A system, method and device for detecting symmetry axis of anisotropic material

Abstract

The present invention discloses a system, method and equipment for detecting the symmetry axis of anisotropic materials. The system comprises: a placement platform for placing samples of anisotropic materials to be detected, an ultrasonic detector, a pulse signal generator and an oscilloscope; wherein the probe of the ultrasonic detector is coupled to a parallel surface of the sample through a semi-solid coupling agent, and the axis of the probe is perpendicular to the parallel surface; a coaxial cable is used to connect the excitation interface of the pulse signal generator to the probe, and the output interface of the pulse signal generator is connected to the oscilloscope. This is achieved by using ultrasonic direct shear waves and utilizing the birefringence phenomenon in anisotropic materials. When the waveform reaches a trough within a specific time period, the joint direction of the probe is recorded; the joint direction of the probe is determined as the symmetry axis direction of the sample of the anisotropic material to be detected. This overcomes the problem that the traditional method of detecting the symmetry axis of anisotropic materials can only be destructive.

Description

Technical Field

[0001] The present invention relates to the technical field of material detection, and in particular to a system, method and equipment for detecting the symmetry axis of anisotropic materials. Background Art

[0002] Anisotropic materials refer to materials whose physical and chemical properties show different characteristics in different directions. If you want to detect the direction of the symmetry axis of anisotropic materials, you usually use a destruction or deformation method to measure, that is, you need to destroy the material or deform it, and you can only do sampling testing. Therefore, the anisotropic material to be tested is damaged. Summary of the invention

[0003] In view of the above problems, the present invention provides a system, method and device for detecting the symmetry axis of anisotropic materials, so as to realize non-destructive detection of anisotropic materials.

[0004] In order to achieve the above object, the present invention provides the following technical solutions:

[0005] A system for detecting a symmetry axis of anisotropic materials, the system comprising:

[0006] A placing platform for placing samples of anisotropic materials to be tested, an ultrasonic detector, a pulse signal generator and an oscilloscope; wherein the probe of the ultrasonic detector is coupled to a parallel surface of the sample through a semi-solid coupling agent, and the axis of the probe is perpendicular to the parallel surface; a coaxial cable is used to connect the excitation interface of the pulse signal generator to the probe, and the output interface of the pulse signal generator is connected to the oscilloscope.

[0007] Optionally, the probe of the ultrasonic detector includes a first probe and a second probe, and the first probe and the second probe are respectively coupled to two parallel planes corresponding to the sample, wherein the sample has two parallel planes, the first probe and the second probe are perpendicular to the corresponding parallel planes, and the axes of the first probe and the second probe coincide.

[0008] A method for detecting an anisotropic material symmetry axis, the method being applied to the anisotropic material symmetry axis detection system as described in any one of the above, the method comprising:

[0009] respectively setting the working modes of the pulse signal generator and the oscilloscope;

[0010] Controlling the probe to rotate along the axis and collecting the waveform on the oscilloscope;

[0011] When the waveform reaches a trough within a specific time period, recording the connector direction of the probe;

[0012] The joint direction of the probe is determined to be the direction of the symmetry axis of the sample of the anisotropic material to be tested.

[0013] Optionally, the respectively setting the working modes of the pulse signal generator and the oscilloscope includes:

[0014] Setting the working mode of the pulse signal generator to self-transmit and self-receive;

[0015] The delay and display range of the oscilloscope are adjusted, and the adjusted state of the oscilloscope is determined as the current working mode of the oscilloscope.

[0016] Optionally, when the waveform reaches a trough within a specific time period, recording the connector direction of the probe includes:

[0017] When the waveform presents periodic changes within a specific time and a specific number of valleys appear, the connector direction of the probe when the waveform appears the valley is recorded.

[0018] Optionally, the probe includes a first probe and a second probe, wherein controlling the probe to rotate along an axis includes:

[0019] The first probe and the second probe are controlled to rotate synchronously along the same axis.

[0020] A device for detecting the symmetry axis of anisotropic materials, the device being applied to the symmetry axis detection system of anisotropic materials as described in any one of the above, the device comprising:

[0021] A setting unit, used to set the working modes of the pulse signal generator and the oscilloscope respectively;

[0022] A collection unit, used for controlling the probe to rotate along the axis and collecting the waveform on the oscilloscope;

[0023] A recording unit, used for recording the connection direction of the probe when the waveform reaches a trough within a specific time period;

[0024] The determination unit is used to determine the joint direction of the probe as the symmetry axis direction of the sample of the anisotropic material to be detected.

[0025] Optionally, the setting unit is specifically used to:

[0026] Setting the working mode of the pulse signal generator to self-transmit and self-receive;

[0027] The delay and display range of the oscilloscope are adjusted, and the adjusted state of the oscilloscope is determined as the current working mode of the oscilloscope.

[0028] Optionally, the recording unit is specifically used for:

[0029] When the waveform presents periodic changes within a specific time and a specific number of valleys appear, the connector direction of the probe when the waveform appears the valley is recorded.

[0030] Optionally, the probe includes a first probe and a second probe, wherein controlling the probe to rotate along an axis includes:

[0031] The first probe and the second probe are controlled to rotate synchronously along the same axis.

[0032] Compared with the prior art, the present invention provides a system, method and device for detecting the symmetry axis of anisotropic materials. The system includes: a placement platform for placing samples of anisotropic materials to be detected, an ultrasonic detector, a pulse signal generator and an oscilloscope; wherein the probe of the ultrasonic detector is coupled to a parallel surface of the sample through a semi-solid coupling agent, and the axis of the probe is perpendicular to the parallel surface; a coaxial cable is used to connect the excitation interface of the pulse signal generator to the probe, and the output interface of the pulse signal generator is connected to the oscilloscope. This is achieved by using ultrasonic direct shear waves and utilizing the birefringence phenomenon in anisotropic materials. When the waveform reaches a trough within a specific time period, the joint direction of the probe is recorded; the joint direction of the probe is determined as the symmetry axis direction of the sample of the anisotropic material to be detected. This overcomes the problem that the traditional method of detecting the symmetry axis of anisotropic materials can only be destructive. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the provided drawings without paying creative work.

[0034] Figure 1 A schematic structural diagram of a system for detecting the symmetry axis of anisotropic materials provided by an embodiment of the present invention;

[0035] Figure 2 A schematic diagram of a flow chart of a method for detecting a symmetry axis of an anisotropic material provided by an embodiment of the present invention;

[0036] Figure 3 A schematic structural diagram of a device for detecting the symmetry axis of an anisotropic material provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0037] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0038] The terms "first" and "second" and the like in the specification and claims of the present invention and the above drawings are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device including a series of steps or units is not limited to the listed steps or units, but may include steps or units that are not listed.

[0039] In the embodiments of the present invention, a system, method and device for detecting the symmetry axis of anisotropic materials are provided. The detection is achieved by adopting ultrasonic direct shear waves and utilizing the birefringence phenomenon in anisotropic materials, thereby overcoming the problem that the traditional detection of the symmetry axis of anisotropic materials can only be carried out by destructive methods. No sampling is required during detection, and in-situ detection can be achieved by only one-side contact. The system, method and device are particularly suitable for determining the anisotropic symmetry axis of metal rolled plates, forgings and additively manufactured parts.

[0040] See also Figure 1 , which is a schematic diagram of the structure of a symmetry axis detection system for anisotropic materials provided in an embodiment of the present application. It should be noted that: Figure 1 This is only a schematic diagram of the anisotropic material symmetry axis detection system. In actual application scenarios, corresponding devices or components can be adjusted or added based on specific application requirements. The system includes:

[0041] A placement platform for placing samples of anisotropic materials to be tested, an ultrasonic detector, a pulse signal generator 11 and an oscilloscope 12; wherein the probe 13 of the ultrasonic detector is coupled to a parallel surface of the sample through a semi-solid coupling agent, and the axis of the probe 13 is perpendicular to the parallel surface; a coaxial cable is used to connect the excitation interface of the pulse signal generator to the probe, and the output interface of the pulse signal generator 11 is connected to the oscilloscope 12.

[0042] Furthermore, the probe of the ultrasonic detector includes a first probe and a second probe, and the first probe and the second probe are respectively coupled to two parallel surfaces corresponding to the sample, wherein the sample has two parallel surfaces, the first probe and the second probe are perpendicular to the corresponding parallel surfaces, and the axes of the first probe and the second probe coincide. Figure 1As shown, the two probes of the ultrasonic detector are respectively a first probe 13 and a second probe 14 .

[0043] Specifically, the placement platform for placing the sample of the anisotropic material to be tested can be any platform with a stable and flat surface. The sample of the anisotropic material to be tested needs to have at least two parallel planes, and the probe of the ultrasonic detector is an ultrasonic direct shear wave probe. For example, an ultrasonic direct shear wave probe with a center frequency of 20MHz can be used. Use a semi-solid coupling agent such as honey and syrup to couple the probe to a parallel plane of the sample, and the axis of the probe is perpendicular to the parallel plane. For example, the anisotropic material sample to be tested is on the surface of a high-temperature alloy rolled plate, and the axis of the probe is perpendicular to the plane.

[0044] Furthermore, if the sample of the anisotropic material to be tested is too thick, the attenuation of ultrasound will be large, making it difficult to receive the reflected echo from another plane. In this case, two probes of the same specification (such as the first probe and the second probe of the ultrasonic detector) can be placed in two parallel planes respectively, and the two can be made to rotate synchronously along the same axis. At this time, the signal generator is adjusted to a transmit-receive mode.

[0045] The principle of the symmetry axis detection of anisotropic materials in the embodiment of the present invention is: anisotropic materials generally have one or more symmetry axes. When there is an angle between the polarization direction of the ultrasonic shear wave and the direction of its symmetry axis, birefringence will occur, that is, the ultrasonic shear wave is decomposed into two columns of shear waves along its axis and perpendicular to its symmetry axis. Since the material is anisotropic, there is a difference in the speed of the two columns of shear waves. When they are reflected back to the ultrasonic probe by the other side of the sample, the waveform formed is the superposition of the two, thereby causing the duration of the ultrasonic waveform to increase. During the rotation of the probe along its axis, the direction of the symmetry axis of the anisotropic material can be determined by observing the duration of the waveform.

[0046] Correspondingly, see Figure 2 , which is a flow chart of a method for detecting the symmetry axis of an anisotropic material provided by an embodiment of the present invention. The method is applied to the anisotropic material symmetry axis detection system described above. The method may include the following steps:

[0047] S201. Set the working modes of the pulse signal generator and the oscilloscope respectively.

[0048] In order to accurately ensure the working status of each device in the anisotropic material symmetry axis detection system, so that the corresponding information can be accurately collected or displayed. First, use a coaxial cable to connect the excitation interface of the pulse signal generator to the ultrasonic direct shear wave probe, and connect the output receiver of the pulse signal generator to the oscilloscope. Turn on the pulse signal generator and set its mode to self-transmission and self-reception. Turn on the oscilloscope and adjust its delay and display range so that the reflected echo of another parallel plane occupies more than 50% of the width direction of the oscilloscope. The probe is rotated slowly along its axis. It should be ensured that the probe and the sample are always well coupled during the rotation process.

[0049] Specifically, in one implementation of the embodiment of the present application, the working modes of the pulse signal generator and the oscilloscope are set separately, including: setting the working mode of the pulse signal generator to self-transmission and self-reception; adjusting the delay and display range of the oscilloscope, and determining the state of the adjusted oscilloscope as the current working mode of the oscilloscope. It should be noted that this working mode is the initial state working mode when performing detection. During the real-time detection process, it can be adjusted based on the display information of the oscilloscope. For example, if the waveform displayed by the oscilloscope is incomplete, the display range of the oscilloscope can be adjusted.

[0050] S202, controlling the probe to rotate along the axis, and collecting the waveform on the oscilloscope.

[0051] When controlling the probe to rotate along the axis, a manual rotation control method or an automatic rotation control method can be used, wherein manual rotation means that the tester turns the probe, and automatic rotation means that the probe is controlled by a control device connected to the probe. For example, information such as the frequency and angle of the probe rotation can be input into the control device so that the control device can control the probe to rotate at a corresponding frequency or angle. Regardless of which rotation method the probe adopts, the probe must be well coupled with the sample and the center position must remain unchanged, that is, the rotation of the probe along its axis must be ensured, so the automatic rotation control method is preferred.

[0052] The connector direction of the ultrasonic direct shear wave probe is the polarization direction of the transmitted shear wave. During the rotation of the probe, the oscilloscope will display the corresponding waveform. Therefore, it is necessary to collect and record the waveform on the oscilloscope to facilitate the subsequent determination of the symmetry axis direction.

[0053] S203: When the waveform reaches a trough within a specific time period, record the connector direction of the probe.

[0054] S204: When the joint direction of the probe is determined to be the direction of the symmetry axis of the sample of the anisotropic material to be tested.

[0055] The specific time period is the waveform duration, that is, the time from the appearance to the end of the waveform. When the waveform shows periodic changes within a specific time and a specific number of troughs appear, record the connector direction of the probe when the waveform appears at the trough. When the polarization direction of the shear wave is at an angle to the direction of the symmetry axis of the material, the shear wave will split into two shear waves propagating along the symmetry axis and perpendicular to the symmetry axis. The speeds of the two are slightly different. After being received, they are synthesized into a vibration signal, which is displayed on the oscilloscope as an increase in the wave duration. When the polarization direction of the shear wave is consistent with the direction of the symmetry axis of the material, the shear wave does not split, so the duration is the shortest. During the rotation of the probe, the duration of the waveform will change periodically, and the direction of its symmetry axis can be judged based on this change.

[0056] Specifically, if there is no special marking, the connector direction of the ultrasonic direct shear wave probe is the polarization direction of the shear wave it emits. When the probe rotates along its axis, observe the waveform on the oscilloscope. When the waveform duration reaches a trough, note the connector direction of the ultrasonic direct shear wave probe. The waveform duration changes periodically. Generally, the waveform duration will have four troughs at intervals of 90° per rotation. At this time, the connector direction of the ultrasonic direct shear wave probe is the direction of the symmetry axis of the anisotropic material.

[0057] In one embodiment, if the probe includes a first probe and a second probe, wherein the controlling the probe to rotate along the axis includes: controlling the first probe and the second probe to rotate synchronously along the same axis. Specifically, if the sample is too thick or has a large attenuation to ultrasound, and it is difficult to receive the reflected echo from another parallel plane, two probes of the same specification can be placed on two parallel planes respectively, and the two can be rotated synchronously along the same axis. At this time, the signal generator is adjusted to a one-transmit-one-receive mode, and the oscilloscope is adjusted in the same way to identify the waveform and determine the symmetry axis.

[0058] Furthermore, in the self-transmitting and self-receiving mode, multiple reflection echoes from another parallel plane can also be used, and a probe with a center frequency in the range of 0.5-25MHz can be used. Generally, the thinner the sample to be tested is, the smaller the attenuation of ultrasound is, and a probe with a high center frequency is selected. The thicker the sample to be tested is, the greater the attenuation of ultrasound is, and a probe with a low center frequency is selected. When the signal-to-noise ratio of the reflection echo from another parallel plane is greater than 10, a probe with a high frequency is selected as much as possible. In one implementation of the embodiment of the present invention, the oscilloscope can also be replaced by an AD card.

[0059] The embodiment of the present invention provides a system and method for detecting the symmetry axis of anisotropic materials. The system includes: a placement platform for placing samples of anisotropic materials to be detected, an ultrasonic detector, a pulse signal generator and an oscilloscope; wherein the probe of the ultrasonic detector is coupled to a parallel surface of the sample through a semi-solid coupling agent, and the axis of the probe is perpendicular to the parallel surface; a coaxial cable is used to connect the excitation interface of the pulse signal generator to the probe, and the output interface of the pulse signal generator is connected to the oscilloscope. This is achieved by using ultrasonic direct shear waves and utilizing the birefringence phenomenon in anisotropic materials. When the waveform reaches a trough within a specific time period, the joint direction of the probe is recorded; the joint direction of the probe is determined as the symmetry axis direction of the sample of the anisotropic material to be detected. This overcomes the problem that the traditional method of detecting the symmetry axis of anisotropic materials can only be destructive.

[0060] The following is a detailed description of the symmetry axis detection process of anisotropic materials according to an embodiment of the present invention.

[0061] The sample of the anisotropic material to be tested must have at least two parallel planes. An ultrasonic direct shear wave probe is used and coupled to a parallel plane of the sample using a semi-solid coupling agent such as honey or syrup, with the probe axis perpendicular to the parallel plane.

[0062] Use a coaxial cable to connect the excitation interface of the pulse signal generator to the ultrasonic direct shear wave probe, and connect the output interface of the pulse signal generator to the oscilloscope. Turn on the pulse signal generator and set its mode to self-transmission and self-reception. Turn on the oscilloscope and adjust its delay and display range so that the reflected echo from another parallel plane occupies more than 50% of the width of the oscilloscope. Rotate the probe slowly along its axis to ensure that the probe and sample are always well coupled during the rotation.

[0063] If there is no special marking, the connector direction of the ultrasonic direct shear wave probe is the polarization direction of the shear wave it emits. When the probe rotates along its axis, observe the waveform on the oscilloscope. When the waveform duration reaches a trough, note the connector direction of the ultrasonic direct shear wave probe. The waveform duration changes periodically. Generally, the waveform duration will have four troughs at intervals of 90° per rotation. At this time, the connector direction of the ultrasonic direct shear wave probe is the direction of the symmetry axis of the anisotropic material.

[0064] The present invention essentially adopts an ultrasonic non-destructive method for measuring the symmetry axis direction of anisotropic materials, which can obtain the symmetry axis direction of anisotropic materials in a non-destructive way by using ultrasonic direct shear waves, thus making up for the disadvantage that the traditional method needs sampling and destruction.

[0065] Specifically, if the sample of the anisotropic material to be tested is a high-temperature alloy rolled plate, the testing steps are as follows:

[0066] An ultrasonic direct shear wave probe with a center frequency of 20 MHz is used, and a semi-solid coupling agent such as honey and syrup is used to couple it to the surface of the high-temperature alloy rolled plate, and the axis of the probe is perpendicular to the surface of the rolled plate.

[0067] Use a coaxial cable to connect the excitation interface of the pulse signal generator to the ultrasonic direct shear wave probe, and connect the output interface of the pulse signal generator to the oscilloscope. Turn on the pulse signal generator and set its mode to self-transmission and self-reception. Turn on the oscilloscope and adjust its delay and display range so that the reflected echo from another parallel plane occupies more than 50% of the width of the oscilloscope. Rotate the probe slowly along its axis to ensure that the probe and sample are always well coupled during the rotation.

[0068] The joint direction of the ultrasonic direct shear wave probe is the polarization direction of the shear wave it emits. When the probe rotates along its axis, observe the waveform on the oscilloscope. When the waveform duration reaches a trough, note the joint direction of the ultrasonic direct shear wave probe. The waveform duration changes periodically. Generally, the waveform duration will have four troughs at intervals of 90° per rotation. At this time, the joint direction of the ultrasonic direct shear wave probe is the direction of the symmetry axis of the high-temperature alloy rolled plate.

[0069] For another example, the sample of anisotropic material to be tested is a titanium alloy additive manufacturing part, and the testing steps are as follows:

[0070] Two parallel planes are found on the titanium alloy additive manufacturing part, and two ultrasonic direct shear wave probes are used to couple them on the two parallel planes using semi-solid coupling agents such as honey and syrup. The probe axes are perpendicular to the parallel planes and the two probe axes coincide.

[0071] Use a coaxial cable to connect the excitation interface of the pulse signal generator to an ultrasonic direct-transmitting shear wave probe, connect the output interface of the pulse signal generator to channel 1 of the oscilloscope, and connect the other ultrasonic direct-transmitting shear wave probe to channel 2 of the oscilloscope with a coaxial cable. Turn on the pulse signal generator and set its mode to one transmit and one receive. Turn on the oscilloscope and use the signal of channel 1 as the trigger signal. Adjust its delay and display range so that the receiving signal of channel 2 occupies more than 50% of the width of the oscilloscope. Make the two probes rotate slowly along their axes synchronously, and ensure that the probes and samples are always well coupled during the rotation and that the axes of the two probes remain coincident.

[0072] The joint direction of the ultrasonic direct shear wave probe is the polarization direction of the shear wave it emits. When the probe rotates along its axis, observe the waveform on the oscilloscope. When the waveform duration reaches a trough, note the joint direction of the ultrasonic direct shear wave probe. The waveform duration changes periodically. For each rotation, the waveform duration will have four troughs at intervals of 90°. At this time, the joint direction of the ultrasonic direct shear wave probe is the direction of the symmetry axis of this titanium alloy additive manufacturing part.

[0073] In another embodiment of the present invention, a device for detecting the symmetry axis of anisotropic material is provided. The device is applied to any of the above-mentioned systems for detecting the symmetry axis of anisotropic material. Figure 3 , the device may include:

[0074] A setting unit 301, used to set the working modes of the pulse signal generator and the oscilloscope respectively;

[0075] The acquisition unit 302 is used to control the probe to rotate along the axis and acquire the waveform on the oscilloscope;

[0076] A recording unit 303, used for recording the connection direction of the probe when the waveform reaches a trough within a specific time period;

[0077] The determination unit 304 is used to determine the joint direction of the probe as the symmetry axis direction of the sample of the anisotropic material to be detected.

[0078] It should be noted that the anisotropic material symmetry axis detection device can be a part of the anisotropic material symmetry axis detection system to operate or control other components in the anisotropic material symmetry axis detection system. Correspondingly, the device can also be a processing device for processing. The setting unit of the anisotropic material symmetry axis detection device can be connected to the pulse signal generator and the oscilloscope, and send its corresponding setting parameters to the pulse signal generator and the oscilloscope respectively, so that the pulse signal generator and the oscilloscope reach the corresponding working mode. Its acquisition unit can be connected to the probe and the oscilloscope of the ultrasonic detector respectively, output control instructions for controlling the rotation of the probe, and receive waveform data sent by the oscilloscope to collect the waveform on the oscilloscope. The recording unit and the determination unit serve as the processor of the device, which are used to record the joint direction of the probe corresponding to the waveform in real time, and determine the symmetry axis direction of the sample of the anisotropic material.

[0079] It should be noted that the connection mode of the device and the execution process of each unit can be adjusted based on the actual application scenario, and the present invention only provides an example thereof.

[0080] Based on the embodiment of the device, the setting unit is specifically used for:

[0081] Setting the working mode of the pulse signal generator to self-transmit and self-receive;

[0082] The delay and display range of the oscilloscope are adjusted, and the adjusted state of the oscilloscope is determined as the current working mode of the oscilloscope.

[0083] Optionally, the recording unit is specifically used for:

[0084] When the waveform presents periodic changes within a specific time and a specific number of valleys appear, the connector direction of the probe when the waveform appears the valley is recorded.

[0085] Optionally, the probe includes a first probe and a second probe, wherein controlling the probe to rotate along an axis includes:

[0086] The first probe and the second probe are controlled to rotate synchronously along the same axis.

[0087] Based on the foregoing embodiments, an embodiment of the present invention provides a computer-readable storage medium, which stores one or more programs, and the one or more programs can be executed by one or more processors to implement the steps of the anisotropic material symmetry axis detection method as described in any of the above items.

[0088] An embodiment of the present invention further provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of a method for detecting the axis of symmetry of anisotropic materials when executing the program.

[0089] It should be noted that the working principles of the readable storage medium and the electronic device can refer to the processing process of the anisotropic material symmetry axis detection device, which will not be described in detail here.

[0090] It should be noted that the processor or CPU can be at least one of an Application Specific Integrated Circuit (ASIC), a Digital Signal Processor (DSP), a Digital Signal Processing Device (DSPD), a Programmable Logic Device (PLD), a Field Programmable Gate Array (FPGA), a Central Processing Unit (CPU), a controller, a microcontroller, and a microprocessor. It is understandable that the electronic device that implements the above-mentioned processor function can also be other, and the embodiments of the present application are not specifically limited.

[0091] It should be noted that the above-mentioned computer storage medium / memory can be a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), a magnetic random access memory (FRAM), a flash memory (Flash Memory), a magnetic surface memory, an optical disc, or a compact disc (CD-ROM) and other memories; it can also be various terminals including one or any combination of the above-mentioned memories, such as mobile phones, computers, tablet devices, personal digital assistants, etc.

[0092] In the several embodiments provided by the present invention, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are only schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation, such as: multiple units or components can be combined, or can be integrated into another system, or some features can be ignored or not executed. In addition, the coupling, direct coupling, or communication connection between the components shown or discussed can be through some interfaces, and the indirect coupling or communication connection of the devices or units can be electrical, mechanical or other forms.

[0093] The units described above as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units; some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.

[0094] In addition, all functional units in the embodiments of the present invention can be integrated into one processing module, or each unit can be a separate unit, or two or more units can be integrated into one unit; the above integrated unit can be implemented in the form of hardware or in the form of hardware plus software functional units. A person of ordinary skill in the art can understand that all or part of the steps of implementing the above method embodiments can be completed by hardware related to program instructions, and the aforementioned program can be stored in a computer-readable storage medium, which, when executed, executes the steps of the above method embodiments; and the aforementioned storage medium includes: mobile storage devices, read-only memory (ROM), random access memory (RAM), disks or optical disks, and other media that can store program codes.

[0095] The methods disclosed in the several method embodiments provided by the present invention can be arbitrarily combined without conflict to obtain new method embodiments.

[0096] The features disclosed in several product embodiments provided by the present invention can be arbitrarily combined without conflict to obtain new product embodiments.

[0097] The features disclosed in several method or device embodiments provided by the present invention can be arbitrarily combined without conflict to obtain new method embodiments or device embodiments.

[0098] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

[0099] In this specification, each embodiment is described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the embodiments can be referred to each other. For the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant parts can be referred to the method part.

[0100] The above description of the disclosed embodiments enables one skilled in the art to implement or use the present invention. Various modifications to these embodiments will be apparent to one skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown herein, but rather to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A symmetry axis detection system for anisotropic materials, characterized in that: The system comprises: A placement platform for placing a sample of anisotropic material to be detected, an ultrasonic detector, a pulse signal generator and an oscilloscope; wherein the probe of the ultrasonic detector is coupled to a parallel plane of the sample through a semi-solid coupling agent, and the axis of the probe is perpendicular to the parallel plane; a coaxial cable is used to connect the excitation interface of the pulse signal generator to the probe, and the output interface of the pulse signal generator is connected to the oscilloscope; the sample of anisotropic material to be detected has at least two parallel planes.

2. The system according to claim 1, characterized in that The probe of the ultrasonic detector includes a first probe and a second probe, and the first probe and the second probe are respectively coupled to two parallel planes corresponding to the sample, wherein the sample has two parallel planes, the first probe and the second probe are perpendicular to the corresponding parallel planes, and the axes of the first probe and the second probe coincide.

3. A method for detecting the symmetry axis of anisotropic materials, characterized in that: The method is applied to the anisotropic material symmetry axis detection system according to any one of claims 1 to 2, and the method comprises: respectively setting the working modes of the pulse signal generator and the oscilloscope; Controlling the probe to rotate along the axis and collecting the waveform on the oscilloscope; When the waveform reaches a trough within a specific time period, recording the connector direction of the probe; The joint direction of the probe is determined to be the direction of the symmetry axis of the sample of the anisotropic material to be tested.

4. The method according to claim 3, characterized in that The step of respectively setting the working modes of the pulse signal generator and the oscilloscope comprises: Setting the working mode of the pulse signal generator to self-transmit and self-receive; The delay and display range of the oscilloscope are adjusted, and the adjusted state of the oscilloscope is determined as the current working mode of the oscilloscope.

5. The method according to claim 3, characterized in that: When the waveform reaches a trough within a specific time period, recording the connector direction of the probe comprises: When the waveform presents periodic changes within a specific time and a specific number of valleys appear, the connector direction of the probe when the waveform appears the valley is recorded.

6. The method according to claim 3, characterized in that The probe comprises a first probe and a second probe, wherein controlling the probe to rotate along an axis comprises: The first probe and the second probe are controlled to rotate synchronously along the same axis.

7. A device for detecting the symmetry axis of anisotropic materials, characterized in that: The device is applied to the anisotropic material symmetry axis detection system according to any one of claims 1 to 2, and the device comprises: A setting unit, used to set the working modes of the pulse signal generator and the oscilloscope respectively; A collection unit, used for controlling the probe to rotate along the axis and collecting the waveform on the oscilloscope; A recording unit, used for recording the joint direction of the probe when the waveform reaches a trough within a specific time period; The determination unit is used to determine the joint direction of the probe as the symmetry axis direction of the sample of the anisotropic material to be detected.

8. The device according to claim 7, characterized in that The setting unit is specifically used for: Setting the working mode of the pulse signal generator to self-transmit and self-receive; The delay and display range of the oscilloscope are adjusted, and the adjusted state of the oscilloscope is determined as the current working mode of the oscilloscope.

9. The device according to claim 7, characterized in that The recording unit is specifically used for: When the waveform presents periodic changes within a specific time and a specific number of valleys appear, the connector direction of the probe when the waveform appears the valley is recorded.

10. The device according to claim 7, characterized in that The probe comprises a first probe and a second probe, wherein controlling the probe to rotate along an axis comprises: The first probe and the second probe are controlled to rotate synchronously along the same axis.

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