Testing method, system, computer device and storage medium for Internet of Things devices

Abstract

The present application relates to a testing method, system, computer device and storage medium for an Internet of Things device. The method includes: obtaining load voltage data of a target load device when it is determined that a host computer has started a test on an Internet of Things device; the target load device is a device that is a load of the Internet of Things device; the Internet of Things device is used to control the device status of the target load device; based on the load voltage data obtained multiple times and the abnormal load status conditions corresponding to the target load device, the target load device is monitored to determine the load status monitoring result of the target load device; when a load query instruction is obtained, the load status monitoring result is sent to the host computer to instruct the host computer to determine the target test result of the Internet of Things device based on the load status monitoring result. The use of this method can improve the accuracy of Internet of Things testing.

Description

Technical Field

[0001] The present application relates to the field of Internet of Things technology, and in particular to a testing method, system, computer device, and storage medium for Internet of Things devices. Background Art

[0002] With the development of IoT technology, more and more devices are becoming connected. For example, in smart homes, IoT technology connects various devices in the home, providing multiple functions such as home appliance control, lighting control, and remote phone control.

[0003] In traditional technology, during the testing of IoT devices, only the status of the IoT devices themselves is considered, which has certain limitations and leads to relatively low accuracy of IoT testing. Summary of the Invention

[0004] Based on this, it is necessary to provide a testing method, system, computer device, computer-readable storage medium and computer program product for IoT devices that can improve accuracy in response to the above technical problems.

[0005] In a first aspect, the present application provides a method for testing an IoT device. The method comprises:

[0006] When it is determined that the host computer has started a test on the IoT device, load voltage data of a target load device is obtained; the target load device is a device loaded by the IoT device; and the IoT device is used to control the device state of the target load device;

[0007] Performing status monitoring on the target load device based on the load voltage data acquired multiple times and the abnormal load status condition corresponding to the target load device, and determining a load status monitoring result of the target load device;

[0008] When a load query instruction is obtained, the load status monitoring result is sent to the host computer to instruct the host computer to determine a target test result for testing the Internet of Things device based on the load status monitoring result.

[0009] In one embodiment, obtaining load voltage data of a target load device includes:

[0010] Obtaining the load analog value collected by the current transformer set on the circuit of the target load device;

[0011] Perform analog-to-digital conversion on the load analog quantity to obtain load voltage data of the target load device.

[0012] In one embodiment, the target load device includes a lighting device; the IoT device load includes multiple lighting devices; and obtaining a load analog value collected by a current transformer provided on a circuit of the target load device includes:

[0013] Obtain the load analog value of the current transformer set on the circuit of each lighting device according to the collection time interval;

[0014] Performing analog-to-digital conversion on the load analog quantity to obtain load voltage data of the target load device includes:

[0015] For each lighting device, analog-to-digital conversion is performed on the load analog quantity of the lighting device through an analog-to-digital converter corresponding to the lighting device to obtain load voltage data of the lighting device.

[0016] In one embodiment, performing analog-to-digital conversion on the load analog quantity to obtain load voltage data of the target load device includes:

[0017] Performing analog-to-digital conversion on the load analog quantity, and writing the converted load voltage data into the result storage space;

[0018] The load voltage data in the result storage space is stored in a preset storage space, so as to obtain the load voltage data of the target load device from the preset storage space.

[0019] In one embodiment, the performing status monitoring on the target load device based on the load voltage data acquired multiple times and the abnormal load status condition corresponding to the target load device, and determining the load status monitoring result of the target load device includes:

[0020] When the load voltage data acquired for a preset number of consecutive times reaches a voltage abnormality threshold corresponding to the target load device, a load state monitoring result indicating that the load state of the target load device is abnormal is determined.

[0021] In one embodiment, when the load voltage data acquired for a preset number of consecutive times reaches the voltage abnormality threshold corresponding to the target load device, determining the load state monitoring result indicating that the load state of the target load device is abnormal includes:

[0022] When the acquired load voltage data reaches the voltage abnormality threshold corresponding to the target load device each time, controlling the counter to increase the count;

[0023] clearing the count value of the counter when the load voltage data obtained each time does not reach the voltage abnormality threshold;

[0024] When the count value of the counter reaches an abnormal state threshold, a load state monitoring result indicating that the load state of the target load device is abnormal is determined.

[0025] In one embodiment, when a load query instruction is obtained, sending the load status monitoring result to the host computer to instruct the host computer to determine a target test result for testing the IoT device based on the load status monitoring result includes:

[0026] When a load query instruction is obtained, the load status monitoring result is sent to the host computer to instruct the host computer to determine the target test result of the Internet of Things device based on the load status monitoring result and the basic test result;

[0027] Among them, the basic test result is the test result output by the host computer when starting the test on the Internet of Things device.

[0028] In a second aspect, the present application also provides a testing system for an IoT device. The system includes a host computer, a target load device, an IoT device, and a load status monitoring device; the target load device is a device that the IoT device loads; and the IoT device is used to control the device status of the target load device.

[0029] The host computer is used to start testing the IoT device;

[0030] The load status monitoring device is configured to obtain load voltage data of a target load device when it is determined that the host computer has started testing the IoT device; perform status monitoring on the target load device based on the load voltage data obtained multiple times and the abnormal load status conditions corresponding to the target load device, and determine a load status monitoring result of the target load device; and send the load status monitoring result to the host computer when a load query instruction is obtained;

[0031] The host computer is further configured to determine a target test result for testing the IoT device based on the load status monitoring result.

[0032] In a third aspect, the present application further provides a computer device comprising a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps of each embodiment of the method described in the present application.

[0033] In a fourth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of each embodiment of the method described in the present application.

[0034] In a fifth aspect, the present application further provides a computer program product, which includes a computer program that, when executed by a processor, implements the steps in each embodiment of the method described in the present application.

[0035] The above-mentioned testing method, system, computer device, storage medium, and computer program product for IoT devices, when determining that the host computer has started testing the IoT device, obtains the load voltage data of the target load device; the target load device is the device loaded by the IoT device; the IoT device is used to control the device status of the target load device; based on the load voltage data obtained multiple times and the abnormal load status conditions corresponding to the target load device, the target load device is monitored to determine the load status monitoring result of the target load device; when a load query instruction is obtained, the load status monitoring result is sent to the host computer to instruct the host computer to determine the target test result of the IoT device based on the load status monitoring result. By obtaining the load voltage data of the target load device loaded by the IoT device and performing status monitoring on the target load device, the target test result of the IoT device can be determined in combination with the status monitoring result of the target load device. Compared with the traditional method that only considers the status of the IoT device itself, the accuracy of IoT testing is improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] Figure 1 This is an application environment diagram of a testing method for an Internet of Things device in one embodiment;

[0037] Figure 2 1 is a flow chart of a method for testing an IoT device in one embodiment;

[0038] Figure 3 A schematic diagram of a process for determining a load status monitoring result in one embodiment;

[0039] Figure 4 A schematic diagram of a process for obtaining a load query instruction in one embodiment;

[0040] Figure 5 A structural block diagram of a testing system for an Internet of Things device in one embodiment;

[0041] Figure 6 FIG. 1 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0042] In order to make the purpose, technical solutions and advantages of this application more clear, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0043] The testing method of the Internet of Things device provided in the embodiment of the present application can be applied to Figure 1 In the application environment shown. The load status monitoring device 102 communicates with the host computer 104 via a serial communication protocol. It is understood that the serial communication protocol may be a UART (Universal Asynchronous Receiver / Transmitter) protocol. The UART protocol is a serial, asynchronous, full-duplex communication protocol. The host computer 104 may initiate a test on the IoT device; the load status monitoring device 102 may obtain load voltage data of a target load device upon determining that the host computer 104 has initiated a test on the IoT device; the target load device is a device loaded by the IoT device; the IoT device is used to control the device status of the target load device; the load status monitoring device 102 may monitor the status of the target load device based on the load voltage data obtained multiple times and the load status abnormality conditions corresponding to the target load device, and determine the load status monitoring result of the target load device; the load status monitoring device 102 may send the load status monitoring result to the host computer upon obtaining a load query instruction; and the host computer 104 may determine the target test result for the IoT device based on the load status monitoring result. The host computer may be a terminal or a server. Terminals include, but are not limited to, various personal computers, laptops, smartphones, tablets, IoT devices, and portable wearable devices. IoT devices include smart speakers, smart TVs, smart air conditioners, and smart car devices. Portable wearable devices include smart watches, smart bracelets, and head-mounted devices. Servers can be implemented as standalone servers or as a server cluster consisting of multiple servers.

[0044] In one embodiment, Figure 2 As shown, a testing method for an IoT device is provided. The method is implemented through interaction between a host computer, a target load device, an IoT device, and a load status monitoring device, and includes the following steps:

[0045] S202 : When it is determined that the host computer has started testing the IoT device, load voltage data of the target load device is obtained.

[0046] The target load device is the device that the IoT device is loading. The IoT device is used to control the device status of the target load device. It can be understood that the target load device is actually the part of the IoT device that is loaded by the IoT device, in addition to the IoT device itself. For example, in a smart home scenario, the load of the IoT device, a smart switch, can be a lighting device, so the lighting device is the target load device. The load voltage data indicates the voltage on the circuit of the target load device.

[0047] For example, the host computer may start a test process for the IoT device, and the target load device may obtain the load voltage data of the target load device when the test process for the IoT device is started.

[0048] In one embodiment, the load state monitoring device may include a single chip microcomputer and a current transformer. The load state monitoring device may detect a load analog quantity of the target load device through the current transformer and convert the load analog quantity into load voltage data through the single chip microcomputer.

[0049] In one embodiment, when it is determined that the host computer has initiated a burn-in test on the IoT device, load voltage data of the target load device is obtained. It is understood that the load of the IoT device will affect the aging of the IoT device, so the load of the IoT device needs to be considered during the burn-in test.

[0050] In one embodiment, the IoT device may be a smart home device, such as at least one of a smart central control device and a smart switch device.

[0051] S204 , performing status monitoring on the target load device based on the load voltage data acquired multiple times and the abnormal load status conditions corresponding to the target load device, and determining a load status monitoring result of the target load device.

[0052] The abnormal load condition refers to a condition for determining whether the load state is abnormal. It is understood that the configuration of each load device is different, and the corresponding abnormal load condition is also different.

[0053] Exemplarily, the load state monitoring device may determine a load state monitoring result indicating that the load state of the target load device is abnormal when the load voltage data acquired multiple times meets the load state abnormality condition corresponding to the target load device.

[0054] In one embodiment, the load state abnormality condition may be that the load voltage data reaches a voltage abnormality threshold. When the load voltage data acquired multiple times all reach the voltage abnormality threshold, a load state monitoring result indicating that the load state of the target load device is abnormal is determined.

[0055] S206: When the load query instruction is obtained, the load status monitoring result is sent to the host computer to instruct the host computer to determine the target test result for the IoT device based on the load status monitoring result.

[0056] The load query instruction is used to instruct the load status monitoring device to feed back the load status monitoring result of the target load device to the host computer.

[0057] For example, the load status monitoring device can receive a load query command sent by a host computer. Upon receiving the load query command, the load status monitoring device can transmit the load status monitoring result to the host computer. It is understood that the load condition of the IoT device is a test condition for IoT device reliability testing. The host computer can adjust the test conditions of the IoT device based on the load status monitoring result and continue testing the IoT device to obtain the target test result.

[0058] In the above-mentioned method for testing an IoT device, when it is determined that the host computer has started testing the IoT device, the load voltage data of the target load device is obtained; the target load device is the device loaded by the IoT device; the IoT device is used to control the device status of the target load device; based on the load voltage data obtained multiple times and the abnormal load status conditions corresponding to the target load device, the target load device is monitored to determine the load status monitoring result of the target load device; when a load query instruction is obtained, the load status monitoring result is sent to the host computer to instruct the host computer to determine the target test result for testing the IoT device based on the load status monitoring result. By obtaining the load voltage data of the target load device loaded by the IoT device and performing status monitoring on the target load device, the target test result of the IoT device can be subsequently determined in combination with the status monitoring result of the target load device. Compared with the traditional method that only considers the status of the IoT device itself, the accuracy of the IoT test is improved.

[0059] In one embodiment, obtaining the load voltage data of the target load device includes: obtaining a load analog quantity collected by a current transformer provided on a circuit of the target load device; and performing analog-to-digital conversion on the load analog quantity to obtain the load voltage data of the target load device.

[0060] A current transformer is an instrument that uses the principle of electromagnetic induction to convert a large primary current into a smaller secondary current for measurement. The load analog quantity is the analog signal collected by the current transformer. Load voltage data includes the digital signal converted from the analog signal. For example, load voltage data can include the voltage value on the circuit of the target load device.

[0061] For example, a current transformer is contactlessly attached to the power supply circuit of the target load device. Based on the principle of electromagnetic induction, when current flows through the current transformer, it generates a current in the secondary circuit. This current, after passing through the sampling resistor, generates a voltage drop, i.e., the load analog value. The load status monitoring device includes an analog-to-digital converter corresponding to each current transformer. The load status monitoring device can determine the analog-to-digital converter corresponding to the target load device and obtain the load voltage data obtained by the analog-to-digital converter after performing analog-to-digital conversion of the load analog value.

[0062] In one embodiment, after the on-chip peripheral functions of the single-chip microcomputer in the load status monitoring device are pre-configured, the load voltage data can be collected through the analog-to-digital converter of the single-chip microcomputer. For example, the analog-to-digital converter of the single-chip microcomputer is configured to operate in a cyclic scan + direct memory access mode.

[0063] In this embodiment, a load analog quantity collected by a current transformer provided on a circuit of a target load device is obtained; the load analog quantity is converted into a digital form to obtain load voltage data of the target load device. Subsequently, the load status monitoring result can be analyzed based on the load voltage data to determine the target test result based on the load status monitoring result, which fully considers the load condition of the IoT device and ensures the reliability of the test result.

[0064] In one embodiment, the target load device includes a lighting device; the Internet of Things device load includes multiple lighting devices; obtaining the load analog quantity collected by the current transformer set on the circuit of the target load device includes: obtaining the load analog quantity of the current transformer set on the circuit of each lighting device according to the collection time interval; performing analog-to-digital conversion on the load analog quantity to obtain the load voltage data of the target load device includes: for each lighting device, performing analog-to-digital conversion on the load analog quantity of the lighting device through the analog-to-digital converter corresponding to the lighting device to obtain the load voltage data of the lighting device.

[0065] For example, the load status monitoring device can use a time polling method to obtain the load analog value of the current transformer provided in the circuit of each lighting device at each collection time interval. The load status monitoring device can perform analog-to-digital conversion on the load analog value of each lighting device using the analog-to-digital converter corresponding to each lighting device to obtain load voltage data.

[0066] In one embodiment, the bare-metal architecture of the microcontroller uses a time-polling method. The microcontroller can instantly obtain the real-time voltage output of the current transformer. The microcontroller's analog-to-digital converter is configured for multi-channel acquisition, enabling monitoring of multiple lighting devices.

[0067] In one embodiment, the lighting device may be a 220-volt light bulb. The single-chip microcomputer may be a GD32, the acquisition time interval may be 500 microseconds, and the analog-to-digital converter of the single-chip microcomputer may be a 10-channel acquisition, which can monitor 10 light bulbs.

[0068] In this embodiment, the load analog quantity of the current transformer set on the circuit of each lighting device is obtained according to the collection time interval, and the load analog quantity of the lighting device is converted into a digital form through the analog-to-digital converter corresponding to the lighting device to obtain load voltage data. The load status monitoring results can be subsequently analyzed based on the load voltage data to determine the target test results based on the load status monitoring results, which fully considers the load conditions of the Internet of Things devices and ensures the reliability of the test results.

[0069] In one embodiment, performing analog-to-digital conversion on the load analog quantity to obtain load voltage data of the target load device includes: performing analog-to-digital conversion on the load analog quantity, and writing the converted load voltage data into a result storage space; storing the load voltage data in the result storage space into a preset storage space, so as to obtain the load voltage data of the target load device from the preset storage space.

[0070] Exemplarily, the load status monitoring device can transfer the load voltage data using direct memory access (DMA). The load status monitoring device can perform analog-to-digital conversion on the load analog quantity through an analog-to-digital converter, and write the converted load voltage data into the result register space corresponding to the analog-to-digital converter. The load status monitoring device can store the load voltage data in the result register space into a preset storage space using direct memory access (DMA) to obtain the load voltage data of the target load device from the preset storage space. Direct memory access is used to provide high-speed data transmission between peripherals and memories, and between memories.

[0071] In one embodiment, the source address of a direct memory access (DMA) in a single-chip microcomputer (MCU) of a load status monitoring device is set to the result register corresponding to the analog-to-digital converter (ADC), and the target address of the DMA is set to an array allocated in the storage space. It can be understood that this array is the preset storage space. By setting the DMA in the MCU to operate in a destination address auto-increment loop mode and the ADC in a regular channel scanning loop mode, load voltage data collected by multiple ADCs can be acquired in real time without blocking the MCU.

[0072] In this embodiment, the load voltage data in the result storage space is stored in the preset storage space to obtain the load voltage data of the target load device from the preset storage space. Subsequently, the load status monitoring results can be analyzed based on the load voltage data to determine the target test results based on the load status monitoring results. This fully considers the load conditions of the Internet of Things devices and ensures the reliability of the test results.

[0073] In one embodiment, the target load device is state-monitored based on the load voltage data acquired multiple times and the load state abnormality condition corresponding to the target load device, and determining the load state monitoring result of the target load device includes: when the load voltage data acquired a preset number of times continuously reaches the voltage abnormality threshold corresponding to the target load device, determining the load state monitoring result characterizing the load state abnormality of the target load device.

[0074] For example, the load state monitoring device may acquire load voltage data from a preset storage space at every acquisition time interval. If the load voltage data acquired for a preset number of consecutive times reaches a voltage anomaly threshold corresponding to the target load device, the load state monitoring device may determine a load state monitoring result indicating that the load state of the target load device is abnormal. If the load voltage data acquired any one of the preset number of consecutive times does not reach the voltage anomaly threshold corresponding to the target load device, the load state monitoring device may determine a load state monitoring result indicating that the load state of the target load device is normal.

[0075] In this embodiment, when the load voltage data obtained for a preset number of consecutive times reaches the voltage anomaly threshold corresponding to the target load device, a load status monitoring result characterizing the abnormal load status of the target load device is determined, and the target test result is subsequently determined based on the load status monitoring result, fully considering the load condition of the Internet of Things device to ensure the reliability of the test result.

[0076] In one embodiment, when the load voltage data obtained for a preset number of consecutive times reaches the voltage anomaly threshold corresponding to the target load device, determining the load state monitoring result characterizing that the load state of the target load device is abnormal includes: controlling a counter to increase the count each time the load voltage data obtained reaches the voltage anomaly threshold corresponding to the target load device; clearing the count value of the counter each time the load voltage data obtained does not reach the voltage anomaly threshold; and determining the load state monitoring result characterizing that the load state of the target load device is abnormal when the count value of the counter reaches the state anomaly threshold.

[0077] For example, because the load status monitoring device monitors multiple lighting devices, it cannot use commonly used filtering algorithms such as weighted averaging, first-order smoothing filtering, and sliding average to process the load voltage data. The load status monitoring device can control the counter to increase by one count each time the acquired load voltage data reaches the voltage anomaly threshold corresponding to the target load device. It is understood that the size of the count increased each time is consistent. The load status monitoring device can clear all count values ​​in the counter each time the acquired load voltage data does not reach the voltage anomaly threshold. When the count value of the counter reaches the state anomaly threshold, a load status monitoring result is determined that indicates an abnormal load state of the target load device.

[0078] In one embodiment, Figure 3The figure shows a flow chart for determining the load status monitoring result. The load status monitoring device determines whether there is an interval of 500 microseconds by judging whether the 500 microsecond timing flag is set. When the positioning flag is not set, the load status monitoring can handle other tasks. It can be understood that the setting of the positioning flag indicates an interval of 500us. The load status monitoring device can take out the load voltage data every 500us. If the load voltage data is less than the voltage abnormality threshold, the control counter is increased by 1, otherwise the counter is cleared. It can be understood that the load voltage data is automatically updated through direct memory access without processor intervention, so the load status monitoring device takes out the real-time updated value each time. If the cumulative count exceeds 10,000, the load status monitoring result is determined to be abnormal in the load status of the target load device.

[0079] In this embodiment, each time the load voltage data obtained reaches the voltage anomaly threshold corresponding to the target load device, the counter is controlled to increase the count; each time the load voltage data obtained does not reach the voltage anomaly threshold, the count value of the counter is cleared; when the count value of the counter reaches the state anomaly threshold, the load state monitoring result characterizing the load state anomaly of the target load device is determined. By controlling the counter, the accuracy of the load state monitoring results of multiple lighting devices can be guaranteed.

[0080] In one embodiment, when a load query instruction is obtained, the load status monitoring result is sent to the host computer to instruct the host computer to determine the target test result of the Internet of Things device based on the load status monitoring result. This includes: when a load query instruction is obtained, the load status monitoring result is sent to the host computer to instruct the host computer to determine the target test result of the Internet of Things device based on the load status monitoring result and the basic test result; wherein the basic test result is the test result output by the host computer for starting the test of the Internet of Things device.

[0081] For example, the load status monitoring device can cache received data in a serial port receive queue. After parsing the load query command from the serial port receive queue, the load status monitoring result is sent to a host computer. The host computer can combine the load status monitoring result with the basic test results to analyze the impact of the IoT device's load on device aging, and obtain a target test result. It is understood that the target test result can indicate the impact of IoT device load changes on IoT device aging.

[0082] In one embodiment, Figure 4A flowchart for obtaining load query commands is provided. The load status monitoring device can determine whether the 50-millisecond positioning flag is set. That is, the load status monitoring device checks every 50 milliseconds whether the serial port receive queue is empty. If the serial port receive queue is not empty, the load status monitoring device can parse the serial port data in the serial port receive queue. If the load query command is parsed, the load status monitoring result can be returned to the host computer.

[0083] In one embodiment, the microcontroller supports UART+RS485 communication, using a custom protocol frame to receive load query commands and report load status monitoring results. Furthermore, the microcontroller implements a receive circular buffer queue, namely the serial port receive queue, to prevent commands from the host computer from being overwritten by new commands if they are not responded to.

[0084] In this embodiment, when a load query instruction is obtained, the load status monitoring result is sent to the host computer to instruct the host computer to determine the target test result of the Internet of Things device based on the load status monitoring result and the basic test result, thereby ensuring the test accuracy of the Internet of Things device.

[0085] It should be understood that, although the various steps in the flowcharts involved in the various embodiments described above are displayed in sequence according to the instructions of the arrows, these steps are not necessarily executed in sequence in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and these steps can be executed in other orders. Moreover, at least a portion of the steps in the flowcharts involved in the various embodiments described above can include multiple steps or multiple stages, and these steps or stages are not necessarily executed and completed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a portion of steps or stages in other steps.

[0086] Based on the same inventive concept, embodiments of the present application also provide an IoT device testing system for implementing the aforementioned IoT device testing method. The solution provided by this system is similar to the solution described in the aforementioned method. Therefore, the specific limitations of the following embodiments of the testing system for one or more IoT devices can be found in the aforementioned limitations of the IoT device testing method, and will not be further elaborated here.

[0087] In one embodiment, Figure 5 As shown, a testing system 500 for an IoT device 506 is provided, comprising: a host computer 502, a target load device 504, the IoT device 506 and a load status monitoring device 508, wherein:

[0088] The target load device 504 is a device loaded by the IoT device 506 ; the IoT device 506 is used to control the device state of the target load device 504 .

[0089] The host computer 502 is used to start testing the IoT device 506 .

[0090] The load status monitoring device 508 is used to obtain the load voltage data of the target load device 504 when it is determined that the host computer 502 has started testing the Internet of Things device 506; perform status monitoring on the target load device 504 based on the load voltage data obtained multiple times and the abnormal load status conditions corresponding to the target load device 504, and determine the load status monitoring result of the target load device 504; and send the load status monitoring result to the host computer 502 when a load query instruction is obtained.

[0091] The host computer 502 is further configured to determine a target test result for the IoT device 506 based on the load status monitoring result.

[0092] In one embodiment, the load status monitoring device 508 is configured to obtain a load analog quantity collected by a current transformer provided on a circuit of the target load device 504 ; and perform analog-to-digital conversion on the load analog quantity to obtain load voltage data of the target load device 504 .

[0093] In one embodiment, the target load device 504 includes a lighting device; the Internet of Things device 506 is loaded with multiple lighting devices; the load status monitoring device 508 is used to obtain the load analog quantity of the current transformer set in the circuit of each lighting device according to the collection time interval; for each lighting device, the load analog quantity of the lighting device is converted into a digital form through the analog-to-digital converter corresponding to the lighting device to obtain the load voltage data of the lighting device.

[0094] In one embodiment, the load status monitoring device 508 is used to perform analog-to-digital conversion on the load analog quantity and write the converted load voltage data into the result storage space; the load voltage data in the result storage space is stored in the preset storage space to obtain the load voltage data of the target load device 504 from the preset storage space.

[0095] In one embodiment, the load state monitoring device 508 is configured to determine a load state monitoring result indicating that the load state of the target load device 504 is abnormal when the load voltage data acquired for a preset number of consecutive times reaches a voltage abnormality threshold corresponding to the target load device 504 .

[0096] In one embodiment, the load status monitoring device 508 is used to control the counter to increase the count each time the load voltage data obtained reaches the voltage anomaly threshold corresponding to the target load device 504; clear the count value of the counter each time the load voltage data obtained does not reach the voltage anomaly threshold; and determine the load status monitoring result characterizing the load status anomaly of the target load device 504 when the count value of the counter reaches the status anomaly threshold.

[0097] In one embodiment, the load status monitoring device 508 is used to send the load status monitoring result to the host computer 502 when a load query instruction is obtained; the host computer 502 is used to determine the target test result of the Internet of Things device 506 based on the load status monitoring result and the basic test result; wherein, the basic test result is the test result of the host computer 502 starting the test output of the Internet of Things device 506.

[0098] Each device in the test system for IoT device 506 may be implemented in whole or in part through software, hardware, or a combination thereof. Each of these devices may be embedded in or independent of a processor in a computer device in hardware form, or may be stored in a computer device memory in software form, so that the processor can call and execute operations corresponding to each of these devices.

[0099] In one embodiment, a computer device is provided. The computer device may be a host computer or a load status monitoring device. The internal structure diagram thereof may be as follows: Figure 6 As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, abbreviated as I / O) and a communication interface. The processor, memory and input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external device through a network connection. When the computer program is executed by the processor, a testing method for an Internet of Things device is implemented.

[0100] Those skilled in the art will understand that Figure 6 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different component arrangement.

[0101] In one embodiment, a computer device is provided, including a memory and a processor. The memory stores a computer program, and the processor implements the steps in the above method embodiments when executing the computer program.

[0102] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.

[0103] In one embodiment, a computer program product is provided, including a computer program, which implements the steps in the above method embodiments when executed by a processor.

[0104] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with the relevant laws, regulations and standards of relevant countries and regions.

[0105] Those skilled in the art will appreciate that all or part of the processes in the above-mentioned embodiment methods can be implemented by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, database or other media used in the embodiments provided in this application may include at least one of non-volatile and volatile memory. Non-volatile memory may include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory may include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in the various embodiments provided herein may include at least one of a relational database and a non-relational database. Non-relational databases may include, but are not limited to, distributed databases based on blockchains. The processor involved in the various embodiments provided herein may be, but are not limited to, a general-purpose processor, a central processing unit, a graphics processing unit, a digital signal processor, a programmable logic unit, a data processing logic unit based on quantum computing, and the like.

[0106] The technical features of the above embodiments can be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0107] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present application. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present application, and these modifications and improvements fall within the scope of protection of the present application. Therefore, the scope of protection of the present application shall be determined by the appended claims.

Claims

1. A testing method for an Internet of Things device, characterized in that: The method comprises: When it is determined that the host computer has started a test on the IoT device, load voltage data of a target load device is obtained; the target load device is a device loaded by the IoT device other than the IoT device itself; the IoT device is used to control the device state of the target load device; Performing status monitoring on the target load device based on the load voltage data acquired multiple times and the abnormal load status condition corresponding to the target load device, and determining a load status monitoring result of the target load device; When a load query instruction is obtained, the load status monitoring result is sent to the host computer to instruct the host computer to analyze the impact of the target load device on the aging of the Internet of Things device based on the load status monitoring result and the basic test result, and obtain the target test result of the Internet of Things device. The basic test result is the test result of the host computer starting the test output of the Internet of Things device.

2. The method according to claim 1, characterized in that The acquiring of load voltage data of the target load device includes: Obtaining the load analog value collected by the current transformer set on the circuit of the target load device; Perform analog-to-digital conversion on the load analog quantity to obtain load voltage data of the target load device.

3. The method according to claim 2, characterized in that The target load device includes a lighting device; the IoT device load includes multiple lighting devices; and the load analog quantity collected by the current transformer set on the circuit of the target load device includes: Obtain the load analog value of the current transformer set on the circuit of each lighting device according to the collection time interval; Performing analog-to-digital conversion on the load analog quantity to obtain load voltage data of the target load device includes: For each lighting device, analog-to-digital conversion is performed on the load analog quantity of the lighting device through an analog-to-digital converter corresponding to the lighting device to obtain load voltage data of the lighting device.

4. The method according to claim 2, characterized in that The performing analog-to-digital conversion on the load analog quantity to obtain load voltage data of the target load device includes: Performing analog-to-digital conversion on the load analog quantity, and writing the converted load voltage data into the result storage space; The load voltage data in the result storage space is stored in a preset storage space, so as to obtain the load voltage data of the target load device from the preset storage space.

5. The method according to claim 1, wherein The performing status monitoring on the target load device based on the load voltage data acquired multiple times and the abnormal load status condition corresponding to the target load device, and determining the load status monitoring result of the target load device includes: When the load voltage data acquired for a preset number of consecutive times reaches a voltage abnormality threshold corresponding to the target load device, a load state monitoring result indicating that the load state of the target load device is abnormal is determined.

6. The method according to claim 3, characterized in that When the load voltage data acquired for a preset number of consecutive times reaches the voltage abnormality threshold corresponding to the target load device, determining the load state monitoring result indicating that the load state of the target load device is abnormal includes: When the acquired load voltage data reaches the voltage abnormality threshold corresponding to the target load device each time, controlling the counter to increase the count; clearing the count value of the counter when the load voltage data obtained each time does not reach the voltage abnormality threshold; When the count value of the counter reaches an abnormal state threshold, a load state monitoring result indicating that the load state of the target load device is abnormal is determined.

7. A testing system for an Internet of Things device, characterized in that: The system includes a host computer, a target load device, an Internet of Things device, and a load status monitoring device; the target load device is a device loaded by the Internet of Things device other than the Internet of Things device itself; the Internet of Things device is used to control the device status of the target load device; The host computer is used to start testing the IoT device; The load status monitoring device is used to obtain load voltage data of the target load device when it is determined that the host computer has started testing the IoT device; Performing status monitoring on the target load device based on the load voltage data obtained multiple times and the load status abnormality condition corresponding to the target load device, and determining the load status monitoring result of the target load device; and sending the load status monitoring result to the host computer when a load query instruction is obtained; The host computer is also used to analyze the impact of the target load device on the aging of the Internet of Things device based on the load status monitoring results and basic test results, and obtain the target test results of the Internet of Things device. The basic test results are the test results of the host computer starting the test output of the Internet of Things device.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 6 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

10. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

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