A testing device for conductive film on a keyboard

Abstract

This invention discloses a testing device for conductive film on a keyboard, belonging to the technical field of testing tools. It includes a base and a support mounted on the base. A test cover plate is placed on the base, and the test cover plate is moved vertically up and down by a lifting component mounted on the support. The test cover plate has test through holes corresponding to rubber buttons. A marker is provided within the test through hole, triggered by the rubber button, to determine whether the rubber button's installation is qualified. As the test cover plate moves up and down with the lifting component, the marker moves with the test through hole. The conductive film is placed below the test cover plate. The test cover plate falls, and the change in stroke triggered by the rubber button is observed. This allows for the determination of whether the rubber button's installation position on the conductive film, its physical elasticity, and hardness change after installation, thus determining whether the rubber button's installation on the conductive film is qualified. This device allows for the testing of a batch of rubber buttons in a single operation.

Description

Technical Field

[0001] This invention belongs to the field of testing tool technology, specifically a testing device for keyboard conductive film. Background Technology

[0002] A conductive film is a thin film that conducts electricity. During transport, charged carriers in a conductive film are scattered by surfaces and interfaces. When the film thickness is comparable to the electron's free path, the effects of these surfaces and interfaces become significant; this phenomenon is called the size effect of the film. It is equivalent to a reduction in the free path of the charge carriers, therefore, compared to a bulk material of the same material, the conductivity of a thin film is lower.

[0003] A keyboard is a device used to input instructions and data for operating computer equipment, and it is a frequently used tool in computer control. One of the core components of a keyboard is the conductive film, which is the main input receiver. The conductive film generally includes a plastic circuit layer and rubber buttons. The rubber buttons are glued to the plastic film, and before they are glued, they are often misaligned or fall off due to vibration, impact, etc., affecting their use.

[0004] Since the rubber keys are the only component of the keyboard casing that bears the pressure, their upper part is designed with a recessed structure to increase the pressable area. Around this recessed structure is a ring that contacts the keyboard casing keys. Any misalignment of the rubber keys or their inherent physical elasticity can affect the normal use of the keyboard casing keys. Currently, there is no device to test a batch of rubber keys on the same conductive film simultaneously, resulting in low inspection efficiency and a high likelihood of missed detections. Summary of the Invention

[0005] To address the problem of low testing efficiency caused by the inability to batch test rubber keys on conductive films, this invention provides a testing device for keyboard conductive films.

[0006] This invention is achieved through the following technical solution:

[0007] A testing device for a conductive film on a keyboard includes a base and a support mounted on the base. A test cover is placed on the base, and the test cover is moved vertically up and down by a lifting component mounted on the support. The test cover has test through holes corresponding to rubber keys. A marker is provided in the test through hole, which is triggered by the rubber key and can determine whether the rubber key is installed correctly.

[0008] As the test cover moves up and down with the lifting assembly, the marker moves along with the test through-hole. After the conductive film is placed under the test cover, the test cover is lowered. After the marker contacts the rubber button, the change in stroke triggered by the rubber button is observed. This allows us to determine whether the installation position of the rubber button on the conductive film, its own physical elasticity and hardness have changed after installation on the conductive film, and thus determine whether the installation of the rubber button on the conductive film is qualified. This also achieves the goal of testing a batch of rubber buttons in one operation.

[0009] A further improvement of the present invention is that the outer wall of the aforementioned marker is coated with different colored segments from top to bottom. By observing whether the colors exposed above the test through-hole are the same under the influence of different colored segments, it can be determined whether the marker's stroke triggered by the rubber button is qualified; the different colors provide a more prominent observation effect.

[0010] A further improvement of the present invention is that the aforementioned marking element includes a test part one and a test part two arranged sequentially from top to bottom; the test part one is a columnar structure with equal diameter at the top and bottom, which fits into the test through hole; the test part two is a frustum-shaped structure that is larger at the top and smaller at the bottom. With the test part one and the test through hole able to cooperate with each other, the axis of the test part one is aligned with the axis of the test through hole in the initial state of the test; as the test part two contacts the rubber button, while observing the distance the marking element protrudes above the test through hole, due to the structure of the rubber button, if there is a deviation in the installation position, the test part two will tilt within the test through hole because it lacks uniform peripheral support, thus further improving the observation effect of the test results.

[0011] A further improvement of the present invention is that the bottom surface of the aforementioned test part two is provided with a hemispherical test part three. When the hemispherical test part three comes into contact with the rubber button whose top surface is annular and whose interior has a concave structure, it can further reduce the contact area with the rubber button. The hemispherical structure forms a guide surface when the rubber button deviates from its installation position, thereby improving the tilt display effect of the marker in the test through hole.

[0012] A further improvement of the present invention is that the lifting assembly includes a guide seat and a guide rod slidably disposed on the guide seat; the guide seat is mounted on a bracket, and the bottom end of the guide rod is connected to the test cover plate. The guide rod is guided and constrained by the guide seat to ensure the vertical state of the test cover plate during the lifting process.

[0013] A further improvement of the present invention is that a long strip-shaped transition plate is connected between the guide rod and the test cover plate; both ends of the transition plate extend towards the sides of the test cover plate, and the bottom surface of the transition plate is connected to the test cover plate by spaced-apart connecting posts. The spaced-apart connecting posts on the bottom surface of the guide rod and the transition plate can effectively increase the contact area of ​​the test cover plate, thereby reducing the error data caused by the tilt of the test cover plate during the lifting and lowering process.

[0014] A further improvement of the present invention is that tension springs connecting the support and the transition plate are symmetrically provided on both sides of the guide rod. The tension springs help reduce the pulling force required to lift the test cover plate upwards, saving physical exertion.

[0015] A further improvement of the present invention is that the above-mentioned lifting assembly also includes a U-shaped guide plate; the guide plate is evenly distributed with two vertically penetrating guide rods, the bottom ends of which are connected to the test cover plate. The U-shaped guide plate, in conjunction with the two evenly distributed guide rods, improves the balance and stability of the test cover plate during its up-and-down movement, effectively reducing the incidence of increased test errors due to tilting of the test cover plate over a long period; simultaneously, the U-shaped structure provides the operator with an operating notch space required for contact with the test cover plate, i.e., providing operating space for placing the conductive film under the test cover plate.

[0016] A further improvement of the present invention is that the bottom end of the guide rod 2 is provided with a connecting seat 1 that can be detachably connected to the test cover plate. The connecting seat 1 can increase the contact area with the test cover plate, reduce the stress on the test cover plate per unit area; at the same time, it can be used to replace test cover plates of different specifications in a timely manner for different conductive films, thereby improving the applicability.

[0017] A further improvement of the present invention is that the base is provided with a groove corresponding to the test cover and communicating with the outside of the base; a carrier plate for placing a conductive film is slidably disposed in the groove, and a limiting plate is provided on the carrier plate. Under the action of the limiting plate, the accuracy of placing one side of the conductive film on the carrier plate is limited; the carrier plate slides in the groove to improve the convenience of placing and removing the conductive film under the test cover.

[0018] As can be seen from the above technical solution, the beneficial effects of the present invention are: during the process of the test cover plate moving up and down with the lifting component, the marker moves together with the test through hole; after the conductive film is placed under the test cover plate, the test cover plate is lowered, and after the marker contacts the rubber button, the stroke change triggered by the rubber button is observed. This allows us to determine whether the installation position of the rubber button on the conductive film, its own physical elasticity and hardness have changed after being installed on the conductive film, and thus determine whether the installation of the rubber button on the conductive film is qualified and meets the standards, and achieve the purpose of completing the test of a batch of rubber buttons in one operation. Attached Figure Description

[0019] To more clearly illustrate the technical solution of the present invention, the accompanying drawings used in the description will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a structural schematic diagram of a specific embodiment of the present invention.

[0021] Figure 2 This is a schematic diagram of the test cover plate and lifting assembly combination according to a specific embodiment of the present invention.

[0022] Figure 3 This is a schematic diagram of the combination of the base and the support in a specific embodiment of the present invention.

[0023] Figure 4 This is a schematic diagram of a marker element in a specific embodiment of the present invention.

[0024] In the attached diagram: 10, base; 11, groove; 20, bracket; 30, lifting assembly; 31, guide seat; 32, guide rod one; 33, transition plate; 331, connecting seat two; 332, connecting column; 34, tension spring; 35, guide plate; 36, guide rod two; 361, connecting seat one; 40, test cover plate; 41, test through hole; 50, marking piece; 51, test part one; 52, test part two; 53, test part three; 54, anti-slip protrusion; 60, carrier plate; 70, limiting plate. Detailed Implementation

[0025] To make the objectives, features, and advantages of this invention more apparent and understandable, the technical solutions of this invention will be clearly and completely described below with reference to the accompanying drawings of the specific embodiments. Obviously, the embodiments described below are only some embodiments of this invention, and not all embodiments. Based on the embodiments of this patent, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this patent.

[0026] As attached Figure 1-4As shown, a testing device for a conductive film on a keyboard includes a base 10 and a support 20 disposed on the base 10. A test cover 40 is placed on the base 10, and the test cover 40 is driven to move vertically up and down by a lifting component 30 disposed on the support 20. The test cover 40 has a test through hole 41 corresponding to a rubber key. A marker 50 is provided in the test through hole 41, which is triggered by the rubber key and can determine whether the rubber key is installed correctly. As the test cover 40 moves up and down with the lifting component 30, the marker 50 moves together with the test through hole 41. After the conductive film is placed under the test cover 40, the test cover 40 is lowered. After the marker 50 contacts the rubber key, the change in stroke triggered by the rubber key is observed. This allows the device to determine whether the installation position of the rubber key on the conductive film, its own physical elasticity and hardness have changed after installation on the conductive film, and thus determine whether the installation of the rubber key on the conductive film is qualified. This allows the device to complete the testing of a batch of rubber keys in one operation.

[0027] The marker 50 includes a test part 51 and a test part 52 arranged sequentially from top to bottom. The test part 51 is a columnar structure with equal diameter at the top and bottom, which matches the test through hole 41. The test part 52 is a frustum-shaped structure that is larger at the top and smaller at the bottom. With the test part 51 and the test through hole 41 working together, the axis of the test part 51 is aligned with the axis of the test through hole 41 in the initial state of the test. As the test part 52 contacts the rubber button, while observing the distance of the marker 50 exposed above the test through hole 41, due to the structure of the rubber button, if there is a deviation in the installation position, the test part 52 will tilt within the test through hole 41 because it lacks uniform peripheral support. This will further improve the observation effect of the test results.

[0028] The length of the second test section 52 is greater than the depth of the test through hole 41. When the marker 50 is lifted by the rubber button, it can display the tilted state to the greatest extent, improving its recognizability.

[0029] The test section 51 above the test through hole 41 is provided with an anti-slip protrusion 54 to prevent the marker 50 from sliding down and detaching from the test through hole 41. This prevents the marker 50 from sliding down and detaching from the test through hole 41 after the test cover plate 40 moves upward.

[0030] The bottom surface of the second test section 52 is provided with a hemispherical third test section 53. When the hemispherical third test section 53 comes into contact with the rubber button, which has an annular top surface and a concave internal structure, it can further reduce the contact area with the rubber button. The hemispherical structure forms a guide surface when the rubber button deviates from its installation position, improving the tilt display effect of the marker 50 in the test through hole 41.

[0031] The outer wall of the marker 50 is coated with different colored segments from top to bottom. By observing whether the colors exposed above the test through-hole 41 are the same under the action of different colored segments, it can be determined whether the stroke of the marker 50 triggered by the rubber button is qualified; the display of different colors can serve as a way to make it more eye-catching.

[0032] The lifting assembly 30 includes a guide seat 31 and a guide rod 32 that slides vertically on the guide seat 31. The guide seat 31 is mounted on the bracket 20, and the bottom end of the guide rod 32 is connected to the test cover plate 40. The guide rod 32 is guided and limited by the guide seat 31 to ensure the vertical state of the test cover plate 40 during the lifting process.

[0033] A long strip-shaped transition plate 33 connects the guide rod 32 to the test cover plate 40. Both ends of the transition plate 33 extend towards the sides of the test cover plate 40, and the bottom surface of the transition plate 33 is connected to the test cover plate 40 by spaced-apart connecting posts 332. The guide rod 32, via the transition plate 33 and the spaced-apart connecting posts 332 on its bottom surface, effectively increases the contact area with the test cover plate 40, thereby reducing the error data caused by tilting of the test cover plate 40 during lifting and lowering.

[0034] The guide rod 32 is connected to the transition plate 33 via the connecting seat 331. The connecting seat 331 increases the contact area between the guide rod 32 and the transition plate 33, reducing the stress on the transition plate 33 per unit area. When changing different test covers 40, the efficiency of replacement can be improved by disassembling the transition plate 33 and the connecting seat 331.

[0035] The guide rod 32 is symmetrically provided with tension springs 34 connecting the bracket 20 and the transition plate 33 on both sides. The tension springs 34 help reduce the pulling force required to lift the test cover plate 40 upward, saving physical effort.

[0036] The lifting assembly 30 also includes a U-shaped guide plate 35; guide rods 36 are evenly distributed on the guide plate 35, and the bottom end of the guide rods 36 connects to the test cover plate 40. The U-shaped guide plate 35, in conjunction with the evenly distributed guide rods 36, improves the balance and stability of the test cover plate 40 during its up-and-down movement, effectively reducing the incidence of increased test errors caused by the test cover plate 40 tilting over a long period of time; at the same time, the U-shaped structure provides an operating notch space for the operator to contact the test cover plate 40, that is, to provide operating space for placing the conductive film under the test cover plate 40.

[0037] The bottom end of the guide rod 36 is provided with a connecting seat 361 that can be detachably connected to the test cover plate 40. The connecting seat 361 can increase the contact area with the test cover plate 40, reduce the stress on the test cover plate 40 per unit area, and at the same time, allow for timely replacement of test cover plates 40 of different specifications for different conductive films, thereby improving the applicability.

[0038] The base 10 has a groove 11 corresponding to the test cover plate 40 and communicating with the outside of the base 10; a carrier plate 60 for placing a conductive film is slidably disposed in the groove 11, and a limiting plate 70 is provided on the carrier plate 60. Under the action of the limiting plate 70, the accuracy of placing one side of the conductive film in contact with the limiting plate 70 on the carrier plate 60 is limited; the carrier plate 60 slides in the groove 11 to improve the convenience of placing and removing the conductive film under the test cover plate 40.

[0039] The width of the groove 11, i.e., the length perpendicular to the direction in which the carrier plate 60 is pulled along the groove 11, is less than the length of the test cover plate 40, but greater than the distance between the two furthest test through holes 41 on the test cover plate 40 in the length direction. The purpose is to ensure that the area of ​​the groove 11 corresponds to all the test through holes 41 on the test cover plate 40, forming a test cover plate 40 spanning across the groove 11. A gap is left between the carrier plate 60 and the bottom of the marker 50 in its initial state to prevent wear on the marker 50 when the carrier plate 60 is pulled out.

[0040] The present invention discloses a testing device for conductive film on a keyboard. During the up-and-down movement of the test cover plate 40 following the lifting assembly 30, the marker 50 moves along with the test through-hole 41. After the conductive film is placed under the test cover plate 40, the test cover plate 40 is lowered. After the marker 50 contacts the rubber key, the change in stroke triggered by the rubber key is observed. This allows for the determination of whether the installation position of the rubber key on the conductive film, its own physical elasticity and hardness, have changed after installation on the conductive film. This, in turn, determines whether the installation of the rubber key on the conductive film is qualified and achieves the goal of testing a batch of rubber keys in a single operation.

[0041] The various embodiments in this specification are described in a progressive manner. Each embodiment focuses on the differences from other embodiments. The same or similar parts between the various embodiments can be referred to each other.

[0042] The terms "upper," "lower," "outer," "inner," etc., used in the specification, claims, and accompanying drawings of this invention are used to distinguish relative positional relationships and are not necessarily qualitative. It should be understood that such data can be interchanged where appropriate so that embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion.

[0043] The above description of the disclosed embodiments enables those skilled in the art to make or use the invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the invention. Therefore, the invention is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A test device for a keyboard conductive film, comprising a base (10) and a support (20) provided on the base (10), characterized in that, The base (10) is placed with a test cover plate (40), the test cover plate (40) is driven to move vertically up and down by a lifting assembly (30) arranged on the support (20); the test cover plate (40) is provided with a test through hole (41) corresponding to the rubber key; the test through hole (41) is provided with a marking piece (50) triggered by the rubber key and capable of judging whether the rubber key installation is qualified; the outer wall of the marking piece (50) is coated with marking color sections of different colors from top to bottom; the marking piece (50) comprises a test one (51) and a test two (52) arranged in sequence from top to bottom; the test one (51) is in a columnar structure matched with the test through hole (41) and having the same diameter from top to bottom; the test two (52) is in a frustoconical structure with a large upper part and a small lower part; the bottom surface of the test two (52) is provided with a hemispherical test three (53).

2. The test apparatus for a conductive film of a keyboard according to claim 1, wherein The lifting assembly (30) comprises a guide seat (31) and a guide rod one (32) slidingly arranged on the guide seat (31); the guide seat (31) is installed on the support (20), and the bottom end of the guide rod one (32) is connected with the test cover plate (40).

3. The test apparatus for a conductive film of a keyboard according to claim 2, wherein A long strip-shaped transition plate (33) is connected between the guide rod one (32) and the test cover plate (40); the two ends of the transition plate (33) extend to the two side edges of the test cover plate (40), and the bottom surface of the transition plate (33) is connected with the test cover plate (40) by a connection column (332) arranged at intervals.

4. The test apparatus for a conductive film of a keyboard according to claim 3, wherein The two sides of the guide rod one (32) are symmetrically provided with a tension spring (34) connecting the support (20) and the transition plate (33).

5. The test apparatus for a conductive film of a keyboard according to claim 2, wherein The lifting assembly (30) further comprises a guide plate (35) in the shape of an I; the guide plate (35) is uniformly provided with a guide rod two (36) vertically penetrating the guide plate (35), and the bottom end of the guide rod two (36) is connected with the test cover plate (40).

6. The test apparatus for a conductive film of a keyboard according to claim 5, wherein The bottom end of the guide rod two (36) is provided with a connection seat one (361) capable of being detachably connected with the test cover plate (40).

7. The test apparatus for a conductive film of a keyboard as defined in claim 1, wherein The base (10) is provided with a groove (11) corresponding to the test cover plate (40) and communicating with the outside of the base (10); the groove (11) is slidingly provided with a carrier plate (60) for placing a conductive film, and the carrier plate (60) is provided with a limiting plate (70).

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