Power supply testing method, device, equipment and storage medium

Abstract

The present application discloses a power supply testing method, apparatus, device, and storage medium, relating to the field of system testing technology, including: determining the power supply and corresponding power rails in the integrated circuit to be tested; setting up several voltage regulator test tools according to the power rails, and using the voltage regulator test tools to simulate the load current demand of the power supply when the integrated circuit to be tested is operating; using a preset power control unit to control the state parameters corresponding to the several voltage regulator test tools based on the load current demand, and monitoring the change data of the state parameters corresponding to the several voltage regulator test tools after the power supply starts to operate to obtain corresponding power supply test results. By simulating the working state under load through the voltage regulator test tools and performing multiple controls through the preset power control unit, the mutual influence of multiple power rails and the working conditions under different states can be tested, thereby improving the effectiveness of the power supply test.

Description

Technical Field

[0001] The present invention relates to the technical field of system testing, and in particular to a power supply testing method, device, equipment and storage medium. Background Art

[0002] Large-scale integrated circuits (ICs) have multiple power rails, i.e., power rails for power supply. For example, the core of a CPU (Central Processing Unit) requires a separate power rail, and the CPU's cache, IO ports, etc. also require separate power rails. However, due to the space limitations of a PCB (Printed Circuit Board), multiple power rails will inevitably overlap between different layers. During the operation of the CPU, the power rails may affect each other, which may seriously affect the normal operation of the CPU. In the prior art, power supply tests are all single power rail tests. For example, to test the core power supply of a CPU, only the current is pulled at the load end for testing, so the mutual influence of the power rails cannot be discovered. Moreover, during the test, the power rails are all in normal working condition, but the system test cannot obtain the corresponding test data and cannot test the worst case. Therefore, even if the system test in the R&D stage is fine, it cannot be guaranteed that there will be no problems during the customer's application. Therefore, how to clarify the mutual influence between the power rails through testing and better optimize the power supply solution in the power test stage is a problem to be solved in this field. Summary of the Invention

[0003] In view of this, the present invention aims to provide a power supply testing method, apparatus, device, and storage medium. This method can simulate the operating states of various components in a tested integrated circuit under load using a voltage regulator test tool. Furthermore, a preset power supply control unit can be used to perform various controls on the operating states of the voltage regulator test tool. This allows for testing the mutual influence of multiple power rails and their operating conditions under different states, thereby improving the effectiveness of power supply testing. The specific scheme is as follows:

[0004] In a first aspect, the present application provides a power supply testing method, comprising:

[0005] Determining a plurality of power supplies in the integrated circuit to be tested and a plurality of power rails corresponding to the plurality of power supplies;

[0006] Setting a plurality of voltage regulator test tools according to the plurality of power rails, and using the plurality of voltage regulator test tools to simulate the load current requirements of the plurality of power supplies when the integrated circuit to be tested is operating;

[0007] A preset power supply control unit is used to control the state parameters corresponding to the multiple voltage regulator test tools based on the load current demand, and after the multiple power supplies start working, the state parameter change data corresponding to the multiple voltage regulator test tools are monitored, and the corresponding power supply test results are obtained by analyzing the state parameter change data.

[0008] Optionally, determining a plurality of power supplies in the integrated circuit to be tested and a plurality of power rails corresponding to the plurality of power supplies respectively includes:

[0009] Determine several power supplies in the integrated circuit to be tested, and determine several power rails based on a one-to-one correspondence principle;

[0010] Accordingly, the setting of a plurality of voltage regulator test tools according to the plurality of power rails includes:

[0011] A corresponding voltage regulator testing tool is provided on each power rail according to the number of the power rails.

[0012] Optionally, the controlling of the state parameters corresponding to the plurality of voltage regulator test tools based on the load current requirement by using a preset power supply control unit includes:

[0013] Using a preset power supply control unit to control the state parameters corresponding to different voltage regulator test tools based on the load current demand;

[0014] Alternatively, after the plurality of voltage regulator test tools are connected in parallel, a preset power supply control unit is used to uniformly control the state parameters corresponding to the plurality of voltage regulator test tools based on the load current demand.

[0015] Optionally, the using of a preset power supply control unit to control state parameters corresponding to different voltage regulator test tools based on the load current requirement includes:

[0016] A preset power supply control unit is used to control the multiple voltage regulator test tools to work in staggered operation based on the load current demand, and the state parameters corresponding to different voltage regulator test tools are set to different state parameters corresponding to different working states of the central processing unit, so as to monitor the state parameter change data after the multiple power supplies start working, and analyze the state parameter change data to test the mutual influence of the staggered operation of the multiple power rails.

[0017] Optionally, the using of a preset power supply control unit to control state parameters corresponding to different voltage regulator test tools based on the load current requirement includes:

[0018] A preset power supply control unit is used to set, based on the load current demand, other voltage regulator test tools except for the plurality of target voltage regulator test tools to operate simultaneously, and the plurality of target voltage regulator test tools to operate at staggered times relative to the other voltage regulator test tools, and to set corresponding status parameters so as to monitor the status parameter change data after the plurality of power supplies start working, and to analyze the status parameter change data so as to test the influence of the power rail corresponding to the target voltage regulator test tool on other power rails.

[0019] Optionally, the using a preset power supply control unit to uniformly control the state parameters corresponding to the plurality of voltage regulator test tools based on the load current demand includes:

[0020] A preset power supply control unit is used to uniformly control the multiple voltage regulator test tools to operate simultaneously based on the load current demand, and to set corresponding state parameters so as to monitor the state parameter change data after the multiple power supplies start working, and to obtain corresponding power supply test results by analyzing the state parameter change data so as to test the mutual influence of the simultaneous operation of the multiple power rails.

[0021] Optionally, the controlling of the state parameters corresponding to the plurality of voltage regulator test tools based on the load current requirement by using a preset power supply control unit includes:

[0022] A preset power supply control unit is used to set the state parameters corresponding to the multiple voltage regulator test tools to target state parameters corresponding to a preset worst-case scenario based on the load current demand, so as to analyze the state parameter change data after the multiple power supplies start working and test the mutual influence of the multiple power rails corresponding to the multiple voltage regulator test tools under the preset worst-case scenario.

[0023] In a second aspect, the present application provides a power supply testing device, comprising:

[0024] A power supply determination module, configured to determine a plurality of power supplies in the integrated circuit to be tested and a plurality of power rails corresponding to the plurality of power supplies;

[0025] a demand simulation module, configured to set a plurality of voltage regulator test tools according to the plurality of power rails, and use the plurality of voltage regulator test tools to simulate the load current requirements of the plurality of power supplies when the integrated circuit to be tested is operating;

[0026] a parameter control module, configured to control state parameters corresponding to the plurality of voltage regulator test tools based on the load current requirement using a preset power supply control unit;

[0027] The data analysis module is used to monitor the state parameter change data corresponding to the several voltage regulator test tools after the several power supplies start working, and obtain corresponding power supply test results by analyzing the state parameter change data.

[0028] In a third aspect, the present application provides an electronic device comprising a processor and a memory; wherein the memory is used to store a computer program, and the computer program is loaded and executed by the processor to implement the aforementioned power supply testing method.

[0029] In a fourth aspect, the present application provides a computer-readable storage medium for storing a computer program, which implements the aforementioned power supply testing method when executed by a processor.

[0030] As can be seen from this. In the present application, several power supplies in the integrated circuit to be tested and several power rails corresponding to the several power supplies are determined; several voltage regulator test tools are set according to the several power rails, and the several voltage regulator test tools are used to simulate the load current requirements of the several power supplies when the integrated circuit to be tested is working; a preset power control unit is used to control the state parameters corresponding to the several voltage regulator test tools based on the load current requirements, and after the several power supplies start working, the state parameter change data corresponding to the several voltage regulator test tools are monitored, and the state parameter change data is analyzed to obtain the corresponding power supply test results. In this way, the working state of each component when there is a load in the integrated circuit to be tested can be simulated by the voltage regulator test tool, and the working state of the voltage regulator test tool can be controlled in multiple ways by the preset power control unit, so that the mutual influence of multiple power rails and the working conditions under different states can be tested, thereby avoiding the problem of inaccurate test results and poor test effect caused by testing only the normal working state of a single power supply, thereby improving the effect of power supply testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are merely embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the provided drawings without paying any creative work.

[0032] Figure 1 A flow chart of a power supply testing method provided in this application;

[0033] Figure 2 A specific implementation structure diagram of a power supply testing method provided in this application;

[0034] Figure 3 A flow chart of a specific power supply testing method provided in this application;

[0035] Figure 4 A schematic diagram of the structure of a power supply test device provided in this application;

[0036] Figure 5 This is a structural diagram of an electronic device provided in this application. DETAILED DESCRIPTION

[0037] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0038] Large-scale integrated circuits (ICs) have multiple power rails for power supply. Due to PCB space limitations, multiple power rails will inevitably overlap between different stacked layers. During CPU operation, the power rails may affect each other, seriously affecting the normal operation of the CPU. The present application can simulate the operating state of the tested integrated circuit under load through a voltage regulator test tool, and control the operating state of the voltage regulator test tool through a preset power control unit. This can test the mutual influence of multiple power rails and the working conditions under different working states, thereby improving the effectiveness of power supply testing.

[0039] See also Figure 1 As shown, an embodiment of the present invention discloses a power supply testing method, comprising:

[0040] Step S11 : determining a plurality of power supplies in the integrated circuit to be tested and a plurality of power rails corresponding to the plurality of power supplies.

[0041] In this embodiment, after the integrated circuit to be tested is determined, several power supply sources within the integrated circuit to be tested that power the large-scale integrated circuit are determined. Each power supply corresponds to a power rail within the integrated circuit based on a one-to-one correspondence principle. It will be appreciated that if a single power supply supplies power to components within multiple integrated ICs, one power supply source can be assigned to multiple power rails. Determining multiple power rails facilitates subsequent testing of interactions between the power rails.

[0042] Step S12: setting a plurality of voltage regulator test tools according to the plurality of power rails, and using the plurality of voltage regulator test tools to simulate the load current requirements of the plurality of power supplies when the integrated circuit to be tested is working.

[0043] In this embodiment, a corresponding voltage regulator test tool is provided on each power rail according to the number of power rails, so that the voltage regulator test tools can be used to simulate the load current requirements of the multiple power supplies when the integrated circuit under test is operating. It is understood that the voltage regulator test tool (VRTT) can simulate the load current requirements of the large-scale integrated circuit when operating. The preset power control unit can communicate with the VRTT to control the state of each VRTT, including but not limited to the amplitude of the load current, the current slope (response speed), the dynamic operating frequency and other parameters. The voltage regulator test tool can implement synchronous or asynchronous control to simulate different operating states of the CPU and more accurately test the interaction between power rails. It can also simulate various special operating states, such as the situation when the current on the power rail of the integrated circuit reaches a peak, to conduct more detailed testing of the power supply and reduce the probability of abnormal problems during subsequent commissioning.

[0044] Step S13: Using a preset power supply control unit to control the state parameters corresponding to the plurality of voltage regulator test tools based on the load current demand, and monitoring the state parameter change data corresponding to the plurality of voltage regulator test tools after the plurality of power supplies start working, and obtaining corresponding power supply test results by analyzing the state parameter change data.

[0045] In this embodiment, a preset power supply control unit can be used to control the state parameters corresponding to different voltage regulator test tools based on the load current demand; or, after the multiple voltage regulator test tools are connected in parallel, the preset power supply control unit can be used to uniformly control the state parameters corresponding to the multiple voltage regulator test tools based on the load current demand to achieve synchronous control or asynchronous control, facilitate multiple tests, and improve test results.

[0046] It should be pointed out that a preset power supply control unit can be used to set the state parameters corresponding to the several voltage regulator test tools to target state parameters corresponding to a preset worst-case scenario based on the load current demand, so as to analyze the state parameter change data after the several power supplies start working, and test the mutual influence of the several power rails corresponding to the several voltage regulator test tools under the preset worst-case scenario. By testing under the worst-case scenario, the power supply solution can be optimized in the R&D stage by analyzing the test data, thereby reducing the manual maintenance costs that may be incurred during subsequent commissioning.

[0047] like Figure 2 As shown, power supply 1 to power supply n are power supplies for large-scale integrated ICs, each power supply corresponds to a power rail of the integrated IC, and the number of power supplies depends on the number of power rails required by the integrated IC; VRTT1 to VRTTn are voltage regulator test tools, each VRTT can simulate the load current when the large-scale integrated IC is working, including but not limited to current amplitude, slope, frequency, etc. Each VRTT can be used for testing alone, or can be connected in parallel and uniformly controlled by the control unit for testing; the control unit is used to control the working state and test parameters of each VRTT according to the test requirements. Through the above technical solution, the present application can simulate the working state of each component when there is a load in the integrated circuit to be tested through the voltage regulator test tool, and control the working state of the voltage regulator test tool through the preset power control unit to test the working conditions of multiple power rails, avoiding the problem of inaccurate test results and poor test effect caused by testing only the normal working state of a single power supply, and can perform testing in the worst case. By analyzing the test data, the power supply solution can be optimized in the R&D stage, reducing the manual maintenance costs that may be incurred during the subsequent commissioning process, and improving the effect of power supply testing.

[0048] Based on the previous embodiment, it can be seen that the present application can use the voltage regulator test tool to simulate the working state and perform control to achieve the test purpose. Next, the different control methods of the voltage regulator test tool will be described in detail in this embodiment. Figure 3 As shown, the embodiment of the present application discloses a specific power supply testing method, including:

[0049] Step S21 : Using a preset power control unit to control state parameters corresponding to a plurality of voltage regulator test tools on a power rail based on a load current requirement and a preset control scheme.

[0050] In a specific embodiment, a preset power supply control unit is used to control the staggered operation of the several voltage regulator test tools based on the load current demand, and the state parameters corresponding to different voltage regulator test tools are set to different state parameters corresponding to different working states of the central processor, so as to monitor the state parameter change data after the several power supplies start working, and analyze the state parameter change data to test the mutual influence of the staggered operation of the several power rails.

[0051] In another specific embodiment, a preset power supply control unit is used to set the voltage regulator test tools other than the target voltage regulator test tools to operate simultaneously based on the load current demand, and to set the target voltage regulator test tools to operate at staggered times relative to the other voltage regulator test tools. For example, the control unit controls VRTT2-VRTTn to load simultaneously, while VRTT1 loads at a staggered time, to test the impact of the power rail corresponding to power supply 1 on other power rails, or controls VRTT1 and VRTT2 to operate simultaneously, controls the other VRTTs to operate at staggered times, and sets corresponding state parameters. This allows monitoring of the state parameter change data after the power supplies start operating, and by analyzing the state parameter change data, to test the impact of the power rail corresponding to the target voltage regulator test tool on other power rails.

[0052] In another specific embodiment, a preset power supply control unit is used to uniformly control the multiple voltage regulator test tools to work simultaneously based on the load current demand, and set corresponding state parameters so as to monitor the state parameter change data after the multiple power supplies start working, and obtain corresponding power supply test results by analyzing the state parameter change data so as to test the mutual influence of the simultaneous operation of the multiple power rails.

[0053] It's understood that the control scheme for the voltage regulator test tool is not limited to the one described above and can be adjusted based on actual needs. Furthermore, this method can be used to test not only the interplay between power rails within large-scale integrated circuits (ICs), but also the interplay between overlapping and intersecting power rails on an onboard server motherboard. This technical solution allows for testing the interplay between individual power rails when the integrated IC is operating under load, achieving enhanced testing results.

[0054] Step S22: After the power supply starts to work, the state parameter change data corresponding to the plurality of voltage regulator test tools are monitored, and the state parameter change data are analyzed to obtain corresponding power supply test results.

[0055] For a more specific processing procedure of the above step S22, reference may be made to the corresponding contents disclosed in the above embodiments, which will not be described again here.

[0056] As can be seen, in this embodiment, a preset power supply control unit can be used to control the state parameters corresponding to the multiple voltage regulator test tools based on the load current demand and the preset control scheme. After the multiple power supplies begin operation, the state parameter change data corresponding to the multiple voltage regulator test tools can be monitored, and the corresponding power supply test results can be obtained by analyzing the state parameter change data. Controlling the operating state of each VRTT and simulating different operating states of the CPU can achieve better testing results.

[0057] See also Figure 4 As shown, the embodiment of the present application also discloses a power supply testing device, including:

[0058] A power supply determination module 11 is configured to determine a plurality of power supplies in the integrated circuit to be tested and a plurality of power rails corresponding to the plurality of power supplies;

[0059] a demand simulation module 12, configured to set a plurality of voltage regulator test tools according to the plurality of power rails, and use the plurality of voltage regulator test tools to simulate the load current requirements of the plurality of power supplies when the integrated circuit to be tested is operating;

[0060] a parameter control module 13, configured to control the state parameters corresponding to the plurality of voltage regulator test tools based on the load current demand using a preset power supply control unit;

[0061] The data analysis module 14 is used to monitor the state parameter change data corresponding to the plurality of voltage regulator test tools after the plurality of power supplies start working, and to obtain corresponding power supply test results by analyzing the state parameter change data.

[0062] In this embodiment, several power supplies in the integrated circuit to be tested and several power rails corresponding to the several power supplies are determined; several voltage regulator test tools are set according to the several power rails, and the several voltage regulator test tools are used to simulate the load current requirements of the several power supplies when the integrated circuit to be tested is working; a preset power control unit is used to control the state parameters corresponding to the several voltage regulator test tools based on the load current requirements, and after the several power supplies start working, the state parameter change data corresponding to the several voltage regulator test tools are monitored, and the state parameter change data is analyzed to obtain the corresponding power supply test results. Through the above technical solution, the present application can simulate the working state of each component in the integrated circuit to be tested when there is a load through the voltage regulator test tool, and the working state of the voltage regulator test tool can be controlled in multiple ways through the preset power control unit, so as to test the mutual influence of multiple power rails and the working conditions under different states, thereby improving the effect of power supply testing.

[0063] In some specific embodiments, the power source determination module 11 specifically includes:

[0064] The power supply determination unit is used to determine a number of power supplies in the integrated circuit to be tested and determine a number of power rails according to a one-to-one correspondence principle.

[0065] Accordingly, the demand simulation module 12 specifically includes:

[0066] The test tool setting unit is used to set a corresponding voltage regulator test tool on each power rail according to the number of the power rails.

[0067] In some specific embodiments, the parameter control module 13 specifically includes:

[0068] a first parameter control unit, configured to control state parameters corresponding to different voltage regulator test tools respectively based on the load current requirement using a preset power supply control unit;

[0069] The second parameter control unit is used to connect the plurality of voltage regulator test tools in parallel and, using a preset power supply control unit, uniformly control the state parameters corresponding to the plurality of voltage regulator test tools based on the load current requirement.

[0070] In some specific embodiments, the parameter control module 13 specifically includes:

[0071] A first test tool control unit is used to control the multiple voltage regulator test tools to operate in staggered manner based on the load current demand using a preset power supply control unit, and to set the state parameters corresponding to different voltage regulator test tools to different state parameters corresponding to different operating states of the central processing unit, so as to monitor the state parameter change data after the multiple power supplies start working, and to analyze the state parameter change data to test the mutual influence of the staggered operation of the multiple power rails.

[0072] In some specific embodiments, the parameter control module 13 specifically includes:

[0073] The second test tool control unit is used to use a preset power supply control unit to set other voltage regulator test tools except for several target voltage regulator test tools to work simultaneously based on the load current demand, and to set the several target voltage regulator test tools to work at staggered times relative to the other voltage regulator test tools, and to set corresponding status parameters so as to monitor the status parameter change data after the several power supplies start working, and to test the influence of the power rail corresponding to the target voltage regulator test tool on other power rails by analyzing the status parameter change data.

[0074] In some specific embodiments, the parameter control module 13 specifically includes:

[0075] A third test tool control unit is used to use a preset power supply control unit to uniformly control the multiple voltage regulator test tools to operate simultaneously based on the load current demand, and set corresponding state parameters so as to monitor the state parameter change data after the multiple power supplies start working, and to obtain corresponding power supply test results by analyzing the state parameter change data so as to test the mutual influence of the simultaneous operation of the multiple power rails.

[0076] In some specific embodiments, the parameter control module 13 further includes:

[0077] a fourth test tool control unit, configured to use a preset power supply control unit to set the state parameters corresponding to the plurality of voltage regulator test tools to target state parameters corresponding to a preset worst-case scenario based on the load current requirement, so as to analyze the state parameter change data after the plurality of power supplies start working, and test the mutual influence of the plurality of power rails corresponding to the plurality of voltage regulator test tools under the preset worst-case scenario.

[0078] Furthermore, the embodiment of the present application also discloses an electronic device, Figure 5This is a structural diagram of an electronic device 20 according to an exemplary embodiment. The content in the diagram should not be considered as any limitation to the scope of application of the present application.

[0079] Figure 5 This is a schematic diagram of the structure of an electronic device 20 provided in an embodiment of the present application. The electronic device 20 may include: at least one processor 21, at least one memory 22, a power supply 23, a communication interface 24, an input / output interface 25, and a communication bus 26. The memory 22 is used to store a computer program, which is loaded and executed by the processor 21 to implement the relevant steps of the power supply testing method disclosed in any of the aforementioned embodiments. Furthermore, the electronic device 20 in this embodiment may be a computer.

[0080] In this embodiment, the power supply 23 is used to provide operating voltage for each hardware device on the electronic device 20; the communication interface 24 can create a data transmission channel between the electronic device 20 and the external device. The communication protocol it follows is any communication protocol that can be applied to the technical solution of this application and is not specifically limited here; the input and output interface 25 is used to obtain external input data or output data to the outside world. Its specific interface type can be selected according to specific application needs and is not specifically limited here.

[0081] In addition, the memory 22, as a carrier for resource storage, can be a read-only memory, random access memory, disk or CD, etc. The resources stored thereon can include an operating system 221, a computer program 222, etc., and the storage method can be temporary storage or permanent storage.

[0082] The operating system 221 is used to manage and control the hardware devices on the electronic device 20 and the computer program 222, and can be Windows Server, Netware, Unix, Linux, etc. In addition to including a computer program capable of performing the power supply testing method performed by the electronic device 20 disclosed in any of the aforementioned embodiments, the computer program 222 can further include a computer program capable of performing other specific tasks.

[0083] Furthermore, this application also discloses a computer-readable storage medium for storing a computer program; wherein, when executed by a processor, the computer program implements the aforementioned power supply testing method. The specific steps of this method can be referred to the corresponding contents disclosed in the aforementioned embodiments and will not be repeated here.

[0084] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on its differences from the other embodiments. Reference can be made to the descriptions of the identical or similar parts between the various embodiments. For the devices disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the descriptions are relatively simple, and the relevant parts can be referred to the descriptions of the methods.

[0085] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the components and steps of each example according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0086] The steps of the methods or algorithms described in conjunction with the embodiments disclosed herein may be implemented directly using hardware, a software module executed by a processor, or a combination of the two. The software module may be placed in a random access memory (RAM), internal memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.

[0087] Finally, it should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article, or device comprising the element.

[0088] The above is a detailed introduction to the technical solution provided by the present application. Specific examples are used herein to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method of the present application and its core idea. At the same time, for those skilled in the art, according to the ideas of the present application, there may be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.

Claims

1. A power supply testing method, characterized in that: include: Determining a plurality of power supplies in the integrated circuit to be tested and a plurality of power rails corresponding to the plurality of power supplies; A plurality of voltage regulator test tools are provided according to the plurality of power rails, and the plurality of voltage regulator test tools are used to simulate the load current requirements of the plurality of power supplies when the integrated circuit under test is operating; wherein the power supplies correspond to the power rails one-to-one, and each power rail is provided with a voltage regulator test tool corresponding to the power rail one-to-one; Using a preset power supply control unit to control state parameters corresponding to the plurality of voltage regulator test tools based on the load current demand, and monitoring state parameter change data corresponding to the plurality of voltage regulator test tools after the plurality of power supplies start working, and obtaining corresponding power supply test results by analyzing the state parameter change data; The method of controlling the state parameters corresponding to the plurality of voltage regulator test tools based on the load current requirement by using a preset power supply control unit includes: Using a preset power supply control unit to control the state parameters corresponding to different voltage regulator test tools based on the load current demand; Alternatively, after the plurality of voltage regulator test tools are connected in parallel, a preset power supply control unit is used to uniformly control the state parameters corresponding to the plurality of voltage regulator test tools based on the load current demand; Furthermore, the method of using a preset power supply control unit to control the state parameters corresponding to different voltage regulator test tools based on the load current requirement includes: A preset power supply control unit is used to set, based on the load current demand, other voltage regulator test tools except for the plurality of target voltage regulator test tools to operate simultaneously, and the plurality of target voltage regulator test tools to operate at staggered times relative to the other voltage regulator test tools, and to set corresponding status parameters so as to monitor the status parameter change data after the plurality of power supplies start working, and to analyze the status parameter change data so as to test the influence of the power rail corresponding to the target voltage regulator test tool on other power rails.

2. The power supply testing method according to claim 1, wherein: The determining of a plurality of power supplies in the integrated circuit to be tested and a plurality of power rails corresponding to the plurality of power supplies respectively includes: Determine several power supplies in the integrated circuit to be tested, and determine several power rails based on a one-to-one correspondence principle; Accordingly, the setting of a plurality of voltage regulator test tools according to the plurality of power rails includes: A corresponding voltage regulator testing tool is provided on each power rail according to the number of the power rails.

3. The power supply testing method according to claim 1, wherein: The method of using a preset power supply control unit to control the state parameters corresponding to different voltage regulator test tools based on the load current requirement includes: A preset power supply control unit is used to control the multiple voltage regulator test tools to work in staggered operation based on the load current demand, and the state parameters corresponding to different voltage regulator test tools are set to different state parameters corresponding to different working states of the central processing unit, so as to monitor the state parameter change data after the multiple power supplies start working, and analyze the state parameter change data to test the mutual influence of the staggered operation of the multiple power rails.

4. The power supply testing method according to claim 1, wherein: The method of uniformly controlling the state parameters corresponding to the plurality of voltage regulator test tools based on the load current requirement by using a preset power supply control unit includes: A preset power supply control unit is used to uniformly control the multiple voltage regulator test tools to operate simultaneously based on the load current demand, and to set corresponding state parameters so as to monitor the state parameter change data after the multiple power supplies start working, and to obtain corresponding power supply test results by analyzing the state parameter change data so as to test the mutual influence of the simultaneous operation of the multiple power rails.

5. The power supply testing method according to any one of claims 1 to 4, characterized in that: The controlling of the state parameters corresponding to the plurality of voltage regulator test tools based on the load current requirement by using a preset power supply control unit includes: A preset power supply control unit is used to set the state parameters corresponding to the multiple voltage regulator test tools to target state parameters corresponding to a preset worst-case scenario based on the load current demand, so as to analyze the state parameter change data after the multiple power supplies start working and test the mutual influence of the multiple power rails corresponding to the multiple voltage regulator test tools under the preset worst-case scenario.

6. A power supply testing device, characterized in that: include: A power supply determination module, configured to determine a plurality of power supplies in the integrated circuit to be tested and a plurality of power rails corresponding to the plurality of power supplies; a demand simulation module, configured to set up a plurality of voltage regulator test tools according to the plurality of power rails, and use the plurality of voltage regulator test tools to simulate the load current demand of the plurality of power supplies when the integrated circuit under test is operating; wherein the power supplies correspond to the power rails one-to-one, and each power rail is provided with a voltage regulator test tool corresponding to the power rail; a parameter control module, configured to control state parameters corresponding to the plurality of voltage regulator test tools based on the load current demand using a preset power supply control unit; a data analysis module, configured to monitor state parameter change data corresponding to the plurality of voltage regulator test tools after the plurality of power supplies start operating, and to obtain corresponding power supply test results by analyzing the state parameter change data; Wherein, the parameter control module includes: a first parameter control unit, configured to control state parameters corresponding to different voltage regulator test tools respectively based on the load current requirement using a preset power supply control unit; a second parameter control unit, configured to connect the plurality of voltage regulator test tools in parallel and, using a preset power supply control unit, uniformly control state parameters corresponding to the plurality of voltage regulator test tools based on the load current demand; The second test tool control unit is used to use a preset power supply control unit to set other voltage regulator test tools except for several target voltage regulator test tools to work simultaneously based on the load current demand, and to set the several target voltage regulator test tools to work at staggered times relative to the other voltage regulator test tools, and to set corresponding status parameters so as to monitor the status parameter change data after the several power supplies start working, and to test the influence of the power rail corresponding to the target voltage regulator test tool on other power rails by analyzing the status parameter change data.

7. An electronic device, characterized in that: The electronic device includes a processor and a memory; wherein the memory is used to store a computer program, and the computer program is loaded and executed by the processor to implement the power supply testing method according to any one of claims 1 to 5.

8. A computer-readable storage medium, characterized in that Used to store a computer program, which, when executed by a processor, implements the power supply testing method according to any one of claims 1 to 5.

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