Methods, systems, electronic devices, and storage media for heavy metal ion detection

Abstract

The application discloses a method, a system, an electronic device and a storage medium for heavy metal ion detection. The method for heavy metal ion detection comprises the following steps: in the process of detecting heavy metal ions by an electrochemical analysis method, optical analysis modal information of a to-be-detected substance is acquired; electrochemical analysis modal information of the to-be-detected substance is acquired; and characteristic information of the to-be-detected substance is determined according to the optical analysis modal information and the electrochemical analysis modal information, wherein the to-be-detected substance comprises at least two kinds of heavy metal ions, and the characteristic information comprises type information and concentration information of the heavy metal ions in the to-be-detected substance. The optical analysis modal information and the electrochemical analysis modal information in the to-be-detected substance can be acquired simultaneously, the double-modal information is verified and calculated mutually, qualitative and quantitative analysis of multiple ions in the to-be-detected substance can be performed in situ, simply and quickly, and the problem that the traditional electrochemical analysis method is interfered by external environment or human factors and thus has poor detection precision is overcome.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of heavy metal detection, and in particular to a method and system for detecting heavy metal ions, an electronic device and a storage medium. BACKGROUND

[0002] Heavy metal ion pollution in the ocean has become one of the global environmental problems. Due to the vast area, large amount of water and great variety of the ocean, heavy metal ion pollution detection has become a key step for controlling and managing the quality of the marine environment. At present, the traditional detection methods of heavy metals mainly include atomic absorption method, inductively coupled plasma mass spectrometry, atomic fluorescence spectrometry and electrochemical analysis method, etc. However, these methods have the problems of complicated detection steps, long detection time, poor detection precision, large volume of detection electronic equipment and high cost, and cannot simultaneously detect multiple heavy metal ions in situ. How to simply, accurately and simultaneously detect multiple heavy metal ions in situ is particularly important. SUMMARY

[0003] The technical problem to be solved by the present application is to provide a method and system for detecting heavy metal ions, an electronic device and a storage medium, which can qualitatively and quantitatively analyze multiple ions in a test object in situ, simply and quickly, and overcome the problem of poor detection precision caused by external environmental or human factors interference in the traditional electrochemical analysis method.

[0004] To solve the above technical problems, the present application adopts the following technical solutions:

[0005] A method for detecting heavy metal ions, comprising the following steps: obtaining optical analysis modal information of a test object during detection of heavy metal ions by an electrochemical analysis method; obtaining electrochemical analysis modal information of the test object during detection of heavy metal ions by the electrochemical analysis method; and determining characteristic information of the test object according to the optical analysis modal information and the electrochemical analysis modal information, wherein the test object includes at least two kinds of heavy metal ions, and the characteristic information includes type information and concentration information of the heavy metal ions in the test object.

[0006] A system for detecting heavy metal ions includes an electrochemical system, an optical system, and a processing device. The electrochemical system includes an electrochemical workstation, a working electrode, and a container. The container holds an analyte containing at least two heavy metal ions. The working electrode employs an optical sensor with a conductive layer on its surface. The electrochemical workstation applies a voltage to the working electrode to deposit or dissolve heavy metal ions in the conductive layer. The optical system includes a light source and a light signal processing device. The light signal emitted by the light source passes through the optical sensor to form a feedback light signal. The light signal processing device analyzes the feedback light signal. The processing device acquires optical analytical mode information of the analyte through the electrochemical system and electrochemical analytical mode information through the optical system, and determines the characteristic information of the analyte based on the optical and electrochemical analytical mode information, wherein the characteristic information includes information on the type and concentration of heavy metal ions.

[0007] An electronic device for detecting heavy metal ions includes a processor and a memory storing computer program instructions; the processor executes the computer program instructions to implement the above-described method for detecting heavy metal ions.

[0008] A computer-readable storage medium storing computer program instructions, which, when executed by a processor, constitute the above-described method for detecting heavy metal ions.

[0009] The beneficial technical effects of the present invention are as follows: The above-mentioned method for detecting heavy metal ions can simultaneously acquire optical analysis mode information and electrochemical analysis mode information in the analyte. By mutually supplementing and verifying the calculations through dual-mode information, it is possible to perform qualitative and quantitative analysis of multiple ions in the analyte in situ, simply and quickly. This overcomes the problem of poor detection accuracy caused by interference from external environment or human factors in traditional electrochemical analysis methods, and can acquire high-precision detection data in real time. Attached Figure Description

[0010] Figure 1 This is a schematic flowchart of the method for heavy metal ion detection according to the present invention;

[0011] Figure 2 This is a schematic diagram of the system for heavy metal ion detection according to the present invention;

[0012] Figure 3 (a) in the figure shows the curves relating potential change and electrochemical response during the electrochemical detection of lead ions. Figure 3 (b) represents the spectral wavelength response and the first derivative of the spectral wavelength response during the electrochemical detection of lead ions.

[0013] Figure 4 (a) is a potential change and electrochemical response corresponding relationship curve in the process of electrochemical detection of copper ions, Figure 4 (b) is a spectral wavelength response and a first derivative of the spectral wavelength response in the process of electrochemical detection of copper ions;

[0014] Figure 5 (a) is a potential change curve in the process of electrochemical detection of lead ions and copper ions, Figure 5 (b) is a spectral wavelength response and a first derivative of the spectral wavelength response in the process of electrochemical detection of lead ions and copper ions. DETAILED DESCRIPTION

[0015] In order to make ordinary skilled in the art more clearly understand the purpose, technical solution and advantages of the present application, the present application is further described below in conjunction with the drawings and examples.

[0016] The present application provides a method for detecting heavy metal ions. As shown in the figure, in an embodiment of the present application, the method for detecting heavy metal ions comprises the following steps: Figure 1

[0017] S10, obtaining optical analysis modal information of a to-be-detected substance in the process of detecting heavy metal ions by electrochemical analysis method;

[0018] S20, obtaining electrochemical analysis modal information of the to-be-detected substance in the process of detecting heavy metal ions by electrochemical analysis method;

[0019] S30, determining characteristic information of the to-be-detected substance according to the optical analysis modal information and the electrochemical analysis modal information.

[0020] In the present embodiment, anodic differential pulse stripping voltammetry is used to detect heavy metal ions; of course, in other embodiments, square wave stripping voltammetry, linear sweep voltammetry, cyclic voltammetry can also be used to detect heavy metal ions.

[0021] The to-be-detected substance includes at least two heavy metal ions, and in the present application, the heavy metal ions can be lead ions (Pb 2+ ), mercury ions (Hg 2+ ), cadmium ions (Cd 2+ ), chromium ions (Cr 3+ , Cr 6+ ), nickel ions (Ni 2+ ), barium ions (Ba 2+ ), copper ions (Cu 2+ ), zinc ions (Zn 2+ ), silver ions (Ag + ), cobalt ions (Co​2+ ), manganese ions (Mn 2+ ), iron ions (Fe 2+ , Fe 3+ ), thallium ions (Tl + ), bismuth ions (Bi 3+ ) and other different metal ions.

[0022] The optical analysis modal information is spectral information, the spectral information includes surface plasmon resonance (SPR) signals and first-order derivatives thereof, the electrochemical analysis modal information includes electrochemical stripping potentials and electrochemical response currents, and the characteristic information includes type information of heavy metal ions in the to-be-detected object and concentration information of the heavy metal ions.

[0023] Different heavy metal ions exhibit specific voltage stripping peaks when electrochemically characterized to obtain electrochemical analysis modal of the to-be-detected object, and the heavy metal ions undergo redox reactions in the electrochemical stripping process, affect the microenvironment change around the surface of the optical sensor, thereby changing the spectral signal to obtain the optical analysis modal simultaneously, and heavy metal ions of different concentrations exhibit differentiated current intensities, and the spectral signal caused by the changed microenvironment change has particularity. Based on this, the step S30 further includes:

[0024] S31, determining type information of the heavy metal ions according to the first-order derivative of the surface plasmon resonance signal and the electrochemical stripping potential;

[0025] S32, determining concentration information of the heavy metal ions according to the light intensity offset size of the surface plasmon resonance signal and the size of the electrochemical response current, or determining the concentration information of the heavy metal ions according to the light wavelength offset size of the surface plasmon resonance signal and the size of the electrochemical response current.

[0026] The method for detecting heavy metal ions in the embodiment can simultaneously obtain optical analysis modal information and electrochemical analysis modal information of the to-be-detected object, and through mutual complementation and verification calculation of the dual modal information, can in situ, simply and quickly analyze multiple ions in the to-be-detected object qualitatively and quantitatively, and overcome the problem that the traditional electrochemical analysis method is interfered by external environment or human factors to cause poor detection precision, and can obtain high-precision detection data in real time.

[0027] The application provides a system for detecting heavy metal ions. Figure 2As shown, in one embodiment of the present application, the system for heavy metal ion detection comprises an electrochemical system, an optical system and a processing device; the electrochemical system comprises an electrochemical workstation 5, a working electrode 4 and a container 3; the container 3 is used to contain the to-be-tested substance, and the to-be-tested substance comprises at least two heavy metal ions; the working electrode 4 adopts an optical sensor, and a conductive layer is plated on the surface of the optical sensor, so that the metal ions can be reduced to the elemental substance and deposited on the surface of the working electrode 4, causing the surface plasmon resonance wave of the conductive layer to change on the surface of the optical sensor, and after the electrochemical workstation 5 is powered on, there are enough electrons on the surface of the conductive layer; the electrochemical workstation 5 is used to apply a voltage to the working electrode, so that the heavy metal ions are deposited or dissolved on the conductive layer of the working electrode 4; the optical system comprises a light source 1 and a light signal processing device 6; the light signal emitted by the light source 1 forms a feedback light signal after passing through the optical sensor; the light signal processing device 6 is used to analyze the feedback light signal; the processing device is used to obtain optical analysis mode information of the to-be-tested substance through the electrochemical system, and to obtain electrochemical analysis mode information of the to-be-tested substance through the optical system, and to determine characteristic information of the to-be-tested substance according to the optical analysis mode information and the electrochemical analysis mode information, wherein the characteristic information comprises type information of the heavy metal ions in the to-be-tested substance and concentration information of the heavy metal ions.

[0028] The system for heavy metal ion detection of the present embodiment uses the optical sensor plated with the conductive layer as the working electrode of the electrochemical system, which can not only transmit the light signal carrying the spectral characteristic data to the light signal processing device 6, but also transmit the electrical signal carrying the electrical characteristic data to the electrochemical workstation 5; the system for heavy metal ion detection can simultaneously generate electrochemical and optical dual-mode responses, and the dual-mode information can be verified and calculated mutually, so that the qualitative and quantitative analysis of multiple ions in the to-be-tested substance can be performed in situ, simply and quickly, and the problem of poor detection precision caused by the interference of external environment or human factors in the traditional electrochemical analysis method can be overcome, and high-precision detection data can be obtained in real time.

[0029] In a preferred embodiment of the present application, the optical sensor adopts a multimode fiber-single mode fiber interference device (belonging to an evanescent field excitation type optical fiber sensor), which can better transmit optical signal data, reduce the interference of external environment or human factors, and realize real-time, simple, and high-precision detection of heavy metal ions. Moreover, the optical sensor is a fiber probe type, has a very small size, and can be easily integrated into a space-limited object to be detected, and can be widely applied to many fields such as environmental detection, food safety, and industrial production, and has great development potential and market demand. In other embodiments, the optical sensor can adopt other evanescent field excitation type optical fiber sensors such as a multimode fiber-single mode fiber-multimode fiber interference device, a multimode fiber-no core fiber-multimode fiber interference device, a micro-nano fiber, and an inclined Bragg fiber grating; and the optical sensor can also adopt interference type optical fiber sensors such as a Fabry-Perot fiber device, a multimode fiber device, a multimode fiber-photonic crystal fiber-multimode fiber heterochiral device, a Bragg fiber grating, and a long period fiber grating.

[0030] In a preferred embodiment of the present application, the conductive layer of the optical sensor is a gold film plated on the surface of the optical sensor by a magnetron sputtering method. In other embodiments, the conductive layer can also be a metal film such as a silver film, a copper film, a palladium film, a platinum film, and the like, and the film forming method of the metal film can be magnetron sputtering, vacuum evaporation, ion beam deposition, chemical vapor deposition, electrochemical deposition, and self-assembled film, and the like.

[0031] In a preferred embodiment of the present application, the light source 1 adopts a visible light source, the optical signal processing device 6 adopts a spectrometer, and the electrochemical workstation 5 adopts an ion detection device. In order to better acquire data and transmit the data to the spectrometer and the ion detection device, a Y-type coupler 2 is used for connection in the present application, three ports of the Y-type coupler 2 are connected with the light source 1, the spectrometer, and the working electrode 4, and the ion detection device is connected with the working electrode 4 through conductive glue. In other embodiments, the light source 1 can also adopt a mid-infrared light source or a tunable laser; and the optical signal processing device can adopt an optical signal demodulator.

[0032] In a preferred embodiment of the present application, the ion detection device is further provided with an electrode clamp, and the ion detection device is connected with the working electrode 4 through the electrode clamp and the conductive glue.

[0033] In a preferred embodiment of the present application, the optical signal processing device selects a spectrometer with a wavelength range of 300-1000 nm, has a small volume, a light weight, and a higher degree of integrability.

[0034] In a preferred embodiment of the present application, the electrochemical system further comprises a counter electrode 8 and a reference electrode 7, and the electrochemical workstation 5 is connected to the counter electrode 8 and the reference electrode 7, respectively, so that the working electrode 4, the reference electrode 7 and the counter electrode 8 are simultaneously contacted with the object to be detected, forming a three-electrode system for detecting the ion concentration, and the heavy metal ions in the object to be detected are detected in optical and electrochemical dual modalities in real time. In order to better perceive and obtain the electrical characteristic data, the Ag / AgCl electrode is used as the reference electrode 7, and the Pt electrode is used as the counter electrode 8.

[0035] In a preferred embodiment of the present application, the ion detection device comprises a processor module, which is used as the processing device, i.e., the processor module in the ion detection device can determine the characteristic information of the object to be detected according to the optical analysis modality information and the electrochemical analysis modality information. In other embodiments, the processing device can also be a host computer connected to the ion detection device and the spectrometer.

[0036] The working process of the system for detecting heavy metal ions of the present application will be described below by taking the detection of lead ions (Pb 2+ ) and copper ions (Cu 2+ ) by using an anodic differential pulse stripping voltammetry as an example.

[0037] First, the cleaned working electrode 4, the reference electrode 7 and the counter electrode 8 are inserted into the container 3 containing the heavy metal ion solution (object to be detected), the optical path is connected as shown in FIG. 4, and the ion detection device is connected to the working electrode 4, the reference electrode 7 and the counter electrode 8. Figure 2

[0038] When detecting lead ions, the related electrochemical workstation parameters are set as follows: deposition potential -0.8 V, deposition time 100 s, standing time 10 s, and stripping voltage range -0.8- -0.1 V. Under the constant voltage -0.8 V for 100 s, the lead ions obtain electrons to undergo reduction reaction and become metal elements and are continuously deposited on the surface of the optical sensor metal film. Under the forward scanning voltage -0.8- -0.1 V, the metal elements continuously lose electrons to undergo oxidation reaction and are stripped from the surface of the metal film, and when the characteristic stripping peak potential of the lead ions is reached, the ordinate current of the electrochemical response appears a sharp peak, the optical sensor quickly detects and captures the change of the interface refractive index, and the entire electrochemical process is detected in real time. The optical sensor evanesces the light containing the plasmon resonance wave to the external environment outside the gold film, interacts with the heavy metal lead elements attached to the surface of the metal film, and causes the change of the interface refractive index, which can be displayed in the spectrometer.

[0039] As shown in FIG. 5, the working electrode 4 is connected to the ion detection device, the reference electrode 7 is connected to the ion detection device, and the counter electrode 8 is connected to the ion detection device. Figure 3 Figure 3 ​​(a) is the corresponding relation curve of potential change and electrochemical response in the process of lead ion electrochemical detection, -0.56V is the characteristic stripping peak potential of lead ion, at this time the stripping rate reaches the maximum and the current appears a sharp peak; Figure 3 (b) is the spectral wavelength response and the first derivative of the spectral wavelength response in the process of lead ion electrochemical detection, during the deposition process at constant potential -0.8V, the spectral wavelength first rapidly decreases and then slowly tends to be stable, at the characteristic stripping peak potential -0.56V of lead ion, the stripping rate reaches the maximum and the first derivative of the spectral wavelength response appears a sharp peak (corresponding to the electrochemical response).

[0040] When detecting copper ions, the related electrochemical workstation parameters are set as follows: deposition potential -0.2V, deposition time 100s, standing time 10s, and stripping voltage range -0.2-0.5V. The electrochemical response and optical response are as shown in Figure 4 Figure 4 (a) is the corresponding relation curve of potential change and electrochemical response in the process of copper ion electrochemical detection, the characteristic stripping peak potential of copper ion is 0.31V; Figure 4 (b) is the spectral wavelength response and the first derivative of the spectral wavelength response in the process of copper ion electrochemical detection, during the enrichment process at constant potential -0.2V, the wavelength first rapidly decreases (blue shift) and then slowly tends to be stable, during the stripping process at -0.2-0.5V, the wavelength changes in the opposite direction, i.e. continuously red shifts, at the characteristic stripping peak potential 0.31V of copper ion, the first derivative of the spectral response has a sharp peak (corresponding to the electrochemical response), indicating that the copper ion is continuously oxidized and separated from the surface of the optical sensor metal film, and the stripping rate is the fastest near the characteristic stripping peak potential.

[0041] When detecting a mixed solution containing lead ions and copper ions, the related electrochemical workstation parameters are set as follows: deposition potential -0.8V, deposition time 100s, standing time 10s, and stripping voltage range -0.8-0.5V. The electrochemical response and optical response are as shown in Figure 5 Figure 5 (a) is the electrochemical response curve in the process of electrochemical detection of lead ions and copper ions, the characteristic stripping peak potentials of lead ions and copper ions are -0.56V and 0.31V; Figure 5 (b) is the spectral wavelength response and the first derivative of the spectral wavelength response in the process of electrochemical detection of lead ions and copper ions, the first derivative of the response curve has two obvious sharp peaks, which can reflect the speed of the metal ion stripping rate, the first sharp peak corresponds to the maximum rate of lead ion stripping, and the second sharp peak corresponds to the maximum rate position of copper ion migration.

[0042] ​​The system for detecting heavy metal ions of the present application can also be used to detect multiple heavy metal ions in a dual mode under room temperature, heating, or cooling conditions, using electrochemical analysis methods such as square wave stripping voltammetry, linear sweep voltammetry, cyclic voltammetry, etc. Specifically, by setting different deposition potentials and stripping potential ranges, the first derivative of the wavelength or intensity change of the spectrum is calculated, and the different heavy metal ions are identified in combination with the electrochemical stripping potential. The wavelength or intensity change of the spectrum and the electrochemical response correspond to each other, and the different concentrations of heavy metal ions are identified in combination with the current size and wavelength or intensity drift size of the electrochemical response.

[0043] The present application also provides an electronic device for detecting heavy metal ions, the electronic device comprising a processor and a memory storing computer program instructions, wherein the memory is used to store various types of data to support operations on the electronic device, which can include instructions for operating any application or method on the electronic device, and application-related data. The memory can be implemented by one or more volatile or non-volatile storage electronic devices of any type or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic storage, flash memory, magnetic disk or optical disk. The processor can be one or more processors for controlling the overall operation of the electronic device, by calling and executing program instructions stored in the memory to complete the Figure 1 The various steps of the method for detecting heavy metal ions in the illustrated embodiments.

[0044] The present application also provides a computer readable storage medium having computer program instructions stored thereon, which, when executed by a processor, implement the method for detecting heavy metal ions as Figure 1 The method for detecting heavy metal ions in the illustrated embodiments.

[0045] The above description is only the preferred embodiments of the present application, and does not limit the present application in any form. Those skilled in the art can make various equivalent changes and improvements on the basis of the above-described embodiments, and any equivalent changes or modifications made within the scope of the claims shall fall within the protection scope of the present application.

Claims

1. A method for heavy metal ion detection, characterized in that, The method for detecting heavy metal ions comprises the following steps: S10, obtaining optical analysis modal information of a to-be-detected substance in the process of detecting heavy metal ions by an electrochemical analysis method; S20, obtaining electrochemical analysis modal information of the to-be-detected substance in the process of detecting heavy metal ions by the electrochemical analysis method; S30, determining characteristic information of the to-be-detected substance according to the optical analysis modal information and the electrochemical analysis modal information, wherein the to-be-detected substance comprises at least two kinds of heavy metal ions, and the characteristic information comprises type information and concentration information of the heavy metal ions in the to-be-detected substance; The optical analysis modal information comprises surface plasmon resonance signals and first-order derivatives thereof, the electrochemical analysis modal information comprises electrochemical stripping potentials and electrochemical response currents, and the step S30 further comprises the following steps: S31, determining the type information of the heavy metal ions according to the first-order derivatives of the surface plasmon resonance signals and the electrochemical stripping potentials; S32, determining the concentration information of the heavy metal ions according to the light intensity offset of the surface plasmon resonance signals and the size of the electrochemical response currents, or determining the concentration information of the heavy metal ions according to the light wavelength offset of the surface plasmon resonance signals and the size of the electrochemical response currents.

2. The method for detection of heavy metal ions according to any one of claims 1, characterized in that, The electrochemical analysis method comprises any one of square wave stripping voltammetry, linear sweep voltammetry, anodic differential pulse stripping voltammetry and cyclic voltammetry.

3. A system for heavy metal ion detection, characterized by, The system for detecting heavy metal ions comprises an electrochemical system, an optical system and a processing device; The electrochemical system comprises an electrochemical workstation, a working electrode and a container; the container is used for containing the to-be-detected substance, the to-be-detected substance comprises at least two kinds of heavy metal ions, the working electrode adopts an optical sensor with a conductive layer on the surface, and the electrochemical workstation is used for applying a voltage to the working electrode to make the heavy metal ions deposit or strip on the conductive layer of the working electrode; The optical system comprises a light source and a light signal processing device; the light signal emitted by the light source forms a feedback light signal after passing through the optical sensor; and the light signal processing device is used for analyzing the feedback light signal; The processing device is used for obtaining the optical analysis modal information of the to-be-detected substance by the electrochemical system, obtaining the electrochemical analysis modal information of the to-be-detected substance by the optical system, and determining the characteristic information of the to-be-detected substance according to the optical analysis modal information and the electrochemical analysis modal information, wherein the characteristic information comprises type information and concentration information of the heavy metal ions; The optical analysis modal information comprises surface plasmon resonance signals and first-order derivatives thereof, the electrochemical analysis modal information comprises electrochemical stripping potentials and electrochemical response currents, and the determination of the characteristic information of the to-be-detected substance according to the optical analysis modal information and the electrochemical analysis modal information comprises the following steps: determining the type information of the heavy metal ions according to the first-order derivatives of the surface plasmon resonance signals and the electrochemical stripping potentials; and determining the concentration information of the heavy metal ions according to the light intensity offset of the surface plasmon resonance signals and the size of the electrochemical response currents, or determining the concentration information of the heavy metal ions according to the light wavelength offset of the surface plasmon resonance signals and the size of the electrochemical response currents. The concentration information of the heavy metal ions is determined according to the light intensity offset of the surface plasmon resonance signal and the size of the electrochemical response current; or the concentration information of the heavy metal ions is determined according to the light wavelength offset of the surface plasmon resonance signal and the size of the electrochemical response current.

4. The system for heavy metal ion detection of claim 3, wherein, The optical sensor is an interference optical fiber sensor or an evanescent field excitation optical fiber sensor.

5. The system for heavy metal ion detection of claim 3 or 4, wherein, The conductive layer is a metal film, which is plated on the surface of the optical sensor by a film forming mode of magnetron sputtering, vacuum evaporation, ion beam deposition, chemical vapor deposition or electrochemical deposition.

6. The system for heavy metal ion detection of claim 3, wherein, The electrochemical workstation is an ion detection device, the optical signal processing device is a spectrometer, and the three ports of the Y-type coupler are connected with the light source, the spectrometer and the working electrode.

7. The system for heavy metal ion detection of claim 6, wherein, The electrochemical system further comprises a counter electrode and a reference electrode, and the ion detection device is connected with the counter electrode and the reference electrode.

8. An electronic device for detecting heavy metal ions, characterized by The electronic device comprises a processor and a memory storing computer program instructions; and the processor executes the computer program instructions to realize the method for heavy metal ion detection according to claim 1 or 2.

9. A computer-readable storage medium, characterized in that, The computer readable storage medium stores computer program instructions, and the computer program instructions are executed by the processor to realize the method for heavy metal ion detection according to claim 1 or 2.

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