Oscilloscope probe clamp and circuit board testing robot

Abstract

The application provides an oscilloscope probe clamp and a circuit board testing robot, which comprises a flange support, a first probe component and a second probe component. A first probe of the first probe component is floatingly arranged on a second end of the flange support through a mounting structure, and the center of the first probe and the center of the flange support satisfy a concentric condition. The second probe component is arranged on the second end of the flange support and is arranged eccentrically relative to the center of the flange support. The second probe component comprises a second probe, a swing structure, a first moving structure and a second moving structure. The second probe is arranged on the swing structure and swings under the action of the swing structure. The second moving structure is connected with the first moving structure and moves in a first direction under the action of the first moving structure. The swing structure is connected with the second moving structure and moves in a second direction under the action of the second moving structure. The second direction is parallel to the length direction of the first probe, and the first direction is perpendicular to the second direction.

Description

Technical Field

[0001] This invention relates to the field of testing instrument technology, and in particular to an oscilloscope probe fixture and a circuit board testing robot. Background Technology

[0002] In the development of circuit boards (such as computer motherboards), in order to verify the rationality of the design, it is necessary to produce a prototype and conduct contact tests on it, that is, to test the solder joints of each component on the circuit board.

[0003] Currently, most testing processes involve manual point-to-point measurement of the contacts under test. Testers hold an oscilloscope probe and measure the contacts. To increase the detection range and ensure full contact between the probe and the contact, the tester needs to move the probe back and forth to adjust its position. For circuit boards with relatively simple circuits and few test signals, manual operation is sufficient. However, with the advancement of electronic technology, circuits are becoming increasingly complex, and the number of contacts under test on circuit boards is increasing. Manual circuit board testing methods are time-consuming, labor-intensive, and prone to errors, making them unsuitable for the competitive demands of rapid, high-quality production. Summary of the Invention

[0004] In view of this, according to one aspect of the present invention, an oscilloscope probe holder is provided to at least partially solve the above-mentioned technical problems.

[0005] The oscilloscope probe holder according to the present invention comprises:

[0006] Flange support, having a first end and a second end;

[0007] A first probe component includes a first probe and a mounting structure. The first probe is floatingly mounted on the second end via the mounting structure, and the center of the first probe is concentric with the center of the flange support.

[0008] The second probe component is located on the second end and is eccentrically disposed relative to the center of the flange support. The second probe component includes a second probe, a swing structure, a first moving structure, and a second moving structure. The second probe is disposed on the swing structure to swing under the action of the swing structure. The second moving structure is connected to the first moving structure to move along a first direction under the action of the first moving structure. The swing structure is connected to the second moving structure to move along a second direction under the action of the second moving structure.

[0009] Wherein, the second direction is parallel to the length direction of the first probe, and the first direction is perpendicular to the second direction.

[0010] Alternatively, a camera component may be provided on the flange support for taking pictures of the workpiece to be inspected.

[0011] Alternatively, the mounting structure includes a mounting cylinder, a mounting plate, and a floating connection component;

[0012] The mounting cylinder is disposed on the second end;

[0013] The mounting plate is connected to the mounting cylinder via the floating connecting component, so that its position relative to the mounting cylinder in the second direction is adjustable;

[0014] The first probe is mounted on the mounting plate.

[0015] Alternatively, the first probe component may further include a sensor, the mounting cylinder having a bottom wall, the sensor being disposed on the bottom wall, the first probe having a first contact end and a second contact end, the first contact end being used to abut against the object to be tested, and the second contact end abutting against the sensor.

[0016] Alternatively, the floating connection component includes a bolt, a nut, and an elastic element sleeved on the bolt. The bolt passes through the mounting cylinder and the mounting plate and is connected to the nut. The two ends of the elastic element abut against the mounting cylinder and the mounting plate, respectively.

[0017] Alternatively, the first moving structure includes a first bracket, a first driving assembly, and a first moving member. The first bracket is disposed on the mounting plate, the first driving assembly is disposed on the first bracket, and the first moving member is driven by the first driving assembly to move along the first direction. The second moving structure includes a second bracket, a second driving assembly, and a second moving member. The second bracket is disposed on the first moving member, the second driving assembly is disposed on the second bracket, and the second moving member is driven by the second driving assembly to move along the second direction.

[0018] Alternatively, the swing structure includes a swing drive and a transmission assembly. The swing drive is disposed on the second moving member, and the second probe is connected to the swing drive through the transmission assembly to swing under the drive of the swing drive.

[0019] Alternatively, the transmission assembly includes a belt drive assembly, a worm gear assembly, and a crank-rocker assembly. The belt drive assembly includes a driving wheel and a driven wheel. The driving wheel is mounted on the oscillating drive member. The driven wheel and the worm of the worm gear assembly are mounted on a first shaft. The worm wheel of the worm gear assembly and the crank of the crank-rocker assembly are mounted on a second shaft. The first shaft and the second shaft are intersected. The second probe is mounted on the rocker arm of the crank-rocker assembly.

[0020] Alternatively, the oscillating structure may further include a housing mounted on the second moving member, wherein the cranks of the belt drive assembly, the worm gear assembly, and the crank rocker assembly are all located within the housing.

[0021] According to another aspect of the present invention, a circuit board testing robot is also provided, including a robotic arm and an oscilloscope probe holder as described above, wherein the first end of the flange support is disposed on the robotic arm.

[0022] In this invention, a first probe component and a second probe component are simultaneously mounted on the flange support. A single robotic arm can detect a set of contacts. Furthermore, since the second probe component includes a swing structure, a first moving structure, and a second moving structure, the relative position between the second probe and the first probe can be changed. This allows it to adapt to situations where the grounding point of different contacts has a different orientation relative to the main contact. It can be combined with a robotic arm for circuit board testing, thereby greatly reducing the manpower cost of circuit board testing. Attached Figure Description

[0023] The above and other objects, features, and advantages of exemplary embodiments of the present invention will become readily apparent from the following detailed description taken in conjunction with the accompanying drawings. Several embodiments of the invention are illustrated in the drawings by way of example, not limitation, in which:

[0024] In the accompanying drawings, the same or corresponding reference numerals indicate the same or corresponding parts.

[0025] Figure 1 A perspective view (from one direction) of an oscilloscope probe holder according to an exemplary embodiment of the present invention;

[0026] Figure 2 A perspective view (from another direction) of an oscilloscope probe holder according to an exemplary embodiment of the present invention;

[0027] Figure 3 for Figure 1 A partial structural diagram of the camera component and its connected mounting structure;

[0028] Figure 4 for Figure 1 A schematic diagram of the structure of the first probe component;

[0029] Figure 5 for Figure 1 A schematic diagram of the structure of the second probe component;

[0030] Figure 6 for Figure 5 A schematic diagram of the swinging structure in the diagram;

[0031] Figure 7 This is a partial structural schematic diagram of a circuit board testing robot according to an exemplary embodiment of the present invention.

[0032] Explanation of the labels in the diagram:

[0033] 100. Camera component; 101. Flange support; 1011. First end; 1012. Second end; 110. Camera bracket; 120. Camera; 130. Camera light source; 140. Light source bracket; 200. First probe component; 201. First probe; 2011. Probe sleeve; 2012. Probe body; 2013. Probe cap; 220. Mounting structure; 221. Mounting cylinder; 222. Mounting plate; 223. Floating connection component; 224. Sensor; 300. Second probe component; 301. Second probe; 3011. Probe holder; 310. Swinging structure; 311. Swinging drive component; 31 2. Transmission assembly; 3121. Belt drive assembly; 3122. Worm gear assembly; 3123. Crank-rocker assembly; 31231. Connecting rod; 31232. Rocker arm; 31234. Probe support; 3124. First shaft; 3125. Second shaft; 313. Cover; 320. First moving structure; 321. First bracket; 322. First drive assembly; 323. First moving component; 324. Lead screw bearing seat; 330. Second moving structure; 331. Second bracket; 332. Second drive assembly; 333. Second moving component; 334. Guide optical axis; 335. Optical axis support; 400. Robotic arm. Detailed Implementation

[0034] To make the objectives, features, and advantages of this invention more apparent and understandable, the technical solutions of the embodiments of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this invention, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention.

[0035] The embodiments of the present invention will now be described in detail with reference to the accompanying drawings.

[0036] like Figure 1 and Figure 2 As shown, the oscilloscope probe holder according to the present invention includes a flange support 101, a first probe component 200, and a second probe component 300.

[0037] Flange support 101 has a first end 1011 and a second end 1012, as follows: Figure 7As shown, the first end 1011 is used to connect to the end flange of the robotic arm 400, and the other end is connected to the mounting cylinder 221. A camera component 100 can also be installed on the flange support 101, which is used to photograph the workpiece to be inspected. (See also...) Figure 3 The camera component 100 includes a camera bracket 110, a camera 120, a camera light source 130, and a light source bracket 140. The camera bracket 110 is connected to the flange support 101 by fasteners such as screws. The camera 120 is fixed on the camera bracket 110. The light source bracket 140 is connected to the first probe component 200. The camera light source 130 is connected to the light source bracket 140. The sensor 224 of the light source bracket 140 and the first probe component 200 is fixed on the mounting cylinder 221.

[0038] See also Figure 4 The first probe component 200 includes a first probe 201 and a mounting structure 220. The first probe 201 is floatingly mounted on the second end 1012 through the mounting structure 220, and the center of the first probe 201 and the center of the flange support 101 satisfy the concentricity condition. That is, the first probe 201 and the flange support 101 are concentrically mounted within the tolerance range.

[0039] Here, in order to achieve the floating setting of the first probe 201, the mounting structure 220 includes a mounting cylinder 221, a mounting plate 222, and a floating connecting component 223. The mounting cylinder 221 is disposed on the second end 1012 (see Figure 2 The mounting plate 222 is connected to the mounting cylinder 221 via a floating connecting component 223, so that its position relative to the mounting cylinder 221 in a second direction is adjustable. The second direction is as follows: Figure 4 In the Z direction, i.e., the vertical direction, the first probe 201 is mounted on the mounting plate 222, so that the position of the first probe 201 in the vertical direction can be adjusted. Here, the first probe 201 can be used as the main probe for testing.

[0040] Here, the first probe component 200 also includes a sensor 224. The mounting cylinder 221 has a bottom wall (not marked in the figure), the sensor 224 is disposed on the bottom wall, and the first probe 201 has a first contact end (i.e. the end away from the mounting plate 222) and a second contact end (i.e. the end connected to the mounting plate 222). The first contact end is used to abut against the object to be tested, and the second contact end abuts against the sensor 224.

[0041] Here, the floating connection component 223 may include a bolt, a nut, and an elastic element sleeved on the bolt. The elastic element may be a common spring. After the bolt passes through the mounting cylinder 221 and the mounting plate 222, it is connected to the nut. The two ends of the elastic element abut against the mounting cylinder 221 and the mounting plate 222 respectively, so as to realize the floating connection between the mounting plate 222 and the mounting cylinder 221.

[0042] In one embodiment of the present invention, the first probe 201 may include a probe sleeve 2011, a probe body 2012, and a probe cap 2013. The lower end face of the sensor 224 can be mounted to the bottom wall of the mounting cylinder 221 by screws. The outer cylindrical surface of the mounting plate 222 and the inner cylindrical surface of the mounting cylinder 221 are in clearance fit. The floating connecting component 223 connects the mounting plate 222 and the mounting cylinder 221. Specifically, the floating connecting component 223 consists of a bolt and nut and an elastic element sleeved on the bolt. The bolt passes through the mounting cylinder 221 and the mounting plate 222. The two ends of the elastic element abut against the mounting cylinder 221 and the mounting plate 222, respectively. The nut is tightened from the bottom of the mounting cylinder 221 to compress the elastic element, so that the upper end face of the sensor 224 just contacts the probe sleeve 2011. The probe sleeve 2011 passes through the center hole of the mounting plate 222 to form a transition fit and is connected to the mounting plate 222 by fasteners such as screws. The probe body 2012 is mounted on the probe sleeve 2011. The probe cap 2013 is installed at the end of the probe sleeve 2011 through internal thread engagement with the external thread of the probe sleeve 2011 and is tightened to press the probe body 2012 into the probe sleeve 2011. During detection, after the probe body 2012 contacts the part to be tested (such as the motherboard), a certain contact force is applied, which is transmitted to the sensor 224 through the probe sleeve 2011.

[0043] See also Figure 5 The second probe component 300 is located on the second end 1012 and is eccentrically positioned relative to the center of the flange support 101 (see...). Figure 2 The second probe component 300 includes a second probe 301, a swing structure 310, a first moving structure 320, and a second moving structure 330. The second probe 301 is disposed on the swing structure 310 to swing under the action of the swing structure 310; the second moving structure 330 is connected to the first moving structure 320 to move along a first direction under the action of the first moving structure 320, such that... Figure 5 The X direction; the swing structure 310 is connected to the second moving structure 330 so that it can move along the second direction under the action of the second moving structure 330, the second direction being as follows: Figure 5 The second direction is parallel to the length direction of the first probe 201, and perpendicular to it. In other words, the first and second directions are the X-axis and Z-axis directions in the spatial coordinate system, respectively. Here, the second probe 301 can be used as a grounding probe.

[0044] Here, the first moving structure 320 includes a first bracket 321, a first drive assembly 322, and a first moving member 323. The first bracket 321 is mounted on the mounting plate 222, the first drive assembly 322 is mounted on the first bracket 321, and the first moving member 323 is driven by the first drive assembly 322 to move along a first direction. The first drive assembly 322 can be a lead screw motor. The second moving structure 330 includes a second bracket 331, a second drive assembly 332, and a second moving member 333. The second bracket 331 is mounted on the first moving member 323, the second drive assembly 332 is mounted on the second bracket 331, and the second moving member 333 is driven by the second drive assembly 332 to move along a second direction. The second drive assembly 332 can also be a lead screw motor.

[0045] Specifically, the first drive assembly 322 is mounted on the first bracket 321, and two first moving parts 323 (which can be common guide rail and slider combinations) are mounted side by side on the mounting plate 222. A lead screw bearing seat is mounted on the first moving parts 323, and the end of the lead screw of the first drive assembly 322 passes through the bearing seat hole. The second bracket 331 is disposed on the first moving parts 323, so that the first drive assembly 322 can drive the second bracket 331 to move along the guide rail of the first moving parts 323. The second drive assembly 332 is mounted on the second bracket 331, and two guide optical shafts 334 are clamped and mounted on the second bracket 331 through two optical shaft supports 335. The second moving part 333 is connected to the guide optical shafts 334 and the lead screw of the second drive assembly 332.

[0046] See also Figure 5 and Figure 6 The swing structure 310 includes a swing drive 311 and a transmission assembly 312. The swing drive 311 is disposed on the second moving member 333. The second probe 301 is connected to the swing drive 311 through the transmission assembly 312 so as to swing under the drive of the swing drive 311.

[0047] Here, the transmission assembly 312 includes a belt drive assembly 3121, a worm gear assembly 3122, and a crank-rocker assembly 3123. The belt drive assembly 3121 includes a driving wheel and a driven wheel. The driving wheel is mounted on the oscillating drive member 311. The driven wheel and the worm of the worm gear assembly 3122 are mounted on a first shaft 3124. The worm of the worm gear assembly 3122 and the crank of the crank-rocker assembly 3123 are mounted on a second shaft 3125. The first shaft 3124 and the second shaft 3125 are intersected. The second probe 301 is mounted on the rocker arm 31232 of the crank-rocker assembly 3123.

[0048] Here, the swing structure 310 also includes a cover 313, which is mounted on the second moving member 333. The cranks of the belt drive assembly 3121, the worm gear assembly 3122, and the crank rocker assembly 3123 are all located inside the cover 313. In this way, the cranks of the belt drive assembly 3121, the worm gear assembly 3122, and the crank rocker assembly 3123 can be protected, and the motion noise can also be reduced.

[0049] Specifically, the second moving member 333 serves as the mounting plate for the swing structure 310 and is connected to the power output shaft of the second drive assembly 332, allowing the swing structure 310 and the second probe 301 to be driven by the second drive assembly 332. The swing drive member 311 is mounted on the second moving member 333 and can be a common DC motor. The swing drive member 311 drives the driven wheel of the belt drive assembly 3121 via the driving wheel of the belt drive assembly 3121. The driven wheel of the belt drive assembly 3121 is coaxially fixed to the worm of the worm gear assembly 3122. This shaft (i.e., the first shaft 3124) is mounted on the second moving member 333 via two bearing seats. The worm gear of the worm gear assembly 3122 is connected to the crank-rocker assembly. The crank of component 3123 is coaxially fixed to form a driven shaft (i.e., the second shaft 3125); one end of the probe support 31234 is hinged to the second moving component 333 through a hinge point; the rocker arm 31232 of the crank rocker assembly 3123 is installed at the other end of the probe support 31234 and can rotate around the hinge point; the probe seat 3011 is fixed on the rocker arm 31232 of the crank rocker assembly 3123, and the second probe 301 is installed on the probe seat 3011; one end of the connecting rod 31231 of the crank rocker assembly 3123 is connected to the crank, and the other end is connected to the rocker arm 31232; the cover 313 is installed on the second moving component 333 and covers the belt drive assembly 3121, the worm gear assembly 3122, and the crank of the crank rocker assembly 3123. Thus, the second drive assembly 332 drives the worm of the worm gear assembly 3122 to rotate via the belt drive assembly 3121. The worm of the worm gear assembly 3122 drives the worm wheel of the worm gear assembly 3122 and the crank of the crank rocker assembly 3123 to rotate. The crank of the crank rocker assembly 3123 drives the connecting rod 31231. The connecting rod 31231 pulls the rocker arm 31232 and the second probe 301 to swing to both sides to a certain angle. The rocker arm 31232 is then stopped by the probe support 31234, achieving a limit. At this time, the pulleys (the driving and driven pulleys of the belt drive assembly 3121) slip, preventing the second drive assembly 332 from stalling. Furthermore, due to the self-locking nature of the worm gear assembly 3122 transmission, only the second drive assembly 332 can drive the second probe 301 to swing; the second probe 301 cannot move freely.

[0050] It should be understood that, in order to limit the rocker arm 31232, the probe support 31234 has a slot. The rocker arm 31232 includes a first rod part and a second rod part. The first rod part and the second rod part are connected to make the rocker arm 31232 as a whole T-shape. The middle part of the first rod part is hinged to the probe support 31234, and the end of the second rod part away from the first rod part is fixedly connected to the probe seat 3011.

[0051] The oscilloscope probe holder of the present invention can be used as an end effector and installed on different devices, depending on actual needs. For example, the oscilloscope probe holder can be used on a collaborative robot.

[0052] According to another aspect of the present invention, a circuit board testing robot is also provided, such as... Figure 7 As shown, it includes a robotic arm 400 and an oscilloscope probe holder as described above, in conjunction with reference to [reference needed]. Figure 2 The first end 1011 of the flange support 101 is mounted on the robotic arm 400. Since the second probe component 300 can drive the second probe 301 to move horizontally, vertically, and swing at the root of the second probe 301, and since the first probe 201 and the flange support 101 are concentrically mounted within the tolerance range, the second probe 301 can complete the circumferential movement around the first probe 201 by rotating the end of the robotic arm 400.

[0053] The oscilloscope probe holder according to the present invention can be combined with a robotic arm 400 for circuit board testing, thereby greatly reducing the labor cost of circuit board testing. According to the oscilloscope probe holder of the present invention, since the first probe component 200 and the second probe component 300 are simultaneously clamped on the flange support 101, a single robotic arm can perform the detection of a set of contacts. Furthermore, since the second probe component 300 includes a swing structure 310, a first moving structure 320, and a second moving structure 330, the relative position between the second probe 301 and the first probe 201 can be changed, thereby adapting to situations where the grounding point of different contacts has different orientations relative to the main contact.

[0054] Furthermore, according to the oscilloscope probe holder of the present invention, based on the design of the camera component 100, it is possible to take pictures of the object to be tested, which is beneficial for image recognition and matching, and thus accurately determine the relative position of the probe and the contact to be tested.

[0055] In the description of this invention, it should be understood that the orientation or positional relationship indicated by directional terms is generally based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing this invention and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on the scope of protection of this invention; the directional terms "inner" and "outer" refer to the inner and outer contours relative to the outline of each component itself.

[0056] For ease of description, spatial relative terms such as "above," "over," "on the upper surface of," and "above" are used herein to describe the spatial positional relationship between one or more components or features shown in the figures and other components or features. It should be understood that spatial relative terms include not only the orientation of the component as depicted in the figures but also different orientations during use or operation. For example, if the components in the figures are inverted as a whole, "above" or "above other components or features" will include cases where the component is "below" or "under" other components or features. Thus, the exemplary term "above" can include both "above" and "below." Furthermore, these components or features may also be positioned at other different angles (e.g., rotated 90 degrees or other angles), and this document intends to include all such cases.

[0057] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the scope of exemplary embodiments according to the invention. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms “comprising” and / or “including” are used in this specification, they indicate the presence of features, steps, operations, parts, components, and / or combinations thereof.

[0058] It should be noted that the terms "first," "second," etc., used in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in sequences other than those illustrated or described herein.

[0059] The present invention has been described through the above embodiments. However, it should be understood that the above embodiments are for illustrative purposes only and are not intended to limit the invention to the scope of the described embodiments. Furthermore, those skilled in the art will understand that the present invention is not limited to the above embodiments, and many more variations and modifications can be made based on the teachings of the present invention, all of which fall within the scope of protection claimed by the present invention. The scope of protection of the present invention is defined by the appended claims and their equivalents.

Claims

1. An oscilloscope probe holder, characterized in that, include: Flange support, having a first end and a second end; The first probe component includes a first probe and a mounting structure. The first probe is floatingly mounted on the second end through the mounting structure, and the center of the first probe and the center of the flange support satisfy the concentricity condition. as well as The second probe component is located on the second end and is eccentrically disposed relative to the center of the flange support. The second probe component includes a second probe, a swing structure, a first moving structure, and a second moving structure. The second probe is disposed on the swing structure to swing under the action of the swing structure. The second moving structure is connected to the first moving structure to move along a first direction under the action of the first moving structure. The swing structure is connected to the second moving structure to move along a second direction under the action of the second moving structure. Wherein, the second direction is parallel to the length direction of the first probe, and the first direction is perpendicular to the second direction; The second moving structure includes a second support, a second drive assembly, and a second moving member. The second drive assembly is disposed on the second support, and the second moving member is driven by the second drive assembly to move along the second direction. The swing structure includes a swing drive and a transmission assembly. The swing drive is mounted on the second moving member. The second probe is connected to the swing drive through the transmission assembly so that it swings under the drive of the swing drive.

2. The oscilloscope probe holder according to claim 1, characterized in that, A camera component is provided on the flange support, and the camera component is used to take pictures of the part to be inspected.

3. The oscilloscope probe holder according to claim 1 or 2, characterized in that, The mounting structure includes a mounting cylinder, a mounting plate, and a floating connection component; The mounting cylinder is disposed on the second end; The mounting plate is connected to the mounting cylinder via the floating connecting component, so that its position relative to the mounting cylinder in the second direction is adjustable; The first probe is mounted on the mounting plate.

4. The oscilloscope probe holder according to claim 3, characterized in that, The first probe component further includes a sensor. The mounting cylinder has a bottom wall, and the sensor is disposed on the bottom wall. The first probe has a first contact end and a second contact end. The first contact end is used to abut against the object to be tested, and the second contact end abuts against the sensor.

5. The oscilloscope probe holder according to claim 3, characterized in that, The floating connection component includes a bolt, a nut, and an elastic element sleeved on the bolt. The bolt passes through the mounting cylinder and the mounting plate and is connected to the nut. The two ends of the elastic element abut against the mounting cylinder and the mounting plate, respectively.

6. The oscilloscope probe holder according to claim 3, characterized in that, The first movable structure includes a first bracket, a first drive assembly, and a first movable member. The first bracket is disposed on the mounting plate, the first drive assembly is disposed on the first bracket, the first movable member is driven by the first drive assembly to move along the first direction, and the second bracket is disposed on the first movable member.

7. The oscilloscope probe holder according to claim 1, characterized in that, The transmission assembly includes a belt drive assembly, a worm gear assembly, and a crank-rocker assembly. The belt drive assembly includes a driving wheel and a driven wheel. The driving wheel is mounted on the oscillating drive member. The driven wheel and the worm of the worm gear assembly are mounted on a first shaft. The worm wheel of the worm gear assembly and the crank of the crank-rocker assembly are mounted on a second shaft. The first shaft and the second shaft are intersected. The second probe is mounted on the rocker arm of the crank-rocker assembly.

8. The oscilloscope probe holder according to claim 7, characterized in that, The swing structure also includes a cover, which is mounted on the second moving member. The cranks of the belt drive assembly, the worm gear assembly, and the crank rocker assembly are all located inside the cover.

9. A circuit board testing robot, comprising a robotic arm, characterized in that, It also includes an oscilloscope probe holder as described in any one of claims 1 to 8, wherein the first end of the flange support is disposed on the robotic arm.

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