85 results about "Electric stress" patented technology

The invention discloses an online early warning method and detection system for a power supply, and belongs to the technical field of power supply monitoring, and the method comprises the steps: collecting an electric stress parameter of a to-be-monitored power supply in real time based on an early warning sampling frequency, and carrying out the preprocessing; once the real-time electric stress value is greater than or equal to the early warning safety threshold value, determining that the event is a potential abnormal event, constructing an abnormal time window, carrying out abnormal feature analysis, and carrying out recessive parameter inversion in combination with a digital twinborn body to generate an abnormal feature set; and calculating a real-time health index, once a potential abnormal event is identified, correcting the health index, generating an event health index, calculating a health decline rate, predicting a health index in a future time period and carrying out health early warning by combining the abnormal feature set, so that cost increase of reversible abnormal excessive early warning is avoided, and damage caused by missed judgment and accumulation is prevented.

The invention provides a power device failure positioning method and system based on multi-physics field coupling, and the method comprises the steps: applying dynamic electric stress to a tested power device, and synchronously collecting the thermal field data, electric field data and mechanical field data of the tested power device; wherein the thermal field data is used for representing the surface temperature distribution of the to-be-measured power device, the electric field data is used for representing the electrical parameters of the to-be-measured power device, and the mechanical field data is used for representing the internal morphology of the to-be-measured power device; synchronizing the thermal field data, the electric field data and the mechanical field data through timestamps, and aligning in a preset three-dimensional coordinate system to obtain multi-dimensional alignment data; and generating a failure probability distribution diagram according to the multi-dimensional alignment data so as to determine corresponding failure point coordinates. Through multi-physics field data coupling analysis, the problem of failure point fuzzy positioning in a complex packaging structure is solved, and the detection sensitivity under a dynamic working condition is improved.

The invention relates to a power supply module, electronic equipment and a preparation method of the power supply module, the power supply module comprises a substrate, a power supply chip, a first electronic device and a second electronic device, the power supply chip is arranged in the substrate, the first electronic device is arranged on the surface of one side of the substrate along the thickness direction of the power supply module, and the second electronic device is arranged on the surface of the other side of the substrate. The first electronic device is electrically connected with the power supply chip, the side, away from the substrate, of the first electronic device is used for being electrically connected with the circuit board, the second electronic device comprises an inductor, the inductor comprises a magnetic core and a magnetic packaging part, the magnetic core is electrically connected with the power supply chip, and the magnetic core is packaged on the surface of the side, away from the first electronic device, of the substrate through the magnetic packaging part. The power supply module with the structure occupies a small area, can shorten a power routing path, reduce parasitic power routing path, reduce power loss, reduce an electric stress risk, can reduce the overall thickness of the power supply module, and improves the layout space of the first electronic device and the second electronic device, thereby facilitating the improvement of the power supply performance of the power supply module.

The invention discloses a reliability evaluation method for a conductive thermal interface material. The method comprises the following steps: manufacturing a substitute sample according to a conductive thermal interface material bonding layer structure of an actual device and a sintering process; gradually increasing the environment temperature to test an actual device, and taking the amplification of the interface thermal resistance as a failure threshold value when the performance of the device cannot meet the requirement; according to the set temperature stress and current stress conditions, thermoelectric stress tests are carried out on all the alternative samples, the tests are stopped after a period of time, and interface thermal resistance tests are carried out; when the amplification of the interface thermal resistance of the alternative sample exceeds a failure threshold value, stopping the thermoelectric stress test of the alternative sample and recording the failure life until the amplification of the interface thermal resistance of all the alternative samples exceeds the failure threshold value; and obtaining the failure life of the conductive thermal interface material according to the failure life data of all the alternative samples, thereby realizing reliability evaluation of the conductive thermal interface material. According to the method, the reliability of interface thermal resistance degradation caused by the electromigration effect can be effectively evaluated.

The invention relates to an accelerated test system and method based on a weak link of an electronic component, and belongs to the technical field of electronic product testing, and the method comprises the steps: carrying out the hierarchy analysis and modeling preparation of a whole machine structure, and carrying out the structural layering of a target whole machine system; weak link identification: identifying a key failure path influencing the reliability in the whole machine, and determining a weak component; acceleration pre-test: carrying out acceleration pre-test on the identified weak component, and obtaining degradation behavior data of the weak component through multi-stage acceleration stress loading; constructing a complete machine acceleration model, and calculating the influence of temperature stress, electric stress and vibration stress on the failure degradation rate of the product; acceleration factor calculation: calculating an acceleration factor based on the activation energy of the weak link part; and predicting the service life of the whole machine through acceleration factors, failure mode analysis and component service life data. The failure of the whole machine is converted into the failure of a weak link; the service degradation process of the whole machine can be reflected more truly, and the accuracy of a prediction result is improved.

A Radio Frequency Identification Device (RFID) tag capable of withstanding electrical stress from induction sealing arrangement and provide shielding against the metallic seal required for induction sealing includes an antenna coil partitioned into a main coil and an auxiliary coil. Both the coils are collocated on two separate overlapping or non-overlapping regions of a dielectric substrate without any galvanic connection therebetween. The main coil is operatively connected with semiconductor chip on the dielectric substrate for necessary RFID activities, while the auxiliary coil operates as a resonator tuned to a certain resonating frequency that enables the auxiliary coil to act as a virtual open circuit to induction sealing frequency and help the semiconductor chip to withstand the electrical stress from induction sealing. The auxiliary coil carries a current during interrogation of the tag by an RFID Reader which provides shielding against eddy currents on the metal seal for induction sealing.

The invention discloses a GIS metal particle defect detection test platform and a detection method, and relates to the technical field of high-voltage electrical equipment detection and fault diagnosis, and the platform comprises a GIS equipment module which is used for simulating an actual GIS equipment operation environment and an internal metal particle defect scene; the alternating current voltage module is used for applying processing frequency voltage to the GIS equipment module; the impulse voltage module is used for superposing impulse voltage on the basis of power frequency voltage to realize electric stress coupling; the physical vibration module is used for applying controllable mechanical vibration to the GIS equipment module, simulating impact disturbance generated by switch operation, and enabling internal metal particles to be in a suspended or moving state; the protection device is used for ensuring the effective superposition of the power frequency voltage and the impulse voltage and blocking the reverse voltage; and the detection equipment is used for monitoring the motion trail, the charge characteristic and the partial discharge signal of the metal particles in the GIS equipment module in real time so as to carry out defect mechanism analysis. According to the invention, complex working conditions in GIS operation can be truly simulated.

The invention relates to a system and method for reducing electrical stress of a switching device. Methods, systems, and devices are provided for techniques for a switching device that controllably couples a first conductive line to a second conductive line or decouples the first conductive line from the second conductive line. The switching device includes a branch of a primary transistor and a branch of a circuit. At least one of the one or more branches of the primary transistor includes a plurality of primary transistors connected in series. The control terminals of the plurality of primary transistors are connected together and receive a primary control signal, and the plurality of primary transistors are controllably switched to couple the first conductive line to the second conductive line or to decouple the first conductive line from the second conductive line. A plurality of circuits are configured to provide a gradient voltage level between the first conductive line and the second conductive line such that drain-source voltages of the plurality of primary transistors are limited to a maximum allowable value.

The invention relates to a component test method and system based on pre-test degradation data, and belongs to the technical field of electronic product testing, and the method comprises the following steps: carrying out the hierarchical analysis and modeling preparation of a whole machine structure, and carrying out the structural layering of a target whole machine system; acceleration pre-test: carrying out acceleration pre-test on the component, and obtaining degradation behavior data of the component through multi-stage acceleration stress loading; constructing a complete machine acceleration model, and calculating the influence of temperature stress, electric stress and vibration stress on the failure degradation rate of the product; calculating an acceleration factor, predicting the service life of the electronic product under the actual use condition by analyzing degradation data in the acceleration pre-test, and calculating the acceleration factor; and predicting the service life of the whole machine through acceleration factors, failure mode analysis and component service life data. By identifying weak components in the whole machine, only key components are subjected to an acceleration pre-test.

The present application provides a method for monitoring a through fault current. The method may involve: detecting a through fault; calculating an electrical stress, peak current, and duration of the through fault; determining two sets of percentage state changes associated with the through fault; assigning a respective set of weights and criticalities to each set of percentage state changes; calculating a mechanical state change based on the first set of percentage state changes and the first set of weights and criticalities; calculating a thermal state change based on the second set of percentage state changes and the second set of weights and criticalities; calculating a cumulative state change based on the mechanical and thermal state changes; and training a machine learning model using the electrical stress, peak current, duration, two sets of percentage state changes, and mechanical, thermal, and cumulative state changes.

The invention discloses an insulating part interface defect detection method and device and electronic equipment, and the detection method comprises the following steps: S1, applying mechanical stress, thermal stress and electric stress to an interface area of a test sample at the same time, so as to couple and excite measurable response related to the interface defect; s2, synchronously monitoring response signals of at least two different physical properties caused by the interface defects while applying the multiple stresses; s3, identifying and / or positioning the interface defect based on the characteristics of the at least two response signals and the relevance of the at least two response signals in time and space; wherein the loading parameters of at least two of the mechanical stress, the thermal stress and the electric stress are subjected to closed-loop adjustment on the basis of each other, so that high-sensitivity and high-reliability identification and accurate positioning of tiny and hidden interface defects which are difficult to identify by a traditional method can be realized; and the accuracy and comprehensiveness of state detection of the insulating part are effectively improved.

This invention relates to the field of industrial Internet of Things (IoT) technology, and particularly to a data fusion decision optimization method, device, and storage medium based on artificial intelligence. The method includes: identifying start-stop events and extracting mechanical impact response windows and thermal relaxation response windows; determining impact characteristic metrics based on vibration signals within the mechanical impact response windows, determining thermal relaxation characteristic metrics based on temperature decay processes within the thermal relaxation response windows, and thus determining the insulation fatigue damage degree; determining a fatigue accumulation index based on the impact characteristic metrics and thermal relaxation characteristic metrics, and thus determining the insulation fatigue damage degree; determining an electrical stress accumulation metric based on stator current harmonic characteristics; determining the health status by comprehensively considering the insulation fatigue damage degree and electrical stress accumulation metric within a management cycle, and providing maintenance prompts. This invention achieves accurate assessment and graded early warning of insulation health status, significantly improving the intelligent level and reliability of motor stator winding operation and maintenance under frequent start-stop conditions.

The invention discloses a grid-forming converter multiple current test system and method, and the system comprises a tested converter, the input side of which is connected to a power grid; the impedance conversion module is connected with the output side of the tested converter and used for changing the impedance of a loop on the output side of the tested converter so that the output current of the tested converter can be switched between the rated current and the n-time current of the rated current, and n is larger than 1; the electric stress acquisition module is connected to the tested converter and is used for acquiring an electric stress parameter when the tested converter works; and the upper computer is connected with the electric stress acquisition module and the tested converter and is used for regulating and controlling the operation of the tested converter and monitoring and recording the electric stress parameters of the tested converter. The system can effectively test the hardware stress of the multiple current of the grid-forming converter under the condition that the power grid capacity is limited, so that the electric stress condition of the converter under the multiple current is evaluated, the implementation cost is lower, and the efficiency is higher.

The invention relates to the technical field of IGBTs (Insulated Gate Bipolar Translator), in particular to a crimping type IGBT assembly, which comprises a first IGBT module, a second IGBT module and a third IGBT module, the second IGBT module is arranged at the top of the third IGBT module; the first IGBT module is arranged at the top of the second IGBT module; the crimping type IGBT assembly further comprises a first upper horizontal row, a first lower horizontal row and a first vertical row. The crimping type IGBT assembly further comprises a second upper horizontal row, a second lower horizontal row and a second vertical row. By optimizing the IGBT module stacking layout and the copper bar connecting structure, the total distance of current transmission paths from the input interface to the collector electrode of each IGBT module and from the output interface to the emitter electrode of each IGBT module is completely consistent, and the balance of parasitic resistance and parasitic inductance of each branch is ensured; therefore, the problem of current unbalance caused by path difference in an existing parallel structure is effectively solved, the current sharing coefficient is stabilized at a high level, and thermal breakdown or electric stress damage caused by long-term overload of a single IGBT module is avoided.

The invention provides a high-energy acoustoelectric physical field fracturing and permeability increasing experiment system and method. The experiment system comprises an anti-explosion and anti-explosion cavity, and a test loading system, an acoustoelectric fracturing system, a gas injection system, an extraction system and a parameter monitoring system which are mounted in the anti-explosion and anti-explosion cavity. Strong electric stress and shock waves generated by high-voltage discharge and vibration and cavitation effects caused by a high-strength sound field jointly act on a coal sample. Under the action of an electro-acoustic coupling field, microscopic cracks are generated in the coal sample and are expanded into a net, so that the permeability is improved; and meanwhile, physical field energy promotes desorption of gas molecules and accelerates the diffusion process, and finally efficient extraction of unconventional natural gas is achieved. According to the invention, breakthroughs are made in the aspects of fracturing energy, fracturing action range, in-situ observation capability and the like, a simulation experiment of fracturing and permeation enhancement of the deep ultra-low permeability reservoir under the action of a high-energy acoustoelectric physical field is realized, and an experiment platform is provided for research on a permeation enhancement transformation mechanism of the deep ultra-low permeability reservoir.

The invention discloses a method for evaluating the aging performance of flame-retardant insulating oil, and relates to the technical field of performance evaluation of insulating materials of power equipment, and the method comprises the following steps: S1, sample preparation; s2, a sequential coupling aging test: sequentially performing an accelerated thermal aging test and a disruptive discharge aging test on the flame-retardant insulating oil sample; s3, performance parameter testing and characteristic rule identification: testing a flash point, a breakdown voltage, a dielectric loss factor tan delta and an acid value of the sample at different stages of the sequential coupling aging test; analyzing an evolution rule of a flash point along with thermal aging time, change characteristics of a breakdown voltage in thermal aging and breakdown discharge aging processes, and change trends of a dielectric loss factor and an acid value; and S4, comprehensive performance and service life evaluation. According to the invention, through a sequential coupling aging test, a complex working condition of a thermal-electric stress synergistic effect in the transformer is comprehensively simulated, and the limitation of a traditional single aging mode is overcome.

An ESD circuit includes an ESD clamp device with an ESD clamp transistor. The ESD clamp transistor has two sets of one or more body contacts. One set is coupled to a supply voltage rail and the other set is coupled to a clamp activation circuit. The clamp activation circuit is coupled to a clamp device. During an electrical stress event of a sufficient severity affecting a supply voltage rail, the activation circuit makes the clamp device conductive to transfer charge between supply voltage rails.

The invention relates to an apparatus for protecting over-electric stress and a method of controlling the same. An apparatus for protecting over-electric stress (EOS) includes: a discharge module configured to discharge the EOS when a predetermined threshold voltage is sensed; and a controller configured to control the discharge module, in which the controller includes: at least one sensing module configured to sense the predetermined threshold voltage; and a feedback module configured to increase a response time of the discharge module when the predetermined threshold voltage is sensed.

The composite electric stress control tape is mainly composed of a backing layer and an adhesive layer, wherein the backing layer is a plasticized PVC film layer; the raw material components of the adhesive layer mainly include base rubber, dielectric filler, conductive filler, plasticizer, tackifier, reinforcing filler and antioxidant. The composite electric stress control tape has excellent mechanical and electrical properties, thereby ensuring the integrity, stability and reliability of the product during long-term use.

The application relates to a life evaluation model establishment method and device, equipment and a storage medium, which are applied in the field of integrated circuits, comprising determining an electrical stress condition of the power device, measuring a failure time of the power device under the electrical stress condition, calculating a Weibull cumulative distribution function of the power device under the failure time, fitting and calculating a characteristic life value of the power device under the electrical stress condition according to the Weibull cumulative distribution function and a preset global shape factor, constructing a deep neural network model, training the deep neural network model by using the characteristic life value obtained by fitting and calculation, and generating an accelerated life evaluation model. The application has the technical effect of performing failure analysis and life evaluation on a device with complex process and structure, and improving the evaluation accuracy.

This invention discloses a method for stimulating solder joint desoldering failure in avionics products under complex operating conditions. The test chamber begins a temperature rise program from a low temperature (T) while the product is powered on. At a high temperature (T), the test chamber temperature is maintained for 10-15 minutes, vibration is applied, and functional performance testing is performed to determine if a failure has occurred. The product is then powered off, and the test chamber is cooled to the low temperature (T). This process is repeated. This invention simulates the complex environment of a product in the field through a comprehensive test profile of temperature, vibration, and electrical stress, stimulating solder joint desoldering failure in the product's chips. It verifies the mechanism of solder joint desoldering failure analysis and provides a basis for product design improvements, thereby enhancing the long-term reliability of the product in the field.

The application provides a satellite high-voltage electronic component life model calculation method, which can obtain the insulation performance life of a satellite high-voltage electronic component. The specific process of the method is as follows: setting an experimental condition: performing a high-accelerated life test under different electric stresses under constant temperature and vacuum conditions, and determining a test time corresponding to each applied working voltage; preparing a test sample: the sample is made according to the simulated actual insulation structure, and high-temperature drying is performed before the test; a test scheme: including a cold-heat alternating cycle test, an electric accelerated aging test and a non-destructive performance parameter detection; model fitting: based on the performance parameters obtained by the non-destructive performance parameter detection, a relationship curve between the withstand voltage multiple and the life is fitted, a fitting coefficient is obtained, and a satellite high-voltage electronic component life model is obtained based on the fitting coefficient.

The invention discloses a circuit breaker mechanical state detection method, system, medium and equipment, and the method comprises the steps: constructing a sensor array, carrying out a multi-working-condition electric stress test, synchronously collecting a signal, and carrying out the extraction and preprocessing of a vibration signal, a digital band-pass filter is adopted to filter out ultrasonic frequency components of 40 kHz or above, and vibration acceleration signals within the range of 20 Hz to 2000 Hz are reserved and calculated; signal feature analysis and state evaluation: performing time domain and frequency domain analysis on the vibration acceleration signal, calculating a maximum acceleration value in a preset time window to quantify vibration intensity, and obtaining a spectrogram through fast Fourier transform to analyze main frequency components and energy distribution; and evaluating the mechanical stability and the insulation condition of the circuit breaker by combining the vibration characteristic changes under different voltage grades, circuit breaker states and measuring point positions.

The invention relates to the technical field of analog integrated circuits, in particular to an anti-transient-electric-stress low-delay demodulation circuit and system, and the circuit employs two comparators to compare the positive input and negative input of an original modulation signal with a bias voltage, so that when the original modulation signal is not input, the output original signal maintains a normal low level unchanged; when an original modulation signal is input, no matter whether a positive common-mode transient electric stress event or a negative common-mode transient electric stress event occurs, the levels of the external input ends of the two comparator modules are pulled up or pulled down at the same time, the first level signal and the second level signal can respond to the abnormal event to be overturned to the same level, so that the first level signal and the second level signal are converted to the same level. And original signal output is forcibly set to zero, so that error information generated by a common-mode transient electric stress event is shielded and isolated, and the influence on the accuracy of signal demodulation is reduced. And finally, an error signal caused by a common-mode transient electric stress event when the modulation signal is demodulated is identified and corrected, and the accuracy and the reliability of signal demodulation are improved.

This invention relates to the field of ceramic capacitor testing technology, specifically to a method for accelerating the evaluation of the bonding between the internal and external electrodes of a ceramic capacitor. The method includes the following steps: performing initial electrical parameter testing on the ceramic capacitor under test to obtain initial parameters; subjecting the ceramic capacitor that has completed the initial test to multiple charge-discharge cycles exceeding its rated voltage, with complete discharge performed after each charge cycle; retesting the electrical parameters on the ceramic capacitor that has completed the charge-discharge cycles to obtain retest parameters; comparing the changes in the initial parameters and the retest parameters, and quantitatively evaluating the bonding between the internal and external electrodes of the ceramic capacitor under test based on the parameter changes. This solution, on the one hand, overcomes the inherent defects of existing mainstream metallographic grinding testing methods, achieving non-destructive testing of MLCC electrode bonding; on the other hand, it breaks through the long-standing technical bias in the field that "electrical stress can only evaluate the electrical properties of the ceramic dielectric and cannot evaluate the mechanical bonding of the electrodes."

The invention discloses a transistor variability test characterization method, device and equipment, relates to the technical field of semiconductor characterization and test, and is used for fitting the variability of a device in high sigma distribution. Comprising the following steps: determining a plurality of to-be-tested devices in a test array; applying electric stress to the plurality of to-be-tested devices in the test array and testing to obtain test experiment data; on the basis of test experiment data, statistical distribution of device parameters changing along with time is constructed; and fitting the statistical distribution by using the statistical model to obtain a fitting model so as to complete time domain variability test analysis and model fitting. According to the technical scheme provided by the invention, the reliability and variability of a large number of semiconductor devices can be efficiently tested in batches, the test efficiency and the data statistics significance are remarkably improved, and the statistical distribution of device parameters drifting along with time is accurately described; the finally obtained fitting model can predict the variability and reliability of the semiconductor device more accurately.

This invention discloses a method for predicting and evaluating the lifetime of a thyristor based on an accelerated decay model using electrical stress. It relates to the field of accelerated decay model technology and includes: acquiring the actual equipment in operation of the thyristor; analyzing the electrical variable values ​​during the entire lifecycle of the equipment to obtain the target time; retrieving the experimental records of the thyristor and converting the actual operating time to the experimental time of the thyristor in the experiment to obtain the target time period in the experiment; extracting several monitoring times and analyzing the changes in the index values ​​of each decay index to obtain the aging value of the experimental thyristor in the target time period; obtaining the degree of influence of each type of strain on the thyristor and determining whether the sample size selection is reasonable. This invention, by analyzing the actual equipment and experimental records, closely matches the actual characteristics of the thyristor and determines whether the sample size selection is reasonable, which helps to select more reliable experimental samples and improve the accuracy of thyristor lifetime prediction.

This utility model relates to a power supply electrical stress fault reproduction control device, belonging to the technical field of power supply electrical stress fault reproduction control devices. It includes a control body, with fixing members fixedly installed on the rear sides of both the left and right sides. Each fixing member has two connection holes on its rear side for connection, and the inner walls of several connection holes are provided with fasteners for fixation. The control body has protective plates on its upper and lower sides and rear side, with heat dissipation vents on the surface of each protective plate. This utility model effectively reinforces the connection points, preventing loosening of the connections during use and ensuring the device's normal operation. Furthermore, the protective heat dissipation structure covering the device's surface not only protects the surface but also enhances heat dissipation, thus preventing surface damage.

The application discloses an oil-paper insulation typical defect cumulative damage estimation method, 1, a partial discharge collection system is built, through oil-paper insulation typical defect discharge experiments, cumulative critical damage of a target device or a target model under the same electric stress form is calculated, and an oil-paper insulation typical defect cumulative critical damage model is established; 2, partial discharge detection is carried out on the target device or the target model, relevant discharge data are acquired, insulation cumulative damage is calculated, and through the established oil-paper insulation typical defect cumulative critical damage model, insulation damage rate of the target device or the target model is obtained. The method can calculate insulation cumulative damage of the oil-filled device in a current period, and determine the insulation damage rate, and can effectively estimate the cumulative damage condition of the oil-paper insulation typical defect.

This disclosure provides a thermal management device (100) for an electrical cable (102). The device (100) comprises a body (112) made of boron nitride, which has an inner surface (112A) designed to engage with an insulating layer (108) and a conductor (110) of the electrical cable (102). The body (112) is configured to dissipate heat from a selected region of the cable, and the insulation (108) terminates at the body (112) to improve thermal conductivity and reduce electrical stress. The inner surface (112A) can be conical, with a cone angle between 3 degrees and 15 degrees, to improve fit and heat transfer. The disclosed solution offers a passive, lightweight, and scalable approach to local thermal management in high-voltage cable assemblies.