Detection method, areal density device, detection apparatus, and storage medium

Abstract

The present application discloses a detection method, a surface density device, a detection apparatus, and a storage medium. The surface density device includes a radiation source and an ionization chamber disposed at an interval from the radiation source. The detection method includes: during the operation of the surface density device, obtaining a first current pose of the radiation source and a second current pose of the ionization chamber; confirming a first pose deviation of the radiation source according to the first current pose; confirming a second pose deviation of the ionization chamber according to the second current pose; and determining whether a pose change occurs between the radiation source and the ionization chamber according to the first pose deviation and the second pose deviation. In the detection method according to the embodiments of the present application, the current poses of the radiation source and the ionization chamber are first obtained respectively, and then it is confirmed whether a pose change occurs between the radiation source and the ionization chamber according to the current poses, so that corresponding measures can be taken when a pose change occurs between the radiation source and the ionization chamber, thereby improving the accuracy of the measurement result of the surface density device.

Description

Technical Field

[0001] This application relates to the field of testing technologies, and particularly to a detection method, a surface density device, a detection apparatus, and a storage medium. Background Art

[0002] A surface density device is a device for detecting the thickness and / or density of a sheet-like object. Generally, a surface density device includes a radiation source and an ionization chamber. When the surface density device is working, the object to be detected is arranged between the radiation source and the ionization chamber. The radiation source emits rays to the object to be measured, and the rays enter the ionization chamber after passing through the object to be measured. The ionization chamber determines the thickness and / or density of the object to be measured according to the attenuation degree of the rays. However, when the surface density device is used for too long, the relative position between the radiation source and the ionization chamber may change, resulting in inaccurate measurement results. Summary of the Invention

[0003] Embodiments of this application provide a detection method, a surface density device, a detection apparatus, and a storage medium, which can at least partially solve the technical problem that when the surface density device is used for too long, the relative position between the radiation source and the ionization chamber may change, resulting in inaccurate measurement results.

[0004] In the detection method of the surface density device according to the embodiments of this application, the surface density device includes a radiation source and an ionization chamber spaced from the radiation source, and the detection method includes:

[0005] During the working process of the surface density device, obtain the first current pose of the radiation source and the second current pose of the ionization chamber;

[0006] Confirm the first pose deviation of the radiation source according to the first current pose;

[0007] Confirm the second pose deviation of the ionization chamber according to the second current pose;

[0008] Determine whether the pose of the radiation source relative to the ionization chamber has changed according to the first pose deviation and the second pose deviation.

[0009] In the detection method according to the embodiments of this application, first obtain the current poses of the radiation source and the ionization chamber respectively, and then confirm whether the pose of the radiation source relative to the ionization chamber has changed according to the current poses, so that corresponding measures can be taken when the pose of the radiation source relative to the ionization chamber changes, thereby improving the accuracy of the measurement results of the surface density device.

[0010] In addition, detecting the poses of the radiation source and the ionization chamber during the working process of the surface density device enables the surface density device to operate without stopping, making the detection process more convenient, facilitating real-time correction of the measurement results of the surface density device, and making the detection efficiency of the surface density device higher.

[0011] In some embodiments, obtaining the first current pose of the radiation source and the second current pose of the ionization chamber includes:

[0012] Obtaining the current positions of the radiation source and the ionization chamber in at least one direction to determine the first current pose and the second current pose.

[0013] In this way, the first current pose and the second current pose are more easily determined.

[0014] In some embodiments, obtaining the current positions of the radiation source and the ionization chamber in at least one direction to determine the first current pose and the second current pose includes:

[0015] Obtaining the first current position of the radiation source in a first direction, where the first direction is the same as the movement direction of the radiation source;

[0016] Obtaining the second current position of the ionization chamber in the first direction, where the first current pose includes the first current position and the second current pose includes the second current position;

[0017] Determining whether a pose change of the radiation source relative to the ionization chamber occurs according to the first pose deviation and the second pose deviation includes:

[0018] When the degrees of deviation of the first pose deviation and the second pose deviation are different, determining that a pose change of the radiation source relative to the ionization chamber occurs in the first direction.

[0019] In this way, it is possible to detect whether a relative pose change occurs between the ionization chamber and the radiation source in the first direction.

[0020] In some embodiments, obtaining the first current position of the radiation source in the first direction includes:

[0021] Obtaining the first current positions of two different parts of the radiation source in the first direction;

[0022] Determining the first torsion amount of the radiation source according to the two first current positions, where the first current pose includes the first torsion amount;

[0023] Obtaining the second current position of the ionization chamber in the first direction includes;

[0024] Obtaining the second current positions of two different parts of the ionization chamber in the first direction;

[0025] Determining the second torsion amount of the ionization chamber according to the two second current positions, where the second current pose includes the second torsion amount;

[0026] Determining whether a pose change of the radiation source relative to the ionization chamber occurs according to the first pose deviation and the second pose deviation includes:

[0027] When the degrees of deviation of the first pose deviation and the second pose deviation are different, determining that a torsional pose change of the radiation source relative to the ionization chamber occurs.

[0028] In this way, it is possible to determine whether a pose change in the torsional state occurs between the radiation source and the ionization chamber.

[0029] In some embodiments, obtaining the current positions of the radiation source and the ionization chamber in at least one direction to determine the first current pose and the second current pose includes:

[0030] Obtaining a third current position of the radiation source in a second direction, where the second direction is perpendicular to the movement direction of the radiation source and perpendicular to the arrangement direction of the radiation source and the ionization chamber;

[0031] Obtaining a fourth current position of the radiation source in the second direction, where the first current pose includes the third current position and the second current pose includes the fourth current position;

[0032] Determining whether a pose change of the radiation source relative to the ionization chamber occurs according to the first pose deviation and the second pose deviation includes:

[0033] When the degrees of deviation of the first pose deviation and the second pose deviation are different, determining that a pose change of the radiation source relative to the ionization chamber occurs in the second direction.

[0034] In this way, it is possible to detect whether a relative pose change occurs between the ionization chamber and the radiation source in the second direction.

[0035] In some embodiments, obtaining the current positions of the radiation source and the ionization chamber in at least one direction to determine the first current pose and the second current pose includes:

[0036] Obtaining a fourth current position of the radiation source in a third direction, where the third direction is the same as the arrangement direction of the radiation source and the ionization chamber;

[0037] Obtaining a fifth current position of the radiation source in the third direction, where the first current pose includes the fourth current position and the second current pose includes the fifth current position;

[0038] Determining whether a pose change of the radiation source relative to the ionization chamber occurs according to the first pose deviation and the second pose deviation includes:

[0039] When the degrees of deviation of the first pose deviation and the second pose deviation are different, it is determined that the radiation source has a pose change relative to the ionization chamber in the third direction.

[0040] In this way, it is possible to detect whether there is a relative pose change between the ionization chamber and the radiation source in the third direction.

[0041] In some embodiments, the detection method further includes:

[0042] When the radiation source has a pose change relative to the ionization chamber, correct the measurement result of the areal density device according to the amount of pose change.

[0043] In this way, correcting the measurement result of the areal density device according to the amount of pose change makes the measurement result of the areal density device more accurate.

[0044] The areal density device according to the embodiment of the present application includes:

[0045] A radiation source;

[0046] An ionization chamber arranged at an interval from the radiation source;

[0047] A memory, a processor, and a computer program stored on the memory and executable on the processor, and when the processor executes the program, the steps of the method described in any of the above embodiments are implemented.

[0048] In this way, first obtain the current poses of the radiation source and the ionization chamber respectively, and then confirm whether the radiation source has a pose change relative to the ionization chamber according to the current poses, so that corresponding measures can be taken when the radiation source has a pose change relative to the ionization chamber, so as to improve the accuracy of the measurement result of the areal density device.

[0049] In some embodiments, distance sensors are provided on both the radiation source and the ionization chamber, and the distance sensors are used to detect the distances between the radiation source and the ionization chamber and a predetermined position.

[0050] In this way, the current poses of the radiation source and the ionization chamber can be conveniently obtained according to the distance sensors.

[0051] A detection device includes:

[0052] An acquisition module, configured to acquire a first current pose of the radiation source of the areal density device and a second current pose of the ionization chamber of the areal density device during the operation of the areal density device;

[0053] A confirmation module, configured to confirm a first pose deviation of the radiation source according to the first current pose, and confirm a second pose deviation of the ionization chamber according to the second current pose;

[0054] A determination module, configured to determine whether a pose change of the radiation source relative to the ionization chamber occurs according to the first pose deviation and the second pose deviation.

[0055] In this way, the current poses of the radiation source and the ionization chamber are respectively obtained first, and then it is confirmed whether a pose change of the radiation source relative to the ionization chamber occurs according to the current poses, so that corresponding measures can be taken when a pose change of the radiation source relative to the ionization chamber occurs, thereby improving the accuracy of the measurement result of the surface density device.

[0056] A non-volatile computer-readable storage medium storing computer-executable instructions, which, when executed by one or more processors, cause the processors to execute the detection method described in any one of the above embodiments.

[0057] Additional aspects and advantages of the present application will be given in part in the following description, become apparent in part from the following description, or be learned through the practice of the present application. Description of the Drawings

[0058] The above and / or additional aspects and advantages of the present application will become apparent and be readily understood from the description of the embodiments in conjunction with the following drawings, where:

[0059] Figure 1 is a schematic flowchart of a detection method according to one embodiment of the present application;

[0060] Figure 2 is a perspective view of a surface density device according to one embodiment of the present application;

[0061] Figure 3 is a schematic diagram of a radiation source and an ionization chamber in a normal pose according to one embodiment of the present application;

[0062] Figure 4 is a schematic diagram of a pose change of the radiation source relative to the ionization according to one embodiment of the present application;

[0063] Figure 5 is a schematic diagram of a pose change of the radiation source relative to the ionization according to one embodiment of the present application;

[0064] Figure 6 is a schematic diagram of a pose change of the radiation source relative to the ionization according to one embodiment of the present application;

[0065] Figure 7 is a schematic flowchart of a detection method according to one embodiment of the present application;

[0066] Figure 8 is a schematic flowchart of a detection method according to one embodiment of the present application;

[0067] Figure 9 is a schematic flowchart of the detection method according to one embodiment of the present application;

[0068] Figure 10 is a schematic flowchart of the detection method according to one embodiment of the present application;

[0069] Figure 11 is a schematic flowchart of the detection method according to one embodiment of the present application;

[0070] Figure 12 is a schematic diagram of the calculation principle in the detection method according to one embodiment of the present application;

[0071] Figure 13 is a schematic flowchart of the detection method according to one embodiment of the present application;

[0072] Figure 14 is a schematic diagram of the modules of the detection device according to one embodiment of the present application.

[0073] Main reference numerals of the drawings:

[0074] Areal density device 100, radiation source 10, ionization chamber 20, first predetermined position 30, second predetermined position 40, third predetermined position 50, fourth predetermined position 60;

[0075] First distance sensor 101, second distance sensor 102, third distance sensor 103, fourth distance sensor 104, fifth distance sensor 105, sixth distance sensor 106, seventh distance sensor 107, eighth distance sensor 108;

[0076] Detection device 200, acquisition module 210, confirmation module 220, determination module 230. Detailed implementation manners

[0077] Hereinafter, embodiments of the technical solutions of the present application will be described in detail with reference to the drawings. The following embodiments are only used to illustrate the technical solutions of the present application more clearly, and thus are only examples and should not be used to limit the protection scope of the present application.

[0078] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field to which the present application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit the present application; the terms "including" and "having" and any variations thereof in the specification and claims of the present application and the above drawings are intended to cover non-exclusive inclusion.

[0079] In the description of the embodiments of the present application, technical terms such as "first" and "second" are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity, specific order or primary-secondary relationship of the indicated technical features. In the description of the embodiments of the present application, the meaning of "a plurality of" is more than two, unless otherwise specifically defined.

[0080] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in connection with the embodiments can be included in at least one embodiment of the present application. The phrase appears in various places in the specification and does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0081] In the description of the embodiments of the present application, the term "and / or" is merely a description of the association relationship of associated objects, indicating that three relationships can exist. For example, A and / or B can represent: A exists alone, A and B exist simultaneously, and B exists alone. In addition, the character " / " in this article generally represents an "or" relationship between the associated objects before and after.

[0082] In the description of the embodiments of the present application, the term "a plurality of" refers to more than two (including two). Similarly, "a plurality of groups" refers to more than two groups (including two groups), and "a plurality of sheets" refers to more than two sheets (including two sheets).

[0083] In the description of the embodiments of the present application, unless otherwise clearly specified and limited, technical terms such as "installation", "connection", "connection", "fixation" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or integrated; it can also be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two components or the interaction relationship between two components. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to specific situations.

[0084] The areal density device is a device for detecting the thickness and / or density of a sheet-like object. The areal density device generally includes a radiation source and an ionization chamber. When the areal density device is working, the object to be detected (such as an electrode sheet) is arranged between the radiation source and the ionization chamber. The radiation source emits rays to the object to be measured, and the rays enter the ionization chamber after passing through the object to be measured. The ionization chamber determines the thickness and / or density of the object to be measured according to the attenuation degree of the rays.

[0085] In a surface density device, a radiation source and an ionization chamber are generally installed on a guide rail. After the surface density device is assembled and debugged, the radiation source and the ionization chamber reciprocate on the guide rail to scan and detect the object to be measured. After the density device has been continuously used for a period of time, if components such as the guide rail of the surface density device undergo large deformations, fasteners become loose, transmission parts wear, etc., the relative pose between the radiation source and the detector will change. As a result, the effective rays emitted by the radiation source and passing through the object to be measured cannot be fully received by the ionization chamber, causing inaccurate measurement results of the surface density device.

[0086] The inventor has statistically found that when the radiation source and the ionization chamber are horizontally misaligned by 4 mm, the measurement accuracy of the surface density device is reduced by approximately 11%; when the radiation source and the ionization chamber are vertically misaligned by 4 mm, the measurement accuracy of the surface density device is reduced by approximately 5.5%; when the radiation source and the ionization chamber are torsionally rotated by 2° relative to each other, the measurement accuracy of the surface density device is reduced by approximately 5%.

[0087] Regarding the above technical problems, after research, the inventor believes that the surface density device can be periodically overhauled after it is no longer necessary to measure the object to be measured, so as to ensure the measurement accuracy of the surface density device. However, it is possible that the surface density device malfunctions during the two overhauls, resulting in incorrect measurement results for a large number of objects to be measured and causing serious economic losses.

[0088] Based on this, after careful research, the inventor determines whether the relative pose between the radiation source and the ionization chamber has changed by detecting the relative pose of the radiation source and the ionization chamber in real time during the operation of the surface density device, so as to timely take corresponding measures to improve the detection accuracy of the surface density device, and solve the technical problem that the relative position between the radiation source and the ionization chamber may change, resulting in inaccurate measurement results.

[0089] Please refer to Figure 1 and Figure 2 , Figure 1 which is a schematic flow diagram of the detection method of one embodiment of the present application. Figure 2 which is a three-dimensional schematic diagram of a surface density device 100 of one embodiment of the present application.

[0090] The detection method of the embodiment of the present application is used for a surface density device 100, and the surface density device 100 includes a radiation source 10 and an ionization chamber 20 spaced apart from the radiation source 10. The detection method includes:

[0091] S10, during the operation of the surface density device 100, obtain the first current pose of the radiation source 10 and the second current pose of the ionization chamber 20;

[0092] S20, confirm the first pose deviation of the radiation source 10 according to the first current pose;

[0093] S30. Confirm the second pose deviation of the ionization chamber 20 according to the second current pose.

[0094] S40. Determine whether the pose of the radiation source 10 relative to the ionization chamber 20 has changed according to the first pose deviation and the second pose deviation.

[0095] Specifically, the areal density device 100 is a device for detecting the thickness and / or density of a sheet-like object. The radiation source 10 is a component for emitting detection rays, and the detection rays are, for example, X-rays. The rays emitted by the radiation source 10 are directed towards the ionization chamber 20, or rather, the radiation source 10 emits rays towards the ionization chamber 20. The ionization chamber 20 is a component for receiving detection rays, and the ionization chamber 20 is also called a detector. As shown in the orientation, the ionization chamber 20 is arranged above the radiation source 10. There is a gap between the ionization chamber 20 and the radiation source 10, and the object to be detected is located in this gap. Figure 2 As shown in the orientation, the ionization chamber 20 is arranged above the radiation source 10. There is a gap between the ionization chamber 20 and the radiation source 10, and the object to be detected is located in this gap.

[0096] When the areal density device 100 is working, the radiation source 10 and the ionization chamber 20 can reciprocate synchronously along the X direction (the first direction), the object to be detected can move along the Y direction (the second direction), and the radiation source 10 emits detection rays towards the Z direction (the third direction), so that the detection rays pass through the object to be detected and then enter the ionization chamber 20 and are captured by the ionization chamber 20. The areal density device 100 can calculate the weight per unit area (i.e., the areal density) of the object to be detected according to the intensity of the detection rays captured by the ionization chamber 20.

[0097] In step S10, the working process of the areal density device 100 refers to the process in which the areal density device 100 is detecting parameters such as the areal density of the object to be detected. The pose of the radiation source 10 is the position and attitude of the radiation source 10. For example, parameters such as the distance of the radiation source 10 relative to the reference position and the rotation angle. The reference position mentioned here can be a position or multiple different positions. Similarly, the pose of the ionization chamber 20 is the position and attitude of the ionization chamber 20. The current pose is the pose detected in real time. For example, the pose detected by the radiation source 10 at the current moment is the current pose.

[0098] The first current pose and the second current pose can be measured by sensors such as distance sensors. For example, a distance sensor can be installed on the radiation source 10, and the distance between the distance sensor and the fixed position on the areal density device is measured according to the distance sensor to obtain the first current pose. Another example is that the first current pose and the second current pose can be measured by sensors such as gyroscopes. The present application does not limit the specific detection method of the first current pose and the second current pose.

[0099] In steps S20 and S30, the first pose deviation can be the deviation amount of the first current pose relative to the first initial pose. The second pose deviation can be the deviation amount of the second current pose relative to the second initial pose.

[0100] The first initial pose and the second initial pose are respectively the poses of the radiation source 10 and the ionization chamber 20 at a certain position in the movement stroke after the surface density device 100 is assembled and calibrated. The first initial pose can be measured by relevant devices and stored in the surface density device 100. For example, the first initial pose can be measured by a detection component such as a sensor.

[0101] It can be understood that if the value of the first current pose is equal to the value of the first initial pose, then the first pose deviation is 0. That is to say, the current pose of the radiation source 10 has not changed relative to the initial pose.

[0102] In step S40, if at least one of the first pose deviation and the second pose deviation is greater than the deviation threshold, and the first pose deviation and the second pose deviation cannot cancel each other out, it can be indicated that the pose of the radiation source 10 has changed relative to the ionization chamber 20. For example, if the radiation source 10 and the ionization chamber 20 change the same distance in the same direction, then it is considered that the first pose deviation and the second pose deviation can cancel each other out, and the poses of the radiation source 10 and the ionization chamber 20 have not changed.

[0103] As Figure 3 shown, Figure 3 is a schematic diagram of the radiation source 10 and the ionization chamber 20 in the normal position, Figure 3 indicating that the poses of the radiation source 10 and the ionization chamber 20 have not changed. Figures 4 - 6 respectively indicate that the poses of the radiation source 10 and the ionization chamber 20 have changed differently.

[0104] In this way, in the detection method of the embodiment of the present application, the current poses of the radiation source 10 and the ionization chamber 20 are respectively obtained first, and then it is confirmed whether the pose of the radiation source 10 has changed relative to the ionization chamber 20 according to the current poses, so that corresponding measures can be taken when the pose of the radiation source 10 has changed relative to the ionization chamber 20, so as to improve the accuracy of the measurement result of the surface density device 100.

[0105] In addition, during the operation of the surface density device 100, the poses of the radiation source 10 and the ionization chamber 20 are detected, so that the surface density device 100 does not need to stop, the detection process is more convenient, which is beneficial to correcting the measurement result of the surface density device 100 in real time, and making the detection efficiency of the surface density device 100 higher.

[0106] Please refer to Figure 7In some embodiments, obtaining a first current position of the radiation source 10 and a second current position of the ionization chamber 20 (S10) includes:

[0107] S110, obtaining the current positions of the radiation source 10 and the ionization chamber 20 in at least one direction to determine the first current posture and the second current posture;

[0108] Specifically, the current position of the radiation source 10 in a certain direction can be represented by the distance between the radiation source 10 and a predetermined position. For example, a three-dimensional coordinate system can be set on the areal density device 100, and the current position of the radiation source 10 can be determined based on the coordinates of the radiation source 10. Similarly, the current position of the ionization chamber 20 in a certain direction can be represented by the distance between the ionization chamber 20 and a predetermined position.

[0109] In this way, the first current pose and the second current pose are easier to determine.

[0110] See also Figure 8 In some embodiments, step S110 includes:

[0111] S11, obtain the radiation source 10 in the first direction (such as Figure 2 a first current position in the X direction in the image, wherein the first direction is the same as the direction of movement of the radiation source 10;

[0112] S12, acquiring a second current position of the ionization chamber 20 in the first direction, where the first current position includes the first current position, and the second current position includes the second current position;

[0113] Step S40 includes:

[0114] S41 , when the first posture deviation and the second posture deviation have different degrees of deviation, determining that the radiation source 10 has changed its posture relative to the ionization chamber 20 in the first direction.

[0115] Specifically, in step S11, the first current position can be represented by a distance, that is, the first current distance between the radiation source 10 and the first predetermined position 30 in the first direction can be obtained to determine the first current position. The radiation source 10 can move back and forth along the X direction. The first predetermined position 30 can be a position of the surface density device 100 facing the radiation source 10 along the X direction. For example, in an embodiment of the present application, the first predetermined position 30 is a plane located in the positive X direction of the radiation source 10. The first current distance can be detected by a first distance sensor 101. The first distance sensor 101 can be installed on the radiation source 10 or on the first predetermined position 30. The first distance sensor 101 is, for example, a laser sensor, and the first distance sensor 101 can detect and obtain the first current distance by emitting light and receiving reflected light.

[0116] In step S12, the second current position can be represented by a distance. That is to say, the second current distance between the ionization chamber 20 and the second predetermined position 40 in the first direction can be obtained to determine the second current position. The ionization chamber 20 reciprocates back and forth along the X direction. The second predetermined position 40 can be the position of the surface density device 100 along the X direction facing the ionization chamber 20. For example, in the embodiment of the present application, the second predetermined position 40 is a plane located in the positive X direction of the ionization chamber 20. The second current distance can be detected by the second distance sensor 102. The second distance sensor 102 can be installed on the ionization chamber 20 or on the second predetermined position 40. The second distance sensor 102 is, for example, a laser sensor, and the second distance sensor 102 can detect the second current distance by emitting light and receiving the reflected light.

[0117] In step S41, the difference between the first current distance and the first initial distance can be calculated and used as the first difference; and the difference between the second current distance and the second initial distance can be calculated and used as the second difference; when the difference between the first difference and the second difference is greater than the first predetermined difference, it is determined that the pose of the radiation source 10 relative to the ionization chamber 20 has changed.

[0118] Specifically, the first initial distance is the distance between the radiation source 10 and the first predetermined position 30 measured after the surface density device 100 is calibrated. According to the first difference, it can be determined whether the radiation source 10 has changed its position in the X direction. In an example, the first current distance is L AX1 ’, the first initial distance is L AX1 , the first difference is X A1 , then X A1 = L AX1 ’ - L AX1 .

[0119] The second initial distance is the distance between the ionization chamber 20 and the second predetermined position 40 measured after the surface density device 100 is calibrated. According to the second difference, it can be determined whether the ionization chamber 20 has changed its position in the X direction. In an example, the second current distance is L BX1 ’, the second initial distance is L BX1 , the second difference is X B1 , then X B1 = L BX1 ’ - L BX1 .

[0120] If the difference between the first difference and the second difference is large, it means that the radiation source 10 has changed its position in its own movement direction relative to the ionization chamber 20. In an example, the difference between the first difference and the second difference is ΔX, and ΔX = XA1 -X B1 If ΔX is greater than the first predetermined difference, it is determined that the pose of the radiation source 10 has changed relative to the ionization chamber 20.

[0121] In summary, through the first current position and the second current position, it can be detected whether the relative pose of the ionization chamber 20 and the radiation source 10 has changed in the first direction.

[0122] Please refer to Figure 9 , in some embodiments, step S110 includes:

[0123] S13, obtaining a third current position of the radiation source 10 in a second direction (such as Figure 2 the Y direction in

[0124] ), the second direction is perpendicular to the moving direction of the radiation source 10, and the second direction is perpendicular to the arrangement direction of the radiation source 10 and the ionization chamber 20;

[0125] Step S40 includes:

[0126] S42, when the deviation degrees of the first pose deviation and the second pose deviation are different, it is determined that the pose of the radiation source 10 has changed relative to the ionization chamber 20 in the second direction.

[0127] Specifically, in step S13, the third current position can be represented by a distance, that is, the third current distance between the radiation source 10 and the third predetermined position 50 in the second direction can be obtained to determine the third current position; the object to be measured can move along the Y direction. The third predetermined position 50 can be the position of the surface density device 100 facing the radiation source 10 along the Y direction. For example, in the embodiments of the present application, the third predetermined position 50 can be a plane perpendicular to the Y direction of the radiation source 10 and the negative Y direction passes through the third predetermined position 50. The third current distance can be detected by the third distance sensor 103. The third distance sensor 103 can be installed on the radiation source 10 or on the third predetermined position 50. In order to reduce the number of the third distance sensors 103, in the embodiments of the present application, the third distance sensor 103 is installed on the radiation source 10. The third distance sensor 103 is, for example, a laser sensor, and the third distance sensor 103 can detect the third current distance by emitting light and receiving the reflected light.

[0128] In step S14, the fourth current position can be represented by a distance, that is, the fourth current distance between the ionization chamber 20 and the fourth predetermined position 60 in the second direction can be obtained to determine the fourth current position.

[0129] The fourth predetermined position 60 may be the position of the areal density device 100 facing the radiation source 10 in the Y direction. For example, in the embodiments of the present application, the fourth predetermined position 60 is in a plane perpendicular to the Y direction of the ionization chamber 50 and the negative Y direction passes through the third predetermined position 50, and the third predetermined position 50 and the fourth predetermined position 60 may be in the same plane. The fourth current distance can be detected by the fourth distance sensor 104. The fourth distance sensor 104 may be installed on the ionization chamber 20 or on the fourth predetermined position 60. In order to reduce the number of the fourth distance sensors 104, in the embodiments of the present application, the fourth distance sensor is installed on the radiation source 10. The fourth distance sensor 104 is, for example, a laser sensor, and the fourth distance sensor 104 can detect the fourth current distance by emitting light and receiving the reflected light.

[0130] In step S42, the difference between the third current distance and the third initial distance can be calculated and used as the third difference; the difference between the fourth current distance and the fourth initial distance can be calculated and used as the fourth difference; when the difference between the third difference and the fourth difference is greater than the second predetermined difference, it is determined that the pose of the radiation source 10 relative to the ionization chamber 20 has changed.

[0131] Among them, the third initial distance is the distance between the radiation source 10 and the third predetermined position 50 measured after the areal density device 100 is calibrated. According to the third difference, it can be determined whether the radiation source 10 has changed its position in the Y direction. In one example, the third current distance is L AY ’, the third initial distance is L AY , the third difference is Y AY , then, Y AY = L AY ’ - Y AY .

[0132] The fourth initial distance is the distance between the ionization chamber 20 and the fourth predetermined position 60 measured after the areal density device 100 is calibrated. According to the fourth difference, it can be determined whether the ionization chamber 20 has changed its position in the Y direction. In one example, the fourth current distance is L BY ’, the fourth initial distance is L BY , the fourth difference is Y BY , then, Y BY = L BY ’ - Y BY .

[0133] If the difference between the third difference and the fourth difference is large, it indicates that the radiation source 10 has changed its position relative to the ionization chamber 20 in the moving direction of the object to be measured. In one example, the difference between the third difference and the second difference is ΔY, and ΔY = Y AY - YBY If ΔY is greater than the second predetermined difference, it is determined that the pose of the radiation source 10 has changed relative to the ionization chamber 20.

[0134] In this way, whether the poses of the ionization chamber 20 and the radiation source 10 have changed relatively in the moving direction of the object to be measured can be detected through the third current position and the fourth current position.

[0135] Please refer to Figure 10 , in some embodiments, step S110 includes:

[0136] S15, obtaining the fourth current position of the radiation source 10 in the third direction (such as Figure 2 the Z direction in

[0137] ), the third direction is the same as the arrangement direction of the radiation source 10 and the ionization chamber 20;

[0138] Step S40 includes:

[0139] S43, when the deviation degrees of the first pose deviation and the second pose deviation are different, it is determined that the pose of the radiation source 10 has changed relative to the ionization chamber 20 in the third direction.

[0140] In step S15, the fifth current position can be represented by a distance. That is to say, the fifth current distance between the radiation source 10 and the object to be measured can be obtained to determine the fifth current position; the object to be measured is located in the Z direction of the radiation source 10, and the fifth current distance can be detected by the fifth distance sensor 105. The fifth distance sensor 105 can be installed on the radiation source 10. The fifth distance sensor 105 is, for example, a laser sensor, and the fifth distance sensor 105 can detect the fifth current distance by emitting light and receiving the reflected light.

[0141] In step S16, the sixth current position can be represented by a distance. That is to say, the sixth current distance between the ionization chamber 20 and the object to be measured can be obtained to determine the sixth current position. The sixth current distance can be detected by the sixth distance sensor 106. The sixth distance sensor 106 can be installed on the ionization chamber 20. The sixth distance sensor 106 is, for example, a laser sensor, and the sixth distance sensor 106 can detect the sixth current distance by emitting light and receiving the reflected light.

[0142] In step S43, the difference between the fifth current distance and the fifth initial distance can be calculated as the fifth difference; and the difference between the sixth current distance and the sixth initial distance can be calculated as the sixth difference; when the sum between the fifth difference and the sixth difference is greater than a predetermined value, it is determined that the pose of the radiation source 10 relative to the ionization chamber 20 has changed.

[0143] The fifth initial distance is the distance between the radiation source 10 and the object to be measured obtained by measurement after the surface density device 100 is calibrated. According to the fifth difference, it can be determined whether the radiation source 10 has changed its position in the Z direction. In one example, the fifth current distance is L AZ ’, the fifth initial distance is L AZ , and the fifth difference is Z AZ . Then, Z AZ＝ L AZ ’ - Z AZ .

[0144] The sixth initial distance is the distance between the ionization chamber 20 and the object to be measured obtained by measurement after the surface density device 100 is calibrated. According to the sixth difference, it can be determined whether the ionization chamber 20 has changed its position in the Z direction. In one example, the sixth current distance is L BZ ’, the sixth initial distance is L BZ , and the sixth difference is Z BZ . Then, Z BZ＝ L BZ ’ - Z BZ .

[0145] If the difference between the fifth difference and the sixth difference is large, it indicates that the radiation source 10 has changed its position relative to the ionization chamber 20 in the movement direction of the object to be measured. In one example, the difference between the fifth difference and the second difference is ΔZ, and ΔZ = Z AZ - Z BZ . If ΔZ is greater than the second predetermined difference, it is determined that the pose of the radiation source 10 relative to the ionization chamber 20 has changed.

[0146] In this way, through the fifth current position and the sixth current position, it can be detected whether the ionization chamber 20 and the radiation source 10 have relatively changed their poses in the movement direction of the measured thickness.

[0147] It should be noted that since the thickness difference of the object to be measured is small, the measurement error caused by the thickness difference of the object to be measured can be ignored.

[0148] Please refer to Figure 11 , in some embodiments, step S11 includes:

[0149] S111, obtaining the first current positions of two different parts of the radiation source 10 in the first direction;

[0150] S112. Determine the first torsion amount of the radiation source 10 based on two first current positions. The first current pose includes the first torsion amount.

[0151] Step S12 includes:

[0152] S121. Obtain the second current positions of two different parts of the ionization chamber 20 in the first direction.

[0153] S122. Determine the second torsion amount of the ionization chamber 20 based on the two second current positions. The second current pose includes the second torsion amount.

[0154] Step S40 includes:

[0155] S44. When the deviation degrees of the first pose deviation and the second pose deviation are different, determine that the torsion pose of the radiation source 10 relative to the ionization chamber 20 has changed.

[0156] Specifically, in steps S111 and S112, the first current distance between the first radiation part of the radiation source 10 in its own movement direction and the first predetermined position 30 can be obtained as one of the first current positions. The seventh current distance between the second radiation part of the radiation source 10 in its own movement direction and the first predetermined position 30 can be obtained as the other first current position. The second radiation part and the first radiation part are located on the same side of the radiation source 10.

[0157] As discussed above, the first current distance can be detected by the first distance sensor 101. The first distance sensor 101 can be installed on the first radiation part of the radiation source 10 or on the first predetermined position 30. The first distance sensor 101 is, for example, a laser sensor. The first distance sensor 101 can detect the first current distance by emitting light and receiving the reflected light.

[0158] Similarly, as Figure 2 shown, the seventh current distance can be detected by the seventh distance sensor 107. The seventh distance sensor 107 can be installed on the second radiation part of the radiation source 10 or on the first predetermined position 30. The seventh distance sensor 107 is, for example, a laser sensor. The seventh distance sensor 107 can detect the seventh current distance by emitting light and receiving the reflected light.

[0159] In the embodiments of the present application, the first radiation part and the second radiation part are two different positions on the radiation source 10. The first radiation part and the second radiation part can be entities with specific features such as surfaces or structures.

[0160] The first rotation angle of the radiation source 10 can be calculated based on the first current distance, the seventh current distance, and the first predetermined distance, where the first predetermined distance is the distance between the center of the first radiation site and the center of the second radiation site;

[0161] The first predetermined distance is the distance between the radiation source 10 and the first predetermined position 30 measured after the surface density device 100 is calibrated. Please refer to Figure 12 , in one example, the first current distance is L AX1 ’, the seventh current distance is L AX2 ’, the first initial distance is L AX1 , the seventh initial distance is L AX2 , the first predetermined distance is A, and the first rotation angle is θ A , then,

[0162] θ A = arcsin([|(L AX1 ’ - L AX1 ) - (L AX2 ’ - L AX2 )|] / A).

[0163] In steps S121 and S122, the second current distance between the first ionization site of the ionization chamber 20 and the second predetermined position 40 in its own movement direction can be obtained as one of the second current positions; the eighth current distance between the second ionization site of the ionization chamber 20 and the second predetermined position 40 in its own movement direction can be obtained as the other second current position;

[0164] As discussed above, the second current distance can be detected by the second distance sensor 102. The second distance sensor 102 can be installed on the first ionization site of the ionization chamber 20 or on the second predetermined position 40. The second distance sensor 102 is, for example, a laser sensor, and the second distance sensor 102 can detect the second current distance by emitting light and receiving the reflected light.

[0165] Similarly, the eighth current distance can be detected by the eighth distance sensor 108. The eighth distance sensor 108 can be installed on the second ionization site of the ionization chamber 20 or on the second predetermined position 40. The eighth distance sensor 108 is, for example, a laser sensor, and the eighth distance sensor 108 can detect the eighth current distance by emitting light and receiving the reflected light.

[0166] In the embodiments of the present application, the first ionization site and the second ionization site are two different positions on the ionization chamber 20, and the first ionization site and the second ionization site can be entities with specific features such as surfaces or structures.

[0167] The second rotation angle of the radiation source 10 can be calculated based on the second current distance, the eighth current distance, and the second predetermined distance, where the second predetermined distance is the distance between the center of the first ionization site and the center of the second ionization site;

[0168] The second predetermined distance is the distance between the ionization chamber 20 and the second predetermined position 40 measured after the surface density device 100 is calibrated. In one example, the second current distance is L BX1 ’, the seventh current distance is L BX2 ’, the second initial distance is L BX1 , the seventh initial distance is L BX2 , the second predetermined distance is B, and the second rotation angle is θ B , then θ B = arcsin([|(L BX1 ’ - L BX1 ) - (L BX2 ’ - L BX2 )|] / B).

[0169] It should be noted that the first predetermined distance A can be equal to the second predetermined distance B.

[0170] In step S44, it can be determined that the pose of the radiation source 10 relative to the ionization chamber 20 has changed when the sum of the first rotation angle and the second rotation angle is greater than the rotation angle threshold.

[0171] If the sum of the first rotation angle and the second rotation angle is relatively large, it indicates that the position of the radiation source 10 relative to the ionization chamber 20 has changed in its own movement direction. In one example, the sum of the first rotation angle and the second rotation angle is θ, θ = θ A + θ B . If θ is greater than the rotation angle threshold, it is determined that the pose of the radiation source 10 relative to the ionization chamber 20 has changed.

[0172] In this way, through the first rotation angle and the second rotation angle, it can be determined whether the poses of the radiation source 10 and the ionization chamber 20 have changed in the torsion state.

[0173] In the embodiment of the present application, since the radiation source 10 and the ionization chamber 20 reciprocate during operation, in order to detect the relationship between the current pose and the initial pose of the radiation source 10 and the ionization chamber 20 in real time, it is necessary to measure the initial pose in advance. Therefore, after the surface density device 100 is calibrated, the initial poses are obtained at multiple positions respectively, so that multiple initial poses can be obtained, enabling the radiation source 10 and the ionization chamber 20 to detect and confirm whether the poses have changed when they are at any position during operation.

[0174] In some embodiments, obtaining a first current position of the radiation source 10 and a second current position of the ionization chamber 20 (S10) includes:

[0175] Obtaining a first current posture through a detection result of a distance sensor provided on the radiation source 10;

[0176] The second current posture is acquired through the detection result of the distance sensor provided on the ionization chamber 20 .

[0177] As discussed above, the first to eighth distance sensors can detect corresponding distances to obtain the current positions of the radiation source 10 and the ionization chamber 20. In this way, the current positions of the radiation source 10 and the ionization chamber 20 can be conveniently obtained based on the distance sensors.

[0178] See also Figure 13 In certain embodiments, the detection method further comprises:

[0179] S50 , when the position of the radiation source 10 relative to the ionization chamber 20 changes, the measurement result of the surface density device 100 is corrected according to the amount of position change.

[0180] In this way, the measurement results of the areal density device 100 are corrected according to the amount of position change, making the measurement results of the areal density device 100 more accurate. For example, when it is determined that the measurement result is too large due to the position change of the radiation source 10 relative to the ionization chamber 20, the measurement result can be corrected to reduce it to make the measurement result more accurate.

[0181] In addition, in some embodiments, when the position of the radiation source 10 changes relative to the ionization chamber 20, prompts and warnings can be issued to facilitate the evaluation, maintenance and inspection of the equipment status, etc., effectively avoiding the surface density equipment 100 from operating in the event of a fault, and avoiding safety hazards in large quantities of products.

[0182] The surface density device 100 of the embodiment of the present application includes a radiation source 10, an ionization chamber 20 spaced apart from the radiation source 10, a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the program, the steps of the method of any of the above embodiments are implemented.

[0183] For example, the processor may perform the following detection method steps:

[0184] S10, during the operation of the areal density device 100, obtaining a first current position of the radiation source 10 and a second current position of the ionization chamber 20;

[0185] S20, confirming a first posture deviation of the radiation source 10 according to the first current posture;

[0186] S30. Confirm the second pose deviation of the ionization chamber 20 according to the second current pose.

[0187] S40. Determine whether the pose of the radiation source 10 relative to the ionization chamber 20 has changed according to the first pose deviation and the second pose deviation.

[0188] In this way, first obtain the current poses of the radiation source 10 and the ionization chamber 20 respectively, and then confirm whether the pose of the radiation source 10 relative to the ionization chamber 20 has changed according to the current poses, so that corresponding measures can be taken when the pose of the radiation source 10 relative to the ionization chamber 20 changes, thereby improving the accuracy of the measurement results of the surface density device 100.

[0189] In some embodiments, distance sensors are provided on both the radiation source 10 and the ionization chamber 20, and the distance sensors are used to detect the distances between the radiation source 10 and the ionization chamber 20 and a predetermined position. In this way, the current poses of the radiation source 10 and the ionization chamber 20 can be conveniently obtained according to the distance sensors.

[0190] It should be noted that the explanatory description of the detection method in the above embodiments is applicable to the detection device of the present application. For other parts of the detection device in the embodiments of the present application that are not elaborated, please refer to the corresponding parts of the above test method and will not be repeated here.

[0191] Please refer to Figure 14 , the detection device 200 of the embodiment of the present application includes an acquisition module 210, a confirmation module 220, and a determination module 230. The acquisition module 210 is used to acquire the first current pose of the radiation source 10 of the surface density device 100 and the second current pose of the ionization chamber 20 of the surface density device 100 during the operation of the surface density device 100; the confirmation module 220 is used to calculate the first pose deviation between the first current pose and the first initial pose of the radiation source 10, and to calculate the second pose deviation between the second current pose and the second initial pose of the ionization chamber 20; the determination module 230 is used to determine whether the pose of the radiation source 10 relative to the ionization chamber 20 has changed according to the first pose deviation and the second pose deviation.

[0192] In this way, first obtain the current poses of the radiation source 10 and the ionization chamber 20 respectively, and then confirm whether the pose of the radiation source 10 relative to the ionization chamber 20 has changed according to the current poses, so that corresponding measures can be taken when the pose of the radiation source 10 relative to the ionization chamber 20 changes, thereby improving the accuracy of the measurement results of the surface density device 100.

[0193] It should be noted that the detection device 200 of the embodiment of the present application can implement the detection methods of any of the above embodiments, and each step of the detection methods of the above embodiments can be executed by the corresponding modules of the detection device 200, which will not be repeated here.

[0194] In addition, the explanations of the detection methods in the above embodiments are applicable to the detection device 200 of the present application. For other parts of the detection device 200 in the embodiments of the present application that are not elaborated, please refer to the corresponding parts of the above test methods and will not be repeated here.

[0195] A non-volatile computer-readable storage medium storing computer-executable instructions that, when executed by one or more processors, cause the processors to execute the detection method according to any one of the above embodiments.

[0196] In the description of this specification, the descriptions with reference to the terms "one embodiment", "certain embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples", etc. mean that the specific features, structures, materials, or characteristics described in connection with the embodiments or examples are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Moreover, the specific features, structures, materials, or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0197] Any process or method description, whether in a flowchart or described otherwise herein, can be understood to represent a module, segment, or portion of code including one or more executable instructions for implementing a specific logical function or process. The scope of the preferred embodiments of the present invention includes additional implementations where functions may be executed not in the order shown or discussed, including substantially concurrently or in reverse order depending on the functions involved, which should be understood by those skilled in the art to which the embodiments of the present invention pertain.

[0198] The logic and / or steps represented in the flowchart or otherwise described herein can, for example, be considered a definable sequence list of executable instructions for implementing logical functions, which can be embodied specifically in any computer-readable medium for use by an instruction execution system, apparatus, or device (such as a computer-based system, a system including a processing module, or other systems that can fetch and execute instructions from the instruction execution system, apparatus, or device), or used in conjunction with these instruction execution systems, apparatus, or devices. For the purposes of this specification, a "computer-readable medium" can be any device that can contain, store, communicate, propagate, or transport a program for use by or in conjunction with an instruction execution system, apparatus, or device. More specific examples (non-exhaustive list) of computer-readable media include the following: an electrical connection portion with one or more wirings (electronic device), a portable computer diskette (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). Additionally, the computer-readable medium can even be paper or other suitable media on which the program can be printed, because the program can be obtained electronically, for example, by optically scanning the paper or other media, followed by editing, interpretation, or otherwise processing as appropriate, and then stored in a computer memory.

[0199] It should be understood that various parts of the embodiments of the present invention can be implemented using hardware, software, firmware, or a combination thereof. In the above embodiments, multiple steps or methods can be implemented using software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented using hardware, as in another embodiment, any one or a combination of the following techniques well known in the art can be used: discrete logic circuits having logic gate circuits for implementing logical functions on data signals, application specific integrated circuits having appropriate combinational logic gate circuits, programmable gate arrays (PGAs), field programmable gate arrays (FPGAs), etc.

[0200] Those of ordinary skill in the art of this technology can understand that all or part of the steps carried by the methods of the above embodiments can be completed by instructing relevant hardware through a program, and the program can be stored in a computer-readable storage medium. When the program is executed, it includes one or a combination of the steps of the method embodiments.

[0201] In addition, each functional unit in various embodiments of the present invention may be integrated into a processing module, may exist separately as individual units physically, or two or more units may be integrated into one module. The above-mentioned integrated module may be implemented in the form of hardware or in the form of a software functional module. When the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it may also be stored in a computer-readable storage medium. The above-mentioned storage medium may be a read-only memory, a magnetic disk, an optical disk, or the like.

[0202] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, and are not intended to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements for some or all of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the various embodiments of the present application, and they should all be covered by the scope of the claims and the description of the present application. In particular, as long as there is no structural conflict, the various technical features mentioned in each embodiment can be combined in any way. The present application is not limited to the specific embodiments disclosed herein, but includes all technical solutions falling within the scope of the claims.

Claims

1. A detection method for a surface density device, characterized in that, The surface density device includes a radiation source and an ionization chamber arranged at an interval from the radiation source, and the detection method includes: During the operation of the surface density device, obtaining a first current pose of the radiation source and a second current pose of the ionization chamber; Confirming a first pose deviation of the radiation source according to the first current pose; confirming a second pose deviation of the ionization chamber according to the second current pose; Wherein, the first pose deviation is the deviation amount of the first current pose relative to the first initial pose, and the second pose deviation is the deviation amount of the second current pose relative to the second initial pose; Determining whether a pose change occurs to the radiation source relative to the ionization chamber according to the first pose deviation and the second pose deviation.

2. The detection method according to claim 1, characterized in that, The obtaining of the first current pose of the radiation source and the second current pose of the ionization chamber includes: Obtaining the current positions of the radiation source and the ionization chamber in at least one direction to determine the first current pose and the second current pose.

3. The detection method according to claim 2, wherein The obtaining of the current positions of the radiation source and the ionization chamber in at least one direction to determine the first current pose and the second current pose includes: Obtaining a first current position of the radiation source in a first direction, the first direction being the same as the movement direction of the radiation source; Obtaining a second current position of the ionization chamber in the first direction, the first current pose including the first current position, and the second current pose including the second current position; Determining whether a pose change occurs to the radiation source relative to the ionization chamber according to the first pose deviation and the second pose deviation includes: When the deviation degrees of the first pose deviation and the second pose deviation are different, determining that a pose change occurs to the radiation source relative to the ionization chamber in the first direction.

4. The detection method according to claim 3, wherein The obtaining of the first current position of the radiation source in the first direction includes: Obtaining first current positions of two different parts of the radiation source in the first direction; Determining a first torsion amount of the radiation source according to the two first current positions, the first current pose including the first torsion amount; The obtaining of the second current position of the ionization chamber in the first direction includes; Obtaining second current positions of two different parts of the ionization chamber in the first direction; Determining a second torsion amount of the ionization chamber according to the two second current positions, the second current pose including the second torsion amount; Determining whether a pose change occurs to the radiation source relative to the ionization chamber according to the first pose deviation and the second pose deviation includes: When the deviation degrees of the first pose deviation and the second pose deviation are different, determining that a torsional pose change occurs to the radiation source relative to the ionization chamber.

5. The detection method according to claim 2, characterized in that, The obtaining of the current positions of the radiation source and the ionization chamber in at least one direction to determine the first current pose and the second current pose includes: Obtaining a third current position of the radiation source in a second direction, the second direction being perpendicular to the movement direction of the radiation source and perpendicular to the arrangement direction of the radiation source and the ionization chamber; Obtain a fourth current position of the radiation source in a second direction, where the first current pose includes the third current position and the second current pose includes the fourth current position; Determine whether a pose change of the radiation source relative to the ionization chamber occurs according to the first pose deviation and the second pose deviation, including: When the degrees of deviation of the first pose deviation and the second pose deviation are different, determine that a pose change of the radiation source relative to the ionization chamber occurs in the second direction.

6. The detection method according to claim 2, wherein Obtain current positions of the radiation source and the ionization chamber in at least one direction to determine the first current pose and the second current pose, including: Obtain a fourth current position of the radiation source in a third direction, where the third direction is the same as the arrangement direction of the radiation source and the ionization chamber; Obtain a fifth current position of the radiation source in the third direction, where the first current pose includes the fourth current position and the second current pose includes the fifth current position; Determine whether a pose change of the radiation source relative to the ionization chamber occurs according to the first pose deviation and the second pose deviation, including: When the degrees of deviation of the first pose deviation and the second pose deviation are different, determine that a pose change of the radiation source relative to the ionization chamber occurs in the third direction.

7. The detection method according to claim 1, wherein The detection method further includes: When a pose change of the radiation source relative to the ionization chamber occurs, correct the measurement result of the surface density device according to the amount of pose change.

8. A surface density device, characterized in that, including: A radiation source; An ionization chamber arranged at an interval from the radiation source; A memory, a processor, and a computer program stored on the memory and executable on the processor, where when the processor executes the program, it implements the steps of the method according to any one of claims 1-7.

9. The areal density device according to claim 8, characterized in that, Distance sensors are arranged on both the radiation source and the ionization chamber, and the distance sensors are used to detect the distances between the radiation source and the ionization chamber and a predetermined position.

10. A detection device, characterized in that, including: An acquisition module, configured to acquire a first current pose of the radiation source of the surface density device and a second current pose of the ionization chamber of the surface density device during the operation of the surface density device; A confirmation module, configured to confirm a first pose deviation of the radiation source according to the first current pose and a second pose deviation of the ionization chamber according to the second current pose; where the first pose deviation is the deviation amount of the first current pose relative to the first initial pose, and the second pose deviation is the deviation amount of the second current pose relative to the second initial pose; A determination module, configured to determine whether a pose change of the radiation source relative to the ionization chamber occurs according to the first pose deviation and the second pose deviation.

11. A non-volatile computer-readable storage medium storing computer-executable instructions, characterized in that, When the computer-executable instructions are executed by one or more processors, the processor is caused to execute the steps of the detection method according to any one of claims 1-7.

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