Parameter determination method and device of optoelectronic modulator, storage medium and terminal

Abstract

The application discloses a kind of photoelectric modulator parameter determination method and device, storage medium, terminal, it is related to optical fiber product test technical field, main purpose is to solve the problem of low efficiency of photoelectric modulator parameter determination.The main include the characteristic voltage of target photoelectric modulator, optical power input value, the characteristic voltage includes first characteristic voltage, second characteristic voltage, the characteristic voltage is extracted from optical power voltage fitting curve;According to the first characteristic voltage configuration first voltage input value, and obtain the first optical power collected under the first voltage input value, according to the second characteristic voltage configuration second voltage input value, and obtain the second optical power collected under the second voltage input value;According to the first optical power, the second optical power, the optical power input value, the characteristic voltage is calculated to obtain the target parameter of the target photoelectric modulator.It is mainly used for testing the parameter of photoelectric modulator.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of optical fiber product testing, in particular to a method and device for determining parameters of an optoelectronic modulator, a storage medium and a terminal. BACKGROUND

[0002] An electro-optical modulator is a modulator made of an electro-optical crystal using the photoelectric effect of the electro-optical crystal. When a voltage is applied to the electro-optical crystal, the refractive index of the electro-optical crystal will change, thereby causing changes in the characteristics of the light wave passing through the crystal, so as to realize the modulation of the phase, amplitude, intensity and polarization state of the optical signal. The optoelectronic modulator is widely used in the field of optical fiber communication, such as optical fiber cable television, optical link in wireless communication system, etc.

[0003] In order to ensure the quality and function realization of the optoelectronic modulator, the parameters of each optoelectronic modulator need to be tested. The time length of the test process directly affects the development and test progress of the product. The existing method for measuring the parameters of the optoelectronic modulator mainly measures the optical power value under different voltage values by point-by-point measurement, and completes the measurement of each parameter of the optoelectronic modulator. However, the measurement workload of this method is large, the measurement time is long, and the parameter determination efficiency of the optoelectronic modulator is low. SUMMARY

[0004] Therefore, the present application provides a method and device for determining parameters of an optoelectronic modulator, a storage medium and a terminal, which mainly aims to solve the problem of low parameter determination efficiency of the existing optoelectronic modulator.

[0005] According to one aspect of the present application, a method for determining parameters of an optoelectronic modulator is provided, comprising:

[0006] obtaining a characteristic voltage and an optical power input value of a target optoelectronic modulator, the characteristic voltage comprising a first characteristic voltage and a second characteristic voltage, the characteristic voltage being extracted from an optical power voltage fitting curve;

[0007] configuring a first voltage input value according to the first characteristic voltage and obtaining a first optical power collected under the first voltage input value, configuring a second voltage input value according to the second characteristic voltage and obtaining a second optical power collected under the second voltage input value;

[0008] calculating a target parameter of the target optoelectronic modulator according to the first optical power, the second optical power, the optical power input value and the characteristic voltage.

[0009] Further, before obtaining the characteristic voltage and the optical power input value of the target optoelectronic modulator, the method further comprises:

[0010] acquire output optical power data of the target optoelectronic modulator under a preset input voltage;

[0011] fit the preset input voltage and the output optical power data to obtain an optical power-voltage fitting curve of the target optoelectronic modulator, and verify the optical power-voltage fitting curve;

[0012] if the verification result is passed, extract a voltage value corresponding to an optical power feature point in the optical power-voltage fitting curve to obtain a feature voltage.

[0013] Further, the verifying the optical power-voltage fitting curve comprises:

[0014] acquire attribute information of the target optoelectronic modulator, and acquire a preset optical power-voltage relationship curve matching the attribute information from a relationship curve mapping relationship set;

[0015] calculate a curve similarity between the optical power-voltage fitting curve and the preset optical power-voltage relationship curve;

[0016] if the curve similarity is greater than or equal to a preset similarity threshold, determine that the verification result is passed;

[0017] if the curve similarity is less than the preset similarity threshold, determine that the verification result is not passed.

[0018] Further, before the verifying the optical power-voltage fitting curve, the method further comprises:

[0019] acquire optical power point-by-point voltage scanning data of an optoelectronic modulator of a global attribute type;

[0020] generate a preset optical power-voltage relationship curve based on the power point-by-point voltage scanning data of each attribute type;

[0021] construct a mapping between the preset optical power-voltage relationship curve and the attribute type to obtain a relationship curve mapping relationship set.

[0022] Further, the target parameter comprises an optical power loss value, a polarization value, and a bias voltage, and the target parameter of the target optoelectronic modulator is calculated according to the first optical power, the second optical power, the optical power input value, and the feature voltage, comprising:

[0023] an optical power loss value is calculated according to the first optical power and the optical power input value;

[0024] a polarization value is calculated according to the first optical power and the second optical power;

[0025] calculating a difference between the first characteristic voltage and the second characteristic voltage to obtain a bias voltage.

[0026] Further, after the target parameter of the target optoelectronic modulator is calculated according to the first optical power, the second optical power, the optical power input value and the characteristic voltage, the method further comprises:

[0027] if the target parameter is greater than a first preset parameter threshold or less than a second preset parameter threshold, the preset input voltage is updated;

[0028] an updated optical power voltage fitting curve is regenerated based on the updated preset input voltage, an updated optical power voltage fitting curve is obtained, and a characteristic voltage is extracted based on the updated optical power voltage fitting curve.

[0029] According to another aspect of the present application, a parameter determination device of an optoelectronic modulator is provided, comprising:

[0030] an acquisition module configured to acquire a characteristic voltage of a target optoelectronic modulator and an optical power input value, the characteristic voltage comprising a first characteristic voltage and a second characteristic voltage, the characteristic voltage being extracted from an optical power voltage fitting curve;

[0031] a configuration module configured to configure a first voltage input value according to the first characteristic voltage and acquire a first optical power collected under the first voltage input value, and configure a second voltage input value according to the second characteristic voltage and acquire a second optical power collected under the second voltage input value;

[0032] a calculation module configured to calculate a target parameter of the target optoelectronic modulator according to the first optical power, the second optical power, the optical power input value and the characteristic voltage.

[0033] Further, the device further comprises:

[0034] the acquisition module is further configured to acquire output optical power data of the target optoelectronic modulator under a preset input voltage;

[0035] a processing module configured to perform fitting processing on the preset input voltage and the output optical power data to obtain an optical power voltage fitting curve of the target optoelectronic modulator, and to verify the optical power voltage fitting curve;

[0036] an extraction module configured to extract voltage values corresponding to optical power characteristic points in the optical power voltage fitting curve to obtain a characteristic voltage if the verification result passes the verification.

[0037] Further, the processing module further comprises:

[0038] The acquisition unit is configured to acquire attribute information of the target optoelectronic modulator, and acquire a preset optical power-voltage relationship curve matching the attribute information from a relationship curve mapping relationship set.

[0039] The second calculation unit is configured to calculate a curve similarity between the optical power-voltage fitting curve and the preset optical power-voltage relationship curve.

[0040] The first verification unit is configured to determine that the verification result passes verification if the curve similarity is greater than or equal to a preset similarity threshold.

[0041] The first verification unit is configured to determine that the verification result fails verification if the curve similarity is less than a preset similarity threshold.

[0042] Further, the apparatus further comprises:

[0043] The acquisition module is further configured to acquire optical power point-by-point voltage scanning data of an optoelectronic modulator of a global attribute type.

[0044] The generation module is configured to generate a preset optical power-voltage relationship curve based on the power point-by-point voltage scanning data of each attribute type.

[0045] The construction module is configured to construct a mapping between the preset optical power-voltage relationship curve and the corresponding attribute type, to obtain a relationship curve mapping relationship set.

[0046] Further, the calculation module comprises:

[0047] The third calculation unit is configured to calculate an optical power loss value according to the first optical power and the optical power input value.

[0048] The fourth calculation unit is configured to calculate a polarization value according to the first optical power and the second optical power.

[0049] The fifth calculation unit is configured to calculate a difference value between the first characteristic voltage and the second characteristic voltage, to obtain a bias voltage.

[0050] Further, the apparatus further comprises:

[0051] The first update module is configured to update the preset input voltage if the target parameter is greater than a first preset parameter threshold or less than a second preset parameter threshold.

[0052] The second update module is configured to regenerate an optical power-voltage fitting curve based on the updated preset input voltage, to obtain an updated optical power-voltage fitting curve, and extract a characteristic voltage based on the updated optical power-voltage fitting curve.

[0053] According to another aspect of the present application, there is provided a storage medium having stored therein at least one executable instruction, which causes a processor to perform operations corresponding to the parameter determination method of the optoelectronic modulator.

[0054] According to still another aspect of the present application, there is provided a terminal comprising a processor, a memory, a communication interface and a communication bus, which enable communication among each other;

[0055] The memory is configured to store at least one executable instruction, which causes the processor to perform operations corresponding to the parameter determination method of the optoelectronic modulator.

[0056] By means of the above technical solution, the technical solution provided by the embodiments of the present application has at least the following advantages:

[0057] The present application provides a parameter determination method and device of an optoelectronic modulator, a storage medium and a terminal. The embodiments of the present application obtain a characteristic voltage and an optical power input value of a target optoelectronic modulator, the characteristic voltage comprising a first characteristic voltage and a second characteristic voltage, the characteristic voltage being extracted from an optical power voltage fitting curve; a first voltage input value is configured according to the first characteristic voltage, and a first optical power collected at the first voltage input value is obtained; a second voltage input value is configured according to the second characteristic voltage, and a second optical power collected at the second voltage input value is obtained; a target parameter of the target optoelectronic modulator is calculated according to the first optical power, the second optical power, the optical power input value and the characteristic voltage, which greatly reduces the amount of optical power data measurement, reduces the measurement time, ensures the accuracy of measurement, and greatly improves the efficiency of parameter determination of the optoelectronic modulator.

[0058] The above description is only a summary of the technical solutions of the present application. In order to enable one skilled in the art to better understand the technical means of the present application, the content of the specification can be implemented, and in order to enable the above and other purposes, features and advantages of the present application to be more apparent and easy to understand, the following specific embodiments of the present application are described. BRIEF DESCRIPTION OF DRAWINGS

[0059] Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The accompanying drawings are included to provide a description of the preferred embodiments and are not meant to limit the present application. Furthermore, the same reference numerals are used throughout the several drawings to designate the same or similar parts. In the drawings:

[0060] Figure 1 A flowchart of a parameter determination method of an optoelectronic modulator provided by the embodiments of the present application is shown;

[0061] Figure 2 A flow chart of a parameter determination method of another optoelectronic modulator provided by an embodiment of the present application is shown;

[0062] Figure 3 A comparison chart of a light power voltage fitting curve and a light power voltage measured relation curve provided by an embodiment of the present application is shown;

[0063] Figure 4 A block diagram of a parameter determination device of an optoelectronic modulator provided by an embodiment of the present application is shown;

[0064] Figure 5 A structure schematic diagram of a terminal provided by an embodiment of the present application is shown. DETAILED DESCRIPTION

[0065] Exemplary embodiments of the present disclosure will be described in detail with reference to the drawings. Although exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided so that the present disclosure can be more thoroughly understood and the scope of the present disclosure can be accurately conveyed to those skilled in the art.

[0066] For the existing method of measuring the parameters of the optoelectronic modulator, the light power values under different voltage values are measured point by point to complete the measurement of the parameters of the optoelectronic modulator. However, the measurement workload of this method is large, the measurement time is long, and the efficiency of determining the parameters of the optoelectronic modulator is low. Embodiments of the present application provide a parameter determination method of an optoelectronic modulator, as shown in Figure 1 The method comprises:

[0067] 101, obtaining a characteristic voltage and a light power input value of a target optoelectronic modulator.

[0068] In the embodiment of the present application, the target optoelectronic modulator is an optoelectronic modulator to be tested. The electro-optic crystal of the optoelectronic modulator can be a lithium niobate crystal, a gallium arsenide crystal, a lithium tantalate crystal, etc., which is not specifically limited in the embodiment of the present application. The optical power input value is the value of the initial optical power input to the target optoelectronic modulator in the process of testing the target optoelectronic modulator. The characteristic voltage is extracted from the optical power-voltage fitting curve, and the characteristic voltage is the optical power peak voltage and the optical power valley voltage in the optical power-voltage fitting curve, including the first characteristic voltage and the second characteristic voltage. The actual measured value of the optical power corresponding to the first characteristic voltage and the second characteristic voltage can be used for the target parameter of the target optoelectronic modulator. The optical power-voltage fitting curve is fitted based on the preset input voltage of the target optoelectronic modulator and the optical power value collected under the preset input voltage. The preset input voltage can be a preset number of voltage values randomly selected in the input voltage range of the target optoelectronic modulator, or a preset number of voltage values set according to the experience value of voltage debugging, wherein the preset number can be 4, 5, or more than 5, which is not specifically limited in the embodiment of the present application.

[0069] It should be noted that by inputting a preset number of voltage values to the target optoelectronic modulator and collecting the corresponding optical power, the curve of the optical power of the target optoelectronic modulator changing with the voltage value can be fitted according to the voltage value and the optical power, and then the characteristic voltage corresponding to the optical power used for calculating the parameter can be extracted, avoiding testing the optical power corresponding to all voltage values in the voltage range, greatly reducing the optical power test amount and the test time, thereby effectively improving the efficiency of extracting the characteristic voltage.

[0070] 102、According to the first characteristic voltage, a first voltage input value is configured, and a first optical power collected under the first voltage input value is obtained. According to the second characteristic voltage, a second voltage input value is configured, and a second optical power collected under the second voltage input value is obtained.

[0071] In the embodiment of the present application, the voltage is input to the target optoelectronic modulator by the direct current source, and the current execution subject is a computer device connected to the control end of the direct current source. The current execution end controls the direct current source to input the corresponding voltage to the target optoelectronic modulator by configuring the voltage input value to the control end of the direct current source. After obtaining the first characteristic voltage and the second characteristic voltage, in order to measure the actual value of the optical power of the target optoelectronic modulator under the first characteristic voltage and the second characteristic voltage respectively, specifically, the current execution subject configures the first characteristic voltage as the first voltage input value, so that the direct current source inputs the voltage to the target optoelectronic modulator according to the first voltage input value, and after the optical power meter collects the first optical power under the first voltage input value, the current execution subject obtains the collected first optical power from the optical power meter. Similarly, the current execution subject configures the second characteristic voltage as the second voltage input value, so that the direct current source inputs the voltage to the target optoelectronic modulator according to the second voltage input value, and after the optical power meter collects the second optical power under the second voltage input value, the current execution subject obtains the collected second optical power from the optical power meter. It should be noted that the configuration order of the first voltage input value and the second voltage input value can be customized according to the actual application scene, and the collection order of the first optical power and the second optical power corresponds to the input order of the voltage value, and the embodiment of the present application does not make specific limitation on the configuration order of the voltage.

[0072] 103. Calculate the target parameter of the target optoelectronic modulator according to the first optical power, the second optical power, the optical power input value and the characteristic voltage.

[0073] In the embodiment of the present application, the target parameter is a parameter representing the working performance of the target optoelectronic modulator, such as optical power insertion loss, polarization value, bias voltage, etc., which is not limited in the embodiment of the present application. For example, the first optical power is the maximum optical power, and the second optical power is the minimum optical power, and the polarization value can be calculated according to the maximum optical power and the minimum optical power. The characteristic voltage is the optical power peak voltage and the optical power valley voltage in the optical power voltage fitting curve, the actual optical power measured at the optical power peak voltage is the actual maximum value of the optical power, i.e. the first optical power, and the actual optical power measured at the optical power valley voltage is the actual minimum value of the optical power, i.e. the second optical power. Since the first optical power and the second optical power are both actual measurement values, the accuracy of the calculation result can be effectively guaranteed according to the first optical power and the second optical power, so as to reduce the number of optical power tests while guaranteeing the accuracy of the optoelectronic modulator parameters, thereby effectively improving the efficiency of the optoelectronic modulator parameter measurement.

[0074] In one embodiment of the present application, in order to further illustrate and limit, as shown in Figure 2 Before the step of obtaining the characteristic voltage and the optical power input value of the target optoelectronic modulator, the method further comprises:

[0075] 201. Obtain the output optical power data of the target photoelectric modulator under a preset input voltage.

[0076] 202. The preset input voltage and the output optical power data are fitted to obtain the optical power voltage fitting curve of the target optoelectronic modulator, and the optical power voltage fitting curve is verified.

[0077] 203. If the verification result is that the verification is passed, the voltage value corresponding to the optical power feature point in the optical power voltage fitting curve is extracted to obtain the feature voltage.

[0078] In this embodiment of the invention, the output optical power data is the optical power data corresponding to the output of the target opto-modulator after applying voltage to the target opto-modulator according to each preset input voltage. Different preset input voltages correspond to different output optical powers. The optical power data is fitted with data points that change with the preset input voltage to obtain an optical power-voltage fitting curve reflecting the trend of optical power change. Specifically, the least squares method can be used to fit the data, and this embodiment of the invention does not make specific limitations. After obtaining the optical power-voltage fitting curve, in order to ensure the correctness of the fitting curve, the fitting curve is verified. If the fitting curve passes the verification, the optical power feature points are extracted, that is, the voltage values ​​corresponding to the maximum and minimum optical power points, respectively. The voltage values ​​corresponding to an adjacent set of maximum and minimum optical power points are used as feature voltages.

[0079] It should be noted that, as Figure 3 The figure shows a comparison between the fitted curve of optical power and voltage and the measured curve of optical power and voltage. The fitted curve and the curve plotted from the measured values ​​of optical power and voltage scanned point by point show the same trend. Therefore, based on the voltages corresponding to the maximum and minimum optical power points in the fitted curve, accurate extraction of characteristic voltages can be achieved.

[0080] In one embodiment of the present invention, for further explanation and limitation, the step of verifying the optical power voltage fitting curve includes:

[0081] Obtain the attribute information of the target optoelectronic modulator, and obtain the preset optical power-voltage relationship curve that matches the attribute information from the relationship curve mapping relationship set;

[0082] Calculate the similarity between the optical power-voltage fitting curve and the preset optical power-voltage relationship curve;

[0083] If the curve similarity is greater than or equal to a preset similarity threshold, then the verification result is determined to be a pass.

[0084] If the curve similarity is less than a preset similarity threshold, it is determined that the verification result is failed.

[0085] In the embodiment of the present application, the light power voltage fitting curve obtained by fitting is verified based on a preset light power voltage relationship curve. The preset light power voltage relationship curve is a fitting curve matched with the attribute information of the target optoelectronic modulator. The similarity between the preset light power voltage relationship curve and the light power voltage fitting curve is calculated, and the verification result is determined according to the comparison result of the similarity and the preset similarity threshold. For example, if the calculated similarity is 98%, it is considered that the verification result of the light power voltage fitting curve is passed, and if the calculated similarity is 90%, it is considered that the verification result of the light power voltage fitting curve is failed. The similarity of the two fitting curves can be calculated based on the Euclidean distance of the light power value under the same voltage value, or other similarity algorithms, which are not limited in the embodiment of the present application.

[0086] It should be noted that, since the trend of the light power of different optical crystals or different models of optoelectronic modulators varies with the voltage, in order to ensure the accuracy of the light power voltage fitting curve obtained by fitting, the light power voltage fitting curve is verified based on the preset light power voltage relationship curve with the same attribute information as the current target optoelectronic modulator, which can effectively ensure the accuracy of the light power voltage fitting curve, the accuracy of the characteristic voltage, and the accuracy of the target parameter.

[0087] In one embodiment of the present application, in order to further illustrate and limit, before the step of verifying the light power voltage fitting curve, the method further comprises:

[0088] Obtaining the light power point-by-point voltage scanning data of the optoelectronic modulator of the global attribute type;

[0089] Generating the preset light power voltage relationship curve based on the power point-by-point voltage scanning data of each attribute type;

[0090] Constructing the mapping between the preset light power voltage relationship curve and the corresponding attribute type to obtain a set of relationship curve mapping relationships.

[0091] In the embodiment of the present application, in order to construct the preset optical power-voltage relationship curve, for each attribute type of the optical-electric modulator of all attribute types, the optical power-voltage scanning data is collected. For example, the voltage range is 0-15v, and the optical power-voltage scanning data is the actual measurement data of the optical power under 0.1V, 0.2V, 0.3V,..., 14.9V, 15V collected point by point with 0.1v as a voltage unit. The preset optical power-voltage relationship curve is generated according to the actual measurement data of the optical power corresponding to each voltage value. The mapping relationship between the obtained preset optical power-voltage relationship curve and the attribute type of the corresponding optical-electric modulator is established. The attribute type can be the product model of the optical-electric modulator, the optical crystal type, etc., which is not limited in the embodiment of the present application.

[0092] In an embodiment of the present application, in order to further illustrate and limit, the step of calculating the target parameter of the target optical-electric modulator according to the first optical power, the second optical power, the optical power input value and the characteristic voltage includes:

[0093] calculating an optical power loss value according to the first optical power and the optical power input value;

[0094] calculating a polarization value according to the first optical power and the second optical power;

[0095] calculating the difference between the first characteristic voltage and the second characteristic voltage to obtain a bias voltage.

[0096] In the embodiment of the present application, the target parameter includes the optical power loss value, the polarization value and the bias voltage. The optical power loss value is set as IL, the optical power input value is set as IL0, the first optical power is set as IL1, the second optical power is set as IL2, the first characteristic voltage is set as DC Vπ1, and the second characteristic voltage is set as DC Vπ2. max The optical power loss value is IL=IL0-(-10*logIL1-IL2)(1). max The polarization value is set as ER, and the second optical power is set as IL2. min The polarization value is ER=-10*logIL2(2). max The bias voltage is set as DC Vπ, and the first characteristic voltage is set as DC Vπ1, and the second characteristic voltage is set as DC Vπ2. min The bias voltage is DC Vπ=DC Vπ2-DC Vπ1(3).

[0097] In an embodiment of the present application, in order to further illustrate and limit, after the step of calculating the target parameter of the target optical-electric modulator according to the first optical power, the second optical power, the optical power input value and the characteristic voltage, the method further includes:

[0098] If the target parameter is greater than the first preset parameter threshold or less than the second preset parameter threshold, the preset input voltage will be updated.

[0099] The optical power voltage fitting curve is regenerated based on the updated preset input voltage to obtain the updated optical power voltage fitting curve, and the feature voltage is extracted based on the updated optical power voltage fitting curve.

[0100] In this embodiment of the invention, after calculating the target parameter, to ensure the accuracy of the target parameter result, the target parameter is compared with a first preset parameter threshold and a second preset parameter threshold. If the target parameter is within the range defined by the first and second preset parameter thresholds, it indicates that the target parameter is accurate; if the target parameter exceeds the range defined by the first and second preset parameter thresholds, it indicates that the target parameter is incorrect. The first preset parameter threshold can be configured according to the lower limit standard of the target parameter specification value, and the second preset parameter threshold can be configured according to the upper limit standard of the target parameter specification value. For example, in the specification of optical power loss value, the upper limit standard is 'a' and the lower limit standard is 'b'. The first preset parameter threshold is configured as 'a', and the second preset parameter threshold is configured as 'b'. If the optical power loss value c in the target parameter has a < c < b, then the optical power loss value is qualified; otherwise, the optical power loss value is determined to be unqualified. If the target parameter is incorrect, it may be due to the excessive concentration of the preset input voltage values, which leads to inaccurate extraction of the characteristic voltage in the optical power voltage fitting curve. Therefore, when the target parameter is incorrect, the preset input voltage is reset and the optical power voltage fitting curve is regenerated in order to extract new characteristic voltages and remeasure the first and second optical power under the characteristic voltages.

[0101] This invention provides a method for determining the parameters of an optoelectronic modulator. In this embodiment, the method acquires the characteristic voltage and optical power input value of the target optoelectronic modulator. The characteristic voltage includes a first characteristic voltage and a second characteristic voltage, which are extracted from an optical power-voltage fitting curve. A first voltage input value is configured based on the first characteristic voltage, and a first optical power is acquired under the first voltage input value. A second voltage input value is configured based on the second characteristic voltage, and a second optical power is acquired under the second voltage input value. The target parameters of the target optoelectronic modulator are calculated based on the first optical power, the second optical power, the optical power input value, and the characteristic voltage. This significantly reduces the amount of optical power data measurement, shortens the measurement time, and ensures measurement accuracy, thereby greatly improving the efficiency of determining the optoelectronic modulator parameters.

[0102] Furthermore, as a response to the above Figure 1 The implementation of the method shown in this invention provides a parameter determination device for an optoelectronic modulator, such as...Figure 4 The device comprises:

[0103] The acquisition module 31 is configured to acquire characteristic voltages and an optical power input value of a target optoelectronic modulator, the characteristic voltages comprising a first characteristic voltage and a second characteristic voltage, the characteristic voltages being extracted from an optical power voltage fitting curve;

[0104] The configuration module 32 is configured to configure a first voltage input value according to the first characteristic voltage and acquire a first optical power collected at the first voltage input value, and configure a second voltage input value according to the second characteristic voltage and acquire a second optical power collected at the second voltage input value.

[0105] The calculation module 33 is configured to calculate a target parameter of the target optoelectronic modulator according to the first optical power, the second optical power, the optical power input value and the characteristic voltages.

[0106] Further, the device further comprises:

[0107] The acquisition module 31 is further configured to acquire output optical power data of the target optoelectronic modulator at a preset input voltage.

[0108] The processing module is configured to perform fitting processing on the preset input voltage and the output optical power data to obtain an optical power voltage fitting curve of the target optoelectronic modulator, and to perform verification on the optical power voltage fitting curve.

[0109] The extraction module is configured to, if the verification result passes the verification, extract voltage values corresponding to optical power characteristic points in the optical power voltage fitting curve to obtain characteristic voltages.

[0110] Further, the processing module further comprises:

[0111] The acquisition unit is configured to acquire attribute information of the target optoelectronic modulator, and acquire a preset optical power voltage relationship curve matching the attribute information from a relationship curve mapping relationship set.

[0112] The second calculation unit is configured to calculate a curve similarity between the optical power voltage fitting curve and the preset optical power voltage relationship curve.

[0113] The first verification unit is configured to, if the curve similarity is greater than or equal to a preset similarity threshold, determine that the verification result passes the verification.

[0114] The first verification unit is configured to, if the curve similarity is less than the preset similarity threshold, determine that the verification result does not pass the verification.

[0115] Further, the device further comprises:

[0116] The acquisition module 31 is further configured to acquire the point-by-point voltage scanning data of the optical power of the global attribute type of the electro-optical modulator.

[0117] The generation module is configured to generate a preset optical power-voltage relationship curve based on the power point-by-point voltage scanning data of each attribute type.

[0118] The construction module is configured to construct a mapping between the preset optical power-voltage relationship curve and the corresponding attribute type, to obtain a set of relationship curve mapping relationships.

[0119] Further, the calculation module 33 comprises:

[0120] The third calculation unit is configured to calculate an optical power loss value according to the first optical power and the optical power input value.

[0121] The fourth calculation unit is configured to calculate a polarization value according to the first optical power and the second optical power.

[0122] The fifth calculation unit is configured to calculate a difference value between the first characteristic voltage and the second characteristic voltage, to obtain a bias voltage.

[0123] Further, the device further comprises:

[0124] The first update module is configured to update the preset input voltage if the target parameter is greater than a first preset parameter threshold or smaller than a second preset parameter threshold.

[0125] The second update module is configured to regenerate an optical power-voltage fitting curve based on the updated preset input voltage, to obtain an updated optical power-voltage fitting curve, and extract a characteristic voltage based on the updated optical power-voltage fitting curve.

[0126] The present application provides a kind of parameter determination device of electro-optical modulator, and the present application embodiment is by obtaining the characteristic voltage of target electro-optical modulator, optical power input value, the characteristic voltage includes first characteristic voltage, second characteristic voltage, and the characteristic voltage is extracted from optical power-voltage fitting curve;According to the first characteristic voltage configuration first voltage input value, and obtain the first optical power of first voltage input value under acquisition, according to the second characteristic voltage configuration second voltage input value, and obtain the second optical power of second voltage input value under acquisition;According to the first optical power, the second optical power, the optical power input value, the characteristic voltage calculation obtains the target parameter of target electro-optical modulator, greatly reduces the measurement amount of optical power data, reduces the measurement time, and also ensures the accuracy of measurement, to greatly improve the efficiency of electro-optical modulator parameter determination.

[0127] According to one embodiment of the present application, a storage medium is provided, which stores at least one executable instruction, and the computer executable instruction is used to execute the parameter determination method of the optoelectronic modulator in any of the above method embodiments.

[0128] Figure 5 A structure diagram of a terminal according to one embodiment of the present application is shown, and the specific embodiments of the present application do not limit the specific implementation of the terminal.

[0129] As shown in Figure 5 the terminal can include a processor 402, a communications interface 404, a memory 406, and a communications bus 408.

[0130] The processor 402, the communications interface 404, and the memory 406 can communicate with each other through the communications bus 408.

[0131] The communications interface 404 is configured to communicate with network elements such as clients or other servers.

[0132] The processor 402 is configured to execute the program 410, and specifically can execute the related steps in the parameter determination method of the optoelectronic modulator.

[0133] Specifically, the program 410 can include program codes, and the program codes include computer operation instructions.

[0134] The processor 402 can be a central processing unit (CPU), or an application specific integrated circuit (ASIC), or one or more integrated circuits configured to implement embodiments of the present application. The one or more processors included in the terminal can be the same type of processor, such as one or more CPUs; or can be different types of processors, such as one or more CPUs and one or more ASICs.

[0135] The memory 406 is configured to store the program 410. The memory 406 can include a high-speed RAM memory, and can also include a non-volatile memory, such as at least one disk memory.

[0136] The program 410 can be specifically used to cause the processor 402 to perform the following operations:

[0137] obtain a characteristic voltage and an optical power input value of a target optoelectronic modulator, the characteristic voltage including a first characteristic voltage and a second characteristic voltage, the characteristic voltage being extracted from an optical power voltage fitting curve;

[0138] configuring a first voltage input value according to the first characteristic voltage, and obtaining a first optical power collected under the first voltage input value; configuring a second voltage input value according to the second characteristic voltage, and obtaining a second optical power collected under the second voltage input value;

[0139] calculating a target parameter of the target optoelectronic modulator according to the first optical power, the second optical power, the optical power input value and the characteristic voltage.

[0140] Obviously, those skilled in the art should understand that the modules or steps of the present application described above can be realized by general computing devices, which can be concentrated on a single computing device, or distributed on a network composed of multiple computing devices, and optionally, they can be realized by program codes executable by computing devices, so that they can be stored in storage devices and executed by computing devices, and in some cases, the steps shown or described can be executed in different order, or they can be respectively manufactured into individual integrated circuit modules, or multiple modules or steps among them can be manufactured into a single integrated circuit module to realize. Thus, the present application is not limited to any specific combination of hardware and software.

[0141] The above only describes the preferred embodiments of the present application and is not used to limit the present application. For those skilled in the art, the present application can have various modifications and changes. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A method of determining parameters of an electro-optic modulator, characterized by, The method comprises the following steps: obtaining characteristic voltages and light power input values of a target optoelectronic modulator, wherein the characteristic voltages comprise a first characteristic voltage and a second characteristic voltage, and the characteristic voltages are extracted from a light power voltage fitting curve; configuring a first voltage input value according to the first characteristic voltage and obtaining a first light power collected under the first voltage input value, configuring a second voltage input value according to the second characteristic voltage and obtaining a second light power collected under the second voltage input value; calculating target parameters of the target optoelectronic modulator according to the first light power, the second light power, the light power input values and the characteristic voltages, wherein the target parameters comprise a light power loss value, a polarization value and a bias voltage, and the calculation process of the target parameters comprises: calculating the light power loss value according to the first light power and the light power input values; calculating the polarization value according to the first light power and the second light power; and calculating the bias voltage by calculating the difference between the first characteristic voltage and the second characteristic voltage.

2. The method of claim 1, wherein, Before the step of obtaining the characteristic voltages and the light power input values of the target optoelectronic modulator, the method further comprises the following steps: obtaining output light power data of the target optoelectronic modulator under a preset input voltage; performing fitting processing on the preset input voltage and the output light power data to obtain a light power voltage fitting curve of the target optoelectronic modulator, and verifying the light power voltage fitting curve; if the verification result is passed, extracting voltage values corresponding to light power characteristic points in the light power voltage fitting curve to obtain characteristic voltages.

3. The method of claim 2, wherein, The verification of the light power voltage fitting curve comprises the following steps: obtaining attribute information of the target optoelectronic modulator, and obtaining a preset light power voltage relationship curve matched with the attribute information from a relationship curve mapping relationship set; calculating a curve similarity between the light power voltage fitting curve and the preset light power voltage relationship curve; if the curve similarity is greater than or equal to a preset similarity threshold, it is determined that the verification result is passed; if the curve similarity is less than the preset similarity threshold, it is determined that the verification result is not passed.

4. The method of claim 2, wherein, Before the verification of the light power voltage fitting curve, the method further comprises the following steps: obtaining light power point-by-point voltage scanning data of optoelectronic modulators of a global attribute type; generating a preset light power voltage relationship curve based on the power point-by-point voltage scanning data of each attribute type; mapping the preset light power voltage relationship curve and the corresponding attribute type to obtain a relationship curve mapping relationship set.

5. The method of claim 2, wherein, After the calculation of the target parameters of the target optoelectronic modulator according to the first light power, the second light power, the light power input values and the characteristic voltages, the method further comprises the following steps: if the target parameters are greater than a first preset parameter threshold or less than a second preset parameter threshold, the preset input voltage is updated. The light power voltage fitting curve is regenerated based on the updated preset input voltage, an updated light power voltage fitting curve is obtained, and a characteristic voltage is extracted based on the updated light power voltage fitting curve.

6. A parameter determination apparatus for an electro-optic modulator, characterized by The method comprises the following steps: An acquisition module is configured to acquire a characteristic voltage of a target optoelectronic modulator and a light power input value, wherein the characteristic voltage comprises a first characteristic voltage and a second characteristic voltage, and the characteristic voltage is extracted from a light power voltage fitting curve; A configuration module is configured to configure a first voltage input value according to the first characteristic voltage, acquire a first light power collected under the first voltage input value, configure a second voltage input value according to the second characteristic voltage, and acquire a second light power collected under the second voltage input value; A calculation module is configured to calculate a target parameter of the target optoelectronic modulator according to the first light power, the second light power, the light power input value, and the characteristic voltage, wherein the target parameter comprises a light power loss value, a polarization value, and a bias voltage, and the calculation process of the target parameter comprises the following steps: calculating the light power loss value according to the first light power and the light power input value; calculating the polarization value according to the first light power and the second light power; and calculating the bias voltage by calculating the difference between the first characteristic voltage and the second characteristic voltage.

7. The apparatus of claim 6, wherein, The device further comprises: The acquisition module is further configured to acquire output light power data of the target optoelectronic modulator under a preset input voltage; A processing module is configured to perform fitting processing on the preset input voltage and the output light power data to obtain a light power voltage fitting curve of the target optoelectronic modulator, and perform verification on the light power voltage fitting curve; An extraction module is configured to extract a voltage value corresponding to a light power characteristic point in the light power voltage fitting curve to obtain a characteristic voltage if the verification result passes the verification.

8. A storage medium having at least one executable instruction stored therein, wherein the executable instruction causes a processor to perform operations corresponding to the parameter determination method of the optoelectronic modulator according to any one of claims 1-5.

9. A terminal comprising: A processor, a memory, a communication interface, and a communication bus, wherein the processor, the memory, and the communication interface complete communication with each other through the communication bus; The memory is configured to store at least one executable instruction, and the executable instruction causes the processor to perform operations corresponding to the parameter determination method of the optoelectronic modulator according to any one of claims 1-5.

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