Display temperature control strategy testing method, device, terminal equipment and storage medium

Abstract

The present invention discloses a display temperature control strategy testing method, apparatus, terminal device, and computer-readable storage medium. The method is applied to a temperature control strategy testing system, wherein the temperature control strategy testing system includes a resistor box and a display to be tested, wherein the display to be tested includes a thermistor. The method determines a preset resistance value of the resistor box as a simulated resistance value of the thermistor; determines a simulated temperature of the display to be tested based on the simulated resistance value; determines a target brightness duty cycle corresponding to the simulated temperature based on a pre-acquired temperature control strategy of the display to be tested; and compares a first actual brightness duty cycle of the display to be tested with the target brightness duty cycle to determine a test result corresponding to the temperature control strategy. The present invention achieves a method of shortening the verification time and accurately controlling the target verification temperature when verifying the temperature control strategy of the display by using a resistor box to simulate the change in the resistance value of the thermistor.

Description

Technical Field

[0001] The present invention belongs to the technical field of software testing, and in particular relates to a display temperature control strategy testing method, device, terminal equipment, and computer-readable storage medium. Background Art

[0002] With the rapid development of science and technology, liquid crystal displays are widely used in automotive instruments and multimedia entertainment systems. As an important interface for human-computer interaction, they are used to display graphic and text information.

[0003] Currently, since in-vehicle display products are often in mobile environments, when they are in harsh environments or undergoing ambient temperature cycle reliability testing, the internal temperature of the display may be too high, resulting in unrecoverable abnormal conditions such as black screen, dark spots, yellow spots, etc., which may lead to test failure or permanent damage to the display. Therefore, a temperature control strategy has been added to the display to regulate the display temperature. However, the existing verification method for this temperature control strategy is mainly to place an incubator inside the display to control the ambient temperature, or directly use a heat gun to heat the thermistor to change the thermistor resistance, determine the display temperature, and verify whether the temperature control strategy is effectively enabled.

[0004] In summary, existing verification methods for display temperature control strategies have the problem that the testing process takes a long time due to the limitations of the test environment, and it is difficult to accurately reach the required verification temperature. Summary of the Invention

[0005] The primary objective of this invention is to provide a display temperature control strategy testing method, apparatus, terminal device, and computer-readable storage medium. By utilizing a resistance box to simulate thermistor resistance changes, this method aims to shorten verification time and precisely control the target verification temperature when verifying a display's temperature control strategy.

[0006] To achieve the above object, the present invention provides a display temperature control strategy testing method, the display temperature control strategy testing method is applied to a temperature control strategy testing system, the temperature control strategy testing system includes a resistance box and a display to be tested, wherein the display to be tested includes a thermistor;

[0007] The display temperature control strategy testing method includes:

[0008] Determining the preset resistance value of the resistance box as the simulated resistance value of the thermistor;

[0009] determining a simulated temperature of the display to be tested based on the simulated resistance value;

[0010] Determining a target brightness duty cycle corresponding to the simulated temperature based on a pre-acquired temperature control strategy of the display to be tested;

[0011] The first actual brightness duty cycle of the display to be tested is compared with the target brightness duty cycle to determine a test result corresponding to the temperature control strategy.

[0012] Optionally, the step of determining the simulated temperature of the display to be tested based on the simulated resistance value includes:

[0013] Determining a target temperature corresponding to the simulated resistance value based on the simulated resistance value in a previously acquired resistance and temperature comparison table of the thermistor;

[0014] The target temperature is determined as the simulated temperature of the display to be tested.

[0015] Optionally, the step of determining the target brightness duty cycle corresponding to the simulated temperature based on the pre-acquired temperature control strategy of the display to be tested includes:

[0016] Calculating an analog voltage value of the thermistor based on the analog resistance value;

[0017] Based on the analog voltage value, determining a brightness duty cycle corresponding to the analog voltage value in a pre-acquired temperature control strategy of the display to be tested;

[0018] The brightness duty cycle corresponding to the analog voltage value is determined as the target brightness duty cycle corresponding to the analog temperature.

[0019] Optionally, the step of comparing the first actual brightness duty cycle of the display to be tested with the target brightness duty cycle to determine a test result corresponding to the temperature control strategy includes:

[0020] Detecting whether a first actual brightness duty cycle of the display to be tested is the target brightness duty cycle;

[0021] If so, determining that the test result corresponding to the temperature control strategy is that the temperature control strategy is enabled normally;

[0022] If not, it is determined that the test result corresponding to the temperature control strategy is an abnormal activation of the temperature control strategy.

[0023] Optionally, the temperature control strategy testing system further includes a logic analyzer, and the method further includes:

[0024] The first actual brightness duty cycle of the display to be tested is detected by the logic analyzer.

[0025] Optionally, after the step of determining that the test result corresponding to the temperature control policy is an abnormal activation of the temperature control policy, the method further includes:

[0026] An abnormal prompt indicating that the temperature control strategy is enabled abnormally is displayed on the display to be tested, so as to prompt the tester to modify the target program corresponding to the simulated temperature in the temperature control strategy.

[0027] Optionally, after the step of displaying an abnormal prompt indicating that the temperature control strategy is enabled abnormally on the display to be tested, so as to prompt the tester to modify the target program corresponding to the temperature in the temperature control strategy, the method further includes:

[0028] Writing a new temperature control strategy obtained by modifying the target program into the display to be tested;

[0029] The second actual brightness duty cycle of the display to be tested written with the new temperature control strategy is compared with the target brightness duty cycle to obtain a test result corresponding to the new temperature control strategy.

[0030] In addition, to achieve the above-mentioned object, the present invention further provides a display temperature control strategy test device, the display temperature control strategy test device is applied to a temperature control strategy test system, the temperature control strategy test system includes a resistance box and a display to be tested, wherein the display to be tested includes a thermistor;

[0031] The display temperature control strategy testing device includes:

[0032] a resistance box module, configured to determine a preset resistance value of the resistance box as a simulated resistance value of the thermistor;

[0033] a display temperature module, configured to determine a simulated temperature of the display to be tested based on the simulated resistance value;

[0034] a target brightness duty cycle module, configured to determine a target brightness duty cycle corresponding to the simulated temperature based on a pre-acquired temperature control strategy of the display to be tested;

[0035] The test result module is used to compare the first actual brightness duty cycle of the display to be tested with the target brightness duty cycle to determine the test result corresponding to the temperature control strategy.

[0036] In addition, to achieve the above-mentioned purpose, the present invention also provides a terminal device, which includes: a memory, a processor, and a display temperature control strategy test program stored on the memory and runnable on the processor. When the display temperature control strategy test program of the terminal device is executed by the processor, the steps of the display temperature control strategy test method described above are implemented.

[0037] In addition, to achieve the above-mentioned purpose, the present invention also provides a computer-readable storage medium, on which a display temperature control strategy test program is stored. When the display temperature control strategy test program is executed by a processor, the steps of the display temperature control strategy test method as described above are implemented.

[0038] An embodiment of the present invention proposes a display temperature control strategy testing method, apparatus, terminal device, and computer-readable storage medium. The method is applied to a temperature control strategy testing system, which includes a resistor box and a display to be tested, wherein the display to be tested includes a thermistor. The method determines a preset resistance value of the resistor box as a simulated resistance value of the thermistor; determines a simulated temperature of the display to be tested based on the simulated resistance value; determines a target brightness duty cycle corresponding to the simulated temperature based on a pre-acquired temperature control strategy of the display to be tested; and compares a first actual brightness duty cycle of the display to be tested with the target brightness duty cycle to determine a test result corresponding to the temperature control strategy.

[0039] In an embodiment of the present invention, a preset resistance value of a resistance box is used as the simulated resistance value of the thermistor of the display under test, and a simulated temperature of the display under test is determined based on the simulated resistance value. Then, based on a pre-acquired temperature control strategy of the display under test, a target brightness duty cycle corresponding to the simulated temperature of the display under test is determined. Finally, a first actual brightness duty cycle of the display under test is compared with the target brightness duty cycle, thereby determining a test result of the temperature control strategy of the display under test based on the comparison result. Thus, compared to the traditional method of changing the resistance value of the thermistor using a temperature box or a heat gun, the present invention achieves a shortened verification time and precise control of the target verification temperature when verifying the display's temperature control strategy by using a resistance box to simulate the change in the thermistor resistance value, compared to the traditional method of changing the resistance value of the thermistor using a temperature box or a heat gun. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] Figure 1 Schematic diagram of the device structure of the hardware operating environment of the terminal device involved in the embodiment of the present invention;

[0041] Figure 2 This is a schematic flow chart of the steps of the first embodiment of the display temperature control strategy testing method of the present invention;

[0042] Figure 3 Schematic diagram of the hardware connection structure involved in an embodiment of the display temperature control strategy testing method of the present invention;

[0043] Figure 4 Schematic diagram of a temperature control strategy test process involved in an embodiment of a display temperature control strategy test method of the present invention;

[0044] Figure 5A schematic diagram of recording the test report content involved in an embodiment of the display temperature control strategy testing method of the present invention;

[0045] Figure 6 Schematic diagram of the functional modules of an embodiment of a display temperature control strategy testing device according to the present invention.

[0046] The purpose, features and advantages of the present invention will be further described with reference to the accompanying drawings and in conjunction with the embodiments. DETAILED DESCRIPTION

[0047] It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0048] Reference Figure 1 , Figure 1 This is a schematic diagram of the device structure of the hardware operating environment of the terminal device involved in the embodiment of the present invention.

[0049] In embodiments of the present invention, a terminal device can be a terminal device used in the field of software testing technology, integrated with a temperature control strategy testing system. Furthermore, the temperature control strategy testing system includes a resistance box and a display under test, wherein the display under test includes a thermistor. Specifically, the terminal device can be a smartphone, a personal computer (PC), a tablet computer, a portable computer, or the like.

[0050] like Figure 1 As shown, the terminal device may include: a processor 1001, such as a CPU, a communication bus 1002, a user interface 1003, a network interface 1004, and a memory 1005. The communication bus 1002 is used to implement connection and communication between these components. The user interface 1003 may include a display screen (DiSpl ay) and an input unit such as a keyboard. Optionally, the user interface 1003 may also include a standard wired interface and a wireless interface. The network interface 1004 may optionally include a standard wired interface and a wireless interface (such as a Wi-Fi interface). The memory 1005 may be a high-speed RAM memory or a stable memory (non-volatile memory), such as a disk memory. The memory 1005 may also be a storage device independent of the aforementioned processor 1001.

[0051] Those skilled in the art will understand that Figure 1 The terminal device structure shown in the figure does not constitute a limitation on the terminal device, and may include more or fewer components than shown in the figure, or combine certain components, or arrange the components differently.

[0052] like Figure 1As shown, the memory 1005 as a computer storage medium may include an operating system, a network communication module, a user interface module, and a display temperature control strategy test program.

[0053] exist Figure 1 In the terminal shown, the network interface 1004 is mainly used to connect to the backend server and communicate data with the backend server; the user interface 1003 is mainly used to connect to the client and communicate data with the client; and the processor 1001 can be used to call the display temperature control strategy test program stored in the memory 1005 and perform the following operations:

[0054] Determining the preset resistance value of the resistance box as the simulated resistance value of the thermistor;

[0055] determining a simulated temperature of the display to be tested based on the simulated resistance value;

[0056] Determining a target brightness duty cycle corresponding to the simulated temperature based on a pre-acquired temperature control strategy of the display to be tested;

[0057] The first actual brightness duty cycle of the display to be tested is compared with the target brightness duty cycle to determine a test result corresponding to the temperature control strategy.

[0058] Optionally, the processor 1001 may also be configured to call a display temperature control strategy test program stored in the memory 1005 and perform the following operations:

[0059] Determining a target temperature corresponding to the simulated resistance value based on the simulated resistance value in a previously acquired resistance and temperature comparison table of the thermistor;

[0060] The target temperature is determined as the simulated temperature of the display to be tested.

[0061] Optionally, the processor 1001 may also be configured to call a display temperature control strategy test program stored in the memory 1005 and perform the following operations:

[0062] Calculating an analog voltage value of the thermistor based on the analog resistance value;

[0063] Based on the analog voltage value, determining a brightness duty cycle corresponding to the analog voltage value in a pre-acquired temperature control strategy of the display to be tested;

[0064] The brightness duty cycle corresponding to the analog voltage value is determined as the target brightness duty cycle corresponding to the analog temperature.

[0065] Optionally, the processor 1001 may also be configured to call a display temperature control strategy test program stored in the memory 1005 and perform the following operations:

[0066] Detecting whether a first actual brightness duty cycle of the display to be tested is the target brightness duty cycle;

[0067] If so, determining that the test result corresponding to the temperature control strategy is that the temperature control strategy is enabled normally;

[0068] If not, it is determined that the test result corresponding to the temperature control strategy is an abnormal activation of the temperature control strategy.

[0069] Optionally, the temperature control strategy test system further includes a logic analyzer, and the processor 1001 may be further configured to call a display temperature control strategy test program stored in the memory 1005 and perform the following operations:

[0070] The first actual brightness duty cycle of the display to be tested is detected by the logic analyzer.

[0071] Optionally, the processor 1001 may also be configured to call a display temperature control strategy test program stored in the memory 1005, and after determining that the test result corresponding to the temperature control strategy is an abnormal activation of the temperature control strategy, further perform the following operations:

[0072] An abnormal prompt indicating abnormal activation of the temperature control strategy is displayed on the display to be tested, and the abnormal prompt is used to prompt the tester to modify the target program corresponding to the simulated temperature in the temperature control strategy.

[0073] Optionally, the processor 1001 may also be configured to call a display temperature control strategy test program stored in the memory 1005, and after the step of displaying an abnormal prompt indicating that the temperature control strategy is enabled abnormally on the display to be tested, further perform the following operations:

[0074] Writing a new temperature control strategy obtained by modifying the target program into the display to be tested;

[0075] The second actual brightness duty cycle of the display to be tested written with the new temperature control strategy is compared with the target brightness duty cycle to obtain a test result corresponding to the new temperature control strategy.

[0076] Based on the above-mentioned terminal device, various embodiments of the display temperature control strategy testing method of the present invention are proposed.

[0077] Currently, since in-vehicle display products are often in mobile environments, when they are in harsh environments or undergoing ambient temperature cycle reliability testing, the internal temperature of the display may be too high, resulting in unrecoverable abnormal conditions such as black screen, dark spots, yellow spots, etc., which may lead to test failure or permanent damage to the display. Therefore, a temperature control strategy has been added to the display to regulate the display temperature. However, the existing verification method for this temperature control strategy is mainly to place an incubator inside the display to control the ambient temperature, or directly use a heat gun to heat the thermistor to change the thermistor resistance, determine the display temperature, and verify whether the temperature control strategy is effectively enabled.

[0078] In response to the above phenomenon, the present invention proposes a display temperature control strategy testing method. The display temperature control strategy testing method of the present invention is applied to a temperature control strategy testing system, which includes a resistance box and a display to be tested, wherein the display to be tested includes a thermistor.

[0079] The display temperature control strategy testing method of the present invention determines the preset resistance value of a resistance box as the simulated resistance value of the thermistor of the display under test, determines the simulated temperature of the display under test based on the simulated resistance value, then determines the target brightness duty cycle corresponding to the simulated temperature of the display under test based on the previously acquired temperature control strategy of the display under test. Finally, the first actual brightness duty cycle of the display under test is compared with the target brightness duty cycle, thereby determining the test result of the temperature control strategy of the display under test based on the comparison result. Thus, compared to the traditional method of changing the thermistor resistance value using a temperature box or a heat gun, the present invention achieves a shorter verification time and more precise control of the target verification temperature when verifying the display's temperature control strategy by using a resistance box to simulate the change in the thermistor resistance value.

[0080] Please refer to Figure 2 , Figure 2 This is a flow chart of a first embodiment of a display temperature control strategy testing method according to the present invention. It should be noted that although a logical sequence is shown in the flow chart, in some cases, the display temperature control strategy testing method according to the present invention may execute the steps in a different order than shown or described herein.

[0081] In a first embodiment of a display temperature control strategy testing method of the present invention, the display temperature control strategy testing method of the present invention includes:

[0082] Step S10: determining the preset resistance value of the resistance box as the simulated resistance value of the thermistor;

[0083] In this embodiment, the temperature control strategy testing system determines the preset resistance value set by the resistance box as the simulated resistance value of the thermistor in the display to be tested.

[0084] For example, Figure 3 As shown in the figure, LCD (Liquid Crystal Display) represents the vehicle-mounted LCD display to be tested, PCBA represents the PCB circuit board. Before the temperature control strategy test begins, the NTC (Negative Temperature Coefficient, a thermistor phenomenon and material with a negative temperature coefficient whose resistance decreases exponentially with increasing temperature) thermistor of the display to be tested is disconnected from the series 0-ohm resistor. The resistance pole of the resistance box is directly connected to the pin at one end of the 0-ohm resistor, and the negative pole of the resistance box is connected to GND.

[0085] For example, the tester manually adjusts the resistance of the resistance box and sets the resistance of the resistance box to a preset resistance value of 1.87 kilo-ohms. It should be noted that, since the thermistor of the display to be tested has been replaced by the resistance box in the hardware connection, the preset resistance value of the resistance box can be used as the simulated resistance value of the thermistor at this time.

[0086] Step S20, determining a simulated temperature of the display to be tested based on the simulated resistance value;

[0087] In this embodiment, the temperature control strategy testing system determines the simulated temperature of the display to be tested based on the simulated resistance value of the thermistor.

[0088] Exemplarily, the temperature control strategy testing system determines the temperature of the display to be tested corresponding to the resistance value of 1.87 kilo-ohms set by the resistance box.

[0089] Furthermore, in a feasible embodiment, the above step S20 may include:

[0090] Step S201, determining a target temperature corresponding to the simulated resistance value based on the simulated resistance value in a previously acquired table of resistance values and temperatures of the thermistor;

[0091] Step S202: determining the target temperature as the simulated temperature of the display to be tested.

[0092] In this embodiment, the temperature control strategy test system pre-acquires a resistance value and temperature comparison table of the thermistor of the display to be tested, and then finds a target temperature corresponding to the simulated resistance value in the simulated resistance value and temperature comparison table based on the simulated resistance value of the thermistor of the display to be tested, and then determines the target temperature as the simulated temperature of the display to be tested.

[0093] For example, the temperature control strategy test system determines that the temperature corresponding to the resistance of the thermistor of the display under test is 1.87 kilo-ohms and 77 degrees Celsius from the resistance and temperature comparison table obtained in advance. Therefore, the temperature of the display under test is determined to be 77 degrees Celsius.

[0094] Step S30, determining a target brightness duty cycle corresponding to the simulated temperature based on a pre-acquired temperature control strategy of the display to be tested;

[0095] In this embodiment, the temperature control strategy testing system pre-acquires the temperature control strategy of the display to be tested, and determines the target brightness duty cycle corresponding to the simulated temperature of the display to be tested according to the temperature control strategy.

[0096] Exemplarily, the temperature control strategy of the display to be tested includes a backlight NTC heating strategy and a backlight NTC temperature return strategy, wherein the backlight NTC heating strategy is that when the temperature of the display corresponding to the resistance value of the NTC thermistor is 75 degrees Celsius, for every 2 degrees Celsius increase in the display temperature, the backlight PWM (Pulse Width Modulation) signal duty cycle, that is, the brightness duty cycle of the display, decreases by 15% until the display temperature reaches 86 degrees Celsius; the backlight NTC temperature return strategy is that when the temperature of the display corresponding to the resistance value of the NTC thermistor is higher than 86 degrees Celsius, the module backlight maintains a brightness duty cycle of 10%, and when the display temperature drops from 86 degrees Celsius to a low temperature, the backlight PWM signal duty cycle remains at 10%, until the display temperature drops to 73 degrees Celsius, the backlight PWM signal directly rises to 100%.

[0097] Furthermore, in a feasible embodiment, the above step S30 may include:

[0098] Step S301, calculating the analog voltage value of the thermistor based on the analog resistance value;

[0099] In this embodiment, the temperature control strategy testing system calculates the analog voltage value of the thermistor based on the analog resistance value of the thermistor of the display to be tested.

[0100] For example, the calculation formula of the voltage value U of the NTC thermistor is:

[0101]

[0102] It should be noted that the power supply voltage in the present invention is 3.3V. It should be understood that based on the different design requirements of actual applications, in different feasible implementation methods, the power supply voltage can be any voltage value that meets actual needs. The present invention does not limit the voltage value of the power supply voltage.

[0103] Step S302, based on the analog voltage value, determining a brightness duty cycle corresponding to the analog voltage value in a pre-acquired temperature control strategy of the display to be tested;

[0104] In this embodiment, the temperature control strategy testing system determines the display brightness duty cycle corresponding to the analog voltage value of the thermistor in the pre-acquired temperature control strategy of the display to be tested.

[0105] For example, the voltage value of the NTC thermistor is 2V, and according to the voltage value, the desired brightness duty cycle corresponding to the voltage value is determined to be 85% in the temperature control strategy.

[0106] Step S303 : determining the brightness duty cycle corresponding to the analog voltage value as the target brightness duty cycle corresponding to the analog temperature.

[0107] In this embodiment, the temperature control strategy testing system determines the brightness duty cycle corresponding to the analog voltage value of the thermistor as the target brightness duty cycle corresponding to the temperature of the display to be tested.

[0108] Exemplarily, the temperature control strategy testing system determines the expected brightness duty cycle of 85% corresponding to the voltage value of 2V of the NTC thermistor as the brightness duty cycle of the display when the display temperature is 77 degrees Celsius and the temperature control strategy is normally enabled.

[0109] It should be noted that the working principle of the temperature control strategy is to directly monitor the voltage value of the NTC thermistor and change the display brightness duty cycle according to the voltage value. The voltage value is calculated based on the resistance value of the NTC thermistor, and the resistance value and temperature in the NTC thermistor temperature comparison table correspond one to one. Therefore, the effect of the temperature control strategy is to adjust the display brightness according to the display temperature.

[0110] Step S40 : comparing the first actual brightness duty cycle of the display to be tested with the target brightness duty cycle to determine a test result corresponding to the temperature control strategy.

[0111] In this embodiment, the temperature control strategy testing system compares the first actual brightness duty cycle of the display to be tested with the target brightness duty cycle, thereby determining a test result of the temperature control measurement of the display to be tested.

[0112] Exemplarily, the temperature control strategy test system detects the actual brightness duty cycle of the display to be tested, compares the actual brightness duty cycle with the expected brightness duty cycle determined according to the temperature control strategy, and determines the test result of the temperature control strategy according to the comparison result.

[0113] In this embodiment, the display temperature control strategy testing method of the present invention determines, by the temperature control strategy testing system, a preset resistance value set in a resistor box as a simulated resistance value of a thermistor in the display under test. The temperature control strategy testing system pre-acquires a table comparing the simulated resistance value and temperature of the thermistor in the display under test, then finds a target temperature corresponding to the simulated resistance value in the table based on the simulated resistance value of the thermistor in the display under test, and then determines the target temperature as the simulated temperature of the display under test. The temperature control strategy testing system calculates a simulated voltage value of the thermistor based on the simulated resistance value of the thermistor in the display under test, and determines, based on the simulated voltage value of the thermistor, a brightness duty cycle of the display corresponding to the simulated voltage value in a pre-acquired temperature control strategy of the display under test, and then determines the brightness duty cycle corresponding to the voltage value of the thermistor as the target brightness duty cycle corresponding to the temperature of the display under test. The temperature control strategy testing system compares a first actual brightness duty cycle of the display under test with the target brightness duty cycle to thereby determine a test result of a temperature control measurement of the display under test.

[0114] Thus, an embodiment of the present invention determines the preset resistance value of the resistance box as the simulated resistance value of the thermistor of the display under test, determines the simulated temperature of the display under test based on the simulated resistance value, and then determines the target brightness duty cycle corresponding to the simulated temperature of the display under test based on the pre-acquired temperature control strategy of the display under test. Finally, the first actual brightness duty cycle of the display under test is compared with the target brightness duty cycle, thereby determining the test result of the temperature control strategy of the display under test based on the comparison result. Thus, compared to the traditional method of changing the resistance value of the thermistor using a temperature box or a heat gun, the present invention shortens the verification time and accurately controls the target verification temperature when verifying the temperature control strategy of the display by using a resistance box to simulate the change of the thermistor resistance value.

[0115] Furthermore, based on the first embodiment of the display temperature control strategy testing method of the present invention, a second embodiment of the display temperature control strategy testing method of the present invention is proposed.

[0116] In this embodiment, the display temperature control strategy testing method of the present invention, the above step S40 may include:

[0117] Step S401, detecting whether a first actual brightness duty cycle of the display to be tested is the target brightness duty cycle;

[0118] Step S402: If yes, determine that the test result corresponding to the temperature control strategy is that the temperature control strategy is enabled normally;

[0119] Step S403: If not, determine that the test result corresponding to the temperature control strategy is abnormal in enabling the temperature control strategy.

[0120] In this embodiment, the temperature control strategy testing system detects whether the first actual brightness duty cycle of the display to be tested is the target brightness duty cycle. If the brightness duty cycle of the display to be tested is the target brightness duty cycle, the test result of the temperature control strategy is determined to be that the temperature control strategy is enabled normally; if the brightness duty cycle of the display to be tested is not the target brightness duty cycle, the test result of the temperature control strategy is determined to be that the temperature control strategy is enabled abnormally.

[0121] For example, the temperature control strategy test system detects whether the actual brightness duty cycle of the display under test is 85% of the target brightness duty cycle. When the actual brightness duty cycle of the display under test is the target brightness duty cycle, it means that the temperature control strategy of the display under test has automatically adjusted the temperature of the display, that is, changed the screen brightness duty cycle of the display, and then determines

[0122] It should be noted that in the actual test process, it is necessary to simulate multiple resistance values of thermistors through a resistance box and verify them one by one. Finally, after the test sample capacity meets the actual needs, the test report of the temperature control strategy of the display to be tested is determined, such as Figure 5 As shown, the test report is the data manually recorded by the tester, in which the inspection content is the temperature control strategy rules; the preset conditions include ambient temperature and NTC corresponding temperature. The ambient temperature is the normal temperature of the test bench, but the change of ambient temperature is simulated by changing the resistance value of the resistance box. The NTC corresponding temperature is the temperature corresponding to the resistance value in the operation step column obtained according to the resistance and temperature comparison table of the NTC thermistor; the operation step is to adjust the resistance value of the resistance box; the ADC voltage monitoring value is the voltage value of the NTC thermistor; the expected value of the PWM duty cycle is the expected brightness duty cycle of the display screen determined according to the temperature control strategy; the measured value of the PWM duty cycle is the actual brightness duty cycle of the display screen; each verification generates a judgment result.

[0123] Furthermore, the temperature control strategy testing system further includes a logic analyzer. In a feasible embodiment, the above step S401 may include:

[0124] Step A: detecting a first actual brightness duty cycle of the display to be tested by using the logic analyzer.

[0125] In this embodiment, the temperature control strategy testing system detects the first actual brightness duty cycle of the display screen to be tested through a logic analyzer.

[0126] For example, before the test begins, the PWM interface of the display to be tested is connected to an external lead, and the lead is used to connect to a logic analyzer for directly detecting the screen brightness duty cycle of the display to be tested.

[0127] In this embodiment, the display temperature control strategy testing method of the present invention detects the first actual brightness duty cycle of the display screen to be tested through a logic analyzer by a temperature control strategy testing system; the temperature control strategy testing system detects whether the first actual brightness duty cycle of the display to be tested is the target brightness duty cycle. If the first actual brightness duty cycle of the display to be tested is the target brightness duty cycle, the test result of the temperature control strategy is determined to be normal activation of the temperature control strategy; if the first actual brightness duty cycle of the display to be tested is not the target brightness duty cycle, the test result of the temperature control strategy is determined to be abnormal activation of the temperature control strategy.

[0128] In this way, by using the PWM external logic analyzer of the display to be tested, the screen brightness duty cycle of the display to be tested can be directly detected, and the actual detected brightness duty cycle is compared with the expected brightness duty cycle in the temperature control strategy, and whether the temperature control device is normally enabled is determined based on the comparison result.

[0129] Furthermore, based on the first embodiment and / or the second embodiment of the display temperature control strategy testing method of the present invention, a third embodiment of the display temperature control strategy testing method of the present invention is proposed.

[0130] In this embodiment, the display temperature control strategy testing method of the present invention may further include, after step S403, the following steps:

[0131] Step B: displaying an abnormal prompt indicating that the temperature control strategy is activated abnormally on the display to be tested, wherein the abnormal prompt is used to prompt the tester to modify the target program corresponding to the simulated temperature in the temperature control strategy.

[0132] In this embodiment, when the temperature control strategy testing system determines that the temperature control strategy of the display under test is abnormally enabled, it displays an abnormal prompt of the temperature control strategy being abnormally enabled on the display under test, thereby prompting the tester to modify the target program corresponding to the resistance box simulated temperature in the temperature control strategy.

[0133] For example, when the temperature control strategy is activated abnormally, the temperature control strategy testing system displays an abnormal prompt on the display to be tested, thereby prompting the tester to modify the software program portion corresponding to the simulated temperature of the current test.

[0134] Furthermore, in a feasible embodiment, after the above step B, the display temperature control strategy testing method of the present invention may further include:

[0135] Step C, writing a new temperature control strategy obtained by modifying the target program into the display to be tested;

[0136] Step D: comparing the second actual brightness duty cycle of the display to be tested written with the new temperature control strategy with the target brightness duty cycle to obtain a test result corresponding to the new temperature control strategy.

[0137] In this embodiment, the temperature control strategy testing system writes the new temperature control strategy obtained after modifying the target program into the display to be tested, then detects the second actual brightness duty cycle of the display to be tested, and compares the new brightness duty cycle with the target brightness duty cycle to determine the test result of the new temperature control strategy.

[0138] Exemplarily, the temperature control strategy testing system writes the modified new temperature control strategy into the display to be tested. After writing, the new temperature control strategy adjusts the display temperature based on the resistance value of the NTC thermistor simulated by the resistance box, and then detects the display screen brightness duty cycle, that is, the new brightness duty cycle, through a logic analyzer connected to the PWM of the display to be tested. If the new brightness duty cycle is the target brightness duty cycle, the test result of the new temperature control strategy is determined to be enabled normally. If the new brightness duty cycle is not the target brightness duty cycle, the test result of the new temperature control strategy is determined to be enabled abnormally. A prompt of the enabled abnormality is displayed on the display to prompt the tester to modify the software program of the temperature control strategy again until the temperature control strategy can be enabled normally.

[0139] For example, Figure 4 As shown, the test process for a display temperature control strategy involves first writing the temperature control strategy software into the display under test and obtaining a table comparing the resistance value of the NTC thermistor to the temperature. The execution process involves connecting the resistance box to the logic analyzer, then powering on the device under test. The resistance of the resistance box is set according to the resistance value corresponding to the target temperature of the temperature control device to simulate the resistance change of the NTC thermistor. The test then determines whether the brightness duty cycle of the display meets the requirements of the temperature control strategy. If so, a test report is issued. If not, the program software corresponding to the temperature control strategy is modified until the temperature control strategy can be properly and effectively activated.

[0140] In this embodiment, the display temperature control strategy testing method of the present invention displays an abnormal prompt of the activation of the temperature control strategy abnormality on the display to be tested when the temperature control strategy testing system determines that the temperature control strategy of the display to be tested is abnormally activated, thereby prompting the tester to modify the target program corresponding to the resistance box simulated temperature in the temperature control strategy; the temperature control strategy testing system writes the new temperature control strategy obtained after modifying the target program into the display to be tested, and then detects the new brightness duty cycle of the display to be tested, and compares the new brightness duty cycle with the target brightness duty cycle, thereby determining the test result of the new temperature control strategy.

[0141] In this way, the verification result of each time the resistance box is used to simulate the thermistor resistance value is determined, and when the verification result is abnormal, an abnormal prompt is displayed on the display, so that the tester or developer can directly determine the program scope of the error in the temperature control strategy, which is convenient for subsequent modification of the program software.

[0142] In addition, an embodiment of the present invention also provides a display temperature control strategy testing device.

[0143] Please refer to Figure 6 , Figure 6 This is a functional module diagram of an embodiment of a display temperature control strategy testing device according to the present invention. Figure 6 As shown, the display temperature control strategy testing device of the present invention includes:

[0144] The resistance box module 10 is used to determine the preset resistance value of the resistance box as the simulated resistance value of the thermistor;

[0145] a display temperature module 20, configured to determine a simulated temperature of the display to be tested based on the simulated resistance value;

[0146] A target brightness duty cycle module 30 is configured to determine a target brightness duty cycle corresponding to the simulated temperature based on a pre-acquired temperature control strategy of the display to be tested;

[0147] The test result module 40 is configured to compare the first actual brightness duty cycle of the display to be tested with the target brightness duty cycle to determine a test result corresponding to the temperature control strategy.

[0148] Optionally, the display temperature module 20 includes:

[0149] a target temperature unit, configured to determine a target temperature corresponding to the analog resistance value in a pre-acquired analog resistance value and temperature comparison table of the thermistor based on the analog resistance value;

[0150] A display temperature unit is used to determine the target temperature as the simulated temperature of the display to be tested.

[0151] Optionally, the target brightness duty cycle module 30 includes:

[0152] a voltage value unit, configured to calculate an analog voltage value of the thermistor based on the analog resistance value;

[0153] a brightness duty cycle unit, configured to determine, based on the analog voltage value, a brightness duty cycle corresponding to the analog voltage value in a pre-acquired temperature control strategy of the display to be tested;

[0154] The target brightness duty cycle unit is configured to determine the brightness duty cycle corresponding to the analog voltage value as the target brightness duty cycle corresponding to the analog temperature.

[0155] Optionally, the test result module 40 includes:

[0156] a judgment unit, configured to detect whether a first actual brightness duty cycle of the display to be tested is the target brightness duty cycle;

[0157] an enabling normal unit, configured to determine, if yes, that the test result corresponding to the temperature control strategy is that the temperature control strategy is enabled normally;

[0158] The activation exception unit is used to determine, if not, that the test result corresponding to the temperature control strategy is a temperature control strategy activation exception.

[0159] Optionally, the temperature control strategy testing system further includes a logic analyzer, and the display temperature control strategy testing device of the present invention further includes:

[0160] The brightness duty cycle detection module is used to detect a first actual brightness duty cycle of the display to be tested through the logic analyzer.

[0161] Optionally, the display temperature control strategy testing device of the present invention further includes:

[0162] The abnormal prompt module is used to display an abnormal prompt of the activation of the temperature control strategy through the display to be tested, and the abnormal prompt is used to prompt the tester to modify the target program corresponding to the simulated temperature in the temperature control strategy.

[0163] Optionally, the display temperature control strategy testing device of the present invention further includes:

[0164] a rewriting module, configured to write a new temperature control strategy obtained by modifying the target program into the display to be tested;

[0165] The re-comparison module is used to compare the second actual brightness duty cycle of the display to be tested written with the new temperature control strategy with the target brightness duty cycle to obtain a test result corresponding to the new temperature control strategy.

[0166] The present invention also provides a computer storage medium storing a display temperature control strategy test program. When the display temperature control strategy test program is executed by a processor, the steps of the display temperature control strategy test program method described in any of the above embodiments are implemented.

[0167] The specific embodiments of the computer storage medium of the present invention are basically the same as the above-mentioned embodiments of the display temperature control strategy testing program method of the present invention, and will not be described in detail here.

[0168] The present invention also provides a computer program product, which includes a computer program. When the computer program is executed by a processor, it implements the steps of the display temperature control strategy testing method of the present invention as described in any of the above embodiments, which will not be repeated here.

[0169] It should be noted that, in this document, the terms "comprises," "includes," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, article, or system comprising a series of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or system. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or system comprising the element.

[0170] The serial numbers of the above embodiments of the present invention are for description only and do not represent the advantages or disadvantages of the embodiments.

[0171] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus the necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) as described above, and includes several instructions for enabling a terminal device (which can be a TWS headset, etc.) to execute the methods described in each embodiment of the present invention.

[0172] The above are only preferred embodiments of the present invention and are not intended to limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made using the contents of the present invention description and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A display temperature control strategy testing method, characterized in that: The display temperature control strategy testing method is applied to a temperature control strategy testing system, the temperature control strategy testing system comprising a resistance box and a display to be tested, wherein the display to be tested comprises a thermistor; The display temperature control strategy testing method includes: Determining the preset resistance value of the resistance box as the simulated resistance value of the thermistor; determining a simulated temperature of the display to be tested based on the simulated resistance value; Calculating an analog voltage value of the thermistor based on the analog resistance value; Based on the analog voltage value, determining a brightness duty cycle corresponding to the analog voltage value in a pre-acquired temperature control strategy of the display to be tested, wherein the temperature control strategy is used to change the brightness duty cycle of the display to be tested based on the voltage value of the thermistor, and the temperature control strategy includes a backlight heating strategy and a backlight temperature recovery strategy, the backlight heating strategy is to gradually reduce the brightness duty cycle of the display to be tested when the simulated temperature is within a first preset temperature range and the simulated temperature gradually increases, and the backlight temperature recovery strategy is to use a first preset brightness duty cycle as the brightness duty cycle of the display to be tested when the simulated temperature is within a second preset temperature range or when the simulated temperature is within the first preset temperature range and the simulated temperature gradually decreases, and the upper limit value of the first preset temperature range is equal to the lower limit value of the second preset temperature range; Determining the brightness duty cycle corresponding to the analog voltage value as the target brightness duty cycle corresponding to the analog temperature; Detecting whether a first actual brightness duty cycle of the display to be tested is the target brightness duty cycle; If so, determining that the test result corresponding to the temperature control strategy is that the temperature control strategy is enabled normally; If not, it is determined that the test result corresponding to the temperature control strategy is an abnormal activation of the temperature control strategy.

2. The display temperature control strategy testing method according to claim 1, wherein: The step of determining the simulated temperature of the display to be tested based on the simulated resistance value includes: Determining a target temperature corresponding to the simulated resistance value based on the simulated resistance value in a previously acquired resistance and temperature comparison table of the thermistor; The target temperature is determined as the simulated temperature of the display to be tested.

3. The display temperature control strategy testing method according to any one of claims 1 to 2, characterized in that: The temperature control strategy testing system further includes a logic analyzer, and the method further includes: The first actual brightness duty cycle of the display to be tested is detected by the logic analyzer.

4. The display temperature control strategy testing method according to claim 1, wherein: After the step of determining that the test result corresponding to the temperature control policy is an abnormal activation of the temperature control policy, the method further includes: An abnormal prompt indicating abnormal activation of the temperature control strategy is displayed on the display to be tested, and the abnormal prompt is used to prompt the tester to modify the target program corresponding to the simulated temperature in the temperature control strategy.

5. The display temperature control strategy testing method according to claim 4, wherein: After the step of displaying, on the display to be tested, an abnormal prompt indicating that the temperature control strategy is abnormally enabled, the method further includes: Writing a new temperature control strategy obtained by modifying the target program into the display to be tested; The second actual brightness duty cycle of the display to be tested written with the new temperature control strategy is compared with the target brightness duty cycle to obtain a test result corresponding to the new temperature control strategy.

6. A display temperature control strategy testing device, characterized in that: The display temperature control strategy test device is applied to a temperature control strategy test system, wherein the temperature control strategy test system includes a resistance box and a display to be tested, wherein the display to be tested includes a thermistor; The display temperature control strategy testing device includes: a resistance box module, configured to determine a preset resistance value of the resistance box as a simulated resistance value of the thermistor; a display temperature module, configured to determine a simulated temperature of the display to be tested based on the simulated resistance value; a target brightness duty cycle module, configured to calculate the analog voltage value of the thermistor based on the analog resistance value; determine, based on the analog voltage value, the brightness duty cycle corresponding to the analog voltage value in a pre-acquired temperature control strategy of the display to be tested, wherein the temperature control strategy is configured to change the brightness duty cycle of the display to be tested based on the voltage value of the thermistor; determine the brightness duty cycle corresponding to the analog voltage value as the target brightness duty cycle corresponding to the simulated temperature, wherein the temperature control strategy includes a backlight heating strategy and a backlight temperature recovery strategy, wherein the backlight heating strategy is configured to gradually reduce the brightness duty cycle of the display to be tested when the simulated temperature is within a first preset temperature range and the simulated temperature gradually increases, and the backlight temperature recovery strategy is configured to use a first preset brightness duty cycle as the brightness duty cycle of the display to be tested when the simulated temperature is within a second preset temperature range or when the simulated temperature is within the first preset temperature range and the simulated temperature gradually decreases, wherein the upper limit value of the first preset temperature range is equal to the lower limit value of the second preset temperature range; A test result module is used to detect whether the first actual brightness duty cycle of the display to be tested is the target brightness duty cycle; if so, determine that the test result corresponding to the temperature control strategy is that the temperature control strategy is enabled normally; if not, determine that the test result corresponding to the temperature control strategy is that the temperature control strategy is enabled abnormally.

7. A terminal device, characterized in that: The terminal device includes: a memory, a processor, and a display temperature control strategy test program stored in the memory and executable on the processor. When the display temperature control strategy test program is executed by the processor, the steps of the display temperature control strategy test method according to any one of claims 1 to 5 are implemented.

8. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a display temperature control strategy test program, which, when executed by a processor, implements the steps of the display temperature control strategy test method according to any one of claims 1 to 5.

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