Defect processing method, device, apparatus, and storage medium

Abstract

The present disclosure provides a defect processing method, device, equipment, storage medium and program product, relates to the technical field of computers and data processing, and particularly relates to the technical field of software defect processing. The specific implementation scheme is as follows: for any target party in a plurality of parties, in response to a confirmation instruction for a target defect, a target source is determined according to a candidate source of the target defect, wherein the processing party of the target defect is the target party, the processing party of the target defect is obtained according to a code label of target code including the target defect; the candidate source is determined by the processing party processing the target defect; and in response to a modification operation of the processing party on the target defect, target party defect analysis data is determined.

Description

Technical Field

[0001] This disclosure relates to the fields of computer technology and data processing technology, and in particular to the field of software defect handling technology, specifically to a defect handling method, apparatus, device, storage medium, and program product. Background Technology

[0002] Software defect handling involves recording software defects, tracking their resolution, and verifying their effectiveness. Defect handling can, for example, lead to software quality improvements. Summary of the Invention

[0003] This disclosure provides a defect handling method, apparatus, device, storage medium, and program product.

[0004] According to one aspect of this disclosure, a defect handling method is provided, comprising: for any one of a plurality of participating parties, in response to a confirmation instruction for a target defect, determining a target source based on candidate sources of the target defect, wherein the party handling the target defect is the target party, and the party handling the target defect is obtained based on a code tag including the target code of the target defect; the candidate sources are determined by the party handling the target defect; and in response to a modification operation of the party handling the target defect, determining target party defect analysis data.

[0005] According to another aspect of this disclosure, a defect processing apparatus is provided, comprising: a target source determination module, configured to determine a target source for any one of a plurality of participating parties, in response to a confirmation instruction for a target defect, based on candidate sources of the target defect, wherein the handler of the target defect is the target party, and the handler of the target defect is obtained based on a code tag including the target code of the target defect; the candidate sources are determined by the handler of the target defect; and a target party defect analysis data determination module, configured to determine target party defect analysis data in response to a modification operation of the handler on the target defect.

[0006] According to another aspect of this disclosure, an electronic device is provided, comprising: at least one processor and a memory communicatively connected to the at least one processor. The memory stores instructions executable by the at least one processor, which, when executed by the at least one processor, enables the at least one processor to perform the methods of embodiments of this disclosure.

[0007] According to another aspect of this disclosure, a non-transitory computer-readable storage medium is provided storing computer instructions for causing a computer to perform the methods of embodiments of this disclosure.

[0008] According to another aspect of this disclosure, a computer program product is provided, including a computer program stored on at least one of a readable storage medium and an electronic device, wherein the computer program, when executed by a processor, implements the methods of embodiments of this disclosure.

[0009] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of this disclosure, nor is it intended to limit the scope of this disclosure. Other features of this disclosure will become readily apparent from the following description. Attached Figure Description

[0010] The accompanying drawings are provided to better understand this solution and do not constitute a limitation of this disclosure. Wherein:

[0011] Figure 1 A schematic diagram illustrating the system architecture of a defect handling method and apparatus according to embodiments of the present disclosure is shown.

[0012] Figure 2 A flowchart illustrating a defect handling method according to an embodiment of the present disclosure is shown schematically.

[0013] Figure 3 This illustration schematically shows a defect processing cycle diagram of a defect processing method according to yet another embodiment of the present disclosure;

[0014] Figure 4 A schematic diagram illustrating a defect handling method according to yet another embodiment of the present disclosure is shown.

[0015] Figure 5 A block diagram of a defect handling apparatus according to an embodiment of the present disclosure is schematically shown; and

[0016] Figure 6 A block diagram of an electronic device that can implement the defect handling method of the embodiments of the present disclosure is shown schematically. Detailed Implementation

[0017] The exemplary embodiments of this disclosure are described below with reference to the accompanying drawings, including various details of the embodiments to aid understanding, and should be considered merely exemplary. Therefore, those skilled in the art will recognize that various changes and modifications can be made to the embodiments described herein without departing from the scope and spirit of this disclosure. Similarly, for clarity and brevity, descriptions of well-known functions and structures are omitted in the following description.

[0018] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit this disclosure. The terms “comprising,” “including,” etc., as used herein indicate the presence of features, steps, operations, and / or components, but do not exclude the presence or addition of one or more other features, steps, operations, or components.

[0019] All terms used herein (including technical and scientific terms) have the meanings commonly understood by those skilled in the art, unless otherwise defined. It should be noted that the terms used herein are to be interpreted in a manner consistent with the context of this specification, and not in an idealized or overly rigid way.

[0020] When using expressions such as "at least one of A, B, and C", they should generally be interpreted in accordance with the meaning that is commonly understood by a person skilled in the art (e.g., "a system having at least one of A, B, and C" should include, but is not limited to, a system having A alone, a system having B alone, a system having C alone, a system having A and B, a system having A and C, a system having B and C, and / or a system having A, B, and C, etc.).

[0021] Software defect handling involves recording software defects, tracking their resolution, and verifying their effectiveness. Defect handling can, for example, enable the development of targeted software quality improvement plans. Hereinafter, "software defects (i.e., bugs)" will be referred to as "defects."

[0022] A defect handling system can record defects, which are then assigned by quality assurance personnel to the appropriate personnel for handling. The defect is recorded by the assigned personnel, who then update the status. Quality assurance personnel verify whether the defect has been repaired and closed. The actions of both the handling personnel and quality management personnel can be analyzed to develop a quality improvement plan.

[0023] Defect handling systems are typically based on software products and involve a single team.

[0024] Figure 1 The diagram schematically illustrates the system architecture of a defect handling method and apparatus according to an embodiment of the present disclosure. It should be noted that... Figure 1 The examples shown are merely examples of system architectures that can be applied to the embodiments of this disclosure, in order to help those skilled in the art understand the technical content of this disclosure, but do not mean that the embodiments of this disclosure cannot be used in other devices, systems, environments or scenarios.

[0025] like Figure 1As shown, the system architecture 100 according to this embodiment may include clients 101, 102, and 103, a network 104, and a server 105. The network 104 serves as a medium for providing a communication link between clients 101, 102, and 103 and the server 105. The network 104 may include various connection types, such as wired or wireless communication links, or fiber optic cables, etc.

[0026] Users can use clients 101, 102, and 103 to interact with server 105 via network 104 to receive or send messages, etc. Various communication client applications can be installed on clients 101, 102, and 103, such as shopping applications, web browser applications, search applications, instant messaging tools, email clients, social media platform software, etc. (for example only).

[0027] Clients 101, 102, and 103 can be various electronic devices with displays and web browsing capabilities, including but not limited to smartphones, tablets, laptops, and desktop computers. Clients 101, 102, and 103 in this embodiment of the disclosure can, for example, run applications.

[0028] Server 105 can be a server providing various services, such as a backend management server supporting websites browsed by users using clients 101, 102, and 103 (this is just an example). The backend management server can analyze and process data such as received user requests, and feed back the processing results (such as web pages, information, or data obtained or generated according to user requests) to the clients. Alternatively, server 105 can also be a cloud server, meaning server 105 has cloud computing capabilities.

[0029] It should be noted that the defect handling method provided in this embodiment can be executed by server 105. Correspondingly, the defect handling apparatus provided in this embodiment can be located in server 105. The defect handling method provided in this embodiment can also be executed by a server or server cluster that is different from server 105 and capable of communicating with clients 101, 102, 103 and / or server 105. Correspondingly, the defect handling apparatus provided in this embodiment can also be located in a server or server cluster that is different from server 105 and capable of communicating with clients 101, 102, 103 and / or server 105.

[0030] In one example, server 105 can obtain confirmation instructions, modification operations, etc. for the target defect from clients 101, 102, and 103 via network 104, and execute the defect handling method of this disclosure embodiment.

[0031] It should be understood that Figure 1The number of clients, networks, and servers shown is merely illustrative. Depending on implementation needs, there can be any number of clients, networks, and servers.

[0032] It should be noted that the collection, storage, use, processing, transmission, provision, and disclosure of user personal information involved in the technical solution disclosed herein all comply with the provisions of relevant laws and regulations and do not violate public order and good morals.

[0033] In the technical solution disclosed herein, the user's authorization or consent is obtained before acquiring or collecting the user's personal information.

[0034] This disclosure provides a defect handling method, which is described below in conjunction with... Figure 1 The system architecture, referencing Figures 2-4 This describes a defect handling method according to exemplary embodiments of the present disclosure. The defect handling method of the embodiments of the present disclosure may, for example, be derived from... Figure 1 The server 105 shown is used to execute this.

[0035] Figure 2 A flowchart illustrating a defect handling method according to an embodiment of the present disclosure is shown schematically.

[0036] like Figure 2 As shown, the defect handling method 200 of this disclosure embodiment may include, for example, operations S210 to S220.

[0037] In operation S210, for any target party among multiple participants, in response to the confirmation instruction for the target defect, the target source is determined based on the candidate sources of the target defect.

[0038] The handler for the target defect is the target party. The handler for the target defect is obtained based on the code tags that include the target code containing the target defect.

[0039] For example, if the target party acknowledges the defect, it can be considered that the target party is responsible for handling the defect. In scenarios involving multiple parties, such as project delivery, the party responsible for handling the defect handles it, but the party responsible for handling the defect is not necessarily the source of the defect.

[0040] Candidate sources are determined by the processing party handling the target defect. A candidate source can be understood as a potential source of the target defect. The target source determined based on the candidate sources is used as the predicted source of the target defect, and its confidence level is greater than or equal to the confidence level of the candidate source as the source of the target defect.

[0041] Participants can participate in defect handling. The following will use the participation of parties in defect handling in a project delivery scenario as an example to illustrate this.

[0042] Project delivery can be understood as the contract between Party A and Party B, whereby Party B delivers a series of software products or services as stipulated in the contract to Party A within the time period agreed upon in the contract, and Party A pays Party B the project amount stipulated in the contract after the products or services have been accepted according to the acceptance standards agreed upon in the contract.

[0043] Unlike defect handling in software products, which involves a single participant, project delivery scenarios involve multiple participants, such as enterprise entities, customer entities, and partner entities. Each participant can participate in defect handling, resulting in a longer development chain. Furthermore, in scenarios involving multiple participants, the communication costs between them regarding the target defect are high.

[0044] In operation S220, in response to the processing party's modification operation on the target defect, the target party's defect analysis data is determined.

[0045] According to the defect handling method of this disclosure, for scenarios involving multiple parties in defect handling, such as project delivery, for each target party among the multiple parties, if the target party is the party handling the target defect, the target source of the target defect can be determined through the above operations. This can distinguish between the party that introduced the target defect (target source) and the party that handled the target defect. By clarifying the different responsible parties, the software project quality can be improved efficiently and accurately in the future, avoiding situations where defects are not claimed and excessive communication between the parties regarding the target defect can be avoided, thereby reducing the communication costs between the parties based on the target defect.

[0046] According to the defect handling method of this disclosure, by responding to the modification operation of the processing party on the target defect, the determined target defect analysis data can be recorded and analyzed, and the operation of the processing party on the target defect can be used for subsequent, for example, software project quality improvement based on the target defect analysis data.

[0047] The defect handling method according to the embodiments of this disclosure, through the above operations, is adaptable to scenarios such as project delivery where multiple parties participate in defect handling. Specifically, in scenarios such as project delivery, software products are delivered according to acceptance standards, which may involve adjustments adapted to the delivery party. In this case, multiple parties can participate in handling the target defect. Therefore, resolving the target defect and improving the quality of the software product to meet acceptance standards, as well as improving the communication efficiency among various parties regarding the target defect, are requirements of the project delivery scenario. The defect handling method of the embodiments of this disclosure, through the above operations, can identify different responsible parties among multiple parties and record and analyze the actions of the handling parties on the target defect to obtain target defect analysis data. Subsequently, it can efficiently and accurately improve the quality of the software project and reduce the communication costs among various parties based on the target defect.

[0048] For example, according to another embodiment of the defect handling method of this disclosure, the following specific example can be used to determine the target defect analysis data in response to the modification operation of the processing party on the target defect: In response to the modification operation of the processing party on the target defect, the operation of recording the defect handling field associated with the target defect is performed to obtain the processing record data for the target defect. The processing record data is then statistically analyzed to determine the target defect analysis data.

[0049] For example, the target defect analysis data includes at least one of the following: number of defects, defect resolution rate, defect severity rate, defect resolution time, and defect return rate.

[0050] The number of defects, defect resolution rate, defect severity rate, defect resolution time, and defect feedback rate can comprehensively and accurately reflect the target party's defect handling situation.

[0051] For example, the target party can statistically analyze the processed record data based on a scheduled task with a set period to determine the target party's defect analysis data. The set period can be, for example, days / times. The set period can also be the same as the display period of the defect analysis data.

[0052] For example, the defect handling field includes at least one of the following: defect status field, defect handling method field, and defect discovery stage field.

[0053] The defect discovery field should include one of the following states: delivered for testing, delivered for deployment.

[0054] For example, the defect discovery field may also include at least one of the following states: requirements design, requirements review, development self-testing, and pre-shipment testing.

[0055] For example, the defect status field may include at least one of the following statuses: new, processing, processed, completed, and reopened, where completed is the final defect status.

[0056] For example, the defect handling method field may include at least one of the following states: fixed, not fixed this period, not fixed, cannot be reproduced (e.g., accidental operation), conforms to design (e.g., the relevant personnel misunderstood, there is actually no problem), and duplicate (e.g., the defect has already been reported). Among them, fixed, not fixed this period, and not fixed are valid defects. The defect handling method field can measure the effectiveness of defect reporting and further measure the quality of defect reporting.

[0057] According to the defect handling method of this disclosure, the operation of the defect handling field associated with the target defect can be recorded to obtain the processing record data for the target defect. The processing record data can be used as the basis for analysis. By statistically analyzing the processing record data, the target defect analysis data can be used as the basis for judging the defect handling efficiency of the target party.

[0058] According to the defect handling method of this disclosure, a defect handling field, including, for example, a defect status field, a defect handling method field, and a defect discovery stage field, can characterize comprehensive data related to the handling of the target defect. For example, a defect status field including "new," "processing," "processed," "completed," and "reopened" can record the complete processing cycle of the target defect. The target defect analysis data includes at least one of the following: defect quantity, defect resolution rate, defect severity rate, defect resolution time, and defect return rate, to accurately analyze defects handled by the target party from various dimensions.

[0059] Figure 3 The diagram illustrates a defect processing cycle of a defect processing method according to yet another embodiment of the present disclosure.

[0060] Figure 3 In the example, for any given target defect, the defect processing cycle for that defect by the target party (as the handler) is reflected in the process of the defect processing field changing from the "new" status to the "completed" status. The target party is determined based on the code tag BUG-i, which includes the target code of the target defect. Figure 3 In the example, there are three participants, pal through pa3, and the target is participant pa2.

[0061] like Figure 3 As shown, for a specific target defect BUG-i, the target party is the one handling the target defect. The target party modifies the defect status field to the new status S1; during the processing of target defect BUG-i, the defect status field is modified to the processing status S2; after processing is completed, the defect status field is modified to the processed status S3. For example, quality inspectors or automation can perform defect processing detection on the target defect processed by the target party to ensure the quality of defect processing. After the defect processing detection passes, the defect status field can be modified to the completed status S4; after modifying the defect status field to the completed status S4 or if the defect processing detection fails, it is possible to listen and mark whether the target defect is reopened. If the target defect is reopened, the defect status field can be modified to the reopened field S5; if the target defect is reopened and during the processing of target defect BUG-i, the defect status field is modified to the processing status S2.

[0062] For example, according to another embodiment of the defect handling method of this disclosure, the specific example of determining the target source based on candidate sources of the target defect can be implemented using the following embodiments: when the candidate source is a processing party, the candidate source is determined as the target source. When the candidate source is a designated party other than the processing party, in response to receiving defect source feedback data indicating that the target defect was generated by the designated party, the candidate source is determined as the target source.

[0063] The defect source feedback data is determined by the designated party.

[0064] For example, the processor can select candidate sources. If the processor believes the target defect was generated by itself, it can designate itself as a candidate source. If the processor believes the target defect was not generated by itself, it can determine and designate the party that generated the target defect (the designated party) as a candidate source. When the candidate source is a designated party other than the processor, a target defect source confirmation request can be sent to the designated party. Upon receiving this request, the designated party can determine whether the target defect was generated by itself. If the designated party acknowledges that the target defect was generated by itself, it can provide the processor with defect source feedback data indicating that the target defect was generated by the designated method. If the designated party does not acknowledge that the target defect was generated by itself, it can provide the processor with defect source feedback data indicating that the target defect was not generated by the designated method. In this case, the processor can re-determine and designate the designated party that generated the target defect.

[0065] In some implementations, for example, when quality inspectors determine the source of a target defect and assign it to a handler, it is equivalent to the quality inspectors equating the assigned handler of the target defect with the source of the defect.

[0066] The defect handling method according to embodiments of this disclosure refines the scenarios described above, specifying two scenarios: when the candidate source determined by the processing party is the processing party and when it is not. When the candidate source determined by the processing party is the processing party, it indicates that the processing party recognizes the target source as the processing party, and in this case, the processing party and the source of the target defect are consistent. When the candidate source determined by the processing party is not the processing party, the processing party will designate a specific party as the source of the target defect. Compared to quality control personnel determining the source of the target defect, the processing party's determination of the source of the target defect is more accurate. Furthermore, based on the defect source feedback data from the designated party, it is determined from the designated party's perspective whether the designated party recognizes the source of the target defect. If both the processing party and the designated party of the target defect recognize the source of the target defect as the designated party, the designated party is determined as the target source. Therefore, the source of the target defect (target source) can be accurately determined, and the processing party and the source of the target defect can be accurately distinguished.

[0067] For example, feedback data on the source of defects can also be automatically determined.

[0068] For example, a trained deep learning model can automatically determine the source of a defect from feedback data. Deep learning models can be, for example, convolutional neural networks (CNNs) or recurrent neural networks (RNNs). The input to a deep learning model can be target code containing the target defect.

[0069] For example, pre-defined detection logic can be used to detect relevant data of the target defect and determine the source of the defect feedback data. The detection logic may include, for example, constraint rules that govern how participating parties handle defects, and parsing rules that parse relevant data of the target defect using these constraint rules. The relevant data of the target defect can be obtained based on these constraint rules.

[0070] For example, a defect handling method according to another embodiment of this disclosure may further include the following operations: in response to a defect analysis data display instruction, acquiring target defect analysis data for each target party among a plurality of participants to obtain defect analysis data; and displaying the defect analysis data.

[0071] The participants include corporate entities, customer entities, and partner entities.

[0072] A business entity may develop a software project and provide the completed software project to a customer entity. A business entity may also collaborate with a partner entity to develop a software project.

[0073] According to the defect handling method of this disclosure, in scenarios such as project delivery involving multiple defect handling participants, target defect analysis data of each target party among the multiple participants can be obtained by responding to a defect analysis data display instruction. The obtained defect analysis data characterizes the global defect analysis of each target party among the multiple participants, which facilitates subsequent accurate and efficient improvement of software project quality and is adapted to specific scenarios such as project delivery involving multiple defect handling participants.

[0074] It should be noted that the same defect handling method can be used for each target party among multiple participants, such as enterprise entities, customer entities, and partner entities. Alternatively, the defect handling method of this disclosure can be used for only one target party (e.g., the enterprise entity) among multiple participants, such as enterprise entities, customer entities, and partner entities. For example, the defect handling method for the remaining target parties (e.g., customer entities and partner entities) may differ from the defect handling method of this disclosure. In this case, the enterprise entity may obtain target defect analysis data of the customer entity and partner entity by calling an interface, or the enterprise entity may import target defect analysis data of the customer entity and partner entity.

[0075] Figure 4 The diagram illustrates a defect analysis data of a defect handling method according to an embodiment of the present disclosure.

[0076] exist Figure 4 In the example, each participant's data is stored in a database. Figure 4 The illustration shows a specific example of three participants, pal through pa3. For one target party X, defect analysis data can be obtained from each of the multiple participants, treating them as the target party. This defect analysis data can then be displayed in the front end.

[0077] Figure 5 A block diagram of a defect handling apparatus according to an embodiment of the present disclosure is shown schematically.

[0078] like Figure 5 As shown, the defect processing apparatus 500 of this embodiment includes, for example, a target source determination module 510 and a target defect analysis data determination module 520.

[0079] The target source determination module 510 is used to determine the target source for any one of the multiple participants in response to a confirmation instruction for the target defect, based on the candidate sources of the target defect. The target party is the party that handles the target defect, and the party that handles the target defect is obtained based on the code tag that includes the target code of the target defect. The candidate sources are determined by the party that handles the target defect.

[0080] The target defect analysis data determination module 520 is used to determine the target defect analysis data in response to the processing party's modification operation on the target defect.

[0081] For example, the defect processing apparatus according to an embodiment of the present disclosure further includes: a defect analysis data determination module, configured to, in response to a defect analysis data display instruction, acquire target defect analysis data of each target party among a plurality of participants to obtain defect analysis data, wherein the participants include enterprise entities, customer entities and partner entities; and a display module, configured to display the defect analysis data.

[0082] For example, the target source determination module includes: a first target source determination submodule, configured to determine a candidate source as a target source when the candidate source is a processor; and a second target source determination submodule, configured to determine a candidate source as a target source in response to receiving defect source feedback data indicating that the target defect was generated by the designated party when the candidate source is a designated party other than the processor, wherein the defect source feedback data is determined by the designated party.

[0083] For example, the target defect analysis data determination module includes: a processing record data determination submodule, used to record the operation of the defect processing field associated with the target defect in response to the modification operation of the processing party on the target defect, and obtain processing record data for the target defect; and a statistics submodule, used to perform statistics on the processing record data to determine the target defect analysis data, wherein the target defect analysis data includes at least one of the following: number of defects, defect resolution rate, defect severity rate, defect resolution time, and defect return rate.

[0084] For example, the defect handling field includes at least one of the following: defect status field, defect handling method field, and defect discovery stage field; the defect discovery stage field includes one of the following statuses: delivery testing, delivery deployment.

[0085] It should be understood that the embodiments of the apparatus portion of this disclosure correspond to the same or similar embodiments of the method portion of this disclosure, and the technical problems solved and the technical effects achieved are also the same or similar. This disclosure will not repeat them here.

[0086] According to embodiments of this disclosure, this disclosure also provides an electronic device, a readable storage medium, and a computer program product.

[0087] Figure 6 A schematic block diagram of an example electronic device 600 that can be used to implement embodiments of the present disclosure is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device may also represent various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the present disclosure described and / or claimed herein.

[0088] like Figure 6 As shown, device 600 includes a computing unit 601, which can perform various appropriate actions and processes based on a computer program stored in read-only memory (ROM) 602 or a computer program loaded from storage unit 608 into random access memory (RAM) 603. RAM 603 may also store various programs and data required for the operation of device 600. The computing unit 601, ROM 602, and RAM 603 are interconnected via bus 604. Input / output (I / O) interface 605 is also connected to bus 604.

[0089] Multiple components in device 600 are connected to I / O interface 605, including: input unit 606, such as keyboard, mouse, etc.; output unit 607, such as various types of monitors, speakers, etc.; storage unit 608, such as disk, optical disk, etc.; and communication unit 609, such as network card, modem, wireless transceiver, etc. Communication unit 609 allows device 600 to exchange information / data with other devices through computer networks such as the Internet and / or various telecommunications networks.

[0090] The computing unit 601 can be a variety of general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of the computing unit 601 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various computing units running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. The computing unit 601 performs the various methods and processes described above, such as defect handling methods. For example, in some embodiments, method XXX may be implemented as a computer software program tangibly contained in a machine-readable medium, such as storage unit 608. In some embodiments, part or all of the computer program may be loaded and / or installed on device 600 via ROM 602 and / or communication unit 609. When the computer program is loaded into RAM 603 and executed by the computing unit 601, one or more steps of the defect handling methods described above may be performed. Alternatively, in other embodiments, the computing unit 601 may be configured to perform defect handling methods by any other suitable means (e.g., by means of firmware).

[0091] Various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), systems-on-a-chip (SoCs), complex programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0092] The program code used to implement the methods of this disclosure may be written in any combination of one or more programming languages. This program code may be provided to a processor or controller of a general-purpose computer, special-purpose computer, or other programmable data processing apparatus, such that when executed by the processor or controller, the program code causes the functions / operations specified in the flowcharts and / or block diagrams to be implemented. The program code may be executed entirely on a machine, partially on a machine, as a standalone software package partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0093] In the context of this disclosure, a machine-readable medium can be a tangible medium that may contain or store a program for use by or in conjunction with an instruction execution system, apparatus, or device. A machine-readable medium can be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium can be, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination of the foregoing. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the foregoing.

[0094] To provide interaction with a user, the systems and techniques described herein can be implemented on a computer having: a display device for displaying information to the user (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor); and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the computer. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0095] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as a data server), or computing systems that include middleware components (e.g., an application server), or computing systems that include frontend components (e.g., a user computer with a graphical user interface or web browser through which a user can interact with embodiments of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., a communication network). Examples of communication networks include local area networks (LANs), wide area networks (WANs), and the Internet.

[0096] Computer systems can include clients and servers. Clients and servers are generally located far apart and typically interact through communication networks. Client-server relationships are created by computer programs running on the respective computers and having a client-server relationship with each other.

[0097] It should be understood that the various forms of processes shown above can be used to rearrange, add, or delete steps. For example, the steps described in this disclosure can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution disclosed in this disclosure can be achieved, and this is not limited herein.

[0098] The specific embodiments described above do not constitute a limitation on the scope of protection of this disclosure. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this disclosure should be included within the scope of protection of this disclosure.

Claims

1. A defect processing method, comprising: determining a target source according to a candidate source of a target defect for any one target party of a plurality of parties in response to a confirmation instruction for the target defect, wherein a processing party of the target defect is the target party, the processing party of the target defect is obtained according to a code tag of target code comprising the target defect, and the candidate source is determined by the processing party processing the target defect; and determining target party defect analysis data in response to a modification operation of the processing party on the target defect; wherein the determining the target source according to the candidate source of the target defect comprises: determining the candidate source as the target source in a case where the candidate source is the processing party; and determining the candidate source as the target source in response to receiving defect source feedback data that the target defect is generated by a specified party other than the processing party in a case where the candidate source is the specified party, wherein the defect source feedback data is determined by the specified party. 2.The method of claim 1, further comprising: obtaining the target party defect analysis data of each of the target parties of the plurality of parties to obtain defect analysis data in response to a defect analysis data display instruction, wherein the parties comprise an enterprise entity, a customer entity and a partner entity; and displaying the defect analysis data.

3. The method of claim 1, wherein, The determining the target party defect analysis data in response to the modification operation of the processing party on the target defect comprises: recording an operation of a defect processing field associated with the target defect to obtain processing record data for the target defect in response to the modification operation of the processing party on the target defect; and statistically processing the processing record data to determine the target party defect analysis data, wherein the target party defect analysis data comprises at least one of the following: a defect quantity, a defect resolution rate, a defect severity rate, a defect resolution time length and a defect return rate.

4. The method of claim 3, wherein, The defect processing field comprises at least one of the following: a defect status field, a defect processing mode field and a defect should be found stage field; and the defect should be found stage field comprises one of the following states: delivery test, delivery deployment. 5.A defect processing apparatus, comprising: a target source determination module configured to determine a target source according to a candidate source of a target defect for any one target party of a plurality of parties in response to a confirmation instruction for the target defect, wherein a processing party of the target defect is the target party, the processing party of the target defect is obtained according to a code tag of target code comprising the target defect, and the candidate source is determined by the processing party processing the target defect; and a target party defect analysis data determination module configured to determine target party defect analysis data in response to a modification operation of the processing party on the target defect; wherein the target source determination module comprises: a target source first determination submodule configured to determine the candidate source as the target source in a case where the candidate source is the processing party; and a target source second determination submodule configured to determine the candidate source as the target source in response to receiving defect source feedback data that the target defect is generated by a specified party other than the processing party in a case where the candidate source is the specified party, wherein the defect source feedback data is determined by the specified party. The target source second determination submodule is configured to, in a case where the candidate source is a designated party other than the processing party, determine the candidate source as the target source in response to receiving defect source feedback data indicating that the target defect is generated by the designated party. 6.The apparatus of claim 5, further comprising: a defect analysis data determination module configured to, in response to a defect analysis data display instruction, acquire the target party defect analysis data of each of the target parties in the plurality of parties, to obtain defect analysis data, wherein the parties include an enterprise entity, a customer entity, and a partner entity; and a display module configured to display the defect analysis data.

7. The apparatus of claim 5, wherein, The target party defect analysis data determination module includes: a processing record data determination submodule configured to, in response to a modification operation of the target defect by the processing party, record an operation of a defect processing field associated with the target defect, to obtain processing record data for the target defect; and a statistical submodule configured to statistically process the processing record data, to determine the target party defect analysis data, wherein the target party defect analysis data includes at least one of the following: a defect quantity, a defect resolution rate, a defect severity rate, a defect resolution time length, and a defect return rate.

8. The apparatus of claim 7, wherein, The defect processing field includes at least one of the following: a defect status field, a defect processing mode field, and a defect should be found stage field; the defect should be found stage field includes one of the following states: delivery test, delivery deployment. 9.An electronic device comprising: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the method of any one of claims 1-4.

10. A non-transitory computer readable storage medium having stored thereon computer instructions, wherein, The computer instructions are used to enable the computer to perform the method of any one of claims 1-4. 11.A computer program product comprising a computer program stored on at least one of a readable storage medium and an electronic device, the computer program, when executed by a processor, implements the method of any one of claims 1-4.

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