A PCB testing mechanism

Abstract

The embodiment of the application belongs to the field of production testing, and relates to a PCB testing mechanism. The PCB testing mechanism comprises a mounting frame, a driving device, a quick-change device and a needle plate device. The driving device is arranged on the mounting frame, the quick-change device is connected with the moving end of the driving device, and the needle plate device is connected with the quick-change device. The quick-change device comprises a first fixed plate, a first sliding rail and a stop block. The first fixed plate is connected with the movable end of the driving device, the first sliding rail is arranged on the end face of the first fixed plate away from the driving device, a sliding groove is formed in the side of the first sliding rail opposite to the first fixed plate, the needle plate device is slidably arranged in the sliding groove, and the stop block is rotatably arranged at the end of the first sliding rail to abut against the entrance and exit of the sliding groove. The application not only has a simple structure, but also realizes fast dismounting and mounting of the needle plate device, thereby improving the efficiency of maintaining the needle plate device and the efficiency of testing various PCBs.

Description

Technical Field

[0001] This application relates to the field of production testing technology, and more specifically, to a PCB testing mechanism. Background Technology

[0002] After the PCB board is manufactured, it needs to be tested. As a result, testing mechanisms for PCB boards have emerged in the market. Most PCB testing mechanisms include a drive unit and a pin plate. The pin plate is fixedly connected to the moving end of the drive unit. The drive unit drives the pin plate to contact the PCB board to realize the PCB board test. However, the process of replacing the pin plate in this type of PCB testing mechanism is complicated, which leads to slow disassembly and installation of the pin plate, resulting in low efficiency in maintaining the pin plate and low efficiency in testing multiple types of PCB boards. Summary of the Invention

[0003] This application provides a PCB testing mechanism to solve the problems in the prior art where the disassembly and replacement of pin boards is slow, resulting in low efficiency in maintaining pin boards and testing multiple PCB boards.

[0004] To address the aforementioned technical problems, this application provides a PCB testing mechanism, which employs the following technical solution:

[0005] A PCB testing mechanism includes: a mounting frame, a driving device, a quick-change device, and a pin plate device. The driving device is mounted on the mounting frame, the quick-change device is connected to the moving end of the driving device, and the pin plate device is connected to the quick-change device. The quick-change device includes a first fixed plate, a first slide rail, and a stop. The first fixed plate is connected to the moving end of the driving device. The first slide rail is located on the end face of the first fixed plate away from the driving device. A groove is formed on the side of the first slide rail opposite to the first fixed plate. The pin plate device slides within the groove. The stop is rotatably located at the end of the first slide rail to abut against the inlet and outlet of the groove.

[0006] Furthermore, the PCB testing mechanism also includes a flipping device, which is mounted on the mounting frame and connected to the driving device. The flipping device includes a rotating shaft, a flipping positioning pin, and a flipping positioning block. The rotating shaft is rotatably mounted on the mounting frame and connected to the driving device. The flipping positioning pin is mounted on the mounting frame and spaced apart from the rotating shaft. The flipping positioning block is mounted on the driving device and cooperates with the flipping positioning pin to fix the driving device.

[0007] Furthermore, the needle plate device includes a needle plate assembly, a floating assembly, and a probe assembly; the needle plate assembly is slidably disposed in the groove, the floating assembly and the probe assembly are spaced apart on the end face of the needle plate assembly away from the quick-change device, and the movable ends of the floating assembly and the probe assembly can move toward or away from the needle plate assembly.

[0008] Furthermore, the probe assembly includes an elastic probe and / or a microneedle module, the elastic probe and the microneedle module being spaced apart on the needle plate assembly; the microneedle module includes a fixing block, a probe body, an adapter, a floating shaft, and microneedles, the fixing block being inserted through the needle plate assembly, the probe body being inserted through the fixing block, the adapter being located at one end of the fixing block away from the needle plate assembly and in contact with the probe body, the floating shaft being threadedly connected to both ends of the adapter, the microneedles being slidably connected to the floating shaft, and the microneedles being in contact with the adapter.

[0009] Furthermore, the floating assembly includes an elastic element and a floating plate. The elastic element is disposed on the end face of the needle plate assembly away from the quick-change device, and the floating plate is connected to the end of the elastic element away from the needle plate assembly.

[0010] Furthermore, the test structure also includes a carrier device, which is located within the mounting frame and below the needle plate device; a buffer positioning rod is provided on the end face of the needle plate assembly near the carrier device, and the height of the buffer positioning rod protruding from the needle plate assembly is greater than the height of the floating assembly and the probe assembly protruding from the needle plate assembly; a buffer positioning hole that cooperates with the buffer positioning rod is provided on the end face of the carrier device near the needle plate device.

[0011] Furthermore, the carrier device includes a second slide rail, an inlet / outlet cylinder, and a carrier plate. One end of the second slide rail is located inside the mounting frame. The inlet / outlet cylinder is disposed adjacent to the end of the second slide rail located inside the mounting frame. The carrier plate is connected to the moving end of the inlet / outlet cylinder. The carrier plate is slidably connected to the second slide rail. The buffer positioning rod is disposed on the carrier plate.

[0012] Furthermore, the PCB testing mechanism also includes a shifting device, which is disposed on the end face of the mounting bracket away from the driving device and spaced apart from the pin plate device. The shifting device includes a third slide rail and a mounting plate, the mounting plate being slidably connected to the third slide rail, and the mounting bracket being mounted on the mounting plate.

[0013] Furthermore, the PCB testing mechanism also includes a mobile trolley, which is equipped with multiple testing stations. Each testing station is equipped with the mounting frame, driving device, quick-change device, and pin plate device.

[0014] Furthermore, the PCB testing mechanism also includes a locking device, which is mounted on the mobile trolley and connected to the drive device. The locking device includes a locking cylinder and a locking positioning pin. The locking cylinder is mounted on the mobile trolley, and the locking positioning pin is connected to the moving end of the locking cylinder. The drive device is provided with a locking positioning block, and the locking positioning pin cooperates with the locking positioning block.

[0015] Compared with the prior art, the embodiments of this application have the following advantages: On the one hand, the quick-change device has a simple structure, and the installation and separation of the pin plate device can be realized through the first slide rail and the stop block. Setting up the quick-change device will not significantly increase the cost of the PCB testing mechanism. On the other hand, the replacement process of the pin plate device is simple, making the disassembly and installation of the pin plate device fast, facilitating the maintenance of the pin plate device, and also facilitating the replacement of different pin plate devices according to different PCB boards, greatly improving the efficiency of the PCB testing mechanism in testing multiple PCB boards. Moreover, the first fixed plate of the quick-change device is connected to the driving device, and the pin plate device is then connected to the first fixed plate through the slide rail, so that the driving device can normally drive the up and down movement of the pin plate device without affecting the testing of the PCB board. The PCB testing mechanism provided by the embodiments of this application, while having a simple structure, also achieves fast disassembly and installation of the pin plate device, thereby improving the efficiency of maintaining the pin plate device and the efficiency of testing multiple PCB boards. Attached Figure Description

[0016] To more clearly illustrate the solution of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 This is a schematic diagram of a PCB testing mechanism provided in an embodiment of the present invention;

[0018] Figure 2 This is a schematic diagram of a PCB testing mechanism with the mobile carriage hidden, provided by an embodiment of the present invention;

[0019] Figure 3 This is a schematic diagram of a PCB testing mechanism with a hidden moving carriage and a flipping drive device provided in an embodiment of the present invention;

[0020] Figure 4 yes Figure 3 Enlarged view of point A in the middle;

[0021] Figure 5 This is a schematic diagram of a pinboard device in a PCB testing mechanism provided by an embodiment of the present invention;

[0022] Figure 6 This is a schematic diagram of a microneedle module in a PCB testing mechanism provided by an embodiment of the present invention;

[0023] Figure 7 This is a schematic diagram of a micro-needle module in a PCB testing mechanism provided by an embodiment of the present invention from another angle;

[0024] Figure 8 This is a reference diagram of the contact points on the PCB board.

[0025] Figure label:

[0026] 1. Mounting bracket; 2. Drive unit; 21. Locking and positioning block; 22. Second fixing plate; 23. Drive component; 24. Guide shaft; 3. Quick-change device; 31. First fixing plate; 32. First slide rail; 33. Stop block; 34. Spring ball;

[0027] 4. Needle plate assembly; 41. Needle plate assembly; 411. Upper plate; 412. Lower plate; 413. Connecting rod; 414. Buffer positioning rod; 42. Floating assembly; 421. Elastic element; 422. Floating plate; 43. Probe assembly; 431. Elastic probe; 432. Microneedle module; 433. Fixing block; 434. Probe body; 435. Adapter; 4351. Adapter PCB board; 4352. Floating element; 436. Floating shaft; 437. Microneedle component; 4371. Mounting block; 4372. Microneedle body; 4373. Groove;

[0028] 5. Tilting device; 51. Rotating shaft; 52. Tilting positioning pin; 53. Tilting positioning block;

[0029] 6. Carrier device; 61. Buffer positioning hole; 62. Second slide rail; 63. Inlet / outlet cylinder; 64. Carrier plate;

[0030] 7. Shifting device; 71. Third slide rail; 72. Mounting plate;

[0031] 8. Moving trolley; 9. Locking device; 91. Locking cylinder; 92. Locking positioning pin. Detailed Implementation

[0032] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terminology used herein in the specification of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application; the terms "comprising" and "having," and any variations thereof, in the specification, claims, and foregoing drawings of this application are intended to cover non-exclusive inclusion. The terms "first," "second," etc., in the specification, claims, or foregoing drawings of this application are used to distinguish different objects, not to describe a particular order.

[0033] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0034] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings.

[0035] This application provides a PCB testing mechanism, such as... Figures 1 to 3 As shown, the PCB testing mechanism includes: a mounting frame 1, a driving device 2, a quick-change device 3, and a pin plate device 4. The driving device 2 is mounted on the mounting frame 1. The quick-change device 3 is connected to the moving end of the driving device 2. The pin plate device 4 is connected to the quick-change device 3. The quick-change device 3 includes a first fixed plate 31, a first slide rail 32, and a stop block 33. The first fixed plate 31 is connected to the moving end of the driving device 2. The first slide rail 32 is located on the end face of the first fixed plate 31 away from the driving device 2. A groove is formed on the side of the first slide rail 32 opposite to the first fixed plate 31. The pin plate device 4 slides in the groove. The stop block 33 is rotatably located at the end of the first slide rail 32 to abut against the inlet and outlet of the groove.

[0036] The working principle of the PCB testing mechanism provided in this application embodiment is as follows: First, it can be understood that the test points of the pin plate device 4 correspond to the contact points a on the PCB board to be tested. Contact point a on the PCB board can be found in [reference needed]. Figure 8When testing a PCB board, place the PCB board at the bottom of the pin plate device 4, then start the drive device 2. The drive device 2 drives the first fixing plate 31 of the quick-change device 3 to move toward the PCB board. The first fixing plate 31 drives the pin plate device 4 toward the PCB board, so that the pin plate device 4 contacts the PCB board to conduct electricity and complete the PCB board test. When replacing or maintaining the pin plate device 4, first rotate the stop block 33 so that the stop block 33 no longer blocks the inlet and outlet of the slide, and then take out the pin plate device 4 through the slide, so as to quickly separate the pin plate device 4 from the quick-change device 3. Conversely, when installing the maintained pin plate device 4 or a new pin plate device 4, first put the pin plate device 4 into the first slide rail 32 through the slide, and then rotate the stop block 33 so that the stop block 33 blocks the inlet and outlet of the slide, so as to connect the pin plate device 4 with the quick-change device 3.

[0037] The beneficial effects of the PCB testing mechanism provided in this application embodiment are as follows: On the one hand, the quick-change device 3 has a simple structure, and the pin plate device 4 can be quickly installed and separated through the first slide rail 32 and the stop block 33, and the setting of the quick-change device 3 does not significantly increase the cost of the PCB testing mechanism; on the other hand, the replacement process of the pin plate device 4 is simple, making the disassembly and installation of the pin plate device 4 efficient, facilitating the maintenance of the pin plate device 4, and also facilitating the replacement of different pin plate devices 4 according to different PCB boards, greatly improving the efficiency of the PCB testing mechanism in testing multiple PCB boards. Moreover, the first fixing plate 31 of the quick-change device 3 is connected to the driving device 2, and the pin plate device 4 is then connected to the first fixing plate 31 through the slide groove, so that the driving device 2 can normally drive the up and down movement of the pin plate device 4 without affecting the testing of the PCB board. The PCB testing mechanism provided in this application embodiment, while having a simple structure, also achieves fast disassembly and installation of the pin plate device 4, thereby improving the efficiency of maintaining the pin plate device 4 and the efficiency of testing multiple PCB boards.

[0038] Furthermore, the first slide rail 32 is provided with a plurality of spaced spring beads 34 on one side near the slide groove, and the side wall of the needle plate device 4 abuts against the spring beads 34; the spring beads 34 apply a pushing force to both ends of the needle plate device 4, so that when the driving device 2 drives the quick change device 3 and the needle plate device 4 to move up and down, the positioning of the needle plate device 4 is stable and will not shake.

[0039] Furthermore, there are two first slide rails 32 and two stop blocks 33. The two first slide rails 32 are respectively located at both ends of the first fixed plate 31. The two ends of the needle plate device 4 are slidably connected to the two first slide rails 32 respectively. The two stop blocks 33 are respectively located at the ends of the two first slide rails 32 to abut against the inlet and outlet of the slide groove; thus increasing the balance of the needle plate device 4.

[0040] Furthermore, the first slide rail 32 is provided with a sliding positioning block (not shown) at one end away from the stop block 33. The sliding positioning block abuts against the inlet and outlet at the other end of the slide groove, which can limit the sliding stroke of the needle plate device 4 and make the needle plate device 4 accurately positioned.

[0041] Furthermore, the mounting bracket 1 includes two vertically spaced side plates, and the two sides of the driving device 2 are respectively connected to one of the side plates.

[0042] Furthermore, the PCB testing mechanism also includes a flipping device 5, which is mounted on the mounting frame 1 and connected to the driving device 2. The flipping device 5 includes a rotating shaft 51, a flipping positioning pin 52, and a flipping positioning block 53. The rotating shaft 51 is rotatably mounted on the mounting frame 1 and connected to the driving device 2. The flipping positioning pin 52 is mounted on the mounting frame and spaced apart from the rotating shaft 51. The flipping positioning block 53 is mounted on the driving device 2 and cooperates with the flipping positioning pin 52 to fix the driving device. In this embodiment, the flipping positioning pin 52 is an indexing pin. When maintenance or replacement of the pin plate device 4 is required, the flipping positioning pin 52 is moved to disengage from the flipping positioning block 53, and then the driving device is flipped. 2. At the end away from the rotating shaft 51, the drive device 2 is rotatably connected to the mounting frame 1 via the rotating shaft 51, enabling the drive device 2, quick-change device 3, and needle plate device 4 to be flipped. After flipping, it is convenient for operators to replace the slow-change needle plate device or maintain and inspect the needle plate device 4. After maintaining or replacing the needle plate device 4, the end of the drive device 2 away from the rotating shaft 51 is pressed down, and the drive device 2 is rotatably connected to the mounting frame 1 via the rotating shaft 51. Then, the flip positioning pin 52 is moved to reset the flip positioning pin 52, so that the flip positioning pin 52 is inserted into the flip positioning block 53 again to achieve engagement, realizing the fixed connection between the drive device 2 and the mounting frame 1. This allows the drive device 2 to drive the quick-change device 3 and the needle plate device 4 to move up and down stably, increasing the stability of the PCB testing mechanism.

[0043] Furthermore, there are two rotating shafts 51, two flip positioning pins 52 and two flip positioning blocks 53. The two rotating shafts 51 and two flip positioning pins 52 are respectively located on both sides of the mounting frame 1, and the two flip positioning blocks 53 are respectively located on both sides of the driven device 2, which increases the stability of the driven device 2 when it flips and is fixed.

[0044] like Figures 4 to 7As shown, the needle plate device 4 further includes a needle plate assembly 41, a floating assembly 42, and a probe assembly 43; the needle plate assembly 41 is slidably disposed in the slide groove, and the floating assembly 42 and the probe assembly 43 are spaced apart on the end face of the needle plate assembly 41 away from the quick-change device 3, and the movable ends of the floating assembly 42 and the probe assembly 43 can move toward or away from the needle plate assembly 41; when the driving device 2 drives the quick-change device 3 and the needle plate device 4 to move toward the PCB board, the lower surfaces of the floating assembly 42 and the probe assembly 43 contact the PCB board, and then the driving device 2 continues to press down to make the floating assembly 42... The movable ends of the floating component 42 and the probe assembly 43 are squeezed and move toward the needle plate assembly 41. When the movable ends of the floating component 42 and the probe assembly 43 can no longer move toward the needle plate assembly 41, the driving device 2 stops pressing down. At the same time, the probe assembly 43 is connected to the PCB board to complete the PCB board test. During the pressing down process of the driving device 2, the movement of the movable ends of the floating component 42 and the probe assembly 43 can buffer the pressing down movement of the driving device 2, prevent the driving device 2 from pressing down too fast and causing impact on the PCB board, and protect the PCB product very well, greatly avoiding the occurrence of product damage.

[0045] Further, the probe assembly 43 includes elastic probes 431 and / or microneedle modules 432. The number and layout of the elastic probes 431 and microneedle modules 432 are set according to the contact points on the PCB board, so that the test points of the probe assembly 43 correspond to the contact points on the PCB board. The elastic probes 431 and microneedle modules 432 are spaced apart on the needle plate assembly 41. The microneedle module 432 includes a fixing block 433, a probe body 434, an adapter 435, a floating shaft 436, and microneedles 437. The fixing block 433 passes through the needle plate assembly 41, the probe body 434 passes through the fixing block 433, the adapter 435 is located at the end of the fixing block 433 away from the needle plate assembly 41 and contacts and communicates with the probe body 434, and the floating shaft 436 is threadedly connected to both ends of the adapter 435. The microneedle 437 is slidably connected to the floating shaft 436, and the microneedle 437 can contact and conduct with the adapter 435. When the driving device 2 moves the probe assembly 43 toward the PCB board, the end of the elastic probe 431 in the probe assembly 43 and the microneedle 437 of the microneedle module 432 contact the PCB board. The elastic probe 431 first achieves conduction with the PCB board. When the driving device 2 continues to drive the probe assembly 43 toward the PCB board, the end of the elastic probe 431 is squeezed and contracted, and the microneedle 437 moves toward the adapter 435 through the floating shaft 436. When the microneedle 437 contacts the adapter 435 and achieves conduction but cannot continue to move toward the adapter 435, the driving device 2 stops pressing down. At the same time, conduction is achieved between the PCB board, the microneedle 437, the adapter 435 and the probe body 434, and finally the PCB board test is completed.

[0046] Furthermore, a spring (not shown) is sleeved on the floating shaft 436, with the two ends of the spring abutting against the microneedle 437 and the adapter 435 respectively; when the drive device 2 resets and no longer exerts a downward force on the needle plate assembly 41, the spring returns to its original shape, causing the microneedle 437 to separate from the adapter 435 and stop the conduction.

[0047] It should be noted that the upper and lower surfaces of the adapter 435 are provided with conductive points, and the upper surface of the microneedle 437 is also provided with conductive points. Thus, when the microneedle 437 contacts the lower surface of the adapter 435, the microneedle 437, the adapter 435 and the probe body 434 are connected.

[0048] The moving end of the probe assembly 43 consists of the end of the elastic probe 431 and the microneedle 437 of the microneedle module 432. The elastic probe 431 and the microneedle module 432 can buffer the downward movement of the drive device 2, preventing the drive device 2 from pressing too fast and impacting the PCB board. This effectively protects the PCB product and the probe assembly 43, greatly avoiding damage to the product and the probe assembly 43, increasing the service life of the probe assembly 43 and reducing maintenance costs. When the microneedle 437 is damaged or the PCB board to be tested is changed, the floating shaft 436 is rotated to separate the floating shaft 436 from the adapter 435. Then, the microneedle 437 is removed from the floating shaft 436, a new microneedle 437 is obtained and fitted onto the floating shaft 436, and finally, the floating shaft 436 is threadedly connected to the adapter 435. This allows the microneedle 437 to be replaced without replacing the entire microneedle module 432 or the pin board assembly 41, reducing maintenance costs and the cost of testing multiple PCB boards.

[0049] Specifically, the microneedle component 437 includes a mounting block 4371 and a microneedle body 4372. The upper surface of the mounting block 4371 is provided with a conductive point. The mounting block 4371 is slidably connected to the floating shaft 436. The mounting block 4371 can contact and conduct with the adapter 435. The bottom of the mounting block 4371 is provided with a groove 4373. The microneedle body 4372 is located in the groove 4373. The mounting block 4371 protrudes from the microneedle body 4372. During the downward pressing process of the driving device 2, the mounting block 4371 first contacts the PCB board, and then the contact point between the microneedle body 4372 and the PCB board makes contact to achieve conduction. The mounting block 4371 buffers the downward pressing movement of the driving device 2, greatly avoiding damage to the microneedle component 437 and verifying the service life of the microneedle component 437.

[0050] It should be noted that the test points of the needle plate device 4 are the end of the elastic probe 431 and the microneedle body 4372 of the microneedle component 437 in the microneedle module 432.

[0051] Furthermore, the adapter 435 includes: an adapter PCB board 4351 and a floating component 4352. The adapter PCB board 4351 is disposed at the end of the fixed block 433 away from the needle plate assembly 41 and is in contact with and connected to the probe body 434. The floating component 4352 is disposed at the end of the adapter PCB board 4351 away from the fixed block 433 and is in contact with the adapter PCB board 4351. The floating shaft 436 is disposed on the floating component 4352. The upper and lower surfaces of the floating component 4352 are provided with conductive points to realize the conduction between the adapter PCB board 4351 and the micro needle component 437. The floating component 4352 can avoid the floating shaft 436 from being threadedly connected to the adapter PCB board 4351, thereby reducing the wear of the adapter PCB board 4351.

[0052] In a preferred embodiment, the needle plate assembly 41 includes an upper plate 411 and a lower plate 412, which are connected by a connecting rod 413. The upper plate 411 is slidably connected to the first slide rail 32, and the floating assembly 42 and the probe assembly 43 are disposed on the lower plate 412. The upper plate 411 can prevent the top of the probe assembly 43 from rubbing against the first fixed plate 31 of the quick-change device 3 and causing wear, and also facilitates the wiring of the probe assembly 43.

[0053] Furthermore, there are two floating components 42, which are located at both ends of the needle plate assembly 41. Each floating component 42 includes an elastic element 421 and a floating plate 422. The elastic element 421 is located on the end face of the needle plate assembly 41 away from the quick-change device 3, and the floating plate 422 is connected to the end of the elastic element 421 away from the needle plate assembly 41. When the driving device 2 moves the needle plate assembly 4 towards the PCB board, the bottom surface of the floating plate 422 contacts the PCB board. When the driving device 2 continues to drive... When the pin plate assembly 4 moves toward the PCB board, the elastic element 421 is squeezed and contracted, and the floating element 4352 moves toward the pin plate assembly 41. When the drive device 2 resets and no longer exerts a downward force on the pin plate assembly 41, the elastic element 421 returns to its original shape, causing the floating plate 422 to reset, and then the drive device 2 presses down again to buffer it. The floating component 42 buffers the downward movement of the drive device 2, preventing the drive device 2 from pressing down too fast and impacting the PCB board, thus protecting the PCB product very well and greatly avoiding damage to the product.

[0054] like Figures 1 to 3As shown, the test structure further includes a carrier device 6, which is located inside the mounting frame 1 and below the needle plate device 4. A buffer positioning rod 414 is provided on the end face of the needle plate assembly 41 near the carrier device 6. The height of the buffer positioning rod 414 protruding from the needle plate assembly 41 is greater than the height of the floating assembly 42 and the probe assembly 43 protruding from the needle plate assembly 41. A buffer positioning hole 61 that cooperates with the buffer positioning rod 414 is provided on the end face of the carrier device 6 near the needle plate device 4. When the drive device 2 drives the quick-change device 3 and the pin plate device 4 to move toward the PCB board, the buffer positioning rod 414 first inserts into the buffer positioning hole 61 for a first buffering action; as the drive device 2 continues to press down, the moving ends of the floating component 42 and the probe component 43 contact the PCB board for a second buffering action; as the drive device 2 continues to press down, the moving ends of the floating component 42 and the probe component 43 are squeezed, and finally the probe component 43 makes contact with the PCB board, realizing PCB board testing; the buffer positioning rod 414, the buffer positioning hole 61, the floating component 42 and the probe component 43 provide multiple buffers for the downward movement of the drive device 2, effectively protecting the PCB product and preventing damage to the product.

[0055] Furthermore, a damping sleeve is provided inside the buffer positioning hole 61; this increases the friction between the buffer positioning hole 61 and the buffer positioning rod 414, further buffering the force generated when the drive device 2 presses down.

[0056] Furthermore, the carrier device 6 includes a second slide rail 62, an inlet / outlet cylinder 63, and a carrier plate 64. One end of the second slide rail 62 is located inside the mounting frame 1. The inlet / outlet cylinder 63 is disposed adjacent to the end of the second slide rail 62 located inside the mounting frame 1. The carrier plate 64 is connected to the moving end of the inlet / outlet cylinder 63. The carrier plate 64 is slidably connected to the second slide rail 62. The buffer positioning rod 414 is disposed on the carrier plate 64. The inlet / outlet cylinder 63 drives the carrier plate 64 to move on the second slide rail 62, so that the carrier plate 64 enters and exits the mounting frame 1, which facilitates the operator to place and replace PCB boards on the carrier plate 64.

[0057] Furthermore, the PCB testing mechanism also includes a shifting device 7, which is located on the end face of the mounting frame 1 away from the driving device 2 and spaced apart from the pin plate device 4. The shifting device 7 includes a third slide rail 71 and a mounting plate 72, which is slidably connected to the third slide rail 71. The mounting frame 1 is mounted on the mounting plate 72. The mounting frame 1 can be dragged along the third slide rail 71 via the mounting plate 72, which facilitates the maintenance and inspection of the driving device 2, quick-change device 3, pin plate device 4, and flipping device 5 by the operator.

[0058] In a preferred embodiment, the second slide rail 62 and the inlet / outlet cylinder 63 are disposed on the mounting plate 72, which facilitates the maintenance and inspection of the carrier device 6 by the operator.

[0059] like Figure 7 As shown, the PCB testing mechanism further includes a mobile trolley 8, which is equipped with multiple testing stations. Each testing station is equipped with the mounting frame 1, the driving device 2, the quick-change device 3, and the pin plate device 4. The mobile trolley 8 increases the mobility of the PCB testing mechanism, and the multiple testing stations facilitate the simultaneous testing of multiple PCBs or various types of PCBs, thereby increasing testing efficiency.

[0060] Furthermore, the PCB testing mechanism also includes a locking device 9, which is mounted on the moving trolley 8 and connected to the drive device 2. The locking device 9 includes a locking cylinder 91 and a locking positioning pin 92. The locking cylinder 91 is mounted on the moving trolley 8, and the locking positioning pin 92 is connected to the moving end of the locking cylinder 91. The drive device 2 is provided with a locking positioning block 21, and the locking positioning pin 92 cooperates with the locking positioning block 21. When the locking positioning pin 92 cooperates with the locking positioning block 21, the mounting frame 1 cannot be moved, which can prevent the mounting frame 1 from shifting during the movement of the moving trolley 8. When it is necessary to move the mounting frame 1 to inspect and maintain the drive device 2, quick-change device 3, and pin plate device 4, the locking positioning pin 92 is driven out of the locking positioning block 21 by the locking cylinder 91.

[0061] In a preferred embodiment, each of the test stations is provided with the mounting frame 1, drive device 2, quick-change device 3, needle plate device 4, flipping device 5, carrier device 6, moving device and locking device 9.

[0062] Furthermore, the driving device 2 includes a second fixing plate 22 and a driving member 23. The second fixing plate 22 is disposed on the mounting bracket 1, and the driving member 23 is disposed on the second fixing plate 22 and connected to the first fixing plate 31 of the quick-change device 3.

[0063] Furthermore, the driving device 2 also includes a plurality of guide shafts 24, which pass through the second fixing plate 22 and are connected to the first fixing plate 31.

[0064] Specifically, the second fixing plate 22 is U-shaped, and both sides of the second fixing plate 22 are rotatably connected to the mounting bracket 1.

[0065] Specifically, the driving component 23 is a driving cylinder, and the moving end of the driving cylinder is connected to the first fixed plate 31. Alternatively, the driving component 23 can be a motor, a lead screw, and a nut, with the motor mounted on the second fixed plate 22, the moving end of the motor connected to the lead screw, and the nut slidably mounted on the lead screw and connected to the first fixed plate 31.

[0066] Obviously, the embodiments described above are only some embodiments of this application, not all embodiments. The accompanying drawings show preferred embodiments of this application, but do not limit the patent scope of this application. This application can be implemented in many different forms; rather, the purpose of providing these embodiments is to provide a more thorough and comprehensive understanding of the disclosure of this application. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing specific embodiments, or make equivalent substitutions for some of the technical features. Any equivalent structures made using the content of this application's specification and drawings, directly or indirectly applied to other related technical fields, are similarly within the scope of patent protection of this application.

Claims

1. A PCB testing mechanism, characterized in that, include: The device includes a mounting frame, a drive unit, a quick-change device, and a needle plate assembly. The drive unit is mounted on the mounting frame, the quick-change device is connected to the moving end of the drive unit, and the needle plate assembly is connected to the quick-change device. The quick-change device includes a first fixed plate, a first slide rail, and a stop block; the first fixed plate is connected to the movable end of the driving device, the first slide rail is disposed on the end face of the first fixed plate away from the driving device, a slide groove is provided on the side of the first slide rail opposite to the first fixed plate, the needle plate device is slidably disposed in the slide groove, and the stop block is rotatably disposed at the end of the first slide rail to abut against the inlet and outlet of the slide groove. The PCB testing mechanism also includes a flipping device, which is mounted on the mounting frame and connected to the driving device. The flipping device includes a rotating shaft, a flipping positioning pin, and a flipping positioning block. The rotating shaft is rotatably mounted on the mounting frame and connected to the driving device. The flipping positioning pin is mounted on the mounting frame and spaced apart from the rotating shaft. The flipping positioning block is mounted on the driving device and cooperates with the flipping positioning pin to fix the driving device.

2. The PCB testing mechanism according to claim 1, characterized in that, The needle plate device includes a needle plate assembly, a floating assembly, and a probe assembly; the needle plate assembly is slidably disposed in the groove, and the floating assembly and the probe assembly are spaced apart on the end face of the needle plate assembly away from the quick-change device, and the movable ends of the floating assembly and the probe assembly can move toward or away from the needle plate assembly.

3. The PCB testing mechanism according to claim 2, characterized in that, The probe assembly includes an elastic probe and / or a microneedle module, wherein the elastic probe and the microneedle module are spaced apart on the needle plate assembly; The microneedle module includes a fixing block, a probe body, an adapter, a floating shaft, and microneedles. The fixing block is mounted on the needle plate assembly, the probe body is mounted on the fixing block, the adapter is located at the end of the fixing block away from the needle plate assembly and is in contact with the probe body, the floating shaft is threaded to both ends of the adapter, the microneedles are slidably connected to the floating shaft, and the microneedles can contact and communicate with the adapter.

4. The PCB testing mechanism according to claim 2, characterized in that, The floating assembly includes an elastic element and a floating plate. The elastic element is disposed on the end face of the needle plate assembly away from the quick-change device, and the floating plate is connected to the end of the elastic element away from the needle plate assembly.

5. The PCB testing mechanism according to claim 2, characterized in that, The test structure also includes a carrier device, which is disposed within the mounting frame and located below the needle plate device; A buffer positioning rod is provided on the end face of the needle plate assembly near the carrier device. The height of the buffer positioning rod protruding from the needle plate assembly is greater than the height of the floating assembly and the probe assembly protruding from the needle plate assembly. A buffer positioning hole that cooperates with the buffer positioning rod is provided on the end face of the carrier device near the needle plate assembly.

6. The PCB testing mechanism according to claim 5, characterized in that, The carrier device includes a second slide rail, an inlet / outlet cylinder, and a carrier plate. One end of the second slide rail is located inside the mounting frame. The inlet / outlet cylinder is disposed adjacent to the end of the second slide rail located inside the mounting frame. The carrier plate is connected to the moving end of the inlet / outlet cylinder. The carrier plate is slidably connected to the second slide rail. The buffer positioning rod is disposed on the carrier plate.

7. The PCB testing mechanism according to claim 1, characterized in that, The PCB testing mechanism also includes a shifting device, which is disposed on the end face of the mounting bracket away from the driving device and spaced apart from the pin plate device. The shifting device includes a third slide rail and a mounting plate, which is slidably connected to the third slide rail, and the mounting bracket is mounted on the mounting plate.

8. The PCB testing mechanism according to claim 1, characterized in that, The PCB testing mechanism also includes a mobile trolley, which has multiple testing stations. Each testing station is equipped with a mounting frame, a drive device, a quick-change device, and a pin plate device.

9. The PCB testing mechanism according to claim 8, characterized in that, The PCB testing mechanism also includes a locking device, which is mounted on the mobile trolley and connected to the drive device. The locking device includes a locking cylinder and a locking positioning pin. The locking cylinder is mounted on the mobile trolley, and the locking positioning pin is connected to the moving end of the locking cylinder. The drive device is provided with a locking positioning block, and the locking positioning pin cooperates with the locking positioning block.

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