Infrared temperature measurement correction method, device and system for three-dimensional curved surface

Abstract

This invention discloses an infrared temperature measurement correction method, apparatus, and system for three-dimensional curved surfaces. The infrared temperature measurement correction method includes: dividing the blade surface into at least two emissivity measurement regions according to the surface type of the blade being measured; acquiring the emissivity distribution of each emissivity measurement region on the blade surface at different temperatures; obtaining bidirectional reflection distribution functions for different surface types based on the projected energy of the infrared light source at different incident angles and the reflected energy received by the infrared camera at different detection angles; and obtaining the corrected measurement temperature based on the acquired emissivity distribution of each emissivity measurement region on the blade surface at different temperatures and the bidirectional reflection distribution functions for different surface types. This invention has a wide range of applications and high correction accuracy, and can be used to correct infrared temperature measurements of curved surfaces such as aero-engine turbine blades in complex environments, enabling non-contact, multi-dimensional, and online measurement of curved surfaces.

Description

Technical Field

[0001] This invention belongs to the field of aviation temperature measurement technology, and further relates to the field of infrared radiation temperature measurement technology, particularly to an infrared temperature measurement correction method and system for three-dimensional curved surfaces under complex backgrounds. Background Technology

[0002] The most direct and effective way to improve the specific impulse of an aero-engine is to increase the turbine rotor inlet temperature. However, as the inlet temperature rises, the turbine blades operate under high thermal loads for extended periods, increasing their failure rate. Accurately measuring the operating temperature of turbine blades is of great significance for improving their lifespan and ensuring the safe operation of aero-engines.

[0003] Currently, the main temperature measurement methods are divided into contact and non-contact methods. Contact temperature measurement includes methods such as thin-film thermocouple measurement, temperature-indicating paint measurement, and crystal thermometry. Non-contact temperature measurement includes fluorescence thermometry and radiation thermometry. When turbine blades are operating, thin-film thermocouple measurement suffers from the difficulty of placing the wires, while temperature-indicating paint and crystal thermometry cannot reflect dynamic temperature changes. Among non-contact methods, fluorescence thermometry has the advantages of a wide temperature range and high accuracy, but the response signal acquisition is difficult, and the signal is prone to failure as the temperature rises. Infrared radiation thermometry is widely used in the temperature measurement process of aero-engines both domestically and internationally. Compared with traditional temperature measurement methods, infrared thermometry has the advantages of not damaging the surface of the object being measured; short response time, enabling real-time measurement of constantly changing temperature values; wide temperature range; and high sensitivity. In the operating environment of turbine blades, radiation thermometry has even greater advantages.

[0004] Radiation thermometry errors are influenced by the emissivity of the blade surface, which in turn is related to the blade's surface characteristics. Factors such as coating erosion and oxidation can alter the emissivity. Furthermore, the emissivity is also affected by temperature, wavelength, observation angle, and surface conditions, making accurate measurement difficult. Applying a suitable black primer to a metal surface can treat it as non-metallic; when the angle between the observation line and the normal to the surface of the measured part is between 0° and 60°, the emissivity remains essentially constant. Besides the blade's own emissivity affecting the measurement results, the radiation from the high-temperature environment surrounding the blade also influences the results. The reflection properties of a point under illumination are related to the location of the incident point, the incident direction, the exit direction, and the wavelength. Obtaining the bidirectional reflection distribution function value is crucial for effective radiation measurement. In radiative heat transfer calculations, it is also necessary to calculate the angle coefficient between any two radiative heat transfer surface elements. Summary of the Invention

[0005] The technical problem to be solved by the present invention is to provide an infrared temperature measurement correction method, device and system for three-dimensional curved surfaces.

[0006] To solve the above problems, the technical solution adopted by the present invention is as follows:

[0007] This invention first provides an infrared temperature measurement correction method for three-dimensional curved surfaces, comprising:

[0008] Based on the surface type of the blade being measured, the blade surface is divided into at least two emissivity measurement areas;

[0009] Obtain the emissivity distribution of each emissivity measurement area on the blade surface at different temperatures;

[0010] Based on the projected energy of the infrared light source at different incident angles and the reflected energy received by the infrared camera at different detection angles, the bidirectional reflection distribution function of different surface types is obtained;

[0011] Based on the emissivity distribution of each emissivity measurement area on the blade surface at different temperatures and the bidirectional reflection distribution function of different surface types, the corrected measurement temperature is obtained.

[0012] The present invention also provides an infrared temperature measurement correction device for a three-dimensional curved surface, comprising:

[0013] Temperature acquisition module is used to acquire temperature data of a three-dimensional curved surface at high temperatures;

[0014] The processing module corrects the temperature data acquired by the temperature acquisition module according to the infrared temperature measurement correction method.

[0015] The present invention also provides an infrared temperature measurement correction system for a three-dimensional curved surface under complex background, comprising:

[0016] Curved blades are used as the object being measured and to provide background radiation.

[0017] A fixed base plate is used to fix the three-dimensional curved blades and change the spacing between the three-dimensional curved blades.

[0018] Ceramic heating elements are used to heat the surface of three-dimensional curved blades;

[0019] A transformer power supply is used to power the ceramic heating element and control the temperature of the ceramic heating element by controlling the power supply voltage.

[0020] Type K thermocouples are used to measure the true temperature of bent blades and high-temperature combustion gases, providing reference data for emissivity measurements and infrared correction results.

[0021] Temperature monitoring device is used to record the temperature measured by thermocouples;

[0022] Infrared light source is used to emit infrared radiation energy, providing a light source for measuring the bidirectional reflectance distribution of a surface;

[0023] Infrared cameras are used to measure the infrared radiation energy and temperature of three-dimensional curved surfaces at high temperatures, and to obtain raw temperature data that needs to be corrected.

[0024] Swirl premixed burner: used to generate high-temperature gas and simulate a high-temperature gas environment;

[0025] Flue gas analyzer: used to measure the composition and concentration of high-temperature fuel gas;

[0026] Pressure sensor: Used to measure the pressure of high-temperature gas;

[0027] as well as

[0028] The data processing unit corrects the raw temperature data obtained by the infrared camera according to the described infrared temperature correction method. This invention's infrared temperature correction system can control various variables related to the infrared camera's temperature measurement error and verify the correction model.

[0029] Beneficial effects

[0030] The applicant's research revealed that during the temperature measurement of curved blades by an infrared camera, the following factors are considered: the non-uniform emissivity ε(q,T) of the blade surface, the bidirectional reflectance distribution function BRDF(r,Ω,Ω′) of the blade surface, the distance between the blades L(r,r′), and the detection angle θ of the infrared camera. <n,Ω d The six parameters related to temperature measurement accuracy are: infrared integrated transmittance τ of the infrared window, gas influence coefficient μ, etc. Therefore, this application uses these six parameters as the main correction points to improve the temperature measurement accuracy of the infrared camera. To address the non-uniformity of emissivity on the blade surface, emissivity is measured in zones according to the actual blade surface type, and a zone correction method is used during the correction process. The temperature cloud map output after correction by the software is compared with the actual temperature measured by the thermocouple, and the temperature measurement error is significantly reduced. This invention has strong universality and high temperature measurement accuracy. It corrects temperature measurement errors based on the principle of infrared radiation thermometry, realizing non-contact, multi-dimensional, online measurement of curved surfaces. Attached Figure Description

[0031] Figure 1 This is a flowchart of the infrared thermometry correction method for three-dimensional curved blades according to the present invention;

[0032] Figure 2 This is a schematic diagram of the three-dimensional curved blade infrared temperature measurement correction system of the present invention;

[0033] Figure 3 This is a schematic diagram of the temperature measurement system in practical application of the present invention;

[0034] Figure 4 This is a schematic diagram of the wear and corrosion areas of a three-dimensional curved blade;

[0035] Figure 5 It is the numerical value of the bidirectional reflection distribution function with an incident angle of 30°;

[0036] Figure 6 It is the numerical value of the bidirectional reflection distribution function with an incident angle of 45°;

[0037] Figure 7 It is the numerical value of the bidirectional reflection distribution function with an incident angle of 50°;

[0038] Figure 8 This is the grid angle coefficient value in the infrared temperature measurement system of the present invention;

[0039] In the diagram: 1—Temperature monitor, 2—Ceramic heating element, 3—K-type thermocouple, 4—Bent blade, 5—Fixed base plate, 6—Transformer power supply, 7—Computer, 8—Infrared camera, 9—Infrared detection window, 10—Oxygen cylinder, 11—Methane cylinder, 12—Aircraft engine turbine blade. Detailed Implementation

[0040] The present invention will now be described in detail with reference to the accompanying drawings and specific embodiments:

[0041] The present invention will now be described in detail with reference to the accompanying drawings:

[0042] This embodiment provides an infrared temperature measurement correction method for three-dimensional curved surfaces. For details, please refer to [link to specific procedures]. Figure 1 ,include:

[0043] A. Based on the surface type of the blade being measured, divide the blade surface into at least two emissivity measurement areas;

[0044] In the step of dividing the blade surface into at least two emissivity measurement regions based on the surface type of the blade, the surface type of the blade is classified according to the degree of abrasion and corrosion.

[0045] Based on the degree of abrasion and corrosion, the blade surface is classified into at least three surface types, including a surface type without abrasion and corrosion, a surface type with severe abrasion and corrosion, and at least one surface type between the two.

[0046] B. Obtain the emissivity distribution of each emissivity measurement area on the blade surface at different temperatures;

[0047] Obtain the emissivity distribution of each region on the blade surface at different temperatures, including:

[0048] The emissivity values ​​at any one or more spatial locations within each emissivity measurement area at room temperature are used as the emissivity values ​​of the corresponding emissivity measurement area. When multiple spatial locations are used, the average emissivity values ​​of the multiple locations are used as the emissivity values ​​of the corresponding emissivity measurement area.

[0049] The blade surface is then heated to obtain the emissivity values ​​ε(q,T) of each emissivity measurement region q at different temperatures T, where q is 1-Q and Q is the emissivity measurement region.

[0050] The formula for calculating emissivity is expressed as:

[0051] The formula for calculating the emissivity at any spatial location is expressed as:

[0052]

[0053] In the formula, T m For the temperature measured by the infrared camera, c1 = 3.7418 × 10⁻⁶ -6 W·m is the first Planck coefficient, c² = 1.4388 × 10⁻⁶. -6 m·K is the second Planck coefficient.

[0054] C. Based on the projected energy of the infrared light source at different incident angles and the reflected energy received by the infrared camera at different detection angles, obtain the bidirectional reflection distribution function for different surface types;

[0055] D. Based on the emissivity distribution of each emissivity measurement area on the blade surface at different temperatures and the bidirectional reflection distribution function of different surface types, the corrected measurement temperature is obtained.

[0056] Based on the emissivity distribution of each emissivity measurement area on the blade surface at different temperatures and the bidirectional reflectance distribution function for different surface types, the corrected measurement temperature is obtained as follows:

[0057]

[0058] In the formula, T′(r) is the corrected measured temperature at spatial position r; η(E) is the factory calibration curve of the infrared camera; λ is the wavelength; τ is the integrated transmittance of the infrared measurement window; μ is the influence coefficient of the high-temperature gas; θ is the detection angle of the infrared camera; ε(q,T) is the emissivity value at temperature T at location q in the emissivity measurement area; λ1 and λ2 are the upper and lower limits of the wavelength response of the infrared camera, respectively; M(λ,r,T) is the blackbody spectral radiance generated by the true temperature; M(λ,r′,T) is the blackbody spectral radiance generated by the high-temperature background blade; r′ represents different spatial positions on the high-temperature background blade; X r′,rLet r′ be the angular coefficient of different spatial positions r′ on the blade under high temperature background with respect to the spatial position r of the measured blade, A′ be the area of ​​the infinitesimal element in the visible region of the measured position, Γ be the visible region of the measured position, BRDF(r,Ω,Ω′) be the bidirectional reflection distribution function of the curved surface, Ω represent the energy incident direction vector, and Ω′ represent the energy outgoing direction vector.

[0059] To measure the angular coefficient X between the visible micro-elements r of the blade at different spatial positions r′ on a high-temperature background. r′,r The calculation is performed according to the set bending blade spacing L(r,r′) and surface shape function S(r):

[0060]

[0061] In the formula, X r′,r denoted as angular coefficient between infinitesimal elements in the visible region, and r as the spatial position.

[0062] According to the gas composition Y of the environment in which the curved surface is located. i Concentration c i Pressure P, temperature T g The influence coefficient μ of the high-temperature gas was calculated and substituted into the correction model for temperature correction, including:

[0063] Based on the line-by-line method and the HITEMP database, gas component Y i Concentration c i Pressure P, temperature T g Calculate the emission intensity κ of the gas η ;

[0064] The average spectral absorption coefficient κ of the infrared camera's detection band is then calculated using the cumulative K-distribution method. a ;

[0065] The influence coefficient μ of high-temperature gas is calculated based on the radiation transfer equation, gas temperature, gas area size, and absorption coefficient.

[0066] This embodiment provides an infrared temperature measurement correction system for three-dimensional curved surfaces under complex backgrounds, such as... Figure 2 As shown, it includes a temperature monitoring instrument 1, a ceramic heating element 2, a K-type thermocouple 3, a curved blade 4, a fixed base plate 5, a transformer power supply 6, a computer 7, an infrared camera 8, an infrared detection window 9, an oxygen cylinder 10, and a methane cylinder 11.

[0067] This embodiment provides an infrared temperature measurement correction method and system for three-dimensional curved surfaces under complex backgrounds. The correction method includes the following steps:

[0068] (1) The wear degree, corrosion state, and load temperature of the three-dimensional curved surface are the main factors affecting the emissivity value of the curved surface. The actual temperature of the blade is measured using a thermocouple, and the measured temperature is obtained using an infrared camera. The emissivity is then calculated according to the emissivity calculation formula. The specific steps are as follows:

[0069] In a laboratory environment, the surface type of the three-dimensional curved blade is determined based on the degree of wear and corrosion state of the surface, and the location of each surface type is used as an emissivity measurement area. In this embodiment, based on the degree of wear and corrosion state, the blade surface is divided into three surface types: surface type A (no wear and corrosion), surface type B (light wear and corrosion), and surface type C (heavy wear and corrosion). Figure 3 As shown. The emissivity values ​​at any one or more spatial locations within each emissivity measurement area at room temperature are used as the emissivity values ​​for the corresponding emissivity measurement area. When multiple spatial locations are used, the average value of the multiple locations is used as the emissivity value for the corresponding emissivity measurement area. Because emissivity changes with temperature, the blade surface is further heated to obtain a function of emissivity versus temperature for each emissivity measurement area, resulting in emissivity values ​​(ε[A,T], ε[B,T], and ε[C,T]) for three different surface types at different temperatures. During the correction process, the temperature obtained from the infrared camera is normalized, and each temperature point is matched to the corresponding emissivity measurement area based on its spatial location. Then, the emissivity value of the corresponding emissivity measurement area is substituted into the correction formula to correct the temperature at each spatial location obtained by the infrared camera, thereby achieving surface correction of the three-dimensional curved blade surface.

[0070] The formula for calculating the emissivity at any spatial location is expressed as:

[0071]

[0072] In the formula, T m ε is the measurement temperature of the infrared camera; ε(q,T) is the emissivity value of different spatial locations q at different temperatures T; λ is the measurement wavelength; λ1 and λ2 are the upper and lower limits of the wavelength response of the infrared camera, respectively; c1 = 3.7418 × 10 -6 W·m is the first Planck coefficient; c² = 1.4388 × 10⁻⁶ -6 m·K is the second Planck coefficient.

[0073] (2) Based on the projected energy of the infrared light source at different incident angles and the reflected energy received by the infrared camera at different detection angles, the bidirectional reflection distribution function of different materials or surface states of the curved surface is measured to obtain the bidirectional reflection distribution function BRDF(r,Ω,Ω′) for different surface types.

[0074] The formula for calculating the bidirectional reflectance distribution function of the spectrum can be expressed as follows: In the incident direction... Above, solid angle dΩ i Within, the spectral energy projected per unit time per unit area is This energy is projected onto the surface, and the energy reflected varies depending on the direction of reflection. If the energy is reflected in the direction of reflection... Above, the reflected spectral radiation intensity is Right now:

[0075]

[0076] With the incident angle of the infrared parallel light source fixed, and the infrared camera rotated with the illumination point of the parallel light source as the center and the focusing distance of the infrared camera as the radius, the reflected energy at different exit angles was recorded. The incident angle of the infrared parallel light source was changed, and the reflected energy at different exit angles was recorded repeatedly. The illumination point of the infrared parallel light source was changed so that the illumination point was located in the three parts divided in step (1), and the reflectance distribution function BRDF(r,Ω,Ω′) corresponding to the emissivity of each part was obtained, such as... Figure 5-7 As shown.

[0077] (3) The radiation angle coefficient distribution X between adjacent surfaces is calculated according to the set curved blade spacing L(r,r′) and surface shape function S(r). r′,r ;

[0078] The formula for calculating the angle coefficient can be expressed as:

[0079]

[0080] In the formula, X r′,r denoted as angular coefficient between infinitesimal elements in the visible region, and r as the spatial position.

[0081] The spacing L(r,r′) between the curved blades is changed by a fixed base plate. Positioning holes are made on the base plate every 2.5cm, and these holes determine the spacing L(r,r′) between the three-dimensional curved blades. The three-dimensional curved surface is then meshed, with both the surface of the blade under test and the background blade surface divided into 16×5 grids. The angle factor of each grid is calculated using the angle factor calculation formula. Figure 8 As shown.

[0082] (4) Based on the gas composition Y of the environment in which the curved surface is located. i Concentration c i Pressure P, temperature T g The influence coefficient μ of the high-temperature gas was calculated and substituted into the correction model for temperature correction, including:

[0083] Based on the line-by-line method and the HITEMP database, gas component Y i Concentration ci Pressure P, temperature T g Calculate the emission intensity κ of the gas η Then, the average spectral absorption coefficient κ of the infrared camera's detection band is calculated using the cumulative K-distribution method. a The influence coefficient μ of high-temperature gas is calculated based on the radiation transfer equation, gas temperature, gas area size, and absorption coefficient.

[0084] (5) Fix the infrared camera, measure the detection angle, and correct the temperature measurement result according to the following correction model formula to obtain the corrected result. The correction model formula is:

[0085]

[0086] In the formula, T′(r) is the corrected measured temperature at spatial position r; η(E) is the factory calibration curve of the infrared camera; λ is the wavelength; τ is the integrated transmittance of the infrared measurement window; μ is the influence coefficient of the high-temperature gas; θ is the detection angle of the infrared camera; ε(q,T) is the emissivity value at different spatial positions q and different temperatures T; λ1 and λ2 are the upper and lower limits of the wavelength response of the infrared camera, respectively; M(λ,r,T) is the blackbody spectral radiance generated by the true temperature; M(λ,r′,T) is the blackbody spectral radiance generated by the high-temperature background blade; r′ is the different spatial positions on the high-temperature background blade; X r′,r Let r′ be the angular coefficient of different spatial positions r′ on the blade under high temperature background with respect to the spatial position r of the measured blade, A′ be the area of ​​the infinitesimal element in the visible region of the measured position, Γ be the visible region of the measured position, BRDF(r,Ω,Ω′) be the bidirectional reflection distribution function of the curved surface, Ω represent the energy incident direction vector, and Ω′ represent the energy outgoing direction vector.

[0087] The results of the corrections are shown in Table 1.

[0088] Table 1 Temperature Measurement Correction Experiment Table

[0089]

[0090] In Table 1, T0(K), T m (K) and T c (K) represents the actual temperature, the measured temperature, and the corrected temperature, respectively. As shown in Table 1, the corrected temperature error is significantly reduced to below 1%.

Claims

1. A method for infrared temperature measurement correction of a three-dimensional curved surface, characterized in that, include: Based on the surface type of the blade being measured, the blade surface is divided into at least two emissivity measurement areas; Obtain the emissivity distribution of each emissivity measurement area on the blade surface at different temperatures; Based on the projected energy of the infrared light source at different incident angles and the reflected energy received by the infrared camera at different detection angles, the bidirectional reflection distribution function for different surface types is obtained. Based on the emissivity distribution of each emissivity measurement area on the blade surface at different temperatures and the bidirectional reflectance distribution function of different surface types, the corrected measurement temperature is obtained; Based on the emissivity distribution of each emissivity measurement area on the blade surface at different temperatures and the bidirectional reflectance distribution function for different surface types, the corrected measurement temperature is obtained as follows: In the formula, Spatial location The corrected measured temperature; For the factory calibration curve of the infrared camera; Wavelength; The integral transmittance of the infrared measurement window; The influence coefficient of high-temperature gas; The detection angle of the infrared camera; For emissivity measurement area Emissivity values ​​at internal temperature For 1- Q , Q The number of emissivity measurement areas divided; , These are the upper and lower limits of the wavelength response of the infrared camera, respectively. The blackbody spectral radiative force generated at the true temperature; The blackbody spectral radiative force generated by the blade against a high-temperature background; Different spatial positions on the blades under high temperature background; Different spatial positions on the blade under high temperature background For measuring the spatial position of the blade angular coefficient, Let be the area of ​​a micro-element within the visible region of the location to be measured; The visible area of ​​the location to be measured; For the bidirectional reflection distribution function of the curved surface; This represents the energy incident direction vector; This represents the energy emission direction vector.

2. The infrared temperature measurement correction method for three-dimensional curved surfaces according to claim 1, characterized in that, Obtain the emissivity distribution of each region on the blade surface at different temperatures, including: The emissivity values ​​at any one or more spatial locations within each emissivity measurement area at room temperature are used as the emissivity values ​​of the corresponding emissivity measurement area. When multiple spatial locations are used, the average emissivity values ​​of the multiple locations are used as the emissivity values ​​of the corresponding emissivity measurement area. The blade surface is then heated to obtain the emissivity measurement area for each region. At different temperatures Emissivity values ​​below .

3. The infrared temperature measurement correction method for three-dimensional curved surfaces according to claim 2, characterized in that, The formula for calculating emissivity is expressed as: The formula for calculating the emissivity at any spatial location is expressed as: In the formula, For measuring temperature using an infrared camera, c 1 =3.7418×10 -6 W·m is the first Planck coefficient. c 2 =1.4388×10 -6 m·K is the second Planck coefficient.

4. The infrared temperature measurement correction method for three-dimensional curved surfaces according to claim 3, characterized in that, In the step of dividing the blade surface into at least two emissivity measurement regions based on the surface type of the blade, the surface type of the blade is classified according to the degree of abrasion and corrosion.

5. The infrared temperature measurement correction method for three-dimensional curved surfaces according to claim 4, characterized in that, Based on the degree of abrasion and corrosion, the blade surface is classified into at least three surface types, including a surface type without abrasion and corrosion, a surface type with severe abrasion and corrosion, and at least one surface type between the two.

6. The infrared temperature measurement correction method for three-dimensional curved surfaces according to claim 2, characterized in that, Different spatial positions on the blade under high temperature background For the visible area of ​​the measuring blade angular coefficient between infinitesimal elements According to the set spacing of the curved blades and surface shape function Perform the calculation: In the formula, The angle coefficient between infinitesimal elements in the visible region. For spatial location.

7. The infrared temperature measurement correction method for three-dimensional curved surfaces according to claim 2, characterized in that, According to the gas composition of the environment in which the curved surface is located. ,concentration ,pressure ,temperature Calculate the influence coefficient of high-temperature gas The temperature is then adjusted by incorporating the following into the correction model: Based on the line-by-line method and the HITEMP database, gas composition ,concentration ,pressure ,temperature Calculate the emission intensity of the gas ; The average spectral absorption coefficient of the infrared camera's detection band is then calculated using the cumulative K-distribution method. ; The influence coefficient of high-temperature gas was calculated based on the radiation transfer equation, gas temperature, gas area size, and absorption coefficient. .

8. An infrared temperature measurement correction device for a three-dimensional curved surface, characterized in that, include: Temperature acquisition module is used to acquire temperature data of a three-dimensional curved surface at high temperatures; The processing module corrects the temperature data acquired by the temperature acquisition module using the infrared temperature measurement correction method according to any one of claims 1-7.

9. An infrared temperature measurement correction system for three-dimensional curved surfaces under complex backgrounds, characterized in that, include: Curved blades are used as the object being measured and to provide background radiation. A fixed base plate is used to fix the three-dimensional curved blades and change the spacing between the three-dimensional curved blades. Ceramic heating elements are used to heat the surface of three-dimensional curved blades; A transformer power supply is used to power the ceramic heating element and control the temperature of the ceramic heating element by controlling the power supply voltage. Type K thermocouples are used to measure the true temperature of bent blades and high-temperature combustion gases, providing reference data for emissivity measurements and infrared correction results. Temperature monitoring device is used to record the temperature measured by thermocouples; Infrared light source is used to emit infrared radiation energy, providing a light source for measuring the bidirectional reflectance distribution of a surface; Infrared cameras are used to measure the infrared radiation energy and temperature of three-dimensional curved surfaces at high temperatures, and to obtain raw temperature data that needs to be corrected. Swirl premixed burner: used to generate high-temperature gas and simulate a high-temperature gas environment; Flue gas analyzer: used to measure the composition and concentration of high-temperature fuel gas; Pressure sensor: Used to measure the pressure of high-temperature gas; as well as The data processing unit corrects the raw temperature data obtained by the infrared camera using the infrared temperature correction method according to any one of claims 1-7.

Images