A method for testing the performance degradation of an atmospheric data probe

Abstract

The application discloses an atmospheric data probe accelerated performance degradation test method, and belongs to the technical field of performance analysis, and comprises the following steps: S1, constructing an atmospheric data probe accelerated performance degradation test system; S2, obtaining the electrical stress limit, the temperature stress limit and the comprehensive stress limit of the electrical stress and the temperature stress of the atmospheric data probe; S3, performing the atmospheric data probe accelerated performance degradation test to determine the service life of the atmospheric data probe. The atmospheric data probe accelerated performance degradation test method can greatly reduce the life and reliability test time of the atmospheric data probe, and can significantly reduce the development fund of the atmospheric data probe.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of performance analysis, and particularly relates to a method for testing performance degradation of an atmospheric data probe. BACKGROUND

[0002] The atmospheric data probe belongs to an aircraft atmospheric data system, is installed on the nose or the outside of the fuselage of an aircraft, and is used for sensing the total pressure, static pressure, surface pressure, local angle of attack (local angle of sideslip) and atmospheric total temperature of the aircraft. The atmospheric data probe usually comprises a total pressure probe, a static pressure probe, a total temperature probe, an angle of attack sensor (angle of sideslip sensor) or a combination of multiple atmospheric data probes.

[0003] The atmospheric data probe is directly exposed to the external atmospheric environment of the aircraft due to being installed on the outside of the aircraft. In order to ensure that the atmospheric data probe can normally work under icing weather conditions, the atmospheric data probe generally adopts an electric heating mode to realize the anti-icing and deicing functions and ensure the working performance thereof.

[0004] The atmospheric data probe is one of the key equipment affecting the safety of an aircraft. In order to meet the safety and reliability requirements of the aircraft, the life / reliability index of the atmospheric data probe is generally required to be not less than 20000 hours, and the life / reliability index of the atmospheric data probe for large passenger aircraft is required to be not less than 40000 hours.

[0005] In view of the extremely high requirement that the life / reliability index of the atmospheric data probe is not less than 40000 hours, in order to prove that the product design meets the technical index requirements, such as a life / reliability index verification test method under normal stress conditions (stress under the actual use environment conditions of the atmospheric data probe), it is required to continuously perform the test for about 4.5662 years, which will result in that the product test period and the equipment occupation time are too long, and the development test cost is extremely high, so that the development cost and development period of the atmospheric data probe are unacceptable.

[0006] The atmospheric data probe mainly comprises a heating wire (or a heater) for realizing the heating function of the probe and a mechanical structure for realizing the aerodynamic sensing function. Since the failure rate of the mechanical structure is much lower than that of the heating wire, the life / reliability index of the atmospheric data probe is mainly determined by the life / reliability of the heating wire and the welding process.

[0007] The main failure modes and causes of atmospheric data probes are as follows: (1) Main failure mode: The heating wire burns out; (2) Main cause: The atmospheric data probe is continuously subjected to the temperature shock of "high temperature" environment and "normal temperature-high temperature-normal temperature" in the operating environment, causing the insulation performance of the heating wire insulation layer to degrade and decrease, resulting in voltage breakdown, and ultimately causing the heating wire to burn out due to local overtemperature. According to the analysis of the failure modes and causes of atmospheric data probes, the characteristic parameters of the insulation performance degradation of atmospheric data probes are related to the two stresses of ambient temperature and working power supply voltage, and its accelerated performance degradation conforms to the Ehring model. Summary of the Invention

[0008] In order to solve the above problems, the present invention proposes an atmospheric data probe accelerated performance degradation test method.

[0009] The technical solution of the present invention is: a method for testing the accelerated performance degradation of an atmospheric data probe comprises the following steps:

[0010] S1: Construct an atmospheric data probe accelerated performance degradation test system;

[0011] S2: Using the atmospheric data probe accelerated performance degradation test system to obtain the electrical stress limit, temperature stress limit, and combined stress limit of electrical stress and temperature stress of the atmospheric data probe;

[0012] S3: Based on the electrical stress limit, temperature stress limit, and combined stress limit of electrical stress and temperature stress of the atmospheric data probe, an atmospheric data probe accelerated performance degradation test is conducted using an atmospheric data probe accelerated performance degradation test system to determine the service life of the atmospheric data probe.

[0013] Furthermore, in step S1, the atmospheric data probe accelerated performance degradation test system includes a temperature box, a test box, a computer, a temperature probe, an insulation resistance tester and a power supply voltage adjustment device; the temperature box, the computer, the temperature probe, the insulation resistance tester and the power supply voltage adjustment device are all connected to the test box; and the temperature probe is arranged in the temperature box.

[0014] Furthermore, in the atmospheric data probe accelerated performance degradation test system, the temperature box is used to provide temperature stress to the atmospheric data probe; the test box is used to control the opening and closing of the atmospheric data probe heating working power supply, and transmit the received insulation resistance and probe tip temperature of the atmospheric data probe to the computer; the temperature probe is used to collect the probe tip temperature of the atmospheric data probe and transmit it to the test box; the insulation resistance tester is used to test the insulation resistance of the atmospheric data probe and transmit it to the test box; the power supply voltage adjustment device is used to adjust the heating working power supply voltage of the atmospheric data probe; and the computer is used to analyze the real-time data of the atmospheric data probe accelerated performance degradation test.

[0015] Further, in step S2, the specific method for obtaining the electrical stress limit of the atmospheric data probe is as follows: the atmospheric data probe is placed in a temperature box, the temperature box is not temperature-controlled, the heating working power supply voltage of the atmospheric data probe is increased to the rated working voltage of the atmospheric data probe, then the heating working power supply voltage of the atmospheric data probe is boosted until the atmospheric data probe fails, and the highest heating working power supply voltage before the atmospheric data probe fails is taken as the electrical stress limit.

[0016] Further, in step S2, the specific method for obtaining the temperature stress limit of the atmospheric data probe is as follows: the atmospheric data probe is placed in a temperature box, the heating working power supply is at the rated working voltage, the atmospheric data probe is heated by the temperature box until the atmospheric data probe fails or the temperature of the test system reaches the highest applied environmental temperature of the temperature box, and the probe tip temperature before the atmospheric data probe fails or the probe tip temperature corresponding to the highest applied environmental temperature of the temperature box is taken as the temperature stress limit of the atmospheric data probe.

[0017] Further, in step S2, the specific method for obtaining the comprehensive stress limit of the electrical stress and the temperature stress is as follows: the atmospheric data probe is placed in a temperature box, the heating working power supply voltage of the atmospheric data probe is increased to the rated working voltage of the atmospheric data probe, then the atmospheric data probe is heated and boosted until the atmospheric data probe fails, and the highest applied environmental temperature before the atmospheric data probe fails, the probe tip temperature corresponding to the highest heating working power supply voltage, and the highest heating working power supply voltage are taken as the comprehensive stress limit of the electrical stress and the temperature stress.

[0018] Further, step S3 includes the following sub-steps:

[0019] S31: determining the comprehensive acceleration stress condition of the atmospheric data probe acceleration performance degradation test according to the comprehensive stress limit of the electrical stress and the temperature stress;

[0020] S32: raising the heating working power supply voltage of the atmospheric data probe to the power supply voltage value under the comprehensive acceleration stress condition by the power supply voltage adjustment device, and raising the environmental temperature to the temperature value under the comprehensive acceleration stress condition by the temperature box, to generate an atmospheric data probe acceleration performance degradation test package line;

[0021] S33: performing atmospheric data probe acceleration performance degradation test by using the atmospheric data probe acceleration performance degradation test system according to the atmospheric data probe acceleration performance degradation test package line, until the insulation resistance of the atmospheric data probe reaches the failure resistance threshold, to construct an atmospheric data probe performance degradation model;

[0022] S34: determining the target function of the insulation resistance of the atmospheric data probe and the temperature stress, the electric stress and the performance degradation test time according to the insulation resistance and the atmospheric data probe performance degradation model of the atmospheric data probe acceleration performance degradation test;

[0023] S35: determining the time when the insulation resistance of the atmospheric data probe reaches the failure resistance threshold under the normal stress according to the target function of the insulation resistance of the atmospheric data probe and the temperature stress, the electric stress and the performance degradation test time, and taking the time as the service life of the atmospheric data probe.

[0024] Further, in step S33, the expression of the atmospheric data probe performance degradation model is:

[0025]

[0026] wherein R(t) represents the insulation resistance of the atmospheric data probe after the performance degradation for time t, R0 represents the initial value of the insulation resistance of the atmospheric data probe, ξ represents the insulation performance degradation amount, A represents the first model undetermined constant, B represents the second model undetermined constant, n represents the third model undetermined constant, T represents the probe temperature stress, k represents the Boltzmann constant, and S represents the power voltage stress.

[0027] Further, in step S34, the specific method for determining the target function of the insulation resistance amount of the atmospheric data probe and the temperature stress, the electric stress and the performance degradation test time is: determining the first model undetermined constant, the second model undetermined constant and the third model undetermined constant in the atmospheric data probe performance degradation model according to the insulation resistance and the expression of the atmospheric data probe performance degradation model obtained by the atmospheric data probe acceleration performance degradation test, and determining the target function of the insulation resistance of the atmospheric data probe and the temperature stress, the electric stress and the performance degradation test time according to the atmospheric data probe performance degradation model, the first model undetermined constant, the second model undetermined constant and the third model undetermined constant.

[0028] The beneficial effects of the present application are:

[0029] (1) The present application adopts a temperature box, a general power tester, a general power adjustment device and a computer to form an atmospheric data probe acceleration performance degradation test system, which is easy to realize and has low cost.

[0030] (2) The atmospheric data probe acceleration performance degradation test method of the present application can greatly reduce the life and reliability test time of the atmospheric data probe, and can significantly reduce the development fund of the atmospheric data probe. BRIEF DESCRIPTION OF DRAWINGS

[0031] Figure 1 It is a flow chart of the atmospheric data probe acceleration performance degradation test method.

[0032] Figure 2 A structure diagram of the atmospheric data probe accelerated performance degradation test system;

[0033] Figure 3 A package line diagram of the atmospheric data probe accelerated performance degradation test;

[0034] Figure 4 A performance degradation trend diagram of the atmospheric data probe under different stress conditions. DETAILED DESCRIPTION

[0035] The embodiments of the present application will be further described below with reference to the drawings.

[0036] As shown in the drawings, Figure 1 The present application provides an atmospheric data probe accelerated performance degradation test method, comprising the following steps:

[0037] S1: constructing an atmospheric data probe accelerated performance degradation test system;

[0038] S2: using the atmospheric data probe accelerated performance degradation test system to obtain the electrical stress limit, temperature stress limit and comprehensive stress limit of electrical stress and temperature stress of the atmospheric data probe;

[0039] S3: according to the electrical stress limit, temperature stress limit and comprehensive stress limit of electrical stress and temperature stress of the atmospheric data probe, using the atmospheric data probe accelerated performance degradation test system to perform atmospheric data probe accelerated performance degradation test to determine the service life of the atmospheric data probe.

[0040] In the embodiments of the present application, as shown in the drawings, Figure 2 In step S1, the atmospheric data probe accelerated performance degradation test system comprises a temperature box, a test box, a computer, a temperature probe, an insulation resistance tester and a power supply voltage adjustment device; the temperature box, the computer, the temperature probe, the insulation resistance tester and the power supply voltage adjustment device are all connected with the test box; the temperature probe is arranged in the temperature box.

[0041] As shown in the drawings, Figure 2 AC 400Hz 115V or DC 28V is used as the input of the power supply voltage adjustment device, AC 50Hz 220V is used as the input of the test box, and AC 50Hz 220V or a fan power supply is used as the input of the temperature box.

[0042] In the embodiment of the present application, in the atmospheric data probe accelerated performance degradation test system, the temperature box is used to provide temperature stress of the atmospheric data probe; the test box is used to control the opening and closing of the heating power supply of the atmospheric data probe, and transmit the received insulation resistance and probe tip temperature of the atmospheric data probe to the computer; the temperature probe is used to collect the probe tip temperature of the atmospheric data probe and transmit it to the test box; the insulation resistance tester is used to test the insulation resistance of the atmospheric data probe and transmit it to the test box; the power voltage adjustment device is used to adjust the heating power voltage of the atmospheric data probe; and the computer is used to analyze the real-time data of the atmospheric data probe accelerated performance degradation test.

[0043] In the embodiment of the present application, in step S2, the specific method for obtaining the electrical stress limit of the atmospheric data probe is as follows: the atmospheric data probe is placed in the temperature box, the temperature box is not temperature-controlled, the heating power voltage of the atmospheric data probe is increased to the rated working voltage of the atmospheric data probe, then the heating power voltage of the atmospheric data probe is boosted until the atmospheric data probe fails, and the highest heating power voltage before the atmospheric data probe fails is taken as the electrical stress limit.

[0044] When obtaining the electrical stress limit of the atmospheric data probe, the rated working voltage is AC 115V and DC 28V, the heating power voltage is gradually increased by +2V step, and each voltage point should be maintained for 30 minutes.

[0045] In the embodiment of the present application, in step S2, the specific method for obtaining the temperature stress limit of the atmospheric data probe is as follows: the atmospheric data probe is placed in the temperature box, the heating power is at the rated working voltage, the atmospheric data probe is heated by the temperature box until the atmospheric data probe fails or the temperature of the test system reaches the highest applied environmental temperature of the temperature box, and the probe tip temperature before the atmospheric data probe fails or the probe tip temperature corresponding to the highest applied environmental temperature of the temperature box is taken as the temperature stress limit of the atmospheric data probe.

[0046] When obtaining the temperature stress limit of the atmospheric data probe, the temperature of the temperature box is controlled to increase by a certain step (such as +5℃, +10℃), the temperature increasing speed is not less than 15℃ / min, and each temperature point is maintained for 30 minutes.

[0047] In the embodiment of the present application, in step S2, the specific method for obtaining the comprehensive stress limit of the electrical stress and the temperature stress is as follows: the atmospheric data probe is placed in the temperature box, the heating power voltage of the atmospheric data probe is increased to the rated working voltage of the atmospheric data probe, then the atmospheric data probe is heated and boosted until the atmospheric data probe fails, the probe tip temperature corresponding to the highest applied environmental temperature before the atmospheric data probe fails and the highest heating power voltage are taken as the comprehensive stress limit of the electrical stress and the temperature stress.

[0048] When the comprehensive stress limit of the electrical stress and the temperature stress is obtained, the heating power voltage is adjusted to the rated working voltage of the atmospheric data probe (such as AC 115V or DC 28V), and the atmospheric data probe is started to work in heating, the temperature of the temperature box is controlled to be increased by a certain step (such as +10℃ or +2V), the temperature increasing speed is not less than 15℃ / min, and each temperature point and voltage point is kept for 30 minutes.

[0049] In the embodiment of the present application, step S3 comprises the following sub-steps:

[0050] S31: determining the comprehensive accelerated stress condition of the atmospheric data probe accelerated performance degradation test according to the comprehensive stress limit of the electrical stress and the temperature stress;

[0051] S32: increasing the heating working power voltage of the atmospheric data probe to the power voltage value under the comprehensive accelerated stress condition by the power voltage adjusting device, and increasing the environmental temperature to the temperature value under the comprehensive accelerated stress condition by the temperature box, to generate the atmospheric data probe accelerated performance degradation test package line;

[0052] S33: performing the atmospheric data probe accelerated performance degradation test by using the atmospheric data probe accelerated performance degradation test system according to the atmospheric data probe accelerated performance degradation test package line, until the insulation resistance of the atmospheric data probe reaches the failure resistance threshold, to construct the atmospheric data probe performance degradation model;

[0053] S34: determining the target function of the insulation resistance of the atmospheric data probe and the temperature stress, the electrical stress and the performance degradation test time according to the insulation resistance of the atmospheric data probe accelerated performance degradation test and the atmospheric data probe performance degradation model;

[0054] S35: determining the time when the insulation resistance of the atmospheric data probe reaches the failure resistance threshold under the normal stress according to the target function of the insulation resistance of the atmospheric data probe and the temperature stress, the electrical stress and the performance degradation test time, and taking the time as the service life of the atmospheric data probe.

[0055] When the performance degradation test under the comprehensive stress acceleration condition is carried out, the test sample machines of the atmospheric data probes in the same batch are not less than 5, the temperature stress and the power voltage stress are applied at the same time, the comprehensive stress acceleration factor is not less than 10 times, the test time is the time when the performance of all the atmospheric data probes in the temperature box under the acceleration stress degrades to the failure threshold or 1 / 10 of the total life / reliability index under the acceleration stress condition, and the earlier one is taken as the standard.

[0056] In the embodiment of the present application, in step S33, the formula is The transformation obtains Rt=R0×(1-ξ), according to the Eyring model and the formula Rt=R0×(1-ξ), the relationship between the insulation resistance of the atmospheric data probe and the temperature stress, the power supply voltage stress and the test time t can be obtained, that is, the atmospheric data probe accelerated performance degradation model, and the expression is:

[0057]

[0058] Wherein, R(t) represents the insulation resistance of the atmospheric data probe after the performance degradation for time t, R0 represents the initial value of the insulation resistance of the atmospheric data probe, ξ represents the insulation performance degradation amount, A represents the first model undetermined constant, B represents the second model undetermined constant, n represents the third model undetermined constant, T represents the probe temperature stress, k represents the Boltzmann constant, and S represents the power supply voltage stress.

[0059] In the embodiment of the application, in step S34, the specific method for determining the target function of the insulation resistance amount of the atmospheric data probe and the temperature stress, the electric stress and the performance degradation test time is as follows: according to the insulation resistance obtained from the atmospheric data probe accelerated performance degradation test and the expression of the atmospheric data probe performance degradation model, the first model undetermined constant, the second model undetermined constant and the third model undetermined constant in the atmospheric data probe performance degradation model are determined, and according to the atmospheric data probe performance degradation model, the first model undetermined constant, the second model undetermined constant and the third model undetermined constant, the target function of the insulation resistance of the atmospheric data probe and the temperature stress, the electric stress and the performance degradation test time is determined.

[0060] According to the atmospheric data probe accelerated performance degradation test data, the accelerated performance degradation data of the three probes that reach the failure threshold earliest are respectively substituted into the atmospheric data probe accelerated performance degradation model to obtain an equation group formed by three equations, and through simultaneously solving the equation group, the first model undetermined constant, the second model undetermined constant and the third model undetermined constant in the performance degradation model are obtained.

[0061] According to the actual use condition (assuming that 6 hours of heating work are assumed in every 8 hours) of the atmospheric data probe and the obtained temperature and power supply voltage comprehensive stress limit, the test envelope of the atmospheric data probe accelerated performance degradation test is provided through the temperature box and the test box, as shown in the figure. Figure 3 The black point represents the detection point.

[0062] The performance degradation trend of the atmospheric data probe under different stress conditions is as shown in the figure. Figure 4 Figure 4 ​It can be seen that (1) the higher the acceleration stress level, the shorter the time to reach the failure threshold, thus, a large amount of test time can be saved through the accelerated performance degradation test, and (2) the degradation amount of the performance degradation characteristic parameter of the processed product is linearly related to the test time.

[0063] The application constructs a new atmospheric data probe accelerated performance degradation test method, the accelerated performance degradation test method mainly adopts the insulation resistance between the atmospheric data probe heating power supply pin and the probe shell as the observation parameter of the atmospheric data probe performance degradation, temperature stress (probe tip temperature) and electric stress (heating power supply voltage) as the comprehensive stress of the atmospheric data probe accelerated performance degradation test, establishes the accelerated performance degradation model of the relationship between the atmospheric data probe performance degradation characteristic parameter (insulation resistance) and the temperature stress, power supply voltage stress and test time, and obtains the undetermined constant in the model through the performance degradation data of the atmospheric data probe under the accelerated stress (high stress), obtains the atmospheric data probe performance degradation equation, and then obtains the life / reliability level of the product under the normal stress through the atmospheric data probe performance degradation equation.

Claims

1. A method for testing the accelerated performance degradation of an atmospheric data probe, characterized in that: The following steps are involved: S1: Construct an atmospheric data probe accelerated performance degradation test system; S2: Using the atmospheric data probe accelerated performance degradation test system to obtain the electrical stress limit, temperature stress limit, and combined stress limit of electrical stress and temperature stress of the atmospheric data probe; S3: Based on the electrical stress limit, temperature stress limit, and combined stress limit of the electrical stress and temperature stress of the atmospheric data probe, an atmospheric data probe accelerated performance degradation test is conducted using an atmospheric data probe accelerated performance degradation test system to determine the service life of the atmospheric data probe; The step S3 includes the following sub-steps: S31: Determine the comprehensive accelerated stress conditions for the accelerated performance degradation test of the atmospheric data probe based on the comprehensive stress limit of electrical stress and temperature stress; S32: Raising the heated working power supply voltage of the atmospheric data probe to the power supply voltage value under the comprehensive accelerated stress condition by means of a power supply voltage adjustment device, and raising the ambient temperature to the temperature value under the comprehensive accelerated stress condition by means of a temperature chamber, thereby generating an accelerated performance degradation test envelope of the atmospheric data probe; S33: performing an accelerated performance degradation test of the atmospheric data probe using an accelerated performance degradation test system according to the atmospheric data probe accelerated performance degradation test envelope until the insulation resistance of the atmospheric data probe reaches a failure resistance threshold, thereby constructing a performance degradation model of the atmospheric data probe; S34: determining an objective function of the insulation resistance of the atmospheric data probe and the temperature stress, electrical stress, and performance degradation test time based on the insulation resistance of the atmospheric data probe accelerated performance degradation test and the atmospheric data probe performance degradation model; S35: Based on the objective function of the insulation resistance of the atmospheric data probe and the temperature stress, electrical stress and performance degradation test time, determine the time when the insulation resistance of the atmospheric data probe reaches the failure resistance threshold under normal stress, and use it as the service life of the atmospheric data probe.

2. The method for accelerating performance degradation of an air data probe according to claim 1, wherein: In step S1, the atmospheric data probe accelerated performance degradation test system includes a temperature box, a test box, a computer, a temperature probe, an insulation resistance tester, and a power supply voltage adjustment device; the temperature box, the computer, the temperature probe, the insulation resistance tester, and the power supply voltage adjustment device are all connected to the test box; and the temperature probe is set in the temperature box.

3. The method for testing the accelerated performance degradation of an air data probe according to claim 2, wherein: In the atmospheric data probe accelerated performance degradation test system, the temperature box is used to provide temperature stress to the atmospheric data probe; the test box is used to control the on and off of the atmospheric data probe heating power supply, and transmit the received atmospheric data probe insulation resistance and probe tip temperature to the computer; The temperature probe is used to collect the probe tip temperature of the atmospheric data probe and transmit it to the test box; the insulation resistance tester is used to test the insulation resistance of the atmospheric data probe and transmit it to the test box; the power supply voltage adjustment device is used to adjust the heating working power supply voltage of the atmospheric data probe; the computer is used to analyze the real-time data of the atmospheric data probe accelerated performance degradation test.

4. The method for accelerating performance degradation of an air data probe according to claim 2, wherein: In step S2, the specific method for obtaining the electrical stress limit of the atmospheric data probe is: placing the atmospheric data probe in a temperature box without temperature control, increasing the heating working power supply voltage of the atmospheric data probe to the rated working voltage of the atmospheric data probe, and then boosting the heating working power supply voltage of the atmospheric data probe until the atmospheric data probe fails, and using the highest heating working power supply voltage of the atmospheric data probe before the failure as the electrical stress limit.

5. The method for accelerating performance degradation of an air data probe according to claim 2, wherein: In step S2, the specific method for obtaining the temperature stress limit of the atmospheric data probe is as follows: placing the atmospheric data probe in a temperature box, setting the heating working power supply to the rated working voltage, heating the atmospheric data probe through the temperature box until the atmospheric data probe fails or the temperature of the test system reaches the maximum applied ambient temperature of the temperature box, and taking the probe tip temperature before the atmospheric data probe fails or the probe tip temperature corresponding to the maximum applied ambient temperature of the temperature box as the temperature stress limit of the atmospheric data probe.

6. The method for accelerating performance degradation of an air data probe according to claim 2, wherein: In step S2, a specific method for obtaining the combined stress limit of electrical stress and temperature stress is as follows: placing the atmospheric data probe in a temperature box, increasing the heating working power supply voltage of the atmospheric data probe to the rated working voltage of the atmospheric data probe, and then increasing the temperature and voltage of the atmospheric data probe until the atmospheric data probe fails. The highest applied ambient temperature before the atmospheric data probe fails, the probe tip temperature corresponding to the highest heating working power supply voltage, and the highest heating working power supply voltage are used as the combined stress limit of electrical stress and temperature stress.

7. The method for accelerating performance degradation of an air data probe according to claim 1, wherein: In step S33, the expression of the atmospheric data probe performance degradation model is: Where R(t) represents the insulation resistance of the air data probe after performance degradation over time t, R0 represents the initial value of the insulation resistance of the air data probe, and ξ represents the amount of insulation performance degradation. A represents the first model unknown constant, B represents the undetermined constant of the second model, n represents the third model unknown constant, T represents the probe temperature stress, k represents the Boltzmann constant, S Indicates the power supply voltage stress.

8. The method for accelerating performance degradation of an air data probe according to claim 1, wherein: In step S34, the specific method for determining the objective function of the insulation resistance of the atmospheric data probe and the temperature stress, electrical stress and performance degradation test time is as follows: based on the insulation resistance obtained from the accelerated performance degradation test of the atmospheric data probe and the expression of the atmospheric data probe performance degradation model, the first model undetermined constant, the second model undetermined constant and the third model undetermined constant in the atmospheric data probe performance degradation model are determined; and based on the atmospheric data probe performance degradation model, the first model undetermined constant, the second model undetermined constant and the third model undetermined constant, the objective function of the insulation resistance of the atmospheric data probe and the temperature stress, electrical stress and performance degradation test time is determined.

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