Automated optical inspection apparatus for transistors

Abstract

The application relates to a transistor automatic optical detection device, which comprises a feeding part, a transfer part and a detection part; the feeding part is provided with a feeding station for clamping a material pipe by the transfer part, the detection part detects three detection surfaces of a transistor inside the material pipe from a first surface, a second surface and a third surface of the material pipe; the transfer part comprises a translation mechanism, a rotating mechanism and a clamping mechanism; the clamping mechanism clamps the material pipe located at the feeding station, the translation mechanism drives the clamping mechanism to translate between the feeding part and the detection part, and the rotating mechanism drives the clamping mechanism to switch between a horizontal plane and a vertical plane; the translation mechanism and the rotating mechanism are matched to sequentially send the first surface, the second surface and the third surface of the material pipe to the detection part. The first surface, the second surface and the third surface of the material pipe clamped by the clamping mechanism are continuously and sequentially sent to the detection part through the matching of the translation mechanism and the rotating mechanism, so that the preparation time of detection is saved, and the work efficiency is improved.

Description

Technical Field

[0001] This invention relates to transistor defect detection equipment, specifically an automated optical inspection device for transistors. Background Technology

[0002] Automated Optical Inspection (AOI) is a technology that uses optical principles to detect common defects in the appearance of products. AOI equipment automatically scans the product using a camera, captures images, compares the area to be inspected with acceptable parameters in a database, processes the images, identifies defects, and displays or marks these defects on a monitor or with automatic markers for repair personnel to fix.

[0003] When using AOI (Automated Optical Inspection) technology to inspect transistors, defects need to be detected on the leaded end face and both front and back surfaces. Current technology uses a rotating clamping assembly to hold the transistor and rotate it twice sequentially, sending each of the three surfaces to be inspected to the same inspection station to complete the defect detection. While this achieves automated optical inspection, it requires sending the inspected transistors to the unloading station before picking up new ones, resulting in low efficiency. Summary of the Invention

[0004] This invention addresses the problem of low efficiency in existing AOI equipment by providing a high-efficiency automated optical inspection device for transistors.

[0005] The technical solution of the present invention is as follows: An automated optical inspection device for transistors, used to inspect three surfaces of a transistor, the automated optical inspection device for transistors includes a loading unit, a transfer unit, and an inspection unit; wherein:

[0006] The feeding section is configured to store multiple stacked tubes, with transistors to be tested arranged side by side inside the tubes. The first, second, and third surfaces of the tubes are all transparent and face the three test surfaces of the transistors inside the tubes, respectively.

[0007] The feeding section is equipped with a feeding station for the transfer section to clamp the material tube, and the detection section is configured to detect the three surfaces to be detected of the transistor inside the material tube from the first, second and third transparent surfaces of the material tube respectively.

[0008] The transfer unit includes a translation mechanism, a rotation mechanism, and a clamping mechanism. The clamping mechanism is installed at the movable end of the rotation mechanism, and the rotation mechanism is installed at the movable end of the translation mechanism. The clamping mechanism is configured to clamp the material tube located at the loading station. The translation mechanism is configured to drive the clamping mechanism to translate between the loading unit and the inspection unit. The rotation mechanism is configured to drive the clamping mechanism to switch between the horizontal and vertical planes.

[0009] The translation mechanism and the rotation mechanism work together to send the first, second and third surfaces of the material tube to the inspection section in sequence.

[0010] By configuring a transfer unit that includes a translation mechanism, a rotation mechanism, and a clamping mechanism, the translation mechanism and the rotation mechanism work together to ensure that the first, second, and third surfaces of the material tube held by the clamping mechanism are continuously and sequentially sent to the inspection unit, thereby saving inspection preparation time and improving work efficiency.

[0011] Optionally, the detection unit includes a first detection component and a second detection component. The first detection component is used to detect the first surface and the third surface of the tube, respectively, and the second detection component is used to detect the second surface of the tube.

[0012] The inspection unit includes two inspection components. The first inspection component can inspect the first and third surfaces of the tube at the same height, while the second inspection component can inspect the second surface of the tube at a different height. The positions of the two inspection components can be adjusted and fixed before inspection, and they do not need to be readjusted during inspection, which can save inspection time.

[0013] Optionally, the first surface of the tube is opposite to the third surface, and the clamping mechanism includes a first clamping component and a second clamping component mounted opposite to the movable end of the rotating mechanism. The first clamping component and the second clamping component are respectively used to clamp a tube individually.

[0014] While the tube held by the first clamping assembly is being inspected on the third surface, the second clamping assembly clamps another tube from the loading station.

[0015] While the tube held by the second clamping assembly is being inspected on the third surface, the first clamping assembly clamps another tube from the loading station.

[0016] The clamping mechanism includes two clamping components. When one clamping component is holding a tube at the inspection station, the other clamping component clamps another tube from the loading station, realizing synchronous feeding of the two tubes and improving work efficiency.

[0017] Optionally, the transistor automated optical inspection device also includes a marking section located after the inspection section. The marking section is configured to mark the surface of the tube corresponding to the defective transistor. The marking section is provided with a transfer station for receiving the tube after inspection.

[0018] While the tube held by the first clamping assembly is being inspected on the first surface, the tube held by the second clamping assembly is in the transfer station.

[0019] When the tube held by the second clamping component is inspected on the first surface, the tube held by the first clamping component is in the transfer station.

[0020] By configuring a marking section, marks can be made on the surface of the tube corresponding to the defective transistor, which facilitates the subsequent processing of the defective transistor.

[0021] Optionally, the first detection component and the second detection component are spaced apart and positioned above the translation path of the translation mechanism;

[0022] When the material tube held by the first clamping component is moved to below the first detection component, the first detection component detects the first surface or the third surface of the material tube;

[0023] The rotating mechanism is used to drive the first clamping assembly to rotate 90°, so that the second surface of the tube rotates to the bottom of the second detection assembly, which is used to detect the second surface of the tube.

[0024] By setting the first detection component and the second detection component at intervals, the positions of the two detection components correspond to the clamping positions of each clamping component before and after rotation, which facilitates the detection of two adjacent surfaces of the material tube, namely the first surface and the second surface or the second surface and the third surface.

[0025] Optionally, the loading section includes a organizing component, a buffer component, and a transfer component, wherein,

[0026] The cache component is used to store multiple stacked material pipes;

[0027] The transfer component is used to remove the feed tube from the buffer component and place it into the straightening component;

[0028] The aligning assembly is used to receive the feed tube and position it at the loading station.

[0029] By temporarily storing the material tube using the caching component, the waiting time of the transfer component can be reduced, and the transfer efficiency of the transfer component can be improved. By straightening the material tube using the straightening component, the material tube can be accurately positioned at the feeding position, which can avoid the transfer error of the transfer component and reduce the failure rate.

[0030] Optionally, the organizing component is provided with two bearing seats located on both sides of the feeding station. The two bearing seats are provided with a positioning step on the first side along the translation direction of the translation mechanism, and the two bearing seats are provided with a top block that can move relative to the positioning step on the second side along the translation direction of the translation mechanism.

[0031] The grading assembly also includes a reference plate, a grading plate, and a grading plate drive. The reference plate and the grading plate are located on the outer side of the two bearing seats along the direction perpendicular to the translation of the translation mechanism. The grading plate is mounted on the grading plate drive, which drives the grading plate to move relative to the reference plate.

[0032] By using the positioning steps and reference plate as a reference, and by moving the top block and the leveling plate, the material tube is leveled and positioned on the horizontal plane, making it easy for the transfer unit to accurately grasp it.

[0033] Optionally, the marking unit includes a marking unit assembly, a marking unit translation module, a material conveyor line, a material support assembly, and a lifting assembly;

[0034] The lifting assembly is installed outside the material pipe transport line, and the material support assembly is installed above the material pipe transport line; the material pipe transport line is configured to receive and transport the material pipes transmitted from the transfer unit, the transfer station is set at the feed end of the material pipe transport line, the lifting assembly is configured to lift the material pipes from the material pipe transport line to the material support assembly, and the material support assembly is configured to support and position the material pipes.

[0035] The marking device translation module is installed above the material support assembly; the marking device group is installed on the movable end of the marking device translation module, and the marking device translation module is configured to move the marking device group to the material support assembly; the marking device group includes multiple marking devices and marking device lifting components, the marking devices are installed on the movable end of the marking device lifting components, and the marking device lifting components drive their respective marking devices to rise and fall and mark on the material tube.

[0036] The lifting assembly lifts the material tube from the material tube transport line to the material support assembly. The marking assembly is moved above the material support assembly by the marking translation module. The marking lifting component drives the marking device to rise and fall to achieve marking on the material tube. During marking, the material tube will not deviate, and the marking device can mark normally.

[0037] Optionally, the transistor automated optical inspection device also includes a receiving unit, which is installed at the post-marking station and is configured to collect material tubes according to the inspection results of the inspection unit.

[0038] By classifying and collecting the marked tubes in the receiving department, timely classification of the tubes after testing can be achieved, thus improving work efficiency.

[0039] Optionally, the receiving section includes an adsorption assembly, an adsorption assembly lifting component, an adsorption assembly translation component, a good product receiving box, and an NG product receiving box;

[0040] The adsorption component is installed on the movable end of the adsorption component lifting part, and the adsorption component lifting part is installed on the movable end of the adsorption component translation part; the adsorption component translation part is configured to drive the adsorption component lifting part to translate above the good product receiving box or the NG product receiving box, and the adsorption component lifting part is configured to drive the adsorption component to lift.

[0041] The adsorption assembly includes multiple suction cup groups and suction cup group lifting components. Each suction cup group is raised and lowered by its respective suction cup group lifting component.

[0042] The adsorption component adsorbs the material tubes, and the adsorption component lifting and translating components move the adsorption component to the top of the good product receiving box or the NG product receiving box. Then, the tested material tubes are collected in the corresponding receiving boxes, thus realizing the classified collection of material tubes.

[0043] Optionally, pins for sealing the tube are provided at both ends along its length. Two adjacent transistors inside the tube abut against each other. The first and third surfaces of the tube form limiting protrusions inward, which hold the main body of the transistor in place.

[0044] The transistor can be reliably fixed inside the feed tube by the limiting protrusion.

[0045] Optionally, the first detection component includes a plurality of first cameras spaced apart along the length of the feed tube, each first camera being used to detect at least one transistor inside the feed tube;

[0046] The second detection component includes a plurality of second cameras spaced apart along the length of the feed tube, each second camera being used to detect at least one transistor inside the feed tube.

[0047] Each detection component includes multiple cameras, which can detect multiple transistors simultaneously, improving detection efficiency. Attached Figure Description

[0048] Figure 1 This is a three-dimensional structural diagram of a feed tube used to load the transistors that need to be tested by this invention.

[0049] Figure 2 This is a three-dimensional structural diagram of an optional embodiment of the present invention.

[0050] Figure 3 for Figure 2 A three-dimensional structural diagram of the regularized component in the illustrated embodiment.

[0051] Figure 4 for Figure 2 A three-dimensional structural diagram of the feeding section in the illustrated embodiment.

[0052] Figure 5 for Figure 4 The diagram shows a three-dimensional structure of the loading section from another perspective, in which the transfer components have been removed.

[0053] Figure 6 for Figure 4 A three-dimensional structural diagram of the material frame replacement component in the feeding section is shown.

[0054] Figure 7 for Figure 6 A schematic diagram of the three-dimensional structure after the base and skateboard are assembled.

[0055] Figure 8 for Figure 7 Enlarged view of point A in the image.

[0056] Figure 9 for Figure 2A three-dimensional structural diagram of the transfer unit in the illustrated embodiment.

[0057] Figure 10 for Figure 2 A three-dimensional structural diagram showing the relative positions of the aligning component, transfer section, detection section, and material pipe transport line 4 in the illustrated embodiment.

[0058] Figure 11 for Figure 12 The main view.

[0059] Figure 12 for Figure 2 A three-dimensional structural diagram of the marking section in the illustrated embodiment.

[0060] Figure 13 for Figure 12 The diagram shows a three-dimensional structure of the marking unit from another perspective, in which the marking unit assembly and the marking unit translation module have been removed.

[0061] Figure 14 for Figure 2 A three-dimensional structural diagram of the receiving section in the illustrated embodiment.

[0062] Figures 1 to 14 Including:

[0063] Automated optical inspection device for transistors 1;

[0064] 10. Loading section; 11. Loading station; 12. Steering assembly; 121. Bearing seat; 122. Positioning step; 123. Top block; 124. Base plate; 125. Steering plate drive component; 126. Bearing seat cylinder; 127. Top block cylinder; 128. Top block slide rail; 129. Buffer assembly; 13. Buffer frame; 131. Fixed plate; 132. Fixed plate translation part; 133. Partition plate; 134. Fixed plate lifting part; 135. Guide assembly. 136. Transfer assembly 14. Transfer translation part 141. Adsorption lifting part 142. Adsorption part 143. Adsorption mounting plate 144. Adsorption component 145. Material frame replacement assembly 15. Base 151. Slide plate 152. Slide rail 153. Positioning wheel 154. Positioning assembly 155. Insert block 156. Socket 157. Steel ball 158. Spring 159. Lifting assembly 16. Lifting plate 161. Lifting plate lifting part 162;

[0065] Transfer unit 20, translation mechanism 21, rotation mechanism 22, transfer plate 221, rotating shaft 222, bearing seat 223, rotating shaft drive 224, fixed frame 225, clamping mechanism 23, first clamping assembly 231, second clamping assembly 232, first gripper 233, first gripper drive 234, second gripper 235, second gripper drive 236, transfer station 24;

[0066] Detection unit 30, first detection component 31, first camera 311, second detection component 32, second camera 321;

[0067] Marking section 40, marking unit 41, marking unit 411, marking unit lifting component 412, marking unit translation module 42, material pipe transport line 43, conveyor belt 431, reference block 432, guide plate 433, air blowing component 434, material support assembly 44, bracket 441, bracket translation component 442, leveling plate 443, push block drive component 444, push block 445, lifting assembly 45, lifting plate 451, lifting plate lifting component 452, stop block 453;

[0068] 50. Receiving section; 51. Adsorption assembly; 511. Suction cup assembly; 512. Suction cup assembly lifting component; 52. Adsorption assembly lifting component; 53. Adsorption assembly translation component; 54. Good product receiving box; 55. NG product receiving box; 56. Good product guide frame; 57. NG product guide frame.

[0069] Material tube 100, first surface 101, second surface 102, third surface 103, pin 104, limiting protrusion 105;

[0070] Material frame 200, positioning groove 201, pad block 202, partition plate 203. Detailed Implementation

[0071] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0072] like Figure 1 As shown, a feed tube 100 is used to load transistors that need to be tested according to the present invention. The transistors to be tested are arranged side-by-side inside the feed tube 100. The first surface 101, second surface 102, and third surface 103 of the feed tube 100 are all transparent and respectively face the three surfaces of the transistors to be tested within the feed tube 100. Optionally, the first surface 101 of the feed tube 100 faces the third surface 103.

[0073] Optionally, pins 104 for sealing the tube 100 are provided at both ends of the tube 100 along its length; two adjacent transistors inside the tube 100 abut against each other, and the first surface 101 and the third surface 103 of the tube 100 form limiting protrusions 105 inwardly; the two limiting protrusions 105 extend along the length of the tube 100 and lock the main body of the transistor.

[0074] The transistor can be reliably fixed inside the feed tube 100 by the limiting protrusion 105.

[0075] Figure 2 The image shows an automated transistor optical inspection device 1, used for inspecting, for example... Figure 1 The transistors loaded in the feed tube 100 shown are inspected on three surfaces to be inspected. The automated optical inspection device 1 for transistors mainly includes a feeding unit 10, a transfer unit 20, and an inspection unit 30.

[0076] Wherein: the feeding section 10 is configured to store stacked multiple material tubes 100;

[0077] The feeding section 10 is provided with a feeding station 11 for the transfer section 20 to clamp the material tube 100, and the detection section 30 is configured to detect the three surfaces to be detected of the transistor inside the material tube 100 from the transparent first surface 101, second surface 102 and third surface 103 respectively.

[0078] The transfer unit 20 includes a translation mechanism 21, a rotation mechanism 22, and a clamping mechanism 23. The clamping mechanism 23 is installed at the movable end of the rotation mechanism 22, and the rotation mechanism 22 is installed at the movable end of the translation mechanism 21. The clamping mechanism 23 is configured to clamp the material tube 100 located at the loading station 11. The translation mechanism 21 is configured to drive the clamping mechanism 23 to translate between the loading unit 10 and the detection unit 30. The rotation mechanism 22 is configured to drive the clamping mechanism 23 to switch between the horizontal plane and the vertical plane.

[0079] The translation mechanism 21 and the rotation mechanism 22 work together to send the first surface 101, the second surface 102 and the third surface 103 of the material tube 100 to the detection unit 30 for detection in sequence.

[0080] By configuring a transfer unit 20 including a translation mechanism 21, a rotation mechanism 22 and a clamping mechanism 23, the translation mechanism 21 and the rotation mechanism 22 cooperate to ensure that the first surface 101, the second surface 102 and the third surface 103 of the material tube 100 held by the clamping mechanism 23 are continuously and sequentially sent to the detection unit 30, thereby saving the preparation time for detection and improving work efficiency.

[0081] The various components of the present invention will now be described in further detail.

[0082] like Figure 2 As shown, the feeding section 10 is used to feed the material tube 100 to the transfer section 20. As an optional embodiment, the feeding section 10 includes a straightening component 12, a buffer component 13, and a transfer component 14.

[0083] Among them, the cache component 13 is used to store multiple stacked material pipes 100;

[0084] Transfer assembly 14 is used to remove the feed tube 100 from the buffer assembly 13 and place it into the straightening assembly 12;

[0085] The straightening component 12 is used to receive the feed tube 100 and place the feed tube 100 in the loading station 11.

[0086] By temporarily storing the material tube 100 by the buffer component 13, the waiting time of the transfer component 14 can be reduced and the transfer efficiency of the transfer component 14 can be improved; by straightening the material tube 100 by the straightening component 12, the material tube 100 can be accurately located at the feeding position, which can avoid the transfer error of the transfer component 14 and reduce the failure rate.

[0087] In this embodiment, such as Figure 3 As shown, optionally, the straightening component 12 is provided with two bearing seats 121 located on both sides of the loading station 11. The two bearing seats 121 are provided with a positioning step 122 on the first side (i.e. the side closer to the transfer part 20) along the translation direction of the translation mechanism 21, and the two bearing seats 121 are provided with a top block 123 that can move relative to the positioning step 122 on the second side (i.e. the side away from the transfer part 20) along the translation direction of the translation mechanism 21.

[0088] The leveling assembly 12 also includes a reference plate 124, a leveling plate 125, and a leveling plate drive 126. The reference plate 124 and the leveling plate 125 are respectively located on the outer side of the two bearing seats 121 along the translation direction perpendicular to the translation mechanism 21. The leveling plate 125 is mounted on the movable end of the leveling plate drive 126, and the leveling plate drive 126 drives the leveling plate 125 to move relative to the reference plate 124. Optionally, the leveling plate drive 126 is a cylinder.

[0089] Using the positioning step 122 and the reference plate 124 as references, the material tube 100 is regulated by the movement of the top block 123 and the regulating plate 125, so that the material tube 100 is in a constant position before being gripped, which facilitates the transfer unit 20 to grip it accurately.

[0090] In one embodiment, two support seats 121 are respectively mounted on support seat cylinders 127, and the support seat cylinders 127 can drive the corresponding support seats 121 to rise and fall.

[0091] In another embodiment, two top blocks 123 are respectively mounted on the movable end of a top block cylinder 128, which is mounted on a support seat 121. A top block slide rail 129 is also installed between each top block 123 and the corresponding support seat 121. The top block cylinder 128 drives the corresponding top block 123 to slide along the top block slide rail 129, which can move closer to or away from the corresponding positioning step 122.

[0092] like Figure 4 , Figure 5 As shown, optionally, the cache component 13 includes a cache frame 131, a fixed plate 132, and a fixed plate translation part 133.

[0093] Two fixed plates 132 are arranged on opposite sides of the buffer frame 131. Each fixed plate 132 is mounted on the movable end of a fixed plate translation part 133. The two fixed plates 132 are configured to be inserted into or removed from the buffer frame 131 by the movement of the fixed plate translation part 133. Optionally, the fixed plate translation part 133 is a cylinder.

[0094] By having the fixed plate 132 inserted into the buffer frame 131 by the fixed plate translation part 133, the material tube 100 that is lifted into the buffer frame 131 by the lifting component 16 can be lifted into the buffer frame 131 and then removed from the material frame 200, thereby facilitating the replacement of the material frame 200 in the replacement component 15.

[0095] Optionally, multiple partitions 134 are vertically installed inside the cache frame 131, dividing the cache frame 131 into multiple parallel cache spaces.

[0096] The buffer box 131 is equipped with multiple buffer spaces, which can store multiple columns of tubes 100 at the same time, reducing the waiting time of the transfer component 14 and improving the transfer efficiency.

[0097] In one embodiment, optionally, the buffer assembly 13 further includes a fixed plate lifting section 135, and a fixed plate translating section 133 is installed at the movable end of the fixed plate lifting section 135. The fixed plate lifting section 135 is used to drive the fixed plate translating section 133 to rise and fall, so that the uppermost material tube 100 in the buffer frame 131 is in a constant position. Optionally, the fixed plate lifting section 135 adopts a lead screw motor, which steps to lift the fixed plate 132 and the fixed plate translating section 133, raising the height of one material tube 100 at a time, so that the uppermost material tube 100 in the buffer assembly 13 is always in the same position, which is convenient for the transfer assembly 14 to grasp.

[0098] The fixed plate 132 is raised and lowered to a predetermined position in the buffer assembly 13 by the fixed plate lifting part 135, so that the uppermost material tube 100 in the buffer frame 131 is always in a constant position, which facilitates the transfer assembly 14 to transfer the material tube 100.

[0099] In one embodiment, the material plate lifting section 135 further includes a guide assembly 136 configured to guide the material plate lifting section 135 during lifting. Optionally, the guide assembly 136 may be a guide rod. The guidance of the material plate lifting section 135 by the guide assembly 136 prevents the buffer frame 131 from wobbling.

[0100] like Figure 4 , Figure 5As shown, optionally, the transfer assembly 14 includes a transfer translation section 141, an adsorption lifting section 142, and an adsorption section 143. The adsorption section 143 is mounted on the adsorption lifting section 142, and the adsorption lifting section 142 is mounted on the transfer translation section 141. The adsorption section 143 is used to adsorb the feed tube 100 in the buffer assembly 13, the adsorption lifting section 142 is used to drive the adsorption section 143 to move up and down, and the transfer translation section 141 is used to drive the adsorption lifting section 142 to move horizontally. Optionally, the transfer translation section 141 and the adsorption lifting section 142 are both linear modules.

[0101] The material tube 100 in the buffer assembly 13 is adsorbed by the adsorption part 143, and the adsorption lifting part 142 and the transfer translation part 141 drive the adsorption part 143 to move to the feeding position, so as to realize the smooth feeding of the material tube 100.

[0102] In this embodiment, optionally, the adsorption unit 143 includes an adsorption mounting plate 144 and a plurality of adsorption elements 145, the plurality of adsorption elements 145 being mounted below the adsorption mounting plate 144. Optionally, the adsorption elements 145 are suction cups.

[0103] The adsorption section 143 is equipped with a plurality of adsorption elements 145, which reliably adsorb the feed tube 100, thereby preventing the feed tube 100 from falling and damaging the transistor.

[0104] like Figure 4 , Figure 5 As shown, optionally, the feeding section 10 also includes a material frame replacement assembly 15. As an optional embodiment, the material frame replacement assembly 15 includes a base 151, a slide plate 152, and a slide rail 153. The slide plate 152 is movably mounted on the base 151 via the slide rail 153, and the slide plate 152 is used to support the material frame 200.

[0105] The material frame replacement component 15 uses a sliding plate 152 and a slide rail 153, which allows for smooth pulling and easy replacement of the material frame 200.

[0106] like Figure 6 As shown, optionally, a positioning wheel 154 is installed on the slide plate 152, and a positioning groove 201 is provided at the bottom of the material frame 200 for the positioning wheel 154 to fit into.

[0107] By cooperating with the positioning wheel 154 and the positioning groove 201, the material frame 200 can be positioned on the slide plate 152 to prevent the material frame 200 from shaking.

[0108] like Figure 7 , Figure 8 As shown, optionally, the material frame replacement assembly 15 also includes a positioning assembly 155, which is installed between the base 151 and the slide plate 152. The positioning assembly 155 is used to position the slide plate 152 on the base 151.

[0109] Positioning the slide plate 152 on the base 151 by positioning component 155 ensures that the material frame 200 is in a predetermined position, which facilitates the lifting component 16 to lift the material tube 100.

[0110] Specifically, the positioning component 155 includes a plug 156 and a socket 157. The plug 156 is mounted on the slide plate 152, and the socket 157 is mounted on the base 151. The socket 157 is provided with a groove for the plug 156 to be inserted into. Steel balls 158 are installed on both sides of the groove, and the steel balls 158 are abutted against the plug 156 by springs 159.

[0111] like Figure 4 , Figure 5 As shown, optionally, the lifting assembly 16 includes a lifting plate 161 and a lifting plate lifting part 162. The lifting plate 161 is mounted on the movable part of the lifting plate lifting part 162. The lifting plate lifting part 162 drives the lifting plate 161 to rise and fall vertically. A cavity is formed at the bottom of the material frame 200 for the lifting plate 161 to be inserted into the material tube 100 below. Optionally, the lifting plate lifting part 162 is a linear module.

[0112] The bottom of the material frame 200 is provided with a cavity, which facilitates the insertion of the lifting plate 161 of the lifting assembly 16 into the material frame 200 without causing interference.

[0113] Specifically, the material frame 200 is divided into multiple storage spaces by multiple partitions 203. Each storage space is equipped with a pad 202 at the bottom, and the material tube 100 is placed on the pad 202. A cavity is formed below the material tube 100 for the lifting plate 161 to be inserted.

[0114] like Figure 2 As shown, the function of the transfer unit 20 is to detect the transistors in the feed tube 100. The transfer unit 20 includes a translation mechanism 21, a rotation mechanism 22, and a clamping mechanism 23.

[0115] like Figure 9 As shown, optionally, the translation mechanism 21 adopts a linear module.

[0116] like Figure 9 As shown, in one optional embodiment, the rotating mechanism 22 includes a transfer plate 221, a rotating shaft 222, bearing seats 223, and a rotating shaft drive 224. The rotating shaft 222 is rotatably mounted on the transfer plate 221 via two bearing seats 223. The transfer plate 221 is mounted on the movable end of the translation mechanism 21. The movable end of the rotating shaft drive 224 is connected to the rotating shaft 222; the rotating shaft drive 224 drives the rotating shaft 222 to rotate. Optionally, the rotating shaft drive 224 adopts a belt pulley transmission mechanism.

[0117] like Figure 9As shown, as an optional implementation, the clamping mechanism 23 includes a first clamping component 231 and a second clamping component 232 mounted opposite to the movable end of the rotating mechanism 22. The first clamping component 231 and the second clamping component 232 are respectively used to clamp a material tube 100 individually.

[0118] When the material tube 100 held by the first clamping component 231 is inspected on the third surface 103, the second clamping component 232 clamps another material tube 100 from the loading station 11.

[0119] When the material tube 100 held by the second clamping component 232 is inspected on the third surface 103, the first clamping component 231 clamps another material tube 100 from the loading station 11.

[0120] The clamping mechanism 23 includes two clamping components. When one clamping component clamps the material tube 100 at the inspection station, the other clamping component clamps another material tube 100 from the loading station 11, realizing the synchronous feeding of the two material tubes 100 and improving work efficiency.

[0121] Optionally, the first clamping assembly 231 includes two pairs of first grippers 233 and two first gripper drivers 234, with each pair of first grippers 233 mounted on one first gripper driver 234; the two first gripper drivers 234 are respectively fixedly mounted on one end of the rotating shaft 222, and the first gripper drivers 234 drive the first grippers 233 to open and close. Optionally, the first gripper driver 234 is a double-headed cylinder.

[0122] The second clamping assembly 232 is symmetrically mounted on the rotating shaft 222 along with the first clamping assembly 231. The second clamping assembly 232 includes two pairs of second jaws 235 and two second jaw drive members 236. The second jaws 235 are mounted on the second jaw drive members 236; the second jaw drive members 236 drive the second jaws 235 to open and close. Optionally, the second jaw drive member 236 is a double-headed cylinder.

[0123] Optionally, two fixing frames 225 are installed on the rotating shaft 222, and a first gripper 233 and a second gripper 235 are symmetrically installed on each fixing frame 225.

[0124] like Figure 2 As shown, the function of the detection unit 30 is to detect the transistors in the feed tube 100.

[0125] As an optional implementation, the detection unit 30 includes a first detection component 31 and a second detection component 32. The first detection component 31 is used to detect the first surface 101 and the third surface 103 of the material tube 100 respectively, and the second detection component 32 is used to detect the second surface 102 of the material tube 100.

[0126] The detection unit 30 includes two detection components. The first detection component 31 can detect the first surface 101 and the third surface 103 of the tube 100 at the same height position, and the second detection component 32 can detect the second surface 102 of the tube 100 at another height position. The positions of the two detection components can be adjusted and fixed before detection, and do not need to be readjusted during detection, which can save detection time.

[0127] Optionally, the first detection component 31 includes a plurality of first cameras 311 spaced apart along the length of the tube 100, each first camera 311 being used to detect at least one transistor within the tube 100;

[0128] The second detection component 32 includes a plurality of second cameras 321 spaced apart along the length of the feed tube 100, each second camera 321 being used to detect at least one transistor within the feed tube 100.

[0129] Each detection component includes multiple cameras, which can simultaneously detect all transistors within a single tube 100, improving detection efficiency.

[0130] like Figure 10 , Figure 11 As shown, optionally, the first detection component 31 and the second detection component 32 are spaced apart and positioned above the translation path of the translation mechanism 21;

[0131] When the material tube 100 held by the first clamping component 231 is moved to below the first detection component 31, the first detection component 31 detects the first surface 101 or the third surface 103 of the material tube 100.

[0132] The rotating mechanism 22 is used to drive the first clamping assembly 231 to rotate 90°, so that the second surface 102 of the material tube 100 rotates to the bottom of the second detection assembly 32, which is used to detect the second surface 102 of the material tube 100.

[0133] By setting the first detection component 31 and the second detection component 32 at intervals, the positions of the two detection components correspond to the clamping positions of each clamping component before and after rotation, which facilitates the detection unit 30 to detect two adjacent surfaces of the material tube 100, namely the first surface 101 and the second surface 102 or the second surface 102 and the third surface 103.

[0134] like Figure 2 As shown, the present invention may further include a marking section 40 located after the detection section 30. The marking section 40 is configured to mark the surface of the tube 100 corresponding to the defective transistor. The marking section 40 is provided with a transfer station 24 for receiving the tube 100 after detection.

[0135] When the material tube 100 held by the first clamping component 231 is inspected on the first surface 101, the material tube 100 held by the second clamping component 232 is in the transfer station 24.

[0136] When the tube 100 held by the second clamping component 232 is inspected on the first surface 101, the tube 100 held by the first clamping component 231 is in the transfer station 24.

[0137] By configuring the marking section 40, a mark can be made on the surface of the tube 100 corresponding to the defective transistor, which facilitates the subsequent processing of the defective transistor.

[0138] like Figure 12 , Figure 13 As shown, in one optional implementation, the marking unit 40 includes a marking unit 41, a marking unit translation module 42, a material tube transport line 43, a material support assembly 44, and a lifting assembly 45.

[0139] The lifting assembly 45 is installed outside the material pipe transport line 43, and the material support assembly 44 is installed above the material pipe transport line 43. The material pipe transport line 43 is configured to receive and transport the material pipe 100 transmitted from the transfer unit 20. The transfer station 24 is set at the feed end of the material pipe transport line 43. The lifting assembly 45 is configured to lift the material pipe 100 from the material pipe transport line 43 to the material support assembly 44. The material support assembly 44 is configured to support and position the material pipe 100.

[0140] The marking device translation module 42 is installed above the material support assembly 44; the marking device group 41 is installed at the movable end of the marking device translation module 42, and the marking device translation module 42 is configured to drive the marking device group 41 to move above the material support assembly 44; the marking device group 41 includes multiple marking devices 411 and a marking device lifting component 412, the marking devices 411 are installed at the movable end of the marking device lifting component 412, and the marking device lifting component 412 drives each marking device 411 to rise and fall and mark on the material tube 100.

[0141] The lifting component 45 lifts the material tube 100 from the material tube transport line 43 to the material support component 44. The marking device translation module 42 moves the marking device group 41 above the material support component 44. The marking device lifting component 412 drives the marking device 411 to rise and fall, thereby marking on the material tube 100. During marking, the material tube 100 will not deviate, and the marking device 411 can mark normally.

[0142] In one embodiment, optionally, the material pipe transport line 43 includes two parallel and spaced conveyor belts 431, with a reference block 432 installed at the discharge end of the conveyor belts 431 for blocking the material pipe 100, and / or a guide plate 433 installed at the feed end of the conveyor belts 431 for guiding the material pipe 100.

[0143] By setting a reference block 432 at the discharge end of the conveyor belt 431, the position of the material pipe 100 on the material pipe transport line 43 is kept constant, which facilitates the accurate lifting of the lifting component 45; by setting a guide plate 433 to guide the material pipe 100, the material pipe 100 can smoothly enter the material pipe transport line 43.

[0144] In another embodiment, optionally, two guide plates 433 are symmetrically installed on the outside of the feed ends of the two conveyor belts 431, and the distance between the feed ends of the two guide plates 433 gradually decreases along the feed direction.

[0145] By setting the guide plate 433 into an arc shape, the material tube 100 can be stably and smoothly aligned to the center position on the material tube transport line 43.

[0146] In one embodiment, optionally, the feed end of the tube conveyor line 43 is also equipped with an air blowing element 434 for blowing the tube 100 to be received toward the conveyor belt 431.

[0147] The air blowing component 434 allows the material tube 100 to fall quickly onto the material tube transport line 43, improving production efficiency.

[0148] like Figure 13 As shown, in one embodiment, optionally, the material support assembly 44 includes two brackets 441 and a bracket translation component 442. The two brackets 441 are symmetrically installed on the outer side of the material pipe conveyor line 43 in the conveying direction. The bracket translation component 442 drives the two brackets 441 to move closer to or away from each other. Optionally, the bracket translation component 442 is a cylinder.

[0149] The two brackets 441 are moved away by the bracket translation component 442 so that there is space for the lifting component 45 to lift the material tube 100 above the upper surface of the bracket 441; the two brackets 441 are moved closer by the bracket translation component 442 so that the material tube 100 can be placed on the bracket 441 when the lifting component 45 descends.

[0150] Optionally, the material support assembly 44 also includes a straightening plate 443. The two straightening plates 443 are symmetrically installed on the two brackets 441. The two straightening plates 443 are used to straighten the material tube 100 supported on the two brackets 441. The two straightening plates 443 abut against or move away from the two ends of the material tube 100 in the length direction under the action of the brackets 441.

[0151] The straightening plate 443 can straighten the uniformity of the tube 100 in the length direction.

[0152] Optionally, each preform 443 and its corresponding bracket 441 are integrally formed in an L-shape. The integral formation of the preform 443 and the bracket 441 facilitates manufacturing.

[0153] In one embodiment, optionally, the reference block 432 is higher than the bracket 441, and the material support assembly 44 further includes a pusher drive 444 mounted on each bracket 441. The pusher drive 444 is located at the end of the bracket 441 near the feed end of the conveyor belt 431. A pusher 445 is mounted on the movable part of the pusher drive 444. The pusher drive 444 is configured to drive the pusher 445 to abut against the material pipe 100, causing multiple material pipes 100 to converge along the conveying direction of the material pipe transport line 43. Optionally, the pusher drive 444 is a cylinder.

[0154] The reference block 432 is positioned higher than the bracket 441 and can serve as the reference surface for the material tube 100 during marking. By driving the push block 445 to abut against the material tube 100 through the push block drive 444, multiple material tubes 100 can be brought together along the conveying direction of the material tube transport line 43.

[0155] In one embodiment, optionally, the lifting assembly 45 includes a lifting plate 451 and a lifting plate lifting member 452, wherein the lifting plate 451 is mounted on a movable part of the lifting plate lifting member 452, and the lifting plate lifting member 452 is configured to drive the lifting plate 451 to rise and fall. Optionally, the lifting plate lifting member 452 is a cylinder.

[0156] The lifting plate 451 is raised and lowered by the lifting plate lifting component 452 to transfer the material tube 100 to the material support component 44.

[0157] In another embodiment, the lifting assembly 45 may optionally include a stop block 453, which is mounted on one end of the lifting plate 451 near the feed end of the feed tube 100 conveyed on the feed tube 43; the stop block 453 is configured to block the feed tube 100 located in the downstream section being conveyed on the feed tube 43 when the lifting plate 451 is raised.

[0158] By using the stop block 453 to block the material pipe 100 that will be subsequently fed into the material pipe transport line 43 outside the lifting assembly 45, interference between the material pipe 100 and the lifting plate 451 can be avoided.

[0159] like Figure 2 As shown, the present invention may further include a receiving unit 50, which is installed at the post-marking station of the marking unit 40. The receiving unit 50 is configured to classify and collect the material tubes 100 according to the detection results of the detection unit 30.

[0160] By classifying and collecting the marked tubes 100 through the receiving section 50, the tubes 100 can be classified in a timely manner after testing, thereby improving work efficiency.

[0161] like Figure 14 As shown, in one optional implementation, the receiving section 50 includes an adsorption component 51, an adsorption component lifting component 52, an adsorption component translation component 53, a good product receiving box 54, and an NG product receiving box 55.

[0162] The adsorption component 51 is mounted on the movable end of the adsorption component lifting member 52, and the adsorption component lifting member 52 is mounted on the movable end of the adsorption component translating member 53. The adsorption component translating member 53 is configured to move the adsorption component lifting member 52 to above the good product receiving box 54 or the NG product receiving box 55, and the adsorption component lifting member 52 is configured to move the adsorption component 51 up and down. Optionally, the adsorption component lifting member 52 is a cylinder, and the adsorption component translating member 53 is a linear module.

[0163] Optionally, the adsorption assembly 51 includes multiple suction cup groups 511 and suction cup group lifting components 512, each suction cup group 511 being raised and lowered by its respective suction cup group lifting component 512. Optionally, the suction cup group lifting component 512 is a cylinder.

[0164] The marked material tubes 100 on the marking section 40 and the material support assembly 44 are adsorbed by the adsorption component 51 in one go. The adsorption component 51 is moved to the top of the good product collection box 54 or the NG product collection box 55 by the adsorption component lifting component 52 and the adsorption component translation component 53. Then, the tested material tubes 100 are classified and collected in the corresponding collection boxes to realize the classified collection of material tubes 100.

[0165] In one embodiment, a good product guide frame 56 is installed above the good product receiving box 54, and an NG product guide frame 57 is installed above the NG product receiving box 55. The good product guide frame 56 and the NG product guide frame 57 respectively serve as guides.

[0166] like Figure 2 As shown, the working process of this invention is as follows:

[0167] The buffer component 13 of the feeding section 10 takes out a material tube 100 from the buffer box 131 and sends it to the straightening component 12;

[0168] The transfer section 20 slides to the straightening component 12 to clamp the material tube 100, and then returns to the inspection section 30 for optical inspection. After inspection, the material tube 100 is sent from the transfer section 20 to the marking section 40.

[0169] After the marking unit 40 marks the defective transistors, the adsorption component 51 of the receiving unit 50 picks up the material tube 100 and sends it into the corresponding receiving box.

[0170] The present invention has been described above in sufficient detail and with certain specificities. Those skilled in the art should understand that the descriptions in the embodiments are merely exemplary, and all changes made without departing from the true spirit and scope of the invention should fall within the protection scope of the invention. The scope of protection claimed by the present invention is defined by the claims, and not by the above descriptions in the embodiments.

Claims

1. A transistor automated optical inspection apparatus, characterized by, The application discloses a transistor automatic optical detection device for detecting three surfaces of transistors. The feeding part is configured to store a plurality of stacked material tubes, the material tubes are provided with transistors to be detected side by side, and the first surface, the second surface and the third surface of the material tube are transparent and correspond to the three surfaces to be detected of the transistor in the material tube respectively. The feeding part is provided with a feeding station for the transfer part to clamp the material tube, and the detection part is configured to detect the three surfaces to be detected of the transistor in the material tube from the transparent first surface, the second surface and the third surface of the material tube respectively. The transfer part comprises a translation mechanism, a rotating mechanism and a clamping mechanism, the clamping mechanism comprises a first clamping assembly mounted on the movable end of the rotating mechanism, and the rotating mechanism is mounted on the movable end of the translation mechanism. The translation mechanism and the rotating mechanism are matched to sequentially send the first surface, the second surface and the third surface of the material tube to the detection part. The detection part comprises a first detection assembly and a second detection assembly, the first detection assembly is used for detecting the first surface and the third surface of the material tube respectively, and the second detection assembly is used for detecting the second surface of the material tube. The first detection assembly and the second detection assembly are arranged on the translation path of the translation mechanism. When the material tube clamped by the first clamping assembly is translated to below the first detection assembly, the first detection assembly detects the first surface or the third surface of the material tube. The rotating mechanism is used for turning the first clamping assembly by 90 degrees, so that the second surface of the material tube is rotated to below the second detection assembly, and the second detection assembly is used for detecting the second surface of the material tube.

2. The transistor automated optical inspection apparatus according to claim 1, wherein The clamping mechanism comprises a first clamping assembly and a second clamping assembly mounted on the movable end of the rotating mechanism in a back-to-back mode, and the first clamping assembly and the second clamping assembly are used for clamping a material tube respectively. When the material tube clamped by the first clamping assembly is detected on the third surface, the second clamping assembly clamps another material tube from the feeding station. When the material tube clamped by the second clamping assembly is detected on the third surface, the first clamping assembly clamps another material tube from the feeding station.

3. The transistor automated optical inspection apparatus of claim 2, wherein The transistor automatic optical detection device further comprises a marking part located at the rear of the detection part, the marking part is configured to mark on the surface of the material tube corresponding to the unqualified transistor, and the marking part is provided with a transfer station for receiving the material tube after detection. When the material tube clamped by the first clamping assembly is detected on the first surface, the material tube clamped by the second clamping assembly is located in the transfer station. When the material tube clamped by the second clamping assembly is detected on the first surface, the material tube clamped by the first clamping assembly is located in the transfer station.

4. The transistor automated optical inspection apparatus of claim 1, wherein The feeding part comprises a regularizing assembly, a buffer assembly and a transfer assembly, The buffer assembly is used for storing a plurality of stacked material pipes; The transfer assembly is used for taking the material pipes from the buffer assembly and placing them into the regularizing assembly; The regularizing assembly is used for receiving the material pipes and making the material pipes in a feeding station.

5. The transistor automated optical inspection apparatus of claim 4, wherein, The regularizing assembly is provided with two bearing seats located on both sides of the feeding station, and a positioning step is arranged on the first side of the bearing seats along the translation direction of the translation mechanism, and a top block is arranged on the second side of the bearing seats along the translation direction of the translation mechanism and can move relative to the positioning step. The regularizing assembly further comprises a reference plate, a regularizing plate and a regularizing plate driving element, the reference plate and the regularizing plate are respectively located on the outer side of the two bearing seats perpendicular to the translation direction of the translation mechanism, the regularizing plate is installed on the regularizing plate driving element, and the regularizing plate driving element drives the regularizing plate to move relative to the reference plate.

6. The transistor automated optical inspection apparatus of claim 3, wherein The marking part comprises a marker group, a marker translation module, a material pipe conveying line, a material holding assembly and a lifting assembly; The lifting assembly is installed outside the material pipe conveying line, and the material holding assembly is installed above the material pipe conveying line; the material pipe conveying line is configured to receive and convey the material pipes transmitted from the transfer part, the transfer station is arranged at the feeding end of the material pipe conveying line, the lifting assembly is configured to lift the material pipes from the material pipe conveying line to the material holding assembly, and the material holding assembly is configured to hold and position the material pipes; The marker translation module is installed above the material holding assembly; the marker group is installed at the movable end of the marker translation module, and the marker translation module is configured to drive the marker group to move above the material holding assembly; the marker group comprises a plurality of markers and marker lifting elements, the markers are installed at the movable end of the marker lifting elements, and the marker lifting elements drive the respective markers to lift and mark on the material pipes.

7. The transistor automated optical inspection apparatus of claim 3, wherein The transistor automatic optical detection device further comprises a material collecting part, the material collecting part is installed at the downstream station of the marking part, and the material collecting part is configured to collect the material pipes according to the detection results of the detection part.

8. The transistor automated optical inspection apparatus of claim 7, wherein, The material collecting part comprises a suction assembly, a suction assembly lifting element, a suction assembly translation element, a good product collecting box and an NG product collecting box; The suction assembly is installed at the movable end of the suction assembly lifting element, and the suction assembly lifting element is installed at the movable end of the suction assembly translation element; the suction assembly translation element is configured to drive the suction assembly lifting element to translate above the good product collecting box or the NG product collecting box, and the suction assembly lifting element is configured to drive the suction assembly to lift; The suction assembly comprises a plurality of suction disc groups and suction disc group lifting elements, and each suction disc group is lifted under the driving of the respective suction disc group lifting element.

9. The transistor automated optical inspection apparatus of claim 1, wherein, The length direction of the material pipe is provided with a plug for closing the material pipe at each end, the adjacent two transistors in the material pipe abut each other, and the first surface and the third surface of the material pipe form a limiting protrusion inwardly, respectively, and the two limiting protrusions clamp the main body part of the transistor.

10. The transistor automated optical inspection apparatus of claim 1, wherein, The first detection assembly comprises a plurality of first cameras arranged at intervals along the length direction of the pipe, each of the first cameras being configured to detect at least one of the transistors in the pipe; The second detection assembly comprises a plurality of second cameras arranged at intervals along the length direction of the pipe, each of the second cameras being configured to detect at least one of the transistors in the pipe.

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