 are: inner diameter 78.4 mm, radius 127.9 mm, curvature coefficient -0.78, 4th order aspherical coefficient 1.7505E-7, and 6th order aspherical coefficient 3.5528E-11, the fitting curve of the first aspherical mirror 311 can be calculated using the above formula.

[0078] The reflective illumination device includes a coaxial light source 210 and a reflector mechanism. The coaxial light source 210 is used to provide coaxial light to the test object including the curved structure 410. The reflector mechanism facing the curved structure 410 includes a plane reflector and an aspherical reflector. One end of the aspherical reflector is connected to one end of the plane reflector. The plane reflector and the aspherical reflector are used to supplement the light for the curved structure 410. By supplementing the light for the curved structure 410 through the reflector mechanism, the illumination distribution of the curved structure 410 is made more uniform, thereby improving the uniformity of the imaging of the curved structure 410.

[0079] It should be understood that if the curved surface structure 410 of the object to be tested includes N curved surface regions, the reflective illumination device includes no less than N reflector mechanisms, and each reflector mechanism provides supplementary lighting for the curved surface regions.

[0080] Figure 6 A schematic diagram of the structure of another reflective lighting device according to an embodiment of this application is shown, such as... Figure 6As shown, if N is two (i.e., the curved surface region includes the second curved surface region and the third curved surface region), the reflective lighting device includes a coaxial light source 210, a second reflector mechanism 320 and a third reflector mechanism 330.

[0081] The coaxial light source 210 is used to provide coaxial light to the object under test, including the curved surface structure 420, that is, to provide uniform illumination. The power of the coaxial light source 210 is adjustable, and the power is a value that reflects the brightness. In order to adapt to the movement speed of the camera 500, the faster the speed, the higher the power. The camera 500 can be a line scan camera 500.

[0082] like Figure 6 As shown, the coaxial light source 210 only includes a light source. In some embodiments, the coaxial light source 210 includes a light source and a light source reflector, which is disposed between the light source of the coaxial light source 210 and the reflector mechanism included in the reflective lighting device.

[0083] The second reflecting mirror mechanism 320 includes a second planar reflecting mirror 322 and a second aspherical reflecting mirror 312. The second planar reflecting mirror 322 faces the fourth sub-region of the second curved surface region and is used for supplementary lighting of the fourth sub-region. The second aspherical reflecting mirror 312 faces the fifth sub-region of the second curved surface region and is used for supplementary lighting of the fifth sub-region. Simultaneously, light from the coaxial light source 210 directly illuminates the sixth sub-region of the second curved surface region.

[0084] The third reflecting mirror mechanism 330 includes a third planar reflecting mirror 323 and a third aspherical reflecting mirror 313; wherein, the third planar reflecting mirror 323 faces the seventh sub-region in the third curved surface region and is used for supplementary lighting of the seventh sub-region in the third curved surface region; the third aspherical reflecting mirror 313 faces the eighth sub-region in the third curved surface region and is used for supplementary lighting of the eighth sub-region in the third curved surface region; at the same time, the light from the coaxial light source 210 directly illuminates the ninth sub-region of the third curved surface region.

[0085] In some embodiments, when the second curved surface region and the third curved surface region are symmetrical about the centerline of the object under test, the second reflecting mirror mechanism 320 and the third reflecting mirror mechanism 330 are symmetrical about the centerline of the object under test. At this time, the second aspherical reflecting mirror 312 and the third aspherical reflecting mirror 313 are symmetrical about the centerline of the object under test; the second plane reflecting mirror 322 and the third plane reflecting mirror 323 are symmetrical about the centerline of the object under test; the fourth sub-region and the seventh sub-region are symmetrical about the centerline of the object under test; the fifth sub-region and the eighth sub-region are symmetrical about the centerline of the object under test; and the sixth sub-region and the ninth sub-region are symmetrical about the centerline of the object under test.

[0086] For example, the center distance between the second aspherical mirror 312 and the third aspherical mirror 313 can be 50 mm; the center distance between the second plane mirror 322 and the third plane mirror 323 can be 26 mm.

[0087] Of course, the second surface region includes the fourth, fifth and sixth sub-regions, and the third surface region includes the seventh, eighth and ninth sub-regions.

[0088] The principles of the second reflecting mirror mechanism 320 and the third reflecting mirror mechanism 330 for supplementing light to the second and third curved surface regions, respectively, are the same as those of... Figures 2 to 5 The descriptions are the same, so I will not repeat them here.

[0089] In some embodiments, the distance between one side of the second reflector mechanism 320 and one side of the third reflector mechanism 330 and the coaxial light source 210 is not greater than a preset first gap, for example, the preset first gap can be 5mm, so that the coaxial light source 210, the second reflector mechanism 320, the third reflector mechanism 330 and the object to be tested form an approximately closed space, thereby improving the utilization rate of the light from the coaxial light source 210.

[0090] In some embodiments, when the angles between the second plane mirror 322 and the third plane mirror 323 and the horizontal are both the second angle, the angle that can be reflected is twice the second angle through the reflection conversion between the second mirror and the third mirror.

[0091] For example, if the second included angle is 35°, the second plane mirror 322 and the third plane mirror 323 form an image to the left and right. The 35° reflection is converted into direct observation, which means observing the object under test at 70° (the angle with the horizontal). If the second included angle is 45°, it is equivalent to being perpendicular to the object under test.

[0092] Figure 7 It shows Figure 6 Energy distribution diagram of curved area under reflective lighting device, such as Figure 7 As shown, Figure 6 The grayscale difference in the energy distribution map of the curved area of ​​the reflective lighting device is 30. Because of the smaller the difference in grayscale distribution in the curved area, the more uniform the illumination. This can be observed through comparison. Figure 7 and Figure 1b The reflective lighting device in this application embodiment uses a reflector mechanism to supplement the light, making the lighting on the curved surface area more uniform.

[0093] In some embodiments, if N is four (i.e., the curved surface region includes a fourth curved surface region, a fifth curved surface region, a sixth curved surface region, and a seventh curved surface region), the reflective lighting device includes a coaxial light source 210, a fourth reflector mechanism, a fifth reflector mechanism, a sixth reflector mechanism, and a seventh reflector mechanism; wherein, the fourth reflector mechanism is used to supplement light for the fourth curved surface region; the fifth reflector mechanism is used to supplement light for the fifth curved surface region; the sixth reflector mechanism is used to supplement light for the sixth curved surface region; and the seventh reflector mechanism is used to supplement light for the seventh curved surface region.

[0094] If the fourth and fifth curved surface regions are symmetrical about the center line of the object to be measured, and the sixth and seventh curved surface regions are symmetrical about the center line of the object to be measured, then the fourth and fifth reflecting mirror mechanisms are symmetrical about the center line of the object to be measured, and the seventh and eighth reflecting mirror mechanisms are symmetrical about the center line of the object to be measured.

[0095] In some embodiments, the line connecting the fourth and fifth curved surface regions is perpendicular to the line connecting the sixth and seventh curved surface regions; the line connecting the fourth and fifth reflector mechanisms is perpendicular to the line connecting the sixth and seventh reflector mechanisms.

[0096] The principles of the fourth, fifth, sixth, and seventh reflecting mirror mechanisms for supplementing light to the fourth, fifth, sixth, and seventh curved surface regions, respectively, are as follows: Figures 2 to 7 The descriptions are the same, so I will not repeat them here.

[0097] The reflective illumination device includes a coaxial light source 210 and at least one reflector mechanism. The coaxial light source 210 is used to provide coaxial light to the test object including the curved structure 420. The reflector mechanism facing the curved structure 420 includes a plane reflector and an aspherical reflector. One end of the aspherical reflector is connected to one end of the plane reflector. The plane reflector and the aspherical reflector are used to supplement the light for the curved structure 420. By supplementing the light for the curved structure 420 through the reflector mechanism, the illumination distribution of the curved structure 420 is made more uniform, thereby improving the uniformity of the imaging of the curved structure 420.

[0098] Figure 8 A schematic diagram of the structure of a surface inspection system according to an embodiment of this application is shown, as follows: Figure 8 The curved surface detection system includes a camera 500 and a reflective illumination device; wherein, the camera 500 receives the light beam reflected by the object under test, including the curved surface structure 420, through a light source reflector, and the camera 500 is used to photograph the curved surface structure 420.

[0099] This surface inspection system requires only one camera 500 to photograph the object under test, and can photograph one or more curved areas of the object under test. In other words, during the construction of the surface inspection system, only the installation area of ​​one camera is needed to meet the construction requirements of the surface inspection system, reducing the space required for the construction of the surface inspection system.

[0100] It should be understood that, Figure 8 The coaxial light source 220 includes a light source and a light source reflector, which is disposed between the light source of the coaxial light source 220 and the reflector mechanism included in the reflective lighting device.

[0101] In some embodiments, the coaxial light source includes only the light source. In this case, the curved surface detection system includes a camera, a light source reflector, and a reflective illumination device. The light source reflector is disposed between the coaxial light source included in the reflective illumination device and the reflector mechanism included in the reflective illumination device. The camera receives the light beam reflected by the test object including the curved surface structure through the light source reflector, and the camera is used to photograph the curved surface structure.

[0102] In the curved surface inspection system, during the imaging process of the curved surface structure, the curved surface area can be imaged by the plane mirror in the mirror mechanism. That is to say, after the light from the coaxial light source is irradiated onto the curved surface area through the mirror mechanism, the camera can also image the curved surface area through the plane mirror, further improving the uniformity of the imaging of the curved surface area.

[0103] The reflected illumination device in the above-mentioned curved surface inspection system and Figures 2 to 7 The principle of reflecting lighting devices is the same, so it will not be repeated here.

[0104] This application provides a curved surface detection system, which includes a camera 500 and a reflective illumination device. The reflective illumination device includes a coaxial light source 220 and at least one reflector mechanism. The coaxial light source 220 is used to provide coaxial light to the test object including the curved surface structure 420. The reflector mechanism facing the curved surface structure 420 includes a plane reflector and an aspherical reflector. One end of the aspherical reflector is connected to one end of the plane reflector. The plane reflector and the aspherical reflector are used to supplement the light for the curved surface structure 420. By supplementing the light for the curved surface structure 420 through the reflector mechanism, the illumination distribution of the curved surface structure 420 is made more uniform, improving the uniformity of the imaging of the curved surface structure 420 and further improving the detection effect of the curved surface structure 420.

[0105] The following paragraphs will compare and list the Chinese terms used in this application specification and their corresponding English terms to facilitate reading and understanding.

[0106] For ease of explanation, the above description has been provided in conjunction with specific embodiments. However, the discussion in some embodiments above is not intended to be exhaustive or to limit the embodiments to the specific forms disclosed above. Various modifications and variations can be obtained based on the above teachings. The selection and description of the above embodiments are for the purpose of better explaining the principles and practical applications, thereby enabling those skilled in the art to better utilize the embodiments and various different variations of the embodiments suitable for specific application considerations.

Claims

1. A reflective illumination device, characterized in that The application relates to a reflection illuminating device. A coaxial light source is arranged to provide coaxial light for a test object including a curved structure; At least one mirror mechanism is arranged to face the curved structure, and the mirror mechanism includes a plane mirror and an aspheric mirror; one end of the aspheric mirror is connected to one end of the plane mirror, and the plane mirror and the aspheric mirror are respectively arranged to provide light compensation for the curved structure; A fitting curve of the aspheric mirror corresponds to aspheric parameters of the aspheric mirror, and the aspheric parameters correspond to a curved radius and an arc of the curved structure; The aspheric parameters include an angle, an inner diameter, a radius, a curvature coefficient, a 4th-order aspheric coefficient and a 6th-order aspheric coefficient; If the curved structure of the test object includes N curved regions, the reflection illuminating device includes no less than N mirror mechanisms, and each mirror mechanism is arranged to provide light compensation for the curved regions.

2. The reflection illuminating device according to claim 1, wherein: The plane mirror faces a first sub-region in a first curved region included in the curved structure, and the plane mirror is arranged to provide light compensation for the first sub-region; The aspheric mirror belonging to the same mirror mechanism as the plane mirror faces a second sub-region in the first curved region, and the aspheric mirror is arranged to provide light compensation for the second sub-region.

3. The reflective illumination device of claim 1, wherein, The coaxial light source and the test object are located on the same reference line, a first included angle between a first aspheric mirror and the reference line is smaller than a second included angle between a first plane mirror and the reference line, and the first aspheric mirror and the first plane mirror belong to the same mirror mechanism.

4. The reflective illumination device of claim 1, wherein, The plane mirror is further arranged to image the curved structure.

5. The retro-illumination device of claim 1, wherein, If N is two, the curved regions include a second curved region and a third curved region, and the reflection illuminating device includes a second mirror mechanism and a third mirror mechanism; The second mirror mechanism includes a second plane mirror and a second aspheric mirror, and the third mirror mechanism includes a third plane mirror and a third aspheric mirror; The second plane mirror faces a fourth sub-region in the second curved region, and the second plane mirror is arranged to provide light compensation for the fourth sub-region in the second curved region; the second aspheric mirror faces a fifth sub-region in the second curved region, and the second aspheric mirror is arranged to provide light compensation for the fifth sub-region in the second curved region; The third plane mirror faces a seventh sub-region in the third curved region, and the third plane mirror is arranged to provide light compensation for the seventh sub-region in the third curved region; the third aspheric mirror faces an eighth sub-region in the third curved region, and the third aspheric mirror is arranged to provide light compensation for the eighth sub-region in the third curved region.

6. The reflector illumination device according to claim 5, characterized in that When the second curved region and the third curved region are centrally symmetrical with respect to a center line of the test object, the second mirror mechanism and the third mirror mechanism are centrally symmetrical with respect to the center line of the test object.

7. The retro-illumination device of claim 1, wherein, A distance between the other end of the aspheric mirror and the coaxial light source is not greater than a preset first interval.

8. A curved surface detection system characterized by, The camera receives a light beam reflected by the object to be measured including a curved structure, and the camera is configured to take a picture of the curved structure. The camera receives a light beam reflected by the object to be measured including a curved structure, and the camera is configured to take a picture of the curved structure.

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