Circuit fault simulation method and device for resistor-capacitor elements and computer equipment

Abstract

The application relates to a circuit fault simulation method and device for a resistance-capacitance element, computer equipment, a storage medium and a computer program product. The method comprises the following steps: acquiring circuit information of a target circuit; the target circuit comprises a resistance-capacitance element; identifying a key resistance-capacitance element from the resistance-capacitance element comprised by the target circuit according to the circuit information; the key resistance-capacitance element is a resistance-capacitance element related to the circuit performance of the target circuit; identifying a sensitive element in the target circuit from the key resistance-capacitance element; obtaining simulation results of each sensitive element through a circuit simulation model of the target circuit under the condition that the parameter value of a first sensitive element is updated and the parameter value of a second sensitive element remains unchanged; and identifying a target element causing the target circuit to tend to fail from the sensitive elements according to the simulation results of each sensitive element. The method can improve the accuracy of judging the reliability of a circuit formed by a resistance-capacitance element.

Description

Technical Field

[0001] This application relates to the field of power electronics technology, and in particular to a method, apparatus, computer equipment, storage medium, and computer program product for simulating circuit faults of resistive and capacitive components. Background Technology

[0002] With the development of electronic power technology, resistors and capacitors have gradually become the most widely used and consumed electronic components. Therefore, they are often key factors affecting the performance of electronic circuits. Currently, when judging whether a circuit composed of resistors and capacitors has reliability issues, the main approach is to refer to the past experience of relevant technical personnel.

[0003] However, this method of judgment is subjective and considers only a few factors, resulting in a low accuracy rate in judging the reliability of circuits composed of resistors and capacitors. Summary of the Invention

[0004] Therefore, it is necessary to provide a method, apparatus, computer equipment, computer-readable storage medium, and computer program product for simulating circuit faults of resistor-capacitor components that can improve the accuracy of reliability judgment for circuits composed of resistor-capacitor components, in order to address the above-mentioned technical problems.

[0005] Firstly, this application provides a circuit fault simulation method for resistive and capacitive components. The method includes:

[0006] Obtain circuit information for a target circuit; the target circuit includes resistive and capacitive components;

[0007] Based on the circuit information, key resistor-capacitor components are identified from the resistor-capacitor components included in the target circuit; the key resistor-capacitor components are those related to the circuit performance of the target circuit.

[0008] The sensitive components in the target circuit are identified from the key resistor-capacitor components; the sensitive components are candidate components whose parameter drift direction will cause the target circuit to tend to fail.

[0009] When the parameter value of the first sensitive element is updated and the parameter value of the second sensitive element remains unchanged, the simulation result of each sensitive element is obtained through the circuit simulation model of the target circuit; the first sensitive element is any one of the sensitive elements, and the second sensitive element is the sensitive element other than the first sensitive element.

[0010] Based on the simulation results of each sensitive element, the target element that causes the target circuit to tend to fail is identified from the sensitive elements.

[0011] In one embodiment, identifying the sensitive element in the target circuit from the critical resistor-capacitor components includes:

[0012] Identify the parameter drift direction of the key resistor-capacitor components;

[0013] The correspondence between the parameter drift direction of key resistors and capacitors and circuit performance is found, and the circuit performance corresponding to the parameter drift direction of the key resistors and capacitors is obtained.

[0014] Based on the circuit performance corresponding to the parameter drift direction of the key resistor-capacitor components, the key resistor-capacitor components that cause the target circuit to tend to fail are identified from the key resistor-capacitor components and are regarded as the sensitive components in the target circuit.

[0015] In one embodiment, identifying the parameter drift direction of the key resistor-capacitor component includes:

[0016] Obtain the failure mechanism information of the key resistor-capacitor components under preset stress conditions;

[0017] Obtain the failure phenomenon information corresponding to the failure mechanism information, and use it as the failure phenomenon information of the key resistor-capacitor components;

[0018] Based on the failure phenomenon information, the parameter drift direction of the key resistor-capacitor components is determined.

[0019] In one embodiment, before obtaining the simulation results of each sensitive element through the circuit simulation model of the target circuit, the method further includes:

[0020] Based on the circuit information of the target circuit, a circuit simulation model for the target circuit is established;

[0021] Based on the circuit simulation model, the target circuit is simulated to obtain the simulation results of the target circuit;

[0022] When the parameter value of the first sensitive element is updated and the parameter value of the second sensitive element remains unchanged, the simulation results of each sensitive element are obtained through the circuit simulation model of the target circuit, including:

[0023] If the simulation result is normal, the step of obtaining the simulation result of each sensitive element through the circuit simulation model of the target circuit is performed, provided that the parameter value of the first sensitive element is updated and the parameter value of the second sensitive element remains unchanged.

[0024] In one embodiment, when the parameter value of the first sensitive element is updated and the parameter value of the second sensitive element remains unchanged, the simulation result of each sensitive element is obtained through the circuit simulation model of the target circuit, including:

[0025] While keeping the parameter value of the second sensitive element unchanged, update the parameter value of the first sensitive element based on the parameter drift direction of the first sensitive element;

[0026] The circuit performance parameters corresponding to each parameter value update are recorded using the circuit simulation model of the target circuit.

[0027] The simulation results for each sensitive element are obtained by updating the circuit performance parameters corresponding to each parameter value.

[0028] In one embodiment, the method further includes:

[0029] Obtain prevention information corresponding to the failure mechanism information of the target component;

[0030] The aforementioned prevention information will be used as reference information for the circuit design of the target circuit.

[0031] Secondly, this application also provides a circuit fault simulation device for resistive and capacitive components. The device includes:

[0032] An information acquisition module is used to acquire circuit information for a target circuit; the target circuit includes resistive and capacitive components.

[0033] The first identification module is used to identify key resistor-capacitor components from the resistor-capacitor components included in the target circuit based on the circuit information; the key resistor-capacitor components are resistor-capacitor components related to the circuit performance of the target circuit.

[0034] The second identification module is used to identify sensitive components in the target circuit from the key resistor-capacitor components; the sensitive components are candidate components whose parameter drift direction will cause the target circuit to tend to fail.

[0035] The component simulation module is used to obtain the simulation results of each sensitive element through the circuit simulation model of the target circuit when the parameters of the first sensitive element are updated and the parameters of the second sensitive element remain unchanged; the first sensitive element is any one of the sensitive elements, and the second sensitive element is any sensitive element other than the first sensitive element.

[0036] The third identification module is used to identify the target element that causes the target circuit to fail, based on the simulation results of each of the sensitive elements.

[0037] Thirdly, this application also provides a computer device. The computer device includes a memory and a processor, the memory storing a computer program, and the processor executing the computer program to perform the following steps:

[0038] Obtain circuit information for a target circuit; the target circuit includes resistive and capacitive components;

[0039] Based on the circuit information, key resistor-capacitor components are identified from the resistor-capacitor components included in the target circuit; the key resistor-capacitor components are those related to the circuit performance of the target circuit.

[0040] The sensitive components in the target circuit are identified from the key resistor-capacitor components; the sensitive components are candidate components whose parameter drift direction will cause the target circuit to tend to fail.

[0041] When the parameter value of the first sensitive element is updated and the parameter value of the second sensitive element remains unchanged, the simulation result of each sensitive element is obtained through the circuit simulation model of the target circuit; the first sensitive element is any one of the sensitive elements, and the second sensitive element is the sensitive element other than the first sensitive element.

[0042] Based on the simulation results of each sensitive element, the target element that causes the target circuit to tend to fail is identified from the sensitive elements.

[0043] Fourthly, this application also provides a computer-readable storage medium. The computer-readable storage medium stores a computer program thereon, which, when executed by a processor, performs the following steps:

[0044] Obtain circuit information for a target circuit; the target circuit includes resistive and capacitive components;

[0045] Based on the circuit information, key resistor-capacitor components are identified from the resistor-capacitor components included in the target circuit; the key resistor-capacitor components are those related to the circuit performance of the target circuit.

[0046] The sensitive components in the target circuit are identified from the key resistor-capacitor components; the sensitive components are candidate components whose parameter drift direction will cause the target circuit to tend to fail.

[0047] When the parameter value of the first sensitive element is updated and the parameter value of the second sensitive element remains unchanged, the simulation result of each sensitive element is obtained through the circuit simulation model of the target circuit; the first sensitive element is any one of the sensitive elements, and the second sensitive element is the sensitive element other than the first sensitive element.

[0048] Based on the simulation results of each sensitive element, the target element that causes the target circuit to tend to fail is identified from the sensitive elements.

[0049] Fifthly, this application also provides a computer program product. The computer program product includes a computer program that, when executed by a processor, performs the following steps:

[0050] Obtain circuit information for a target circuit; the target circuit includes resistive and capacitive components;

[0051] Based on the circuit information, key resistor-capacitor components are identified from the resistor-capacitor components included in the target circuit; the key resistor-capacitor components are those related to the circuit performance of the target circuit.

[0052] The sensitive components in the target circuit are identified from the key resistor-capacitor components; the sensitive components are candidate components whose parameter drift direction will cause the target circuit to tend to fail.

[0053] When the parameter value of the first sensitive element is updated and the parameter value of the second sensitive element remains unchanged, the simulation result of each sensitive element is obtained through the circuit simulation model of the target circuit; the first sensitive element is any one of the sensitive elements, and the second sensitive element is the sensitive element other than the first sensitive element.

[0054] Based on the simulation results of each sensitive element, the target element that causes the target circuit to tend to fail is identified from the sensitive elements.

[0055] The aforementioned circuit fault simulation method, apparatus, computer equipment, storage medium, and computer program product for resistor-capacitor components acquire circuit information for the target circuit; then, based on the circuit information, identify key resistor-capacitor components from the resistor-capacitor components included in the target circuit; next, identify sensitive components in the target circuit from the key resistor-capacitor components; with the parameter value of the first sensitive component updated and the parameter value of the second sensitive component remaining unchanged, obtain the simulation result of each sensitive component through the circuit simulation model of the target circuit; finally, based on the simulation result of each sensitive component, identify the target component that causes the target circuit to tend to fail from the sensitive components. In this way, relevant circuit information of the target circuit can be comprehensively and effectively acquired and analyzed, thereby accurately identifying key resistor-capacitor components and sensitive components in sequence. Then, with the parameter value of the first sensitive component updated and the parameter value of the second sensitive component remaining unchanged, the simulation results of each sensitive component are obtained through the circuit simulation model of the target circuit. This eliminates the influence of the second sensitive component and obtains the changes in circuit performance indicators caused by the parameter value change of a certain sensitive component. Based on the multiple changes obtained, the simulation results of that sensitive component are effectively summarized. The same sampling method can accurately obtain the simulation results of each sensitive component. Finally, based on the simulation results of each sensitive component, the target component that causes the target circuit to tend to fail is identified from the sensitive components. Identifying the target component based on the objective indicator of the simulation results avoids the influence of subjective factors and takes into account multiple factors, thereby improving the accuracy of the reliability judgment of the circuit composed of resistor-capacitor components. Attached Figure Description

[0056] Figure 1 This is a flowchart illustrating a circuit fault simulation method for resistor-capacitor components in one embodiment.

[0057] Figure 2 This is a flowchart illustrating the steps for obtaining the simulation results of each sensitive element in one embodiment.

[0058] Figure 3 This is a flowchart illustrating the circuit simulation implementation steps in one embodiment;

[0059] Figure 4 This is a schematic diagram of a simulation circuit designed in one embodiment;

[0060] Figure 5 This is a simulation result of resistor R1 parameter drift in one embodiment;

[0061] Figure 6 This is a simulation result of capacitor C1 parameter drift in one embodiment;

[0062] Figure 7This is a flowchart illustrating a circuit fault simulation method for resistor-capacitor components in another embodiment.

[0063] Figure 8 This is a flowchart illustrating a circuit fault simulation method for resistor-capacitor components in yet another embodiment.

[0064] Figure 9 This is a structural block diagram of a circuit fault simulation device for resistor-capacitor components in one embodiment;

[0065] Figure 10 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0066] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0067] In one embodiment, such as Figure 1 As shown, a circuit fault simulation method for resistive and capacitive components is provided. This embodiment illustrates the application of this method to a terminal as an example. It is understood that this method can also be applied to a server, and to a system including both a terminal and a server, and is implemented through interaction between the terminal and the server. The terminal can be, but is not limited to, various personal computers, laptops, smartphones, tablets, IoT devices, and portable wearable devices; IoT devices can be smart speakers, smart TVs, smart air conditioners, smart in-vehicle devices, etc.; portable wearable devices can be smartwatches, smart bracelets, head-mounted devices, etc. The server can be a standalone server or a server cluster composed of multiple servers. In this embodiment, the method includes the following steps:

[0068] Step S101: Obtain circuit information for the target circuit; the target circuit contains resistive and capacitive components.

[0069] The target circuit refers to the circuit to be diagnosed that contains resistive and capacitive components.

[0070] The circuit information refers to the physical circuit board, original design drawings, material selection list, design specification document, user manual document, white box test report, type test report, specifications and application information of all selected materials, etc.

[0071] Among them, RC components refer to the general term for resistive components and capacitor components.

[0072] Specifically, the terminal receives a circuit fault simulation request for resistor-capacitor components and obtains circuit information for the target circuit based on the circuit fault simulation request.

[0073] For example, when a terminal receives a circuit fault simulation request for resistors and capacitors, it obtains the circuit information of the circuit A to be diagnosed, including the physical circuit board, original design drawings, material selection table, design specification document, user manual document, white box test report, type test report, specifications and application information of all selected materials, etc.

[0074] Step S102: Based on the circuit information, identify the key resistor-capacitor components from the resistor-capacitor components included in the target circuit; the key resistor-capacitor components are those related to the circuit performance of the target circuit.

[0075] Among them, key RC components refer to resistors and capacitors that are related to the circuit performance of the target circuit.

[0076] Among them, circuit performance refers to the physical quantities related to circuit performance indicators.

[0077] Specifically, the terminal analyzes the acquired circuit information to obtain analysis results; based on the analysis results, it identifies all resistors and capacitors related to the circuit performance of the target circuit from the resistors and capacitors contained in the target circuit, and lists these resistors and capacitors as key resistors and capacitors.

[0078] For example, the terminal analyzes the acquired circuit information and learns that the circuit needs to be used in a humid and hot environment. When the circuit has no voltage pulse output, it is considered to be a circuit failure. Then, the key resistor-capacitor components R1, R2, and C1 are identified, and the corresponding relationship identification table is listed, as shown in Table 1.

[0079] Step S103: Identify sensitive components in the target circuit from the key resistor and capacitor components; the sensitive components are candidate components whose parameter drift direction will cause the target circuit to tend to fail.

[0080] The parameter drift direction refers to the direction of parameter change, such as the parameter increasing, decreasing, or becoming unstable.

[0081] Among them, sensitive elements refer to candidate elements whose parameter changes will cause the target circuit to fail.

[0082] Specifically, based on failure physics, the terminal lists all failure mechanisms and corresponding failure phenomena of key resistors and capacitors under specific stress, filters out content related to parameter drift, and indicates the direction of parameter drift, thereby identifying sensitive components in the target circuit among the key resistors and capacitors.

[0083] For example, as shown in Tables 1 and 2, based on failure physics, the terminal concludes that under humid and hot environmental stress, the parameter drift direction of resistor R1 and capacitor C1 may lead to a decrease in the output voltage pulse width of the circuit and cause the circuit to tend to fail; while the parameter drift direction of resistor R2 will increase the pulse width and will not cause the circuit to tend to fail. Therefore, resistor R1 and capacitor C1 are sensitive elements.

[0084] Table 1 shows the resistors and capacitors included in the target circuit.

[0085]

[0086] Table 2. Identification results of sensitive elements

[0087]

[0088] In step S104, with the parameter value of the first sensitive element updated and the parameter value of the second sensitive element remaining unchanged, the simulation result of each sensitive element is obtained through the circuit simulation model of the target circuit; the first sensitive element is any one of the sensitive elements, and the second sensitive element is any sensitive element other than the first sensitive element.

[0089] Among them, parameter values ​​refer to a comprehensive description of a certain variable in the population; circuit simulation models refer to mathematical models that simulate the real behavior of a certain electronic circuit.

[0090] Specifically, based on the circuit simulation model of the target circuit, when the parameter value of the first sensitive element is modified, the parameter values ​​of other sensitive elements remain unchanged; when the parameter value of the second sensitive element is modified, the parameter value of the first sensitive element is changed back to its original value, while the parameter values ​​of other sensitive elements remain unchanged, and so on. When modifying the parameter value of a sensitive element, a parameter scanning method is used based on the direction of parameter drift of that sensitive element to record the changes in the corresponding circuit performance parameters, thereby obtaining the simulation results of each sensitive element.

[0091] For example, the terminal first keeps the parameter value of capacitor C1 at its original value, sets the parameter value of resistor R1 to increase linearly from 1 to 100 times, and records the corresponding pulse width changes; then, the parameter value of resistor R1 is modified back to its original value, sets the parameter value of capacitor C1 to increase linearly from 0.1 times to 1 times, records the corresponding pulse width changes, and finally summarizes all simulation results, as shown in Table 3. Figure 5 and Figure 6 As shown.

[0092] Table 3. Fault simulation results of sensitive components

[0093]

[0094] Step S105: Based on the simulation results of each sensitive element, identify the target element that causes the target circuit to fail.

[0095] The simulation results refer to the results obtained by simulating the circuit using a simulation model.

[0096] Specifically, the terminal analyzes the impact of the sensitive element and its parameter drift based on the simulation results of each sensitive element, obtains the analysis results, and identifies the target element that causes the target circuit to fail from all sensitive elements based on the analysis results.

[0097] For example, based on the simulation results of each sensitive element, the terminal analyzes the impact of the sensitive element and its parameter drift and concludes that: when capacitor C1 experiences parameter drift, the output voltage pulse only shows a decrease in width and does not disappear; when resistor R1 experiences parameter drift, the output voltage pulse will completely disappear. Therefore, resistor R1 is the target element that causes the target circuit to tend to fail, and it has the greatest impact on circuit performance, so it should be given special consideration.

[0098] In the above-mentioned circuit fault simulation method for resistor-capacitor components, circuit information for the target circuit is obtained; then, based on the circuit information, key resistor-capacitor components are identified from the resistor-capacitor components included in the target circuit; then, sensitive components in the target circuit are identified from the key resistor-capacitor components; when the parameter value of the first sensitive component is updated and the parameter value of the second sensitive component remains unchanged, the simulation result of each sensitive component is obtained through the circuit simulation model of the target circuit; finally, based on the simulation result of each sensitive component, the target component that causes the target circuit to tend to fail is identified from the sensitive components. In this way, relevant circuit information of the target circuit can be comprehensively and effectively acquired and analyzed, thereby accurately identifying key resistor-capacitor components and sensitive components in sequence. Then, with the parameter value of the first sensitive component updated and the parameter value of the second sensitive component remaining unchanged, the simulation results of each sensitive component are obtained through the circuit simulation model of the target circuit. This eliminates the influence of the second sensitive component and obtains the changes in circuit performance indicators caused by the parameter value change of a certain sensitive component. Based on the multiple changes obtained, the simulation results of the sensitive component are effectively summarized. Finally, based on the simulation results of each sensitive component, the target component that causes the target circuit to tend to fail is identified from the sensitive components. Identifying the target component based on the objective indicator of the simulation results avoids the influence of subjective factors and takes into account multiple factors, thereby improving the accuracy of the reliability judgment of the circuit composed of resistor-capacitor components.

[0099] In one embodiment, step S103 above, identifying sensitive components in the target circuit from key resistor-capacitor components, specifically includes the following: identifying the parameter drift direction of the key resistor-capacitor components; querying the correspondence between the parameter drift direction of the key resistor-capacitor components and the circuit performance to obtain the circuit performance corresponding to the parameter drift direction of the key resistor-capacitor components; and, based on the circuit performance corresponding to the parameter drift direction of the key resistor-capacitor components, identifying the key resistor-capacitor components that cause the target circuit to tend to fail, as sensitive components in the target circuit.

[0100] The parameter drift direction refers to the direction of parameter change, such as the parameter increasing, decreasing, or becoming unstable.

[0101] Specifically, based on failure physics, the terminal lists all failure mechanisms and corresponding failure phenomena of key resistor-capacitor components under specific stress, filters out content related to parameter drift, and indicates the direction of parameter drift; then it queries the correspondence between the parameter drift direction of key resistor-capacitor components and circuit performance to obtain the circuit performance corresponding to the parameter drift direction of key resistor-capacitor components; finally, based on the circuit performance corresponding to the parameter drift direction of key resistor-capacitor components, it identifies the key resistor-capacitor components that cause the target circuit to tend to fail, and uses them as sensitive components in the target circuit.

[0102] For example, as shown in Tables 1 and 2, based on failure physics, the terminal concludes that under humid and hot environmental stress, the parameter drift direction of resistor R1 and capacitor C1 may lead to a decrease in the output voltage pulse width of the circuit and cause the circuit to tend to fail; while the parameter drift direction of resistor R2 will increase the pulse width and will not cause the circuit to tend to fail. Therefore, resistor R1 and capacitor C1 are sensitive elements.

[0103] In this embodiment, by querying the correspondence between the parameter drift direction of key resistors and capacitors and the circuit performance, the circuit performance corresponding to the parameter drift direction of key resistors and capacitors is obtained; then, based on the circuit performance corresponding to the parameter drift direction of key resistors and capacitors, the key resistors and capacitors that cause the target circuit to tend to fail are identified from the key resistors and capacitors, and are regarded as sensitive components in the target circuit; by analyzing the components in the target circuit in a step-by-step manner, the sensitive components in the target circuit can be accurately identified.

[0104] In one embodiment, step S103 above, identifying the parameter drift direction of the key resistor-capacitor component, specifically includes the following: obtaining the failure mechanism information of the key resistor-capacitor component under preset stress conditions; obtaining the failure phenomenon information corresponding to the failure mechanism information as the failure phenomenon information of the key resistor-capacitor component; and determining the parameter drift direction of the key resistor-capacitor component based on the failure phenomenon information.

[0105] Stress refers to the internal forces that interact between different parts of an object when it deforms due to external factors (force, humidity, temperature field changes, etc.) in order to resist the action of these external factors and attempt to restore the object from its deformed position to its original position.

[0106] Among them, failure mechanism refers to the physical, chemical or other causes and processes that lead to failure.

[0107] Among them, failure phenomenon refers to the result caused by failure mechanism.

[0108] Specifically, the terminal receives a parameter drift direction identification command, and based on the parameter drift direction identification command, obtains the failure mechanism information of the key resistor and capacitor components under preset stress conditions, as well as the failure phenomenon information corresponding to the failure mechanism information; analyzes and processes the failure phenomenon information, thereby determining the parameter drift direction of the key resistor and capacitor components.

[0109] For example, when the terminal receives a parameter drift direction identification command, it obtains the failure mechanism information of the key resistor-capacitor component R1 under humid and hot stress conditions as resistive film corrosion. The corresponding failure phenomenon information is an increase in resistance or an open circuit. By analyzing and processing this failure phenomenon information, it is determined that the parameter drift direction of the key resistor-capacitor component R1 is that the parameter increases.

[0110] In this embodiment, by acquiring the failure mechanism information and corresponding failure phenomenon information of key resistor-capacitor components, and by performing targeted analysis on the failure phenomenon information, the parameter drift direction of the key resistor-capacitor components can be accurately determined.

[0111] In one embodiment, before obtaining the simulation results of each sensitive element through the circuit simulation model of the target circuit, step S104 further includes: establishing a circuit simulation model for the target circuit based on the circuit information of the target circuit; simulating the target circuit based on the circuit simulation model to obtain the simulation results of the target circuit. Therefore, step S104, where the parameter values ​​of the first sensitive element are updated and the parameter values ​​of the second sensitive element remain unchanged, specifically includes the following: when the simulation results are in a normal state, the step of obtaining the simulation results of each sensitive element through the circuit simulation model of the target circuit, where the parameter values ​​of the first sensitive element are updated and the parameter values ​​of the second sensitive element remain unchanged.

[0112] Here, a circuit simulation model refers to a mathematical model that simulates the actual behavior of a certain electronic circuit. "Normal state" means that the simulation results are within a reasonable range that conforms to conventional standards.

[0113] Specifically, based on the circuit information of the target circuit, the terminal first establishes models and sets parameters for all electronic components in the circuit, then draws the simulation circuit schematic according to the connection relationship of each component, and establishes a circuit simulation model for the target circuit; then it sets the external input excitation source, and finally runs the simulation to obtain the simulation results of the target circuit.

[0114] For example, such as Figure 3 As shown, based on circuit information such as the circuit design schematic, material selection table, and material specifications, the terminal first establishes models and sets parameters for all electronic components in the circuit, and then draws the simulation circuit schematic according to the connection relationship of each component (e.g., ...). Figure 4 (As shown), then set the external input excitation source, and finally run the simulation, recording the various performance parameters of the circuit to form the simulation results. At this time, the parameters of each component are the same as the original design values, and the simulation results obtained are in a normal state.

[0115] In this embodiment, a circuit simulation model for the target circuit is established based on the circuit information of the target circuit; the target circuit is simulated based on the circuit simulation model to obtain the simulation results of the target circuit; thus, a circuit simulation model for the target circuit can be established in a targeted manner, and subsequent steps are only executed when the simulation results are in a normal state, which can effectively avoid the influence of abnormal factors on subsequent simulation results.

[0116] In one embodiment, such as Figure 2 As shown, in step S104 above, when the parameter value of the first sensitive element is updated and the parameter value of the second sensitive element remains unchanged, the simulation results of each sensitive element are obtained through the circuit simulation model of the target circuit. Specifically, this includes the following steps:

[0117] Step S201: While keeping the parameter value of the second sensitive element unchanged, update the parameter value of the first sensitive element based on the parameter drift direction of the first sensitive element.

[0118] Step S202: Using the circuit simulation model of the target circuit, record the circuit performance parameters corresponding to each parameter value update.

[0119] Step S203: Update the corresponding circuit performance parameters according to each parameter value to obtain the simulation results of each sensitive component.

[0120] Among them, circuit performance parameters refer to physical quantity parameters related to circuit performance indicators.

[0121] Specifically, based on the circuit simulation model of the target circuit, the terminal updates the parameter value of the first sensitive element within a preset range based on the parameter drift direction of the first sensitive element while keeping the parameter value of the second sensitive element unchanged; through the circuit simulation model of the target circuit, the circuit performance parameters corresponding to each parameter value update are recorded; the circuit performance parameters corresponding to each parameter value update are analyzed and processed to finally obtain the simulation results of each sensitive element.

[0122] For example, in the circuit simulation model of the target circuit, the parameter value of capacitor C1 is kept at its original value. The parameter value of resistor R1 is set to increase linearly from 1 to 100 times, and the corresponding pulse width changes are recorded. Then, the parameter value of resistor R1 is modified back to its original value, and the parameter value of capacitor C1 is set to increase linearly from 0.1 times to 1 times, and the corresponding pulse width changes are recorded. Finally, all simulation results are summarized, as shown in Table 3. Figure 5 , Figure 6 As shown.

[0123] In this embodiment, while keeping the parameter value of the second sensitive element constant, the parameter value of the first sensitive element is updated based on the parameter drift direction of the first sensitive element. The circuit performance parameters corresponding to each parameter value update are recorded using the circuit simulation model of the target circuit. The simulation results of each sensitive element are obtained based on the circuit performance parameters corresponding to each parameter value update. By employing the controlled variable method, interference from other sensitive elements is eliminated, and the change in circuit performance indicators caused by the parameter value change of only one sensitive element is studied at any given time. Based on the multiple change results obtained, the simulation results of each sensitive element are effectively summarized, and the same sampling method is used to accurately obtain the simulation results of each sensitive element.

[0124] In one embodiment, step S105, after identifying the target element that causes the target circuit to tend to fail from the sensitive elements based on the simulation results of each sensitive element, further includes: obtaining prevention information corresponding to the failure mechanism information of the target element; and using the prevention information as circuit design reference information for the target circuit.

[0125] Among them, preventive information refers to targeted measures taken in circuit design based on the failure mechanism information of the target component.

[0126] Specifically, the terminal analyzes the impact of the target component and its parameter drift, obtains prevention information corresponding to the failure mechanism information of the target component, and uses the obtained prevention information as circuit design reference information for the target circuit.

[0127] For example, analysis of the target component resistor R1 reveals that parameter drift in R1 will cause the output voltage pulse to completely disappear, thus having the greatest impact on circuit performance and should be given priority consideration. When designing the circuit, targeted measures can be taken to address this type of failure mechanism in resistor R1, such as strengthening its three-proof protection and selecting anti-sulfurization resistors.

[0128] In this embodiment, by acquiring and analyzing the prevention information corresponding to the failure mechanism information of the target component, the prevention information is used as circuit design reference information for the target circuit; thereby, targeted protection measures can be taken for the circuit during circuit design, which is beneficial to improving the reliability of the circuit design.

[0129] In one embodiment, such as Figure 7 As shown, another method for simulating circuit faults involving resistors and capacitors is provided, which specifically includes the following steps:

[0130] Step S701: Obtain circuit information for the target circuit; the target circuit contains resistive and capacitive components.

[0131] Step S702: Based on the circuit information, identify the key resistor-capacitor components from the resistor-capacitor components included in the target circuit; the key resistor-capacitor components are those related to the circuit performance of the target circuit.

[0132] Step S703: Obtain the failure mechanism information of the key resistor-capacitor components under preset stress conditions; obtain the failure phenomenon information corresponding to the failure mechanism information as the failure phenomenon information of the key resistor-capacitor components; determine the parameter drift direction of the key resistor-capacitor components based on the failure phenomenon information.

[0133] Step S704: Query the correspondence between the parameter drift direction of the key resistor and capacitor components and the circuit performance to obtain the circuit performance corresponding to the parameter drift direction of the key resistor and capacitor components; based on the circuit performance corresponding to the parameter drift direction of the key resistor and capacitor components, identify the key resistor and capacitor components that cause the target circuit to tend to fail, and use them as sensitive components in the target circuit.

[0134] Step S705: Based on the circuit information of the target circuit, establish a circuit simulation model for the target circuit; based on the circuit simulation model, simulate the target circuit to obtain the simulation results of the target circuit.

[0135] Step S706: If the simulation result is normal and the parameter value of the second sensitive element remains unchanged, update the parameter value of the first sensitive element based on the parameter drift direction of the first sensitive element; record the circuit performance parameters corresponding to each parameter value update through the circuit simulation model of the target circuit; obtain the simulation result of each sensitive element based on the circuit performance parameters corresponding to each parameter value update.

[0136] Step S707: Based on the simulation results of each sensitive element, identify the target element that causes the target circuit to fail.

[0137] Step S708: Obtain prevention information corresponding to the failure mechanism information of the target component; use the prevention information as circuit design reference information for the target circuit.

[0138] The aforementioned circuit fault simulation method for resistor-capacitor components comprehensively and effectively acquires and analyzes relevant circuit information of the target circuit, accurately identifying key resistor-capacitor components and sensitive components sequentially. Then, with the parameter values ​​of the first sensitive component updated and the parameter values ​​of the second sensitive component remaining unchanged, the simulation results of each sensitive component are obtained through the circuit simulation model of the target circuit. This eliminates the influence of the second sensitive component and obtains the changes in circuit performance indicators caused by the parameter value changes of a particular sensitive component. Based on the multiple changes obtained, the simulation results of that sensitive component are effectively summarized. The same sampling method can accurately obtain the simulation results of each sensitive component. Finally, based on the simulation results of each sensitive component, the target component that leads to the failure of the target circuit is identified from among the sensitive components. Identifying the target component based on the objective indicator of the simulation results avoids the influence of subjective factors and comprehensively considers multiple factors, thereby improving the accuracy of judging the reliability of circuits composed of resistor-capacitor components.

[0139] To more clearly illustrate the circuit fault simulation method for resistive and capacitive components provided in the embodiments of this application, the following specific embodiment will be used to describe the circuit fault simulation method for resistive and capacitive components. In one embodiment, such as Figure 8 As shown, this application also provides another method for simulating circuit faults involving resistive and capacitive components, specifically including the following steps:

[0140] Step S801: Circuit data collection.

[0141] Step S802: Sensitive element identification.

[0142] Step S803: Establish a circuit simulation model.

[0143] Step S804: Fault simulation analysis.

[0144] Step S805: Draw a conclusion.

[0145] The aforementioned circuit fault simulation method for resistor-capacitor components comprehensively and effectively collects and analyzes the circuit data of the target circuit, accurately identifying sensitive components. Based on the obtained circuit data, a circuit simulation model is established. Then, fault simulation analysis is performed on the sensitive components based on the circuit simulation model. Finally, based on the simulation results of each sensitive component, the target component causing the target circuit to tend to fail is identified as a conclusion. Identifying the target component based on the objective indicator of simulation results avoids the influence of subjective factors and comprehensively considers multiple factors, thereby improving the accuracy of reliability judgment for circuits composed of resistor-capacitor components.

[0146] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0147] Based on the same inventive concept, this application also provides a circuit fault simulation device for resistor-capacitor components to implement the circuit fault simulation method for resistor-capacitor components described above. The solution provided by this device is similar to the solution described in the above method. Therefore, the specific limitations of one or more embodiments of the circuit fault simulation device for resistor-capacitor components provided below can be found in the limitations of the circuit fault simulation method for resistor-capacitor components described above, and will not be repeated here.

[0148] In one embodiment, such as Figure 9 As shown, a circuit fault simulation device for resistive and capacitive components is provided, including: an information acquisition module 901, a first identification module 902, a second identification module 903, a component simulation module 904, and a third identification module 905, wherein:

[0149] The information acquisition module 901 is used to acquire circuit information for the target circuit; the target circuit contains resistive and capacitive components.

[0150] The first identification module 902 is used to identify key resistor-capacitor components from the resistor-capacitor components contained in the target circuit based on circuit information; the key resistor-capacitor components are resistor-capacitor components that are related to the circuit performance of the target circuit.

[0151] The second identification module 903 is used to identify sensitive components in the target circuit from key resistor and capacitor components; the sensitive components are candidate components whose parameter drift direction will cause the target circuit to tend to fail.

[0152] The component simulation module 904 is used to obtain the simulation results of each sensitive element through the circuit simulation model of the target circuit, when the parameters of the first sensitive element are updated and the parameters of the second sensitive element remain unchanged; the first sensitive element is any one of the sensitive elements, and the second sensitive element is any sensitive element other than the first sensitive element.

[0153] The third identification module 905 is used to identify the target component that causes the target circuit to fail based on the simulation results of each sensitive component.

[0154] In one embodiment, the second identification module 903 is further configured to identify the parameter drift direction of the key resistor-capacitor component; query the correspondence between the parameter drift direction of the key resistor-capacitor component and the circuit performance to obtain the circuit performance corresponding to the parameter drift direction of the key resistor-capacitor component; and, based on the circuit performance corresponding to the parameter drift direction of the key resistor-capacitor component, identify the key resistor-capacitor component that causes the target circuit to tend to fail from the key resistor-capacitor components, and use it as a sensitive component in the target circuit.

[0155] In one embodiment, the circuit fault simulation device for resistor-capacitor components further includes a parameter drift direction identification module, which is used to obtain failure mechanism information of key resistor-capacitor components under preset stress conditions; obtain failure phenomenon information corresponding to the failure mechanism information as failure phenomenon information of key resistor-capacitor components; and determine the parameter drift direction of key resistor-capacitor components based on the failure phenomenon information.

[0156] In one embodiment, the circuit fault simulation device for resistor-capacitor components further includes a circuit simulation module, which is used to establish a circuit simulation model for the target circuit based on the circuit information of the target circuit; and to simulate the target circuit based on the circuit simulation model to obtain the simulation results of the target circuit.

[0157] The component simulation module 904 is also used to perform the following steps when the simulation result is normal: updating the parameter value of the first sensitive component and keeping the parameter value of the second sensitive component unchanged, and obtaining the simulation result of each sensitive component through the circuit simulation model of the target circuit.

[0158] In one embodiment, the component simulation module 904 is further configured to update the parameter value of the first sensitive element based on the parameter drift direction of the first sensitive element while keeping the parameter value of the second sensitive element unchanged; record the circuit performance parameters corresponding to each parameter value update through the circuit simulation model of the target circuit; and obtain the simulation result of each sensitive element based on the circuit performance parameters corresponding to each parameter value update.

[0159] In one embodiment, the circuit fault simulation device for resistor-capacitor components further includes a preset information providing module for acquiring prevention information corresponding to the failure mechanism information of the target component; and using the prevention information as circuit design reference information for the target circuit.

[0160] The modules in the aforementioned circuit fault simulation device for resistors and capacitors can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in the processor of a computer device in hardware form or independent of it, or stored in the memory of the computer device in software form, so that the processor can call and execute the corresponding operations of each module.

[0161] In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as follows: Figure 10 As shown, the computer device includes a processor, memory, input / output interfaces, a communication interface, a display unit, and an input device. The processor, memory, and input / output interfaces are connected via a system bus, and the communication interface is also connected to the system bus via the input / output interfaces. The processor provides computing and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The input / output interfaces are used for exchanging information between the processor and external devices. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, mobile cellular networks, NFC (Near Field Communication), or other technologies. When executed by the processor, the computer program implements a circuit fault simulation method for resistive and capacitive components. The display unit is used to form a visually visible image and can be a display screen, a projection device, or a virtual reality imaging device. The display screen can be an LCD screen or an e-ink screen. The input device of the computer device can be a touch layer covering the display screen, or buttons, trackballs, or touchpads set on the casing of the computer device, or external keyboards, touchpads, or mice, etc.

[0162] Those skilled in the art will understand that Figure 10The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0163] In one embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to perform the following steps:

[0164] Obtain circuit information for the target circuit; the target circuit contains resistive and capacitive components;

[0165] Based on the circuit information, identify the key resistors and capacitors from the resistors and capacitors contained in the target circuit; the key resistors and capacitors are those that are related to the circuit performance of the target circuit.

[0166] Identify sensitive components in the target circuit from key resistor-capacitor components; sensitive components are candidate components whose parameter drift direction will cause the target circuit to tend to fail.

[0167] When the parameter value of the first sensitive element is updated and the parameter value of the second sensitive element remains unchanged, the simulation results of each sensitive element are obtained through the circuit simulation model of the target circuit; the first sensitive element is any one of the sensitive elements, and the second sensitive element is any sensitive element other than the first sensitive element.

[0168] Based on the simulation results of each sensitive element, the target element that causes the target circuit to fail is identified from among the sensitive elements.

[0169] In one embodiment, when the processor executes the computer program, it further performs the following steps: identifying the parameter drift direction of the key resistor-capacitor components; querying the correspondence between the parameter drift direction of the key resistor-capacitor components and the circuit performance to obtain the circuit performance corresponding to the parameter drift direction of the key resistor-capacitor components; and, based on the circuit performance corresponding to the parameter drift direction of the key resistor-capacitor components, identifying the key resistor-capacitor components that cause the target circuit to tend to fail, as sensitive components in the target circuit.

[0170] In one embodiment, when the processor executes the computer program, it further performs the following steps: acquiring failure mechanism information of key resistor-capacitor components under preset stress conditions; acquiring failure phenomenon information corresponding to the failure mechanism information as failure phenomenon information of key resistor-capacitor components; and determining the parameter drift direction of key resistor-capacitor components based on the failure phenomenon information.

[0171] In one embodiment, when the processor executes the computer program, it further performs the following steps: establishing a circuit simulation model for the target circuit based on the circuit information of the target circuit; simulating the target circuit based on the circuit simulation model to obtain the simulation result of the target circuit; and, if the simulation result is normal, performing the step of updating the parameter value of the first sensitive element and keeping the parameter value of the second sensitive element unchanged, and obtaining the simulation result of each sensitive element through the circuit simulation model of the target circuit.

[0172] In one embodiment, when the processor executes the computer program, it further performs the following steps: while keeping the parameter value of the second sensitive element unchanged, updating the parameter value of the first sensitive element based on the parameter drift direction of the first sensitive element; recording the circuit performance parameters corresponding to each parameter value update through the circuit simulation model of the target circuit; and obtaining the simulation result of each sensitive element based on the circuit performance parameters corresponding to each parameter value update.

[0173] In one embodiment, when the processor executes the computer program, it further performs the following steps: acquiring prevention information corresponding to the failure mechanism information of the target component; and using the prevention information as circuit design reference information for the target circuit.

[0174] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon that, when executed by a processor, implements the steps in the above method embodiments.

[0175] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps in the above method embodiments.

[0176] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of the relevant data shall comply with the relevant laws, regulations and standards of the relevant countries and regions.

[0177] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0178] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0179] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A circuit fault simulation method for resistive and capacitive components, characterized in that, The method includes: Obtain circuit information for a target circuit; the target circuit includes resistive and capacitive components; Based on the circuit information, key resistor-capacitor components are identified from the resistor-capacitor components included in the target circuit; the key resistor-capacitor components are those related to the circuit performance of the target circuit. The process involves: acquiring failure mechanism information of the key resistor-capacitor components under preset stress conditions; acquiring failure phenomenon information corresponding to the failure mechanism information as the failure phenomenon information of the key resistor-capacitor components; determining the parameter drift direction of the key resistor-capacitor components based on the failure phenomenon information; querying the correspondence between the parameter drift direction and circuit performance to obtain the circuit performance corresponding to the parameter drift direction; identifying key resistor-capacitor components that cause the target circuit to tend to fail from the key resistor-capacitor components based on the circuit performance corresponding to the parameter drift direction as sensitive components in the target circuit; the parameter drift direction includes parameter increase, parameter decrease, and parameter instability; the sensitive components are candidate components whose parameter drift direction will cause the target circuit to tend to fail. Based on the circuit information of the target circuit, a circuit simulation model for the target circuit is established; based on the circuit simulation model, the target circuit is simulated to obtain the simulation result of the target circuit; when the simulation result is in a normal state, the step of updating the parameter value of the first sensitive element and keeping the parameter value of the second sensitive element unchanged is performed, and the simulation result of each sensitive element is obtained through the circuit simulation model of the target circuit; the first sensitive element is any one of the sensitive elements, and the second sensitive element is any sensitive element other than the first sensitive element. Based on the simulation results of each sensitive element, the target element that causes the target circuit to tend to fail is identified from the sensitive elements.

2. The method according to claim 1, characterized in that, When the parameter value of the first sensitive element is updated and the parameter value of the second sensitive element remains unchanged, the simulation results of each sensitive element are obtained through the circuit simulation model of the target circuit, including: While keeping the parameter value of the second sensitive element unchanged, update the parameter value of the first sensitive element based on the parameter drift direction of the first sensitive element; The circuit performance parameters corresponding to each parameter value update are recorded using the circuit simulation model of the target circuit. The simulation results for each sensitive element are obtained by updating the circuit performance parameters corresponding to each parameter value.

3. The method according to any one of claims 1 to 2, characterized in that, The method further includes: Obtain prevention information corresponding to the failure mechanism information of the target component; The aforementioned prevention information will be used as reference information for the circuit design of the target circuit.

4. A circuit fault simulation device for resistive and capacitive components, characterized in that, The device includes: An information acquisition module is used to acquire circuit information for a target circuit; the target circuit includes resistive and capacitive components. The first identification module is used to identify key resistor-capacitor components from the resistor-capacitor components included in the target circuit based on the circuit information; the key resistor-capacitor components are resistor-capacitor components related to the circuit performance of the target circuit. The second identification module is used to acquire failure mechanism information of the key resistor-capacitor components under preset stress conditions; acquire failure phenomenon information corresponding to the failure mechanism information as failure phenomenon information of the key resistor-capacitor components; determine the parameter drift direction of the key resistor-capacitor components based on the failure phenomenon information; query the correspondence between the parameter drift direction and circuit performance to obtain the circuit performance corresponding to the parameter drift direction; and identify the key resistor-capacitor components that cause the target circuit to tend to fail from the key resistor-capacitor components based on the circuit performance corresponding to the parameter drift direction as sensitive components in the target circuit; the parameter drift direction includes parameter increase, parameter decrease, and parameter instability; the sensitive component is a candidate component whose parameter drift direction will cause the target circuit to tend to fail. The component simulation module is used to establish a circuit simulation model for the target circuit based on the circuit information of the target circuit; to simulate the target circuit based on the circuit simulation model and obtain the simulation result of the target circuit; and, when the simulation result is in a normal state, to perform the step of updating the parameter value of the first sensitive element and keeping the parameter value of the second sensitive element unchanged, and obtaining the simulation result of each sensitive element through the circuit simulation model of the target circuit; wherein the first sensitive element is any one of the sensitive elements, and the second sensitive element is any sensitive element other than the first sensitive element. The third identification module is used to identify the target element that causes the target circuit to fail, based on the simulation results of each of the sensitive elements.

5. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 3.

6. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 3.

7. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 3.

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