A multi-channel ceramic capacitor withstand voltage testing device and method

Abstract

This invention relates to the field of ceramic capacitors, and in particular to a multi-channel ceramic capacitor withstand voltage testing device and method. The device includes a base, a test holder, multiple movable test probes, a moving mechanism, and multiple fixed test probes. The base is a hollow structure with an internal mounting space. The test holder is mounted on a top plate of the base and has multiple test slots. The movable test probes are movable towards the test holder and mounted on the top plate of the base. The moving mechanism is located within the mounting space of the base and is connected to and drives the movable test probes. The fixed test probes are fixedly mounted on the top plate of the base, with the movable and fixed test probes respectively positioned on opposite sides of the test holder. This invention, through the cooperation of the test holder, movable test probes, and fixed test probes, allows for simultaneous withstand voltage testing of multiple ceramic capacitors, improving testing efficiency.

Description

Technical Field

[0001] This invention relates to the field of ceramic capacitors, and in particular to a multi-channel ceramic capacitor withstand voltage testing device and withstand voltage testing method. Background Technology

[0002] The withstand voltage of a ceramic capacitor is a very important electrical performance indicator. Therefore, during the production of ceramic capacitors, each capacitor needs to undergo a withstand voltage test, which is the process of applying a high voltage to the capacitor without damaging the properties of the insulating material.

[0003] In traditional technology, a single ceramic capacitor is usually placed into a single channel for testing using tweezers. Only one ceramic capacitor is tested at a time. After the test is completed, the tested ceramic capacitor is removed and replaced with a new one to be tested. The process is cumbersome and inefficient because it only tests one ceramic capacitor at a time, which cannot meet the current production requirements.

[0004] To overcome the shortcomings of traditional technologies, existing technologies often use multi-channel fixtures for withstand voltage testing. For example, the patent "Capacitor Inter-electrode Withstand Voltage Test Clamping Device" published by CN204287251U uses a workbench with multiple test positions to simultaneously perform withstand voltage tests on multiple ceramic capacitors, thereby improving testing efficiency. However, when placing the ceramic capacitors before the withstand voltage test, manual operation of the fixture is required to clamp the ceramic capacitors. After the test, the ceramic capacitors that have completed the test also need to be manually removed, which is cumbersome and inefficient. Summary of the Invention

[0005] The main objective of this invention is to overcome the shortcomings of the prior art and provide a multi-channel ceramic capacitor withstand voltage testing device and method that can simultaneously perform withstand voltage tests on multiple ceramic capacitors and automatically remove the ceramic capacitors after the test, thereby improving testing efficiency.

[0006] The present invention adopts the following technical solution:

[0007] A multi-channel ceramic capacitor withstand voltage testing device includes a base, a test holder, multiple movable test probes, a moving mechanism, multiple fixed test probes, a qualified material box, and a discharge mechanism. The base is a hollow structure with an internal mounting space. The test holder is slidably mounted on the top plate of the base between a test position and a discharge position. The discharge mechanism passes through the top plate of the base and drives the test holder to slide. Multiple test slots are spaced along the length of the test holder. The multiple movable test probes are movable towards the test holder and are mounted on the top plate of the base, with the multiple movable test probes arranged in parallel and spaced apart. The moving mechanism is located within the mounting space of the base and passes through the top plate of the base and is connected to... The moving test probe is driven to move, and multiple fixed test probes are fixedly mounted on the top plate of the base and arranged in parallel at intervals. The moving test probe and the fixed test probe are respectively set on both sides of the test base. The needle tips of the moving test probe and the fixed test probe face the test slots on the test base. The moving test probe and the fixed test probe correspond one-to-one with the test slots. The qualified material box is detachably set in the mounting space of the base and is located below the test position of the test base. The top plate of the base has a discharge port. When the test base is in the discharge position, the ceramic capacitor on the test slot is pushed by the fixed test probe from the test position to fall into the qualified material box through the discharge port.

[0008] Furthermore, the base includes a bottom plate, a side plate, and a top plate. The side plate is disposed on the bottom plate, and the top plate is disposed on the side plate. The bottom plate, side plate, and top plate form a base, creating an installation space within the base. A movable slot is provided on the top plate, and the movable mechanism passes through the movable slot to connect to and drive the movable test probe to move along the movable slot.

[0009] Furthermore, a sliding groove is formed in the middle of the base plate, and a sliding opening is formed in the side plate relative to the sliding groove. The qualified material box is detachably mounted on the sliding groove through the sliding opening.

[0010] Furthermore, the discharge mechanism connects to and drives the test seat to slide. The discharge mechanism includes a discharge slide, a discharge slider, and a discharge pad. The discharge slider is slidably disposed on the discharge slide, and the discharge pad is disposed on the discharge slider. A discharge opening is provided on the top plate of the base. The discharge pad passes through the discharge opening and connects to and drives the test seat to slide along the discharge opening.

[0011] Furthermore, a baffle plate is provided on the side of the test base near the moving test needle. The baffle plate is fixedly mounted on the base. Multiple probe holes are opened on the baffle plate. The probe holes pass through the baffle plate from left to right and are arranged in parallel at intervals. One end of the probe hole is directly opposite the tip of the moving test needle, and the other end is directly opposite the test slot.

[0012] Furthermore, the moving mechanism includes a moving slide, a moving slider, a moving test block, and a test pad. The moving slider is slidably mounted on the moving slide, and the test pad is fixedly mounted on the moving slider. The test pad passes through the top plate of the base and connects to the moving test pin. The moving test block has multiple parallel and spaced mounting pin holes, which pass through the moving test block from left to right. The moving test pins are mounted on the mounting pin holes, and each moving test pin corresponds to one mounting pin hole.

[0013] Furthermore, it also includes a fixed test block, which is fixedly mounted on the top plate of the base. The fixed test block has multiple parallel and spaced fixed pin holes, which pass through the fixed test block from left to right. The fixed test pins are set in the fixed pin holes and correspond one-to-one with the fixed pin holes.

[0014] Furthermore, it also includes an anti-electric shock cover plate, which is disposed on the top plate and covers the movable test needle and the fixed test needle. The anti-electric shock cover plate has a discharge port, and the test seat is disposed below the discharge port.

[0015] Furthermore, it also includes a test box, and the anti-electric cover is provided with a placement groove. The test box is placed on the placement groove for placing the ceramic capacitor to be tested.

[0016] A method for testing the withstand voltage of a multi-channel ceramic capacitor includes the following steps:

[0017] Step 1: Place multiple ceramic capacitors sequentially into the test slots on the test stand, and start the device. At this time, the test stand is in the test position, and the fixed test probe contacts one electrode of the ceramic capacitor.

[0018] Step 2: The moving mechanism drives the moving test probe to move towards one side of the ceramic capacitor. The moving test probe presses against the other electrode of the ceramic capacitor, clamping the ceramic capacitor between the moving test probe and the fixed test probe, and performing a withstand voltage test on the ceramic capacitor.

[0019] Step 3: After the test is completed, the moving mechanism drives the test probe away from the ceramic capacitor;

[0020] Step 4: The discharge mechanism drives the test seat to move from the test position to the discharge position, that is, the test seat moves towards the side of the fixed test needle. The fixed test needle pushes the ceramic capacitor from the discharge port into the qualified material box.

[0021] Step 5: The moving mechanism drives the test stand to reset from the discharge position to the test position. Repeat steps 1 to 4 to continue testing the ceramic capacitor to be tested.

[0022] As can be seen from the above description of the present invention, compared with the prior art, the beneficial effects of the present invention are:

[0023] First, ceramic capacitors are placed in multiple test slots on the test stand, and the withstand voltage test is performed on the ceramic capacitors in the test slots simultaneously by fixing the test probe and moving the test probe. Multiple ceramic capacitors can be tested for withstand voltage at the same time, which improves the testing efficiency and meets the production requirements.

[0024] Secondly, the qualified material box is used to place the tested ceramic capacitors. Through the cooperation of the slidable test base and the fixed test probe, after the test is completed, the test base slides towards the fixed test probe, so that the ceramic capacitor on the test base is pushed into the qualified material box by the fixed test probe. The tested ceramic capacitor is automatically removed without manual removal, which improves the efficiency of picking and placing and thus improves the testing efficiency.

[0025] Third, the qualified material box can be slidably removed from the sliding port of the side plate through the sliding groove and sliding port. When the qualified material box is full, it can be removed and replaced with a new qualified material box. The disassembly and assembly are simple and the operation is convenient.

[0026] Fourth, the sliding of the test probe is limited by a baffle plate on one side of the moving test probe, ensuring that the test seat will not deviate from its original position when it is reset. At the same time, the probe hole on the baffle plate can guide the moving test probe, so that the moving test probe can accurately contact the ceramic capacitor on the test slot, ensuring the accuracy of the test.

[0027] Fifth, the safety of the test is improved by using an anti-electric shock cover, and the cover is equipped with a test box to temporarily store the ceramic capacitors to be tested, making it more convenient and faster for operators to place the ceramic capacitors, and further improving the testing efficiency. Attached Figure Description

[0028] Figure 1 This is a schematic diagram of the overall structure of a specific embodiment of the present invention;

[0029] Figure 2 This is an exploded view of the overall structure of a specific embodiment of the present invention;

[0030] Figure 3 This is a cross-sectional view of the overall structure of a specific embodiment of the present invention, showing the state of the test seat when it is in the test position for a pressure test;

[0031] Figure 4 This is a cross-sectional view of the overall structure of a specific embodiment of the present invention, showing the state of the test seat when discharging material at the discharge position;

[0032] Figure 5 This is a schematic diagram of the test stand according to a specific embodiment of the present invention.

[0033] In the diagram: 1. Base, 10. Top plate, 100. Moving slot, 101. Discharge port, 102. Discharge slide, 11. Bottom plate, 110. Sliding groove, 12. Side plate, 120. Sliding port, 2. Test seat, 20. Test groove, 21. Baffle plate, 210. Probe hole, 3. Moving test probe, 4. Moving mechanism, 40. Moving slide, 41. Moving slider, 42. Moving test block, 43. Test pad, 5. Fixed test probe, 6. Qualified material box, 7. Discharge mechanism, 70. Discharge slide, 71. Discharge slider, 72. Discharge pad, 8. Anti-electric cover, 80. Discharge port, 81. Placement groove, 82. Material box to be tested, 9. Fixed test block. Detailed Implementation

[0034] The present invention will be further described below through specific embodiments.

[0035] Reference Figures 1 to 5 This invention discloses a multi-channel ceramic capacitor withstand voltage testing device, comprising a base 1, a test seat 2, multiple movable test probes 3, a moving mechanism 4, multiple fixed test probes 5, a qualified material box 6, a material discharge mechanism 7, an anti-electric shock cover 8, and a fixed test block 9. The base 1 is a hollow structure with an internal installation space. The test seat 2 is slidably mounted on the top plate 10 of the base 1 at test and discharge positions. Multiple test slots 20 are spaced apart along the length of the test seat 2. The multiple movable test probes 3 are movable toward the test seat 2 and mounted on the top plate 10 of the base 1. Multiple movable test pins 3 are arranged in parallel at intervals on the base 1. A moving mechanism 4 is set in the mounting space of the base 1 and passes through the top plate 10 of the base 1, connecting to and driving the movable test pins 3 to move. Multiple fixed test pins 5 are fixedly set on the top plate 10 of the base 1 and are arranged in parallel at intervals. The movable test pins 3 and the fixed test pins 5 are respectively set on both sides of the test base 2. The needle tips of the movable test pins 3 and the fixed test pins 5 face the test slots 20 on the test base 2, and the movable test pins 3 and the fixed test pins 5 correspond one-to-one with the test slots 20. A discharge mechanism 7 is connected to and drives the test base 2 to slide.

[0036] The base 1 includes a top plate 10, a bottom plate 11, and a side plate 12. The side plate 12 is detachably mounted on the bottom plate 11, and the top plate 10 is detachably mounted on the side plate 12. The bottom plate 11, the side plate 12, and the top plate 10 form a mounting space within the base 1. The top plate 10 has a movable slot 100, a discharge port 101, and a discharge slide 102. The movable slot 100 and the discharge slide 102 are located on both sides of the discharge port 101. The movable mechanism 4 passes through the movable slot 100 and connects to and drives the movable test needle 3 to move along the movable slot 100.

[0037] A sliding groove 110 is provided in the middle of the base plate 11, and a sliding opening 120 is provided in the side plate 12 relative to the sliding groove 110. The qualified material box 6 is detachably mounted on the sliding groove 110 through the sliding opening 120 and is located below the test position of the test seat 2. When the test seat 2 is in the discharge position, the ceramic capacitor on the test groove 20 is pushed by the fixed test needle 5 from the test position and falls into the qualified material box 6 through the discharge opening 101. When the test seat 2 is in the test position, the fixed test needle 5 contacts one electrode of the ceramic capacitor in the test groove 20.

[0038] The discharge mechanism 7 includes a discharge slide 70, a discharge slider 71, and a discharge pad 72. The discharge slide 70 has a rotatably mounted screw. The discharge slider 71 has a screw hole. The discharge slider 71 is slidably mounted on the discharge slide 70 through the screw hole and the screw thread engagement. The discharge pad 72 is mounted on the discharge slider 71. The discharge pad 72 passes through the discharge port 102 and connects to and drives the test seat 2 to slide along the discharge port 102.

[0039] A baffle plate 21 is provided on the side of the test base 2 near the movable test probe 3. The baffle plate 21 is fixedly mounted on the top plate 10 of the base 1. The baffle plate 21 has multiple probe holes 210, which extend through the baffle plate 21 from left to right and are arranged in parallel at intervals. One end of each probe hole 210 faces the tip of the movable test probe 3, and the other end faces the test slot 20. The test slot 20 on the test base 2 is a V-shaped slot structure with two relatively inclined slot walls, which facilitates the placement of the ceramic capacitor to be tested. At the same time, during discharge, the ceramic capacitor can slide more smoothly from the test slot 20.

[0040] The moving mechanism 4 includes a moving slide 40, a moving slider 41, a moving test block 42, and a test pad 43. The moving slide 40 has a rotatable screw, and the moving slider 41 has a screw hole. The moving slider 41 is slidably mounted on the moving slide 40 through the screw hole and the screw thread engagement. The test pad 43 is fixedly mounted on the moving slider 41 and passes through the moving slot 100 to connect to the moving test block 42. The moving test block 42 has multiple parallel and spaced mounting pin holes, which pass through the moving test block 42 from left to right. The moving test pins 3 are mounted on the mounting pin holes, and each moving test pin 3 corresponds to one mounting pin hole.

[0041] The fixed test block 9 is fixedly mounted on the top plate 10 of the base 1. The fixed test block 9 has a plurality of parallel and spaced fixed pin holes. The fixed pin holes pass through the fixed test block 9 from left to right. The fixed test pins 5 are set in the fixed pin holes and correspond one-to-one with the fixed pin holes.

[0042] The anti-electric shock cover 8 is mounted on the top plate 10 and covers the movable test probe 3 and the fixed test probe 5. The anti-electric shock cover 8 has a discharge port 80, and the test seat 2 is located below the discharge port 80. The anti-electric shock cover 8 has a placement groove 81, on which a test box 82 is placed. The test box 82 is used to place the ceramic capacitor to be tested. The placement groove 81 positions the test box 82, facilitating its installation and placement.

[0043] Continue to refer to Figures 1 to 5 A method for testing the withstand voltage of multi-channel ceramic capacitors:

[0044] Step 1: The operator uses tweezers to place the ceramic capacitor to be tested from the test box 82 into the test slot 20 on the test stand 2, and starts the device. At this time, the test stand 2 is in the test position, and the fixed test pin 5 presses against the electrode on the other side of the ceramic capacitor on the test slot 20.

[0045] Step 2: The movable slide 40 drives the screw on the movable slide 40 to rotate. The screw drives the movable slider 41 to slide through the threaded engagement. The movable slider 41 drives the test pad 43, which is fixed on the movable slider 41, to move towards the test seat 2. All the movable test pins 3 are connected through the test pads 43. When the test pads 43 move, they can simultaneously drive all the movable test pins 3 to move. The top plate 10 has a movable slot 100 to ensure the normal movement of the movable test pins 3. The movable test pin 3 passes through the probe hole 210 on the baffle plate 21 and abuts against one electrode of the ceramic capacitor on the test slot 20. After the movable test pin 3 and the fixed test pin 5 clamp the ceramic capacitor, the system sends the test model to the withstand voltage tester to perform a withstand voltage test on the ceramic capacitor on the test slot 20.

[0046] Step 3: After the test is passed, the moving slide 40 drives the moving test probe 3 away from the ceramic capacitor on the test slot 20.

[0047] Step 4: The discharge slide 70 drives the discharge slider 71 to slide through the threaded engagement of the screw and the screw hole. The discharge slider 71 drives the discharge pad 72 and the test seat 2, which are fixed on the discharge slider 71, to slide towards the discharge position, that is, the test seat 2 slides towards the side of the fixed test needle 5. The top plate 10 has a discharge port 102 to ensure the normal movement of the test seat 2. Because the fixed test needle 5 does not move, during the sliding of the test seat 2, the ceramic capacitors that have been tested in the test slot 20 are pushed by the fixed test needle 5 and fall into the qualified material box 6 through the discharge port 101 on the top plate 10.

[0048] Step 5: After all the tested ceramic capacitors have fallen into the qualified material box 6, the discharge slide 70 drives the test seat 2 to slide towards the test position, that is, the test seat 2 slides towards the moving test probe 3. The baffle plate 21 positions the test seat 2, allowing it to accurately reset. After the test seat 2 resets, the operator uses tweezers to transfer the ceramic capacitors to be tested from the test box 82 to the test slot 20 on the test seat 2 for the next round of testing. This process is repeated. If the qualified material box 6 is full of tested ceramic capacitors, the full qualified material box 6 can be removed through the sliding port 120 and replaced with an empty qualified material box 6 to continue storing tested ceramic capacitors.

[0049] The above is only one specific embodiment of the present invention, but the design concept of the present invention is not limited thereto. Any non-substantial modifications made to the present invention using this concept shall be considered as infringing the protection scope of the present invention.

Claims

1. A multi-channel ceramic capacitor withstand voltage testing device, characterized in that: The device includes a base, a test seat, multiple movable test probes, a moving mechanism, multiple fixed test probes, a qualified material box, and a discharge mechanism. The base is a hollow structure with an internal installation space. The test seat is mounted on the top plate of the base and can slide between a test position and a discharge position. The discharge mechanism passes through the top plate of the base, connects to and drives the test seat to slide. Multiple test slots are arranged at intervals along the length of the test seat. Multiple movable test probes are mounted on the top plate of the base and can move towards the test seat. The multiple movable test probes are arranged in parallel and spaced apart. A moving mechanism is located in the mounting space of the base and passes through the top plate of the base to connect with and drive the movable test probes. Multiple fixed test probes are fixedly mounted on the top plate of the base and are arranged in parallel and spaced apart. The movable test probes and the fixed test probes are respectively located on both sides of the test seat. The tips of the movable test probes and the fixed test probes face the test slots on the test seat. The movable test probes and the fixed test probes correspond one-to-one with the test slots. The qualified material box is detachably mounted in the mounting space of the base and is located below the test position of the test seat. A discharge port is opened on the top plate of the base. When the test seat is in the discharge position, the ceramic capacitors on the test slots are pushed by the fixed test probes from the test position and fall into the qualified material box through the discharge port.

2. The multi-channel ceramic capacitor withstand voltage testing device according to claim 1, characterized in that: The base includes a bottom plate, a side plate, and a top plate. The side plate is disposed on the bottom plate, and the top plate is disposed on the side plate. The bottom plate, side plate, and top plate form a base, creating an installation space inside the base. A movable slot is provided on the top plate. The movable mechanism passes through the movable slot and connects to and drives the movable test probe to move along the movable slot.

3. The multi-channel ceramic capacitor withstand voltage testing device according to claim 2, characterized in that: The base plate has a sliding groove in the middle, and the side plate has a sliding opening at a position relative to the sliding groove. The qualified material box is detachably mounted on the sliding groove through the sliding opening.

4. The multi-channel ceramic capacitor withstand voltage testing device according to claim 1, characterized in that: The discharge mechanism connects to and drives the test seat to slide. The discharge mechanism includes a discharge slide, a discharge slider, and a discharge pad. The discharge slider is slidably mounted on the discharge slide, and the discharge pad is mounted on the discharge slider. A discharge opening is provided on the top plate of the base. The discharge pad passes through the discharge opening and connects to and drives the test seat to slide along the discharge opening.

5. The multi-channel ceramic capacitor withstand voltage testing device according to claim 1, characterized in that: A baffle plate is provided on the side of the test base near the moving test needle. The baffle plate is fixedly mounted on the base. Multiple probe holes are opened on the baffle plate. The probe holes pass through the baffle plate from left to right and are arranged in parallel at intervals. One end of the probe hole is directly opposite the tip of the moving test needle, and the other end is directly opposite the test slot.

6. The multi-channel ceramic capacitor withstand voltage testing device according to claim 1, characterized in that: The moving mechanism includes a moving slide, a moving slider, a moving test block, and a test pad. The moving slider is slidably mounted on the moving slide, and the test pad is fixedly mounted on the moving slider. The test pad passes through the top plate of the base and connects to the moving test pin. The moving test block has multiple parallel and spaced mounting pin holes, which pass through the moving test block from left to right. The moving test pins are mounted on the mounting pin holes, and each moving test pin corresponds to one mounting pin hole.

7. The multi-channel ceramic capacitor withstand voltage testing device according to claim 1, characterized in that: It also includes a fixed test block, which is fixedly mounted on the top plate of the base. The fixed test block has multiple parallel and spaced fixed pin holes, which pass through the fixed test block from left to right. The fixed test pins are set in the fixed pin holes and correspond one-to-one with the fixed pin holes.

8. The multi-channel ceramic capacitor withstand voltage testing device according to claim 1, characterized in that: It also includes an anti-electric shock cover plate, which is installed on the top plate and covers the movable test needle and the fixed test needle. The anti-electric shock cover plate has a discharge port, and the test seat is located below the discharge port.

9. The multi-channel ceramic capacitor withstand voltage testing device according to claim 8, characterized in that: It also includes a test box, and the anti-electric cover is provided with a placement groove. The test box is placed on the placement groove for placing the ceramic capacitor to be tested.

10. A method for testing the withstand voltage of a multi-channel ceramic capacitor, characterized in that: The test is performed using the withstand voltage testing apparatus according to any one of claims 1 to 8, comprising the following steps: Step 1: Place multiple ceramic capacitors sequentially into the test slots on the test stand, and start the device. At this time, the test stand is in the test position, and the fixed test probe contacts one electrode of the ceramic capacitor. Step 2: The moving mechanism drives the moving test probe to move towards one side of the ceramic capacitor. The moving test probe presses against the other electrode of the ceramic capacitor, clamping the ceramic capacitor between the moving test probe and the fixed test probe, and performing a withstand voltage test on the ceramic capacitor. Step 3: After the test is completed, the moving mechanism drives the test probe away from the ceramic capacitor; Step 4: The discharge mechanism drives the test seat to move from the test position to the discharge position, that is, the test seat moves towards the side of the fixed test needle. The fixed test needle pushes the ceramic capacitor from the discharge port into the qualified material box. Step 5: The moving mechanism drives the test stand to reset from the discharge position to the test position. Repeat steps 1 to 4 to continue testing the ceramic capacitor to be tested.

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