X-ray inspection device and X-ray inspection system

Abstract

The present application discloses an X-ray inspection device, which includes an X-ray tube, a detector disposed facing the X-ray tube, and a conveyor configured to simultaneously inspect at least two objects to be inspected and convey the at least two objects to be inspected to an inspection position between the X-ray tube and the detector.

Description

Technical Field

[0001] The present disclosure relates to an X-ray inspection apparatus and an X-ray inspection system, and more particularly, to an X-ray inspection apparatus capable of effectively inspecting a plurality of objects to be inspected by rotating the objects to be inspected in different directions and using one X-ray tube, and an X-ray inspection system including the X-ray inspection apparatus. Background Art

[0002] X-rays have the characteristic of forming a unique diffraction pattern for each crystal. Because the wavelength of X-rays is as small as the size of an atom, the high energy of X-rays has a strong fluorescent effect on the material, easily penetrating the material and ionizing it. When X-rays are transmitted, the transmittance changes depending on the density or atomic structure of the material, and therefore the energy of the collision with the phosphor is different.

[0003] X-ray inspection devices using this principle can be divided into medical X-ray inspection devices that image the interior of living bodies and industrial X-ray inspection devices used for non-destructive inspection in general industry.

[0004] In particular, when manufacturing objects to be inspected, such as secondary batteries, in the industrial field, X-ray inspection devices are primarily used to inspect the objects for defects. In such cases, to apply X-ray inspection devices to secondary battery production lines, the inspection speed of the X-ray inspection devices must be equal to or higher than the production speed of the production line.

[0005] In the related art, to inspect secondary batteries, multiple X-ray tubes are used sequentially to capture three-dimensional (3D) inspection images of various parts of the secondary battery. However, when multiple X-ray tubes are used, it takes a long time to capture the inspection images, and the overall structure of the X-ray inspection system is complicated. Summary of the Invention

[0006] Technical issues

[0007] The present disclosure aims to solve the above problems and provide an X-ray inspection apparatus and an X-ray inspection system, which can reduce the inspection time by using one X-ray tube to inspect areas to be inspected set at inspection positions relative to multiple objects to be inspected at the same time, and reduce the overall size by simplifying the structure.

[0008] Technical Solution

[0009] An X-ray inspection apparatus according to an embodiment of the present disclosure includes an X-ray tube; a detector arranged to face the X-ray tube; and a conveying device for simultaneously performing X-ray inspection on at least two objects to be inspected and conveying the at least two objects to be inspected to an inspection position between the X-ray tube and the detector.

[0010] The conveying device may include a first conveying device and a second conveying device.

[0011] Each of the first conveying device and the second conveying device can simultaneously convey at least one object to be inspected to the inspection position.

[0012] The conveying device may further include a rotating member for rotating at least two objects to be inspected simultaneously.

[0013] The rotating component can rotate the object to be inspected so that any corner or side surface of the object to be inspected is placed at the inspection position.

[0014] The conveying device can convey the object to be inspected in a conveying direction perpendicular to the X-ray radiation path of the X-ray tube, can rotate around the X-ray radiation path, and can rotate around a horizontal direction perpendicular to the X-ray radiation path and the conveying direction.

[0015] The conveying device may include a first rotating component that rotates the object to be inspected with the X-ray radiation path as an axis; a second rotating component that rotates the object to be inspected and the first rotating component with the horizontal direction as an axis; and a conveying component that conveys the object to be inspected, the first rotating component and the second rotating component in a conveying direction.

[0016] The transfer device may further include a horizontal transfer member that moves the object to be inspected; a first rotating member; and a second rotating member in the horizontal direction.

[0017] The conveying device may further include a fixing member for fixing the object to be inspected on the conveying device.

[0018] The X-ray inspection apparatus may further include a carrier, wherein the carrier accommodates at least one object to be inspected, and the transport device may transport the carrier to an inspection position.

[0019] When a plurality of objects to be inspected are accommodated in the carrier, the X-ray inspection apparatus may further include a partition provided between each of the plurality of objects to be inspected.

[0020] The conveying device may be implemented as an articulated robot that grasps at least two objects to be inspected and rotates the at least two objects to be inspected via a plurality of joints.

[0021] The conveying device may include a base; a plurality of links; a wrist portion having a clamp for grasping at least two objects to be inspected; and a plurality of joints that sequentially connect the base, the plurality of links, and the wrist portion, and connect the plurality of links and the wrist portion so as to be rotatable respectively.

[0022] The wrist portion may include a gripper for grasping at least one object to be inspected.

[0023] The conveying device may include a first conveying device, a second conveying device, and a third conveying device, and each of the first to third conveying devices may convey at least one object to be inspected to an inspection position.

[0024] The detector may include a first detector and a second detector; the conveying device may convey the object to be inspected to a first inspection position between the X-ray tube and the first detector and a second inspection position between the X-ray tube and the second detector, respectively.

[0025] According to an embodiment of the present disclosure, an X-ray inspection system includes an X-ray tube; a detector arranged to face the X-ray tube; at least two carriers, each carrier capable of accommodating at least one object to be inspected; a loading device, which loads the object to be inspected on the carrier; a conveying device, which conveys the at least two carriers and the object to be inspected to an inspection position between the X-ray tube and the detector; a carrier collecting device, which collects the carriers to an initial position, at which the object to be inspected is loaded after the X-ray inspection is completed and the object to be inspected is separated from the carrier; and a conveying device, which conveys the at least two carriers to the inspection position between the X-ray tube and the detector in order to simultaneously perform X-ray inspection on the objects to be inspected respectively accommodated in the at least two carriers.

[0026] The conveying device may include a first conveying device, and a second conveying device, and each of the first conveying device and the second conveying device may simultaneously convey at least one object to be inspected to the inspection position.

[0027] The conveying device may further include a rotating member that simultaneously rotates at least two objects to be inspected.

[0028] The X-ray inspection system may include a first transport device that loads a carrier onto a conveying device, wherein the objects to be inspected are accommodated in the carrier; a sorting device that sorts the objects to be inspected according to the X-ray inspection results of the objects to be inspected; and a second transport device that moves the carrier accommodating the objects to be inspected that have completed the X-ray inspection from the conveying device to the sorting device.

[0029] The sorting device can take out the objects to be inspected that have completed the X-ray inspection from the carrier collecting device.

[0030] The detector may generate an X-ray inspection image of the object to be inspected, and the classification device may classify the object to be inspected and take it out to a line corresponding to the X-ray inspection result based on the generated X-ray inspection image of the object to be inspected.

[0031] The X-ray inspection system may further include a non-defective product classification line and a defective product classification line, and the classification device may arrange objects to be inspected that are determined to be non-defective products on the non-defective product classification line based on the X-ray inspection image, and arrange objects to be inspected that are determined to be defective products on the defective product classification line.

[0032] The X-ray inspection system may include a partition, which is arranged between each of the multiple objects to be inspected when the multiple objects to be inspected are accommodated in the carrier; and a partition collecting device, which collects the partitions; the sorting device can take out the partitions loaded on the carrier to the partition collecting device, and the partition collecting device can collect the partitions to the position where the partitions are loaded on the carrier. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] Figure 1 A perspective view schematically illustrates an X-ray inspection system according to an embodiment of the present disclosure.

[0034] Figure 2 is a perspective view for explaining a loading device according to an embodiment of the present disclosure.

[0035] Figure 3 is a perspective view for explaining the operation of the loading device according to the embodiment of the present disclosure.

[0036] Figure 4 is a view for explaining a configuration in which an object to be inspected and a partition are accommodated in a carrier according to an embodiment of the present disclosure.

[0037] Figure 5 is a view for explaining a configuration in which only an object to be inspected is accommodated in a carrier according to an embodiment of the present disclosure.

[0038] Figure 6 is a perspective view for explaining the operation of the first transportation device according to the embodiment of the present disclosure.

[0039] Figure 7 is a perspective view for explaining the operation of the first transportation device according to the embodiment of the present disclosure.

[0040] Figure 8 is a perspective view for explaining the operation of the first transportation device according to the embodiment of the present disclosure.

[0041] Figure 9 A perspective view schematically illustrates an X-ray inspection apparatus according to an embodiment of the present disclosure.

[0042] Figure 10 is a perspective view for explaining a conveying device according to an embodiment of the present disclosure.

[0043] Figure 11is a schematic diagram for explaining the operation of the conveying device according to the embodiment of the present disclosure.

[0044] Figure 12 is a schematic diagram for explaining the operation of the conveying device according to the embodiment of the present disclosure.

[0045] Figure 13 is a schematic diagram for explaining the operation of the conveying device according to the embodiment of the present disclosure.

[0046] Figure 14 is a schematic diagram for explaining a secondary battery inspection operation of the X-ray inspection apparatus according to an embodiment of the present disclosure.

[0047] Figure 15 is a schematic diagram for explaining a secondary battery inspection operation of the X-ray inspection apparatus according to an embodiment of the present disclosure.

[0048] Figure 16 is a schematic diagram for explaining an inspection operation of an X-ray inspection apparatus including a plurality of detectors.

[0049] Figure 17 is a schematic diagram for explaining an inspection operation of the X-ray inspection apparatus according to an embodiment of the present disclosure.

[0050] Figure 18 It is a side view for explaining a surface inspection method among inspection methods of the X-ray inspection apparatus according to an embodiment of the present disclosure.

[0051] Figure 19 1 is a side view illustrating a linear inspection method among inspection methods of an X-ray inspection apparatus according to an embodiment of the present disclosure.

[0052] Figure 20 1 is a diagram for explaining a secondary battery inspection operation of the X-ray inspection apparatus according to an embodiment of the present disclosure.

[0053] Figure 21 is a schematic diagram for explaining a secondary battery inspection operation of the X-ray inspection apparatus according to an embodiment of the present disclosure.

[0054] Figure 22 is a perspective view for explaining the operation of the second transportation device according to the embodiment of the present disclosure.

[0055] Figure 23 is a perspective view for explaining the operation of the second transportation device according to the embodiment of the present disclosure.

[0056] Figure 24 is a perspective view for explaining the operation of the classification device according to the embodiment of the present disclosure.

[0057] Figure 25is a schematic diagram for explaining a conveying device according to another embodiment of the present disclosure.

[0058] Figure 26 FIG. 1 is a schematic diagram for explaining an inspection process of an X-ray inspection apparatus including a conveying apparatus according to another embodiment of the present disclosure.

[0059] Figure 27 is a perspective view for explaining an X-ray inspection system according to another embodiment of the present disclosure. DETAILED DESCRIPTION

[0060] The embodiments described below are shown by way of example to aid understanding of the present disclosure, and it should be understood that the present disclosure can be implemented through various modifications that differ from the embodiments described herein. However, in the following description of the present disclosure, when it is determined that a detailed description of related known functions or components may unnecessarily obscure the subject matter of the present disclosure, the detailed description and specific explanation will be omitted. In addition, to aid understanding of the present disclosure, the drawings are not drawn to scale, and the sizes of some components may be exaggerated.

[0061] The terms used in this specification and claims are conventional terms, taking into account the functionality of the present disclosure. However, these terms may vary based on the intentions of those skilled in the relevant field, legal or technical interpretations, and the emergence of new technologies. Furthermore, some terms are arbitrarily selected by the applicant. These terms may be interpreted as having the meanings defined in this specification. If no specific term definition is found, they may be interpreted based on the overall description of this specification and common technical knowledge in the relevant technical field.

[0062] In the description of the present disclosure, the order of each step should be understood as non-restrictive, unless the previous step must logically and temporally precede the next step. In other words, except for the above special circumstances, even if the process described as the next step is performed before the process described as the previous step, it will not affect the nature of the present disclosure, and the scope of rights must be defined regardless of the order of the steps.

[0063] In this specification, expressions such as “have”, “may have”, “include” or “may include” indicate the existence of corresponding features (e.g., values, functions, operations or components such as parts), which does not exclude the existence of additional features.

[0064] Terms such as first and second may be used to describe various components, but the components should not be limited by these terms. These terms may be used only for the purpose of distinguishing one component from another. For example, a first component may be referred to as a second component, and similarly, a second component may be referred to as a first component without departing from the scope of the present disclosure.

[0065] In addition, terms used in the present disclosure such as "front surface", "rear surface", "upper surface", "lower surface", "side surface", "left side", "right side", "upper part", and "lower part" are defined with respect to the drawings, and the shape and position of each component are not limited by these terms.

[0066] In addition, since the components necessary for describing each embodiment of the present disclosure have been described in this specification, these components are not necessarily limited thereto. Accordingly, some components may be changed or omitted, while other components may be added. In addition, the components may be distributed and arranged in separate devices that are different from each other.

[0067] Furthermore, the embodiments of the present disclosure will be described in detail with reference to the drawings and the description given in the drawings, but the present disclosure is not limited or restricted by the embodiments.

[0068] Below, we will refer to Figures 1 to 27 The present disclosure is described in detail.

[0069] Figure 1 is a perspective view schematically illustrating an X-ray inspection system according to an embodiment of the present disclosure.

[0070] The X-ray inspection system 1 is a system that can perform a series of operations including transporting an object to be inspected to an inspection position, performing X-ray inspection on the object to be inspected, and classifying non-defective products and defective products according to the inspection results so as to perform non-destructive inspection on the object to be inspected.

[0071] refer to Figure 1 The X-ray inspection system 1 according to an embodiment of the present disclosure may include an X-ray inspection device 10, the X-ray inspection device 10 including an X-ray tube 11 (see Figure 9 ), detector 12 (see Figure 9) and a first conveying device 100; a supply line 41, the supply line 41 supplies objects to be inspected from the outside; a loading device 40, the loading device 40 loads the supplied objects to be inspected onto a carrier 150; a first transport device 20, the first transport device 20 transports the carrier 150 containing the objects to be inspected to the first conveying device 100; a second transport device 30, the second transport device 30 moves the objects to be inspected that have completed X-ray inspection from the first conveying device 100 to the sorting device 50; the sorting device 50, The classification device 50 classifies the objects to be inspected that have completed X-ray inspection; the non-defective product classification line 60, which extracts objects to be inspected that are classified as non-defective products; the defective product classification line 70, which extracts objects to be inspected that are classified as defective products; and the carrier collecting device 80 and the partition collecting device 90, which respectively move the carrier 150 and the partition 154 to circulate in the X-ray inspection system 1.

[0072] The configuration of transport logistics, such as the supply line 41, the first transport device 20, the second transport device 30, the non-defective product sorting line 60, the defective product sorting line 70, the carrier collection device 80 and the partition collection device 90 can be implemented using a conveyor system, a linear motion system (LMS), a magnet motion, a multi-carrier system (MCS) or other linear actuators.

[0073] The first conveyor 100 is a device capable of conveying the object to be inspected to the X-ray radiation path of the X-ray tube 11 and rotating the object to be inspected in multiple directions, and through this operation, the X-ray inspection device 10 can generate a 3D inspection image of the object to be inspected. Figures 8 to 13 The X-ray inspection apparatus 10 including the first conveying device 100 will be described in detail.

[0074] Below, we will refer to Figures 2 to 21 Each component included in the X-ray inspection system 1 according to various embodiments of the present disclosure is described in detail.

[0075] Figure 2 and Figure 3 is a perspective view for explaining the operation of the loading device 40 according to the embodiment of the present disclosure.

[0076] The loading device 40 is a device for loading the object to be inspected 180 and the partition plate 154 onto the carrier 150 .

[0077] refer to Figure 2The loading device 40 can move the object to be inspected 180 provided from the outside through the supply line 41 to be loaded on the carrier 150. For example, the supply line 41 can be connected to a production line of objects to be inspected and supply the objects to be inspected 180 produced on the production line of objects to be inspected to the X-ray inspection system 1.

[0078] The loading device 40 may include a clamp 42 that can grasp and move the object to be inspected 180. For example, the loading device 40 may apply pressure to the side surfaces of the object to be inspected 180 by means of a plurality of protrusions 43 extending from the clamp 42, thereby securing the object to be inspected 180 on the clamp 42, and may also lift the object to be inspected 180 or move the object to be inspected 180.

[0079] However, the structure of the loading device 40 is not limited thereto, and may be implemented as various structures capable of moving the object to be inspected 180 .

[0080] refer to Figure 3 The loading device 40 may drive the gripper 42 to load the object to be inspected 180 and the separator 154 onto the carrier 150 , which is disposed adjacent to the supply line 41 and the separator collecting device 90 .

[0081] In this case, the carrier 150 loaded with the object to be inspected 180 and the partition plate 154 can be supplied from the carrier collecting device 80. Figure 3 Although not shown in the figure, a configuration for moving the carrier 150 may be arranged between the carrier collecting device 80 and the loading device 40. For example, a diverter conveyor may be arranged between the carrier collecting device 80 and the loading device 40, or the carrier 150 may be moved by a linear motion system (LMS), magnet motion, multi-carrier system (MCS), or other linear actuators. Thus, the carrier 150 can be moved to a position where the loading device 40 loads the object to be inspected 180 and the separator 154.

[0082] At the same time, the carriers 150 can be arranged in two rows at the loading position. In this case, the loading device 40 can load the objects 180 to be inspected and the partitions 154 onto their respective carriers 150.

[0083] The following will refer to Figures 1 to 9 A detailed description is given of the operations of the carrier collecting device 80 and the partition collecting device 90 to collect and circulate the carriers 150 and the partitions 154 , respectively, in the X-ray inspection system 1 .

[0084] The loading device 40 may take out the object to be inspected 180 from the supply line 41 and load the object to be inspected 180 on the carrier 150 , and take out the separator 154 from the separator collecting device 90 and load the separator 154 on the carrier 150 .

[0085] Below, we will refer to Figure 4 A structure is described in which the object to be inspected 180 and the partition plate 154 are loaded on the carrier 150 by the loading device 40 .

[0086] Figure 4 1 is a view for explaining a configuration of an object to be inspected and a partition accommodated in a carrier according to an embodiment of the present disclosure.

[0087] The carrier 150 may include a receiving portion 153 which is a space in which one or more objects to be inspected 181 and 182 and a partition 154 may be placed, and a sidewall 151 including at least one groove 152 .

[0088] A plurality of objects to be inspected 181 and 182 may be loaded on the carrier 150. In this case, the partition 154 may be disposed between the objects to be inspected 181 and 182 to separate the plurality of objects to be inspected 181 and 182. Since the partition 154 is disposed between the objects to be inspected 181 and 182, images of the objects to be inspected 181 and 182 can be distinguished from X-ray inspection images obtained for the plurality of objects to be inspected 181 and 182.

[0089] In this case, the loading device 40 may load the objects to be inspected 181 and 182 and the partition 154 onto the carrier 150 by sequentially loading the first object to be inspected 182 thereon, loading the partition 154 thereon, and loading the second object to be inspected 181 thereon.

[0090] The partition plate 154 can be detached from the first conveyor 100 and can be reused when circulating in the X-ray inspection system 1 .

[0091] However, the partition 154 does not correspond to an indispensable configuration for image recognition of the objects to be inspected 181 and 182, and when the partition 154 is not used, the X-ray inspection apparatus 10 can identify each object to be inspected by the shape appearing on the X-ray inspection image, or can separate and identify each object to be inspected by counting the number of electrodes by the size of the shape appearing on the X-ray inspection image. In this case, as Figure 5 As shown, a plurality of objects to be inspected 181, 182, and 183 can be sequentially loaded on the carrier 150. Therefore, a greater number of objects to be inspected can be loaded on the carrier 150 compared to the case where the partition plate 154 is used.

[0092] at the same time, Figure 4 It is shown that two objects to be inspected 181 and 182 and one partition plate 154 are accommodated in the carrier 150 , but the number of objects to be inspected and partition plates 154 loaded on the carrier 150 is not limited thereto.

[0093] For example, three or more objects to be inspected may be accommodated in the carrier 150 , and the partitions 154 may be disposed between the objects to be inspected.

[0094] On the other hand, the length L and the width W of the accommodating portion 153 of the carrier 150 may be changed according to the type of the object to be inspected accommodated in the carrier 150. In this case, by applying the carrier 150 having the length L and the width W corresponding to the size of the object to be inspected to the X-ray inspection system 1, the same X-ray inspection system 1 can be used to perform X-ray inspections on various types of objects to be inspected.

[0095] Furthermore, the carrier 150 may have a structure in which the arrangement of the sidewalls 151 is changeable. In this case, by changing the arrangement of the sidewalls 151 of the carrier 150 and changing the length L and width W of the receiving portion 153, various types of objects to be inspected may be received.

[0096] Below, we will refer to Figures 6 to 8 The first transport device 20 is described, which loads the carrier 150 onto the first conveyor device 100 , wherein the object to be inspected 180 and the partition plate 154 are loaded onto the carrier 150 .

[0097] Figures 6 to 8 is a perspective view for explaining the operation of the first transportation device 20 according to an embodiment of the present disclosure.

[0098] refer to Figure 6 The first transport device 20 can move the carriers 150 and 250 loaded with the objects to be inspected to the first conveying device 100 and the second conveying device 200 by the loading device 40, and can load the carriers 150 and 250 on the first conveying device 100 and the second conveying device 200.

[0099] For example, reference Figure 7 , the first transport device 20 may move along the positive X-axis direction with the carriers 150 and 250 loaded on its upper portion, and load the carriers 150 and 250 onto the first conveying device 100 and the second conveying device 200 .

[0100] In this case, the first transport device 20 may simultaneously transport two carriers 150 and 250 arranged in two rows and load the carriers 150 and 250 on the first conveyor device 100 and the second conveyor device 200, respectively.

[0101] At the same time, reference Figure 8 , the first transport device 20 can load carriers on the first conveying device 100 and the second conveying device 200, move in the negative X-axis direction, and load carriers 150 and 250 to be transported in the next order.

[0102] At the same time, the above description has described the first transport device 20 moving the carrier 150 on which the object to be inspected 180 and the partition 154 are loaded, but is not limited to this. The first transport device 20 can be implemented in the form of directly transporting the object to be inspected 180 without using the carrier 150, and loading the object to be inspected 180 on the first conveying device 100 and the second conveying device 200.

[0103] Figure 9 A perspective view schematically illustrates an X-ray inspection apparatus according to an embodiment of the present disclosure.

[0104] refer to Figure 9 The X-ray inspection device 10 may include an X-ray tube 11 , a detector 12 , and a first conveying device 100 and a second conveying device 200 .

[0105] The X-ray inspection apparatus 10 is an apparatus that uses the property of X-rays passing through an object to inspect the internal state of the object to be inspected. The object to be inspected by the X-ray inspection apparatus 10 may be an electronic component such as a secondary battery, but is not limited thereto.

[0106] refer to Figure 9 , the X-ray tube 11 may emit X-rays in a preset direction, and the detector 12 may be arranged to face the X-ray tube 11. For example, the X-ray tube 11 may emit X-rays in the positive Z-axis direction, and the detector 12 may be arranged above the X-ray tube 11 to receive the X-rays emitted from the X-ray tube 11. However, the arrangement of the X-ray tube 11 and the X-ray radiation direction are not limited thereto, and X-rays may be emitted in different directions, the position of the X-ray tube 11 may be moved, or the X-ray radiation direction may be adjusted.

[0107] The first conveying device 100 and the second conveying device 200 may convey the objects to be inspected 180 and 280 so that the objects to be inspected 180 and 280 are arranged in an X-ray radiation path of the X-ray tube 11 .

[0108] The conveyor device may include a first conveyor device 100 and a second conveyor device 200. The first conveyor device 100 and the second conveyor device 200 may respectively convey platforms 110 and 120 on which at least one object to be inspected is placed, and the platforms 110 and 120 may be simultaneously conveyed by the first conveyor device 100 and the second conveyor device 200. Therefore, a plurality of objects to be inspected may be inspected simultaneously using one X-ray tube 11.

[0109] The first conveyor 100 and the second conveyor 200 are symmetrically arranged and can move parallel to each other. The first conveyor 100 and the second conveyor 200 can have the same structure.

[0110] The first and second conveying devices 100 and 200 may include platforms 110 and 210 on which objects 180 and 280 to be inspected are placed, conveying members 140 and 240 connected to the platforms 110 and 210 , and conveying lines 170 and 270 .

[0111] refer to Figure 9 The conveying lines 170 and 270 may be arranged in the X-axis direction. The conveying members 140 and 240 may be connected to the conveying lines 170 and 270 so as to be movable along the respective conveying lines 170 and 270 .

[0112] In this case, the transporting members 140 and 240 may be connected to the platforms 110 and 210 on which the objects to be inspected 180 and 280 are placed. Therefore, the transporting members 140 and 240 may transport the platforms 110 and 210 in the positive X-axis direction so that the objects to be inspected 180 and 280 placed on the platforms 110 and 210 may be placed on the X-ray radiation path of the X-ray tube 11.

[0113] The following will refer to Figures 11 to 13 The operations of the first conveyor 100 and the second conveyor 200 conveying the platforms 110 and 210 will be described in detail.

[0114] On the other hand, the first conveying device 100 and the second conveying device 200 may include first rotating parts 120 and 220, which rotate the objects to be inspected 180 and 280 arranged on the platforms 110 and 210 with the direction of the X-ray radiation path parallel to the X-ray tube 11 as the axis, and second rotating parts 130 and 230, which rotate the objects to be inspected 180 and 280 with the horizontal direction perpendicular to the X-ray radiation path and the conveying direction of the platforms 110 and 210 as the axis.

[0115] The first rotating members 120 and 220 may be provided on the platforms 110 and 210. The objects to be inspected 180 and 280 may be provided on the first rotating members 120 and 220 and may be rotated by the rotation of the first rotating members 120 and 220.

[0116] For example, reference Figure 8 The first rotating members 120 and 220 can rotate along the Z-axis. Accordingly, the objects to be inspected 180 and 280 can rotate so that any corner thereof is disposed in the X-ray radiation path of the X-ray tube 11 .

[0117] However, the arrangement of the platforms 110 and 210, the first rotating members 120 and 220, and the objects to be inspected 180 and 280 is not limited thereto, and may be implemented in such a form that the object to be inspected is set on the platform, and the object to be inspected and a portion of the platform where the object to be inspected is set are rotated by the first rotating member.

[0118] The second rotating members 130 and 230 may rotate about a horizontal direction perpendicular to an X-ray irradiation path and a conveying direction of the platforms 110 and 210 .

[0119] For example, reference Figure 8 The second rotating parts 130 and 230 can be connected to the side surfaces of the platforms 110 and 210, and can rotate the platforms 110 and 210, the first rotating parts 120 and 220, and the objects to be inspected 180 and 280 set on the platforms 110 and 210 with the Y-axis direction as the axis.

[0120] In this case, the second rotating components 130 and 230 can rotate a certain angle or more, or 360 degrees or more, in the Y-axis direction. For example, the second rotating components 130 and 230 can rotate 180 degrees or more, and can rotate less than 180 degrees as long as an inspection image can be obtained. Furthermore, to obtain high-quality three-dimensional inspection images, the second rotating components 130 and 230 can rotate 360 ​​degrees or more, preferably approximately 370 degrees. Thus, the detector 12 can generate a 3D inspection image by obtaining X-ray inspection images transmitted in different directions through the inspection object.

[0121] The rotation operations of the first and second rotating members 120 and 220 and the second rotating members 130 and 230 and the corresponding generation of the inspection image will be described in detail below.

[0122] Figure 10 is a perspective view for explaining a conveying device according to an embodiment of the present disclosure.

[0123] For the convenience of description, the structure of the first conveying device 100 will be described below as an example. The description of the first conveying device 100 is also applicable to the second conveying device 200.

[0124] The first transfer device 100 may include a platform 110 , a first rotating member 120 , a second rotating member 130 , a transfer member 140 , a carrier 150 , and a fixing member 160 .

[0125] refer to Figure 10 The platform 110 may include a side plate 112 , a lower plate 111 formed and extended in a horizontal direction at a lower end of the side plate 112 , and an upper plate 113 formed and extended in a horizontal direction at an upper end of the side plate 112 .

[0126] The first rotating member 120 may be rotatably disposed on the lower plate 111 of the platform 110 .

[0127] The object to be inspected 180 may be disposed on the first rotating member 120. In this case, the object to be inspected 180 may be disposed on the first rotating member 120 while being accommodated in the carrier 150 having a space for accommodating the object to be inspected 180.

[0128] The carrier 150 can be separated from the first conveyor 100 and can be circulated and reused in the X-ray inspection system 1. The carrier 150 can allow at least one object to be inspected 180 to be conveyed by the first conveyor 100 in such a manner that the at least one object to be inspected 180 is loaded onto the first conveyor 100 by the first transport device 20 while accommodating the at least one object to be inspected 180.

[0129] The fixing member 160 may be arranged to contact the upper portion of the object to be inspected 180 and may have a vertically movable structure. For example, the fixing member 160 may be connected to the upper plate 113 of the platform 110 and arranged to contact the upper portion of the object to be inspected 180 disposed on the lower plate 111 and the first rotating member 120. In this case, after the object to be inspected 180 is placed on the platform 110, the fixing member 160 can be moved to contact the upper portion of the object to be inspected 180, thereby fixing the object to be inspected 180 on the platform 110.

[0130] Accordingly, when the platform 110 is rotated by the first rotating member 120 and the second rotating member 130 or transported by the transport member 140 , the fixing member 160 can fix the object 180 to be disposed on the platform 110 , thereby preventing the object 180 from being separated from the platform 110 during inspection.

[0131] Figures 11 to 13 is a schematic diagram for explaining the operation of the conveying device according to the embodiment of the present disclosure.

[0132] Figures 11 to 13 It is a view of the first conveying device 100 and the second conveying device 200 in the Z-axis direction according to an embodiment of the present disclosure, and unnecessary configurations for explaining the operation of conveying the objects to be inspected 180 and 280 are omitted.

[0133] Figure 11 1 and 2 are views showing a state in which the platforms 110 and 210 are set at positions where the objects to be inspected 180 and 280 are loaded on the platforms 110 and 210 of the first and second conveyor devices 100 and 200 .

[0134] Although Figure 11 Although not shown, the objects to be inspected 180 and 280 may be loaded onto the platforms 110 and 210 while being housed in the carriers 150 and 250, respectively. The loading operation may be performed by the first transport device 20 provided at the starting point of the conveying path of the first conveyor 100 and the second conveyor 200.

[0135] Figure 12 1 is a view showing a state in which the platforms 110 and 210 are set at positions where the objects to be inspected 180 and 280 are subjected to X-ray inspection.

[0136] The transport members 140 and 240 can be moved in the positive X-axis direction from the positions where the objects to be inspected 180 and 280 are loaded (see FIG. Figure 11 ) transport platforms 110 and 210. However, the configuration for transporting the objects to be inspected 180 and 280 in the positive X-axis direction is not limited thereto, and the objects to be inspected 180 and 280 may be transported by the first and second transport devices 20 and 30 (see FIG. Figure 27 ) is transmitted in the positive X-axis direction. Figure 27 Give detailed explanation in this regard.

[0137] refer to Figure 12 , some areas of the objects to be inspected 180 and 280 can be set at the inspection position A. For example, the first rotating parts 120 and 220 can rotate the objects to be inspected 180 and 280 in the Z-axis direction so that any corner of the objects to be inspected 180 and 280 is set at the inspection position A.

[0138] Accordingly, the object to be inspected 180 conveyed by the first conveying device 100 and the object to be inspected 280 conveyed by the second conveying device 200 can be simultaneously inspected using X-rays emitted from one X-ray tube 11 .

[0139] Furthermore, when the objects to be inspected 180 and 280 are rotated by the first rotating members 120 and 220 , X-ray inspection can be performed by setting the angular area of ​​the objects to be inspected 180 and 280 at the inspection position A.

[0140] Furthermore, when the objects to be inspected 180 and 280 are rotated by the first rotating members 120 and 220 , X-ray inspection may be performed by disposing corner areas or side surfaces of the objects to be inspected 180 and 280 at the inspection position A.

[0141] For example, when the objects to be inspected 180 and 280 are secondary batteries, by obtaining a three-dimensional (3D) inspection image of a partial area of ​​the objects to be inspected 180 and 280, such as a corner area, the level difference and bending degree of the negative and positive electrodes of the secondary batteries can be measured, through which it can be determined whether the objects to be inspected have defects.

[0142] Furthermore, the endpoints 180-4, 180-5, 280-4, and 280-5 provided on the side surfaces of the objects to be inspected 180 and 280 can be determined by obtaining inspection images of the side surfaces of the objects to be inspected 180 and 280, for example, the welding state of the endpoints, etc. (see FIG. Figure 15 ) to determine whether the object to be inspected has defects.

[0143] At the same time, despite Figure 12 Although not shown in the figure, the first conveyor 100 and the second conveyor 200 may include a horizontal moving part (not shown) that moves the platforms 110 and 210 in a horizontal direction perpendicular to the conveying direction, that is, in the Y-axis direction. Therefore, it is possible to move the objects to be inspected 180 and 280 so as to be closer to the inspection position A.

[0144] For example, reference Figure 12 , the horizontal moving component of the first conveyor 100 can move the platform 110 in the negative Y-axis direction, and the horizontal moving component of the second conveyor 200 can move the platform 210 in the positive Y-axis direction.

[0145] The horizontal movement part may be a separate part connected to the platforms 110 and 210 , but may be implemented to have the same effect such that the transfer parts 140 and 240 are configured to be movable in the horizontal direction while being connected to the platforms 110 and 210 .

[0146] Figure 13 1 is a view showing a state in which the platforms 110 and 210 of the first conveyor 100 and the second conveyor 200 are set at positions where the objects to be inspected 180 and 280 are moved from the platforms 110 and 210 .

[0147] Although Figure 13 Although not shown, the objects to be inspected 180 and 280 can be moved from the platforms 110 and 210 while being accommodated in the carriers 150 and 250, respectively. This movement operation can be performed by the second transport device 30 arranged at the end point of the conveying path of the first conveyor 100 and the second conveyor 200.

[0148] In this case, the second transport device 30 can move the carriers 150 and 250 loaded with the objects to be inspected 180 and 280 to the sorting device 50. Figure 22 and 23 The operation of the second transport device 30 to move the carriers 150 and 250 will be described in detail.

[0149] Figure 14 and Figure 151 and 2 are views for explaining a secondary battery inspection process of the X-ray inspection apparatus according to an embodiment of the present disclosure.

[0150] Specifically, reference will be made to Figure 14 and Figure 15 The X-ray inspection process of inspecting the objects to be inspected 180 and 280 in various directions by the operation of rotating the second rotating members 130 and 230 by the first conveyor 100 and the second conveyor 200 is described.

[0151] Figure 14 1 and 2. This is a view of some configurations of the first conveyor 100 and the second conveyor 200 as viewed from the X-axis direction. For the convenience of explanation, only the X-ray tube 11, the detector 12, and the objects to be inspected 180 and 280 are simply shown.

[0152] Figure 15 Shown in Figure 14 1 , which is a view of a state in which the objects to be inspected 180 and 280 are rotated 90 degrees in the Y-axis direction by the second rotating members 130 and 230 .

[0153] refer to Figure 12 and Figure 13 The objects to be inspected 180 and 280 can be rotated by the second rotating members 130 and 230 (see Figure 9 ) is rotated 360 degrees about the Y-axis direction and is simultaneously arranged on the X-ray radiation path of the X-ray tube 11. Therefore, the detector 12 can obtain X-ray inspection images that penetrate the objects 180 and 280 in various directions and generate a three-dimensional inspection image of one side of the objects 180 and 280 to be inspected.

[0154] On the other hand, when the X-ray inspection of any corner or side surface of each of the objects to be inspected 180 and 280 is completed by the second rotating members 130 and 230, the objects to be inspected 180 and 280 can be rotated relative to the Z-axis direction by the first rotating members 120 and 220. Therefore, the X-ray inspection can be sequentially performed on the corners or side areas of the objects to be inspected 180 and 280 that have not been subjected to the X-ray inspection.

[0155] When the objects to be inspected 180 and 280 have a rectangular shape, X-ray inspection may be performed at all four corners, and only two corners arranged diagonally opposite to each other may be inspected.

[0156] For example, the objects to be inspected 180 and 280 can be rotated 180 degrees in the Z-axis direction as an axis by the first rotating parts 120 and 220, and then rotated 360 degrees in the Y-axis direction as an axis by the second rotating parts 130 and 230, so that the X-ray inspection device 10 can perform X-ray inspection on a corner or side area opposite to the area where the inspection is performed on the objects to be inspected 180 and 280.

[0157] Meanwhile, the X-ray inspection apparatus according to the present disclosure may be implemented to include one or more detectors.

[0158] Figure 16 This is a schematic diagram for explaining the inspection process of an X-ray inspection apparatus including a plurality of detectors.

[0159] refer to Figure 16 The X-ray inspection apparatus may include an X-ray tube 11 and a plurality of detectors, such as a first detector 12 - 1 and a second detector 12 - 2 , and the X-ray tube 11 may emit X-rays to each of the first detector 12 - 1 and the second detector 12 - 2 .

[0160] The first conveyor 100 and the second conveyor 200 can convey the object to be inspected to an inspection position located in their respective X-ray radiation paths. For example, the first conveyor 100 can convey the object to be inspected 180 to a first inspection position located on the path of X-rays emitted from the X-ray tube 11 to the first detector 12-1, while the second conveyor 200 can convey the object to be inspected 280 to a second inspection position located on the path of X-rays emitted from the X-ray tube 11 to the second detector 12-2.

[0161] In this case, each of the objects to be inspected 180 and 280 can be rotated while being placed on the X-ray radiation path of the X-ray tube 11. Therefore, each of the first detector 12-1 and the second detector 12-2 can obtain X-ray inspection images transmitted in different directions through the objects to be inspected 180 and 280 and generate three-dimensional inspection images of the objects to be inspected 180 and 280.

[0162] Figures 17 to 19 1 is a diagram for explaining another inspection process of the X-ray inspection apparatus according to the embodiment of the present disclosure.

[0163] refer to Figure 17 The first conveyor 100 and the second conveyor 200 can rotate the objects 180 and 280 to be inspected so that their side surfaces are perpendicular to the X-ray radiation path, and then convey the objects 180 and 280 to the inspection position. Therefore, the X-ray inspection apparatus 10 can obtain two-dimensional inspection images of the objects 180 and 280, rather than three-dimensional inspection images.

[0164] Figure 18 is a side view for explaining an area inspection method in a two-dimensional inspection method of an X-ray inspection apparatus according to an embodiment of the present disclosure, and Figure 19 is a side view for explaining a linear inspection method among two-dimensional inspection methods of an X-ray inspection apparatus according to an embodiment of the present disclosure.

[0165] refer to Figure 18 , all side areas of the object to be inspected 180 can be arranged in the X-ray radiation path of the X-ray tube 11, that is, the inspection position. In this case, the X-ray inspection device 10 can obtain a two-dimensional inspection image of the side surface area of ​​the object to be inspected 180.

[0166] At the same time, reference Figure 19 , a portion of the side surface area of ​​the object to be inspected 180 can be positioned in the X-ray radiation path of the X-ray tube 11, i.e., at the inspection position. In this case, by moving the object to be inspected 180 by the first conveyor 100 or by shifting the positions of the X-ray tube 11 and the detector 12, the entire side surface area of ​​the object to be inspected 180 can be X-ray inspected. Accordingly, the X-ray inspection apparatus 10 can obtain a two-dimensional inspection image of the side surface area of ​​the object to be inspected 180.

[0167] Figures 20 to 21 Schematic diagram for explaining a secondary battery inspection process of the X-ray inspection apparatus according to an embodiment of the present disclosure.

[0168] Figure 20 A diagram schematically illustrates a 3D inspection image of a corner area of ​​the object 180 to be inspected that can be generated by the X-ray inspection apparatus 10 when the object 180 to be inspected is a secondary battery.

[0169] refer to Figure 20 , the 3D inspection image of the object to be inspected 180 may include a 3D inspection image of the positive electrode 180 - 1 , the negative electrode 180 - 2 , and the separator 180 - 3 separating the positive electrode 180 - 1 and the negative electrode 180 - 2 .

[0170] The X-ray inspection apparatus 10 may analyze a three-dimensional inspection image of the object to be inspected 180 to determine whether the object to be inspected 180 has defects.

[0171] For example, the X-ray inspection device 10 can measure the alignment status, quantity and bending degree of the positive electrode 180-1 and the negative electrode 180-2 through a three-dimensional inspection image, identify whether the object to be inspected 180 is within the normal range, and classify the object to be inspected 180 as a non-defective product or a defective product based on the identification result.

[0172] In addition, the X-ray inspection apparatus 10 can generate a cut surface of a three-dimensional inspection image and measure the degree of curvature of each of the positive electrode 180-1 and the negative electrode 180-2 and the level difference between the positive electrode 180-1 and the negative electrode 180-2 to determine whether the object to be inspected 180 has defects.

[0173] Specifically, refer to Figure 21, the X-ray inspection apparatus 10 can generate cutting planes cut along lines II and II-II, respectively, relative to the three-dimensional inspection image of the object to be inspected 180. In this case, the X-ray inspection apparatus 10 can measure the level differences D1 and D2 between the positive electrode 180-1 and the negative electrode 180-2 corresponding to the respective cutting directions.

[0174] Meanwhile, the X-ray inspection apparatus 10 according to an embodiment of the present disclosure may convert a 3D inspection image into a 2D image to perform inspection, or may capture a 2D inspection image instead of a 3D image.

[0175] Figures 22 to 23 is a perspective view for explaining the operation of the second transportation device 30 according to an embodiment of the present disclosure.

[0176] refer to Figure 22 , the second transport device 30 can move the objects to be inspected that have completed the X-ray inspection from the carriers 150 and 250 loaded on the first conveyor 100 and the second conveyor 200. In this case, the second transport device 30 can move the carriers 150 and 250 to the sorting device 50 (see Figure 24 ).

[0177] For example, reference Figure 22 and Figure 23 , the second transport device 30 can move to the lower part of the carriers 150 and 250 set on the first conveyor 100 and the second conveyor 200 and move in the positive X-axis direction, while the carriers 150 and 250 are set on the upper part of the second transport device 30.

[0178] In this case, the second transport device 30 may simultaneously load and transport the two carriers 150 and 250 respectively disposed on the first conveying device 100 and the second transport device 200 .

[0179] On the other hand, it has been described above that the second transport device 30 moves the carrier 150, on which the object to be inspected 180 and the partition 154 are loaded, but is not limited to this. The second transport device 30 can be implemented in the form of directly receiving the object to be inspected 180 from the first conveying device 100 and the second conveying device 200 without the need for a carrier 150.

[0180] Figure 24 is a perspective view for explaining the operation of the classification device 50 according to the embodiment of the present disclosure.

[0181] refer to Figure 24 , the sorting device 50 may separate the objects to be inspected 180 and the partitions 154 loaded on the carrier 150 moved by the second transport device 30 from the carrier 150 .

[0182] The sorting device 50 may be implemented in various structures capable of moving the inspection object 180 and the partition plate 154. For example, the sorting device 50 may include a shape of a clip including protrusions as described above in the loading device 40, but is not limited thereto.

[0183] refer to Figure 24 The classification device 50 can take out the object to be inspected 180 and move the object to be inspected 180 to the non-defective product classification line 60 or the defective product classification line 70, and take out the partition 154 and move the partition 154 to the partition collecting device 90.

[0184] At the same time, the empty carrier 150 from which the object to be inspected 180 and the partition plate 154 are taken out can be moved to the carrier collecting device 80. Figure 19 Although not shown in the figure, a diverter conveyor may be provided between the position where the carrier 150 is transported by the second transport device 30 and the carrier collecting device 80. Therefore, the carrier 150 may be moved to the carrier collecting device 80.

[0185] The carrier collecting device 80 can move the collected carriers 150 to the position of the first transport device 20, and the partition collecting device 90 can move the collected partitions 154 to the position of the loading device 40. In this case, the loading device 40 can load new objects to be inspected and the collected partitions 154 on the collected carriers 150. Therefore, the carriers 150 and the partitions 154 can be reused when circulated in the X-ray inspection system 1.

[0186] On the other hand, the classification device 50 can classify the objects to be inspected 180 according to the X-ray inspection results and take them out into rows and columns corresponding to the X-ray inspection results of the objects to be inspected 180 .

[0187] The X-ray inspection apparatus 10 may generate an X-ray inspection image of the object to be inspected based on the X-rays received by the detector 12 , and determine whether the object to be inspected has defects based on the X-ray inspection image.

[0188] For example, when the object to be inspected is a secondary battery, the X-ray inspection device 10 can analyze the three-dimensional inspection image generated by the corner area of ​​the object to be inspected, and measure the alignment status, quantity and bending degree of each electrode in the positive and negative electrodes to identify whether the object to be inspected is within the normal range, and classify the object to be inspected as a non-defective product or a defective product based on the identification result.

[0189] Based on the X-ray inspection image, the sorting device 50 may arrange objects to be inspected 180 a determined to be non-defective products on the non-defective product sorting line 60 and objects to be inspected 180 b determined to be defective products on the defective product sorting line 70 .

[0190] Figure 25is a schematic diagram for explaining a conveying device according to another embodiment of the present disclosure.

[0191] refer to Figure 25 According to another embodiment of the present disclosure, the conveying devices 300 and 400 may be articulated robots capable of grasping and conveying an object to be inspected and rotating the object to be inspected through a plurality of joints.

[0192] In this case, the conveying devices 300 and 400 may include bases 310 and 410 with fixed positions, a plurality of connecting rods 311, 312, 313, 314, 315, 411, 412, 413, 414 and 415 connected in sequence, a plurality of joints 321, 322, 323, 324, 325, 326, 421, 422, 423, 424, 425 and 426 provided on each connecting portion, and wrist portions 330 and 430 for grasping objects 380 and 480 to be inspected.

[0193] The first joints 321 and 421 may connect the bases 310 and 410 and the first links 311 and 411, and the first links 311 and 411 may be connected to the bases 310 and 410 for rotation. The second joints 322 and 422 may connect the second links 312 and 412 for rotation relative to the first links 311 and 411, the third joints 323 and 423 may connect the third links 313 and 413 for rotation relative to the second links 312 and 412, and the fourth joints 324 and 424 may connect the fifth links 315 and 415 for rotation relative to the fourth links 314 and 414.

[0194] Meanwhile, the fifth joints 325 and 425 may connect the wrist portions 330 and 430 to rotate relative to the fifth links 315 and 415 , and the sixth joints 326 and 426 may connect the wrist portions 330 and 430 to rotate relative to the fifth links 315 and 415 around an axis different from the fifth joints 325 and 425 .

[0195] Each joint 321 , 322 , 323 , 324 , 325 , 326 , 421 , 422 , 423 , 424 , 425 , and 426 may receive a driving force through a motor (not shown) to perform a rotational motion.

[0196] The wrist portions 330 and 430 may include clamps 331 and 431 for clamping the objects 380 and 480 to be inspected.

[0197] Accordingly, the conveying devices 300 and 400 can perform a series of operations to convey the objects to be inspected 380 and 480 from the supply line 41 to the inspection position between the X-ray tube 11 and the detector 12, rotate the objects to be inspected 380 and 480 in various directions, and arrange the objects to be inspected 380 and 480 on the non-defective product classification line 60 or the defective product classification line 70 according to the inspection results.

[0198] Figure 26 FIG. 1 is a schematic diagram for explaining an inspection process of an X-ray inspection apparatus including a conveying apparatus according to another embodiment of the present disclosure.

[0199] Figure 26 1 shows a state in which three objects to be inspected 380, 480 and 580 are placed on the inspection position A at the same time. In this case, the conveying device may include a first conveying device, a second conveying device and a third conveying device that convey the objects to be inspected 380, 480 and 580, respectively. Each of the first to third conveying devices may be an articulated robot, such as Figure 20 As shown in .

[0200] refer to Figure 26 , the gripper 331 included in the wrist portion 330 of the first conveyor, the gripper 431 included in the wrist portion 430 of the second conveyor, and the gripper 531 included in the wrist portion 530 of the third conveyor can respectively grasp the objects to be inspected 380, 480, and 580, and convey partial areas of the objects to be inspected 380, 480, and 580 so as to be set at the inspection position A. In this case, the side surface areas of the objects to be inspected 380, 480, and 580 can be set at the inspection position A, and the corner areas of the objects to be inspected 380, 480, and 580 can be set at the inspection position A.

[0201] Therefore, the plurality of objects to be inspected 380 , 480 , and 580 conveyed by the first conveying device to the third conveying device can be inspected simultaneously using X-rays emitted by one X-ray tube 11 .

[0202] Figure 26 It is shown that three objects 380, 480 and 580 are set at the inspection position A at the same time, but the number of objects to be inspected set at the inspection position A is not limited to this. The conveying device can simultaneously inspect four or more objects to be inspected by changing the angle at which the objects to be inspected are set and the X-ray radiation area of ​​the inspection position.

[0203] Figure 27 shows a perspective view of an X-ray inspection system according to another embodiment of the present disclosure,

[0204] refer to Figure 27, the X-ray inspection system can transport the object to be inspected in the X-axis direction through the first transportation devices 20 - 1 and 20 - 2 and the second transportation devices 30 - 1 and 30 - 2 .

[0205] In addition, by Figure 1 By configuring the carrier collecting device 80 - 2 at the position of the partition collecting device 90 , an X-ray inspection system can be implemented, so that the carrier collecting operation can be quickly performed by the two carrier collecting devices 80 - 1 and 80 - 2 .

[0206] Based on this, it is possible to further simplify and implement the overall structure of the X-ray inspection system.

[0207] Although the preferred embodiments of the present disclosure have been shown and described above, the present disclosure is not limited to the above-mentioned specific embodiments. A person skilled in the art of the present disclosure may make various modifications without departing from the main points of the present disclosure as required by the claims, and these modifications should not be understood solely from the technical spirit or perspective of the present disclosure.

[0208] Industry Applicability

[0209] The present disclosure relates to an X-ray inspection apparatus and an X-ray inspection system including the X-ray inspection apparatus.

Claims

1. An X-ray inspection device, comprising: a first platform and a second platform, wherein at least one object to be inspected is respectively arranged on the first platform and the second platform; X-ray tube; a detector, the detector being arranged to face the X-ray tube; as well as a first conveyor and a second conveyor, the first conveyor and the second conveyor being arranged on both sides of an X-ray radiation path between the X-ray tube and the detector, the first conveyor and the second conveyor being configured to transport the first platform and the second platform to an inspection position between the X-ray tube and the detector, thereby enabling X-ray inspection of a plurality of objects to be inspected to be performed simultaneously, wherein each of the first conveying device and the second conveying device comprises: a conveying component configured to convey the platform on which the at least one object to be inspected is located along a conveying direction perpendicular to the X-ray radiation path; a first rotating component configured to rotate the at least one object to be inspected around an axis parallel to the X-ray radiation path; a second rotating member configured to rotate the at least one object to be inspected around an axis perpendicular to both the X-ray irradiation path and the conveying direction; and a horizontal moving part configured to move the platform closer to the inspection position, The platform includes: a side plate, a lower plate extending horizontally at a lower end of the side plate, and an upper plate extending horizontally at an upper end of the side plate, and The first rotating component is rotatably disposed on the lower plate of the platform.

2. The X-ray inspection apparatus according to claim 1, further comprising: a carrier accommodating at least one object to be inspected; as well as When a plurality of objects to be inspected are accommodated in the carrier, a partition is provided between each of the plurality of objects to be inspected. The transport device transports the carrier to the inspection position.

3. The X-ray inspection apparatus according to claim 1, wherein The detector includes a first detector; and a second detector, and The transport device transports the object to be inspected to a first inspection position between the X-ray tube and the first detector and a second inspection position between the X-ray tube and the second detector, respectively.

4. An X-ray inspection system comprising: a platform, on which an object to be inspected is placed; X-ray tube; a detector, the detector being arranged to face the X-ray tube; at least two carriers, each carrier being capable of accommodating at least one object to be inspected; a loading device, wherein the loading device loads the object to be inspected onto the carrier; a conveying device for conveying the at least two carriers and the object to be inspected to an inspection position between the X-ray tube and the detector; as well as a carrier collecting device, the carrier collecting device collecting the carriers to an initial position, and after the object to be inspected is separated from the carrier after completing the X-ray inspection, the object to be inspected is loaded into the initial position, wherein the conveying device conveys the at least two carriers to an inspection position between the X-ray tube and the detector in order to simultaneously perform X-ray inspection on the objects to be inspected respectively contained in the at least two carriers, wherein the conveying device: performing an operation of conveying the object to be inspected in a direction intersecting with an X-ray radiation path of the X-ray tube; as well as performing at least one of the following operations: an operation of rotating about the X-ray radiation path as an axis, or an operation of rotating about an axis perpendicular to both the X-ray radiation path and a transmission direction, wherein the transmission direction is perpendicular to the X-ray radiation path, The transmission device comprises: a first rotating component, configured to rotate the object to be inspected about the X-ray radiation path; a second rotating member that rotates the object to be inspected and the first rotating member around an axis that is perpendicular to both the X-ray radiation path and the conveying direction; a conveying member that conveys the object to be inspected, the first rotating member, and the second rotating member in the conveying direction; and a horizontal moving component that moves the object to be inspected, the first rotating component, and the second rotating component in the horizontal direction; The platform includes: a side plate, a lower plate formed by extending horizontally at the lower end of the side plate, and an upper plate formed by extending horizontally at the upper end of the side plate, and The first rotating component is rotatably disposed on the lower plate of the platform.

5. The X-ray inspection system according to claim 4, further comprising: a first transport device for loading a carrier of an object to be inspected on the conveying device; a classification device for classifying the object to be inspected according to an X-ray inspection result of the object to be inspected; as well as A second transport device is configured to move the carrier containing the object to be inspected from the conveying device to the sorting device when the X-ray inspection is completed.

6. The X-ray inspection system according to claim 5, wherein The detector generates an X-ray inspection image of the object to be inspected, and Based on the X-ray inspection image generated for the object to be inspected, the classification device arranges the object to be inspected that is determined to be a non-defective product on a non-defective product classification line and takes out the object to be inspected, arranges the object to be inspected that is determined to be a defective product on a defective product classification line and takes out the object to be inspected.

7. The X-ray inspection system of claim 5, further comprising: When a plurality of objects to be inspected are accommodated in the carrier, a partition is provided between each of the plurality of objects to be inspected; and a partition collecting device, wherein the partition collecting device collects the partitions, The sorting device takes out the separators loaded on the carrier and gives them to the separator collecting device, and the separator collecting device collects the separators to the position where the separators are loaded on the carrier.

Images