Radiation temperature measurement method, device, electronic device and storage medium

Abstract

The present invention relates to the field of radiation temperature measurement technology and provides a radiation temperature measurement method, apparatus, electronic device, and storage medium. The method comprises: determining a first diffuse reflectance based on a first azimuth angle of reflected light, a first zenith angle of the reflected light, and a conversion coefficient; determining a second diffuse reflectance based on the first zenith angle, the conversion coefficient, a second azimuth angle of incident light, and a second zenith angle of incident light; determining a third diffuse reflectance based on the first diffuse reflectance and the second diffuse reflectance; and determining the temperature of a measured object based on the third diffuse reflectance and set parameters. The present invention improves the accuracy of radiation temperature measurement by measuring the third diffuse reflectance at any observation angle and then performing radiation temperature measurement based on the third diffuse reflectance.

Description

Technical Field

[0001] The present invention relates to the field of radiation temperature measurement technology, and in particular to a radiation temperature measurement method, device, electronic equipment and storage medium. Background Art

[0002] Since any object with a temperature exceeding absolute zero will continuously emit infrared radiation energy into the surrounding space, the surface temperature of an object can be measured by measuring the infrared energy radiated by the object itself. In the process of radiation temperature measurement, the measurement of diffuse reflectance affects the measurement result of the object's surface temperature.

[0003] Currently, diffuse reflectance measurement methods include the Sharpe-Little method, the Cotter method, and the auxiliary integrating sphere method. However, these measurement methods can only measure diffuse reflectance at an observation angle of 0 degrees or approximately 0 degrees, and cannot achieve adjustable diffuse reflectance measurement at any observation angle, resulting in low accuracy of radiation temperature measurement. Summary of the Invention

[0004] The present invention provides a radiation temperature measurement method, device, electronic device and storage medium to solve the problem of low accuracy of radiation temperature measurement. By measuring the third diffuse reflectance ratio at any observation angle and then performing radiation temperature measurement based on the third diffuse reflectance ratio, the accuracy of radiation temperature measurement is improved.

[0005] The present invention provides a radiation temperature measurement method, comprising:

[0006] determining a first diffuse reflectance ratio according to a first azimuth angle of the reflected light, a first apex angle of the reflected light, and a conversion coefficient;

[0007] determining a second diffuse reflectance ratio according to the first zenith angle, the conversion coefficient, a second azimuth angle of the incident light, and a second zenith angle of the incident light;

[0008] determining a third diffuse reflectance according to the first diffuse reflectance and the second diffuse reflectance;

[0009] The temperature of the object to be measured is determined according to the third diffuse reflectance ratio and the set parameters.

[0010] In one embodiment, the set parameters include radiation detection signal, emissivity, brightness radiation intensity and transmittance;

[0011] The determining the temperature of the object to be measured according to the third diffuse reflectance ratio and the set parameters includes:

[0012] determining radiation brightness according to the third diffuse reflectance, the radiation detection signal, the emissivity, the brightness radiation intensity, and the transmittance;

[0013] The temperature of the object to be measured is determined according to the correlation between the radiation brightness and the temperature of the object to be measured.

[0014] In one embodiment, the formula for determining the first diffuse reflectance ratio according to the first azimuth angle of the reflected light, the first apex angle of the reflected light, and the conversion coefficient is as follows:

[0015]

[0016] Among them, ρ 0 / d represents the first diffuse reflectance, k represents the conversion coefficient, φ r Represents the first azimuth angle of reflected light, θ r Indicates the first vertex angle of reflected light.

[0017] In one embodiment, the formula for determining the second diffuse reflectance ratio based on the first zenith angle, the conversion coefficient, the second azimuth angle of the incident light, and the second zenith angle of the incident light is as follows:

[0018]

[0019] Among them, ρ D / θ represents the second diffuse reflectance, k represents the conversion coefficient, θ r represents the first vertex angle of the reflected light, θ i represents the second vertex angle of the incident light, φ i Represents the second azimuth angle of the incident light.

[0020] In one embodiment, the formula for determining the third diffuse reflectance ratio based on the first diffuse reflectance ratio and the second diffuse reflectance ratio is as follows:

[0021]

[0022] Among them, ρ′ D / θ represents the third diffuse reflectance, ρ 0 / d represents the first diffuse reflectance, k represents the conversion coefficient, φ r Represents the first azimuth angle of reflected light, θ r represents the first vertex angle of the reflected light, θ i represents the second vertex angle of the incident light, φ i Represents the second azimuth angle of the incident light.

[0023] In one embodiment, the formula for determining the radiation brightness based on the third diffuse reflectance, the radiation detection signal, the emissivity, the brightness radiation intensity, and the transmittance is as follows:

[0024] S=τ(εL(T)+ρ′ D / θ L u );

[0025] Where S represents the radiation detection signal, τ represents the transmittance, ε represents the emissivity, L(T) represents the radiation brightness at temperature T, and ρ′ D / θ Represents the third diffuse reflectance, L u Indicates the brightness radiation intensity.

[0026] In one embodiment, determining the radiation detection signal includes:

[0027] A detection device is used to detect the radiation detection signal.

[0028] The present invention also provides a radiation temperature measuring device, comprising:

[0029] a first diffuse reflectance determination module, configured to determine a first diffuse reflectance according to a first azimuth angle of the reflected light, a first apex angle of the reflected light, and a conversion coefficient;

[0030] a second diffuse reflectance determination module, configured to determine a second diffuse reflectance according to the first zenith angle, the conversion coefficient, a second azimuth angle of the incident light, and a second zenith angle of the incident light;

[0031] a third diffuse reflectance determination module, configured to determine a third diffuse reflectance according to the first diffuse reflectance and the second diffuse reflectance;

[0032] The temperature measurement module is used to determine the temperature of the object to be measured according to the third diffuse reflectance ratio and set parameters.

[0033] The present invention also provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, any of the above-described radiation temperature measurement methods is implemented.

[0034] The present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements any of the above-described radiation temperature measurement methods.

[0035] The radiation temperature measurement method, device, electronic device, and storage medium provided by the present invention determine a first diffuse reflectance based on a first azimuth angle of reflected light, a first zenith angle of reflected light, and a conversion coefficient; determine a second diffuse reflectance based on the first zenith angle, the conversion coefficient, a second azimuth angle of incident light, and a second zenith angle of incident light; determine a third diffuse reflectance based on the first and second diffuse reflectances; and determine the temperature of the object being measured based on the third diffuse reflectance and set parameters. By measuring the third diffuse reflectance at any observation angle and then performing radiation temperature measurement based on the third diffuse reflectance, the present invention improves the accuracy of radiation temperature measurement. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] In order to more clearly illustrate the technical solutions in the present invention or the prior art, a brief introduction is given below to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0037] Figure 1 1 is a flow chart of the radiation temperature measurement method provided by the present invention;

[0038] Figure 2 It is a structural diagram of the radiation temperature measurement provided by the present invention;

[0039] Figure 3 Schematic diagram of the BRDF angle symbol provided by the present invention;

[0040] Figure 4 It is a structural schematic diagram of the radiation temperature measuring device provided by the present invention;

[0041] Figure 5 It is a structural schematic diagram of the electronic device provided by the present invention. DETAILED DESCRIPTION

[0042] To make the objectives, technical solutions, and advantages of the present invention more clear, the technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the embodiments described are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.

[0043] The following combination Figure 1-Figure 5 The radiation temperature measurement method, device, electronic device and storage medium of the present invention are described.

[0044] Specifically, the present invention provides a radiation temperature measurement method, referring to Figure 1 , Figure 1 It is a flow chart of the radiation temperature measurement method provided by the present invention.

[0045] The radiation temperature measurement method provided by the embodiment of the present invention includes:

[0046] Step 100, determining a first diffuse reflectance ratio according to a first azimuth angle of the reflected light, a first apex angle of the reflected light, and a conversion coefficient;

[0047] It should be noted that diffuse reflection refers to the phenomenon in which light is reflected irregularly in all directions by a rough surface. Material diffuse reflectance is one of the six physical quantities of optical parameters and can be applied in a variety of scenarios, such as lighting engineering, remote sensing science, space exploration, and radiation temperature measurement. This embodiment of the present invention uses radiation temperature measurement as an example to illustrate the measurement and application of diffuse reflectance.

[0048] In the application scenario of radiation temperature measurement, the observer usually stands at a certain distance from the observed person, and the observer can only detect a relatively small solid angle range. Figure 2 As shown, the lighting condition of the object being measured (left side) comes from the environment and is a diffuse lighting condition, called the Diffuse condition (abbreviated as the D condition), and the observation angle is θ. However, currently, the diffuse reflectance can only be measured under the 0 / D condition or the condition approximately 0 / D. That is, under the D condition, the diffuse reflectance can only be measured when the observation angle is 0 or approximately 0, and the diffuse reflectance at any adjustable observation angle cannot be measured. Based on this, the embodiment of the present invention proposes a method for measuring the diffuse reflectance at any observation angle to improve the accuracy of radiation temperature measurement.

[0049] Specifically, an embodiment of the present invention proposes a method for measuring the diffuse reflectance ratio under specific conditions of θ / D based on the material bidirectional reflectance distribution function (BRDF) measurement data. Based on this method, the measurement of the observation angle θ in the range of approximately 0 to ±90 degrees can be achieved.

[0050] For the BRDF measurement under the θ / D condition, it can be measured that when the reflection angle is fixed at θ, the scanning measurement is performed at a certain angle interval, and the incident angle is measured under the hemispherical space condition (θ i ,0;θ,0) BRDF values ​​f of multiple points r (θ i ), and then the diffuse reflectance under θ / D conditions can be calculated by using the integral summation method.

[0051] The first diffuse reflectance is determined according to the first azimuth angle of the reflected light, the first apex angle of the reflected light, and the conversion coefficient. Figure 3 As shown, the absolute reproduction method of diffuse reflectance is used to obtain the standard value of reflectance under 0 / D conditions. According to the relationship between BRDF and reflectance under 0 / D conditions, the following relationship exists:

[0052]

[0053] Among them, ρ 0 / d represents the first diffuse reflectance, k represents the conversion coefficient, φ r Represents the first azimuth angle of reflected light, θr Indicates the first vertex angle of reflected light.

[0054] It can be understood that the first diffuse reflectance refers to the standard value of the reflectance under the condition of 0 / D, that is, the diffuse reflectance when the observation angle is 0.

[0055] Step 200, determining a second diffuse reflectance ratio according to the first zenith angle, the conversion coefficient, a second azimuth angle of the incident light, and a second zenith angle of the incident light;

[0056] After determining the first diffuse reflectance, the second diffuse reflectance needs to be determined. Specifically, the second diffuse reflectance is determined based on the first apex angle, the conversion coefficient, the second azimuth angle of the incident light, and the second apex angle of the incident light. For example, Figure 3 As shown, the calculation formula for the second diffuse reflectance is:

[0057]

[0058] Among them, ρ D / θ represents the second diffuse reflectance, k represents the conversion coefficient, θ r represents the first vertex angle of the reflected light, θ i represents the second vertex angle of the incident light, φ i Represents the second azimuth angle of the incident light.

[0059] Step 300: determining a third diffuse reflectance according to the first diffuse reflectance and the second diffuse reflectance;

[0060] According to the first diffuse reflectance and the second diffuse reflectance, a third diffuse reflectance is determined, for example, Figure 3 As shown, the third diffuse reflectance calculation formula is obtained by dividing formula (2) / formula (1):

[0061]

[0062] Among them, ρ′ D / θ represents the third diffuse reflectance, ρ 0 / d represents the first diffuse reflectance, k represents the conversion coefficient, φ r Represents the first azimuth angle of reflected light, θ r represents the first vertex angle of the reflected light, θ i represents the second vertex angle of the incident light, φ i Represents the second azimuth angle of the incident light.

[0063] By measuring the BRDF characteristics of a material, its diffuse reflectance characteristics under the θ / D condition can be determined, thereby enabling measurement of observation angles θ within the range of approximately 0 to ±90 degrees. In other words, the diffuse reflectance at any observation angle can be measured using formula (3).

[0064] Step 400: Determine the temperature of the object to be measured according to the third diffuse reflectance ratio and set parameters.

[0065] It should be noted that any object whose temperature exceeds absolute zero will continuously emit infrared radiation energy into the surrounding space. Therefore, by measuring the infrared energy radiated by the object itself, its surface temperature can be accurately determined, that is, radiation temperature measurement is realized.

[0066] The temperature of the object to be measured is determined according to the third diffuse reflectance and set parameters, wherein the set parameters include radiation detection signal, emissivity, brightness radiation intensity and transmittance.

[0067] The radiation temperature measurement method provided by an embodiment of the present invention determines a first diffuse reflectance based on a first azimuth angle of reflected light, a first apex angle of the reflected light, and a conversion coefficient; determines a second diffuse reflectance based on the first apex angle, the conversion coefficient, a second azimuth angle of incident light, and a second apex angle of incident light; determines a third diffuse reflectance based on the first and second diffuse reflectances; and determines the temperature of the object being measured based on the third diffuse reflectance and set parameters. By measuring the third diffuse reflectance at any observation angle and then performing radiation temperature measurement based on the third diffuse reflectance, the present invention improves the accuracy of radiation temperature measurement.

[0068] Based on the above embodiment, determining the temperature of the object to be measured according to the third diffuse reflectance ratio and the set parameters includes:

[0069] determining radiation brightness according to the third diffuse reflectance, the radiation detection signal, the emissivity, the brightness radiation intensity, and the transmittance;

[0070] The temperature of the object to be measured is determined according to the correlation between the radiation brightness and the temperature of the object to be measured.

[0071] A detection device is used to detect the radiation detection signal. The radiation brightness is then determined based on the third diffuse reflectance, the radiation detection signal, the emissivity, the brightness radiation intensity, and the transmittance. The temperature of the object being measured is then determined based on the correlation between the radiation brightness and the temperature of the object being measured. Emissivity, also known as relative emissivity, refers to the ratio of the radiation capacity of an object to the radiation capacity of an ideal black body at the same temperature, which is called the emissivity of the object. Brightness radiation intensity refers to the radiation energy of a point light source passing through a unit solid angle in a given direction. Transmittance, also known as the transmission coefficient, refers to the ratio of the transmitted luminous flux to the incident luminous flux. Radiant brightness refers to the radiation flux emitted by a surface element at a point on the surface of the radiation source within a unit solid angle and unit projected area in a given direction. It can be understood that there is a one-to-one correspondence between the radiation brightness and the temperature of the object being measured. Therefore, after determining the radiation brightness, the temperature of the object being measured can be solved.

[0072] Specifically, according to the third diffuse reflectance, the radiation detection signal, the emissivity, the brightness radiation intensity and the transmittance, the formula for determining the radiation brightness is as follows:

[0073] S=τ(εL(T)+ρ′ D / θ L u ) (4);

[0074] Where S represents the radiation detection signal, τ represents the transmittance, ε represents the emissivity, L(T) represents the radiation brightness at temperature T, and ρ′ D / θ Represents the third diffuse reflectance, L u Indicates the brightness radiation intensity.

[0075] For example, the embodiment of the present invention proposes a radiation temperature measurement method based on a fusion standard, assuming that the ambient radiation brightness (or background brightness) is L u , during the entire measurement period L u is a constant with no fluctuations. There is no significant fluctuation in atmospheric density during the measurement process, and the air transmittance of the detection system's distance fusion standard is considered a constant τ. The radiation detection signal measured by the detection system is S (brightness), the object's emissivity is ε, and the third diffuse reflectance is ρ' D / θ , the temperature of the object being measured is T, and the radiation brightness of an ideal black body at temperature T is L(T), then the following relationship exists:

[0076] S=τ(εL(T)+ρ′ D / θ L u ) (4);

[0077] Assume that the subscript of the object being measured is represented by x, and there are n sets of reference standards with subscripts 1...n, then:

[0078]

[0079] Among them, S x , S1, S2, S n represents the radiation detection signal, τ represents the transmittance, ε x , ε1, ε2, ε n represents the emissivity, L(T) represents the radiant brightness at a temperature of T, T represents the temperature of the object being measured, L(T am ) represents the temperature T am The radiance, T am represents the ambient temperature, ρ x ,ρ1,ρ2,ρ n Represents the third diffuse reflectance, L u Indicates the brightness radiation intensity.

[0080] In the above expression (5), the physical quantities to be solved include: the temperature of the object being measured T, the ambient temperature T am , brightness radiation intensity L u , the transmittance τ and radiance of the current atmospheric environment. The reflectance and emissivity of the object being measured and the reference standard are both known. Therefore, based on the unknown physical quantities in equation (5), at least four equations are required to solve. In other words, in addition to the equation for the object being measured, at least three reference standards are required to solve the precise temperature of the object being measured.

[0081] However, the above equation (i.e., formula (5)) is an ill-conditioned equation because some parameters cannot be independent, and it cannot solve the temperature of the object being measured. Therefore, it is necessary to establish different forms of equations. For example, the same standard plate can be placed at different positions to add an equation. Assuming that the current detection system is m away from the standard plate, then an identical observation plate S2 is placed at a distance of 2m, and on the observation surface of the detector, it is located at an adjacent pixel position to the original S2, so that the observation angle can be consistent. Since the distance has doubled, the length of the air penetrated has doubled, and the expression can be obtained as follows:

[0082] S3=τ 2 (ε2L(T am )+ρ2L u ) (9);

[0083] Combined available:

[0084]

[0085] Among them, S x , S1, S2, S3 represent the radiation detection signal, τ represents the transmittance, ε x , ε1, ε2 represent emissivity, L(T) represents the radiant brightness at temperature T, L(T am ) represents the temperature T am The radiance, ρ x , ρ1, ρ2 represent the third diffuse reflectance, L u Indicates the brightness radiation intensity.

[0086] The solution is based on formulas (6) to (9), and the process is as follows:

[0087] Formula (8) / (9) yields τ=S3 / S2(10);

[0088] Combining (7) and (8) we can get:

[0089] ε2S1-ε1S2=ε2τ(ε1L(T am )+ρ1L u )-ε1τ(ε2L(Tam )+ρ2L u )=ε2τρ1L u -ε1τρ2L u (11);

[0090] Simplifying, we can get:

[0091] Substituting (10) and (12) into (6) yields:

[0092]

[0093]

[0094] L(T) in formula (14) is Planck's formula, so L(T) can be calculated by numerical method, based on which the temperature of the object being measured can be calculated.

[0095] This embodiment of the present invention determines the radiant brightness based on the third diffuse reflectance, the radiation detection signal, the emissivity, the luminance radiation intensity, and the transmittance. The temperature of the object being measured is then determined based on the correlation between the radiant brightness and the object's temperature. This embodiment of the present invention improves the accuracy of radiant temperature measurement by measuring the third diffuse reflectance at any observation angle and then performing radiant temperature measurement based on the third diffuse reflectance.

[0096] Figure 4 This is a schematic diagram of the structure of the radiation temperature measuring device provided by the present invention, referring to Figure 4 An embodiment of the present invention provides a radiation temperature measurement device, including a first diffuse reflectance determination module 401, a second diffuse reflectance determination module 402, a third diffuse reflectance determination module 403 and a temperature measurement module 404.

[0097] A first diffuse reflectance determination module 401 is configured to determine a first diffuse reflectance according to a first azimuth angle of the reflected light, a first apex angle of the reflected light, and a conversion coefficient;

[0098] a second diffuse reflectance determination module 402, configured to determine a second diffuse reflectance according to the first zenith angle, the conversion coefficient, a second azimuth angle of the incident light, and a second zenith angle of the incident light;

[0099] a third diffuse reflectance determining module 403, configured to determine a third diffuse reflectance according to the first diffuse reflectance and the second diffuse reflectance;

[0100] The temperature measurement module 404 is configured to determine the temperature of the object under measurement according to the third diffuse reflectance ratio and set parameters.

[0101] The radiation temperature measurement device provided in an embodiment of the present invention determines a first diffuse reflectance based on a first azimuth angle of reflected light, a first apex angle of the reflected light, and a conversion coefficient; determines a second diffuse reflectance based on the first apex angle, the conversion coefficient, a second azimuth angle of incident light, and a second apex angle of incident light; determines a third diffuse reflectance based on the first and second diffuse reflectances; and determines the temperature of the object being measured based on the third diffuse reflectance and set parameters. By measuring the third diffuse reflectance at any observation angle and then performing radiation temperature measurement based on the third diffuse reflectance, the present invention improves the accuracy of radiation temperature measurement.

[0102] In one embodiment, the set parameters include radiation detection signal, emissivity, brightness radiation intensity and transmittance;

[0103] The temperature measurement module 404 is specifically used for:

[0104] determining radiation brightness according to the third diffuse reflectance, the radiation detection signal, the emissivity, the brightness radiation intensity, and the transmittance;

[0105] The temperature of the object to be measured is determined according to the correlation between the radiation brightness and the temperature of the object to be measured.

[0106] In one embodiment, the first diffuse reflectance determination module 401 is specifically configured to:

[0107]

[0108] Among them, ρ 0 / d represents the first diffuse reflectance, k represents the conversion coefficient, φ r Represents the first azimuth angle of reflected light, θ r Indicates the first vertex angle of reflected light.

[0109] In one embodiment, the second diffuse reflectance determination module 402 is specifically configured to:

[0110]

[0111] Among them, ρ D / θ represents the second diffuse reflectance, k represents the conversion coefficient, θ r represents the first vertex angle of the reflected light, θ i represents the second vertex angle of the incident light, φ i Represents the second azimuth angle of the incident light.

[0112] In one embodiment, the third diffuse reflectance determination module 403 is specifically configured to:

[0113]

[0114] Among them, ρ′D / θ represents the third diffuse reflectance, ρ 0 / d represents the first diffuse reflectance, k represents the conversion coefficient, φ r Represents the first azimuth angle of reflected light, θ r represents the first vertex angle of the reflected light, θ i represents the second vertex angle of the incident light, φ i Represents the second azimuth angle of the incident light.

[0115] In one embodiment, the temperature measurement module 404 is specifically configured to:

[0116] S=τ(εL(T)+ρ′ D / θ L u );

[0117] Where S represents the radiation detection signal, τ represents the transmittance, ε represents the emissivity, L(T) represents the radiation brightness at temperature T, and ρ′ D / θ Represents the third diffuse reflectance, L u Indicates the brightness radiation intensity.

[0118] In one embodiment, the temperature measurement module 404 is specifically configured to:

[0119] A detection device is used to detect the radiation detection signal.

[0120] Figure 5 An example of a physical structure diagram of an electronic device is shown below. Figure 5 As shown, the electronic device may include: a processor 510, a communications interface 520, a memory 530, and a communication bus 540, wherein the processor 510, the communications interface 520, and the memory 530 communicate with each other via the communication bus 540. The processor 510 may call the logic instructions in the memory 530 to execute the radiation temperature measurement method, which includes:

[0121] determining a first diffuse reflectance ratio according to a first azimuth angle of the reflected light, a first apex angle of the reflected light, and a conversion coefficient;

[0122] determining a second diffuse reflectance ratio according to the first zenith angle, the conversion coefficient, a second azimuth angle of the incident light, and a second zenith angle of the incident light;

[0123] determining a third diffuse reflectance according to the first diffuse reflectance and the second diffuse reflectance;

[0124] The temperature of the object to be measured is determined according to the third diffuse reflectance ratio and the set parameters.

[0125] In addition, the logic instructions in the above-mentioned memory 530 can be implemented in the form of a software functional unit and can be stored in a computer-readable storage medium when sold or used as an independent product. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art or the part of the technical solution can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc. Various media that can store program codes.

[0126] On the other hand, the present invention further provides a non-transitory computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the method for measuring radiation temperature provided by the above methods is implemented. The method includes:

[0127] determining a first diffuse reflectance ratio according to a first azimuth angle of the reflected light, a first apex angle of the reflected light, and a conversion coefficient;

[0128] determining a second diffuse reflectance ratio according to the first zenith angle, the conversion coefficient, a second azimuth angle of the incident light, and a second zenith angle of the incident light;

[0129] determining a third diffuse reflectance according to the first diffuse reflectance and the second diffuse reflectance;

[0130] The temperature of the object to be measured is determined according to the third diffuse reflectance ratio and the set parameters.

[0131] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, i.e., they may be located in one location or distributed across multiple network units. Some or all of the modules may be selected based on actual needs to achieve the objectives of the present embodiment. Persons of ordinary skill in the art will be able to understand and implement the present invention without inventive effort.

[0132] Through the description of the above embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus a necessary general hardware platform, or of course, by hardware. Based on this understanding, the essence of the above technical solution or the part that contributes to the existing technology can be embodied in the form of a software product. The computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a magnetic disk, an optical disk, etc., and includes a number of instructions for enabling a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or certain parts of the embodiments.

[0133] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. A radiation temperature measurement method, characterized in that: include: determining a first diffuse reflectance ratio according to a first azimuth angle of the reflected light, a first apex angle of the reflected light, and a conversion coefficient; determining a second diffuse reflectance ratio according to the first zenith angle, the conversion coefficient, a second azimuth angle of the incident light, and a second zenith angle of the incident light; determining a third diffuse reflectance according to the first diffuse reflectance and the second diffuse reflectance; determining the temperature of the object to be measured according to the third diffuse reflectance ratio and the set parameters; The set parameters include radiation detection signal, emissivity, brightness radiation intensity and transmittance; The determining the temperature of the object to be measured according to the third diffuse reflectance ratio and the set parameters includes: determining radiation brightness according to the third diffuse reflectance, the radiation detection signal, the emissivity, the brightness radiation intensity, and the transmittance; determining the temperature of the object to be measured according to the correlation between the radiant brightness and the temperature of the object to be measured; The formula for determining the first diffuse reflectance ratio according to the first azimuth angle of the reflected light, the first apex angle of the reflected light, and the conversion coefficient is as follows: ； in, represents the first diffuse reflectance, represents the conversion factor, represents the first azimuth angle of the reflected light, Indicates the first vertex angle of reflected light; The formula for determining the second diffuse reflectance ratio according to the first zenith angle, the conversion coefficient, the second azimuth angle of the incident light, and the second zenith angle of the incident light is as follows: ； in, represents the second diffuse reflectance, represents the conversion factor, represents the first vertex angle of the reflected light, represents the second vertex angle of the incident light, represents the second azimuth angle of the incident light; The formula for determining the third diffuse reflectance ratio based on the first diffuse reflectance ratio and the second diffuse reflectance ratio is as follows: ； in, represents the third diffuse reflectance, represents the first diffuse reflectance, represents the conversion factor, represents the first azimuth angle of the reflected light, represents the first vertex angle of the reflected light, represents the second vertex angle of the incident light, represents the second azimuth angle of the incident light; The formula for determining the radiation brightness based on the third diffuse reflectance, the radiation detection signal, the emissivity, the brightness radiation intensity, and the transmittance is as follows: ； in, Represents the radiation detection signal, represents the transmittance, represents the emissivity, Indicates the temperature The radiance, represents the third diffuse reflectance, Indicates the brightness radiation intensity.

2. The radiation temperature measurement method according to claim 1, characterized in that: Determining the radiation detection signal includes: A detection device is used to detect the radiation detection signal.

3. A radiation temperature measuring device, characterized in that: include: a first diffuse reflectance determination module, configured to determine a first diffuse reflectance according to a first azimuth angle of the reflected light, a first apex angle of the reflected light, and a conversion coefficient; a second diffuse reflectance determination module, configured to determine a second diffuse reflectance according to the first zenith angle, the conversion coefficient, a second azimuth angle of the incident light, and a second zenith angle of the incident light; a third diffuse reflectance determination module, configured to determine a third diffuse reflectance according to the first diffuse reflectance and the second diffuse reflectance; a temperature measurement module, configured to determine the temperature of the object under test based on the third diffuse reflectance and set parameters; the set parameters including radiation detection signal, emissivity, brightness radiation intensity, and transmittance; The temperature measurement module is further configured to determine the radiation brightness based on the third diffuse reflectance, the radiation detection signal, the emissivity, the brightness radiation intensity, and the transmittance; and determine the temperature of the object under test based on a correlation between the radiation brightness and the temperature of the object under test; The calculation formula of the first diffuse reflectance is as follows: ； in, represents the first diffuse reflectance, represents the conversion factor, represents the first azimuth angle of the reflected light, Indicates the first vertex angle of reflected light; The calculation formula of the second diffuse reflectance is as follows: ； in, represents the second diffuse reflectance, represents the conversion factor, represents the first vertex angle of the reflected light, represents the second vertex angle of the incident light, represents the second azimuth angle of the incident light; The calculation formula of the third diffuse reflectance is as follows: ； in, represents the third diffuse reflectance, represents the first diffuse reflectance, represents the conversion factor, represents the first azimuth angle of the reflected light, represents the first vertex angle of the reflected light, represents the second vertex angle of the incident light, represents the second azimuth angle of the incident light; The calculation formula of the radiation detection signal is as follows: ； in, Represents the radiation detection signal, represents the transmittance, represents the emissivity, Indicates the temperature The radiance, represents the third diffuse reflectance, Indicates the brightness radiation intensity.

4. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the program, the radiation temperature measurement method according to any one of claims 1 to 2 is implemented.

5. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the radiation temperature measurement method according to any one of claims 1 to 2 is implemented.

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