Semiconductor laser array monobloc testing device and method

Abstract

The application provides a semiconductor laser array single-bar testing device and method, and the device comprises a base plate, a liquid cooling seat for passing cooling liquid into a micro-channel single-bar, a positive pole block for connecting a positive pole of a power supply and conducting electricity of a positive pole of the micro-channel single-bar, a negative pole block for connecting a negative pole of the power supply and conducting electricity of a negative pole of the micro-channel single-bar, a conductive voltage block for conducting the positive pole and the negative pole of the micro-channel single-bar and sealing with a sealing ring of the micro-channel single-bar, and a driving unit connected with the conductive voltage block and used for controlling a moving speed and a force of the conductive voltage block. The device adopts the driving unit to control the moving speed and the force of the conductive voltage block, the pressing force of the conductive voltage block is adjustable, and then the compression amount of the sealing ring can be adaptively adjusted for each micro-channel single-bar product, so that the problems of micro-channel single-bar deformation and poor sealing caused by the uncontrolled fastening force of the manual adjustment of fastening members in the prior art are avoided.

Description

Technical Field

[0001] This invention relates to the field of laser technology, and in particular to a single-bar testing device and method for semiconductor laser arrays. Background Technology

[0002] Semiconductor lasers, as highly reliable light sources, are characterized by low power consumption, light weight, long lifespan, small size, and low cost, and are widely used in laser display technology, photodynamic therapy, stage lighting, and laser illumination. A semiconductor laser array consists of multiple bars, which can be stacked. Each bar has a microchannel structure. Strict evaluation standards exist for microchannel single bars; only those that meet these standards are eligible for use.

[0003] In the process of realizing this invention, the inventors discovered that the prior art has at least the following problems: Currently, the testing of microchannel monobars uses fasteners to sequentially fix the negative electrode block, microchannel monobar, and positive electrode block together to complete the sealing. The tightening force of the fasteners is difficult to adjust manually, and the compression of the sealing ring is difficult to control. If the tightening force is too large, the negative electrode of the microchannel monobar may be twisted and deformed, which will in turn generate stress on the microchannel monobar and affect its photoelectric performance, causing damage during the test. In addition, the testing efficiency of the manual tightening method is low, and there is room for improvement. Summary of the Invention

[0004] The present invention aims to at least partially solve one of the technical problems in the related art.

[0005] Therefore, the purpose of this invention is to provide a single-bar testing device and method for semiconductor laser arrays, which has a simple structure, is easy to operate, has high production efficiency, and avoids twisting and deformation caused by pressing and sealing the single bar of the microchannel.

[0006] To achieve the above objectives, the first aspect of the present invention provides a semiconductor laser array single-bar testing device, comprising a base plate, a liquid cooling base, a positive electrode block, and a negative electrode block. The liquid cooling base is used to circulate coolant into the microchannel single bar. The positive electrode block is connected to the positive terminal of a power supply to conduct electricity to the positive terminal of the microchannel single bar. The negative electrode block is connected to the negative terminal of a power supply to conduct electricity to the negative terminal of the microchannel single bar. The device also includes:

[0007] A voltage-conducting block is used to conduct the positive and negative electrodes of the microchannel monobar under force and to seal it with the sealing ring of the microchannel monobar.

[0008] A drive unit, connected to the voltage-conducting block, is used to control the moving speed and force of the voltage-conducting block.

[0009] The semiconductor laser array single-bar testing device according to the present application realizes multifunctionalization of the conductive pressure block by conducting the positive and negative poles of the micro-channel single bar through the conductive pressure block, and the conductive pressure block also plays a sealing role with the sealing ring of the micro-channel single bar. The device adopts a driving unit to control the movement and force of the conductive pressure block, the pressing force of the conductive pressure block is adjustable, and then the compression amount of the sealing ring can be adaptively adjusted for each micro-channel single bar product, thereby avoiding the problems of micro-channel single bar deformation and poor sealing caused by the difficulty in controlling the fastening force due to manual adjustment of the fastener in the prior art. The device has simple structure and convenient operation, and the testing efficiency of the micro-channel single bar is improved.

[0010] According to an embodiment of the present application, a connecting lug is arranged on the negative block, and the connecting lug is hinged to the conductive pressure block.

[0011] According to an embodiment of the present application, the liquid cooling seat has a first liquid cooling pipeline in the inside, and the liquid inlet and the liquid outlet are arranged on the first face of the liquid cooling seat and communicate with the first liquid cooling pipeline.

[0012] According to an embodiment of the present application, the positive block is arranged on the second face of the liquid cooling seat, the positive block has a second liquid cooling pipeline penetrating through, the second liquid cooling pipeline communicates with the first liquid cooling pipeline, the micro-channel single bar has a liquid inlet hole and a liquid outlet hole, and the liquid inlet hole and the liquid outlet hole communicate with the second liquid cooling pipeline on the second face of the liquid cooling seat, and the outer ring of the liquid inlet hole and the liquid outlet hole is provided with the sealing ring.

[0013] According to an embodiment of the present application, a clamping groove is arranged on the second face of the positive block, and the micro-channel single bar is arranged in the clamping groove.

[0014] According to an embodiment of the present application, the negative block is arranged on the second face of the liquid cooling seat, and the negative block is separated from the positive block.

[0015] According to an embodiment of the present application, the weight of the connecting lug to the first end of the conductive pressure block is greater than the weight of the connecting lug to the second end of the conductive pressure block.

[0016] According to an embodiment of the present application, the conductive pressure block comprises a first conductive pressure block and a second conductive pressure block, the micro-channel single bar comprises a first micro-channel single bar and a second micro-channel single bar, the first conductive pressure block is arranged opposite to the first micro-channel single bar, and the second conductive pressure block is arranged opposite to the second micro-channel single bar.

[0017] According to one embodiment of the present application, the driving unit is a lifting platform, which comprises a pedestal, a switch, a push rod and a connecting rod, the pedestal is installed on the bottom plate, the first end of the push rod is located in the pedestal, the second end of the push rod is hinged with the connecting rod, and the connecting rod is used for abutting against and applying external force to the conductive pressure block; in the on state of the switch, the push rod extends in the first direction, and in the off state of the switch, the push rod retracts in the reverse direction of the first direction.

[0018] According to one embodiment of the present application, the moving unit further comprises a sliding rail and a sliding block, the sliding rail is arranged on the bottom plate in the second direction, and the sliding block is slidably arranged on the sliding rail, and the liquid cooling seat is fixedly connected with the sliding block.

[0019] The second aspect of the present application provides a semiconductor laser array single-bar testing method, which is completed by using the semiconductor laser array single-bar testing device of the first aspect.

[0020] The first micro-channel single-bar is installed on the positive electrode block;

[0021] The switch is turned on, the push rod extends in the first direction, the first end of the first conductive pressure block is lifted, the second end of the first conductive pressure block is pressed downward, the first conductive pressure block is sealed with the sealing ring of the first micro-channel single-bar, and the positive electrode block and the negative electrode block are communicated;

[0022] The cooling liquid is supplied to the liquid cooling seat, the positive electrode of the power supply is connected to the positive electrode block, the negative electrode of the power supply is connected to the negative electrode block, and the power supply is turned on to test the first micro-channel single-bar.

[0023] After the test is completed, the supply of the cooling liquid and the power supply is turned off, the switch is turned off, the push rod retracts in the reverse direction of the first direction, and the second end of the first conductive pressure block is away from the first micro-channel single-bar.

[0024] According to the semiconductor laser array single-bar testing method provided by the embodiment of the present application, the conductive pressure block is used for conducting electricity and sealing, the compression amount of the sealing ring, that is, the pressing degree, can be adjusted adaptively for each micro-channel single-bar product, and the problems of micro-channel single-bar deformation and poor sealing caused by the difficulty in controlling the fastening degree of the fastener in the prior art are avoided. The method is simple to operate, and compared with the existing manual fastening sealing mode, the efficiency can be improved.

[0025] According to one embodiment of the present application, the moving unit further comprises:

[0026] The liquid cooling seat is moved in the second direction by using the moving unit, so that the second conductive pressure block is aligned with the connecting rod;

[0027] The positive electrode and the negative electrode of the second micro-channel single-bar are conducted by using the second conductive pressure block, and the second conductive pressure block is sealed with the sealing ring of the second micro-channel single-bar.

[0028] Additional aspects and advantages of the present application will be in part apparent and in part pointed out hereinafter. BRIEF DESCRIPTION OF DRAWINGS

[0029] The above and / or additional aspects and advantages of the present application will become apparent and be more readily understood through consideration of the following description, taken in conjunction with the accompanying drawings, in which:

[0030] Figure 1 is a structural schematic diagram of a semiconductor laser array single-bar testing device according to an embodiment of the present application.

[0031] Figure 2 is a structural schematic diagram of a semiconductor laser array single-bar testing device omitting a conductive voltage block according to an embodiment of the present application.

[0032] Figure 3 is a working state schematic diagram of a semiconductor laser array single-bar testing device according to an embodiment of the present application.

[0033] Figure 4 is a structural schematic diagram of a first micro-channel single-bar of a semiconductor laser array single-bar testing device according to an embodiment of the present application.

[0034] Figure 5 is a structural schematic diagram of a second micro-channel single-bar of a semiconductor laser array single-bar testing device according to an embodiment of the present application.

[0035] Figure 6 is a flow schematic diagram of a semiconductor laser array single-bar testing method according to an embodiment of the present application.

[0036] BRIEF DESCRIPTION OF DRAWINGS

[0037] 1 - base plate, 2 - slide rail, 3 - slide block, 4 - liquid cooling seat, 5 - positive electrode block, 6 - negative electrode block, 7 - conductive voltage block, 8 - lifting platform, 9 - insulating block, 10 - connecting lug, 11 - bolt, 12 - first micro-channel single-bar, 13 - second micro-channel single-bar, 14 - liquid inlet, 15 - liquid outlet, 16 - clamping groove, 17 - insertion core, 18 - sealing ring, 19 - liquid inlet hole, 20 - liquid outlet hole, 21 - first groove, 22 - insulating pad, 23 - positive electrode heat sink, 24 - negative electrode sheet, 25 - second groove, 26 - opening, 71 - first conductive voltage block, 72 - second conductive voltage block, 81 - pedestal, 82 - switch, 83 - push rod, 84 - connecting rod, 85 - connecting plate. DETAILED DESCRIPTION

[0038] Embodiments of the present application are described in detail below with reference to the attached drawing figures, wherein the same or like component having the same or similar function is denoted by the same or like reference numerals throughout the attached drawing figures. The embodiments described below are exemplary only, and are not to be construed as limiting the present application. Rather, the embodiments of the present application encompass all modifications, variations, and alternatives that fall within the spirit and scope of the appended claims.

[0039] The micro-channel single-bar has a built-in cooling liquid channel, and has high heat dissipation efficiency. Referring to Figure 4 A common micro-channel single-bar includes, from bottom to top, a positive electrode heat sink 23, an insulating pad 22, and a negative electrode plate 24. The micro-channel single-bar has a liquid inlet hole 14 and a liquid outlet hole 15 penetratingly arranged thereon. The outer circle of the liquid inlet hole and the liquid outlet hole has a circular groove for mounting a sealing ring 18. In order to fix the micro-channel single-bar with the positive electrode block and the negative electrode block, at least one fixing hole needs to be opened on the micro-channel single-bar.

[0040] In the prior art, the micro-channel single-bar is generally fixed by penetrating a fastener through the fixing hole, such as using a screw to fix the negative electrode block, the micro-channel single-bar, and the positive electrode block. The fastener is not conducive to uniform contact of the entire negative electrode plate with the negative electrode block, and point contact or virtual contact is prone to occur, thereby causing the micro-channel single-bar to burn after being powered on.

[0041] A semiconductor laser array single-bar testing device according to an embodiment of the present application is described below with reference to the accompanying drawings. Figure 1 FIG. 1 is a structural schematic diagram of a semiconductor laser array single-bar testing device according to an embodiment of the present application.

[0042] Referring to Figure 1 , Figure 2 , a first aspect of an embodiment of the present application proposes a semiconductor laser array single-bar testing device, which includes a bottom plate 1, a liquid cooling seat 4, a positive electrode block 5, a negative electrode block 6, a conductive voltage block 7, a driving unit, and the like.

[0043] The bottom plate 1 mainly serves as a support function, and is used to bear the liquid cooling seat 4, the positive electrode block 5, the negative electrode block 6, the conductive voltage block 7, the driving unit, and the like.

[0044] The liquid cooling seat 4 is used to pass cooling liquid to the micro-channel single-bar. In an embodiment, the liquid cooling seat 4 has a first liquid cooling pipeline (not shown in the figure) inside. The liquid cooling seat 4 is provided with a liquid inlet 14 and a liquid outlet 15 on a first surface thereof. The liquid inlet 14 and the liquid outlet 15 are in communication with the first liquid cooling pipeline. The liquid inlet 14 and the liquid outlet 15 are used to access an external device. The external device can control the flow and temperature of the cooling liquid, and achieve heat dissipation of the micro-channel single-bar by passing the cooling liquid.

[0045] The positive pole block 5 is used for positive pole conduction of the micro-channel single cell. The positive pole block 5 is connected with the positive pole of the external power supply. The negative pole block 6 is used for negative pole conduction of the micro-channel single cell, and the negative pole block 6 is connected with the negative pole of the external power supply.

[0046] The conductive voltage block 7 is used for conducting the positive pole and the negative pole of the micro-channel single cell, and is sealed with the sealing ring of the micro-channel single cell. The material of the conductive voltage block needs to have conductivity. The size of the conductive voltage block on the side opposite to the sealing ring of the micro-channel single cell is preferably equal to or greater than the outer diameter of the sealing ring. In this way, the uniformity of the force on the sealing ring can be ensured.

[0047] The driving unit is connected with the conductive voltage block 7, and is used for controlling the moving speed and the force of the conductive voltage block 7. The moving speed is controlled to conduct or disconnect the positive pole and the negative pole of the micro-channel single cell, and the moving force is controlled to control the compression amount of the sealing ring to be in an optimal state, so that a better sealing effect is obtained. The driving unit can be connected with the conductive voltage block 7 in a fixed or articulated manner. The driving unit and the conductive voltage block can adopt various forms of movement mechanisms, such as a lever, an extension mechanism, etc. No matter which movement mechanism is adopted, as long as the moving speed and the force of the conductive voltage block can be controlled, the sealing by means of manually tightening the fastener in the prior art can be no longer used, the problems in the prior art can be solved, and the corresponding effects can be achieved.

[0048] The driving unit generally includes a motor, such as a common DC motor. The output force of the driving unit is determined by the output torque of the DC motor. In the case of a certain power, the higher the rotating speed of the DC motor, the smaller the output torque of the DC motor. The torque of the DC motor can be adjusted by changing the input current of the DC motor. Therefore, when the input current of the DC motor is large, the output torque of the DC motor is large, and when the input current of the DC motor is small, the output torque of the DC motor is small. The conductive voltage block generates different pressing forces under the action of different output forces of the driving unit. In the preferred embodiment, a corresponding lookup table of the current and the pressure can be set in advance, so that the current can be easily adjusted according to different pressure requirements to achieve the desired pressure value.

[0049] The semiconductor laser array single cell testing device according to the embodiment of the present application conducts the positive pole and the negative pole of the micro-channel single cell through the conductive voltage block, and the conductive voltage block also seals the sealing ring of the micro-channel single cell, so that the multifunctionalization of the conductive voltage block component is realized. The moving speed and the force of the conductive voltage block are controlled by the driving unit in the device, the pressing force of the conductive voltage block is adjustable, and then the compression amount of the sealing ring can be adaptively adjusted for each kind of micro-channel single cell product, so that the problems of the micro-channel single cell deformation and poor sealing caused by the uncontrollable tightening force of the manual adjustment of the fastener in the prior art are avoided. The device has a simple structure and is easy to operate, and the testing efficiency of the micro-channel single cell is improved.

[0050] In some embodiments, referring to Figure 2 , the negative block 6 is provided with a connecting lug 10, and a bolt 11 is installed on the connecting lug 10. The connecting lug 10 is hinged to the conductive pressure block 7. The conductive pressure block 7 and the connecting lug 10 form a lever structure. As can be seen from Figure 2 , the distance from the connecting lug 10 to the two ends of the conductive pressure block 7 is not consistent. The force arm on the side of the driving unit is longer, which can reduce the size of the output force of the driving unit.

[0051] In some embodiments, referring to Figure 1 , Figure 2 , Figure 4 , Figure 5 As shown in the drawings, the positive block 5 is arranged on the second surface of the liquid cooling seat 4, and the positive block 5 is provided with a second liquid cooling pipe (not shown in the drawings) penetrating through the positive block 5. The second liquid cooling pipe is in communication with the first liquid cooling pipe, and the micro-channel single-bar (12, 13) is provided with an inlet hole 19 and an outlet hole 20. On the second surface of the liquid cooling seat 4, the inlet hole 19 and the outlet hole 20 are in communication with the second liquid cooling pipe, and a sealing ring 18 is installed on the outer circle of the inlet hole 19 and the outlet hole 20. A clamping groove 16 is formed on the second surface of the positive block 5, and the micro-channel single-bar is arranged in the clamping groove 16. The clamping groove can limit the micro-channel single-bar, and facilitate the micro-channel single-bar to be placed in the accurate position. In order to further improve the fixing accuracy of the micro-channel single-bar, a first recess 21 is arranged on the two sides of the micro-channel single-bar, and a detachable plug 17 is arranged on the clamping groove 16, and the plug 17 is matched with the outer shape of the first recess 21. Since the plug 17 may form a protrusion on the surface of the positive block 5, in order not to affect the sealing of the conductive pressure block 7, a second recess 25 is arranged on the two sides of the conductive pressure block 7, which is adapted to the plug 17.

[0052] In one example, the negative block 6 is arranged on the second surface of the liquid cooling seat 4, and the negative block 6 is separated from the positive block 5. The two are separated for insulation. The positive block 5 is closer to the position of the second end of the conductive pressure block 7 than the negative block 6. Optionally, the top surface of the positive block 5 and the top surface of the negative block 6 are located on the same horizontal plane, which facilitates the uniform distribution of the pressing force of the conductive pressure block 7.

[0053] In some embodiments, referring to Figures 2-5As shown, the conductive pressure block 7 includes a first conductive pressure block 71 and a second conductive pressure block 72, the micro-channel single-bar includes a first micro-channel single-bar 12 and a second micro-channel single-bar 13, the first conductive pressure block 71 is arranged opposite to the first micro-channel single-bar 12, and the second conductive pressure block 72 is arranged opposite to the second micro-channel single-bar 13. The purpose of arranging two conductive pressure blocks is that when one micro-channel single-bar is tested, another micro-channel single-bar to be tested can be disassembled and installed, so that the testing efficiency is improved. The product models of the first micro-channel single-bar 12 and the second micro-channel single-bar 13 can be consistent or inconsistent. For example, the first micro-channel single-bar 12 is a two-hole type, and the second micro-channel single-bar 13 is a three-hole type, and the second micro-channel single-bar 13 has one more opening 26 for passing a fastener than the first micro-channel single-bar 12. In addition, the number of peripheral sealing rings 18 of the liquid inlet hole or the liquid outlet hole of the second micro-channel single-bar 13 is two, and the sealing performance is better. It can be seen that the testing device of the embodiment of the application can test micro-channel single-bars of different models and sizes, and compared with the prior art in which one micro-channel single-bar corresponds to one testing fixture, the applicability is wider.

[0054] In some embodiments, in conjunction with Figure 1 、 Figure 2 As shown, the driving unit is a lifting platform 8, the lifting platform 8 includes a pedestal 81, a switch 82, a push rod 83 and a connecting rod 84, the pedestal 81 is installed on the bottom plate 1, a first end of the push rod 83 is located in the pedestal 81, a second end of the push rod 83 is hinged to the connecting rod 84, and the connecting rod 84 is used for abutting against and applying an external force to the conductive pressure block 7; in the on state of the switch 82, the push rod 83 extends in a first direction, and in the off state of the switch 82, the push rod 83 retracts in the opposite direction of the first direction. The first direction is an up-down direction. The push rod can be driven by a DC motor. The lifting platform 8 is powered by a power supply. The adjustment of the size of the pushing force of the push rod 83 is adjusted by various methods known to those skilled in the art, such as adjusting the input current of the DC motor. Correspondingly, the compression amount of the sealing ring also changes. The pushing speed of the push rod is inversely proportional to the pushing force, the greater the pushing speed, the smaller the pushing force, and the smaller the pushing speed, the greater the pushing force. The greater the input current of the DC motor, the greater the strength of the push rod, and the smaller the pushing speed. Alternatively, the weight of the connecting lug 10 to the first end of the conductive pressure block 7 is greater than the weight of the connecting lug 10 to the second end of the conductive pressure block 7, so that when the switch 82 is in the off state, the first end of the conductive pressure block 7 falls under the action of gravity.

[0055] In one example, a top end of the connecting rod 84 is provided with an insulating block 9, which plays a role of insulation and isolation from the first conductive pressure block 71 or the second conductive pressure block 72. In one example, the pedestal 81 and the bottom plate 1 have a connecting plate 85 therebetween. The connecting plate 85 is provided with threaded holes, and the pedestal 81 can be fixed above the connecting plate 85 and the bottom plate 1 can be fixed below the connecting plate 85 by fasteners. The area of the bottom plate 1 is greater than the area of the connecting plate 85.

[0056] In some embodiments, the semiconductor laser array single-bar testing device further comprises a moving unit, the moving unit comprising a slide rail 2 and a slide block 3, the slide rail 2 being arranged on the base plate 1 along a second direction, the slide block 3 being slidably arranged on the slide rail 2, and the liquid cooling seat 4 being fixedly connected with the slide block 3. The second direction is the front-rear direction in the Figure 3 The moving unit is driven by a servo motor, and the servo motor can accurately control the moving position of the slide block 3. The moving unit can complete the testing of multiple models of micro-channel bars under the premise of only using one lifting platform. For example, if a certain model of micro-channel bar needs to be tested, the moving unit is used to move the conductive pressure block matched with the micro-channel bar to the top of the lifting platform, and then the testing is completed.

[0057] Referring to Figure 6 , a second aspect of the embodiment of the present application proposes a semiconductor laser array single-bar testing method, which is completed by using the semiconductor laser array single-bar testing device of the first aspect of the above embodiment, in combination with Figures 1-6 as shown, comprising the following steps:

[0058] Step S102, mounting the first micro-channel bar 12 on the positive electrode block 5.

[0059] In this embodiment, the first micro-channel bar 12 can be placed in the corresponding clamping groove 16 by using a tweezers.

[0060] Step S104, turning on the switch 82, and the push rod 83 extends in a first direction to lift the first end of the first conductive pressure block 71, while the second end of the first conductive pressure block 71 is pressed down to seal with the sealing ring of the first micro-channel bar 12, and the positive electrode block 5 and the negative electrode block 6 are connected.

[0061] In this embodiment, the pressing force of the first conductive pressure block 71 can be adjusted according to actual needs. During the pressing process of the second end of the first conductive pressure block 71, the sealing ring is first abutted, and then the first conductive pressure block 71 is abutted with the negative electrode sheet 24 on the first micro-channel bar 12 as the sealing ring is compressed.

[0062] Step S106, circulating cooling liquid to the liquid cooling seat 4, connecting the positive electrode block 5 to the positive electrode of the power supply, connecting the negative electrode block 6 to the negative electrode of the power supply, and turning on the power supply to test the first micro-channel bar 12.

[0063] In this embodiment, the temperature and flow of the cooling liquid of the external device are set, the device switch is turned on, and the cooling circulating liquid is provided to the liquid cooling seat 4. The positive and negative electrodes of the power supply correspond to the positive and negative electrode blocks of the testing device, and then the power supply parameters are set, the power supply is turned on, and the testing is performed.

[0064] Step S108, after the test is completed, the supply of coolant and power is turned off, the switch 82 is turned off, the push rod 83 is retracted in the opposite direction of the first direction, and the second end of the first conductive pressure block 71 is away from the first micro-channel single-bar 12.

[0065] In this embodiment, after the test is completed, the power is turned off, the coolant circulation is turned off, then compressed air is introduced to blow out the coolant in the coolant channel, then the switch 82 is turned off, and finally the first micro-channel single-bar is taken out.

[0066] According to the semiconductor laser array single-bar test method provided by the embodiment of the present application, the conductive pressure block is used to complete the conduction and sealing, the compression amount of the sealing ring can be adaptively adjusted for each type of micro-channel single-bar product, and the problems of micro-channel single-bar deformation and poor sealing caused by the difficulty in controlling the fastening force of the fastener in the prior art are avoided. The method is simple to operate, and compared with the existing manual fastener tightening sealing mode, the efficiency can be improved.

[0067] On the basis of the above embodiment, the semiconductor laser array single-bar test method further comprises:

[0068] Step S110, the liquid cooling seat 4 is moved in the second direction by using the moving unit, so that the second conductive pressure block 72 is aligned with the connecting rod 84.

[0069] In this embodiment, there is only one lifting platform, and when another micro-channel single-bar needs to be measured, the liquid cooling seat 4 needs to be moved. The moving distance of the liquid cooling seat 4 can be accurately controlled.

[0070] Step S112, the positive and negative electrodes of the second micro-channel single-bar 13 are conducted by using the second conductive pressure block 72, and the second micro-channel single-bar 13 is sealed with the sealing ring.

[0071] In this embodiment, after confirming that the second micro-channel single-bar 13 can be powered on and sealed, the test of the second micro-channel single-bar 13 is completed by referring to steps S106 to S108.

[0072] The test device of this embodiment can match two types of micro-channel single-bars, and has wider applicability.

[0073] It should be noted that in the description of the present application, the terms "first", "second", etc. are only used for the purpose of description, and cannot be understood as indicating or implying relative importance. In addition, in the description of the present application, unless otherwise specified, the meaning of "a plurality of" is two or more.

[0074] In the present application, unless specifically defined otherwise and limited, the terms "mount", "connect", "connection", "fixed", and the like, should be construed as broadly as possible, for example, can be fixed connection, can also be detachable connection, or integrated; can be mechanical connection, can also be electrical connection or communication with each other; can be directly connected, or indirectly connected through an intermediate medium, can be the internal communication of two elements or the interaction relationship between two elements, unless otherwise specifically limited. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0075] In the present application, unless specifically defined otherwise and limited, the first feature is "on" or "under" the second feature. The first and second features can be in direct contact, or the first and second features can be in indirect contact through an intermediate medium. Moreover, the first feature "above", "over" and "on" the second feature can be that the first feature is directly above or obliquely above the second feature, or only indicates that the horizontal height of the first feature is higher than that of the second feature. The first feature "below", "under" and "under" the second feature can be that the first feature is directly below or obliquely below the second feature, or only indicates that the horizontal height of the first feature is less than that of the second feature.

[0076] In the description of the present application, the terms "left", "right", "front", "back", and the like indicate the orientation or positional relationship shown in the drawings, which is only for the convenience of describing the present application and simplifying the description, and does not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the present application.

[0077] Any process or method descriptions in flow charts or otherwise described herein can be understood as representing code modules, segments, or portions of code that include one or more executable instructions for implementing specific logic functions or steps in the process, and that the various embodiments of the present application can include additional implementation with additional functions or steps, in which the order of the steps can be changed, including according to the specific functions implemented, and the functions can be performed in substantially simultaneous with, or in reverse order, as will be understood by those skilled in the art of the embodiments to which the present application belongs.

[0078] In the description of the present application, the description of the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" and the like means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In the present application, the illustrative description of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.

[0079] Although the embodiments of the present application have been shown and described above, it is understood that the above-described embodiments are exemplary and are not to be construed as limiting the present application, and that changes, modifications, substitutions and variations can be made by those skilled in the art without departing from the scope of the present application.

Claims

1. A semiconductor laser array single-bar testing device, comprising a base plate (1), a liquid-cooled base (4), a positive electrode block (5), and a negative electrode block (6), wherein the liquid-cooled base (4) is used to circulate coolant into the microchannel single bar, the positive electrode block (5) is connected to the positive terminal of a power supply to conduct electricity to the positive terminal of the microchannel single bar, and the negative electrode block (6) is connected to the negative terminal of a power supply to conduct electricity to the negative terminal of the microchannel single bar, characterized in that, Also includes: A voltage-conducting block (7) is used to conduct the positive and negative electrodes of the microchannel monobar and to seal it with the sealing ring (18) of the microchannel monobar. A drive unit, connected to the voltage-conducting block (7), is used to control the moving speed and force of the voltage-conducting block (7); A slot (16) is provided on the second surface of the positive electrode block (5), and the microchannel bar is disposed in the slot (16); a first groove (21) is provided on both sides of the microchannel bar, and a detachable insert (17) is provided on the slot (16). The insert (17) matches the shape of the first groove (21). A second groove (25) adapted to the insert (17) is provided on both sides of the conductive block (7); the driving unit is a lifting platform (8), which includes a base (81) and a switch (82). A push rod (83) and a connecting rod (84) are provided. The base (81) is mounted on the base plate (1). The first end of the push rod (83) is located inside the base (81). The second end of the push rod (83) is hinged to the connecting rod (84). The connecting rod (84) is used to abut against the conductive block (7) and apply external force. When the switch (82) is on, the push rod (83) extends in a first direction. When the switch (82) is off, the push rod (83) retracts in the opposite direction of the first direction.

2. The semiconductor laser array single-bar testing device according to claim 1, characterized in that, The negative electrode block (6) is provided with a connecting ear (10), which is hinged to the voltage conducting block (7).

3. The semiconductor laser array single-bar testing device according to claim 1, characterized in that, The liquid cooling base (4) has a first liquid cooling pipe inside. The first surface of the liquid cooling base (4) is provided with a liquid inlet (14) and a liquid outlet (15). The liquid inlet (14) and the liquid outlet (15) are connected to the first liquid cooling pipe.

4. The semiconductor laser array single-bar testing device according to claim 3, characterized in that, The positive electrode block (5) is disposed on the second surface of the liquid cooling base (4). The positive electrode block (5) has a through second liquid cooling pipe, which is connected to the first liquid cooling pipe. The microchannel monobar has an inlet hole (19) and an outlet hole (20). On the second surface of the liquid cooling base (4), the inlet hole (19) and the outlet hole (20) are connected to the second liquid cooling pipe. The outer ring of the inlet hole (19) and the outlet hole (20) is equipped with the sealing ring (18).

5. The semiconductor laser array single-bar testing device according to claim 4, characterized in that, The negative electrode block (6) is disposed on the second surface of the liquid cooling base (4), and the negative electrode block (6) is separate from the positive electrode block (5).

6. The semiconductor laser array single-bar testing device according to claim 2, characterized in that, The weight of the connecting ear (10) to the first end of the conductive block (7) is greater than the weight of the connecting ear (10) to the second end of the conductive block (7).

7. The semiconductor laser array single-bar testing device according to claim 2, characterized in that, The voltage conducting block (7) includes a first voltage conducting block (71) and a second voltage conducting block (72), and the microchannel bar includes a first microchannel bar (12) and a second microchannel bar (13). The first voltage conducting block (71) is arranged opposite to the first microchannel bar (12), and the second voltage conducting block (72) is arranged opposite to the second microchannel bar (13).

8. The semiconductor laser array single-bar testing device according to claim 7, characterized in that, It also includes a moving unit, which includes a slide rail (2) and a slider (3). The slide rail (2) is disposed on the base plate (1) along the second direction, and the slider (3) is slidably disposed on the slide rail (2). The liquid cooling base (4) is fixedly connected to the slider (3).

9. A method for single-bar testing of a semiconductor laser array, characterized in that, The test is performed using the single-bar semiconductor laser array test apparatus as described in claim 8, comprising: The first microchannel single bar (12) is installed on the positive electrode block (5); When the switch (82) is turned on, the push rod (83) extends in the first direction, lifting the first end of the first voltage block (71) while the second end of the first voltage block (71) is pressed down to seal with the sealing ring of the first microchannel bar (12), thus connecting the positive electrode block (5) and the negative electrode block (6). Coolant is introduced into the liquid cooling base (4), the positive electrode block (5) is connected to the positive terminal of the power supply, the negative electrode block (6) is connected to the negative terminal of the power supply, and the power supply is turned on to test the first microchannel single bar (12). After the test is completed, the supply of coolant and power is turned off, the switch (82) is turned off, the push rod (83) retracts in the opposite direction of the first direction, and the second end of the first conductive block (71) moves away from the first microchannel bar (12).

10. The single-bar testing method for semiconductor laser arrays according to claim 9, characterized in that, Also includes: The liquid cooling base (4) is moved in the second direction using the moving unit so that the second conductive block (72) is aligned with the connecting rod (84); The positive and negative terminals of the second microchannel bar (13) are connected by the second conductive voltage block (72) and sealed with the sealing ring of the second microchannel bar (13).

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